IEEE - Institute of Electrical and Electronics Engineers, Inc. - 301-1969

IEEE Test Procedures for Amplifiers and Preamplifiers for SemiConductor Radiation Detectors (For Ionizing Radiation)

superseded - Superseded by
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 11 February 1969
Status: superseded
Page(s): 1 - 22
ISBN (Electronic): 978-1-5044-0277-4
DOI: 10.1109/IEEESTD.1969.7405222
Standard:

Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon finding... View More

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IEEE Standard Test Procedures for Amplifiers and Preamplifiers used with Detectors of Ionizing Radiation
Procedures are given for testing amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of...
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IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semi- Conductor Radiation Detectors for Ionizing Radiation
This standard provides standard test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation. It supersedes the previous edition, IEEE Std 301-1969 (ANSI...
301-1969
February 11, 1969
IEEE Test Procedures for Amplifiers and Preamplifiers for SemiConductor Radiation Detectors (For Ionizing Radiation)
Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon finding its...
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