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A highly sensitive strobed comparator
1981 Edition, Volume 16, April 1, 1981 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

A sensitive strobed comparator has been designed and extensively characterized. It is realized in a standard NMOS silicon-gate process, occupying a die area of 0.05 mm/SUP 2/ (81/mil/SUP 2/). Power consumption is 1 mW from a single 10 V supply....

A high-speed, low-power, strobed comparator
1970 Edition, Volume XIII, January 1, 1970 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

A monolithic integrated comparator providing interrogation of a 3-mV difference signal in a 2-ns window will be presented: 10-ns delay and fast recovery permit operation to 20 MHz as a comparator, detector or data register.

High-Speed Low-Power MOS-Comparator for 20 MHz LSI Parallel A/D Converters
1979 Edition, September 1, 1979 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

A monolithic integrated comparator is presented for strobed interrogation of a difference voltage. The comparator has a dc-offset of 5 mV and provides a logic level output representing the interrogated input within 40 ns of the strobe input....

A 12 b 500 ns subranging ADC
1989 Edition, January 1, 1989 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The author describes a 12-b, 500-ns subranging A/D (analog/digital) converter which includes a voltage reference, a clock generator, and full microprocessor-bus-interface control logic. The subranging architecture includes analog and digital correction, which reduces the...

RP 120:2005 - Measurement of Intermodulation Distortion in Audio Systems
2005 Edition, April 6, 2005 - Society of Motion Picture and Television Engineers

This practice specifies the technique of measuring, by the intermodulation method, the signal distortion introduced by audio systems.

120-1989 - IEEE Master Test Guide for Electrical Measurements in Power Circuits
1989 Edition, November 10, 1989 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Instructions are given for measuring electrical quantities that are commonly needed to determine the performance characteristics of electric machinery and equipment. Methods are given for measuring voltage, current, power, energy, power factor, frequency, impedance, and magnetic quantities, with...

120-1955 - IEEE Standard for Master Test Code for Electrical Measurements in Power Circuits
1955 Edition, November 25, 1955 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The methods given here include measurements, as made with either indicating or integrating instruments, of power, voltage and current in direct current and alternating-current single-phase and polyphase rotating machinery, transformers, induction apparatus, arc and resistance heating equipment and...

A 100µV 120ns strobed comparator
1979 Edition, Volume XXII, January 1, 1979 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

A monolithic voltage comparator which allows the sign determination of signals down to the 100μV region, which are preceded by large amplitudes of opposite sign, will be discussed. The circuit is capable of indicating settling times in the neighborhood of 100ns.

181-2011 - IEEE Standard for Transitions, Pulses, and Related Waveforms
2011 Edition, September 6, 2011 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable...

181-2011 - IEEE Standard for Transitions, Pulses, and Related Waveforms - Redline
2011 Edition, September 6, 2011 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable...

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