ASTM International - ASTM B878-97

Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

historical
Buy Now
Organization: ASTM International
Publication Date: 21 May 1998
Status: historical
Page Count: 4
scope:

1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.

1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).

1.3 The minimum sample resistance required for an event detection in this standard is 10.

1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide B 854.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

October 1, 2014
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
4.1 The tests in this test method are designed to assess the resistance stability of electrical contacts or connections. 4.2 The described procedures are for the detection of events that result from...
April 15, 2009
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
The tests in this test method are designed to assess the resistance stability of electrical contacts or connections. The described procedures are for the detection of events that result from short...
June 10, 2003
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
The tests in this test method are designed to assess the resistance stability of electrical contacts or connections. The described procedures are for the detection of events that result from short...
ASTM B878-97
May 21, 1998
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum...
Advertisement