IEC - International Electrotechnical Commission - IEC 60747-18-1:2019
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
published
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Organization: | IEC - International Electrotechnical Commission |
Publication Date: | 20 May 2019 |
Status: | published |
Page Count: | 26 |
ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process,... View More
Document History

IEC 60747-18-1:2019
May 20, 2019
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process,...