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Thermal excursion accelerating factors [GaAs reliability testing]
1999 Edition, January 1, 1999 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

For more than a decade, the focus of GaAs reliability testing has been on high temperature life testing. Several failure mechanisms are highly accelerated by temperature, so this methodology has produced data that is easy to analyze and straightforward to predict...

Reliability testing of electric motors
1988 Edition, January 1, 1988 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Several motor failure mechanisms are discussed, along with test methods to determine whether a motor is suitable for extended service. Application and limitations of these test procedures are described.< >

Connector Reliability Testing: Noise Spectral Analysis
1991 Edition, January 1, 1991 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The large contribution of connectors to electronic systems unreliability is widely recognized. On the other hand there is even uncertainty about how best to define contact failure. However since connnector reliability test must ultimately match the needs of the electronics...

Reliability testing of electric motors
1989 Edition, Volume 25, May 1, 1989 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Several motor failure mechanisms and test methods to determine whether a motor is suitable for extended service are discussed. Application and limitations of these test procedures are described. It is concluded that motor windings fail because the magnetic forces which...

Reliability Testing for Hostile Environments
1970 Edition, April 1, 1970 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

To insure the reliable operation of electronic components under the different environmental conditions encountered in the field, IBM has established an environmental reliability program. The intent of this program is to first simulate field conditions and then to develop. accelerating...

Beidou receiver based on DSP embedded software reliability testing scheme
2013 Edition, October 1, 2013 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Reliability test is the important means to improve the software reliability and to assure the software quality. In this paper, aimed at the Beidou receiver DSP embedded software, introduced the main test module and the test method for its unit...

Reliability tests for system-on-chip design
2004 Edition, Volume 2, January 1, 2004 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

System-on-chip (SoC) has created a new set of design challenges. The higher integration capacity of SoC reduces the number of components in the system and trims the size and routing complexity of the printed circuit board. Reliability tests for such systems were...

Study of Software Reliability Test Application Framework
2010 Edition, Volume 1, August 1, 2010 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

A new framework is proposed to instruct and automate the process of embedded software reliability test. The structure and characteristics of SRTAF are described in detail based on the test process. Simulation models and data models as the main parts...

Reliability testing of structures with road loadings
2012 Edition, June 1, 2012 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In today's global environment, accelerated life testing is becoming a competitive advantage when time spent from conceptual stage to the final product development needs to be minimized (project costs and development time) in order to be successful. Using accelerated life...

Integrated reliability growth testing
1989 Edition, January 1, 1989 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Testing in development programs for complex systems consists of numerous types, from early prototype testing to functional testing, environmental testing, safety testing, reliability demos, and test-analyze-and-fix (TAAF)...

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