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Combined reliability test for software-hardware system
2014 Edition, June 1, 2014 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

In the traditional reliability test for system, the reliability of software is usually regarded as "1", therefore the software and hardware correlated failures cannot be motivated, which lead to the inaccuracy of the reliability evaluation result. An approach of...

Laser diode burn-in and reliability testing
2006 Edition, Volume 44, February 1, 2006 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

More than 99 percent of all lasers manufactured in the world today are semiconductor laser diodes. Reliability is a concern in every laser diode application, whether it is a simple $10 laser pointer or a space-qualified optical transmitter link. The commercial success of a laser supplier...

Rational design of conditions for reliability test
2009 Edition, July 1, 2009 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This article deals with the problems associated to practical determining the reliability test scope. The author presents his own findings and experience resulting from his participation in testing reliability of many technical systems. Main attention is dedicated...

Software reliability-growth test and the software reliability-testing platform
1997 Edition, January 1, 1997 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Software users are interested in the MTTF value of software. The rules of /spl lambda/ Pareto diagrams are in general quite different from one software to another. We cannot get an analytical expression to describe the pattern of /spl lambda/ Pareto diagram and be generally suitable to all...

Reliability testing of rule-based systems
1996 Edition, Volume 13, September 1, 1996 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Rule-based software systems are becoming more common in industrial settings, particularly to monitor and control large, real-time systems. The authors describe an algorithm for reliability testing of rule-based systems and their experience using it to test an...

Package-On-Package Mechanical Reliability Characterization
2007 Edition, December 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

POP (package-on-package) integration is achieved by stacking laminate substrate packages in vertical direction and interconnecting them with solder balls. Some mechanical reliability issues were addressed through POP development. In particular,...

Parametric reliability test: wafer surface contamination study
2002 Edition, January 1, 2002 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Reliability tests are usually labor and time intensive that makes it difficult to provide reliability assessments in a cost effective and timely manner. On the other hand, the test should be sufficiently sensitive to satisfy experimental requirements...

Rapid reliability testing discussion session
2014 Edition, October 1, 2014 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Presents the opening page to the panel discussion.

Reliability testing by precise electrical measurement
1988 Edition, January 1, 1988 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Tests have been devised which provide indication of incipient failure of CMOS devices. The experimental methodology to confirm the value of the tests depends on the acceptance of the Arrenhius relationships as it was investigated using accelerated life test techniques....

Reliability test for integrated Glass interposer
2016 Edition, April 1, 2016 - The Japan Institute of Electronics Packaging

In this paper, we investigated the reliability test for Glass interposer. The test vehicle is assembled glass interposer with chip, BT substrate, and PCB. The structure of a glass interposer with two RDL on the front-side and one RDL on the backside...

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