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ASTM D6653/D6653M-01(2010)e1 - Standard Test Methods for Determining the Effects of High Altitude on Packaging Systems by Vacuum Method
October 1, 2010 - ASTM International

1.1 These test methods determine the effects of pressure differential when packaged products are transported via certain modes of transport, such as feeder aircraft or ground over high mountain passes. The results of these tests are intended to be used for qualitative purposes....

IEC 60749-30:2005 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
January 20, 2005 - IEC - International Electrotechnical Commission

Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple...

ASTM D6653-01(2006) - Standard Test Methods for Determining the Effects of High Altitude on Packaging Systems by Vacuum Method
November 1, 2006 - ASTM International

1.1 These test methods determine the effects of pressure differential when packaged products are transported via certain modes of transport, such as feeder aircraft or ground over high mountain passes. The results of these tests are intended to be used for qualitative purposes....

Consumer-Centric Manufacturing and Its Impact on Packaging Strategy
Soft Robotics

The Fourth Industrial Revolution has ushered in a new consumer-driven manufacturing landscape. The consumer is truly king in this new world where companies like Amazon have set a new standard for expectations around choice, control, convenience and experience.

IEC 60605-4:1986/AMD1:1989 - Amendment 1 - Equipment reliability testing. Part 4: Procedures for determining point estimates and confidence limits for equipment reliability determination tests
August 15, 1989 - IEC - International Electrotechnical Commission

The contents of the corrigendum of December 1989 have been included in this copy.

IEC 60605-7:1978 - Equipment reliability testing. Part 7: Compliance test plans for failure rate and mean time between failures assuming constant failure rate.
January 1, 1978 - IEC - International Electrotechnical Commission

Gives the statistical test plans which are valid for reliability compliance tests concerning failure rate, mean time between failures and mean time to failure. Should be used in conjunction with IEC 605-1.

IEC 61124:2012 - Reliability testing - Compliance tests for constant failure rate and constant failure intensity
May 23, 2012 - IEC - International Electrotechnical Commission

IEC 61124:2012 gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to...

IEC 61124:2006 - Reliability testing - Compliance tests for constant failure rate and constant failure intensity
March 15, 2006 - IEC - International Electrotechnical Commission

This International Standard gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on...

IEC 61124:2012/COR1:2013 - Corrigendum 1 - Reliability testing - Compliance tests for constant failure rate and constant failure intensity
January 25, 2013 - IEC - International Electrotechnical Commission
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