IEC - International Electrotechnical Commission - IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 July 2020 |
| Status: | published |
| Page Count: | 44 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention... View More
Document History
IEC 60749-41:2020
July 22, 2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention...