loading
Microscopy Immune to Sample-Induced Dephasing
2018 Edition, September 1, 2018 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In microscopy it is commonly assumed that the point spread function is unaffected by the sample, a big assumption considering that cell studies have reported sample-induced phase changes of more than a wavelength. Here we describe a method that does away with...

4-2013 - IEEE Standard for High-Voltage Testing Techniques - Redline
2013 Edition, May 10, 2013 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Standard methods and basic techniques for high-voltage testing applicable to all typesof apparatus for alternating voltages, direct voltages, lightning impulse voltages, switchingimpulse voltages, and impulse currents are established in this standard. Sections that deal withalternating...

4-2013 - IEEE Standard for High-Voltage Testing Techniques
2013 Edition, May 10, 2013 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating...

4a-2001 - Amendment to IEEE Standard Techniques for High-Voltage Testing
2001 Edition, March 21, 2001 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.

Influence of exciton-phonon scattering on self-induced transmission in semiconductors
2001 Edition, January 1, 2001 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Summary form only given. High-intensity pulse propagation of femtosecond laser pulses in optically thick semiconductor crystals can lead to self-induced transmission when the laser is tuned to a free exciton resonance. This effect means that at intensities on the order of...

4-1995 - IEEE Standard Techniques for High-Voltage Testing
1995 Edition, October 12, 1995 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents....

4-1978 - IEEE Standard Techniques for High-Voltage Testing
1978 Edition, January 1, 1978 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This IEEE standard establishes standard methods of measurement of HV and basic testing techniques for application to all types of apparatus. The first section defines terms and presents general requirements regarding tests. Section 2 defines terms relating to the specific tests and...

4-1942 - AIEE American Standards for Measurement of Test Voltage in Dielectric Tests
1942 Edition, February 23, 1942 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In this Standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electric apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests.3. Voltage proof tests. The tests may involve the use of...

4-1940 - AIEE Standards for Measurement of Test Voltage in Dielectric tests
1940 Edition, May 31, 1940 - IEEE - Institute of Electrical and Electronics Engineers, Inc.
A description is not available for this item.
ST 4:1995 - For Television Analog Recording — 2-in Magnetic Tape for Quadruplex Recording — Speed
1995 Edition, January 3, 1995 - Society of Motion Picture and Television Engineers

This standard specifies the nominal rates of travel of 2-in wide magnetic tape for quadruplex video magnetic tape recording.

Advertisement