IEEE - Institute of Electrical and Electronics Engineers, Inc. - C57.138-2016

IEEE Recommended Practice for Routine Impulse Tests for Distribution Transformers

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 31 March 2017
Status: active
Page(s): 1 - 68
ICS Code (Transformers. Reactors): 29.180
ISBN (Electronic): 978-1-5044-3710-3
DOI: 10.1109/IEEESTD.2017.7879146
Regular:

General test procedures for performing routine quality control tests that are suitable for high-volume, production line testing are included in this recommended practice. Transformer connections,... View More

Standard:

General test procedures for performing routine quality control tests that are suitable for high-volume, production line testing are included in this recommended practice. Transformer connections,... View More

Document History

C57.138-2016
March 31, 2017
IEEE Recommended Practice for Routine Impulse Tests for Distribution Transformers
General test procedures for performing routine quality control tests that are suitable for high-volume, production line testing are included in this recommended practice. Transformer connections,...
January 1, 2016
IEEE Draft Recommended Practice for Routine Impulse Test for Distribution Transformers
General test procedures for performing routine quality control test that is suitable for high volume, production line testing. Transformer connections, test methods, circuit configurations and...
January 1, 2016
IEEE Approved Draft Recommended Practice for Routine Impulse Test for Distribution Transformers
General test procedures for performing routine quality control test that is suitable for high volume, production line testing. Transformer connections, test methods, circuit configurations and...
July 22, 1998
IEEE Recommended Practice for Routine Impulse Test for Distribution Transformers
General test procedures for performing routine quality control test that is suitable for high-volume, production line testing. Transformer connections, test methods, circuit configurations, and...
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