ASTM International - ASTM E2444-05e1
Terminology Relating to Measurements Taken on Thin, Reflecting Films
|Publication Date:||1 May 2005|
|ICS Code (Electronics (Vocabularies)):||01.040.31|
|ICS Code (Mechanical structures for electronic equipment):||31.240|
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanic
1.2 The terms are listed in alphabetical order.