IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1671.6/D5, Feb 2008

IEEE Draft Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML: Exchanging Test Station Information

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Status: inactive
ICS Code (IT applications in information, documentation and publishing): 35.240.30
ISBN (Electronic): 978-1-5044-3095-1
Standard:

This document spefifies an exchange format, utilizing XML., for identifying all of the hardware, software, and documentation associated with a test station. This test station may be used as a... View More

Document History

61671-6-2016
April 8, 2016
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description
An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test...
P1671.6/D10, Jan 2015
May 20, 2015
IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Test Station Description
An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test...
1671.6-2015
May 8, 2015
IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test...
1671.6-2015
May 8, 2015
IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline
An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test...
P1671.6/D9, July 2014
January 31, 2015
IEEE Draft Standard for Automatic Test Markup Language (ATML) Test Station Description
An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test...
P1671.6/D9, July 2014
August 15, 2014
IEEE Draft Standard for Automatic Test Markup Language (ATML) Test Station Description
An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test...
1671.6-2008
February 1, 2013
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a...
1671.6-2008
December 17, 2008
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a...
P1671.6/D5, Feb 2008
January 1, 2008
IEEE Draft Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML: Exchanging Test Station Information
This document spefifies an exchange format, utilizing XML., for identifying all of the hardware, software, and documentation associated with a test station. This test station may be used as a...
P1671.6/D6, July 2008
January 1, 2008
IEEE Draft Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML, Exchanging Test Station Information
This document specifies an exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station. This test station may be used as a...
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