IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1450.1-2005

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments

active - Reaffirmed , An Errata is available

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Organization:	IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date:	30 September 2005
Status:	active
Page(s):	1 - 123
ICS Code (Languages used in information technology):	35.060
ISBN (Electronic):	978-0-7381-4733-8
DOI:	10.1109/IEEESTD.2005.97746

Standard:

Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface... View More

Document History

1450.1-2005

September 30, 2005

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments

P1450.1/D22

January 1, 2005

Approved IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Semiconductor Design Environments (Replaced by 1450.1-2005)

A description is not available for this item.

P1450.1/D21

January 1, 2004

Unapproved IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Semiconductor Design Environments (Superseded by IEEE Draft 22)

A description is not available for this item.

IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1450.1-2005

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments

Standard:

Document History

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