IEEE - Institute of Electrical and Electronics Engineers, Inc. - 216-1960

IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms

inactive - Reaffirmed , Inactive: Withdrawn
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 31 October 1960
Status: inactive
Page Count: 4
Page(s): 1 - 4
ICS Code (Electronics (Vocabularies)): 01.040.31
ICS Code (Semiconductor devices in general): 31.080.01
ISBN (Online): 978-0-7381-4352-1
DOI: 10.1109/IEEESTD.1960.81705
Standard:

Definitions of Semiconductor Terms

Document History

RP 216:2002
August 14, 2002
Specifications for 3-Perforation Test and Alignment Film for 35-mm Motion Pictures
This practice specifies the format, dimensions, and optical densities of a test and alignment chart for 3-perforation 35-mm motion-picture film. The image is designed for use as an operational...
ST 216:1998
September 24, 1998
For Motion-Picture Film (35-mm) — Four-Track Striped Release Prints — Recorded Characteristic of Magnetic Audio Records
This standard specifies the recorded characteristic of magnetic audio records on 35-mm four-track striped motion-picture release prints, when reproduced at 24 frames per second or approximately 90 ft...
216-1960
October 31, 1960
IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
Definitions of Semiconductor Terms

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