IEEE - Institute of Electrical and Electronics Engineers, Inc. - 256-1963

IEEE Test Procedure for Semiconductor Diodes

inactive - Inactive: Withdrawn
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 20 December 1963
Status: inactive
Page(s): 1 - 10
ISBN (Online): 978-1-5044-0227-9
DOI: 10.1109/IEEESTD.1963.7385415
Regular:

This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes, For the purpose of this Standard, a semiconductor diode is... View More

Document History

ST 256:1996
December 3, 1996
For Television — Specifications for Video Tape Leader
(1.1) This standard specifies the minimum requirements for the content and duration of signals recorded prior to the start of the recorded program material to permit setup and adjustment of equipment...
256-1963
December 20, 1963
IEEE Test Procedure for Semiconductor Diodes
This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes, For the purpose of this Standard, a semiconductor diode is defined...

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