ASTM International - ASTM E766-98(2003)

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

historical
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Organization: ASTM International
Publication Date: 1 November 2003
Status: historical
Page Count: 6
ICS Code (Optical equipment): 37.020
significance And Use:

Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X.

The use of calibration specimens... View More

scope:

1.1 This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions. Therefore, this practice must be applied to each set of standard operating conditions to be used.

1.2 The values stated in SI units are to be regarded as the standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

November 1, 2019
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
4.1 Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. 4.2 The use of calibration specimens traceable...
January 1, 2014
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
4.1 Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. 4.2 The use of calibration specimens traceable...
January 1, 2014
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
4.1 Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. 4.2 The use of calibration specimens traceable...
June 15, 2008
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. The use of calibration specimens traceable to...
ASTM E766-98(2003)
November 1, 2003
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. The use of calibration specimens traceable to...
December 10, 1998
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard...
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