loading
Towards a (more) electronic transmission and distribution (eT&D)
2017 Edition, Volume 1, March 1, 2017 - CES

The challenges and the path towards a (more) electronic transmission and distribution (eT&D) is presented in this paper. The challenges are first identified together with key stakeholders in the drive for grid modernization....

An experimental comparison of Chen et al. and Bruβ quantum key distribution protocols
2015 Edition, September 1, 2015 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The practical implementation of quantum information technologies requires, for the most part, highly advanced and currently experimental procedures. One exception is quantum cryptography, or quantum key distribution, which has been successfully demonstrated in many laboratories...

On the security of Park et al.'s key distribution protocol for digital mobile communications
1996 Edition, Volume 3, January 1, 1996 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Park et al. (see Proceedings of EuroCrypto '93, p.T131, 1993) previously proposed an efficient key distribution scheme for digital mobile communications. Two attacks are given in this paper to show that their scheme is not secure enough for session key distributions. A...

GPS-inspired Stretchable Self-powered Electronic Skin
Volume PP - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Electronic skin has attracted much attention for their profound implications for human/machine interaction and medicine recently. To imitate the unique characteristics of skin, the electronic skin is moving towards stretchable, multifunctional, biodegradable, more...

Sea Clutter: Scattering, the K Distribution and Radar Performance (Ward, K.D., et al.; 2006) [Book Review]
2007 Edition, Volume 22, January 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.
A description is not available for this item.
Corrections to “An Original Smart-Grids Test Bed to Teach Feeder Automation Functions in a Distribution Grid” [Jan 18 373-385]
2018 Edition, Volume 33, July 1, 2018 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Presents corrections to the paper, "An original smart-grids test bed to teach feeder automation functions in a distribution grid," (Alvarez, M.C., et al), IEEE Trans. Power Syst., vol. 33, no. 1, pp. 373-385, Jan. 2018.

Corrections to “Multilevel MVDC Link Strategy of High-Frequency-Link DC Transformer Based on Switched Capacitor for MVDC Power Distribution” [Apr 17 2829-2835]
2017 Edition, Volume 64, September 1, 2017 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Presents corrections to the paper, "Multilevel MVDC Link Strategy of High-Frequency-Link DC Transformer Based on Switched Capacitor for MVDC Power Distribution," (Wang, Y., et al), IEEE Trans. Ind. Electron. vol. 64, no. 4, pp. 2829-2835, Apr. 2017.

Towards Approximating the Mean Time to Failure in Vehicular Clouds
Volume PP - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In a recent paper, Ghazizadeh et al. have studied vehicular clouds running on top of the vehicles in the parking lot of a major airport. The defining difference between vehicular clouds and their conventional counterparts is the unpredictable availability of...

The ET system - high speed event transfer and distribution via shared memory and networks
2007 Edition, Volume 1, October 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The event transfer (ET) system manages and distributes high volume data as it is being produced in real time. After data creation and insertion into the system, other processes can retrieve the data based on selection criteria, possibly modify the data, then return the data to...

A Comprehensive Review toward the State-of-the-Art in Failure and Lifetime Predictions of Power Electronic Devices
Volume PP - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This paper discusses various types of failure mechanisms, precursor parameters, and accelerated aging- based procedures to estimate the remaining life of power electronic devices. Special attention has been given to summarize the different techniques typically used for measuring the...

Advertisement