IEC - International Electrotechnical Commission - IEC 62951-3:2018
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
published
Buy Now
| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 7 November 2018 |
| Status: | published |
| Page Count: | 22 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates,... View More
Document History
IEC 62951-3:2018
November 7, 2018
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates,...