IEEE - Institute of Electrical and Electronics Engineers, Inc. - 425-1957
AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols
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Inactive: Withdrawn
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 23 August 1957 |
| Status: | inactive |
| Page(s): | 1 - 40 |
| ISBN (Online): | 978-1-5044-0341-2 |
| DOI: | 10.1109/IEEESTD.1957.7419169 |
Regular:
The paper discussed the test code for transistors, its semiconductor definitions and letter symbols.
Standard:
Test code for Transistors - semiconductor definitions and letter symbols.
Document History
March 30, 2011
Source Image Format and Ancillary Data Mapping for the 3 Gb/s Serial Interface
This standard defines three mapping formats: Level A, Level B Dual-Link mapping and Level B Dual-Stream mapping as described below; — Level A specifies: — The direct mapping of various uncompressed...
425-1957
August 23, 1957
AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols
The paper discussed the test code for transistors, its semiconductor definitions and letter symbols.
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