IEC 62047-34:2019 - Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
April 5, 2019 - IEC - International Electrotechnical Commission

IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on...

Enhancing Power Delivery System Designs with CMOS-Based Isolated Gate Drivers (.pdf)
Silicon Labs

As emerging green standards challenge designers to deliver more energy-efficient, cost-effective and reliable power delivery systems in smaller form factors, the need for greater power and isolation device integration becomes increasingly important. A critical building block within ac-dc and...

IEC 62047-33:2019 - Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
April 5, 2019 - IEC - International Electrotechnical Commission

IEC 62047-33:2019 (E) defines terms, definitions, essential ratings and characteristics, as well as test methods applicable to MEMS piezoresistive pressure-sensitive device. This document applies to piezoresistive pressure-sensitive devices for automotive, medical treatment, electronic...

Quartz Crystal and MEMS Oscillators Performance
ECS Inc. International

When the discussion of oscillators comes up, the same question will arise. What is the choice for performance in critical applications, MEMS (Micro-Electro-Mechanical Systems) or quartz-based oscillators? MEMS-based oscillators have been available on the market since 2005. In...

Development of a Damped Piezoresistive MEMS High Shock Sensor
PCB Piezotronics, Inc.

Piezoresistive (PR) silicon accelerometers with micro-electromechanical systems (MEMS) technology are preferred in many high shock impact measurements. These devices exploit the strength of single crystal silicon (SCS) along with the minimal zero shifting associated with PR sensors....

Using MEMS Microphone in Sound Level Meters
Convergence Instruments

A measurement-class microphone such as a 0.5 in ICP microphone is typically a sizable part of the cost of a sound-level meter (SLM). That high instrument cost in turn constrains applications such as construction site monitoring or environmental studies, where many instruments are desired....

IEC 62047-5:2011 - Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
July 13, 2011 - IEC - International Electrotechnical Commission

IEC 62047-5:2011 describes terminology, definition, symbols, test methods that can be used to evaluate and determine the essential ratings and characteristic parameters of RF MEMS switches. The statements made in this standardization are also applicable to RF (Radio Frequency)...

Using MEMS Microphones in Sound Level Meters
Convergence Instruments

Given the pressure that the consumer market keeps applying to the industry, the quality of signal offered by MEMS microphones is constantly improving.

Manufacturing and Applications of MEMS Pressure Sensors
Merit Sensor Systems

See Merit Sensor's in-house wafer fab and assembly areas, where all the company's MEMS piezoresistive pressure sensors are manufactured. It also shows some of the applications into which Merit Sensor's products have been designed.

Innovative Foundry System Using Piezoelectric MEMS Technology
ROHM Semiconductor USA, LLC

Voltage and ferroelectric characteristics are important factors in determining the performance of piezoelectric MEMS. ROHM is focusing on developing a thinner lead zirconate titanate (PZT) material featuring superior voltage and ferroelectric properties.