IEEE - Institute of Electrical and Electronics Engineers, Inc. - PC62.35/D11, Aug 2007
IEEE Draft Standard Test Specifications for Avalanche Junction Semiconductor Surge-Protective Devices
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 January 2007 |
| Status: | inactive |
| ICS Code (Fuses and other overcurrent protection devices): | 29.120.50 |
| ISBN (Electronic): | 978-1-5044-2727-2 |
Document History
December 12, 2018
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1
Superseded by C62.59-2019. Avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche...
January 1, 2018
IEEE Approved Draft Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components - Corrigendum 1
Avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge...
August 31, 2010
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
Avalanche breakdown diodes used for surge protection in systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge...
PC62.35/D11, Aug 2007
January 1, 2007
IEEE Draft Standard Test Specifications for Avalanche Junction Semiconductor Surge-Protective Devices
A description is not available for this item.
January 31, 1989
IEEE Standard Test Specifications for Avalanche Junction Semiconductor Surge Protective Devices
A two-terminal avalanche junction surge suppressor for surge-protective application on systems with dc to 420-Hz frequency and voltages equal to or less than 1000 V rms or 1200 V dc is considered....