IEEE - Institute of Electrical and Electronics Engineers, Inc. - 425-1957

AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols

inactive - Inactive: Withdrawn
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 23 August 1957
Status: inactive
Page(s): 1 - 40
ISBN (Online): 978-1-5044-0341-2
DOI: 10.1109/IEEESTD.1957.7419169
Regular:

The paper discussed the test code for transistors, its semiconductor definitions and letter symbols.

Standard:

Test code for Transistors - semiconductor definitions and letter symbols.

Document History

ST 425-1:2011
March 30, 2011
Source Image Format and Ancillary Data Mapping for the 3 Gb/s Serial Interface
This standard defines three mapping formats: Level A, Level B Dual-Link mapping and Level B Dual-Stream mapping as described below; — Level A specifies: — The direct mapping of various uncompressed...
425-1957
August 23, 1957
AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols
The paper discussed the test code for transistors, its semiconductor definitions and letter symbols.

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