A synthetic aperture imaging system using surface wave modes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bozkurt, A.; Arikan, O.; Atalar, A.
Year: 1995
Synthetic aperture focusing techniques applied in the near field of a focused transducer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masri, W.; Mina, M.; Udpa, S.S.; Udpa, L.; Xue, T.; Lord, W.
Year: 1995
Detection of ultrasonic Lamb waves in composite plates using optical-fibres
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gachagan, A.; Pierce, S.G.; Philp, W.R.; McNab, A.; Hayward, G.; Culshaw, B.
Year: 1995
Switchable single mode Lamb wave transduction by means of both side excitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mao, Y.; Shui, Y.; Jiang, W.; Yin, J.
Year: 1995
Fresnel Lamb wave and V-groove lenses with tunable mode selectivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yarahoglu, G.G.; Atalar, A.; Koymen, H.
Year: 1995
Capped ceramic hydrophones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tressler, J.F.; Dogan, A.; Fernandez, J.F.; Fielding, J.T., Jr.; Uchino, K.; Newnham, R.E.
Year: 1995
Analysis of spurious vibrations in mesa-shaped AT-cut quartz plates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishizaki, A.; Sekimoto, H.; Tajima, D.; Watanabe, Y.
Year: 1995
Novel composite piezoelectric materials using direct bonding techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eda, K.; Tomita, Y.; Sugimoto, M.; Nanba, A.; Ogura, T.; Taguchi, Y.; Kawasaki, O.
Year: 1995
Point contact transducer of waveguiding structure for high-frequency operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamada, K.; Khuri-Yakub, B.T.
Year: 1995
Calculation of transient fields in immersed solids radiated by linear focusing arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ping Wu; Kazys, R.; Stepinski, T.
Year: 1995
The third overtone resonator using 36/spl deg/ rotated Y cut LiNbO/sub 3/ crystal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yachi, M.; Ono, M.
Year: 1995
Calculation scheme for electroelastic moduli of 0-3 piezocomposites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Levassort, F.; Certon, D.; Feuillard, G.; Patat, F.; Lethiecq, M.
Year: 1995
Recent developments of ultrasonic welding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsujino, J.
Year: 1995
Development of torsional-vibration systems used for high frequency ultrasonic plastic welding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adachi, K.; Saito, M.; Ikeya, M.; Mori, S.
Year: 1995
A high frequency sonar simulator for accurate prediction of acoustic system performance in the underwater environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caperan, T.; Hyslop, J.; Hayward, G.
Year: 1995
Investigation of acoustic streaming excited by surface acoustic waves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uchida, T.; Suzuki, T.; Shiokawa, S.
Year: 1995
Evaluation of the ultrasonic detectability of microcalcifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anderson, M.; Soo, M.S.; Bentley, R.; Trahey, G.
Year: 1995
Determination of cell interaction forces in suspensions with ultrasonic scattering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cobet, U.; Pfundner, P.; Walke, M.; Schultz, M.; Schrodter, I.
Year: 1995
Design of sparse array imaging systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lockwood, G.R.; Foster, F.S.
Year: 1995
Ultrafine scale piezoelectric composite materials for high frequency ultrasonic imaging arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pazol, B.G.; Bowen, L.J.; Gentilman, R.L.; Pham, H.T.; Serwatka, W.J.; Oakley, C.G.; Dietz, D.R.
Year: 1995
2D large aperture ultrasound phased arrays for hyperthermia cancer therapy: design, fabrication and experimental results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:VanBaren, P.; Kluiwstra, J.-U.; Seip, R.; Zhang, Y.; Ebbini, E.S.; Cain, C.A.
Year: 1995
A 128/spl times/4 channels 1.5D curved linear array for medical imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tournois, P.; Calisti, S.; Doisy, Y.; Bureau, J.M.; Bernard, F.
Year: 1995
Optimization of the beampattern of 2D sparse arrays by weighting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Holm, S.; Elgetun, B.
Year: 1995
A model based approach to improve the performance of the geometric filtering speckle reduction algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Busse, L.J.; Crimmins, T.R.; Fienup, J.R.
Year: 1995
The application of k-space in medical ultrasound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walker, W.F.; Trahey, G.E.
Year: 1995
Simulation of B-mode imaging and spatial compounding in inhomogeneous media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krueger, M.; Ermert, H.; Li, M.; Kaarmann, H.T.
Year: 1995
Limits on the performance of near field phase aberration correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walker, W.F.; Trahey, G.E.
Year: 1995
A vector Doppler ultrasound instrument
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dunmire, B.L.; Beach, K.W.; Labs, K.H.; Detmer, P.R.; Standness, D.E., Jr.
Year: 1995
Relative performance of two-dimensional speckle-tracking techniques: normalized correlation, non-normalized correlation and sum-absolute-difference
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Friemel, B.H.; Bohs, L.N.; Trahey, G.E.
Year: 1995
A study on the feasibility of using power level for detection of turbulence and vessel differentiation in Doppler power imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shih-Jeh Wu; Reyner, J.; Shung, K.K.; Routh, H.F.
Year: 1995
Micromachined silicon needle for ultrasonic surgery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lal, A.; White, R.M.
Year: 1995
Physics of ultrasonic surgery using tissue fragmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cimino, W.W.; Bond, L.J.
Year: 1995
A new storage scheme for the Lanczos solution of large scale finite element models of piezoelectric resonators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong, Y.-K.
Year: 1995
Physics-of-failure: an approach to reliable product development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pecht, M.; Dasgupta, A.
Year: 1995
On the road to building-in reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erhart, D.L.; Schafft, H.A.; Gladden, W.K.
Year: 1995
Using CHARM-2 wafers to increase reliability in ion implant processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bammi, R.; Reno, S.E.
Year: 1995
A system engineering approach to the design of on-chip electrostatic discharge protection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eaton, J., Jr.; Horner, R.
Year: 1995
Corner point lot qualification technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gagnon, J.J.; Potts, D.C.; Park, S.C.; Whitcomb, R.D.
Year: 1995
A design reliability methodology for CMOS VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oshiro, L.; Radojcic, R.
Year: 1995
Implementation of a WLR-program into a production line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Papp, A.; Bieringer, F.; Koch, D.; Kammer, H.; Kohlhase, A.; Lill, A.; Preussger, A.; Schlemm, A.; Schneegans, M.
Year: 1995
A study of EEPROM endurance correlation with wafer level reliability data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilkie, D.; Hensen, M.
Year: 1995
Detection and measurement of hot carrier degradation associated with asymmetric p-channel transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aldridge, B.; Sharif, N.; Yum, E.; Serhan, F.
Year: 1995
Assessing MOS gate oxide reliability on wafer level with ramped/constant voltage and current stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martin, A.; Suehle, J.; Chaparala, P.; O'Sullivan, P.; Mathewson, A.; Messick, C.
Year: 1995
A new approach for predicting AC hot carrier lifetime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kato, H.
Year: 1995
Discussion group session summary: Package and die interactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gee, S.; Luu Nguyen; Sweet, J.
Year: 1995
A new WLR method based on model parameter analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zimmer, T.; Duluc, J.B.; Milet, N.; Dom, J.P.
Year: 1995
A new technique to measure thin oxide thickness in IC manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nayak, D.K.; Wang, L.; Rakkhit, R.
Year: 1995
Building in reliability (BIR) with critical nodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dion, M.
Year: 1995
Simulation of wafer scale diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Iychettira; L.E. LaForge
Year: 1995
Dielectric step stress and life stress comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strong, A.; Wu, E.; Bolam, R.
Year: 1995
Migrated copper resistive shorts in plastic encapsulated devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Yalamanchili; A. Christou
Year: 1995
Reliability prediction through critical area analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mattick, J.H.N.; Kelsall, R.W.; Miles, R.E.
Year: 1995
Monolithic V-band high power and varactor tunable HEMT oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Schefer; U. Lott; B.-U. Klepser; H.-P. Meier; W. Patrick; W. Bachtold
Year: 1995
'tsupdood? Repackaged problems for you and MMI [security]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bace, R.G.; Schaefer, M.
Year: 1995
QuARC: expressive security mechanisms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yesberg, J.D.; Anderson, M.S.
Year: 1995
Virtual enterprises and the enterprise security architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haigh, T.
Year: 1995
Dependability of computer systems: concepts, limits, improvements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laprie, J.-C.
Year: 1995
An experience report on requirements reliability engineering using formal methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamilton, D.; Covington, R.; Lee, A.
Year: 1995
The role of testing in the B formal development process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Waeselynck, H.; Boulanger, J.-L.
Year: 1995
An approach to safety and correctness verification of software design specification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eun Mi Kim; Kusumoto, S.; Kikuno, T.
Year: 1995
Test generation for Boolean expressions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paradkar, A.; Tai, K.C.
Year: 1995
Software Reliability in COTS-Based Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mangan, P.K.; Cruse, B.; VanBlois, J.P.; Levendel, H.; Nogue, J.
Year: 1995
Dependable computing depends on structured fault tolerance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avizienis, A.
Year: 1995
Dependability of modular software in a multiuser operational environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meyer, J.F.; Littlewood, B.; Wright, D.R.
Year: 1995
Analysis of software rejuvenation using Markov Regenerative Stochastic Petri Net
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garg, S.; Puliafito, A.; Telek, M.; Trivedi, K.S.
Year: 1995
Performability modeling of N version programming technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goseva-Popstojanova, K.; Grnarov, A.
Year: 1995
Predicting software's minimum-time-to-hazard and mean-time-to-hazard for rare input events
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Voas, J.M.; Miller, K.W.
Year: 1995
Software reliability growth analysis: application of NHPP models and its evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nara, T.; Nakata, M.; Ooishi, A.
Year: 1995
BNR/NORTEL: path to improve product quality, reliability and customer satisfaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baziuk, W.
Year: 1995
Defect reduction in VSE-methodology and results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buczilowski, H.
Year: 1995
Constructing operational profiles for synchronous critical software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ouabdesselam, F.; Parissis, I.
Year: 1995
An approach to automatic detection of software failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hlady, M.; Kovacevic, R.; Li, J.J.; Pekilis, B.R.; Prairie, D.; Savor, T.; Seviora, R.E.; Simser, D.; Vorobiev, A.
Year: 1995
MICOM IV&V planning approach and experience involving software reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Loesh, R.E.; Gosnell, A.B.; Johannes, J.D.; Wyskida, R.M.; Zutaut, S.E.
Year: 1995
Software reliability engineering study of a large-scale telecommunications software system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carman, D.W.; Dolinsky, A.A.; Lyu, M.R.; Yu, J.S.
Year: 1995
An analysis of system level software availability during test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Franklin, P.H.
Year: 1995
M-elopee: a CASE tool for software reliability study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vallee, F.; Gayet, B.; Derriennic, H.; Le Gall, G.
Year: 1995
Active antenna elements for millimeter-wave cellular communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vaughan, M.J.; Wright, W.; Compton, R.C.
Year: 1995
Rain attenuation characteristics on radio links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manabe, T.; Yoshida, T.
Year: 1995
Quasi-optical grid amplifiers and oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weikle, R.M., II
Year: 1995
Algorithms for blind identification of terrestrial microwave channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gomez del Moral, J.B.; Biglieri, E.
Year: 1995
Analysis of the "hot" electron regime of operation in heterostructure field effect transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martinez, E.; Shur, M.; Schuermeyer, F.
Year: 1995
60 GHz MMIC mixer using a dual-gate PM HEMT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Allam, R.; Kolanowski, C.; Langrez, D.; Bourne, P.; De Jaeger, J.C.; Crosnier, Y.; Salmer, G.
Year: 1995
Estimation of the surface reflectivity of SAR images based on a marked Poisson point process model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daba, J.S.; Bell, M.R.
Year: 1995
A DSP perspective of sigma-delta techniques and applications in communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bellanger, M.
Year: 1995
Modified delay-locked loop for fading channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilde, A.
Year: 1995
Railway cab signalling by track circuits and spread spectrum modulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Costamagna, E.; Pellegrini, P.F.
Year: 1995
A computer-aided impedance characterization for microwave resonant-cap circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kar, S.
Year: 1995
A manufacturable GaAs BiFET technology for high speed signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, M.F.
Year: 1995
A fuzzy-rule-based phase error detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daffara, F.
Year: 1995
Variance of quantization error at the output of recursive digital filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mollova, G.
Year: 1995
Sampling errors and the influence of processing after sampling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woschni, E.-G.
Year: 1995
Longitudinal electron transport in non regular electron waveguides for future ultra fast nanoelectronic devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tager, A.S.
Year: 1995
An integratable current-tunable R-L oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srisuchinwong, B.; Trung, N.V.
Year: 1995
The volume-metrical monolithic integrated circuits for microwave band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gvozdev, V.I.; Podkovyrin, S.I.; Lyalin, A.A.
Year: 1995
An IC for closed-loop micromotor control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rao, N.K.; Hartsfield, D.K.; Purushotham, A.; Garverick, S.L.
Year: 1995
Rheolinear system theory applied to the problem of generation of extremely low frequencies and to frequency modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woschni, E.-G.
Year: 1995
On log domain filtering for RF applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frey, D.
Year: 1995
Current sensing schemes for use in BiCMOS integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corsi, M.
Year: 1995
A triple-channel 90 V high-speed monolithic CRT driver circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mills, T.B.; Hebert, F.
Year: 1995
Predictive modelling of lateral scaling in bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walkey, D.J.; Schroter, M.; Voinigescu, S.
Year: 1995
A 200 mm SiGe-HBT BiCMOS technology for mixed signal applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen-Ngoc, D.; Harame, D.L.; Malinowski, J.C.; Jeng, S.J.; Schonenberg, K.T.; Gilbert, M.M.; Berg, G.D.; Wu, S.; Soyuer, M.; Tallman, K.A.; Stein, K.J.; Groves, R.A.; Subbanna, S.; Colavito, D.B.; Sunderland, D.A.; Meyerson, B.S.
Year: 1995
A double-spacer technology for the formation of very narrow emitter (0.3 /spl mu/m) double-polysilicon bipolar transistors using 0.8-/spl mu/m photolithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, C.; Scharf, B.; Garone, P.; Humphries, P.; O, K.
Year: 1995
Low-power design methodology for Gbit/s bipolar LSIs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koike, K.; Kawai, K.; Onozawa, A.; Kobayashi, Y.; Ichino, H.
Year: 1995
A 23 GHz static 1/128 frequency divider implemented in a manufacturable Si/SiGe HBT process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Case, M.; Knorr, S.; Larson, L.; Rensch, D.; Harame, D.; Meyerson, B.; Rosenbaum, S.
Year: 1995
Low-frequency noise in UHV/CVD Si- and SiGe-base bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vempati, L.S.; Cressler, J.D.; Babcock, J.A.; Jaeger, R.C.; Harame, D.L.
Year: 1995
1.5 /spl mu/m analog BiCMOS/DMOS process for medium voltage and current power ICs applications up to 50 V
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:El-Diwany, M.; McGregor, J.; Demirliogiu, E.; Huang, R.
Year: 1995
A BiCMOS fully-differential 10-bit 40 MHz pipelined ADC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tzi-Hsiung Shu; Bacrania, K.; Gokhale, R.
Year: 1995
A 5-GHz SiGe HBT return-to-zero comparator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gao, W.; Snelgrove, W.M.; Varelas, T.; Kovacic, S.J.; Harame, D.L.
Year: 1995
Modeling of the substrate effect in high-speed Si-bipolar ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pfost, M.; Rein, H.-M.; Holzwarth, T.
Year: 1995
12-GHz Gilbert mixers using a manufacturable Si/SiGe epitaxial-base bipolar technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glenn, J.; Case, M.; Harame, D.; Meyerson, B.; Poisson, R.
Year: 1995
Silicon bipolar 12 GHz downconverter for satellite receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hutchinson, C.; Frank, M.; Negus, K.
Year: 1995
Simulation prototyping of high power modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, H.H.; Shenai, K.
Year: 1995
Experiences on using a workstation cluster to implement a real-time digital transient network analyzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barretta, L.; Cremonesi, P.; Panzeri, E.; Scarabottolo, N.
Year: 1995
Modeling of faults and abnormal conditions for the testing of generator/transformer protective relay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Winkler, W.; Sowa, P.; Halinka, A.
Year: 1995
Applications of digital power simulators: Advantages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siguerdidjane, H.B.; Gaonach, J.; Le Rohellec, N.
Year: 1995
Results of GPS satellite-synchronized end-to-end transient simulation and dynamic state tests on 500 kV and 750 kV circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jodice, J.A.; Knobel, Y.; Carr, K.; Savchenko, E.; Molkov, A.; Sokolov, V.
Year: 1995
Microcomputer-based simulator for small distribution systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miguel, A.A.; Hernan-Sanhueza, H.
Year: 1995
Heterogeneous Parallel Processing for Power System Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oyama, T.
Year: 1995
A digital simulator for protective relay testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen, J.Y.; Tang, Y.Z.; Liu, P.; Cheng, S.J.
Year: 1995
High-frequency characteristics of resonant tunneling diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elesin, V.F.; Melnikov, D.V.; Podlivaev, A.I.
Year: 1995
Optoelectronic integration of quantum well infrared photodetector for array fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, H.C.
Year: 1995
Logic design and quantum challenge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varshavsky, V.I.
Year: 1995
Proving dynamic properties in an aerospace application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nadjm-Tehrani, S.; Stromberg, J.-E.
Year: 1995
A scalable real-time synchronization protocol for distributed systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rhee, I.; Martin, G.R.
Year: 1995
MiThOS-a real-time micro-kernel threads operating system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mueller, F.; Rustagi, V.; Baker, T.P.
Year: 1995
HYTECH: the next generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henzinger, T.A.; Pei-Hsin Ho; Wong-Toi, H.
Year: 1995
Value vs. deadline scheduling in overload conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buttazzo, G.; Spuri, M.; Sensini, F.
Year: 1995
Dual priority scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davis, R.; Wellings, A.
Year: 1995
Enhancing real-time schedules to tolerate transient faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghosh, S.; Melhem, R.; Mosse, D.
Year: 1995
A software fault injection tool on real-time Mach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dawson, S.; Jahanian, F.; Mitton, T.
Year: 1995
Distributed pinwheel scheduling with end-to-end timing constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Wen Hsueh; Kwei-Jay Lin; Nong Fan
Year: 1995
The design of large real-time systems: the time-triggered approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kopetz, H.; Braun, M.; Ebner, C.; Kruger, A.; Millinger, D.; Nossal, R.; Schedl, A.
Year: 1995
On slot reuse for isochronous services in DQDB networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ching-Chih Han; Chao-Ju Hou; Shin, K.G.
Year: 1995
Modeling bus scheduling policies for real-time systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kettler, K.A.; Lehoczky, J.P.; Strosnider, J.K.
Year: 1995
Compiling Modechart specifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Puchol, C.; Mok, A.K.; Stuart, D.A.
Year: 1995
The specification and schedulability analysis of real-time systems using ACSR
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Young Choi; Insup Lee; Hong-Liang Xie
Year: 1995
A graphical language with formal semantics for the specification and analysis of real-time systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ben-Abdallah, H.; Insup Lee; Jin-Young Choi
Year: 1995
Integrating the timing analysis of pipelining and instruction caching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Healy, C.A.; Whalley, D.B.; Harmon, M.G.
Year: 1995
Efficient microarchitecture modeling and path analysis for real-time software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, Y.-T.S.; Malik, S.; Wolfe, A.
Year: 1995
Worst case timing analysis of RISC processors: R3000/R3010 case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yerang Hur; Young Hyun Bae; Sung-Soo Lim; Sung-Kwan Kim; Byung-Do Rhee; Sang Lyul Min; Chang Yun Park; Minsuk Lee; Heonshik Shin; Chong Sang Kim
Year: 1995
ARTIFACT: a platform for evaluating real-time window system designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sasinowski, J.E.; Strosnider, J.K.
Year: 1995
Current applications of silicon based microsystems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Rooij, N.F.
Year: 1995
Recent progress in micromachining technology and application in implantable biomedical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Najafi, K.
Year: 1995
Endoradiosonde needs micro machine technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uchiyama, A.
Year: 1995
A new optimizer using particle swarm theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eberhart, R.; Kennedy, J.
Year: 1995
Micro fluid sensors and actuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stemme, G.
Year: 1995
Consideration on the optimum conditions to produce micromechanical parts by photo polymerization using direct focused beam writing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, K.; Nakamoto, T.; Abraha A., P.
Year: 1995
Thermally isolated microstructures for sensors and actuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liwei Lin; Mu Chiao; Huey-Chi Chu
Year: 1995
Nickel surface micromachining
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Furukawa, S.; Roy, S.; Miyajima, H.; Mehregany, M.
Year: 1995
Micromachined S-shaped actuator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shikida, M.; Sato, K.; Harada, T.
Year: 1995
Development of micro mobile machine with wheels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hasegawa, Y.; Itoh, K.; Izawa, H.; Itoh, T.
Year: 1995
The running characteristics of a screw-principle microrobot in a small bent pipe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayashi, I.; Iwatsuki, N.; Iwashina, S.
Year: 1995
Informational processing on time sequential input with coupled nonlinear oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kajiya, K.; Yoshikawa, K.
Year: 1995
Cognitive graphics and virtual reality for direct human-robot communication in mobile robot for service use
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ulyanov, S.; Litvintseva, L.; Takanashi, Sh.; Yamafuji, K.
Year: 1995
Navigation and formation control for distributed miniature robots with micro tool and sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aoyama, H.; Nozue, M.; Iwata, F.; Fukaya, J.; Sasaki, A.
Year: 1995
Biomedical micro device fabricated by micro stereo lithography (IH process). "Metabiotic device"-a synthetic approach for life science
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ikuta, K.
Year: 1995
Micro active guide wire catheter system-characteristic evaluation, electrical model and operability evaluation of micro active catheter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shuxiang Guo; Fukuda, T.; Arai, F.; Oguro, K.; Negoro, M.; Nakamura, T.
Year: 1995
Design of an advanced computer writing tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reynaerts, D.; Van Brussel, H.
Year: 1995
Nonparametric estimation of state-price densities implicit in financial asset prices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ait-Sahalia, Y.; Lo, A.W.
Year: 1995
Price behavior and Hurst exponents of tick-by-tick interbank foreign exchange rates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moody, J.; Lizhong Wu
Year: 1995
Intraday volatility forecasting for option pricing using a neural network approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gonzalez Miranda, F.; Burgess, N.
Year: 1995
Multicriteria decision making using fuzzy quantifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yager, R.R.
Year: 1995
Nonlinear time-series analysis with non-singleton fuzzy logic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mouzouris, G.C.; Mendel, J.M.
Year: 1995
Forecasting by density shaping using neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baram, Y.; Roth, Z.
Year: 1995
An analysis of neural-network forecasts from a large-scale, real-world stock selection system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mani, G.; Quah, K.-K.; Mahfoud, S.; Barr, D.
Year: 1995
Neural networks and multivariate currency forecasting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kahhwa, N.; Gan Woon Seng
Year: 1995
Input variable selection for neural networks: application to predicting the U.S. business cycle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Utans, J.; Moody, J.; Rehfuss, S.; Siegelmann, H.
Year: 1995
Company financial strategic analysis using neural classifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ballarin, A.; Gervasi, S.; Cannata, V.; Liudaki, S.
Year: 1995
A neural network model to exploit the econometric properties of Austrian IPOs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haefke, C.; Helmenstein, C.
Year: 1995
Portfolio choice through convex optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henrotte, P.; Lebret, H.
Year: 1995
Trend visualization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piche, S.W.
Year: 1995
Function approximation with learning networks in the financial field and its application to the interest rate sector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoffmann, G.A.
Year: 1995
Neural networks in finance: an information analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kahn, R.N.; Basu, A.K.
Year: 1995
A CMOS technology roadmap for the next fifteen years
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ning, T.H.
Year: 1995
Technology policy and the re-industrialization of Hong Kong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, E.
Year: 1995
PROLIFERATION OF FABRICATION PLANTS IN THE ASIA-PACIFIC REGION
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tam, C.D.
Year: 1995
Fluidic shear-stress measurement using surface-micromachined sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Biao Huang; Chang Liu; Fu-Kang Jiang; Tung, S.; Yu-Chong Tai; Chih-Ming Ho
Year: 1995
Surface micromachined diaphragm pressure sensors with optimized piezoresistive sensing resistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liwei Lin; Weijie Yun; Huey-Chi Chu; Mu Chiao
Year: 1995
Fabrication and dynamic testing of electrostatic actuators with p/sup +/ silicon diaphragms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, E.H.; Yang, S.S.; Han, S.W.; Kim, S.Y.
Year: 1995
Fabrication and its response characteristics of MELO accelerometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jungho Pak, J.; Yi, S.H.; Sung, Y.K.; Neudeck, G.W.
Year: 1995
A novel SOI CBiCMOS compatible device structure for analog and mixed-mode circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mansun Chan; Fung, S.K.H.; Chenming Hu; Ko, P.K.
Year: 1995
ZnSe blue LED with nitrogen-doped ZnSe grown in a Se-rich condition by low-pressure OMCVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min-Yen Yeh; Ming-Kwei Lee
Year: 1995
Diffused-quantum-well vertical cavity Fabry-Perot reflection modulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Choy, W.C.H.; Ip, S.F.; Li, E.H.
Year: 1995
GaAs-InGaAs doped-channel negative-differential-resistance field-effect transistor (NDRFET)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Chau Liu; Lih-Wen Laih; Jung-Hui Tsai; Kong-Beng Thei; Cheng-Zu Wu; Wen-Shiung Lour; Yuan-Tzu Ting; Rong-Chau Liu
Year: 1995
A 70 MS/s 8-bit differential switched-current CMOS A/D converter using parallel interleaved pipelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bracey, M.; Redman-White, W.; Hughes, J.B.; Richardson, J.
Year: 1995
Hierarchical timing estimation using a module timing overlapping technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanthamanon, P.; Hellestrand, G.R.; Chan, R.L.K.
Year: 1995
A constrained terminals over-the-cell router
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shew, P.W.; Jong-Shen Shei; Pei-Yuug Hsiao
Year: 1995
Development of a novel micro FIA-ISFET integrated sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niu Mengnian; Ding Xinfang; Tao Xiang; Lin Wei
Year: 1995
Fabrication of gated wedge-shaped field emitter array by plasma etching and gold plating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinshu Zhang; Tai-Chin Lo
Year: 1995
Directions for technology CAD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mar, J.
Year: 1995
Deep-submicron MOSFET modeling for circuit simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min-Chie Jeng; Zhihong Liu; Yuhua Cheng
Year: 1995
Circuit theoretical approach for one-dimensional quantum mechanics problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanada, H.; Nagai, N.
Year: 1995
Micro yield modeling for IC processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, A.Y.; Krott, L.C.
Year: 1995
Non-radial non-uniformity in chemo-mechanical polishing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, V.S.K.; Nguyen, C.T.; Chan, A.B.Y.; Ling, C.C.; Wong, S.S.
Year: 1995
CoSi/sub 2//SiGe contact formation by Co/a-SiGe/Si solid state reaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qi, W.J.; Li, B.Z.; Jiang, G.B.; Huang, W.N.; Gu, Z.G.
Year: 1995
Electrochemical planarization by selective electroplating for embedded gold wiring in the sub-micron range
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chan, M.Y.; Lo, T.C.
Year: 1995
Dependence of deep submicron CMOSFET characteristics on shallow source/drain junction depth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwang Myoung Rho; Yo Hwan Koh; Chan Kwang Park; Seong Min Hwang; Ha Poong Chung; Myoung Jun Chung; Dai Hoon Lee
Year: 1995
Low power CMOS digital circuit design methodologies with reduced voltage swing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheung, T.S.; Asada, K.; Yip, K.L.; Wong, H.; Cheng, Y.C.
Year: 1995
An asynchronous matrix multiplier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pang, Y.W.; Choy, C.S.
Year: 1995
A full digital self-timed clock generation scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seunghyeon Nahm; Wonyong Sung
Year: 1995
An improved circuit for high performance dc-dc/ac converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian Liu; Zhiming Chen; Yanru Zhong
Year: 1995
Implementation of synthesized digital systems with VHDL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ng, L.S.; Jong, C.C.
Year: 1995
Uniqueness of the feasible voltage solutions for radial power networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiann-Fuh Chen; Wei-Ming Wang
Year: 1995
Polysilicon emitter BICFET with super-current gain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guo, W.L.; Song, Y.X.; Green, M.A.; Movvej-Farshi, M.K.
Year: 1995
Atmospheric pressure CVD-grown SiGe base HBT with the highest value of current gain-Early voltage product
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han, T.-H.; Cho, D.-H.; Lee, S.-M.; Ryum, B.R.
Year: 1995
Simulation of Ge implanted SiGe-channel p-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guo-Fu Niu; Gang Ruan
Year: 1995
Analysis of non-punch through trench emitter insulated gate bipolar transistor (IGBT)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sabesan, L.; Mawby, P.; Towers, M.; Board, K.; Waind, P.
Year: 1995
HDTV level MPEG2 video decoder VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Onoye, T.; Masaki, T.; Morimoto, Y.; Sato, Y.; Shirakawa, I.
Year: 1995
VLSI implementation of multiprocessor system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun-Woo Kang; Kee-Wook Rim
Year: 1995
ASIC implementation of a RISC microprocessor for portable workstation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seung Ho Lee; Beoyng Yoon Choi; Moon Key Lee
Year: 1995
SiGe: a promise into reality?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grimmeiss, H.G.; Olajos, J.; Engvall, J.
Year: 1995
Modeling concepts for modern semiconductor devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kosina, H.; Simlinger, T.
Year: 1995
VHDL-A: a new language for modeling and simulation of heterogeneous systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glesner, M.; Hofmann, K.
Year: 1995
A steady-state analytical model for the trench insulated gate bipolar transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Udrea, F.; Amaratunga, G.A.J.
Year: 1995
Simulation of charge transport phenomena in the channel of deep submicron MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Negoi, A.C.; Zimmermann, J.
Year: 1995
Inverse modeling and optimization of low-voltage power VDMOSFET's technology by neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trajkovic, T.; Pantic, D.
Year: 1995
Refractive index dispersion of a-Si/sub 1-x/C/sub x/:H
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomozeiu, N.; Tomozeiu, M.
Year: 1995
The effect of radiation-induced reversible switching annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pershenkov, V.S.; Belyakov, V.V.; Cherepko, S.V.; Sogoyan, A.V.; Rusanovschi, V.I.; Sontea, V.P.
Year: 1995
Building biologically active molecules/neuronal cells architectures using microlithographic/semiconductor technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolau, D.V.; Taguchi, T.; Nicolau, D.; Yoshikawa, S.
Year: 1995
An ESCA study on ion beam induced oxidation of GaAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osiceanu, P.; Alay, J.L.
Year: 1995
Deep energy levels in N-type silicon introduced by palladium diffusion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benda, V.; Stepkova, D.; Fucikova, J.
Year: 1995
Attenuated phase shift masks using MoSi as an opaque layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Popa, O.; Jonckheere, R.
Year: 1995
Simulated anisotropic etching diagrams-examples and properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moldovan, N.; Ilie, M.
Year: 1995
PC-based oscilloscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lincke, R.; Bull, I.; Trutia, A.; Logofatu, B.
Year: 1995
Optical absorption and photoconductivity of ReS/sub 2/ crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arushanov, E.; Bucher, E.; Kloc, C.; Kulikova, O.; Kulyuk, L.; Siminel, A.
Year: 1995
Structural and electrical properties of thin rf sputtered Ta/sub 2/O/sub 5/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dimitrova, T.; Atanassova, E.
Year: 1995
Planarization techniques in GaAs processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muller, A.; Rizescu, R.; Petrini, I.; Avramescu, V.; Corici, A.; Craciunoiu, F.
Year: 1995
LPCVD SiO/sub 2/ layers prepared from SiH/sub 4/ and O/sub 2/ at 450/spl deg/C in a RTP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cobianu, C.; Rem, J.B.; Klootwijk, J.H.; Weusthof, M.H.H.; Holleman, J.; Woerlee, P.H.
Year: 1995
A novel technique for p-well NMOS power IC's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cao Guangjun; Liu Sanqing; Ying Jianhua; Xu Yanzhong; Qin-Zuxin
Year: 1995
Remarks on the nature of Urbach absorption tail in glassy semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsiulyanu, D.I.; Marian, S.I.
Year: 1995
New type of optoelectronic devices-forward-biased long photodiodes based on graded III-V alloy compounds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peka, H.P.
Year: 1995
Study on the manufacturing technology of GaP-SnO/sub 2/ structures for ultraviolet radiation sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dorogan, V.; Ivashchenco, A.; Snigur, A.; Shchurova, O.; Vieru, T.
Year: 1995
Model for the electrical conductance transient behaviour in thick film SnO/sub 2/ semiconductor gas sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vilanova, X.; Llobet, E.; Correig, X.
Year: 1995
Two-way photomagnetoelectric effect [magnetic sensor]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lakatos, E.
Year: 1995
Static and noise characterization of deep submicron CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zimmermann, J.; Ghibaudo, G.
Year: 1995
Application of compound semiconductors in telecommunication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mojzes, I.
Year: 1995
Modeling of minority-carrier transport at silicon graded n-n/sup +/ junctions. II. Case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trajkovic, A.P.; Ristic, S.D.; Prijic, Z.D.
Year: 1995
Graphical I/O data flow controller for SUPREM III
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bajdechi, O.
Year: 1995
A model for describing the effect of series resistance in pseudo-MOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Popescu, A.
Year: 1995
Development of polyethylene insulation diagnosis of high voltage cables in France
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clavreul, R.; Duchateau, F.
Year: 1995
Luminescence properties of defects in P/sup +/- or B/sup +/-implanted thermally grown silicon dioxide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seol, K.S.; Ieki, A.; Ohki, Y.; Nishikawa, H.; Takiyama, M.
Year: 1995
Effect of electrode metals on electrical conduction in polyimide thin films prepared by vapor deposition polymerization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoda, S.; Shimizu, S.; Miyairi, K.
Year: 1995
Use of functionally gradient material in a temperature measuring element
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, S.; Aoki, K.; Iwata, H.; Hayashi, N.; Ohashi, A.; Kinoshita, Y.; Uchida, Y.; Dykes, D.; Touchard, G.
Year: 1995
Water absorption of extruded cable components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pelissou, S.
Year: 1995
Interface effect on treeing deterioration in XLPE/EX composite materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Changmin; Yoshimura, N.; Lim Jangseob; Miyata, H.; Niwa, T.
Year: 1995
Polymeric insulation in low voltage aerial distribution in Australia: insulation characterisation and limits to system performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birtwhistle, D.; Celina, M.; George, G.; Millers, K.
Year: 1995
Effect of surface conditions on the breakdown strength of various dielectric interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chinh Dang
Year: 1995
Unique electrical properties of self-assembled ultra-thin polymer film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Onoda, M.; Yoshino, K.
Year: 1995
Effect of acetophenone on electric conduction in LDPE film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsurimoto, T.; Mitsumoto, S.; Nagao, M.; Kosaki, M.
Year: 1995
Creepage breakdown characteristics of printed wiring board in silicone gel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takahiko Maeda; K. Haga; Takao Maeda
Year: 1995
Evaluation of TCNQ LB films on aluminum thin films by ATR measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aoki, Y.; Honda, S.; Wakamatsu, T.; Kato, Z.; Kaneko, F.
Year: 1995
Temperature and photoirradiation dependence of electrostatic phenomena at metal/polyimide LB film interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Itoh, E.; Niwa, Y.; Iwamoto, M.
Year: 1995
Conduction and high field phenomena in insulating polymer-conducting polymer composite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao Hong Yin; Yoshino, K.; Nakagawa, S.; Adachi, M.; Yamamoto, H.; Watanuki, T.; Isa, I.
Year: 1995
Effect of /spl gamma/-ray irradiation on thermally stimulated current in polyethersulfone
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eunjoo Kim; Kato, G.; Takeda, T.; Ohki, Y.
Year: 1995
Discharge phenomena in simulated tree channels by applying DC and impulse voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujita, S.; Baba, M.; Shinyama, K.
Year: 1995
Partial discharge in medium voltage extruded cable joints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lamarre, L.; Morin, R.
Year: 1995
Dynamic wetting characteristics of polymeric insulating materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blackmore, P.; Birtwhistle, D.
Year: 1995
Production systems: dealing with turbulence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moinet, M.
Year: 1995
Linear logic as a tool for reasoning on a Petri net model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Girault, F.; Pradin-Chezalviel, B.; Kunzle, L.A.; Valette, R.
Year: 1995
Towards a design methodology for flexible manufacturing systems command combining SA-RT and object Petri nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmed, S.B.; Moalla, M.; Courvoisier, M.
Year: 1995
Modeling and design of machine-tool controllers for small CIM units
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raddadi, M.; Razafindramary, D.; Fofana, M.; Boissier, R.; Soriano, T.
Year: 1995
An object-oriented and Petri net based approach for real time control of FMSs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Briand, C.; Esteban, P.
Year: 1995
Improving reusing abilities in concurrent engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biennier, F.; Coquard, P.; Beuchot, G.
Year: 1995
Concurrent engineering: an expert system for fixture design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caillaud, E.; Noyes, D.; Anglerot, G.; Padilla, P.
Year: 1995
Simulation in the life cycle of manufacturing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bansal, S.
Year: 1995
Virtual factory framework: a key enabler for agile manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jain, S.
Year: 1995
The Gintic modeling, simulation and analysis framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sen, A.; Chong, C.S.; Loh, Y.L.; Jain, S.
Year: 1995
Three mechanisms for managing resource constraints in a library for constraint-based scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Le Pape, C.
Year: 1995
Effective and efficient solution of some lot-sizing problems by tabu search
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hindi, K.S.
Year: 1995
An integrated approach for loading, routeing, and scheduling in flexible manufacturing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kato, K.
Year: 1995
State equation and stability of a class of continuous Petri nets. Application to manufacturing lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amer-Yahia, C.; Zerhouni, N.; El-Moudni, A.; Ferney, M.
Year: 1995
Petri net-based approach to intelligent control synthesis of FMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Capkovic, F.
Year: 1995
Siphon and trap generation in an incremental design process based on Petri nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feng Chu; Xiaolan Xie
Year: 1995
Control policies conciliating deadlock avoidance and flexibility in FMS resource allocation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fanti, M.P.; Maione, B.; Mascolo, S.; Turchiano, B.
Year: 1995
Designing control and diagnosis for flexible manufacturing systems as a multi-agent system using blackboard and object Petri nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hammami, S.; Tnazefti, I.; Moalla, M.; Chaillet, A.
Year: 1995
Monitoring system for discrete event systems using failure-tolerance techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rezg, N.; Niel, E.
Year: 1995
Contribution of functional analysis to failures deductive analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohafid, A.; Dumon, B.; Plot, C.
Year: 1995
Parametric and associative design of cartridges for special tools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mateos, S.; Valino, G.; Rico, J.C.
Year: 1995
Object oriented analysis and design reference models for production activity control system development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huguet, P.; Grabot, B.
Year: 1995
Dimensioning and functional tolerancing aided by computer in CAD/CAM systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mliki, M.N.; Mennier, D.
Year: 1995
Manufacturing sequence family grouping for FMS design-a new approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sedqui, A.; Baptiste, P.; Favrel, J.; Martinez, M.
Year: 1995
A greedy algorithm to determine the number of transporters in a cyclic electroplating process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Armstrong, R.; Shanhong Gu; Lei Lei
Year: 1995
An example for scheduling a chemical processing tank line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenwei Song; Storch, R.L.; Zabinsky, Z.B.
Year: 1995
Anytime scheduling with neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gallone, J.-M.; Charpillet, F.; Alexandre, F.
Year: 1995
Towards effective decision support for production scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meyer, J.; Schmidt, G.
Year: 1995
Scheduling tasks on a flexible manufacturing machine minimizing tool change delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ecker, K.
Year: 1995
Scheduling complex flexible job shop problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:El Maqrini, H.; Teghem, J.
Year: 1995
Simulation of colored Petri nets in concurrent logic programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Naim, A.; Tisseau, J.
Year: 1995
Complex sequencing by methods of interpolation in Z/pZ colored Petri nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marteau, S.; Bourcerie, M.
Year: 1995
Broadcast distributed control for assembly modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lobl, I.
Year: 1995
Skill and knowledge integration for milling monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Charbonnaud, P.; Lazrak, M.B.
Year: 1995
The QFD for planning CIM investments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferretti, M.; Lambiase, A.; Riemma, S.
Year: 1995
Proposal of a model of behavior for reactive scheduling systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baillet, P.; Cauvin, A.
Year: 1995
A tandem expert system for batch scheduling in a CIM system based on group technology concepts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Levner, E.; Levin, I.; Meyzin, L.
Year: 1995
On a trading problem with market limitations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rempala, R.
Year: 1995
A metasystemic model for the reactive firm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burlat, P.; Ouzrout, Y.; Vincent, L.
Year: 1995
C/sub 2/H/sub 2/F/sub 2/: case comprehensive hybrid-hybrid forecasting framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lacaze, H.; Dussauchoy, A.
Year: 1995
Dispatching scheduling of machines and vehicles in a flexible manufacturing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sawik, T.
Year: 1995
Comparative analysis of US-American and German standard production planning and control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schotten, M.; Kees, A.
Year: 1995
A framework for multisensor data fusion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ayari, I.; Haton, J.-P.
Year: 1995
Automatic identification of available grasping and fixturing surfaces in assembly resources planning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sere, A.T.; Laperriere, L.; Mascle, C.
Year: 1995
Applying supervisory control theory to discrete event systems modeled by object oriented principles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fabian, M.; Lennartson, B.
Year: 1995
Supervisory control of a manufacturing system using Petri net structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giua, A.
Year: 1995
Automated design of a Petri net feedback controller for a robotic assembly cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moody, J.O.; Antsaklis, P.J.; Lemmon, M.D.
Year: 1995
How the design process analysis can improve the design process management: A way to cooperative design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brun, J.-M.; Vandorpe, D.
Year: 1995
Defining CAD systems adaptable to design process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gardan, Y.
Year: 1995
On-off scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lau, R.; Favrel, J.
Year: 1995
Jobshop scheduling problems with fuzzy or flexible durations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fortemps, P.
Year: 1995
Controlling modes of operation of electrical distribution systems using expert system methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ekel, P.; Popov, V.
Year: 1995
Remaining management for automatic sheet-metal cutting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cuesta, E.; Cean-Bermudez, D.; Rico, J.C.
Year: 1995
Remaining management for automatic sheet-metal cutting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cuesta, E.; Cean-Bermudez, D.; Rico, J.C.
Year: 1995
Neural network application in aluminium hot-roll process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oboe, R.; Angoletta, M.E.
Year: 1995
Adaptation of the compared downgrading method to the object classing for the operation generation in assembly processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bergeonneau-Nervi, M.-L.; Brun-Picard, D.
Year: 1995
Assembly automation - the way to a factory of the future
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dashchenko, A.I.; Ludwig, D.; Dashchenko, O.
Year: 1995
Microgrippers realized by LIGA techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ballandras, S.; Daniau, W.; Basrour, S.; Robert, D.; Rocher, S.; Robert, L.; Blind, P.; Rouillay, M.; Bernede, P.; Megtert, S.; Liu, Z.; Labeque, A.; Rousseaux, F.; Ravet, M.F.; Hauden, D.
Year: 1995
Microtechnologies for microsensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Delapierre, G.
Year: 1995
A micromachined unit for tunnel current control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kobayashi, D.; Fujita, H.
Year: 1995
Interpretation rules of Petri net models for logic control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cazzola, F.; Ferrarini, L.; Preziosa, M.
Year: 1995
Petri nets, FCCS, and synchronous languages to specify discrete events systems: a comparative synthesis on validation power
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:El Rhalibi, A.; Crestani, D.; Prunet, F.; Durante, C.
Year: 1995
Application of timed Petri nets to modeling the schedules of manufacturing cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zuberek, W.M.
Year: 1995
Model for throughput evaluation in assembly manufacturing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas, J.P.; Nissanke, N.
Year: 1995
Integrated control of autonomous mobile robots
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reale, P.; Sebastianelli, P.; Casucci, M.
Year: 1995
A branch-and-bound algorithm for n-job two machine flow shop scheduling problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chengen Wang; Chengbin Chu; Proth, J.-M.
Year: 1995
An efficient procedure for solving a car sequencing problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guerre-Chaley, F.; Frein, Y.; Bouffard-Vercelli, R.
Year: 1995
Evaluation criteria: a method to represent and compute technological knowledge in CAPP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mognol, P.; Anselmetti, B.
Year: 1995
The SITG information system for the utilization of the TGIP software. Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Poler Escoto, R.; Lario Estaban, F.C.; Lopez Martinez, J.; Vicens Salort, E.; McDonnell, L.R.
Year: 1995
A decision support system based on a factory wide information integrated system and discrete event simulation to help solve scheduling problems in a semiconductor manufacturing environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baudouin, M.; Ruberti, C.; Arekion, J.; Kieffer, J.-P.
Year: 1995
Which tools to use in order to study manufacturing systems: spreadsheets or modelling and simulation techniques?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Claver, J.F.
Year: 1995
Specification and validation of a distributed transaction processing facility for the MMS applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dakroury, Y.; Elloy, J.P.
Year: 1995
Choice of the guide path layout for an AGV based material handling system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gourgand, M.; Xiao-Chao Sun; Tchernev, N.
Year: 1995
The automatic synthesis of performance evaluation models: the Petri net approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zbigniew, B.A.; Jerzy, H.
Year: 1995
Deadlock avoidance in FMS based on structural theory of Petri nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barkaoui, K.; Abdallah, I.B.
Year: 1995
A Petri-net-based collision and deadlock avoidance scheme for FMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jie Wu; Hanqi Zhang
Year: 1995
DPACS: a self-adaptive production activity control structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trentesaux, D.; Tahon, C.
Year: 1995
A state space model for modeling and control of manufacturing processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kosmatopoulos, E.B.; Christodoulou, M.A.
Year: 1995
Flow control in a failure-prone multi-machine manufacturing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abou-Kandkil, H.; De Smet, O.; Freiling, G.; Jank, G.
Year: 1995
A dynamic scheduling method for flexible assembly systems with prescribed product mix
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianguo Long; Marcon, E.; Besombes, B.
Year: 1995
Dynamic allocation of kanbans in a manufacturing system using perturbation analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liberatore, G.; Nicosia, S.; Valigi, P.
Year: 1995
Micromanipulation for micro- and nanomanufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johansson, S.
Year: 1995
Microtechnologies for microscaled robots and components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gebhard, M.; Benecke, W.
Year: 1995
Microrobotics, current of art and future
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fukuda, T.; Ishihara, H.; Arai, F.
Year: 1995
Computer-aided synthesis of qualitative uncertain control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nesenchuk, A.A.
Year: 1995
An O(T/sup 2/) algorithm for the lot-sizing problem with limited inventory levels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toczylowski, E.
Year: 1995
Parallel branch and bound algorithm for scheduling problem with retooling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dudek-Dyduch, E.; Dyduch, T.
Year: 1995
Using stochastic timed Petri nets for modeling and analysing an industrial application based on FIP fieldbus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berge, N.; Juanole, G.; Samaan, M.
Year: 1995
A new approach to study selected functional properties of manufacturing systems based on the concept of orthogonal functional abstractions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zurawski, R.
Year: 1995
Performance modelling of pull manufacturing systems with batch servers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schomig, A.K.; Kahnt, M.
Year: 1995
Analysis of proportional machine allocation scheme in a deterministic reentrant line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shi-Chung Chang; Wen-Lin Jan; Tza-Huei Wang; Cheng-Shang Chang
Year: 1995
A decomposition approach for performance evaluation of non-pipelined systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas, J.P.; Nissanke, N.
Year: 1995
Virtual and node routing for optimal control of production rates in a flexible manufacturing facility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vazquez-Abad, F.J.
Year: 1995
A hierarchical planning model for multistage production systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mehra, A.; Minis, I.; Proth, J.M.
Year: 1995
Sleeping beauties: scheduling the production of mattresses with sequence-dependent set ups
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Assad, A.A.; Ball, M.O.; Dahl, R.W.
Year: 1995
On the selection of parts and processes during design of printed circuit board assemblies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ball, M.O.; Baras, J.S.; Bashyam, S.; Karne, R.K.; Trichur, V.S.
Year: 1995
A framework to specify a reactive and proactive management system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Campagne, J.P.; Jacot, J.H.; Frein, Y.; Vitry, G.
Year: 1995
Multi-site planning: non flexible production units and set-up time treatment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thierry, C.; Besnard, P.; Ghattas, D.; Bel, G.
Year: 1995
Shop floor management using a fuzzy inference controller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Macchiaroli, R.; Riemma, S.
Year: 1995
Using triangular fuzzy numbers in the tests of control charts for unnatural patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kahraman, C.; Tolga, E.; Ulukan, Z.
Year: 1995
Fuzzy flexibility analysis in automated manufacturing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kahraman, C.; Tolga, E.; Ulukan, Z.
Year: 1995
Scheduling flexible manufacturing systems based on timed Petri nets and fuzzy dispatching rules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiong, H.H.; Zhou, M.C.; Manikopoulos, C.N.
Year: 1995
An application of neural networks to computer aided welding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Legoff, O.; Hascoet, J.-V.
Year: 1995
Some scheduling problems in job-shop type manufacturing processes with technological precedence constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Janiak, A.
Year: 1995
Interactive decision support for flexible manufacturing systems using simulation techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piesik, P.; Weglarz, J.
Year: 1995
Selection of assembly sequences and balancing workloads in a flexible assembly line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Korcyl, A.; Lebkowski, P.; Sawik, T.
Year: 1995
A FMS to process elevators sheet metals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanamori, Y.; Kojima, K.; Okazaki, T.; Hashiguchi, N.
Year: 1995
Analyzing selected properties of manufacturing systems using orthogonal functional abstractions: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zurawski, R.
Year: 1995
Performance analysis of a serial production line with machine breakdowns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Bracht, E.
Year: 1995
Lot streaming of a single product in two-machine no-wait flowshops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sriskandarajah, C.; Wagneur, E.
Year: 1995
On the optimization of a single-stage generalized kanban control system in manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liberopoulos, G.; Dallery, Y.
Year: 1995
Cost optimization in supply management policies for assembly systems with random component yield times
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mauroy, G.; Wardi, Y.
Year: 1995
Fuzzy linguistic modeling and control of manufacturing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mahmood, W.; Vachtsevanos, G.
Year: 1995
Work-in-progress optimization of cyclic manufacturing systems with assigned throughputs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Di Febbraro, A.; Minciardi, R.; Sacone, S.
Year: 1995
Optimization issues in automated production of printed circuit boards: operations sequencing and feeder configuration problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Or, I.; Demirkol, E.
Year: 1995
A hierarchical and modular approach to production management based on Petri nets: module simplification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Proth, J.M.; Liming Wang; Xiaolan Xie
Year: 1995
Integrated model and simulation of the production system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belmahdi, N.; Nadif, A.
Year: 1995
Using evolutionary algorithms and simulation for the optimization of manufacturing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tautou, L.; Pierreval, H.
Year: 1995
Improving the simulation model building process through guidance and feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ball, P.D.
Year: 1995
A discrete time model of a car assembly system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Furmans, K.
Year: 1995
Performance of DS/SS local wireless multi-packet reception system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mun Geon Kyeong; Kichul Han
Year: 1995
Capacity evaluation of CDMA-AIC: CDMA cellular system with adaptive interference cancellation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, S.; Ushirokawa, A.
Year: 1995
Fixed network design of cellular mobile communication networks using genetic algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shahbaz, M.
Year: 1995
Design of a single phone cellular system with underlying indoor microcells at initial stages of deployment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kinoshita, Y.; Henriques, M.A.A.; Hanamura, C.
Year: 1995
A study of CW spatial fading of the indoor radio propagation channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hashemi, H.; Tholl, D.; Vlasschaert, T.
Year: 1995
Narrow and wideband measurements for millimeter waves PCS channel characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Delisle, G.Y.; Talbi, L.
Year: 1995
Reduced complexity frequency estimator applied to burst transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Bergogne; P. Sehier; M. Bousquet
Year: 1995
Mobility functionality in new generation PABXs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuan, S.
Year: 1995
The estimation of a CDMA personal system with feedback power control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Zhengmao; Lu Bing; Lu Fan
Year: 1995
A model of the handover dwell time in mobile cellular systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruggieri, M.; Graziosi, F.; Santucci, F.
Year: 1995
The fading characteristics of distributed antennas for indoor wireless systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheung, K.W.; Murch, R.D.; Ling, C.C.
Year: 1995
Performance of selection diversity for a DS CDMA system with synchronization errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sunay, M.O.; McLane, P.J.
Year: 1995
A performance analysis of selective-repeat ARQ with multicopy retransmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, H.
Year: 1995
Proposal of fiber-optic radio highway networks using CDMA method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kajiya, S.; Tsukamoto, K.; Komaki, S.
Year: 1995
On synchronizing and detecting multi-carrier CDMA signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yooh, J.H.; Wei, V.K.
Year: 1995
Performance modelling of UPT networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwiatkowski, M.
Year: 1995
Personal Handy-phone System signalling protocol architecture - cell station-digital network interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, S.; Funakawa, K.; Ohta, N.; Nohara, T.
Year: 1995
Handover request rejection schemes in overloaded mobile systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwon, D.
Year: 1995
Robustness analysis of new fuzzy handover control for indoor cellular telephone
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kinoshita, Y.; Oku, K.
Year: 1995
Automatic window rearrangement using fuzzy rules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsuhara, S.
Year: 1995
Synchronization interface for low power PCS systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Steer, D.G.
Year: 1995
Theoretical analysis of inter-basestation-synchronization system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tong, F.; Akaiwa, Y.
Year: 1995
Software systems engineering-from domain analysis via requirements capture to software architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bjorner, D.
Year: 1995
Communication, collaboration and cooperation in software development-how should we support group work in software development?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saeki, M.
Year: 1995
A criticism on the capture-and-recapture method for software reliability assurance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Isoda, S.
Year: 1995
From scenarios to timed automata: building specifications from users requirements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Some, S.; Dssouli, R.; Vaucher, J.
Year: 1995
Expressing inter-perspective relationships: a logical approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perrussel, L.
Year: 1995
Building the structure of specification documents from utterances of requirements elicitation meetings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miura, N.; Kaiya, H.; Saeki, M.
Year: 1995
Class exerciser: a basic CASE tool for object-oriented development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chien-Min Wang; Kuo, Y.S.
Year: 1995
Management of distributed concurrent development for large scale software systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aoyama, M.
Year: 1995
Evolutional agents: field oriented programming language, Flage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumeno, F.; Tahara, Y.; Ohsuga, A.; Honiden, S.
Year: 1995
Software environment support for integrated formal program specification and development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grundy, J.C.; Hosking, J.G.
Year: 1995
Modelling systems that integrate programming language and environment mechanisms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ransom, K.J.; Marlin, C.D.
Year: 1995
Providing configuration management support in software engineering environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han, J.
Year: 1995
Living with free type and class union
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Song Dong
Year: 1995
Knowledge acquisition and integration on specification change-a method for systematic reuse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsuura, S.; Honiden, S.
Year: 1995
Prototyping the structured specification as logic programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leung, K.R.P.H.; Chan, D.K.C.
Year: 1995
Flexible module operation scheme in formal specification process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Horai, H.
Year: 1995
An environment for the reverse engineering of executable programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cifuentes, C.
Year: 1995
Design and implementation of a method base management system for a situational CASE environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harmsen, F.; Brinkkemper, S.
Year: 1995
A simple configuration management system for CASE repository
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee Taeheun; Chisu Wu
Year: 1995
Integration of software process management and development history recording
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dissman, S.; Gruhn, V.; Ohrndorf, D.
Year: 1995
Limitations of formal methods and an approach to improvement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shaoying Liu; Adams, R.
Year: 1995
Panel on Software Process Improvement Paradigms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zucconi, L.
Year: 1995
Is software engineering really engineering?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Low, G.
Year: 1995
Is software engineering really engineering?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Offen, R.
Year: 1995
Software engineering research validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jeffery, R.
Year: 1995
Notebook computer and low EMI approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghose, A.K.; Deb, G.K.
Year: 1995
EMC analysis in PCB designs using an expert system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nageswara Rao, K.; Venkata Ramana, P.; Krishnamurthy, M.V.; Srinivas, K.
Year: 1995
EMC design verification of PCB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghose, A.K.; Deb, G.K.
Year: 1995
Relevance of EMC education in undergraduate course
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deb, G.K.
Year: 1995
EMC education through distance mode and open learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dey, S.T.K.; Ghosh, C.K.
Year: 1995
Recent techniques in electromagnetic modeling and analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rao, S.M.; Gothard, G.K.
Year: 1995
Simulation of the response of external ESD protection circuits for CMOS ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renuka, R.; Rajesh, J.; Hariharan, V.K.; Shastry, S.V.K.
Year: 1995
Electromagnetic field to unshielded wire coupling model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hariharan, V.K.; Pal, R.K.; Murthy, P.V.N.; Lakshminarayana, V.; Shastry, S.V.K.; Katti, V.R.
Year: 1995
Automated frequency assignment to obtain operational EMC in the battlefield
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Singh, A.P.
Year: 1995
Dipole excitation of RF shielded chamber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shastry, S.V.K.; Nagesh, S.K.; Rao, M.N.
Year: 1995
Alternative test methods for RF immunity testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hopkins, M.; Hatchard, C.
Year: 1995
EMI susceptibility characteristics of electromedical equipment in a typical hospital electromagnetic environment with particular reference to electrocardiography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bandopadhyay, S.; Varkey, J.K.
Year: 1995
Common mode coupling in INSAT-2: a case history
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prahlad Rao, N.; Rao, M.N.; Rambabu, T.V.S.; Managoli, H.Y.; Vinod, S.C.; Singhal, Y.K.; Katti, V.R.
Year: 1995
EMC design of a modern fighter aircraft-a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rao, P.N.A.P.; Chandrasekhar, N.S.; Parthasarathy, T.
Year: 1995
EMI hardening of missile ground support systems-a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakravarti, B.; Devender
Year: 1995
Typical EMI problems in a surface to air missile-a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suryanarayana, K.; Rajeshwar Rao, K.
Year: 1995
A technique for depositing metal layers over large areas for EMI shielding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhatia, M.S.
Year: 1995
Application of filtering, shielding and grounding techniques for an on-line process controller in a jute mill
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chatterjee, A.; Deb, G.K.
Year: 1995
Novel manufacturing and assembly approach to EMI/RFI suppression of high density connectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:North, S.J.; Noade, C.J.; Pennel, R.
Year: 1995
Noise reduction techniques in pulse width modulated inductive switching systems of PSLV
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Umamaheswaran, R.; Narayana Moorthy, N.; Veeraraghavan, P.S.
Year: 1995
EMI control methodologies-application in a low cost TV demodulator system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarkar, A.K.; Mondal, S.K.; Ghosh, A.K.; Deb, G.K.
Year: 1995
A practical study of EMC-aspect in electronic ballast: an analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chatterjee, S.; Basu, D.
Year: 1995
The effect of new European norms on the world EMC market
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Norton, M.
Year: 1995
A taxonomy of programming models for symmetric multiprocessors and SMP clusters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gropp, W.W.; Lusk, E.L.
Year: 1995
Integrating synchronous and asynchronous paradigms: the Fork95 parallel programming language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kessler, C.W.; Seidl, H.
Year: 1995
Smart power technology and the evolution from protective umbrella to complete system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Murari, B.
Year: 1995
Statistical variation of NMOSFET hot-carrier lifetime and its impact on digital circuit reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, J.F.; McGaughy, B.W.; Chenming Hu
Year: 1995
Physical etching/deposition simulation with collision-free boundary movement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsiau, Z.; Kan, E.C.; McVittie, J.P.; Dutton, R.W.
Year: 1995
Ta/sub 2/O/sub 5/ capacitors' dielectric material for giga-bit DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohji, Y.; Matsui, Y.; Itoga, T.; Hirayama, M.; Sugawara, Y.; Torii, K.; Miki, H.; Nakata, M.; Asano, I.; Iijima, S.; Kawamoto, Y.
Year: 1995
An mK/spl times/nK modular image sensor design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kreider, G.; Bosiers, J.; Dillen, B.; van der Heijden, J.; Hoekstra, W.; Kleimann, A.; Opmeer, P.; Oppers, J.; Peek, H.; Pellens, R.; Theuwissen, A.
Year: 1995
1.5 V-operation GaAs spike-gate power FET with 65% power-added efficiency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, T.; Furukawa, H.; Takenaka, H.; Ueda, T.; Noma, A.; Fukui, T.; Tateoka, K.; Ueda, D.
Year: 1995
Ultra-high-speed InAlAs/InGaAs HEMT ICs using pn-level-shift diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Enoki, T.; Umeda, Y.; Osafune, K.; Ito, H.; Ishii, Y.
Year: 1995
0.1-/spl mu/m p/sup +/-GaAs gate HJFETs with f/sub T/=121 GHz fabricated using all dry-etching and selective MOMBE growth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wada, S.; Furuhata, N.; Tokushima, M.; Fukaishi, M.; Hida, H.; Maeda, T.
Year: 1995
High-transconductance GaN MODFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aktas, O.; Kim, W.; Fan, Z.; Stengel, F.; Botchkarev, A.; Salvador, A.; Sverdlov, B.; Mohammad, S.N.; Morkoc, H.
Year: 1995
A CHI wiggler ubitron amplifier experiment: wiggler characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taccetti, J.M.; Jackson, R.H.; Freund, H.P.; Pershing, D.E.; Blank, M.; Granatstein, V.L.
Year: 1995
The development of high frequency, megawatt gyrotrons for ITER
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kreischer, K.E.; Danly, B.G.; Hogge, J.P.; Kimura, T.; Temkin, R.J.; Read, M.E.
Year: 1995
A scaling scheme for interconnect in deep-submicron processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rahmat, K.; Nakagawa, O.S.; Oh, S.-Y.; Moll, J.; Lynch, W.T.
Year: 1995
A novel Dual String NOR (DuSNOR) memory cell technology scalable to the 256 Mbit and 1 Mbit flash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, K.S.; Kim, J.Y.; Yoo, J.W.; Choi, Y.B.; Kim, M.K.; Nam, B.Y.; Park, K.T.; Ahn, S.T.; Kwon, O.H.
Year: 1995
Novel electron injection method using band-to-band tunneling induced hot electrons (BBHE) for flash memory with a P-channel cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohnakado, T.; Mitsunaga, K.; Nunoshita, M.; Onoda, H.; Sakakibara, K.; Tsuji, N.; Ajika, N.; Hatanaka, M.; Miyoshi, H.
Year: 1995
High power 4H-SiC static induction transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siergiej, R.R.; Clarke, R.C.; Aganval, A.K.; Brandt, C.D.; Burk, A.A., Jr.; Morse, A.; Orphanos, P.A.
Year: 1995
Silicon single hole quantum dot transistors for complementary digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leobandung, E.; Lingjie Guo; Chou, S.Y.
Year: 1995
Electron transport properties in InAs self-assembled quantum dot HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Horiguchi, N.; Futatsugi, T.; Nakata, Y.; Yokoyama, N.
Year: 1995
In-situ Ga/sub 2/O/sub 3/ process for GaAs inversion/accumulation device and surface passivation applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Passlack, M.; Minghwei Hong; Mannaerts, J.P.; Chu, S.N.G.; Opila, R.L.; Moriya, N.
Year: 1995
Tower structure Si field emitter arrays with large emission current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hori, Y.; Koga, K.; Sakiyama, K.; Kanemaru, S.; Itoh, J.
Year: 1995
Scaling-down of cone-like field emitter using LOCOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chun Gyoo Lee; Ho Young Ahn; Jong Duk Lee
Year: 1995
Volcano-shaped field emitters for large area displays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Busta, H.; Gammie, G.; Skala, S.; Pogemiller, J.; Nowicki, R.; Hubacek, J.; Devine, D.; Rao, R.; Urbanek, W.
Year: 1995
A scaled 1.8 V, 0.18 /spl mu/m gate length CMOS technology: device design and reliability considerations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rodder, M.; Aur, S.; Chen, I.-C.
Year: 1995
A high performance 0.1 /spl mu/m MOSFET with asymmetric channel profile
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiroki, A.; Odanaka, S.; Hori, A.
Year: 1995
A comparative study of CVD TiN and CVD TaN diffusion barriers for copper interconnection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun, S.C.; Tsai, M.H.; Chiu, H.T.; Chuang, S.H.; Tsai, C.E.
Year: 1995
CMOS process design for minimization of IC power consumption using TCAD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:von Schwerin, A.; Schumann, D.; Berthold, J.
Year: 1995
Thermal analysis of vertically integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kleiner, M.B.; Kuhn, S.A.; Ramm, P.; Weber, W.
Year: 1995
"NET-AN" a full three-dimensional parasitic interconnect distributed RLC extractor for large full chip applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akcasu, O.E.; Lu, J.; Dalal, A.; Mitra, S.; Lev, L.; Vassegihi, N.; Pance, A.; Hingarh, H.; Basit, H.
Year: 1995
A novel poly-silicon-capped poly-silicon-germanium thin-film transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tang, A.J.; Tsai, J.A.; Reif, R.; Tsu-Jae King
Year: 1995
Passive optical alignment of stacked multi-fiber tapes to a two-dimensional surface-emitting laser array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsuda, K.; Chino, T.; Yoshida, T.; Kobayashi, Y.; Hatada, K.
Year: 1995
A low-voltage bulk-silicon tunneling-based microaccelerometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chingwen Yeh; Najafi, K.
Year: 1995
Lateral backward diodes as strain sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Friedrich, A.P.; Besse, P.A.; Fullin, E.; Popovic, R.S.
Year: 1995
Embedded micromechanical devices for the monolithic integration of MEMS with CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, J.H.; Montague, S.; Sniegowski, J.J.; Murray, J.R.; McWhorter, P.J.
Year: 1995
A merged MEMS-CMOS process using silicon wafer bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parameswaran, L.; Hsu, C.; Schmidt, M.A.
Year: 1995
Body charge related transient effects in floating body SOI NMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gautier, J.; Jenkins, K.A.; Sun, J.Y.-C.
Year: 1995
Novel device lifetime behavior and hot-carrier degradation mechanisms under V/sub GS//spl ap/V/sub TH/ stress for thin-film SOI nMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang-Ratkovic, J.; Huang, W.M.; Hwang, B.Y.; Racanelli, M.; Forestner, J.; Woo, J.
Year: 1995
A 0.54 /spl mu/m/sup 2/ self-aligned, HSG floating gate cell (SAHF cell) for 256 Mbit flash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shirai, H.; Kubota, T.; Honma, I.; Watanabe, H.; Ono, H.; Okazawa, T.
Year: 1995
A scalable low power vertical memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hanafi, H.I.; Tiwari, S.; Burns, S.; Kocon, W.; Thomas, A.; Garg, N.; Matsushita, K.
Year: 1995
Novel, high-performance polysilicon heterostructure TFTs using P-I-N source/drains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manna, I.; Liu, K.-C.; Banerjee, S.
Year: 1995
Bipolar installed CMOS technology without any process step increase for high speed cache SRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishimaru, K.; Takahashi, M.; Nishigohori, M.; Okayama, Y.; Unno, Y.; Matsuoka, F.; Kakumu, M.
Year: 1995
A 0.25 /spl mu/m CMOS technology with 45 /spl Aring/ NO-nitrided oxide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luo, M.S.C.; Tsui, P.V.G.; Wei-Ming Chen; Gilbert, P.V.; Maiti, B.; Sitaram, A.R.; Shih-Wei Sun
Year: 1995
Self-aligned metal/IDP Si bipolar technology featuring 14 ps/70 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Onai, T.; Ohue, E.; Tanabe, M.; Washio, K.
Year: 1995
A high performance MOSFET design with highly controllable gate length and low RC delay multilevel interconnects technology for high speed logic devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oyamatsu, H.; Kasai, K.; Matsunaga, N.; Igarashi, H.; Yamaguchi, T.; Asamura, T.; Azuma, A.; Shibata, H.; Kinugawa, M.; Kakumu, M.
Year: 1995
Active substrate membrane probe card
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leung, J.; Zargari, M.; Wooley, B.A.; Wong, S.S.
Year: 1995
Monolithic 26 GHz and 40 GHz VCOs with SiGe heterojunction bipolar transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gruhle, A.; Schuppen, A.; Konig, U.; Erben, U.; Schumacher, H.
Year: 1995
Selective-epitaxial base technology with 14 ps ECL-gate delay, for low power wide-band communication systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pruijmboom, A.; Terpstra, D.; Timmering, C.E.; de Boer, W.B.; Theunissen, M.J.J.; Slotboom, J.W.; Hueting, R.J.E.; Hageraats, J.J.E.W.
Year: 1995
High-efficiency X-band GaInP/GaAs HBT MMIC power amplifier for stable long pulse and CW operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Riepe, K.; Leier, H.; Seiler, U.; Marten, A.; Sledzik, H.
Year: 1995
Hybrid digital/microwave HBTs for >30 Gb/s optical communications circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zampardi, P.J.; Pierson, R.L.; Runge, K.; Yu, R.; Beccue, S.M.; Yu, J.; Fitzsimmons, S.; Wang, K.C.
Year: 1995
253-GHz f/sub max/ AlGaAs/GaAs HBT with Ni/Ti/Pt/Ti/Pt-contact and L-shaped base electrode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanagihara, M.; Sakai, H.; Ota, Y.; Tanabe, M.; Inoue, K.; Tamura, A.
Year: 1995
Reliability investigation of InGaP/GaAs heterojunction bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bahl, S.R.; Camnitz, L.H.; Houng, D.; Mierzwinski, M.; Turner, J.; Lefforge, G.
Year: 1995
A PN gate polysilicon thin film transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Byung-Hyuk Min; Cheol-Min Park; Min-Koo Han
Year: 1995


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