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A CMOS 64×48 Single Photon Avalanche Diode Array with Event-Driven Readout
2006 Edition, September 1, 2006 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This paper presents a CMOS array of 64times48 pixels capable of detecting single photons with timing accuracies better than 80ps. Upon photon arrival, a digital pulse is generated and routed by an event-driven digital...

A 32×32 single photon avalanche diode imager with delay-insensitive address-event readout
2011 Edition, May 1, 2011 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

We report the design and test of a 32×32 array of single photon avalanche diodes. The imager uses a delay-insensitive address-event link for the readout. The chip is fabricated in 0.18µm CMOS in an area of 1.886×1.866 of which 4%...

Passive CMOS Single Photon Avalanche Diode Imager for a Gun Muzzle Flash Detection System
Volume PP - IEEE - Institute of Electrical and Electronics Engineers, Inc.

We present the architecture and design of a novel 64 x 64 CMOS single-photon avalanche diode (SPAD)-based imager for gun muzzle flash detection. The imager is fabricated in a standard front side illuminated 0.18 μ m CMOS Image...

Fully integrated linear single photon avalanche diode (SPAD) array with parallel readout circuit in a standard 180 nm CMOS process
2010 Edition, December 1, 2010 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In recent years, sensors capable of detecting single photons are required for imaging systems in, for example, astronomy, laser ranging, optical time-domain reflectometry (OTDR), single molecule detection, fluorescence decay and biomedical imaging [1]. In response to a...

Readout architectures for high efficiency in Time-Correlated Single Photon Counting experiments - Analysis and review
Volume PP - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In recent years, Time-Correlated Single Photon Counting (TCSPC) has becoming the technique of choice in many life science analyses, where fast and faint luminous signals are recorded with picosecond accuracy. Nevertheless, the maximum operating frequency of a...

Readout Architectures for High Efficiency in Time-Correlated Single Photon Counting Experiments—Analysis and Review
2017 Edition, Volume 9, June 1, 2017 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In recent years, time-correlated single photon counting (TCSPC) has become the technique of choice in many life science analyses, where fast and faint luminous signals are recorded with picosecond accuracy. Nevertheless, the maximum operating frequency of a single...

Photon counting imagers based on high-fill-factor silicon geiger-mode avalanche photodiode arrays
2014 Edition, December 1, 2014 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Geiger-mode avalanche photodiodes (APDs) have been used as single-photon-sensitive optical detectors for applications such as lidar imaging, laser spectroscopy, and optical communications. They are biased above the avalanche breakdown voltage, where the absorption of...

A scalable 20 ×20 fully asynchronous SPAD-based imaging sensor with AER readout
2015 Edition, May 1, 2015 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In this paper we present a scalable 20×20 event-based imaging array. Each pixel consists of a large area (1200 μm2) single photon avalanche diode with dynamic quenching circuitry, compact 9-bit analog counter, comparator, and...

100 000 Frames/s 64 × 32 Single-Photon Detector Array for 2-D Imaging and 3-D Ranging
2014 Edition, Volume 20, November 1, 2014 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

We report on the design and characterization of a multipurpose 64 × 32 CMOS single-photon avalanche diode (SPAD) array. The chip is fabricated in a high-voltage 0.35-μm CMOS technology and consists of 2048 pixels, each combining...

A CMOS imaging platform using single photon avalanche diode array in standard technology
2017 Edition, October 1, 2017 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

A compact single-photon avalanche diode (SPAD) testing array fabricated in standard 0.18μm CMOS technology is presented. Four types of SPAD are designed in 18μm pixel pitch with 3μm active region and arranged in four 16×30 sub-arrays....

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