IEEE - Institute of Electrical and Electronics Engineers, Inc. - C62.36-1991

IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

superseded - Superseded by C62.36-1994
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 10 February 1992
Status: superseded
Page(s): 1 - 36
ICS Code (Fuses and other overcurrent protection devices): 29.120.50
ISBN (Electronic): 978-1-5593-7161-2
DOI: 10.1109/IEEESTD.1992.101081
Standard:

Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or... View More

Document History

November 2, 2016
IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuits
Surge protectors for application on multiconductor balanced or unbalanced information and communications technology (ICT) circuits and smart grid data circuits are addressed in this standard. These...
January 1, 2016
IEEE Approved Draft Standard for Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) circuits, including Smart Grid Data Circuits
This standard applies to surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 V rms, or 1200...
January 1, 2015
IEEE Draft Standard for Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) circuits, including Smart Grid Data Circuits
This standard applies to surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 V rms, or 1200...
July 9, 2014
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc are covered by this...
July 9, 2014
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc are covered by this...
July 9, 2014
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits - Redline
Surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc are covered by this...
October 31, 2013
IEEE Draft Standard for Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
This standard applies to surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 V rms, or 1200...
October 13, 2000
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V...
March 31, 1995
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V...
January 1, 1995
1. Scope
A description is not available for this item.
January 1, 1995
2. References
A description is not available for this item.
January 1, 1995
3. Definitions
A description is not available for this item.
January 1, 1995
4. Service Conditions
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January 1, 1995
5. Basic Configurations
A description is not available for this item.
January 1, 1995
6. Standard Design Test Procedure
A description is not available for this item.
January 1, 1995
7. Nonsurge Performance Tests
A description is not available for this item.
January 1, 1995
8. Active Performance Tests
A description is not available for this item.
January 1, 1995
9. Failure Modes
A description is not available for this item.
C62.36-1991
February 10, 1992
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or equal...
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