IEC - International Electrotechnical Commission - IEC 62951-3:2018

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

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Organization: IEC - International Electrotechnical Commission
Publication Date: 7 November 2018
Status: published
Page Count: 22
ICS Code (Other semiconductor devices): 31.080.99
abstract:

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates,... View More

Document History

IEC 62951-3:2018
November 7, 2018
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates,...
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