IEEE - Institute of Electrical and Electronics Engineers, Inc. - 759-1984

IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

inactive - Reaffirmed
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 15 December 1984
Status: inactive
Page(s): 1 - 52
ICS Code (Radiation measurements): 17.240
ISBN (Electronic): 978-0-7381-0715-8
DOI: 10.1109/IEEESTD.1984.81758
Standard:

Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented.... View More

Document History

759-1984
December 15, 1984
IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented....
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