IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1546-2000

IEEE Guide for Digital Test Interchange Format (DTIF) Application

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Status: active
Page Count: 38
ICS Code (Software): 35.080
ISBN (Paper): 0-7381-2627-6
ISBN (Online): 0-7381-2628-4
DOI: 10.1109/IEEESTD.2001.245622
Standard:

An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide. This information will be an aid to users in developing tools such as preprocessors... View More

Document History

1546-2000
January 1, 2001
IEEE Guide for Digital Test Interchange Format (DTIF) Application
An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide. This information will be an aid to users in developing tools such as preprocessors and...
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