IEEE - Institute of Electrical and Electronics Engineers, Inc. - 641-1987

IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Status: inactive
Page Count: 34
ICS Code (Semiconductor devices in general): 31.080.01
ISBN (Online): 0-7381-4235-2
DOI: 10.1109/IEEESTD.1988.79517
Standard:

This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional... View More

Document History

641-1987
January 1, 1988
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional...
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