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IEC 61123:1991 - Reliability testing - Compliance test plans for success ratio
December 24, 1991 - IEC - International Electrotechnical Commission

Specifies procedures for applying and preparing compliance test plans for success ratio or failure ratio. The procedures are based on the assumption that each trial is statistically independent. Supersedes IEC 605-5 and its amendment 1.

IEC 62343-2-1:2019 - Dynamic modules - Part 2-1: Reliability qualification - Test template
September 16, 2019 - IEC - International Electrotechnical Commission

IEC 62343-2-1:2019 provides a reliability qualification test template for dynamic modules (DMs). The template describes the reliability qualification test items and provides information on requirements or options. Example test conditions are given...

IEC 60605-2:1994 - Equipment reliability testing - Part 2: Design of test cycles
October 12, 1994 - IEC - International Electrotechnical Commission

It applies to the design of operating and environmental test cycles referred to in 8.1 and 8.2 of IEC 605-1.

IEC PAS 62182:2000 - Preconditioning of nonhermetic surface mount devices prior to reliability testing
September 14, 2000 - IEC - International Electrotechnical Commission

Establishes an industry standard preconditioning flow for nonhermetic solid state surface mount devices that is representative of a typical industry multiple solder reflow operation.

Is Your Reliability Testing Program Keeping Pace with Manufacturing and Design Advancements?
ESPEC North America Inc | Qualmark Products and Services

The ever increasing pressure to more quickly deliver higher reliability products at lower costs is prevalent throughout major industries, such as avionics, communications, networking equipment, computer systems, medical, and defense and has led to new design and...

IEC 60300-3-5:2001 - Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
March 7, 2001 - IEC - International Electrotechnical Commission

Provides guidelines for the planning and performing of reliability tests and the use of statistical methods to analyse test data. Describes the tests related to repaired and non-repaired items together with tests for constant and...

ASTM D6653/D6653M-13 - Standard Test Methods for Determining the Effects of High Altitude on Packaging Systems by Vacuum Method
January 15, 2013 - ASTM International

1.1 These test methods determine the effects of pressure differential when packaged products are transported via certain modes of transport, such as feeder aircraft or ground over high mountain passes. The results of these tests are intended to be used for qualitative purposes....

IEC 60749-30:2005+AMD1:2011 CSV - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
August 10, 2011 - IEC - International Electrotechnical Commission

IEC 60749-30:2005+A1:2011 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a...

IEC 62059-31-1:2008 - Electricity metering equipment - Dependability - Part 31-1: Accelerated reliability testing - Elevated temperature and humidity
October 21, 2008 - IEC - International Electrotechnical Commission

IEC 62059-31-1:2008 provides one of several possible methods for estimating product life characteristics by accelerated reliability testing. In this standard, elevated, constant temperature and humidity is applied to achieve acceleration. The method takes into account the...

IEC TS 62861:2017 - Guidelines for principal component reliability testing for LED light sources and LED luminaires
March 3, 2017 - IEC - International Electrotechnical Commission

IEC TS 62861:2017(E) This Technical Specification provides guidelines for establishing confidence in product reliability using principal component testing for LED light sources and LED luminaires for general lighting. It includes methods and criteria using initial...

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