IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1696 D10 June 2013
IEEE Approved Draft Standard for Terminology and Test Methods for Circuit Probes
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 17 February 2014 |
Status: | inactive |
Page(s): | 1 - 66 |
ICS Code (Measurement of electrical and magnetic quantities): | 17.220.20 |
ISBN (Online): | 978-0-7381-8807-2 |
Standard:
There is currently no defined, industry-accepted method for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving... View More
Document History

P1696 D10 June 2013
February 17, 2014
IEEE Approved Draft Standard for Terminology and Test Methods for Circuit Probes
There is currently no defined, industry-accepted method for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving...

February 14, 2014
IEEE Standard for Terminology and Test Methods for Circuit Probes
Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe...

November 13, 2013
IEEE Draft Standard for Terminology and Test Methods for Circuit Probes
There is currently no defined, industry-accepted method for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving...