IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1181-1991

IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Status: inactive
Page Count: 36
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Online): 0-7381-2388-9
DOI: 10.1109/IEEESTD.1991.101074
Standard:

Recommendations are provided for the layout and test methods required to characterize properly latchup behavior in CMOS and BiCMOS integrated circuit processes or other processes that have similar... View More

Document History

1181-1991
January 1, 1991
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization
Recommendations are provided for the layout and test methods required to characterize properly latchup behavior in CMOS and BiCMOS integrated circuit processes or other processes that have similar...
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