IEEE - Institute of Electrical and Electronics Engineers, Inc. - 256-1963

IEEE Test Procedure for Semiconductor Diodes

inactive - Inactive: Withdrawn
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 20 December 1963
Status: inactive
Page(s): 1 - 10
ISBN (Online): 978-1-5044-0227-9
DOI: 10.1109/IEEESTD.1963.7385415
Regular:

This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes, For the purpose of this Standard, a semiconductor diode is... View More

Document History

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256-1963
December 20, 1963
IEEE Test Procedure for Semiconductor Diodes
This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes, For the purpose of this Standard, a semiconductor diode is defined...
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