IEEE - Institute of Electrical and Electronics Engineers, Inc. - 101-1987

IEEE Guide for the Statistical Analysis of Thermal Life Test Data

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 31 December 1988
Status: active
Page(s): 1 - 34
ISBN (Online): 978-0-7381-0826-1
DOI: 10.1109/IEEESTD.1988.6746635
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Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship... View More

Document History

July 29, 2011
IEEE Guide for the Statistical Analysis of Thermal Life Test Data
Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between...
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101-1987
December 31, 1988
IEEE Guide for the Statistical Analysis of Thermal Life Test Data
Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between...
December 31, 1988
IEEE Guide for the Statistical Analysis of Thermal Life Test Data
Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between...
January 1, 1988
IEEE Guide for the Statistical Analysis of Thermal Life Test Data
Accelerated insulation test procedures usually call for a number of specimens to be aged at each of several temperatures appreciably above normal operating temperatures. High temperatures are chosen...
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