IEC - International Electrotechnical Commission - IEC 60747-18-1:2019

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 20 May 2019
Status: published
Page Count: 26
ICS Code (Other semiconductor devices): 31.080.99
abstract:

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process,... View More

Document History

IEC 60747-18-1:2019
May 20, 2019
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process,...
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