IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1687/D1.62, Sept 2013

IEEE Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

archived unapproved draft
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 3 April 2014
Status: archived unapproved draft
Page(s): 1 - 266
ISBN (Online): 978-0-7381-8673-3
Standard:

This standard describes a methodology for accessing instrumentation embedded within a semiconductor device without defining the instruments or their features themselves, via the IEEE 1149.1 Test... View More

Document History

1687-2014
December 5, 2014
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP)...
1687-2014
November 15, 2014
IEEE Approved Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
This standard describes a methodology for accessing instrumentation embedded within a semiconductor device without defining the instruments or their features themselves, via the IEEE 1149.1 Test...
P1687/D1.62, Sept 2013
April 3, 2014
IEEE Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
This standard describes a methodology for accessing instrumentation embedded within a semiconductor device without defining the instruments or their features themselves, via the IEEE 1149.1 Test...
P1687/D1.62, Sept 2013
September 17, 2013
IEEE Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
This standard describes a methodology for accessing instrumentation embedded within a semiconductor device without defining the instruments or their features themselves, via the IEEE 1149.1 Test...

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