Apodised fibre Bragg grating design subject to length constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chisholm, K.E.; Everall, L.A.; Williams, J.A.R.; Bennion, I.; Liu, X.; De La Rue, R.M.; Aitchison, J.S.
Year: 1998
Box like spectral response of a grating assisted codirectional filter for 1.28/1.32 /spl mu/m duplexer application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lupu, A.; Win, P.; Sik, H.; Boulet, P.; Carre, M.; Slempkes, S.; Carenco, A.
Year: 1998
Long-period fiber grating by electrical discharge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Godbout, N.; Daxhelet, X.; Maurier, A.; Lacroix, S.
Year: 1998
New fabrication technique of fibre Bragg gratings with arbitrary chirp and wavelength for chromatic dispersion compensation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Riant, I.; Gourhant, J.; Bruyere, F.; Gurib, S.; da Loura, J.; Sansonetti, P.
Year: 1998
Dispersion managed stretched pulse propagation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haus, H.A.; Chen, Y.
Year: 1998
A novel optical transceiver using an in-line PD/LD assembly for cost-effective single-fiber "ping-pong" optical data link
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuhara, Y.; Nakanishi, H.; Terauchi, H.; Murakami, Y.; Ishida, A.
Year: 1998
THz-class short-pulse generation in mode-locked laser diodes with periodically sampled gratings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, B.S.; Chung, Y.; Lee, S.; Kim, S.H.; Kang, K.N.; Choi, S.S.
Year: 1998
Network element and network level parameters for the management of optical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berthelon, L.; Eilenberger, G.; Chambon, O.; Dembeck, L.; Garnot, M.; Drion, C.
Year: 1998
Highly sensitive optical sampling system with 100 GHz bandwidth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohta, H.; Nogiwa, S.; Chiba, H.
Year: 1998
Tunable radio frequency filtering using linearly chirped fibre grating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang, W.; Williams, J.A.R.; Everall, L.A.; Bennion, I.
Year: 1998
Applications of four-wave mixing in semiconductor optical amplifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mecozzi, A.
Year: 1998
Development of a commercially successful wearable data collection system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stein, R.; Ferrero, S.; Hetfield, M.; Quinn, A.; Krichever, M.
Year: 1998
Design for wearability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gemperle, F.; Kasabach, C.; Stivoric, J.; Bauer, M.; Martin, R.
Year: 1998
Privacy, Wearable Computers, And Recording Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strub, H.B.; Johnson, K.; Allen, A.; Belloni, V.; Starner, T.
Year: 1998
Extracting context from environmental audio
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clarkson, B.; Pentland, A.
Year: 1998
Fuzzy auto-tuning scheme based on /spl alpha/-parameter ultimate sensitivity method for AC speed servo system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshitsugu, J.; Inoue, K.; Nakaoka, M.
Year: 1998
Observer based power feedforward control for AC/AC converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uhrin, R.; Zboray, L.; Profumo, F.
Year: 1998
A new variable structure DC motor controller using genetic algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Al-Hamouz, Z.M.; Al-Duwaish, H.N.
Year: 1998
Fundamental characteristics of electrostatic wafer chuck with insulating sealant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yatsuzuka, K.; Hatakeyama, F.; Asano, K.; Aonuma, S.
Year: 1998
Lumped element model for computing the equilibrium charge distribution along a moving web
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Horenstein, M.N.
Year: 1998
Methodology for the characterization of the electrostatic discharge (ESD) event for bodies in approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Greason, W.D.
Year: 1998
Stability of electrohydrodynamic induction pumping of a stratified liquid/vapor medium in the presence of an external load
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wawzyniak, M.; Seyed-Yagoobi, J.
Year: 1998
Space charge modelling in a charge injected electrostatic atomiser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balachandran, W.; Machowski, W.; Halimic, M.; Wilson, C.W.
Year: 1998
Numerical investigation of powder trajectories and deposition in tribo-charge powder coating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adamiak, K.
Year: 1998
Charging of glass powder in a circulating fluidized bed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tucholski, D.; Colver, G.M.
Year: 1998
Investigations on electrostatic precipitator: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chandra, A.
Year: 1998
A bipolar charge measurement system for aerosol characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hrabar, S.; Machowski, W.; Balachandran, W.
Year: 1998
Electric field and potential determination for electrowinning cells with bipolar electrodes by finite difference models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bittner, R.; Pagliero, A.; Salazar, L.; Valenzuela, M.
Year: 1998
A self-excited electronic ballast for electrodeless fluorescent lamps operated at 10 MHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunoue, N.; Harada, K.; Ishihara, Y.; Todaka, T.; Okamoto, F.
Year: 1998
Optimizing lamp-power regulation in low-voltage-supplied electronic ballasts by using nonresonant inverters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corominas, E.L.; Alonso, J.M.; Calleja, A.J.; Ribas, J.; Rico-Secades, M.
Year: 1998
Design considerations for optimum ignition and dimming of fluorescent lamps using a resonant inverter operating open loop
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ribas, J.; Alonso, J.M.; Corominas, E.L.; Calleja, A.J.; Rico-Secades, M.
Year: 1998
New technologies in electrical cable for mines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pawluk, R.R.
Year: 1998
Active compensation of roll eccentricity in rolling mills
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kugi, A.; Haas, W.; Schlacher, K.; Aistleitner, K.; Frank, H.; Rigler, G.W.
Year: 1998
Development of scalable real-time observers for continuous reheating furnaces based on mathematical modeling techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garcia, D.F.; Sierra, M.; Rodriguez, R.; Campes, A.; Diaz, R.; Obese, F.; Gonzalez, J.A.
Year: 1998
DC motor brush life
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamilton, R.J.
Year: 1998
A new tension controller for continuous strip processing line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seung-Ho Song; Seung-Ki Sul
Year: 1998
A novel control system at DOFASCO's 2 natural gas mixing station
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dudzic, M.; Mutha, R.
Year: 1998
Improving bridle low-speed regulation using cascaded current followers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boulter, B.T.
Year: 1998
Coiling temperature control and performance at AHMSA hot strip mill Mexico
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saini, S.; Shaw, D.A.; Ramon, H.P.; Perez, J.C.
Year: 1998
Automation upgrade no.1 blast furnace US steel-Edgar Thomson plant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kritikos, R.B.; Bellini, E.V.
Year: 1998
The factors to be considered in the correct cable for variable frequency drive applications on cranes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:LaPidus, S.G.
Year: 1998
Advanced control methods in rolling applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keintzel, G.; Schoisswohl, M.; Vorstandlechner, P.; Aistleitner, K.; Schneeweis, R.
Year: 1998
Numeric protective relay basics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ransick, M.P.
Year: 1998
A simple and low cost measuring method for harmonics in the power system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, T.; Matsui, K.; Tsuboi, K.; Ueda, F.
Year: 1998
IEEE/IAS - ANSI - and the IEC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Whittington, B.W.
Year: 1998
Optimal reactive power control for industrial power networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Putman, R.E.; Huff, F.C.; Pal, J.K.
Year: 1998
Series connection of IGBTs in hard-switching applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Busatto, G.; Cascone, B.; Fratelli, L.; Luciano, A.
Year: 1998
1000 A, 4400 V silicon rectifier diode for railway traction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khanna, V.K.; Kumar, A.; Sood, S.C.
Year: 1998
Cost-constrained selection of strand diameter and number in a Litz-wire transformer winding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sullivan, C.R.
Year: 1998
Optimization of shapes for round-wire high-frequency gapped-inductor windings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiankun Hu; Sullivan, C.R.
Year: 1998
Improved analytical modeling of conductive losses in gapped high-frequency inductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wallmeier, P.; Frohleke, N.; Grotstollen, H.
Year: 1998
Optimization of cabling in power electronics structure using inductance criterion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piette, N.; Clavel, E.; Marechal, Y.
Year: 1998
An advanced tool for optimised design of power electronic circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kragh, H.; Blaabjerg, F.; Pedersen, J.K.
Year: 1998
Investigation of flat-pack IGBT reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kirihata, H.; Takahashi, Y.; Wakimoto, H.; Niino, F.
Year: 1998
Further improvements in the reliability of IGBT modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schutze, T.; Berg, H.; Hierholzer, M.
Year: 1998
Analysis of the electro-thermal behaviour of multichip power modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Profumo, F.; Tenconi, A.; Facelli, S.; Passerini, B.
Year: 1998
Direct measurement and analysis of the time-dependent evolution of stress in silicon devices and solder interconnections in power assemblies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun He; Shaw, M.C.; Mather, J.C.; Addison, R.C., Jr.
Year: 1998
Low inductance, explosion robust IGBT modules in high power inverter applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schnur, L.; Debled, G.; Dewar, S.; Marous, J.
Year: 1998
Advanced technology for a new NPT-IGBT module design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miyashita, S.; Yoshiwatari, S.; Kobayashi, S.; Sakurai, K.
Year: 1998
New intelligent power multi-chips modules with junction temperature detecting function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kajiwara, T.; Yamagaguchi, A.; Hoshi, Y.; Sakurai, K.; Gallagher, J.
Year: 1998
Coordinated interconnect: a philosophical change in the design and construction of power electronic converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kelley, A.; Harris, M.; Hartzell, D.; Darcy, D.
Year: 1998
Fully CMOS compatible gate-shifted LDD-NMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Santos, P.; Casimiro, A.P.; Simas, M.I.C.; Lanca, M.
Year: 1998
Capacitors-various dielectrics and their applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaiser, C.J.
Year: 1998
Short term energy storage for ASD ride-through
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Zyl, A.; Spee, R.
Year: 1998
SCR self supplied gate driver for medium voltage application with capacitor as storage element
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raonic, D.
Year: 1998
Computer-aided design of power harmonic filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Medora, N.K.; Kusko, A.
Year: 1998
An integral space-vector PWM technique for DSP-controlled voltage-source inverters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trzynadlowski, A.M.; Bech, M.M.; Blaabjerg, F.; Pedersen, J.K.
Year: 1998
Control and performance of a pulse-density-modulated series-resonant inverter for corona discharge processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujita, H.; Akagi, H.
Year: 1998
Improving the full-bridge phase-shift ZVT converter for failure-free operation under extreme conditions in welding and similar applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aigner, H.; Dierberger, K.; Grafham, D.
Year: 1998
Robust dead-beat current control for PWM rectifiers and active filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malesani, L.; Mattavelli, P.; Buso, S.
Year: 1998
A new medium voltage PWM inverter topology for adjustable speed drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cengelci, E.; Sulistijo, S.U.; Woo, B.O.; Enjeti, P.; Teodorescu, R.; Blaabjerg, F.
Year: 1998
A dynamically robust current control technique for boost type power factor correction circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, Z.; Sen, P.C.
Year: 1998
Auto-connected electronic transformer (ACET) based multi-pulse rectifiers for utility interface of power electronic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kang, M.; Byeong Ok Woo; Enjeti, P.N.; Pitel, I.J.
Year: 1998
FEM evaluation of performance of axial flux slotted permanent magnet machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caricchi, F.; Crescimbini, F.; Santini, E.; Santucci, C.
Year: 1998
Torque ripple minimization with on-line parameter estimation using neural networks in permanent magnet synchronous motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tong Liu; Husain, I.; Elbuluk, M.
Year: 1998
Determination of optimal thermal parameters for brushless permanent magnet motor design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Staton, D.A.; So, E.
Year: 1998
A new analytical method for the computation of air-gap reactances in 3-phase induction motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ionel, D.M.; Cistelecan, M.V.; Miller, T.J.E.; McGilp, M.I.
Year: 1998
The variation of cage motor losses with skew
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McClay, C.I.; Williamson, S.
Year: 1998
A unified approach to the analysis of single-phase induction motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Williamson, S.; Smith, A.C.
Year: 1998
Unified approach to the analysis and design of an AC motor drive for flux-weakening operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bianchi, N.; Bolognani, S.
Year: 1998
Monitoring of induction machines load torque disturbances: an alternative NN-based method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Filippetti, F.; Grellet, G.; Salles, G.; Franceschini, G.; Tassoni, C.
Year: 1998
High performance synchronous reluctance motor with multi-flux barrier for the appliance industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kiriyama, H.; Kawano, S.; Honda, Y.; Higaki, T.; Morimoto, S.; Takeda, Y.
Year: 1998
High-speed synchronous reluctance machine with minimized rotor losses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hofmann, H.; Sander, S.R.
Year: 1998
Axial flux circumferential current permanent magnet (AFCC) machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian Luo; Dinyu Qin; Lipo, T.A.; Shuxiang Li; Surong Huang
Year: 1998
Novel axial flux interior PM synchronous motor realized with powdered soft magnetic materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Profumo, F.; Tenconi, A.; Zhang, Z.; Cavagnino, A.
Year: 1998
Axial flux, modular, permanent-magnet generator with a toroidal winding for wind turbine applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muljadi, E.; Butterfield, C.P.; Yih-Huei Wan
Year: 1998
Rapid computer-aided design method for fast-acting solenoid actuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piron, M.; Sangha, P.; Reid, G.; Miller, T.J.H.; Ionel, D.; Coles, J.
Year: 1998
Performance characterization and torque-ripple reduction in induction motor adjustable speed drives using time-stepping coupled finite element state space techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bangura, J.F.; Demerdash, N.A.
Year: 1998
High precision calorimetry for the measurement of the efficiency of induction motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McLeod, P.; Bradley, K.J.; Ferrah, A.; Magill, R.; Clare, J.G.; Wheeler, P.; Sewell, P.
Year: 1998
Using temperature, voltage, and/or speed measurements to improve trending of induction motor RMS currents in process control and diagnostics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dister, C.J.; Schiferl, R.
Year: 1998
Advantages of switched reluctance motor applications to EV and HEV: design and control issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rahman, K.M.; Fahimi, B.; Suresh, G.; Rajarathnam, A.V.; Ehsani, M.
Year: 1998
An investigation into vibration in switched reluctance motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pillay, P.; Cai, W.
Year: 1998
Switched reluctance motor with fractionally pitched windings and bipolar currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yifan Tang
Year: 1998
A line-start permanent magnet motor with gentle starting behavior
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stephens, C.M.; Kliman, G.B.; Boyd, J.
Year: 1998
Uncontrolled generator operation of interior PM synchronous machines following high-speed inverter shutdown
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jahns, T.M.
Year: 1998
A modified direct torque control (DTC) for induction motor sensorless drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lascu, C.; Boldea, I.; Blaabjerg, F.
Year: 1998
Torque ripple minimization strategy for direct torque control of production motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun-Koo Kang; Seung-Ki Sul
Year: 1998
Digital implementation of predictive direct control algorithms for induction motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mutschler, P.; Flach, E.
Year: 1998
Enhanced current control of PM machine drives through the use of flux controllers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haylock, J.A.; Mecrow, B.C.; Jack, A.G.; Atkinson, D.J.
Year: 1998
Current and flux regulation in field-weakening operation [of induction motors]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Briz, F.; Diez, A.; Degner, M.W.; Lorenz, R.D.
Year: 1998
Analysis of switched reluctance motor drive under fault conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharma, V.K.; Murthy, S.S.; Singh, B.
Year: 1998
Drive configurations for fully-pitched winding switched reluctance machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mecrow, B.C.; Clothier, A.C.; Barrass, P.G.; Weiner, C.
Year: 1998
Development of SRM for spindle motor system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsui, N.; Kosaka, T.; Minoshima, N.; Ohdachi, Y.
Year: 1998
Optimal combination of pole configuration and current waveform of SRM for torque maximization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kosaka, T.; Matsui, N.
Year: 1998
Self-tuning sensorless SRM drives for low cost mass production
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suresh, G.; Rahman, K.M.; Fahimi, B.; Ehsani, M.
Year: 1998
Dual stator winding induction machine drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Munoz-Garcia, A.; Lipo, T.A.
Year: 1998
A periodic burst injection method for deriving rotor position in saturated cage-salient induction motors without a shaft encoder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Staines, C.S.; Asher, G.M.; Bradley, K.J.
Year: 1998
Induction motor parameter tuning for high performance drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jul-Ki Seok; Seung-Ki Sul
Year: 1998
Position sensorless control of a SRM drive using ANN-techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bellini, A.; Filippetti, F.; Franceschini, G.; Tassoni, C.; Vas, P.
Year: 1998
Mitigation of acoustic noise and vibration in switched reluctance motor drive using neural network based current profiling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fahimi, B.; Suresh, G.; Rahman, K.M.; Ehsani, M.
Year: 1998
Model-based I/sub DDQ/ pass/fail limit setting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Unni, T.A.; Walker, D.M.H.
Year: 1998
100 MHz IDDQ sensor design with 1 /spl mu/A resolution for BIST applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonioli, Y.; Kinoshita, K.; Nishikawa, S.; Uemura, H.
Year: 1998
Design-for-Iddq-testing for embedded cores based system-on-a-chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajsuman, R.
Year: 1998
Formalising the software evaluation process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ares Casal, J.M.; Dieste Tubio, O.; Garcia Vazquez, R.; Lopez Fernandez, M.; Rodriguez Yanez, S.
Year: 1998
Specifying active databases in the situation calculus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bertossi, L.; Pinto, J.; Valdivia, R.
Year: 1998
Workflow modeling: exception and failure handling representation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edelweiss, N.; Nicolao, M.
Year: 1998
An adaptive model for programming distributed real-time applications in CORBA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Montez, C.; de oliveira, R.S.; Fraga, J.
Year: 1998
A dynamic logic model for the formal foundation of object-oriented analysis and design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pons, C.; Baum, G.; Felder, M.
Year: 1998
Behavior of keys in random databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seleznjev, O.; Thalheim, B.
Year: 1998
Prospect Of Korean Semiconductor Industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hwang, C.G.
Year: 1998
Silicon Micromachining
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Esashi, M.
Year: 1998
Atom Manipulation With The STM: Nanostructuring And Femtochemistry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rieder, K.H.; Meyer, G.; Bartels, L.
Year: 1998
Nature Of The Silicon And Silicon Dioxide Surfaces During Plasma Etching With Fluorocarbon Containing Discharges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aydil, E.S.; Marra, D.C.
Year: 1998
X-Ray Lithography: Recent Progress And Future Developments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, K.
Year: 1998
Mask Contamination Induced by X-Ray Exposure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okada, I.; Saitoh, Y.; Deguchi, K.; Fukuda, M.; Ban, H.; Matsuda, T.
Year: 1998
Evaluation Of Lithographic Performance Of X-Ray Stepper XS-1
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taguchi, T.; Mitsui, S.; Tanaka, Y.; Fujii, K.; Sugihara, S.; Yamaguchi, K.; Kikuchi, Y.; Tsuboi, S.; Aoyama, H.; Nakayama, N.; Marumoto, K.; Yamabe, M.; Suzuki, K.; Gomei, Y.; Hisatsugu, T.; Fukuda, M.; Suzuki, M.; Haga, T.; Itabashi, S.; Morita, H.
Year: 1998
Characterization Of Proximity Correction In 0.1 /spl mu/m Regime X-Ray Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi, M.; Seo, E.; Seo, Y.; Lee, K.; Kim, O.
Year: 1998
Chemical Vapor Deposition Of Tin Films From Tetrakis(methylethylamido)titanium And Ammonia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaegab Lee; Junghwan Choi; Heunglyul Cho; Eungu Lee; Hyunkook Shin
Year: 1998
In-Situ Phosphorus Doping on Si/sub 1-x/Ge/sub x/ Epitaxial Growth In The SiH/sub 4/ - GeH/sub 4/ - PH/sub 3/ Gas System by Using LPCVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheol Jin Lee; Matsuura, T.; Murota, J.
Year: 1998
Scalpel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.R. Harriott
Year: 1998
High-Speed Convolution System For Real-Time Proximity Effect Correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oogi, S.; Ishimura, T.; Kamikubo, T.; Shimizu, M.; Hattori, Y.; Iijima, T.; Anze, H.; Abe, T.; Tojo, T.; Takigawa, T.
Year: 1998
Application Of New Empirical Model To The Electron Beam Lithography Process With Chemically Amplified Resists
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young-Mog Ham; Cheol Hur; Chang-Nam Ahn; Ki-Ho Baik
Year: 1998
Improved Electron-Beam / DUV Intra-Level Mix-and-Match As A Production Viable Lithography With 100-nm Resolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Magoshi, S.; Niiyama, H.; Sato, S.; Kato, Y.; Watanabe, Y.; Shibata, T.; Ito, M.; Ando, A.; Nakasugi, T.; Sugihara, K.; Okumura, K.
Year: 1998
Sub-10 nm Overlay Accuracy In Electron Beam Lithography For Nanometer-Scale Device Fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamazaki, K.; Fujiwara, A.; Takahashi, Y.; Namatsu, H.; Kurihara, K.
Year: 1998
Challenges For Next Generation Photomask
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morimoto, H.; Okuyama, Y.
Year: 1998
Process Technology For Next Generation Photomask
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung-Min Sohn; Sung-Woon Choi; Byung-Gook Kim; Jin-Min Kim; Byung-Cheol Cha; Hee-Sun Yoon
Year: 1998
Mask Patterning Challenges Beyond 150 nm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gesley, M.
Year: 1998
Reticle CD Latitude For Fabrication Of 0.18/spl mu/m Line Patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsuura, S.; Uchiyama, T.; Fujimoto, M.; Yamazaki, T.; Hashimoto, T.; Kasama, K.
Year: 1998
MEMS: From Research To Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sandmaier, H.; Lang, W.
Year: 1998
Microelectromechancial Systems (MEMS) At The UCLA Micromanufacturing Lab
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang-Jin Kim
Year: 1998
Development Of Silicon Based Inertial Sensor In SAIT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongsoo Oh
Year: 1998
Lithography CAD Technology For Embedded Memory In Logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohnuma, H.; Tsudaka, K.; Kawahira, H.; Nozawa, S.
Year: 1998
Monte-Carlo Based Optical Proximity Correction For The Half-Tone Phase Shift Mask
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Ho Oh; Jai-Cheol Lee; Sungwoo Lim
Year: 1998
OPC Methodology To Overcome Mask Error Effect On Below 0.25 um Lithography Generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keeho Kim; Madhavan, S.; Lilygren, J.
Year: 1998
ArF Excimer Laser Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sasago, M.
Year: 1998
Fabrication Of A Field Emitter Array Monolithically Integrated With Thin-Film-Transistor On Glass
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gamo, H.; Kanemaru, S.; Itoh, J.
Year: 1998
A New Fabrication Process Of Field Emitter Arrays Using Silicon Delamination By Hydrogen Ion Implantation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sasaguri, D.; Asano, T.
Year: 1998
A Piezoresistive Silicon Accelerometer Using Porous Silicon Micromachining And Flip Chip Bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun-Hwan Sim; Jong-Hyun Lee
Year: 1998
Progress In The Development Of Extreme Ultraviolet Lithography Exposure Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ray-Chaudhuri, A.
Year: 1998
0.12 /spl mu/m Optical Lithography Performance Using an Alternating DUV Phase Shift Mask
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trouiller, Y.; Buffet, N.; Mourier, T.; Schiavone, P.; Quere, Y.
Year: 1998
Fabrication Of Ordered Nonohole Arrays Using Anodizing Of AL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masuda, H.
Year: 1998
Novel Fabrication Of Electroplated 3D Micro-Coils Using 3D Photolithography Of Thick Photoresist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoon, J.-B.; Han, C.-H.; Yoon, E.-S.; Kim, C.-K.
Year: 1998
Novel Fabrication Process Of Freestanding Metallic Microstructures Using Double Electroplating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang-Wook Baek; Yong-Kweon Kim
Year: 1998
Pattern Displacement Error Under Off-Axis Illumination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakgeuon Seong; Jongwook Kye; Hoyoung Kang; Jootae Moon
Year: 1998
Optical Lithography At Low /spl kappa/ Factors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sewell, H.
Year: 1998
Determination Of The CD Dispersion And Proximity Bias Across The Lens Field By Electrical Linewidth Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toublan, O.; Boutin, D.; Schiavone, P.
Year: 1998
Printing Sub-100 Nanometer Features Near-Field Photolithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, S.; Nakao, M.; Hatamura, Y.; Komuro, M.; Hiroshima, H.; Hatakeyama, M.
Year: 1998
Illumination Condition And Mask Bias For 0.18/spl mu/m Pattern With KrF Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tabuchi, H.; Shichijo, Y.; Okabe, I.; Oka, N.; Inoue, M.; Iguchi, K.
Year: 1998
Sub 0.1-/spl mu/m Pattern Fabrication Using a 193-nm TSI Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mori, S.; Kuhara, K.; Morisawa, T.; Matsuzawa, N.; Kalmoto, Y.; Endo, M.; Matsuo, T.; Sasago, M.
Year: 1998
Dynamic Response Of Acoustic Delay Line For Beam Lines Of SR Lithography System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toyota, E.
Year: 1998
Thermal Distortion Of An X-Ray Mask For Synchrotron Radiation Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, J.; Kawachi, S.; Toyota, E.
Year: 1998
A Research On The Anisotropic Etching Of Tungsten-Nitride For X-Ray Mask
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, H.G.; Jeong, C.Y.; Lee, S.Y.; Ahn, J.; Song, K.C.; Park, C.K.; Jeon, Y.S.; Lee, D.H.
Year: 1998
A Design Of Beamline Optics For Large Field Exposure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hasegawa, M.; Gomei, Y.; Hisatsugu, T.
Year: 1998
Improvement Of Overlay Accuracy In SR Lithography For Gigabit-Scale Dram Fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suita, M.; Hifumi, T.; Sumitani, H.; Itoga, K.; Ootera, H.; Marumoto, K.; Wakamiya, W.; Matsumoto, T.; Yamamoto, T.; Edo, R.; Ohishi, S.; Sentoku, K.
Year: 1998
Proximity Effect Correction By Pattern Modified Stencil Mask In Large Field Projection Electron-Beam Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kobinata, H.; Yamashita, H.; Nomura, E.; Nozue, H.
Year: 1998
Simulation Of Electron Trajectory In The Cell-Projection Lithography Optical System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, K.; Kotera, M.
Year: 1998
Fabrication Of Silicon Quantum Dots On Oxide And Nitride
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ilgweon Kim; Hyungsik Kim; Jongho Lee; Hyungcheol Shin
Year: 1998
Self-Organizing Process Of Moderately Strained Zn/sub 1-x/CdxSe Layer Grown On GaAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyun-Chul Ko; Fujita, S.
Year: 1998
Quantized Conductance Of A Gate-All-Around Silicon Quantum Wire Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minkyu Je; Sangyeon Han; Ilgweon Kim; Hyungcheol Shin
Year: 1998
Fabrication of a Novel InAs Multiple Quantum Wire Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamamoto, H.; Maemoto, T.; Ichiu, M.; Sasa, S.; Inoue, M.
Year: 1998
Fabrication Of Nanometer Scale Structure Using Thin Film Stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-Il Park; Sung-Ho Hahm; Jong-Hyun Lee; Jung-Hee Lee
Year: 1998
Fabrication Of Periodic Si Nanostructure By Controlled Anodization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakagawa, T.; Sugiyama, H.; Koshida, N.
Year: 1998
Fabrication Of A Mosfet With Self-aligned Nanogate Electrode Based On Dual-functional MoO3WO3 Bilayer Resist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hashimoto, M.; Koreeda, T.; Koshida, N.; Komuro, M.; Atoda, N.
Year: 1998
Nanometer-scale Lithography Of The Ultrathin Films With Atomic Force Microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinchul Kim; Haiwon Lee; Yongwoo Shin; Sunwoo Park
Year: 1998
Fabrication Of InP Sub-micron Pillars For Two-dimensional Photonic Crystals By Reactive Ion Etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hatate, H.; Hashimoto, M.; Shirakawa, H.; Fujiwara, Y.; Takeda, Y.; Nakano, H.; Tatsuta, T.; Tsuji, O.
Year: 1998
Influence Of Interface Structure On Chemical Etching Process For Air Gap Of Microelectromechanical System Based On Surface Micromachining
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoon, Y.S.; Kim, J.H.; Polla, D.L.
Year: 1998
Novel Fabrication Of Comb Drive Actuator Using RIE Of Polysilicon And [110] Si Anisotropic Bulk Etching In KOH
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyung-TaeK Lim; Yong-Kweon Kim
Year: 1998
The Vapor Phase Deposition Of Fluorocarbon Films For The Prevention Of In-Use Stiction In Micromirrors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang-Ho Lee; Myong-Jong Kwon; Jin-Goo Park; Yong-Kweon Kim; Hyung-Jae Shin
Year: 1998
A New Micromachining Technology Using
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sangwoo Lee; Sangjun Park; Dong-il Cho
Year: 1998
A CMOS Compatible Capacitive Silicon Accelerometer With Polysilicon Rib-Style Flexures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seokyu Kim; Youngjoo Yee; Hyeoncheol Kim; Kukjin Chun
Year: 1998
Fabrication Of Micro-Cantilever With A Silicon Probe Prepared By Anodization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Higa, K.; Asano, T.
Year: 1998
Fabrication Of Bimetallic Cantilevers For Chemical Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung, M.Y.; Kim, D.W.; Choi, S.S.; Kang, O.J.; Suh, Y.D.; Kuk, Y.
Year: 1998
Fabrication Of Silicon Micro-Probe For Vertical Probe Card Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Dae Kim; Jun-Hwan Sim; Jae-Woo Nam; Jong-Hyun Lee
Year: 1998
A Capacitive Silicon Microaccelerometer With Force Balancing Electrodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Byeoungju Ha; Yongsoo Oh; Byeungleul Lee; Shinn, M.; Seogsoon Baek; Cimoo Song
Year: 1998
Two-Input.axis Angular Rate Sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seungdo An; Yongsoo Oh; Sang-on Choi; Ci-Moo Song
Year: 1998
Fabrication Of A Nanometer-Scale Si Wire By Micromachining Of A Silicon-on-Insulator Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujii, H.; Kanemaru, S.; Hiroshima, H.; Yokoyama, H.; Itoh, J.
Year: 1998
Fabrication Of Nanometric Aperture Arrays By Wet Anisotropic Etching For Near-Field Optical Memory Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, M.B.; Tsutsui, K.; Ohtsu, M.; Atoda, N.
Year: 1998
Fabrication Of Bulk Diamond Field Emitter Tip Using Beam Assisted Etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taniguchi, J.; Komuro, M.; Hiroshima, H.; Miyamoto, I.
Year: 1998
The origin of photoluminescence In Ge - implanted SiO/sub 2/ layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, H.B.; Chae, K.H.; Whang, C.N.; Yeong, J.Y.; Oh, M.S.; Im, S.; Song, J.H.
Year: 1998
Electrical Properties Of E-Beam Exposed Silicon Dioxides And Their Application To Nano-Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Choi, B.H.; Jung, S.K.; Kim, S.I.; Hwang, S.W.; Park, J.H.; Kim, Y.; Kim, E.K.; Min, S.-K.
Year: 1998
Study On Microdefect Characteristics Analysis By RTA in 1MeV P Ion Implantation for High Memory Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Byeong-Gyu Roh; Hee-Won Kang; So-Haeng Cho; Sung-Pyo Hong; Keom-Yong Eum; Hwan-Sool Oh
Year: 1998
A Study On The High Temperture Platinum Etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyounwoo Kim; Byongsun Ju; Beongyoon Nam; Wonjong Yoo; Changjln Kang; Jootae Moon; Moonyong Lee
Year: 1998
Micro-Etching Technology Of High Aspect Ratio Framework For Electronic Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cho, Y.R.; Oh, J.Y.; Kim, H.S.; Jeong, H.S.
Year: 1998
Tin Oxide Films Deposited By Ozone Assisted Thermal CVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bae, J.W.; Yeom, G.Y.; Lee, S.W.; Song, K.H.; Park, J.I.; Park, K.J.
Year: 1998
Facet Formation In Selectively Overgrown Silicon By Reduced Pressure Chemical Vapor Deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Song, S.; Lee, S.; Ryum, B.; Yoon, E.
Year: 1998
Structural And Compositional Evolution Of SiO/sub 2/ Aerogel Film By Oxygen Plasma Treatment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong-Ryul Kim; Hyung-Ho Park
Year: 1998
Effect Of Internal Surface Bondings On The Etching Of SiO2 Aerogel Film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seok-Joo Wang; Hyung-Ho Park
Year: 1998
A Study On The Deposition Of a-Si:H Films For High Photoconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moonsang Kang; Yongseo Koo; Chul An
Year: 1998
Deposition And Patterning Technique For Realization Of PZT Thick Film Micro Actuator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maeda, R.; Chu, J.; Schroth, A.; Akedo, J.; Ichiki, M.; Wang, Z.; Yonekubo, S.
Year: 1998
New HF Linear Ion Source For Industrial Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seok-Keun Koh; Won-Kook Choi; Hyung-Jin Jung; Bougrov, G.; Kralkina, E.; Kondranin, S.; Pavlov, V.
Year: 1998
The Implementation Of Sub-150nm Contact Hole Pattern By Resist Flow Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Soo Kim; Chang-Il Choi; Cheol-Kyu Bok; Chang-Nam Ahn; Hyeong-Soo Kim; Ki-Ho Baik
Year: 1998
Study Of Bottom Antireflective Coating Process Using A High-Transparency Resist For ArF Excimer Laser Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kishimura, S.; Takahashi, M.; Ohfuji, T.; Sasago, M.
Year: 1998
Positive-Tone E-Beam Lithography With Surface Silylation Of Negative-Tone Commercial Photoresists Sal 601 And AZPN 114
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tegou, E.; Gogolides, E.; Argitis, P.; Zheng Cui
Year: 1998
Analysis Of High-Acceleration SEM Images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moniwa, A.; Terasawa, T.
Year: 1998
Stitching-Error-Free Overlay Metrology For EB Lithography Using "One-Shot" Inspection Target Mark
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Asano, K.; Takahashi, K.; Nagata, T.; Sato, M.; Nara, Y.
Year: 1998
Microprobe Analysis Of Pt Films Deposited By Beam Induced Reaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Park, Y.K.; Nagai, T.; Takai, M.; Lehrer, C.; Frey, L.; Ryssel, H.
Year: 1998
Voltage Modulation Scanned Probe Oxidation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dagata, J.A.; Inoue, T.; Itoh, J.; Matsumoto, K.; Yokoyama, H.
Year: 1998
Nanofabrication Using Scanning Near-Field Optical Microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitsuoka, Y.; Nakajima, K.; Chiba, N.; Muramatsu, H.; Ataka, T.
Year: 1998
Sub-Wavelength Pattern Transfer By Near Field Photo-Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takahito, O.; Mika, O.; Esashi, M.
Year: 1998
Fabrication Of GaAs Microtips And Its Application To Spin-Polarized Scanning Tunneling Microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, K.; Shinohara, R.; Suzuki, Y.; Nabhan, W.
Year: 1998
Measurement Of Secondary Electron Emission Coefficient From MgO Protecting Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Choi, E.H.; Oh, H.J.; Kim, Y.G.; Ko, J.J.; Cho, T.S.; Kim, D.I.; Cho, G.S.; Kang, S.O.
Year: 1998
Selectively Formed InAs Quantum Dot Arrays For Device Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheol Koo Hahn; Young Ju Park; Kyung Hyun Park; Chan Kyung Hyun; Eun Kyu Kim; Suk-Ki Min; Jung Ho Park
Year: 1998
Wire-Like Doping Of Si Atoms At Multiatomic Steps On GaAs[001] Vicinal Surfaces By Metalorganic Vapor Phase Epitaxial Growth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Irisawa, T.; Motohisa, J.; Akabori, M.; Fukui, T.
Year: 1998
In-Situ Observation Of FIB Micropatterning To Semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, M.; Furuya, K.; Saito, T.
Year: 1998
A Nano-Structure Memory With SOI Edge Channel And A Nano Dot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Geunsook Park; Sangyeon Han; Hyungcheol Shin
Year: 1998
Synthesis And Characterization Of Alicyclic Polymers With Hydrophilic Groups For 193-nm Single-Layer Resist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min-Ho Jung; Jae-Chang Jung; Cheol-Kyu Bok; Balk, K.
Year: 1998
Silicon Containing Photoresists For ArF Excimer Laser Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young-Dae Kim; Sang-Jin Park; Haiwon Lee; Si-Hyeung Lee; Dong-Won Jung; Sang-Jun Choi
Year: 1998
Sub-10-nm EB Lithography Using Poly(/spl alpha/-methylstyrene) Resist of Molecular Weight 650
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manako, S.; Fujita, J.; Tanigaki, K.; Ochiai, Y.; Nomura, E.
Year: 1998
Direct Lithography On Hydrogen-Terminated Silicon Surface Using Two-Dimensional Hydrogen Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishikawa, K.; Yoshimura, M.; Ueda, K.
Year: 1998
Fabrication Of Nanometer-Order Dot Patterns By Lift-Off Using Fullerene-Incorporated Bilayer Resist System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishii, T.; Tanaka, H.; Kuramochi, E.; Tamamura, T.
Year: 1998
Step & Scan Lithography For Mass Production Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnold, B.; Koek, B.; de Zwart, G.; Luehrmann, P.; Jenkins, P.
Year: 1998
Charge Reducing Effect Of Chemically Amplified Resist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakasugi, T.; Magoshi, S.; Sugihara, K.; Saito, S.; Kihara, N.
Year: 1998
Sub-Quarter-Micron PT Etching Technology Using Round Head EB Resist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunogami, T.; Kumihashi, T.
Year: 1998
Self-Organization Of A Two-Dimensional Array Of Gold Nano-Dots Encapsulated By Alkanethiol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, S.; Sakaue, H.; Shingubara, S.; Takahagi, T.
Year: 1998
3D scan conversion of CSG models into distance volumes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Breen, D.E.; Mauch, S.; Whitaker, R.T.
Year: 1998
Adaptive perspective ray casting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kreeger, K.; Bitter, I.; Dachille, F.; Chen, B.; Kaufman, A.
Year: 1998
Hypervolume visualization: a challenge in simplicity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bajaj, C.L.; Pascucci, V.; Rabbiolo, G.; Schikore, D.R.
Year: 1998
Object voxelization by filtering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sramek, M.; Kaufman, A.
Year: 1998
Design of accurate and smooth filters for function and derivative reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moller, T.; Mueller, K.; Kurzion, Y.; Machiraju, R.; Yagel, R.
Year: 1998
Deep submicron transferred-substrate heterojunction bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Q. Lee; S.C. Martin; D. Mensa; R. Pullela; R.P. Smith; B. Agarwal; J. Guthrie; M. Rodwell
Year: 1998
Room temperature operation of a-C based single electron transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Yamada; T. Numaguchi; N. Miura; M. Konagai
Year: 1998
Room temperature self-organized quantum dot transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Phillips; K. Kamath; K.T. Brock; P. Bhattacharya
Year: 1998
Silicon single electron switch with an electrically formed quantum dot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.H. Kim; J.D. Lee; B.G. Park; H.G. Lee
Year: 1998
Geiger-mode avalanche photodiode arrays integrated with CMOS timing circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.F. Aull; A.H. Loomis; J.A. Gregory; D.J. Young
Year: 1998
1.1 GHz MSM photodiodes on relaxed Si/sub 1-x/Ge/sub x/ grown by UHV-CVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.J. Koester; B.-U. Klepser; J.O. Chu; K. Ismail
Year: 1998
High-voltage accumulation-layer UMOSFETs in 4H-SiC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Tan; J.A. Cooper, Jr.; M.R. Melloch
Year: 1998
Ion-implanted static induction transistors in 4H-SiC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.K. Agarwal; L.-S. Chen; G.W. Eldridge; R.R. Siergiej; R.C. Clarke
Year: 1998
An addressable amorphous diamond field emission array for e-beam lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J. Paulus; C.E. Thomas; M.L. Simpson; J.A. Moore; L.R. Baylor; D.H. Lowndes; D.B. Geohegan; G.E. Jellison, Jr.; V.I. Merkulov; A.A. Puretzky; E. Voelkl; J. Walter; T.W. Garber
Year: 1998
Novel integration of substrate input/output vertical cavity lasers and resonant photodetectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.A. Louderback; O. Sjolund; E.R. Hegblom; J. Ko; L.A. Coldren
Year: 1998
Saying it in graphics: from intentions to visualizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kerpedjiev, S.; Carenini, G.; Green, N.; Moore, J.; Roth, S.
Year: 1998
The shape of Shakespeare: visualizing text using implicit surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rohrer, R.M.; Ebert, D.S.; Sibert, J.L.
Year: 1998
Investigation of semiconductor structures through capacitance techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gumik, P.; Harmatha, L.; Csabay, O.
Year: 1998
Monte Carlo simulations of the transport of sputtered particles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Macek, K.; Macek, P.; Helmersson, U.
Year: 1998
Simulation and analysis of the electromagnetic behavior of 3D-MCM carried structures by means of investigations on symmetric folded microstrip filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Philippov, P.; Gospodinova, M.; Arnaudov, R.; Andonova, A.; Tzvetkova, A.
Year: 1998
Modeling and simulation of surface generation-recombination in Schottky diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Drobny, V.; Racko, J.; Donoval, D.
Year: 1998
Analysis of the temperature dependent I-V characteristics of the ICB deposited Ag/Si Schottky structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Korosak, D.; Cvikl, B.
Year: 1998
Using sulfide treatment to improve performance of GaSb/GaInAsSb/GaAlAsSb photodiode heterostructures for spectral range, of 1.7-2.5 /spl mu/m
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andreev, I.A.; L'vova, T.V.; Mikhailova, M.P.; Kunitsyna, E.V.; Soldv'ev, V.A.; Yakovlev, Yu.P.
Year: 1998
SiO/sub 2/ film formation and electrical properties of InP MIS structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malyshev, S.A.; Babushkina, N.V.
Year: 1998
T-shaped gate based on poly Si/polyimide supported layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lalinsky, T.; Hrkut, P.; Matay, L.; Kostic, I.; Hascik, S.; Hudek, P.
Year: 1998
Numerical investigations of the large signal dynamic admittance of the transferred electron devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suchecka, M.
Year: 1998
Photoluminescent investigation of the effect of ultrasonic treatment upon defect states in M/n-n/sup +/ GaAs (M=Pt,W,Cr)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ermolovich, I.B.; Konakova, R.V.; Milenin, V.V.; Prokopenko, I.B.; Gromashevskii, V.L.
Year: 1998
Radiation effects in surface-barrier Ir-Al/n-GaAs structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belyaev, A.A.; Konakova, R.V.; Milenin, V.V.; Breza, J.; Lalinsky, T.
Year: 1998
A new concept for a monolithically integrated optoelectronic receiver based on a GaAs-PIN-photodiode and a PJBT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dillmann, F.; Brennemann, P.; Hardtdegen, H.; Marso, M.; Loken, M.; Kordos, P.; Luth, H.; Tegude, F.J.; Kwaspen, J.M.M.; Kaufmann, L.M.F.
Year: 1998
CAD tools for microdevices and microsystems: today's demands, potentials and visions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wachutka, G.; Voigt, P.; Schrag, G.
Year: 1998
Novel plasma enhanced bulk micromachining process for MEMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Valland, B.; Shi, F.; Hudek, P.; Rangelow, J.W.
Year: 1998
Development of a micromanipulation system for special applications in handling of microcomponents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Petrovic, D.; Chatzitheodoridis, E.; Popovic, G.; Haddad, G.; Brenner, W.; Vujanic, A.
Year: 1998
InAs quantum well magnetic sensors with high sensitivity and excellent temperature stability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Behet, M.; de Boeck, J.; Borghs, G.
Year: 1998
Modelling the living cell-microelectronic antenna combination: role of the causal feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srobar, F.; Pokomy, J.
Year: 1998
Approaches to statistical circuit analysis for deep sub-micron technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Orshansky, M.; Chen, J.C.; Hu, C.; Wan, D.; Bendix, D.
Year: 1998
Defect control using an automatic killer defect selection method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshitake, Y.; Maeda, S.; Watanabe, K.
Year: 1998
Intrafield effects and device manufacturability: a statistical simulation approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krivokapic, Z.; Minvielle, A.; Heavlin, W.D.
Year: 1998
Impact of unrealistic worst case modeling on the performance of VLSI circuits in deep sub-micron CMOS technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nardi, A.; Neviani, A.; Zanoni, E.; Guardiani, C.
Year: 1998
Constraint transformation for IC physical design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malavasi, E.; Charbon, E.
Year: 1998
The sensitivity of the parameters of covariance based response surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Waring, T.G.; Walton, A.J.; Ferguson, S.; Sprevak, D.
Year: 1998
Bias and variance in single and multiple response surface modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, T.H.; Goodlin, B.E.; Boning, D.S.; Oji, C.O.; Chung, J.E.; Sawin, H.H.
Year: 1998
The effect of deterministic spatial variations in retrograde well implants on shallow trench isolation and latchup immunity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kapila, D.; Jain, A.; Nandakumar, M.; Ashburn, S.; Vasanth, K.; Sridhar, S.
Year: 1998
High voltage RESURF DMOS process development using DFM techniques: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Redford, M.; Fallon, M.; Shafi, Z.A.; McGinty, J.; Rankin, N.S.; Walton, A.J.
Year: 1998
Statistical modeling of MOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Conti, M.; Crippa, P.; Orcioni, S.; Turchetti, C.
Year: 1998
VLSI process optimization using Taguchi method with multiple-criteria approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, M.-R.
Year: 1998
A novel methodology of critical dimension statistical process control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, C.P.; Shyu, A.; Liou, P.; Leu, R.Q.; Huang, K.; Lin, J.Y.; Yang, T.H.; Liu, H.C.; Ting, M.I.; Shih, Y.C.
Year: 1998
Predictive tolerance and sensitivity analysis based on parametric response surface methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quarantelli, M.; Daldoss, L.; Gubian, P.; Guardiani, C.
Year: 1998
Runs rules for bivariate Shewhart chart
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, A.; Guo, R.-S.; Lee, C.-L.
Year: 1998
Efficiency and cost-effectiveness of AC drives for electric vehicles improved by a novel, boost DC-DC conversion structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fratta, A.; Guglielmi, P.; Villata, F.; Vagati, A.
Year: 1998
Prime mover for hybrid electric propulsion system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fijalkowski, B.T.
Year: 1998
Wireless workgroup teleconferencing: design issues with WLAN IP telephony, PCS, and WPBX technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McInnis, M.D.
Year: 1998
Consumer devices: providing Internet capabilities for a mass audience
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soohoo, K.
Year: 1998
Stochastic methods in engineering design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Steidley, C.W.
Year: 1998
Engineering design optimization with genetic algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dinger, R.H.
Year: 1998
Rechargeable alkaline manganese dioxide (RAM/sup TM/) cell chemistry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniel-Ivad, J.
Year: 1998
Regulatory requirements and the certification process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Urlakis, D.M.
Year: 1998
Competency-based engineering design courses development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kishline, C.R.; Wang, F.C.; Aggoune, E.-H.M.
Year: 1998
A fast access database-an educational experience from requirement to implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lofstrom, D.J.; Aggoune, E.-H.M.; Wang, F.C.
Year: 1998
Understanding C through English grammar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen, T.; Sajous, A.F.
Year: 1998
Effective MOSFET modeling for SPICE circuit simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Foty, G.
Year: 1998
Introduction to microcontrollers. I
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bannatyne, R.; Viot, G.
Year: 1998
Single event effects on commercial SRAMs and power MOSFETs: final results of the CRUX flight experiment on APEX
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barth, J.L.; Adolphsen, J.W.; Gee, G.B.
Year: 1998
Compendium of single event failures in power MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coss, J.R.; Swift, G.M.; Selva, L.E.; Titus, J.L.; Normand, E.; Oberg, D.L.; Wert, J.L.
Year: 1998
Heavy-ion study of single event effects in 12- and 16-bit ADCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bee, S.; Hopkinson, G.R.; Harboe-Sorensen, R.; Adams, L.; Smith, A.
Year: 1998
Radiation evaluation of 3.3 volt 16 M-bit DRAMs for solid state mass memory space applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harboe-Sorensen, R.; Bruggemann, M.; Muller, R.; Rombeck, F.J.
Year: 1998
Total ionizing dose effects on voltage-to-frequency converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, C.I.; Johnston, A.H.; Rax, B.G.
Year: 1998
Burn-in effects on total dose radiation sensitivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gorelick, J.; McClure, S.; Pease, R.L.
Year: 1998
Evaluation of high performance converters under low dose rate total ionizing dose (TID) testing for NASA programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharma, A.K.; Sahu, K.; Kniffin, S.
Year: 1998
Cocktails and other librations-the 88-inch cyclotron radiation effects facility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McMahan, M.A.
Year: 1998
Radiation testing results of COTS based space microcircuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Layton, P.; Anthony, H.; Boss, R.; Hsu, P.
Year: 1998
High power SiC-devices. New result and prospects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lebedev, A.A.; Chelnokov, V.E.
Year: 1998
Recent advances in SiC materials and device technologies in Sweden
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ostling, M.
Year: 1998
Study on Si integrated circuits operating up to 462/spl deg/C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Migitaka, M.
Year: 1998
Low power ASIC for high temperature applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vermesan, O.; Rispal, T.; Soulier, L.
Year: 1998
High temperature growth of SiC and group III nitride structures in production reactors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schmitz, D.; Beccard, R.; Woelk, E.G.; Strauch, G.; Juergensen, H.
Year: 1998
High-temperature amorphous-like semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Golikova, O.A.; Kazanin, M.M.
Year: 1998
Designing the future of electronic journals with lessons learned from the past: economic and use patterns of scientific journals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tenopir, C.; King, D.W.
Year: 1998
Recreating publishing for the engineering and scientific community: the Scholarly Publishing and Academic Resources Coalition (SPARC)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Case, M.M.
Year: 1998
Thinking in electronic terms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wheary, J.; Wild, L.; Weyher, C.; Schutz, B.
Year: 1998
Through a glass darkly: one scientist's view
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raney, R.K.
Year: 1998
Understanding use in the real world
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bishop, A.P.
Year: 1998
Information module in a scientific/engineering workstation: a proposal for utilizing electronic information for interdisciplinary research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian Qin
Year: 1998
Priority for discoveries: challenges of electronic publication to research norms, practices and values
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nissenbaum, H.
Year: 1998
Interaction interfaces-towards a scientific foundation of a methodological usage of message sequence charts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Broy, M.; Kruger, I.
Year: 1998
Active objects in TCOZ
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Song Dong; Mahony, B.
Year: 1998
Incremental architectural modeling and verification of real-time concurrent systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Deng; Jiacun Wang; Sinha, R.
Year: 1998
Using model checking to generate tests from specifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ammann, P.E.; Black, P.E.; Majurski, W.
Year: 1998
A process algebra based verification of a production system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kleijn, J.J.T.; Rooda, J.E.; Reniers, M.A.
Year: 1998
Market-driven symbolic execution of models of manufacturing enterprises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Janowski, T.; Hongjun, Z.; Lugo, G.G.
Year: 1998
Interacting frameworks in Catalysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kung-Kiu Lau; Shaoying Liu; Ornagi, M.; Wills, A.
Year: 1998
From monolithic to modular formal specification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rose, G.
Year: 1998
Translating Object-Z specifications to passive test oracles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McDonald, J.; Strooper, P.
Year: 1998
Formal specification of CORBA services using Object-Z
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kreuz, D.
Year: 1998
The B Bank: a complete case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buchi, M.
Year: 1998
The formal specification of the fieldbus foundation link scheduler in E-LOTOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Petalidis, N.; Gill, D.S.
Year: 1998
Specification-based class testing: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:MacColl, I.; Murray, L.; Strooper, P.; Carrington, D.
Year: 1998
Using metrics to identify design patterns in object-oriented software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antoniol, G.; Fiutem, R.; Cristoforetti, L.
Year: 1998
Using a Personal Software Process/sup SM/ to improve performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayes, W.
Year: 1998
Applications of measurement in product-focused process improvement: a comparative industrial case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birk, A.; Derks, P.; Hamann, D.; Hirvensalo, J.; Oivo, M.; Rodenbach, E.; van Solingen, R.; Taramaa, J.
Year: 1998
Taking the mystery out of experimental design-and a proposal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Votta, L.G.
Year: 1998
A methodology for evaluating predictive metrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosenberg, J.
Year: 1998
Software metrics decision support system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ulvila, J.W.; Gaffney, J.E., Jr.; Chinnis, J.O., Jr.
Year: 1998
Applying software metrics to formal specifications: a cognitive approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vinter, R.; Loomes, M.; Kornbrot, D.
Year: 1998
An integrated process and product model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schneidewind, N.F.
Year: 1998
The predictive validity criterion for evaluating binary classifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:El Emam, K.
Year: 1998
On the validation of relative test complexity for object-oriented code
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianqiang Zhuo; Pichai, R.; Sahni, S.; Oman, P.W.
Year: 1998
Integrating speech and two-dimensional gesture input-a study of redundancy between modes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McKenzie Mills, K.; Alty, J.L.
Year: 1998
Teamwork constructs in architectural design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dave, B.
Year: 1998
Sharing human-computer interaction and software engineering design artifacts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brown, J.; Marshall, S.
Year: 1998
Designing the client user interface for a methodology independent OO CASE tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Phillips, C.; Adams, S.; Page, D.; Mehandjiska, D.
Year: 1998
Information portrayal design: applying the proximity-compatibility principle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, W.B.L.; Sallis, P.J.; O'Hare, D.
Year: 1998
Principles for a usability-oriented pattern language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mahemoff, M.J.; Johnston, L.J.
Year: 1998
The ecological approach to interface design: applying the abstraction hierarchy to intentional domains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, W.B.L.; Sallis, P.J.; O'Hare, D.
Year: 1998
Visualisations of parallel algorithms for reconfigurable torus computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brown, J.; Martin, P.; Paku, N.; Turner, G.
Year: 1998
Cognitive work analysis and the analysis, design, and evaluation of human-computer interactive systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanderson, P.
Year: 1998
Extending cognitive work analysis to manufacturing scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Higgins, P.G.
Year: 1998
Cognitive work analysis for training system design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lintern, G.; Naikar, N.
Year: 1998
KIISS: a system for visual specification of model-based user interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saiz, F.; Contreras, J.; Moriyon, R.
Year: 1998
Computer screen cursor trajectories as controlled by an Accupoint: a kinematic analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Phillips, J.G.; Triggs, T.J.; Bellgrove, M.
Year: 1998
Vixels, createthroughs, dragthroughs and attachment regions in BuildByWire
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mugridge, W.B.; Hosking, J.G.; Grundy, J.C.
Year: 1998
Mixed initiative in design space exploration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Datta, S.; Burrow, A.L.; Woodbury, R.F.
Year: 1998
Exploiting the statechart in interactive learning systems authoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pak-Wah Fung; Kemp, R.H.; Kemp, E.A.
Year: 1998
The method of auxiliary sources for investigation of pulse scattering in time domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bit-Babik, G.G.; Jobava, R.G.; Zaridze, R.S.; Kharshiladze, O.A.
Year: 1998
New materials design: scattering problems and the method of auxiliary sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bogdanov, F.G.; Karkashadze, D.D.; Zaridze, R.S.
Year: 1998
Diffraction by impedance wedge with curved faces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Borovikov, V.A.
Year: 1998
Accumulating, directing and focusing properties of 2-D and 3-D objects of biisotropic materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bogdanov, F.G.; Karkashadze, D.D.
Year: 1998
Use of the thin coatings to control characteristics of radiating and scattering objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bogdanov, F.G.; Karkashadze, D.D.; Metskhvarishvili, D.A.
Year: 1998
On the problem of nonlinear interaction of uniformly exited finite-amplitude sound beams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mishchenko, V.
Year: 1998
The algorithm of modeling of radio channel in cellular communication systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yaschyshyn, E.; Grynyshyn, Y.
Year: 1998
Competitive and temporal Hebbian learning for production of robot trajectories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de A. Barreto, G.; Araujo, A.F.R.
Year: 1998
Reaching the limits of CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Isaac, R.D.
Year: 1998
Electrical performance of chip-on-chip modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Low, Y.L.; O'Connor, K.J.
Year: 1998
Modeling, simulation, and design methodology of the interconnect and packaging of an ultra-high speed source synchronous bus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arabi, T.; Jones, J.; Taylor, G.; Riendeau, D.
Year: 1998
Design methodology for on-chip interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cases, M.; Smith, H.; Bowen, M.
Year: 1998
Temperature stable thermoplastic microwave materials and copper laminates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walpita, L.M.; Ahern, M.; Chen, P.; Goldberg, H.; Weinberg, S.; Zipp, C.; Adams, G.; Wong, Y.H.
Year: 1998
Transient and crosstalk analysis of interconnection lines for single level integrated packaging modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zheng, L.R.; Tenhunnen, H.
Year: 1998
Multi drop net topologies for MCM off chip interconnection lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaller, D.; Harrer, H.; Boehringer, S.; Katopis, G.
Year: 1998
Incorporating vertical discontinuities in power-bus modeling using a mixed-potential integral equation and circuit extraction formulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fan, J.; Shi, H.; Drewniak, J.L.; Hubing, T.H.; DuBroff, R.E.; Van Doren, T.P.
Year: 1998
Contribution of resonance to ground bounce in lossy thin film planes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pannala, S.; Bandyopadhyay, J.; Swaminathan, M.; Torres, M.; Smith, L.; Yuan, X.; Fitzgerald, G.
Year: 1998
ESR and ESL of ceramic capacitor applied to decoupling applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roy, T.; Smith, L.; Prymak, J.
Year: 1998
Analytic modeling of monolithic inductors on semiconductor substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoo, S.-J.; Friar, R.; Neikrik, D.P.
Year: 1998
Microwave and millimeter wave ball grid array (BGA) packages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Panicker, M.P.R.
Year: 1998
Micromachined silicon conformal packaging for millimeter wave system applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katehi, L.P.B.; Kihm, R.T.
Year: 1998
A monolithic spiral transmission-line balun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoon, Y.J.; Lu, Y.; Frye, R.C.; Smith, P.R.
Year: 1998
The application of the TLM method to the simulation of high-speed and high-complexity electronic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Christopoulos, C.; Vukovic, A.
Year: 1998
Model reduction for PEEC models including retardation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cullum, J.; Ruehli, A.E.; Zhang, T.
Year: 1998
Modeling and simulation of microsystems: challenges and trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wild, A.
Year: 1998
Building of silicon mechanical sensors by bulk micromachining and anodic bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lpadatu, D.; Jakobsen, H.
Year: 1998
Silicon linear image sensors for photometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cimpoca, V.; Cengher, D.; Crisan, C.; Olariu, N.; Oros, C.; Cimpoca, M.
Year: 1998
Stress control for process optimization of the capacitive pressure sensors for biomedical applications achieved by surface micromachining technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaiseanu, F.; Postolache, C.; Dascalu, D.; Esteve, J.; Tsoukalas, D.; Jachowicz, R.; Badoiu, A.; Vasile, E.
Year: 1998
Thermal simulation of surface micromachined polysilicon hot plates of low power consumption
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dumitrescu, M.; Cobianu, C.; Lungu, D.; Dascalu, D.; Pascu, A.; Kolev, S.; van den Berg, A.
Year: 1998
Raman and Hall-effect characterization of Zn/sup +//P/sup +/ co-implanted GaAs subjected to rapid thermal annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ursaki, V.V.; Terletsky, A.I.; Tiginyanu, I.M.
Year: 1998
Effect of composition on refractive index dispersion in Ge-Sb-S thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pamukchieva, V.; Szekeres, A.; Sharlandjiev, P.; Alexia, Z.; Gartner, M.
Year: 1998
Thin-film fully-depleted SOI CMOS technology, devices and circuits for LVLP analog/digital/microwave applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Flandre, D.; Vanhoenacker, D.
Year: 1998
Silicon carbide power devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chante, J.P.; Locatelli, M.L.; Planson, D.; Ottaviani, L.; Morvan, E.; Isoird, K.; Nallet, F.
Year: 1998
High speed, low-power CMOS voltage buffers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Neag, M.; McCarthy, O.
Year: 1998
Physical-optical properties of LPCVD amorphous silicon rich-nitride and oxynitride
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Modreanu, M.; Tomozeiu, N.; Cosmin, P.; Gartner, M.
Year: 1998
Experimental evidence of giant fluctuations in the electrical response of very thin SnO/sub 2/ films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cobianu, C.; Mihaila, M.; Bocioaca, L.; Lungu, D.; Savaniu, C.; Arnautu, A.; Iorgulescu, R.
Year: 1998
Heterostructures design optimisation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dima, G.; Mitrea, O.; Govoreanu, B.; Antonoiu, G.; Schoenmaker, W.; Salmer, G.; Profirescu, M.D.
Year: 1998
Glass passivated chip-early reliability test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bucheru, B.T.; Turtudau, F.; Ichim, A.; Iosif, R.; Marinescu, V.A.
Year: 1998
Evaluation of integrated circuit's design limits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andonova, A.V.; Savov, D.T.
Year: 1998
Steady-state lifetime of the nonequilibrium carriers in proton irradiated 6H-SiC pn structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strel'chuk, A.M.; Kozlovski, V.V.; Savkina, N.S.; Rastegaeva, M.G.; Andreev, A.N.
Year: 1998
Dielectric membranes manufactured by isotropic etching of <111> oriented silicon for microwave applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muller, A.; Petrini, I.; Avramescu, V.; Schor, C.; Badilita, V.; Simion, G.; Mihali, M.; Nastase, N.
Year: 1998
Roughness in silicon anisotropic etching: the influence of cleaning conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Divan, R.; Camon, H.; Manea, E.; Avram, M.; Moldovan, N.; Dilhan, M.
Year: 1998
Emission capabilities of GaAs field emitter arrays fabricated using a HCl:H/sub 2/O/sub 2/:H/sub 2/O solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yaradou, O.; Ducroquet, F.; Kropfield, P.; Vanoverschelde, A.
Year: 1998
Field emitter arrays technologies and materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kleps, I.; Banoiu, G.; Avramescu, V.; Angelescu, A.
Year: 1998
Parallel domain decomposition for 3D semiconductor device simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonoiu, G.; Dima, G.; Profirescu, M.D.
Year: 1998
Method for determining temperature lower limit state of the extrinsic saturation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schiopu, P.; Lakatos, E.; Degeratu, V.
Year: 1998
A quantum thermomechanical modeling of band offsets and Schottky barriers of semiconductor heterostructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Unlu, H.
Year: 1998
Membrane supported microwave circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muller, A.; Iordanescu, S.
Year: 1998
Change of the optical properties of porous silicon by post anodization treatments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pavelescu, G.; Ciurea, M.L.; Mihut, L.; Galeata, G.; Lengyel, E.; Baltog, I.; Roger, J.P.
Year: 1998
An auto-scaling ruler for the L-Edit/sup TM/ layout editor implemented using L-Edit/UPI/sup TM/ subroutine library
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crisu, D.; Dan, C.
Year: 1998
Dosimetric characteristics of the indium phosphide based photoconvertors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andronic, I.; Simashkevich, A.; Potlog, T.; Sherban, D.; Ketrush, P.
Year: 1998
Shape evolution during through-mask electrochemical micromachining at low and high aspect ratio
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dikusar, A.I.; Keloglu, O.Yu.; Yushchenko, S.P.
Year: 1998
TiO/sub 2/ anodic oxide films for oxygen gas sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Podaru, C.; Avramescu, V.; Enache, R.; Stoica, G.
Year: 1998
Low parasitic elements and self aligned contacts technology for high frequency bipolar integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Badila, M.; Codreanu, C.; Brezeanu, G.; Marinescu, B.; Stoica, A.M.
Year: 1998
Data channel ASIC for PC interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Popa, M.; Neagoe, O.; Bogdan, D.; Dinoiu, I.
Year: 1998
Air bridges and planar inductors for MMICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vasilache, D.; Iordanescu, S.; Avramescu, V.; Petrini, I.; Rizescu, R.; Muller, A.
Year: 1998
Double barrier resonant tunneling diodes in frequency multiplier applications performances study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Neculoiu, D.; Dobrescu, D.; Dobrescu, L.
Year: 1998
Fractal properties of heat treated metal-compound semiconductor structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kovacs, B.; Dobos, L.; Mojzes, I.; Schuszter, M.
Year: 1998
I-V characterisation of resonant tunneling diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dozsa, L.; Riesz, F.; Vo Van Tuyen; Szentpali, B.; Muller, A.
Year: 1998
A physical-statistical time-series model for the mobile-satellite channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tzaras, C.; Saunders, S.R.; Evans, B.G.
Year: 1998
Indoor ISM band multipath fading: frequency and antenna diversity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Colburn, J.S.; Jensen, M.A.; Rahmat-Samii, Y.
Year: 1998
A hybrid MoM/FDTD technique for studying human head/antenna interactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Forgy, E.A.; Chew, W.C.; Jin, J.M.
Year: 1998
Improved feed system design for a wideband dipole array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:London, S.Y.; Leonov, V.P.; Koert, P.; Susman, L.
Year: 1998
Broadband sector zone base station antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tefiku, F.
Year: 1998
A novel crank quadrifilar slot antenna for GPS hand-held receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ho, C.H.; Huang, D.W.; Wu, B.
Year: 1998
A new GPS hexafilar slot antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ho, C.H.; Huang, D.W.; Wu, B.
Year: 1998
The circularly polarized cylindrical patch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sipus, Z.; Herscovici, N.; Bonefacic, D.
Year: 1998
Compact wide-band microstrip antennas for PCS and cellular phones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanad, M.; Hassan, N.
Year: 1998
A novel dual-band patch antenna for GSM band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fayyaz, N.; Shin, E.; Safavi-Naeini, S.
Year: 1998
Aperture-coupled microstrip antennas using reflector elements for wireless communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Targonski, S.D.; Pozar, D.M.; Waterhouse, R.B.
Year: 1998
Circularly polarized single-fed microstrip patch for wireless communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Herscovici, N.; Sipus, Z.; Bonefacic, D.
Year: 1998
Microstrip base station antenna made of honeycomb composites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kabacik, P.; Bialkowski, M.
Year: 1998
A uniform optimization technique for offset assignment problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leupers, R.; David, F.
Year: 1998
Intellectual property re-use in embedded system co-design: an industrial case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Filippi, E.; Lavagno, L.; Licciardi, L.; Montanaro, A.; Paolini, M.; Passerone, R.; Sgroi, M.; Sangiovanni-Vincentelli, A.
Year: 1998
Incorporating cores into system-level specification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vahid, F.; Givargis, T.
Year: 1998
Resource constrained modulo scheduling with global resource sharing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaschke, C.; Laur, R.
Year: 1998
Statistical performance-driven module binding in high-level synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomiyama, H.; Inoue, A.; Yasuura, H.
Year: 1998
Concurrent error detection at architectural level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bolchini, C.; Fornaciari, W.; Salice, F.; Sciuto, D.
Year: 1998
Synchronization detection for multi-process hierarchical synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bringmann, O.; Rosenstiel, W.; Reichardt, D.
Year: 1998
Integrating communication protocol selection with partitioning in hardware/software codesign
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Knudsen, P.V.; Madsen, J.
Year: 1998
Application of instruction analysis/synthesis tools to x86's functional unit allocation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ing-Jer Huang; Ping-Huei Xie
Year: 1998
A tool for partitioning and pipelined scheduling of hardware-software systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chatha, K.S.; Vemuri, R.
Year: 1998
Fine grain incremental rescheduling via architectural retiming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hassoun, S.
Year: 1998
Integration of flip chip assembly in the SMT process: manufacturing and productivity issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung, E.; Kloeser, J.; Heinricht, K.; Lauter, L.; Aschenbrenner, R.; Reichl, H.
Year: 1998
Designed experiment to assess flip-chip-on-board reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yegnasubramanian, S.; Deshmukh, R.; Fanucci, R.; Gannon, J.; Serafino, A.; Morris, J.R.
Year: 1998
Flux-free process for placement and attach of solder balls to wafers, flip chips and all BGA packages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramos, R.
Year: 1998
Cycle time estimation for printed circuit board assemblies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haberle, K.R.; Graves, R.J.
Year: 1998
Implementation of a "perfect launch" process to improve the effectiveness of automotive new product ramps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hempleman, G.L.
Year: 1998
Analysis of factors affecting component placement accuracy in SMT electronics assembly
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kamen, E.; Goldstein, A.; Creveling, D.; Sahinci, E.; Xiong, Z.
Year: 1998
Investigation of the correlation of peel strength and pad adhesion measurements using different printed circuit board base materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mueller, S.
Year: 1998
Accompanying quality assurance for high level processing of advanced packages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feldmann, K.; Feuerstein, R.
Year: 1998
Analysis and application of vibration behaviour for wirebonding capillary by transmission laser vibrometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tamura, Y.; Miyahara, Y.; Suzuki, H.
Year: 1998
A comprehensive evaluation of the strength of AART solder joints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seeniraj, R.; Manessis, D.; Srihari, K.; Westby, G.R.
Year: 1998
Manufacturing test and measurement technology for wideband interconnects using transient thermal pulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, A.; Biskup, J.; Flake, R.
Year: 1998
The implementation of an "in-scribe" product test strategy to optimize a manufacturing "constraint" and improve yield (metric) performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:MacAfee, G.H.; Brim, S.; Matthews, G.
Year: 1998
Test head scheduling in a semiconductor test facility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bahadur, S.; Mohanraj, S.; Tirupati, D.
Year: 1998
Evaluation of manufacturing handling characteristics of hydrogen peroxide-based tungsten CMP slurry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bare, J.P.; Johl, B.
Year: 1998
Surface contamination of bonding pads incapable of Au wire bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, M.; Tabuse, K.
Year: 1998
Development of high-k photo-definable epoxy composites for embedded capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ogitani, S.; Bidstrup-Allen, S.A.; Kohl, P.
Year: 1998
Evaluation of process parameters for flip chip stencil printing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguty, T.A.; Riedlin, M.H.A.; Ekere, N.N.
Year: 1998
A parametric study of the design constraints and manufacturing tolerances for controlled impedance tape ball grid array designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harvey, P.M.
Year: 1998
A novel MCM package for RF applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Degani, Y.; Dudderar, T.D.; Frye, R.C.; Gregus, J.A.; Jacala, J.J.; Kossives, D.; Lau, M.Y.; Low, Y.; Smith, P.R.; Tai, K.L.
Year: 1998
Failure modes & effects analysis (FMEA) of flip chip devices attached to printed wiring boards (PWB)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kennedy, M.
Year: 1998
Reliability performance assessment and characterization of fine pitch mold array BGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thompson, T.; Huang, E.; Miller, J.; Carrasco, A.
Year: 1998
Reduction of the energy in a notebook computer using lifecycle analysis and design for environment methodologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Janert, J.; Lo, K.; White, C.
Year: 1998
Waste treatment for advanced semiconductor packaging operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brown, P.T.; Raley, B.
Year: 1998
Implications of EPA's Risk Management Program to semiconductor manufacturers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davis, B.J.; Nauert, C.
Year: 1998
A comparison of chilled DI water/ozone and CO/sub 2/-based supercritical fluids as replacements for photoresist-stripping solvents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rubin, J.B.; Davenhall, L.B.; Barton, J.; Taylor, C.M.V.; Tiefert, K.
Year: 1998
Board level reliability for laminate CSP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, A.; Kudo, I.; Hart, C.; Partridge, J.
Year: 1998
Reliability performance and failure mode of high I/O thermally enhanced ball grid array packages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coyle, R.J.; Ejim, T.I.; Holliday, A.; Solan, P.P.; Dorey, J.K.
Year: 1998
Effects of epitaxial silicon technology on the manufacturing performance of wafer fabrication lines [isolation]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hughes, J.C.; Neudeck, G.W.; Uzsoy, R.
Year: 1998
Integration of non photosensitive polyimide into an existing crossover photoresist process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Larson, L.; Rhorer, A.
Year: 1998
Using the theory of constraints' production application in a semiconductor fab with a reentrant bottleneck
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kayton, D.
Year: 1998
Lab sessions and prototyping in interconnection and packaging education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Illyefalvi-Vitez, Z.; Ruszinko, M.; Pinkola, J.; Harsanyi, G.
Year: 1998
Evaluation of conductive adhesives for industrial SMT assemblies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perichaud, M.G.; Deletage, J.Y.; Fremont, H.; Danto, Y.; Faure, C.; Salagoity, M.
Year: 1998
Thermosonic bonding of high-power semiconductor devices for integration with planar microstrip circuitry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lawyer, P.H.; Choudhury, D.; Wetzel, M.D.; Rensch, D.B.
Year: 1998
70 /spl mu/m fine pitch wirebonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen, L.; Singh, I.; Murray, C.; Jackson, J.; DeRosa, J.; Ho, D.
Year: 1998
Modeling via formation in photosensitive MCM dielectric materials using sequential neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, T.S.; May, G.S.
Year: 1998
Neural network-based real time thermal design expert system [packaging]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vikram, S.; Nguyen, L.
Year: 1998
Performance enhanced copper core BGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu, P.; Chen, K.; Ho, L.H.; Nachnani, M.
Year: 1998
Cost analysis: solder bumped flip chip versus wire bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lau, J.; Chen, R.
Year: 1998
Low-cost manufacturing strategy for miniature packaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen, L.; Lee, S.; Takiar, H.
Year: 1998
Analysis and modeling of systematic and defect related yield issues during early development of a new technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guldi, R.; Watts, J.; Paparao, S.; Catlett, D.; Montgomery, J.; Saeki, T.
Year: 1998
How to simultaneously reduce /spl alpha/ and /spl beta/ error with SPC? A multivariate process control approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nasongkhla, R.; Shanthikumar, J.G.; Nurani, R.K.; McIntyre, M.
Year: 1998
Yield analysis and data management using Yield Manager/sup TM/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, F.; Smith, S.
Year: 1998
A comparison of critical area analysis tools [IC yield]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fitzpatrick, S.; O'Donoghue, G.; Cheek, G.
Year: 1998
The advantages of using short cycle time manufacturing (SCM) instead of continuous flow manufacturing (CFM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martin, D.P.
Year: 1998
Improvement of AME 8110 oxide etcher daily clean
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Welp, K.; Fisher, P.; Holden, J.; Wang, P.; Gunn, M.; Franco, J.
Year: 1998
Semiconductor metrics: conflicting goals or increasing opportunities?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sattler, L.; Schlueter, R.
Year: 1998
Towards real time fault identification in plasma etching using neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang, B.; May, G.S.
Year: 1998
A80-a new perspective on predictable factory performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cunningham, C.; Babikian, R.
Year: 1998
Statistical methodology for yield enhancement via baseline reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fridgeirsdottir, K.; Akella, R.; Li, M.; McNally, P.; Mittal, S.
Year: 1998
Development of new methodology and technique to accelerate region yield improvement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, K.; Mitchell, P.; Nulty, J.; Carpenter, M.; Kavan, L.; Jin, B.; McMahon, G.; Seams, C.; Fewkes, J.; Gordon, A.; Sandstrom, C.
Year: 1998
Correlation of digital image metrics to production ADC matching performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blais, J.; Fischer, V.; Moalem, Y.; Saunders, M.
Year: 1998
Defect inspection sampling plans-which one is right for me?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scanlan, B.
Year: 1998
Sampling methodology for SEM-based defect classification: risk, cost, and benefit analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akella, R.; Lin, C.-H.; Chitturi, P.
Year: 1998
The effect of performance based incentive plans [IC manufacturing]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ingersoll, T.
Year: 1998
Enhancing fab performance under team council methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dupuis, R.N., Jr.; Gervais, J.; Park, S.
Year: 1998
Risk management exercise in a wafer fab utilizing dynamic simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McCay, T.; DePinto, G.
Year: 1998
Rewards, structure and alignment affect goal attainment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gentleman-Ingersoll, J.L.
Year: 1998
Quantifying capacity loss associated with staffing in a semiconductor manufacturing line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pollitt, C.; Matthews, J.
Year: 1998
Filling the technology gap through balanced joint development projects and contracted independent research providers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Runnels, S.; Miceli, F.; Kim, I.; Easter, B.
Year: 1998
Automated lot tracking and identification system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rohrer, U.
Year: 1998
A cost benefit analysis of photolithography and metrology dedication in a metrology constrained multipart number fabricator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woods, R.H.
Year: 1998
Dynamic capacity modeling [IC manufacture]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mercier, J.R.
Year: 1998
Effect of 300 mm wafer and small lot size on final test process efficiency and cost of LSI manufacturing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakamae, K.; Chikamura, A.; Fujioka, H.
Year: 1998
A framework for real-time process control. I. Data sampling and processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rong, G.
Year: 1998
In-line defect density targets for new technology from development to manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shamble, E.; Ben-Tzur, M.; Sharifzadeh, S.
Year: 1998
Manufacturing and reliability improvements in metal-oxide-metal capacitors-MOMCAPs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lowell, L.
Year: 1998
Manufacturing for design: putting process control in the language of the designer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Potts, D.C.
Year: 1998
New business models for standard and ASIC products in the semiconductor industry-competing on cost and time-to-market
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akella, R.; Kleinknecht, J.; Gillespie, J.; Kim, B.
Year: 1998
Reducing perfluorinated compound emissions [CVD chamber cleaning]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hines, C.M.; Pinto, J.N.; Izor, R.C.; Tamayo, T.A.; Miller, W.J.
Year: 1998
Yield management for development and manufacture of integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koyama, H.; Inokuchi, M.
Year: 1998
America, Japan, and Europe-which areas have the edge in customer satisfaction and why [semiconductor capital equipment]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burgeson, C.D.
Year: 1998


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