IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1241-2000

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

superseded - Superseded by 1241-2010
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 22 June 2001
Status: superseded
Page(s): 1 - 98
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Electronic): 978-0-7381-2725-5
DOI: 10.1109/IEEESTD.2001.92771
Standard:

IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is... View More

Document History

1241-2010
January 14, 2011
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only...
P1241/D6.6, Aug 2009
January 1, 2009
Draft IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only...
P1241/D6.8, Oct 2009
January 1, 2009
Draft IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only...
1241-2000
June 22, 2001
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is...

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