IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1500/D11, Jan 06

IEEE Draft Standard Testability Method for Embedded Core-Based Integrated Circuits

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Status: inactive
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Electronic): 978-1-5044-2467-7

Document History

P1500/D11, Jan 06
January 1, 2006
IEEE Draft Standard Testability Method for Embedded Core-Based Integrated Circuits
A description is not available for this item.
August 29, 2005
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to...
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