IEEE - Institute of Electrical and Electronics Engineers, Inc. - 62860-2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 30 July 2013 |
Status: | active |
Page(s): | 1 - 28 |
ICS Code (Physics. Chemistry): | 07.030 |
ICS Code (Transistors): | 31.080.30 |
ISBN (Online): | 978-0-7381-8685-6 |
DOI: | 10.1109/IEEESTD.2013.6617657 |
Standard:
Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics,... View More
Document History

62860-2013
July 30, 2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics,...