IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1450-1999
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 September 1999 |
Status: | active |
Page(s): | 1 - 140 |
ICS Code (Languages used in information technology): | 35.060 |
ISBN (Electronic): | 978-0-7381-1647-1 |
DOI: | 10.1109/IEEESTD.1999.90563 |
Standard:
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of... View More
Document History

1450-1999
September 1, 1999
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of...