IEEE - Institute of Electrical and Electronics Engineers, Inc. - 256-1963
IEEE Test Procedure for Semiconductor Diodes
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 20 December 1963 |
Status: | inactive |
Page(s): | 1 - 10 |
ISBN (Online): | 978-1-5044-0227-9 |
DOI: | 10.1109/IEEESTD.1963.7385415 |
Regular:
This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes, For the purpose of this Standard, a semiconductor diode is... View More
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256-1963
December 20, 1963
IEEE Test Procedure for Semiconductor Diodes
This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes, For the purpose of this Standard, a semiconductor diode is defined...