Formalizing System Behavior for Evaluating a System Hang Detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Long Wang; Z. Kalbarczyk; R.K. Iyer
Year: 2008
Availability of Globally Distributed Nodes: An Empirical Evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Warns; C. Storm; W. Hasselbring
Year: 2008
IMS vs. P2P and Web 2.0 - Understanding the Role of the IP Multimedia System (IMS) in Face of a Converging Telco and Internet Service World
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Magedanz
Year: 2008
Trends and Challenges of Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Brasche
Year: 2008
The OtaSizzle Project: Large-Scale Service Experimentation Testbed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Mantyla
Year: 2008
Dynamic Context Monitoring Service for Adaptive and Context-Aware Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Laitakari; D. Pakkala
Year: 2008
DAGR – DAG Based Context Reasoning: An Architecture for Context Aware Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.N. Klein; Sian Lun Lau; A. Pirali; T. Loffler; K. David
Year: 2008
Analyzing Context-Aware Service Development under MUPE Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Jaaskelainen; J. Lautamaki
Year: 2008
Collaborative Transmission in Wireless Sensor Networks by a (1 + 1)-EA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sigg; M. Beigl
Year: 2008
USEME: A Service-Oriented Framework for Wireless Sensor and Actor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Caete; J. Chen; M. Diaz; L. Llopis; B. Rubio
Year: 2008
A P2P-Based Middleware for Wide-Area Service Discovery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Louati; D. Zeghlache
Year: 2008
Adaptive Services in a Distributed Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.K. Benko; E. Hofig; N. Brgulja; R. Kusber
Year: 2008
Delivering RSS-Feeds over SIP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Korpela; J. Manner
Year: 2008
Combining Passive Autoconfiguration and Anomaly-Based Intrusion Detection in Ad Hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Schuhmann; L. Volker
Year: 2008
Tandem Smart Cards: Enforcing Trust for TLS-Based Network Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Urien; S. Elrharbi
Year: 2008
“The European cancer informatics landscape: Challenges for the biomedical informatics community”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Tsiknakis
Year: 2008
“Model-based strategies for biomedical image analysis”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.S. Duncan
Year: 2008
“Frontiers of Neuroengineering with focus on brain machine interface and neural prostheses”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Thakor
Year: 2008
“Quo vadis cardiovascular informatics?”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Kakadiaris
Year: 2008
“On growth of ellipsoidal tumours”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Dassios
Year: 2008
“An effective approach to Magnetoencephalography”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fokas
Year: 2008
“Biobanks, biomolecular resources and bioinformatics for health care and medical research in Europe”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Bongcam-Rudloff
Year: 2008
On ellipsoidal tumours
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Dassios
Year: 2008
A branch-and-bound approach to knowledge-based protein structure assembly
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaolin Zheng; G. Narasimhan
Year: 2008
GPM: A graph pattern matching kernel with diffusion for chemical compound classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Smalter; Jun Huan; G. Lushington
Year: 2008
Structure feature selection for chemical compound classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hongliang Fei; Jun Huan
Year: 2008
An enhanced Markov clustering method for detecting protein complexes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.N. Moschopoulos; G.A. Pavlopoulos; S.D. Likothanassis; S. Kossida
Year: 2008
Clinical trial simulation in Grid environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Kyriazis; A. Menychtas; D. Dionysiou; G. Stamatakos; T. Varvarigou
Year: 2008
Fast parallel bio-molecular logic computing algorithms of discrete logarithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ho; Yu-Ying Shih
Year: 2008
A web based tool for integration of molecular pathway models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Sciacca; V. Ayyadurai; C.F. Dewey
Year: 2008
Faster greedy algorithms for Multiple Degenerate Primer Selection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Balla; S. Rajasekaran; I.I. Mandoiu
Year: 2008
Clock-constrained tree proposal operators in Bayesian phylogenetic inference
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hohna; M. Defoin-Platel; A.J. Drummond
Year: 2008
Genetic algorithm based feature selection for mass spectrometry data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yifeng Li; Yihui Liu; Li Bai
Year: 2008
Automatic quality assessment for fluorescence microscopy images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Paul; D. Kalamatianos; H. Duessmann; H. Huber
Year: 2008
A study of the parameters affecting minimum detectable activity concentration level of clinical LSO PET scanners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.A. Karakatsanis; K.S. Nikita
Year: 2008
VIP: Visualization of integrated proteomics data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.G. Giannopoulou; G. Lepouras; E.S. Manolakos
Year: 2008
Proteomic based identification of cancer biomarkers: The LOCCANDIA integrated platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kalaitzakis; V. Kritsotakis; P. Grangeat; C. Paulus; L. Gerfault; M. Perez; C. Reina; G. Potamias; M. Tsiknakis; D. Kafetzopoulos; P.-A. Binz
Year: 2008
Evaluation of two-dimensional gel electrophoresis maps by local tangent space alignment: An application to neuroproteomics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mazzara; A. Conti; S. Olivieri; S. Iannaccone; M. Alessio; S. Cerutti; L. Pattini
Year: 2008
Inserts in prokaryote genomes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.D. Cristea; R.A. Tuduce; J. Cornelis
Year: 2008
A binary format for genetic data designed for large whole genome studies that enable both marker and strand based analyses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Antoniades; L. Loizou; A. Aristodimou; C.S. Pattichis
Year: 2008
A novel information theoretic method for detecting gene-gene and gene-environment interactions in complex diseases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Chanda; Aidong Zhang; M. Ramanthan
Year: 2008
Gene - nutrition interactions in the onset of obesity as Cardiovascular Disease risk factor based on a computational intelligence method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.K. Valavanis; S.G. Mougiakakou; S. Marinos; G. Karkalis; K.A. Grimaldi; R. Gill; K.S. Nikita
Year: 2008
Charge state determination of peptide tandem mass spectra using support vector machine (SVM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:An-Min Zou; Jiarui Ding; Jin-Hong Shi; Fang-Xiang Wu
Year: 2008
Systematic elicitation of sequence patterns associated with non-proline cis peptide bonds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Exarchos; T.P. Exarchos; C. Papaloukas; A.N. Troganis; D.I. Fotiadis
Year: 2008
Signature genes in human heart failure based on gene expression analysis: Can we identify a unique set?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haiying Wang; Huiru Zheng
Year: 2008
Normalized EM algorithm for tumor clustering using gene expression data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen Minh Phuong; Nguyen Xuan Vinh
Year: 2008
Time series gene expression data clustering and pattern extraction in Arabidopsis thaliana phosphatase-encoding genes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Sobhe Bidari; R. Manshaei; T. Lohrasebi; A. Feizi; M.A. Malboobi; J. Alirezaie
Year: 2008
A novel evolutionary algorithm for bi-clustering of gene expression data based on the Order Preserving Sub-Matrix (OPSM) constraint
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hongchan Roh; Sanghyun Park
Year: 2008
An information theoretic framework for genomic data analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. McKenna; G. Alterovitz
Year: 2008
GOMA: Web utility for direct finding of enriched Gene Ontology terms from gene expression profile
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Mizutani; J. Sese
Year: 2008
Performance validation of microarray analysis methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Zervakis; M.E. Blazadonakis; A. Banti; D. Kafetzopoulos; V. Danilatou; M. Tsiknakis
Year: 2008
Differential gene expression graphs: A data structure for classification in DNA microarrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Benso; S. Di Carlo; G. Politano; L. Sterpone
Year: 2008
A computational approach to microarray universal reference sample
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Tsiliki; S. Kaforou; M. Kapsetaki; G. Potamias; D. Kafetzopoulos
Year: 2008
Combining singular value decomposition and t-test into hybrid approach for significant gene extraction from microarray data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Alshalalfa; R. Alhajj; J. Rokne
Year: 2008
Classification of multiple cancer types in a Hyper Reproducing Kernel Hilbert Space
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Blanco; M. Martin-Merino; J. De Las Rivas
Year: 2008
GOmir: A stand-alone application for human microRNA target analysis and gene ontology clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Zotos; G. Papachristoudis; M.G. Roubelakis; I. Michalopoulos; K.I. Pappa; N.P. Anagnou; S. Kossida
Year: 2008
miRNA target prediction through mining of miRNA relationships
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanju Zhang; J.S. de Bruin; F.J. Verbeek
Year: 2008
Modeling gene regulation and spatial organization of sequence based motifs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Supper; C.A. Kampe; D. Wanke; K.W. Berendzen; K. Harter; R. Bonneau; A. Zell
Year: 2008
Mature miRNA identification via the use of a Naive Bayes classifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Gkirtzou; P. Tsakalides; P. Poirazi
Year: 2008
Motifs in regulatory networks and their structural robustness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Elena; H. Ben-Amor; N. Glade; J. Demongeot
Year: 2008
Extracting decision rules in prediction of protein secondary structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.N. Nguyen; J.M. Zurada; J.C. Rajapakse
Year: 2008
Distance-based indexing of residue contacts for protein structure retrieval and alignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sacan; I.H. Toroslu; H. Ferhatosmanoglu
Year: 2008
Pruning neural networks for protein secondary structure prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Babaei; S.A. Seyyedsalehi; A. Geranmayeh
Year: 2008
Investigation into the role of sequence-driven-features for prediction of protein structural classes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Nanuwa; H. Seker
Year: 2008
Protein similarity networks and Genetic Algorithm driven feature selection for fold recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.K. Valavanis; G.M. Spyrou; K.S. Nikita
Year: 2008
A local structural alignment algorithm with Variable Length Alignment Fragment Pairs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Kundeti; S. Rajasekaran
Year: 2008
A medical, description logic based, ontology for skin lesion images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Maragoudakis; I. Maglogiannis; D. Lymberopoulos
Year: 2008
A framework for the development of Biomedical Text Mining software tools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Lourenco; R. Carreira; S. Carneiro; P. Maia; D. Glez-Pea; F. Fdez-Riverola; E.C. Ferreira; I. Rocha; M. Rocha
Year: 2008
Message communication server for Medical Information Systems’ interoperability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Kolovou; D. Lymberopoulos
Year: 2008
A high throughput approach to keep alive a web-based database system for multiple search among published bioinformatics tools and databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Atlamazoglou; T. Thireou; A. Alexandridou; G. Spyrou
Year: 2008
Parallel integration of heterogeneous genome-wide data sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Greene; K. Bryan; P. Cunningham
Year: 2008
Polyadenylation site prediction using interesting emerging patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Tzanis; I. Kavakiotis; I. Vlahavas
Year: 2008
CASIMIR: Coordination and Sustainability of International Mouse Informatics Resources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M. Hancock; P.N. Schofield; C. Chandras; M. Zouberakis; V. Aidinis; D. Smedley; N. Rosenthal; K. Schughart
Year: 2008
caBIG™: Opportunities and challenges to creating a federated global network of interoperable information systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.A. Komatsoulis
Year: 2008
Database interoperability through Web Services and ontologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sellis; D. Skoutas; K. Staikos
Year: 2008
Towards dynamic database infrastructures for mouse genetics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Swertz; D. Smedley; K. Wolstencroft; R. Alberts; M. Zouberakis; V. Aidinis; K. Schughart; P.N. Schofield; R.C. Jansen
Year: 2008
The Mouse Resource Browser (MRB) - A near-complete registry of mouse resources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Zouberakis; C. Chandras; J.M. Hancock; P.N. Schofield; V. Aidinis
Year: 2008
Using bio-ontologies as data annotation, integration & analytical tools at the Mouse Genome Informatics resource
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V. Anagnostopoulos; J.A. Blake; C.J. Bult; M. Ringwald; J.E. Richardson; J.A. Kadin; J.T. Eppig
Year: 2008
Digital preservation - financial sustainability of biological data and material resources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Chandras; T. Weaver; M. Zouberakis; J.M. Hancock; P.N. Schofield; V. Aidinis
Year: 2008
A novel method for protein 3D-structure similarity measure based on n-gram modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Razmara; S.B. Deris
Year: 2008
Sequence clustering with the Self-Organizing Hidden Markov Model Map
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Ferles; A. Stafylopatis
Year: 2008
Design and implementation of the Smith-Waterman algorithm on the CUDA-compatible GPU
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Munekawa; F. Ino; K. Hagihara
Year: 2008
High performance FPGA-based core for BLAST sequence alignment with the two-hit method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kasap; K. Benkrid; Ying Liu
Year: 2008
Optimizing performance, cost, and sensitivity in pairwise sequence search on a cluster of PlayStations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Aji; Wu-chun Feng
Year: 2008
Adaptive aggregation method for the chemical master equation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jingwei Zhang; L.T. Watson; Yang Cao
Year: 2008
A framework for the integrated analysis of metabolic and regulatory networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Mendes; A. Lourenco; S. Carneiro; M. Rocha; I. Rocha; E.C. Ferreira
Year: 2008
Stability and oscillation of genetic regulatory networks with time delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fang-Xiang Wu
Year: 2008
Building in-silico pathway SBML models from heterogeneous sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Kanaris; K. Moutselos; A. Chatziioannou; I. Maglogiannis; F.N. Kolisis
Year: 2008
A hybrid computational model for phagocyte transmigration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiaxing Xue; Jean Gao; Liping Tang
Year: 2008
Evaluating evolutionary multiobjective algorithms for the in silico optimization of mutant strains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Maia; I. Rocha; E.C. Ferreira; M. Rocha
Year: 2008
Systems analysis of bone mechanotransduction at cellular level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Mynampati; P. Lee Vee Sin
Year: 2008
The benefit of cooperation: Identifying growth-efficient interacting strains of Escherichia coli using metabolic flux balance models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Tzamali; M. Reczko
Year: 2008
An information theoretic divergence for microarray data clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen Xuan Vinh; Nguyen Minh Phuong
Year: 2008
cDNA microarray analysis of a glucocorticoid treated acute lymphoblastic leukemia cell line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.G. Sifakis; G.I. Lambrou; A. Prentza; D. Koutsouris; F. Tzortzatou-Stathopoulou
Year: 2008
Development of a universal, flexible and freely available database management system for gene-centered data collection, curation and display of DNA variation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Zaimidou; S. van Baal; T.D. Smith; K. Mitropoulos; M. Ljujic; D. Radojkovic; R.G. Cotton; G.P. Patrinos
Year: 2008
Use of Gene Ontology semantic information in protein interaction data visualization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Massanet; P. Caminal; A. Perera
Year: 2008
A computer simulation model of gene replacement in vector populations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Guevara; E.E. Vallejo
Year: 2008
Complementary grouping of amino acids based on base-pairing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minseo Park; B.G. Kim
Year: 2008
Identification of active biological networks and common expression conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Seki; J. Sese
Year: 2008
Novel weighted amino acid composition for prediction of protein structural classes within the context of multi-sensor data fusion approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Seker
Year: 2008
Fast parallel bio-molecular logic computing algorithms: Protein folding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Ying Shih; M. Ho
Year: 2008
Detection of transcription factor binding sites using Rényi entropy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Maynou; M. Vallverdu; F. Claria; A. Perera; P. Caminal
Year: 2008
BioSumm: A novel summarizer oriented to biological information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Baralis; A. Fiori; L. Montrucchio
Year: 2008
Maximum likelihood reconstruction for fluorescence Optical Projection Tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Darrell; H. Meyer; U. Birk; K. Marias; M. Brady; J. Ripoll
Year: 2008
Classification of Laser Induced Fluorescence spectra from normal and malignant tissues using Learning Vector Quantization neural network in bladder cancer diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Karemore; M. Nielsen; K.K. Mascarenhas; K.S. Choudhary; A. Patil; V.K. Unnikrishnan; V. Prabhu; A. Chowla; C. Santhosh
Year: 2008
A proposal of a fall detection algorithm for a Multidevice Personal Intelligent Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Estudillo-Valderrama; L.M. Roa; J. Reina-Tosina; D. Naranjo-Hernandez
Year: 2008
Glycaemic stability of the diabetic patient and therapeutic adjustments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Benmakrouha; M.V. Foursov; C. Hespel; J.-P. Hespel
Year: 2008
Translating multiscale cancer models into clinical trials: Simulating breast cancer tumor dynamics within the framework of the “Trial of Principle” clinical trial and the ACGT project.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.A. Kolokotroni; G.S. Stamatakos; D.D. Dionysiou; E.C. Georgiadi; C. Desmedt; N.M. Graf
Year: 2008
Multilevel cancer modeling in the clinical environment: Simulating the behavior of Wilms tumor in the context of the SIOP 2001/GPOH clinical trial and the ACGT project
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.C. Georgiadi; G.S. Stamatakos; N.M. Graf; E.A. Kolokotroni; D.D. Dionysiou; A. Hoppe; N.K. Uzunoglu
Year: 2008
Towards an inclusive computational model of visual cortex
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Gheiratmand; H. Soltanian-Zadeh; H. Khaloozadeh
Year: 2008
Modeling and simulation of Electrical Impedance Tomography (EIT) on ventilated patients with ARDS lungs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Denai; M. Mahfouf; G.H. Mills
Year: 2008
The influence of different bone remodeling equations on a 2-D vertebra model in the final bone density distribution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.G. Vossou; G.S. Savva; C.G. Provatidis
Year: 2008
The influence of infection control policies: A systematic study of the dynamics of an individual-based epidemic model with isolation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Reppas; A.C. Tsoumanis; C.I. Siettos
Year: 2008
Comparative study of Empirical Mode Decomposition applied in experimental biosignals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Karagiannis; P. Constantinou
Year: 2008
On the use of ultrasonic communications in biosensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ifantis; A. Kalis
Year: 2008
Passive focused monitoring and non-invasive irradiation of head tissue phantoms at microwave frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.T. Karathanasis; I.A. Gouzouasis; I.S. Karanasiou; G. Stratakos; N.K. Uzunoglu
Year: 2008
Efficient implementation of biomedical hardware using open source descriptions and behavioral synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Economakos
Year: 2008
A formal language approach for multi-sensor Wearable Health-Monitoring Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pantelopoulos; N. Bourbakis
Year: 2008
A study to demonstrate the use of an air bag device to prevent fall-related injuries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Tamura; T. Yoshimura; M. Sekine
Year: 2008
Flexible data integration and ontology-based data access to medical records
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Zamboulis; A. Poulovassilis; G. Roussos
Year: 2008
Novel metrics of functional network structure and their application to the detection and characterisation of Alzheimer’s disease
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Anastasiou; E. Ifeachor
Year: 2008
HRV complexity as a diagnostic tool for late onset sepsis in sick premature infants
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Wang; G. Carrault; A. Beuchee; L. Senhadji; Huazhong Shu
Year: 2008
Structuring the e-SCP-ECG+ protocol for multi vital-sign handling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.J. Mandellos; M.N. Koukias; D.K. Lymberopoulos
Year: 2008
Point-of-care monitoring and diagnostics for autoimmune diseases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.G. Kalatzis; T.P. Exarchos; N. Giannakeas; S. Markoula; E. Hatzi; P. Rizos; I. Georgiou; D.I. Fotiadis
Year: 2008
Monitoring of patients suffering from special phobias exploiting context and profile information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.C. Panagiotakopoulos; D.K. Lymberopoulos; G.M. Manwlessos
Year: 2008
Assessment of the risk of coronary heart event based on data mining
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Karaolis; J.A. Moutiris; C.S. Pattichis
Year: 2008
Medical disease prediction using Artificial Neural Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.H. Mantzaris; G.C. Anastassopoulos; D.K. Lymberopoulos
Year: 2008
Pathological voice discrimination using cepstral analysis, vector quantization and Hidden Markov Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.C. Costa; B.G. Aguiar Neto; J.M. Fechine
Year: 2008
Classification of Event-Related Potentials associated with response errors in actors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.A. Asvestas; E. Ventouras; I. Karanasiou; G.K. Matsopoulos
Year: 2008
Using agents for feature extraction: Content based image retrieval for medical applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.D. Theodosi; G.A. Tsihrintzis
Year: 2008
Mass detectability in dedicated breast CT: A simulation study with the application of volume noise removal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.Q. Xia; J.Y. Lo
Year: 2008
Susceptibility of texture measures to noise: An application to lung tumor CT images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O.S. Al-Kadi; D. Watson
Year: 2008
Using spiral intensity profile to quantify head and neck cancer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.Y. Kong; Y. Sharma; S.H. Raza; Zhuo Chen; S. Muller; M.D. Wang
Year: 2008
Segmentation of sublingual veins from near infrared sublingual images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zifei Yan; Kuanquan Wang; Naimin Li
Year: 2008
Joining retinal vessel segments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Al-Diri; A. Hunter; D. Steel; M. Habib
Year: 2008
Segmentation of nuclei in cancer tissue images: Contrasting active contours with morphology-based approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Di Cataldo; E. Ficarra; A. Acquaviva; E. Macii
Year: 2008
Local-based fuzzy clustering for segmentation of MR brain images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianzhong Wang; Lili Dou; Na Che; Di Liu; Baoxue Zhang; Jun Kong
Year: 2008
Automatic DNA microarray gridding based on Support Vector Machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Bariamis; D. Maroulis; D.K. Iakovidis
Year: 2008
Improving renal cell carcinoma classification by automatic region of interest selection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Q. Chaudry; S.H. Raza; Y. Sharma; A.N. Young; M.D. Wang
Year: 2008
A machine learning based system for multichannel fluorescence analysis in pancreatic tissue bioimages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Herold; S. Abouna; Luxian Zhou; S. Pelengaris; D.B.A. Epstein; M. Khan; T.W. Nattkemper
Year: 2008
A multiple expert-based melanoma recognition system for dermoscopic images of pigmented skin lesions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Rahman; P. Bhattacharya; B.C. Desai
Year: 2008
Lungs SPECT image processing for volume and perfusion index estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lyra; M. Gavrilelli; V. Lyra; G. Kokona; K. Skouroliakou
Year: 2008
Ultrasound imaging media layer texture analysis of the carotid artery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.P. Loizou; M. Pantziaris; A. Nicolaides; A. Spanias; M.S. Pattichis; C.S. Pattichis
Year: 2008
The study of hepatic NF-κB transcription dynamics via fluorescent image analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. McArdle; K. McMenemy; S. Ferguson
Year: 2008
Medical image authentication and self-correction through an adaptive reversible watermarking technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Fotopoulos; M.L. Stavrinou; A.N. Skodras
Year: 2008
Determination of the mechanoelastic properties of parasites via analysis of their microscopic images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Arabadjis; P. Rousopoulos; C. Papaodysseus; M. Panagopoulos; P. Loumou; G. Theodoropoulos
Year: 2008
Automatic frame reduction of Wireless Capsule Endoscopy video
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tsevas; D.K. Iakovidis; D. Maroulis; E. Pavlakis
Year: 2008
A simple sequential pose recognition model for sleep apnea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ching-Wei Wang; A. Hunter
Year: 2008
Preliminary performance evaluation of a high resolution small animal PET scanner with monolithic crystals and depth-of-interaction encoding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Balcerzyk; G. Kontaxakis; M. Delgado; L. Garcia; J.M. Benlloch; M.A. Pozo
Year: 2008
Assessment of iterative image reconstruction techniques for small-animal PET imaging applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Karali; S. Pavlopoulos; D. Koutsouris
Year: 2008
A sparse variational Bayesian approach for fMRI data analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.P. Oikonomou; E.E. Tripoliti; D.I. Fotiadis
Year: 2008
In-vivo brain anatomical connectivity using diffusion magnetic resonance imaging and fuzzy connectedness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.N. Sotiropoulos; C.R. Tench; Li Bai
Year: 2008
Towards quantification of interstitial pneumonia patterns in lung multidetector CT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Korfiatis; A. Karahaliou; A. Kazantzi; C. Kalogeropoulou; L. Costaridou
Year: 2008
Local hemodynamics and intimal hyperplasia at the venous side of porcine carotid artery - Jugular vein shunt
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.A. Manos; D.P. Sokolis; A.T. Giagini; C.H. Davos; J.D. Kakisis; N. Stergiopulos; P.E. Karayannacos; S. Tsangaris
Year: 2008
2D Oculomotor Plant Mathematical Model for eye movement simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O.V. Komogortsev; U.K.S. Jayarathna
Year: 2008
A generic Grid interface and execution framework for biomedical applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.I. Vegoudakis; V. Koutkias; A. Malousi; I. Chouvarda; N. Maglaveras
Year: 2008
Modelling glycaemia of diabetics : An application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Benmakrouha; C. Hespel; M.V. Foursov
Year: 2008
Automatic intra-operative localization of STN using the beta band frequencies of microelectrode recordings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Michmizos; G.L. Tagaris; D.E. Sakas; K.S. Nikita
Year: 2008
Slow and fast EEG sleep spindle component extraction using Independent Component Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.M. Ventouras; P.Y. Ktonas; H. Tsekou; T. Paparrigopoulos; I. Kalatzis; C.R. Soldatos
Year: 2008
A neural network model of peri-hand space representation and its plastic properties related to tool use
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Magosso; M. Zavaglia; A. Serino; G. di Pellegrino; M. Ursino
Year: 2008
Fitting local field potentials generating model of the basal ganglia to actual recorded signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.L. Tsirogiannis; G.A. Tagaris; D. Sakas; K.S. Nikita
Year: 2008
Characterization of chromatin texture by contour complexity for cancer cell classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kiyuna; A. Saito; E. Kerr; W. Bickmore
Year: 2008
Effects of digital dewaxing methods on K-means-clusterized IR images collected on formalin-fixed paraffin-embedded samples of skin carcinoma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Sebiskveradze; C. Gobinet; E. Ly; M. Manfait; P. Jeannesson; M. Herbin; O. Piot; V. Vrabie
Year: 2008
Size-adapted segmentation of individual mammographic microcalcifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.S. Arikidis; A. Karahaliou; S. Skiadopoulos; P. Korfiatis; E. Likaki; G. Panayiotakis; L. Costaridou
Year: 2008
Retrieval and ranking of biomedical images using boosted haar features
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.K. Reddy; F.A. Bhuyan
Year: 2008
Multimodality image registration using ordinary procrustes analysis and entropy of bivariate normal kernel density
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wan-Hyun Cho; Sun-Worl Kim; Myung-Eun Lee; Soo-Hyung Kim; Soon-Young Park; Chang-bu Jeong
Year: 2008
Wavelet entropy differentiations of event related potentials in dyslexia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.A. Giannakakis; N.N. Tsiaparas; M.-F.S. Xenikou; C. Papageorgiou; K.S. Nikita
Year: 2008
Stability analysis of epileptic EEG signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Hocepied; A. Kacha; F. Grenez; A. Nonclercq
Year: 2008
Control of medical robotics and neurorobotic prosthetics by noninvasive Brain-Robot Interfaces via EEG and RFID technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Eleni
Year: 2008
Graph theory based algorithm for magnetic resonance brain images segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianzhong Wang; Di Liu; Lili Dou; Baoxue Zhang; Jun Kong; Yinghua Lu
Year: 2008
Monte Carlo modeling of corneal and retinal Optical Coherence Tomography imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gerakis; M.Yu. Kirillin; E.A. Sergeeva; M. Makropoulou; A.A. Serafetinides
Year: 2008
Investigating mesh parameters to achieve clinically applicable finite element analysis of vertebrae
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.G. Vossou; C.G. Provatidis
Year: 2008
Gait analysis and automatic gait event identification using accelerometers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.I. Zdragkas; J.N. Avaritsiotis
Year: 2008
Versatile approximation of the lung field boundaries in chest radiographs in the presence of bacterial pulmonary infections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.K. Iakovidis
Year: 2008
A robust pose matching algorithm for covered body analysis for sleep apnea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ching-Wei Wang; A. Hunter
Year: 2008
Ontology-inferred phylogeny reconstruction for analyzing the evolutionary relationships between species: Ontological inference versus cladistics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Shaban-Nejad; V. Haarslev
Year: 2008
CARS: Context-Aware Rate Selection for vehicular networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Shankar; T. Nadeem; J. Rosca; L. Iftode
Year: 2008
CodeOR: Opportunistic routing in wireless mesh networks with segmented network coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunfeng Lin; Baochun Li; Ben Liang
Year: 2008
New adaptive protocols for fine-level end-to-end rate control in wireless networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying Jian; Shigang Chen; Liang Zhang; Yuguang Fang
Year: 2008
Protocol design for scalable and adaptive multicast for group communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De-Nian Yang; Wanjiun Liao
Year: 2008
Resource-aware video multicasting via access gateways in wireless mesh networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wanqing Tu; C.J. Sreenan; Chun Tung Chou; A. Misra; S. Jha
Year: 2008
Link layer multicasting with smart antennas: No client left behind
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sen; Jie Xiong; R. Ghosh; R.R. Choudhury
Year: 2008
IMS presence server: Traffic analysis & performance modelling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Chi; R. Hao; D. Wang; Z. Cao
Year: 2008
Rank-indexed hashing: A compact construction of Bloom filters and variants
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nan Hua; Haiquan Zhao; B. Lin; Jun Xu
Year: 2008
Controlling overload in networks of SIP servers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Hilt; I. Widjaja
Year: 2008
Substream Trading: Towards an open P2P live streaming system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhengye Liu; Yanming Shen; K.W. Ross; S.S. Panwar; Yao Wang
Year: 2008
Protecting anonymity in dynamic peer-to-peer networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Puttaswamy; A. Sala; C. Wilson; B.Y. Zhao
Year: 2008
A model-based approach to security flaw detection of network protocol implementations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yating Hsu; Guoqiang Shu; D. Lee
Year: 2008
Efficient and accurate protocols for distributed delaunay triangulation under churn
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-Young Lee; S.S. Lam
Year: 2008
Load-aware spectrum distribution in Wireless LANs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Moscibroda; R. Chandra; Yunnan Wu; S. Sengupta; P. Bahl; Yuan Yuan
Year: 2008
Optimization based rate allocation and scheduling in TDMA based wireless mesh networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bo Wang; M. Mutka; E. Torng
Year: 2008
Robust channel assignment for link-level resource provision in multi-radio multi-channel wireless networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cunqing Hua; Song Wei; Rong Zheng
Year: 2008
Monitoring persistently congested Internet links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leiwen Deng; A. Kuzmanovic
Year: 2008
TCP-Friendly CBR-Like Rate Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jie Feng; Lisong Xu
Year: 2008
Non-Renegable Selective Acknowledgments (NR-SACKs) for SCTP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Natarajan; N. Ekiz; E. Yilmaz; P.D. Amer; J. Iyengar; R. Stewart
Year: 2008
Competitive analysis of buffer policies with SLA commitments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Patt-Shamir; G. Scalosub; Y. Shavitt
Year: 2008
Topology dynamics and routing for predictable mobile networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Fischer; D. Basin; T. Engel
Year: 2008
RelayCast: Scalable multicast routing in Delay Tolerant Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Lee; Soon Young Oh; Kang-Won Lee; M. Gerla
Year: 2008
Mobility-centric geocasting for mobile partitioned networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Piorkowski
Year: 2008
Incentive-aware routing in DTNs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Shevade; Han Hee Song; Lili Qiu; Yin Zhang
Year: 2008
An interest-driven approach to integrated unicast and multicast routing in MANETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Menchaca-Mendez; J.J. Garcia-Luna-Aceves
Year: 2008
PRISM: Privacy-friendly routing in suspicious MANETs (and VANETs)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. El Defrawy; G. Tsudik
Year: 2008
Byzantine resilient synchronization for content and presence updates in MANETS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Carbunar; M. Pearce; S. Mohapatra; L.J. Rittle; V. Vasudevan
Year: 2008
Routing in intermittently connected sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lu Su; Changlei Liu; Hui Song; Guohong Cao
Year: 2008
Component based localization in sparse wireless ad hoc and sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoping Wang; Jun Luo; Shanshan Li; Dezun Dong; Weifang Cheng
Year: 2008
Experimental evaluation of MAC protocols for fairness and QoS support in wireless networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Warrier; I. Rhee; J.H. Kim
Year: 2008
Where’s Waldo? practical searches for stability in iBGP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Flavel; M. Roughan; N. Bean; A. Shaikh
Year: 2008
A scalable distributed routing protocol for networks with data-path services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Huang; S. Ganapathy; T. Wolf
Year: 2008
An approximation algorithm for QoS routing with two additive constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ronghui Hou; King-Shan Lui; Ka-Cheong Leung; F. Baker
Year: 2008
All Iris Filters are Not Created Equal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Hollingsworth; K.W. Bowyer; P.J. Flynn
Year: 2008
Enrolled Template Specific Decisions and Combinations in Verification Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tulyakov; Jiang Li; V. Govindaraju
Year: 2008
Recognition of Low-Resolution Faces Using Multiple Still Images and Multiple Cameras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.H. Hennings-Yeomans; S. Baker; B.V.K.V. Kumar
Year: 2008
A Novel Genetic Algorithm for 3D Facial Landmark Localization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsz-Ho Yu; Yiu-Sang Moon
Year: 2008
The IV2 Multimodal Biometric Database (Including Iris, 2D, 3D, Stereoscopic, and Talking Face Data), and the IV2-2007 Evaluation Campaign
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Petrovska-Delacretaz; S. Lelandais; J. Colineau; L. Chen; B. Dorizzi; M. Ardabilian; E. Krichen; M.-A. Mellakh; A. Chaari; S. Guerfi; J. D'Hose; B. Ben Amor
Year: 2008
3D Facial Landmarking under Expression, Pose, and Occlusion Variations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Dibeklioglu; A.A. Salah; L. Akarun
Year: 2008
False Matches and Non-independence of Face Recognition Scores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Quinn; P. Grother
Year: 2008
Pseudo-Signatures as a Biometric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Chen; D. Lopresti; L. Ballard; F. Monrose
Year: 2008
On the Effects of Time Variability in Iris Recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Tome-Gonzalez; F. Alonso-Fernandez; J. Ortega-Garcia
Year: 2008
Using 3D pose alignment tools in forensic applications of Face Recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Suman
Year: 2008
A Non-generative Approach for Face Recognition Across Aging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Biswas; G. Aggarwal; N. Ramanathan; R. Chellappa
Year: 2008
The BCOE and the Future of Biometrics at the FBI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.W.V. Bruegge
Year: 2008
The Iris Challenge Evaluation 2005
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.J. Phillips; K.W. Bowyer; P.J. Flynn; X. Liu; W.T. Scruggs
Year: 2008
Multibiometrics for Identity Authentication: Issues, Benefits and Challenges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Kiltter; N. Poh
Year: 2008
Accelerating Iris Template Matching using Commodity Video Graphics Adapters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.P. Broussard; R.N. Rakvic; R.W. Ives
Year: 2008
Fusing Frequency, Spatial and Color Features for Face Recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiming Liu; Chengjun Liu
Year: 2008
A Fusion-Based Approach to Enhancing Multi-Modal Biometric Recognition System Failure Prediction and Overall Performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.J. Scheirer; T.E. Boult
Year: 2008
Adapting Starburst for Elliptical Iris Segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.J. Ryan; D.L. Woodard; A.T. Duchowski; S.T. Birchfield
Year: 2008
ECG to Individual Identification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.N. Singh; P. Gupta
Year: 2008
Usability Testing of Face Image Capture for US Ports of Entry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. Theofanos; B. Stanton; C. Sheppard; R. Micheals
Year: 2008
Three Dimensional Palmprint Recognition using Structured Light Imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Zhang; Guangming Lu; Wei Li; Lei Zhang; Nan Luo
Year: 2008
Fingerprint Anti-Spoofing Using Ridgelet Transform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.B. Nikam; S. Agarwal
Year: 2008
Increased Resolution 3D Face Modeling and Recognition From Multiple Low Resolution Structure From Motion Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Boehnen; P.J. Flynn
Year: 2008
Binary Biometrics: An Analytic Framework to Estimate the Bit Error Probability under Gaussian Assumption
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.J.C. Kelkboom; G.G. Molina; T.A.M. Kevenaar; R.N.J. Veldhuis; W. Jonker
Year: 2008
Estimation of Missing Values in Multimodal Biometric Fusion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Fatukasi; J. Kittler; N. Poh
Year: 2008
3D Facial Gestures in Biometrics: from Feasibility Study to Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Benedikt; D. Cosker; P.L. Rosin; D. Marshall
Year: 2008
Multibiometric Template Security Using Fuzzy Vault
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nandakumar; A.K. Jain
Year: 2008
The University of Southampton Multi-Biometric Tunnel and introducing a novel 3D gait dataset
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.D. Seely; S. Samangooei; M. Lee; J.N. Carter; M.S. Nixon
Year: 2008
The Use of Semantic Human Description as a Soft Biometric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Samangooei; Baofeng Guo; M.S. Nixon
Year: 2008
Analyzing the impact of non-biometric information on multiclassifier processing for signature recognition applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Abreu; M. Fairhurst
Year: 2008
Front-view Gait Recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Goffredo; J.N. Carter; M.S. Nixon
Year: 2008
Real-time Facial Features Tracking by Discrete Gabor Jets and Mean Shift
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Naruniec
Year: 2008
An Automatic Algorithm for Evaluating the Precision of Iris Segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinyu Zuo; N.A. Schmid
Year: 2008
3D Face Recognition using Point Cloud Kernel Correlation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fabry; D. Vandermeulen; P. Suetens
Year: 2008
Cancelable Biometrics for HMM-based Signature Recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Maiorana; P. Campisi; J. Ortega-Garcia; A. Neri
Year: 2008
Median Filter Based Iris Encoding Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinyu Zuo; N.K. Ratha; J.H. Connell
Year: 2008
A Novel Personal Entropy Measure confronted with Online Signature Verification Systems' Performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Houmani; S. Garcia-Salicetti; B. Dorizzi
Year: 2008
Expression-Compensated 3D Face Recognition with Geodesically Aligned Bilinear Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Mpiperis; S. Malassiotis; M.G. Strintzis
Year: 2008
Globally Linear Embedding of Biometric Scores: An Empirical Study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sarkar; P. Mohanty
Year: 2008
Impostures of Talking Face Systems Using Automatic Face Animation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Verdet; J. Hennebert
Year: 2008
Automatic Registration of Vertex Correspondences for 3D Facial Expression Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Rosato; Xiaochen Chen; Lijun Yin
Year: 2008
Learning Face Appearance under Different Lighting Conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Moore; M. Tappen; H. Foroosh
Year: 2008
Extended Depth of Field Iris Recognition with Correlation Filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Boddeti; B. Kumar
Year: 2008
Robust 2D Ear Registration and Recognition Based on SIFT Point Matching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.D. Bustard; M.S. Nixon
Year: 2008
Synthesizing Realistic Expressions in 3D Face Data Sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-L. Minoi; S.H. Amin; C.E. Thomaz; D.F. Gillies
Year: 2008
Generating Registration-free Cancelable Fingerprint Templates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Chikkerur; N.K. Ratha; J.H. Connell; R.M. Bolle
Year: 2008
Profile Face Detection: A Subset Multi-Biometric Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.E. Gentile; K.W. Bowyer; P.J. Flynn
Year: 2008
Fingerprint Biometrics via Low-cost Sensors and Webcams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Piuri; F. Scotti
Year: 2008
Class Distance Weighted Locality Preserving Projection for Automatic Age Estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ueki; M. Miya; T. Ogawa; T. Kobayashi
Year: 2008
An Analysis of Minutiae Neighborhood Probabilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.L.V. Hsu; B. Martin
Year: 2008
Gradient based Textural Characterization of Fingerprints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Aggarwal; N.K. Ratha; Tsai-Yang Jea; R.M. Bolle
Year: 2008
Exploring Ridge Curvature for Fingerprint Indexing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Biswas; N.K. Ratha; G. Aggarwal; J. Connell
Year: 2008
Quantitative Assessment of the Accuracy of 3D Face Shape Reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.H. Amin; D.F. Gillies
Year: 2008
Detection of Iris Texture Distortions By Analyzing Iris Code Matching Results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Ring; K.W. Bowyer
Year: 2008
"Hallucinating Irises" - Dealing with Partial & Occluded Iris Regions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Munemoto; Yung-hui Li; M. Savvides
Year: 2008
Pose-tolerant Non-frontal Face Recognition using EBGM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kin-Wang Cheung; Jiansheng Chen; Yiu-Sang Moon
Year: 2008
A 3D Face Recognition System for Expression and Occlusion Invariance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Alyuz; B. Gokberk; L. Akarun
Year: 2008
IC design and verification approach at Ember
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. LeFort
Year: 2008
Positioning test-benches and test-programs in interaction-oriented system-on-chip verification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoxi Xu; Cheng-Chew Lim; M. Liebelt
Year: 2008
A method for hunting bugs that occur due to system conflicts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Geist; O. Vaida
Year: 2008
Applications of decorator and observer design patterns in functional verification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Karimi
Year: 2008
Test slice difference technique for low power encoding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Lin Li; Tsung-Tang Chen; Po-Han Wu; Jiann-Chyi Rau
Year: 2008
Panel: Software practices for verification/testbench management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shireesh Verma; Srinath Atluri; Valeria Bertacco; Mark Glasser; Badri Gopalan; Sharon Rosenberg
Year: 2008
On dynamic switching of navigation for semi-formal design validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Parikh; M.S. Hsiao
Year: 2008
Multi-level Bounded Model Checking to detect bugs beyond the bound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Nishihara; T. Matsumoto; M. Fujita
Year: 2008
Proving and disproving assertion rewrite rules with automated theorem provers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Morin-Allory; M. Boule; D. Borrione; Z. Zilic
Year: 2008
Janus: A novel use of Formal Verification for targeted behavioral equivalence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Math; D. Hoenig
Year: 2008
On Chip Instrument application to SoC analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Stollon
Year: 2008
Test and validation of a non-deterministic system — True Random Number Generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Udawatta; M. Ehsanian; S. Maidanov; S. Musunuri
Year: 2008
Functional testing approaches for “BIFST-able” tlm_fifo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Alemzadeh; Z. Navabi; S. Di Carlo; A. Scionti; P. Prinetto
Year: 2008
IBM system z functional and performance verification using X-Gen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Schober; B. Hoppe; S. Landa; R. Morad
Year: 2008
Timing verification of distributed network systems at higher levels of abstraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Hatefi-Ardakani; A.M. Gharehbaghi; S. Hessabi
Year: 2008
Temporal parallel gate-level timing simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dusung Kim; M. Ciesielski; Kyuho Shim; Seiyang Yang
Year: 2008
The role of parallel simulation in functional verification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Di Guglielmo; F. Fummi; M. Hampton; G. Pravadelli; F. Stefanni
Year: 2008
A HW/SW co-simulation framework for the verification of multi-CPU systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Cordibella; F. Fummi; G. Perbellini; D. Quaglia
Year: 2008
Panel: SoC power management implications on validation and testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhanu Kapoor; John Goodenough; Shankar Hemmady; Shireesh Verma; Manuel A. d'Abreu; Kaushik Roy
Year: 2008
Special session - What’s so intelligent about testbenches?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avi Ziv; Chris Wilson; Adnan Hamid; Joerg Grosse
Year: 2008
Optimized coverage-directed random simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Ugarte; P. Sanchez
Year: 2008
Evaluation of an efficient control-oriented coverage metric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ramineni; S. Verma; I.G. Harris
Year: 2008
High-level vulnerability over space and time to insidious soft errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.M. Zick; J.P. Hayes
Year: 2008
Computing at the Crossroads (And What Does it Mean to Verification and Test?)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.N. Rabaey
Year: 2008
TTTC: Test Technology Technical Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2008
Unraveling Variability for Process/Product Improvement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gattiker
Year: 2008
The Test Features of the Quad-Core AMD Opteron- Microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Wood; G. Giles; C. Kiszely; M. Schuessler; D. Toneva; J. Irby; M. Mateja
Year: 2008
DFX of a 3rd Generation, 16-core/32-thread UltraSPARC- CMT Microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Parulkar; S. Anandakumar; G. Agarwal; G. Liu; K. Rajan; F. Chiu; R. Pendurkar
Year: 2008
Test Access Mechanism for Multiple Identical Cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Giles; J. Wang; A. Sehgal; K.J. Balakrishnan; J. Wingfield
Year: 2008
High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Mukherjee; A. Pogiel; J. Rajski; J. Tyszer
Year: 2008
A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ney; A. Bosio; L. Dilillo; P. Girard; S. Pravossoudovitch; A. Virazel; M. Bastian
Year: 2008
Analysis of Retention Time Distribution of Embedded DRAM - A New Method to Characterize Across-Chip Threshold Voltage Variation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Kong; P.C. Parries; G. Wang; S.S. Iyer
Year: 2008
Low cost testing of multi-GBit device pins with ATE assisted loopback instrument
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.A. Fritzsche; A.E. Haque
Year: 2008
Efficient High-Speed Interface Verification and Fault Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Nirmaier; J.T. Zaguirre; E. Hong; W. Spirkl; A. Rettenberger; D. Schmitt-Landsiedel
Year: 2008
Implementation Update: Logic Mapping On SPARC- Microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Vij; R. Ratliff
Year: 2008
Failing Frequency Signature Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaekwang Lee; E.J. McCluskey
Year: 2008
A Cost Analysis Framework for Multi-core Systems with Spares
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Shamshiri; P. Lisherness; Sung-Jui Pan; Kwang-Ting Cheng
Year: 2008
An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nagaraj; S. Kundu
Year: 2008
CONCAT: CONflict Driven Learning in ATPG for Industrial designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bommu; K. Chandrasekar; R. Kundu; S. Sengupta
Year: 2008
SAT-based State Justification with Adaptive Mining of Invariants
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weixin Wu; M.S. Hsiao
Year: 2008
RTL Error Diagnosis Using a Word-Level SAT-Solver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mirzaeian; Feijun Zheng; K.-T.T. Cheng
Year: 2008
Embedded Power Delivery Decoupling in Small Form Factor Test Sockets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Vikinski; S. Lupo; G. Sizikov; Chee Yee Chung
Year: 2008
A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Chickermane; P. Gallagher; J. Sage; P. Yuan; K. Chakravadhanula
Year: 2008
Peak Power Reduction Through Dynamic Partitioning of Scan Chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Almukhaizim; O. Sinanoglu
Year: 2008
Time-dependent Behaviour of Full Open Defects in Interconnect Lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Rodriguez-Montanes; D. Arumi; J. Figueras; S. Eichenberger; C. Hora; B. Kruseman
Year: 2008
Engineering Test Coverage on Complex Sockets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J. Schneider; A. Shafi
Year: 2008
Low Energy On-Line SBST of Embedded Processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Merentitis; N. Kranitis; A. Paschalis; D. Gizopoulos
Year: 2008
On-line Failure Detection in Memory Order Buffers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Carretero; X. Vera; P. Chaparro; J. Abella
Year: 2008
VAST: Virtualization-Assisted Concurrent Autonomous Self-Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Inoue; Yanjing Li; S. Mitra
Year: 2008
Frequency and Power Correlation between At-Speed Scan and Functional Tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sde-Paz; E. Salomon
Year: 2008
Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fei Wang; Yu Hu; Huawei Li; Xiaowei Li; Jing Ye; Yu Huang
Year: 2008
Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bastani; N. Callegari; L.-C. Wang; M.S. Abadir
Year: 2008
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sharma; B. Benware; Lei Ling; D. Abercrombie; L. Lee; M. Keim; Huaxing Tang; Wu-Tung Cheng; Ting-Pu Tai; Yi-Jung Chang; R. Lin; A. Man
Year: 2008
Integration of Hardware Assertions in Systems-on-Chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Geuzebroek; B. Vermeulen
Year: 2008
Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ho Fai Ko; A.B. Kinsman; N. Nicolici
Year: 2008
An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaochun Yu; R.D. Blanton
Year: 2008
Detection and Diagnosis of Static Scan Cell Internal Defect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruifeng Guo; Liyang Lai; Yu Huang; Wu-Tung Cheng
Year: 2008
Optical Diagnostics for IBM POWER6- Microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Song; S. Ippolito; F. Stellari; J. Sylvestri; T. Diemoz; G. Smith; P. Muench; N. James; Seongwon Kim; H. Saenz
Year: 2008
Functional Test and Speed/Power Sorting of the IBM POWER6 and Z10 Processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.N. Pham; F. Clougherty; G. Salem; J.M. Crafts; J. Tetzloff; P. Moczygemba; T.M. Skergan
Year: 2008
Transition Test on UltraSPARC- T2 Microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liang-Chi Chen; P. Dickinson; P. Mantri; M. Gala; P. Dahlgren; S. Bhattacharya; O. Caty; K. Woodling; T. Ziaja; D. Curwen; W. Yee; E. Su; Guixiang Gu; T. Nguyen
Year: 2008
DFT Architecture for Automotive Microprocessors using On-Chip Scan Compression supporting Dual Vendor ATPG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ahrens; R. Schlagenhaft; H. Lang; V. Srinivasan; E. Bruzzano
Year: 2008
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Srinivasan; Hui-Chuan Chao; F. Taenzler
Year: 2008
Optimized EVM Testing for IEEE 802.11a/n RF ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Acar; S. Ozev; G. Srinivasan; F. Taenzler
Year: 2008
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Natarajan; H. Choi; D. Lee; R. Senguttuvan; A. Chatterjee
Year: 2008
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Eichenberger; J. Geuzebroek; C. Hora; B. Kruseman; A. Majhi
Year: 2008
Modeling Test Escape Rate as a Function of Multiple Coverages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.M. Butler; J.M. Carulli; J. Saxena
Year: 2008
Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen-Tzu Lin; O. Poku; R.D. Blanton; P. Nigh; P. Lloyd; V. Iyengar
Year: 2008
Leveraging IEEE 1641 for Tester-Independent ATE Software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Van Wagenen; J. Vollmar; D. Thornton
Year: 2008
Bridging the gap between Design and Test Engineering for Functional Pattern Development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Aderholz; H. Ahrens; M. Rohleder
Year: 2008
"Plug & Test" at System Level via Testable TLM Primitives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Alemzadeh; S. Di Carlo; F. Refan; P. Prinetto; Z. Navabi
Year: 2008
Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Moore; M. Mangrum; C. Sellathamby; M. Reja; T. Weng; B. Bai; E. Reid; I. Filanovsky; S. Slupsky
Year: 2008
On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Karimi; M. Maniatakos; A. Jas; Y. Makris
Year: 2008
Using Implications for Online Error Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nepal; N. Alves; J. Dworak; R.I. Bahar
Year: 2008
A Field Analysis of System-level Effects of Soft Errors Occurring in Microprocessors used in Information Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.Z. Shazli; M. Abdul-Aziz; M.B. Tahoori; D.R. Kaeli
Year: 2008
Direct Cell-Stability Test Techniques for an SRAM Macro with Asymmetric Cell-Bias-Voltage Modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Katayama; T. Yabe; O. Hirabayashi; Y. Takeyama; K. Kushida; T. Sasaki; N. Otsuka
Year: 2008
A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories in SOCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsu-Wei Tseng; Jin-Fu Li
Year: 2008
Testing Methodology of Embedded DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.-M. Chang; M.C.-T. Chao; Rei-Fu Huang; Ding-Yuan Chen
Year: 2008
Optimized Circuit Failure Prediction for Aging: Practicality and Promise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Agarwal; V. Balakrishnan; A. Bhuyan; Kyunglok Kim; B.C. Paul; Wenping Wang; Bo Yang; Yu Cao; S. Mitra
Year: 2008
SoC Test Architecture Design and Optimization Considering Power Supply Noise Effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feng Yuan; Qiang Xu
Year: 2008
Observations of Supply-Voltage-Noise Dispersion in Sub-nsec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Takeuchi; G. Tanaka; H. Matsushita; K. Yoshizumi; Y. Katsuki; T. Sato
Year: 2008
An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.C. Keezer; D. Minier; P. Ducharme; A. Majid
Year: 2008
On Accelerating Path Delay Fault Simulation of Long Test Sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I-De Huang; Yi-Shing Chang; S. Natarajan; R. Sharma; S.K. Gupta
Year: 2008
Implicit Identification of Non-Robustly Unsensitizable Paths using Bounded Delay Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Jayaraman; E. Flanigan; S. Tragoudas
Year: 2008
Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Yilmaz; K. Chakrabarty; M. Tehranipoor
Year: 2008
IEEE 1500 Core Wrapper Optimization Techniques and Implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Mullane; M. Higgins; C. MacNamee
Year: 2008
Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laung-Terng Wang; R. Apte; Shianling Wu; Boryau Sheu; Kuen-Jong Lee; Xiaoqing Wen; W.-B. Jone; Chia-Hsien Yeh; Wei-Shin Wang; Hao-Jan Chao; Jianghao Guo; Jinsong Liu; Yanlong Niu; Yi-Chih Sung; Chi-Chun Wang; Fangfang Li
Year: 2008
Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Al-Ars; S. Hamdioui; A.J. van de Goor; G. Mueller
Year: 2008
A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junghyun Nam; Sunghoon Chun; Gibum Koo; Yanggi Kim; Byungsoo Moon; Jonghyoung Lim; Jaehoon Joo; Sangseok Kang; Hoonjung Kim; Kyeongseon Shin; Kisang Kang; Sungho Kang
Year: 2008
A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Ginez; J.-M. Portal; H. Aziza
Year: 2008
Built-in Self-Test and Fault Diagnosis for Lab-on-Chip Using Digital Microfluidic Logic Gates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Zhao; Tao Xu; K. Chakrabarty
Year: 2008
Testing Techniques for Hardware Security
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Majzoobi; F. Koushanfar; M. Potkonjak
Year: 2008
Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Le Jin
Year: 2008
A Novel Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Lee; M. Tehranipoor
Year: 2008
Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hillebrecht; I. Polian; P. Engelke; B. Becker; M. Keim; Wu-Tung Cheng
Year: 2008
The Advantages of Limiting P1687 to a Restricted Subset
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Doege; A.L. Crouch
Year: 2008
A New Language Approach for IJTAG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Portolan; S. Goyal; B. Van Treuren; Chen-Huan Chiang; T. Chakraborty; T.B. Cook
Year: 2008
Problems Using Boundary-Scan for Memory Cluster Tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.G. Van Treuren; Chen-Huan Chiang; K. Honaker
Year: 2008
Align-Encode: Improving the Encoding Capability of Test Stimulus Decompressors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Sinanoglu
Year: 2008
Launch-on-Shift-Capture Transition Tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Park; E.J. McCluskey
Year: 2008
Jitter and Signal Integrity Verification for Synchronous and Asynchronous I/Os at Multiple to 10 GHz/Gbps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.P. Li
Year: 2008
Jitters in high performance microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.M. Mak
Year: 2008
Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Moreira; H. Barnes; H. Kaga; M. Comai; B. Roth; M. Culver
Year: 2008
Embedded Testing in an In-Circuit Test Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Malian; B. Eklow
Year: 2008
Hardware-based Error Rate Testing of Digital Baseband Communication Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Alimohammad; S.F. Fard; B.F. Cockburn
Year: 2008
A Tutorial on STDF Fail Datalog Standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Khoche; P. Burlison; J. Rowe; G. Plowman
Year: 2008
Parametric Testing of Optical Interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Achkir; P. Zivny; B. Eklow
Year: 2008
Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Davidson
Year: 2008
Power-Aware DFT - Do we really need it?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Mukherjee
Year: 2008
Power-Aware DFT - Do we really need it?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Krishnamurthy
Year: 2008
Power-Aware DFT - Do Not Risk It, Use It
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Pouya
Year: 2008
Some Burning Issues that Justify Power-Aware DFT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rearick
Year: 2008
Analog Test Technology: Stable and Grounded, or Open Loop and Spurious?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Purtell
Year: 2008
Analog Test Technology: Challenges Abound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Anderson
Year: 2008
Analog & Mixed-Signal are Key for Test Development Engineering Program
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.I. Schmitz
Year: 2008
Will Test Compression Run Out of Gas?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.K. Goel; E.J. Marinissen
Year: 2008
Will Test Compression Run Out Of Gas?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Pateras
Year: 2008
We Need Faster & Deeper Scan and More Realistic Tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rivoir
Year: 2008
The Limits of Compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.W. Williams
Year: 2008
Debug War Stories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:LeRoy Winemberg
Year: 2008
Debug War Stories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Carder
Year: 2008
The University DFT Tool Showdown - Introduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Davidson
Year: 2008
Functional test-bench refinement through automatic constraint extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.-C. Wang; O. Guzey
Year: 2008
Benchmarking Academic DFT Tools on the OpenSparc Microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Polian; C. Miller; P. Engelke; T. Nopper; A. Czutro; B. Becker
Year: 2008
On the generation of test programs for chip multi-thread computer architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Ravotto; E. Sanchez; M.S. Reorda; G. Squillero
Year: 2008
Challenges in Scaling Software-Based Self-Testing to Multithreaded Chip Multiprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Gizopoulos
Year: 2008
Overview of IEEE P1450.6.2 Standard; Creating CTL Model For Memory Test and Repair
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:IEEE P1450.6.2 Working Group
Year: 2008
IEEE P1581 drastically simplifies connectivity test for memory devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ehrenberg
Year: 2008
Low Power Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bahl; R. Sarkar; A. Garg
Year: 2008
IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Geng-Ming Chiu; J.C.-M. Li
Year: 2008
Test-Access Solutions for Three-Dimensional SOCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoxia Wu; Yibo Chen; K. Chakrabarty; Yuan Xie
Year: 2008
SOC Test Optimization with Compression-Technique Selection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Larsson; Xin Zhang; E. Larsson; K. Chakrabarty
Year: 2008
SoC Yield Improvement: Redundant Architectures to the Rescue?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Vial; A. Bosio; P. Girard; C. Landrault; S. Pravossoudovitch; A. Virazel
Year: 2008
Platform Independent Test Access Port Architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Margulis; D. Akselrod; T. Wood; S. Metsis
Year: 2008
NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Alaghi; M. Sedghi; N. Karimi; Z. Navabi
Year: 2008
VLSI Test Exercise Courses for Students in EE Department
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Komatsu
Year: 2008
Hardware Overhead Reduction for Memory BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Arai; K. Iwasaki; M. Nakao; I. Suzuki
Year: 2008
A Low-Cost Programmable Memory BIST Design for Multiple Memory Instances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung-Fu Lin; Chia-Fu Huang; De-Chung Lu; Chih-Chiang Hsu; Wen-Tsung Chiu; Yu-Wei Chen; Yeong-Jar Chang
Year: 2008
An Efficient Secure Scan Design for an SoC Embedding AES Core
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaehoon Song; Taejin Jung; Junseop Lee; Hyeran Jeong; Byeongjin Kim; Sungju Park
Year: 2008
Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Ye; Fei Wang; Yu Hu; Xiaowei Li
Year: 2008
System JTAG Initiative Group Advancements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.G. Van Treuren
Year: 2008
A Generic Framework for Scan Capture Power Reduction in Test Compression Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao Liu; Feng Yuan; Qiang Xu
Year: 2008
Wireless Test Structure for Integrated Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Noun; P. Cauvet; M.-L. Flottes; D. Andreu; S. Bernard
Year: 2008
Overview of a High Speed Top Side Socket Solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Stewart; T. Animashaun
Year: 2008
Improving the Accuracy of Test Compaction through Adaptive Test Update
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Biswas; R.D. Blanton
Year: 2008
On-chip Timing Uncertainty Measurements on IBM Microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Franch; P. Restle; N. James; W. Huott; J. Friedrich; R. Dixon; S. Weitzel; K. Van Goor; G. Salem
Year: 2008
DFT Implementationis for Striking the Right Balance between Test Cost and Test Quality for Automotive SOCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amit Dutta; Srinivasulu Alampaily; Prasanth V; Rubin A. Parekhji
Year: 2008
Foreword
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2008
The Polynomial Method in Quantum and Classical Computing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Aaronson
Year: 2008
Theory of Sponsored Search Auctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Aggarwal; S. Muthukrishnan
Year: 2008
Average-case Complexity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Trevisan
Year: 2008
Truthful Approximation Schemes for Single-Parameter Agents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Dhangwatnotai; S. Dobzinski; S. Dughmi; T. Roughgarden
Year: 2008
Discretized Multinomial Distributions and Nash Equilibria in Anonymous Games
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Daskalakis; C.H. Papadimitriou
Year: 2008
Approximation Algorithms for Single-minded Envy-free Profit-maximization Problems with Limited Supply
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Cheung; C. Swamy
Year: 2008
Market Equilibria in Polynomial Time for Fixed Number of Goods or Agents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.R. Devanur; R. Kannan
Year: 2008
The Sign-Rank of AC^O
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Razborov; A.A. Sherstov
Year: 2008
Arithmetic Circuits: A Chasm at Depth Four
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Agrawal; V. Vinay
Year: 2008
Dense Subsets of Pseudorandom Sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Reingold; L. Trevisan; M. Tulsiani; S. Vadhan
Year: 2008
Almost-Natural Proofs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.Y. Chow
Year: 2008
Dynamic Connectivity: Connecting to Networks and Geometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.M. Chan; M. Patrascu; L. Roditty
Year: 2008
Algorithms for Single-Source Vertex Connectivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Chuzhoy; S. Khanna
Year: 2008
A Polynomial-Time Approximation Scheme for Euclidean Steiner Forest
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Borradaile; P.N. Klein; C. Mathieu
Year: 2008
Degree Bounded Network Design with Metric Costs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.H. Chan; W.S. Fung; L.C. Lau; C.K. Yung
Year: 2008
Matrix Sparsification for Rank and Determinant Computations via Nested Dissection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Yuster
Year: 2008
Fast Modular Composition in any Characteristic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.S. Kedlaya; C. Umans
Year: 2008
Gaussian Bounds for Noise Correlation of Functions and Tight Analysis of Long Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Mossel
Year: 2008
Worst Case to Average Case Reductions for Polynomials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kaufman; S. Lovett
Year: 2008
On the Union of Cylinders in Three Dimensions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Ezra
Year: 2008
Spherical Cubes and Rounding in High Dimensions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Kindler; R. O'Donnell; A. Rao; A. Wigderson
Year: 2008
Near-Optimal Sparse Recovery in the L1 Norm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Indyk; M. Ruzic
Year: 2008
On Basing Lower-Bounds for Learning on Worst-Case Assumptions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Applebaum; B. Barak; D. Xiao
Year: 2008
The Bayesian Learner is Optimal for Noisy Binary Search  (and Pretty Good for Quantum as Well)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ben Or; A. Hassidim
Year: 2008
Hardness of Minimizing and Learning DNF Expressions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Khot; R. Saket
Year: 2008
Elections Can be Manipulated Often
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Friedgut; G. Kalai; N. Nisan
Year: 2008
On the Hardness of Being Truthful
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Papadimitriou; M. Schapira; Y. Singer
Year: 2008
Multi-unit Auctions with Budget Limits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Dobzinski; R. Lavi; N. Nisan
Year: 2008
Multilinear Formulas, Maximal-Partition Discrepancy and Mixed-Sources Extractors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Raz; A. Yehudayoff
Year: 2008
On the Impossibility of Basing Identity Based Encryption on Trapdoor Permutations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Boneh; P. Papakonstantinou; C. Rackoff; Y. Vahlis; B. Waters
Year: 2008
Leakage-Resilient Cryptography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Dziembowski; K. Pietrzak
Year: 2008
Succincter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Patrascu
Year: 2008
Two Query PCP with Sub-Constant Error
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Moshkovitz; R. Raz
Year: 2008
Constant-Time Approximation Algorithms via Local Improvements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.N. Nguyen; K. Onak
Year: 2008
Some Results on Greedy Embeddings in Metric Spaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Moitra; T. Leighton
Year: 2008
Set Covering with our Eyes Closed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Grandoni; A. Gupta; S. Leonardi; P. Miettinen; P. Sankowski; M. Singh
Year: 2008
Minimizing Movement in Mobile Facility Location Problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Friggstad; M.R. Salavatipour
Year: 2008
A Counterexample to Strong Parallel Repetition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Raz
Year: 2008
Rounding Parallel Repetitions of Unique Games
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Barak; M. Hardt; I. Haviv; A. Rao; O. Regev; D. Steurer
Year: 2008
The Unbounded-Error Communication Complexity of Symmetric Functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Sherstov
Year: 2008
Lower Bounds for Noisy Wireless Networks using Sampling Algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chinmoy Dutta; J. Radhakrishnan
Year: 2008
Inapproximability for Metric Embeddings into R^d
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Matousek; A. Sidiropoulos
Year: 2008
A Geometric Approach to Lower Bounds for Approximate Near-Neighbor Search and Partial Match
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Panigrahy; K. Talwar; U. Wieder
Year: 2008
Hardness of Nearest Neighbor under L-infinity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Andoni; D. Croitoru; M. Patrascu
Year: 2008
(Data) STRUCTURES
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Patrascu
Year: 2008
Entangled Games are Hard to Approximate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Kempe; H. Kobayashi; K. Matsumoto; B. Toner; T. Vidick
Year: 2008
Unique Games with Entangled Provers are Easy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Kempe; O. Regev; B. Toner
Year: 2008
Quantum Multi Prover Interactive Proofs with Communicating Provers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Or; A. Hassidim; H. Pilpel
Year: 2008
A Hypercontractive Inequality for Matrix-Valued Functions with Applications to Quantum Computing and LDCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ben-Aroya; O. Regev; R. de Wolf
Year: 2008
Sketching and Streaming Entropy via Approximation Theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.J.A. Harvey; J. Nelson; K. Onak
Year: 2008
On the Value of Multiple Read/Write Streams for Approximating Frequency Moments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Beame; Dang-Trinh Huynh-Ngoc
Year: 2008
Clock Synchronization with Bounded Global and Local Skew
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Lenzen; T. Locher; R. Wattenhofer
Year: 2008
Shallow-Low-Light Trees, and Tight Lower Bounds for Euclidean Spanners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Dinitz; M. Elkin; S. Solomon
Year: 2008
What Can We Learn Privately?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.P. Kasiviswanathan; H.K. Lee; K. Nissim; S. Raskhodnikova; A. Smith
Year: 2008
Learning Geometric Concepts via Gaussian Surface Area
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.R. Klivans; R. O'Donnell; R.A. Servedio
Year: 2008
Isotropic PCA and Affine-Invariant Clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.C. Brubaker; S. Vempala
Year: 2008
Approximate Kernel Clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Khot; A. Naor
Year: 2008
Beating the Random Ordering is Hard: Inapproximability of Maximum Acyclic Subgraph
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Guruswami; R. Manokaran; P. Raghavendra
Year: 2008
(Acyclic) Job Shops are Hard to Approximate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Mastrolilli; O. Svensson
Year: 2008
Linear Level Lasserre Lower Bounds for Certain k-CSPs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Schoenebeck
Year: 2008
The Power of Reordering for Online Minimum Makespan Scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Englert; D. Ozmen; M. Westermann
Year: 2008
Locally Testing Direct Product in the Low Error Range
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Dinur; E. Goldenberg
Year: 2008
Kakeya Sets, New Mergers and Old Extractors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Dvir; A. Wigderson
Year: 2008
A Dichotomy Theorem for the Resolution Complexity of Random Constraint Satisfaction Problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siu On Chan; M. Molloy
Year: 2008
Holographic Algorithms by Fibonacci Gates and Holographic Reductions for Hardness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Yi Cai; Pinyan Lu; Mingji Xia
Year: 2008
Network Extractor Protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.T. Kalai; Xin Li; A. Rao; D. Zuckerman
Year: 2008
Isomorhism of Hypergraphs of Low Rank in Moderately Exponential Time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Babai; P. Codenotti
Year: 2008
Computing the Tutte Polynomial in Vertex-Exponential Time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Bjorklund; T. Husfeldt; P. Kaski; M. Koivisto
Year: 2008
On the Approximability of Budgeted Allocations and Improved Lower Bounds for Submodular Welfare Maximization and GAP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Chakrabarty; G. Goel
Year: 2008
Submodular Approximation: Sampling-based Algorithms and Lower Bounds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Svitkina; L. Fleischer
Year: 2008
Short Proofs May Be Spacious: An Optimal Separation of Space and Length in Resolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Ben-Sasson; J. Nordstrom
Year: 2008
Noise Tolerance of Expanders and Sublinear Expander Reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kale; Y. Peres; C. Seshadhri
Year: 2008
Sequence Length Requirement of Distance-Based Phylogeny Reconstruction: Breaking the Polynomial Barrier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Roch
Year: 2008
Size Bounds and Query Plans for Relational Joins
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Atserias; M. Grohe; D. Marx
Year: 2008
Eigenvalue Bounds, Spectral Partitioning, and Metrical Deformations via Flows
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Biswal; J.R. Lee; S. Rao
Year: 2008
Embeddings of Topological Graphs: Lossy Invariants, Linearization, and 2-Sums
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Chakrabarti; A. Jaffe; J.R. Lee; J. Vincent
Year: 2008
A Simpler Linear Time Algorithm for Embedding Graphs into an Arbitrary Surface and the Genus of Graphs of Bounded Tree-Width
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.-i. Kawarabayashi; B. Mohar; B. Reed
Year: 2008
Nearly Tight Low Stretch Spanning Trees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Abraham; Y. Bartal; O. Neiman
Year: 2008
Algorithmic Barriers from Phase Transitions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Achlioptas; A. Coja-Oghlan
Year: 2008
Mixing Time of Exponential Random Graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bhamidi; G. Bresler; A. Sly
Year: 2008
k-Wise Independent Random Graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Alon; A. Nussboim
Year: 2008
Broadcasting with Side Information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Alon; E. Lubetzky; U. Stav; A. Weinstein; A. Hassidim
Year: 2008
Adaptive Equalization for DS-CDMA Communication System Using Laguerre Filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Somkur; C. Benjangkaprasert
Year: 2008
Robust Multiuser Downlink Beamforming with Per Antenna Power Constraints using Worst-Case Performance Optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sharma; S. Lambotharan
Year: 2008
A Robust Beamforming Based Interference Control Technique and its Performance for Cognitive Radios
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Cumanan; R. Krishna; V. Sharma; S. Lambotharan
Year: 2008
Bandwidth Enhancement of CPW-Fed Slot Antenna with Inset Tuning Stub
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Jearapraditkul; W. Kueathaweekun; N. Anantrasirichai; O. Sangaroon; T. Wakabayashi
Year: 2008
Adaptive Noise Canceller Using Adaptive IR Notch Filter Based on Lattice Form Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Benjangkaprasert; M. Chanthavong; O. Sangaroon; K. Janchitrapongvej
Year: 2008


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