IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1804/D1.4, Apr 2015

IEEE Draft Standard for Fault Accounting and Coverage Reporting to Digital Modules (FACR)

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2015
Status: inactive
Page(s): 1 - 64
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Electronic): 978-0-7381-9700-5
Standard:

The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and... View More

Document History

January 1, 2017
IEEE Approved Draft Standard for Fault Accounting and Coverage Reporting (FACR) for Digital Modules
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and...
January 1, 2017
IEEE Draft Standard for Fault Accounting and Coverage Reporting to Digital Modules (FACR)
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and...
January 1, 2016
IEEE Draft Standard for Fault Accounting and Coverage Reporting to Digital Modules (FACR)
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and...
P1804/D1.4, Apr 2015
January 1, 2015
IEEE Draft Standard for Fault Accounting and Coverage Reporting to Digital Modules (FACR)
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and...
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