IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1505.1/D6, Apr 2019

IEEE Approved Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 13 June 2019
Status: inactive
Page(s): 1 - 157
ICS Code (Plug-and-socket devices. Connectors): 31.220.10
ISBN (Electronic): 978-1-5044-5787-3
Standard:

An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a... View More

Document History

August 20, 2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a...
August 20, 2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 - Redline
An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a...
P1505.1/D6, Apr 2019
June 13, 2019
IEEE Approved Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a...
July 23, 2018
IEEE Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a...
December 30, 2015
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more...
August 1, 2013
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more...
August 1, 2013
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more...
November 21, 2008
IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
This trial-use standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a...
January 1, 2008
IEEE Draft Trial-Use Standard for Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Standard 1505
This document, the IEEE 1505.1 Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Standard 1505 represents an extension to the...
January 1, 2008
IEEE Draft Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
This trial-use standard, IEEE 1505.1 The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 represents an extension to the...
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