IEC - International Electrotechnical Commission - IEC 62047-42:2022

Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 16 September 2022
Status: published
Page Count: 22
ICS Code (Other semiconductor devices): 31.080.99
abstract:

IEC 62047-42:2022 specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film on microcantilever, which is typical structure of actual micro sensors and... View More

Document History

IEC 62047-42:2022
September 16, 2022
Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
IEC 62047-42:2022 specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film on microcantilever, which is typical structure of actual micro sensors and...
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