IEEE - Institute of Electrical and Electronics Engineers, Inc. - 660-1986

IEEE Standard for Semiconductor Memory Test Pattern Language

inactive - Inactive: Withdrawn
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 18 February 1986
Status: inactive
Page(s): 1 - 14
ISBN (Online): 978-1-5044-0412-9
DOI: 10.1109/IEEESTD.1986.7434526
Regular:

The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify... View More

Document History

660-1986
February 18, 1986
IEEE Standard for Semiconductor Memory Test Pattern Language
The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the...
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