The RSFQ test-timing model for delay insensitive data processing pipeline design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong-Hai Zhang; Bo-Ran Guan
Year: 2005
4 GHz band HTS receiving-filters for a compact cryogenic receiver front-end
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Akasegawa; K. Yamanaka; T. Nakanishi; M. Kai
Year: 2005
Characterization of a quasi-optical NbN superconducting HEB mixer at 300 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Miao; L. Jiang; Y. Luo; Z.H. Lin; Q.J. Yao; S.C. Shi
Year: 2005
Using the time domain sensitivity analysis for an efficient design of symmetric microwave circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Dobes; M. Grabner
Year: 2005
Fast hybrid CAD tool for the optimization of ridged waveguide LTCC filters and diplexers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Arndt; J. Brandt
Year: 2005
Computer aided design of dual-mode elliptic and Butterworth filters in Ku-band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.H. Yamini; M. Mohammad-Taheri; H. Bouzari; V.K. Devabhaktuni
Year: 2005
CPW-fed circularly polarized 2/spl times/2 sequentially rotated patch antenna array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I-Jen Chen
Year: 2005
A GCPW-fed printed antenna for UWB applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.T.H. Lim
Year: 2005
A broadband printed triangular monopole
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.T.H. Lim; A. Ali; J.S. Fu
Year: 2005
Small printed antennas with a parasitic folded shorted-strip for dual-band WLAN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gyoo-Soo Chae; Youngmin Moon; Joong-Soo Lim
Year: 2005
A new omnidirectional vertical polarization antenna with low profile and high gain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junping Geng; Ronghong Jin; Zhiguo Wang; Zhihao Yuan; Jinliang Dong; Jiaqiang Li; Wei Wang; Wei He; Min Ding
Year: 2005
Design of triple-band planar inverted-F antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hui Li; Wenhua Chen; Zhenghe Feng
Year: 2005
Design and development of asymmetric beam monopulse antenna system at Ka-band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.V. Ramakoteswara Rao; V.G. Borkar
Year: 2005
Full-wave analysis of dielectric-loaded waveguide slot antennas including internal and external mutual coupling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boyu Zheng; Zhongxiang Shen; Guangjun Wen
Year: 2005
Small-sized spiral dipole antenna for RFID transponder of UHF band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kihun Chang; Sang-il Kwak; Young Joong Yoon
Year: 2005
Ultra-broadband patch antenna using a wedge-shaped air substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feng-Wei Yao; Shun-Shi Zhong; Xian-Ling Liang
Year: 2005
Implementation of the periodic boundary condition in FDTD algorithm for scattering from randomly rough surface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lei Kuang; Ya-Qiu Jin
Year: 2005
Scattering analysis of arbitrarily shaped conducting thin wire structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kadhum; Bin-Jie Hu; Jun-Xun Yin
Year: 2005
Tunable stop band in the spectrum for a periodically corrugated waveguide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Pogrebnyak; E. Akray; N. Kucukaltun
Year: 2005
The research on the propagation characters of the micro-cells under the beam-space
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinliang Doug; Roughong Jin; Junping Geng; Xianguang Guo; Bo Gao; Min Ding; Wei He; Jiajing Li; Wei Wang
Year: 2005
Scattering and radiation characteristics of step discontinuity in grounded planar chirowaveguide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianfeng Dong; Shanjia Xu
Year: 2005
Calculation of field distribution near electrically large NURBS surface illuminated with a dipole
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Chen; Yu Zhang; Chang-Hong Liang
Year: 2005
Characterize the indoor multipath propagation for MIMO communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhongwei Tang; A.S. Mohan
Year: 2005
A new polynomial approximation for J/sub v/ Bessel functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lianlin Li; Fang Li; F.B. Gross
Year: 2005
Study on RCS scaling relationship of perfect conducting objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Xiao Jie; Li Lei; Shi Xiao Wei; Xie Yong Jun
Year: 2005
Sophisticated numerical hybrid scattering analysis integrated into system simulations for navigation and radar applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Greving
Year: 2005
Parallel NURBS PO method based on the Ludwig algorithm and its application to the RCS computation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Chen; Meng Wang; Yu Zhang; Chang-Hong Liang
Year: 2005
An efficient simulator to land mobile satellite channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dongya Shen
Year: 2005
A new microstrip duplexer using open circuited dual-behavior resonator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Srisathit; R. Phromloungsri; S. Patisang; M. Chongcheawchamnan
Year: 2005
Analysis of scaling-rule and size-reduction limit of spiral inductors to maximize quality factor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Suhara; M. Okayama; T. Okumura
Year: 2005
A novel resonator filter configuration with cellular-liked structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qing-Hua Li; K.-K.M. Cheng
Year: 2005
Nystrom method for EM scattering of 3D conductor bodies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaojuan Zhang; Shuguang Liu
Year: 2005
High-order basis functions for the moment method solution of 2D scattering problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Ping Zhang; Yun-Sheng Xu; Wei-Dong Wang
Year: 2005
Improvement of the marching-on in time method and its application to V-shaped wire antennas for pulse radiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meie Chen; Junhong Wang
Year: 2005
Adaptive RLS algorithm for rational function predistorter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kai Yao; Wei Niu; Minxi Wang
Year: 2005
Strip monopole antenna with a rectangular ring for bi-directional applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Laohapensaeng; C. Free; I.D. Rebertson
Year: 2005
Analysis of edge effect on millimeter-sized planar logarithmic spiral antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Tomioka; M. Suhara; T. Okumura
Year: 2005
A MTRT solution for the resonant frequency of circular microstrip antennas on iso/anisotropic substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Silva; J.N. de Carvalho; A.G. Neto; A.G. D'Assungao
Year: 2005
Design and implementation of dual-band square patch antenna for wireless LAN of 2.4GHz and 5.7GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung Min Kim; Ji Myoung Son; Hyuck Jin Kim; Woon Geun Yang
Year: 2005
A wideband unidirectional antenna using conical reflector fed by circular ring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Ketwan; C. Phongcharoenpanich; S. Kosulvit
Year: 2005
Characteristics analysis for the antenna of lunar low-frequency radio telescope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gong Liyuan; Chen Zhiyu
Year: 2005
A modulation circuit for impulse radio ultra-wideband communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Wang; Weidong Wang; Dongjin Wang; Guanghua Lu
Year: 2005
Inductance calculation of spiral inductors in different shapes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wanchun Tang; Yaning Zhu; Y.L. Chow
Year: 2005
On the critical issues of DSP/FPGA mixed digital predistorter implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ben Nasr; S. Boumaiza; M. Helaoui; A. Ghazel; F.M. Ghannouchi
Year: 2005
Design and implementation of a compact Butler matrix using mitered bends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.Q. Mariadoss; M.K.A. Rahim; M.Z.A.A. Aziz
Year: 2005
An effective two-dimensional super-resolution direction finding algorithm for phased array at subarrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hu Hang; Pan XiangRong
Year: 2005
Statistical evaluation of ESPAR antennas and adaptive beamforming performance prediction using extracted parameters of an ESPAR antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Q. Han; T. Ohira
Year: 2005
An adaptive antenna using genetic algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Laohapensaeng; C. Free
Year: 2005
Uncertainty model for the dipole-like antenna factor measurements on an open area test site
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Ji
Year: 2005
An inverse technique for dielectric-property determination from reflection measurement in spatial domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Mearnchu; D. Torrungrueng; C. Phongcharoenpanich; M. Krairiksh
Year: 2005
Practical multitone amplitude and phase characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Martins; N.B. Carvalho; J.C. Pedro
Year: 2005
Application of test & measure in microwave device characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhanfei Chen; Lingling Sun
Year: 2005
The thru-reflection-unequal-line (TRuL) calibration method for scattering matrix measurement of multi-port networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsin-Chia Lu; Yien-Tien Chou
Year: 2005
Combination of space and time adaptive mean filters for noise reduction in antenna measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyeong-Sik Min; Thanh-Ngon Tran; Chul-Keun Park
Year: 2005
Measurement of permittivity by microwave with heating of a thin film by identical cavity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Kanai; Y. Nikawa
Year: 2005
A novel algorithm for correcting probe position errors in planar near-field measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Ding; Fu Demin; Liu Qizhong; Jiao Yongchang; Mao Naihong
Year: 2005
Novel evaluation method for complex high permittivity of BaTiO/sub 3/ families at microwave frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kumagai; T. Nishikawa; K. Wakino; T. Kitazawa
Year: 2005
New method to reduce errors in antenna pattern measurement using RLS algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Dianat; C. Ghobadi; J. Nourinia
Year: 2005
A method for on-wafer S-parameter measurement of a differential amplifier by using two-port network analyzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ling Sun; Zhigong Wang; Jianjun Gao
Year: 2005
Modeling and measurements for power line communication systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.Q. Luo; S.Y. Tan; Boon Tiong Tan
Year: 2005
Fibonacci quasi crystals as special optical waveguides and filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Rostami; S. Matloub
Year: 2005
Ring resonator based narrow band integrated and fiber mirrors for lasers and sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Schwelb
Year: 2005
Fourier series expansion method combined with perfectly matched layer for modeling of optical waveguides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dan Zhang; Hongting Jia; K. Yasumoto
Year: 2005
Simultaneous visible and infrared upconversion in Yb/Tm doped alumino-germano silicate optical fiber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.R. Watekar; Seongmin Ju; Won-Taek Han
Year: 2005
Silicon optical waveguides using photonic bandgap for bioparticle sensing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Sun; Ching Eng Png; Er Ping Li
Year: 2005
PIM characteristics of resistive loads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Yamamoto; N. Kuga
Year: 2005
Eigenfrequency analysis of a coaxial cavity with large eccentricity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hui-Bo Zhang; Ying-Xin Lai; Shi-Chang Zhang
Year: 2005
A newly designed broadband microstrip equalizer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao Ying; Zhou Dong-fang; Niu Zhong-xia; Zhang De-wei
Year: 2005
Broadband complex permittivity measurement of low loss dielectric disks by cylindrical cavity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:En Li; Gaofeng Guo; Qishao Zhang
Year: 2005
An active RF-ID tag for container management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Sup Kim; Sang-Gi Byeon; Won-kyu Choi; Yong-Cheol Kang; Eun-ju Lee
Year: 2005
Injection locking phenomena of Van der Pol oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tang Zhikai; Jiang Yonghua; Liu Longhe; Hao Yuan; Ling Xiang
Year: 2005
Sampling in three-dimension microwave near-field imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Haibin; Miao Jungang
Year: 2005
Computer-aided analysis for tangent Ogive airborne radome using physical optics method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Renuka; V.G. Borkar
Year: 2005
A correlation analysis with a deterministic hallway angular response model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sewoong Kwon; ByoungSun Lee; Hyun Yook Moon; Jeho Seok; Cheol Mun; Young Joong Yoon
Year: 2005
1800 MHz GSM radiation effects on human blood monocytes membrane anisotropy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Sajin; T. Savopol; E. Kovacs; I. Miron
Year: 2005
GaSb/AlSb quantum cascade laser for terahertz signal source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yasuda; I. Hosako; S. Miyashita; M. Patrashin
Year: 2005
Terahertz sources and applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.J. Hwu; L. Sadwick
Year: 2005
Optical pulse distortion in Fibonacci-class quasi photonic crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Rostami; S. Matloub
Year: 2005
The index of refraction modulation effect on optical switching performance in Kerr-like nonlinear periodic multilayer stacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Rostami; M. Tahmasebpour
Year: 2005
2-dimensional InGaAs/InP photodiode arrays on semi-insulating InP for laser radar and dark current characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eun Soo Nam; H.S. Kim; M.S. Oh; Sun Eui Hong; Yong Won Kim; Hai Doo Cheong; B.W. Kim
Year: 2005
Er/sup 3+//Yb/sup 3+/ Co-doped P/sub 2/O/sub 5/-Nb/sub 2/O/sub 5/-Na/sub 2/O-Ga/sub 2/O/sub 3/-PbCl/sub 2/ glasses for optical waveguide laser and amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maohua Zhu; Shufang Zhang; Tongzhao Gua
Year: 2005
Phase conjugation by diffraction gratings in photorefractive crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.H. Majlesara; M. Esmaeilzadeh
Year: 2005
Electron orbits in a free-electron laser with planar wiggler, axial magnetic field, and ion-channel guiding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Esmaeilzadeh; M.H. Majlesara
Year: 2005
Self-fields effects on gain in an ion-channel free-electron laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Esmaeilzadeh
Year: 2005
Microstrip rectangular ring bandpass filter design using high permittivity substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng-Hsing Hsu; Hong Tie Soong; Cheng-Liang Huang; Ming-Ta Kao
Year: 2005
Ultra-miniature Bluetooth module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bao Jingfu
Year: 2005
A new approach for multi-mode and multi-band digital IF receiver based on AD6624
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ningde Xie; Jianyi Zhou; Ming Chen; Jianing Zhao
Year: 2005
High speed 4/spl times/4 microwave switch matrix using MMIC SPST switch for satellite applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.S. Noh; I.K. Ju; I.B. Yom
Year: 2005
A low-noise low-power CMOS RF front end for 5-GHz wireless LAN receiver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Cheng; Zhiqun Li; Zhigong Wang
Year: 2005
Ka-band LNA module with 1.9dB NF for communications satellite payload
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.P. Chang; I.B. Yom; S.H. Oh
Year: 2005
A compact Ka band sub-harmonically resistive mixer MMIC using miniature hybrid elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kan-Jen Cheng; Tsung-Yu Yang; Hwann-Kaeo Chiou
Year: 2005
A controllable variable gain LNA for 2 GHz band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Seok Hwang; Chang-Jae Kim; Ji-Hoon Kim; Hyung-Joun Yoo
Year: 2005
A reconfigurable mixer with flexible matching network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soo-Hwan Shin; Ji-Hoon Kim; Young-Kyun Jang; Hyung-Joun Yoo
Year: 2005
Enhancement on the robustness of a quad-band power amplifier module for GSM/GPRS handsets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Janne-Wha Wu; Cheng-Chi Hu; Ying-Chou Shih; Ching-Wen Tang; Chung-Er Huang; Che-Wei Shen
Year: 2005
Low cost solution to enhance performance of CDMA repeater amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lei Zhang; Wei Hong; Jianjun Wang; Jianyi Zhou
Year: 2005
A compact millimeter-wave mixer module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ji-Xin Chen; Wei Hong; Hong-Jun Tang; Xiao-Xin Yin; Ke Wu
Year: 2005
Application of lock-in amplifier in the rubidium atomic frequency standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Yong; Lu Shan-wei; Feng KeMing
Year: 2005
Low temperature complex permittivity of MgF/sub 2/ at microwave frequencies from TE/sub 01/spl delta// modes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.V. Jacob; J. Mazierska; J. Krupka
Year: 2005
A current sensing circuit used in integrated step-up converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gong Kunlin; Feng Quanyuan; Zhao Fanglan
Year: 2005
Reduced order RLS rational function predistortion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Niu; Minxi Wang; Kai Yao
Year: 2005
A new temperature compensation method of rectangular waveguide resonant cavities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yidong Wang; Qiang Sui
Year: 2005
Calibration methods of microwave diode detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X.Z. Xiong; C. Iiao
Year: 2005
Vision, strategy, and practice of software research & development in industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Uehara
Year: 2005
Accommodating software development collaboration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Wu; H. Sahraoui
Year: 2005
A temporal logic for input output symbolic transition systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Aiguier; C. Gaston; P. Le Gall; D. Longuet; A. Touil
Year: 2005
Model checking class specifications for Web applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.-H. Choi; H. Watanabe
Year: 2005
Client profiling for QoS-based Web service recommendation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Thio; S. Karunasekera
Year: 2005
A framework for application server based Web services management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heqing Guan; Beihong Jin; Jun Wei; Wei Xu; Ningjiang Chen
Year: 2005
Race-free scenarios of message sequence charts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.-A. Chen; S. Kalvala; J. Sinclair
Year: 2005
Supporting predictive change impact analysis: a control call graph based technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Badri; M. Badri; D. St-Yves
Year: 2005
Improvements towards formalizing UML state diagrams in CSP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.L. Yeung; K.R.P.H. Leung; Ji Wang; Wei Dong
Year: 2005
An approach to ensure service behavior consistency in OSGi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yin Qin; Hu Hao; Li Jim; Ge Jidong; Lu Jian
Year: 2005
An industrial case study on requirements volatility measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Loconsole; J. Borstler
Year: 2005
A qualitative method for measuring the structural complexity of software systems based on complex networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yutao Ma; Keqing He; Dehui Du
Year: 2005
Call-ordering constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Tran; D. Abramson; C. Mingins
Year: 2005
A bipartite graph approach to generate optimal test sequences for protocol conformance testing using the Wp-method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jim Wang; J. Xiao; C.P. Lam; H. Li
Year: 2005
Exception handling: an architecture model and utility support
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.C. Cheng; Chien-Tsun Chen; Jung-Sing Jwo
Year: 2005
Architectural style-based modeling and simulation of complex software systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Guo; G. Engels; R. Heckel
Year: 2005
Using adaptive agents to automatically generate test scenarios from the UML activity diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Xu; H. Li; C.P. Lam
Year: 2005
Simulation-based validation and defect localization for evolving, semi-formal requirements models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Seybold; M. Glinz; S. Meier
Year: 2005
Increasing the efficiency of fault detection in modified code
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Tomaszewski; L. Lundberg; H. Grahn
Year: 2005
Identifying error proneness in path strata with genetic algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.R. Birt; R. Sitte
Year: 2005
Conformance testing of BDI properties in agent-based software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Zheng; V.S. Alagar
Year: 2005
Ontology-based active requirements engineering framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.W. Lee; R.A. Gandhi
Year: 2005
A repository framework for self-growing robot software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyung-Min Koo; In-Young Ko
Year: 2005
Evolutionary testing of unstructured programs in the presence of flag problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiyang Liu; Ning Lei; Hehui Liu; Bin Wang
Year: 2005
A dynamic optimization strategy for evolutionary testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoyuan Xie; Baowen Xu; Liang Shi; Changhai Nie; Yanxiang He
Year: 2005
An integrated solution for testing and analyzing Java applications in an industrial setting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.E. Wong; J. Li
Year: 2005
Regression testing for component-based software systems by enhancing change information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chengying Mao; Yansheng Lu
Year: 2005
Integrating safety and security requirements into design of an embedded system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Zafar; R.G. Dromey
Year: 2005
Monitoring with behavior view diagrams for debugging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Liang; K. Xu
Year: 2005
Development of a business process modeling methodology and a tool for sharing business processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Yamamoto; K. Yamamoto; K. Ohashi; J. Inomata
Year: 2005
Personal software process (PSP) assistant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sison
Year: 2005
Tool support for statistical testing of software components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Shukla; P. Strooper; D. Carrington
Year: 2005
Aspect-oriented modularization of assertion crosscutting objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ishio; T. Kamiya; S. Kusumoto; K. Inoue
Year: 2005
Please STeP/spl I.bar/IN: a socio-technical platform for in situ networking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Nishinaka; M. Asada; Y. Yamamoto; Y. Ye
Year: 2005
Understanding the nature of collaboration in open-source software development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nakakoji; K. Yamada; E. Giaccardi
Year: 2005
Intelligent combination of kernels information for improved classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Majid; A. Khan; A.M. Mirza
Year: 2005
Fast cross-validation of kernel Fisher discriminant classifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. An; Wanquan Liu; S. Venkatesh
Year: 2005
Decision rule extraction and reduction based on grey lattice classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Yamaguchi; Guo-Dong Li; K. Mizutani; T. Akabane; M. Nagai; M. Kitaoka
Year: 2005
Feature selection based on word-sentence relation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Schonhofen; A.A. Benczur
Year: 2005
Face recognition using OPRA-faces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Kokiopoulou; Y. Saad
Year: 2005
The data mining advisor: meta-learning at the service of practitioners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Giraud-Carrier
Year: 2005
A Bayesian kernel for the prediction of neuron properties from binary gene profiles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Frangois Fleuret; W. Gerstner
Year: 2005
New filter-based feature selection criteria for identifying differentially expressed genes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lit-Hsin Loo; S. Roberts; L. Hrebien; M. Kam
Year: 2005
Iterative weighting of phylogenetic profiles increases classification accuracy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roger Craig; Li Liao
Year: 2005
Integrating knowledge-driven and data-driven approaches for the derivation of clinical prediction rules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kwiatkowska; A.S. Atkins
Year: 2005
Multi-label associative classification of medical documents from MEDLINE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Rak; L. Kurgan; M. Reformat
Year: 2005
Drug design by machine learning: ensemble learning for QSAR modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying Liu
Year: 2005
Sparse classifiers for Automated HeartWall Motion Abnormality Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glenn Fung; M. Qazi; S. Krishnan; Jinbo Bi; Bharat Rao; A. Katz
Year: 2005
Censored Time Trees/spl trade/ for predicting time to PSA recurrence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.B. Zubek; D. Verbel
Year: 2005
Abduction and induction for learning models of inhibition in metabolic networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Tamaddoni-Nezhad; R. Chaleil; A. Kakas; S. Muggleton
Year: 2005
Depth of anaesthesia assessment with generative polyspectral models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Rezek; S.J. Roberts; E. Siva; R. Conradt
Year: 2005
Equating interestingness of causal rules via graded response theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hamano
Year: 2005
Decoupling of clustering and classification steps in a cluster-based classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.R. Hashemi; M. Bahar; C. Childers; A.A. Tyler
Year: 2005
TSTMT: step towards an accurate Thai sign translation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ditcharoen; N. Cercone; K. Naruedomkul; B. Tipakorn
Year: 2005
Effective data mining by integrating genetic algorithm into the data preprocessing phase
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Gopalan; E. Korkmaz; R. Alhajj; K. Barker
Year: 2005
Class-dependant resampling for medical applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.M. Valdovinos; J.S. Sanchez
Year: 2005
Detecting temporally redundant association rules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bottcher; M. Spott; D. Nauck
Year: 2005
Sigma: a fault-tolerant mutual exclusion algorithm in dynamic distributed systems subject to process crashes and memory losses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Chen; Shiding Lin; Qiao Lian; Zheng Zhang
Year: 2005
Intersecting sets: a basic abstraction for asynchronous agreement problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Friedman; A. Mostefaoui; M. Raynal
Year: 2005
Availability assessment of SunOS/Solaris Unix systems based on syslogd and wtmpx log files: A case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Simache; M. Kaaniche
Year: 2005
On-chip debugging-based fault emulation for robustness evaluation of embedded software components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-C. Ruiz; J. Pardo; J.-C. Campelo; P. Gil
Year: 2005
Bayesian networks modeling for software inspection effectiveness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.P. Wu; Q.P. Hu; K.L. Poh; S.H. Ng; M. Xie
Year: 2005
Application-based metrics for strategic placement of detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Pattabiraman; Z. Kalbarczyk; R.K. Iyer
Year: 2005
A hardware approach to concurrent error detection capability enhancement in COTS processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Rajabzadeh; S.G. Miremadi
Year: 2005
Optimal fault-tolerant routing scheme for generalized hypercube
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shaohuai Tian; Yingping Lu; Dafang Zhang
Year: 2005
High-order syndrome testing for VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiyi Xu
Year: 2005
A failure-aware model for estimating and analyzing the efficiency of Web services compositions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.B. Lakhal; T. Kobayashi; H. Yokota
Year: 2005
Code design and decoding methods for burst error locating codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kitakami; J. Sano
Year: 2005
An evaluation of the virtual router redundancy protocol extension with load balancing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jen-Hao Kuo; Siong-Ui Te; Pang-Ting Liao; Chun-Ying Huang; Pan-Lung Tsai; Chin-Laung Lei; Sy-Yen Kuo; Yennun Huang; Zsehong Tsai
Year: 2005
Formal development of software for tolerating transient faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Ilic; E. Troubitsyna
Year: 2005
Compression/scan co-design for reducing test data volume, scan-in power dissipation and test application time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Hu; Yin-He Han; Xiao-Wei Li; Hua-Wei Li; Xiao-Qing Wen
Year: 2005
Partitioned cache shadowing for deep sub-micron (DSM) regime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heng Xu; A. Somani
Year: 2005
Research on architecture and design principles of COTS components based generic fault-tolerant computer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ou Zhonghong; Yuan Youguang; Zhao Xiaoyong
Year: 2005
Bi-objective model for test-suite reduction based on modified condition/decision coverage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lili Pan; Beiji Zou; Junyi Li; Hao Chen
Year: 2005
Trust-enhanced alteration scenario for universal computer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiangchun Ren; Kui Dai; Zhiying Wang
Year: 2005
A novel R/sup 2/-FLC dynamic buffer size tuner to support time-critical applications over the Internet by improving logical channel fault tolerance to shorten roundtrip time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.W.K. Lin; A.K.Y. Wong; T.S. Dillon
Year: 2005
Resilient state machine replication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Sousa; N.F. Neves; P. Verissimo
Year: 2005
A distributed location service for reducing query failures in geographic ad hoc routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Hsun Chou; Kuo-Feng Ssu; H.C. Jiau
Year: 2005
Dynamic window-based adaptive fault monitoring for ubiquitous computing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Su Myeong Lee; Hee Yong Youn
Year: 2005
Research on control flags-based weighted authentication trustworthiness model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Lunwei; He Lianyue; Liao Xiangke; Wang Huaimin
Year: 2005
Reliability prediction and assessment of fielded software based on multiple change-point models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Yu Huang; Chu-Ti Lin
Year: 2005
Neural network based on dynamic tunneling technique for weather forecast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zheng Qin; Haoliang Wang; Jinmin Yang; Bin Wang; Jianjun Zou
Year: 2005
Development of dependable real-time systems with Zerberus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Buckl; A. Knoll; G. Schrott
Year: 2005
Implications of Unlicensed Mobile Access (UMA) for GSM security
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Grech; P. Eronen
Year: 2005
Computation, Memory and Bandwidth Efficient Distillation Codes to Mitigate DoS in Multicast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Di Pietro; S. Chessa; P. Maestrini
Year: 2005
Security and Privacy Issues in E-passports
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Juels; D. Molnar; D. Wagner
Year: 2005
DICAS: Detection, Diagnosis and Isolation of Control Attacks in Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Khalil; S. Bagchi; C. Nina-Rotaru
Year: 2005
Securing Topology Maintenance Protocols for Sensor Networks:
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gabrielli; L.V. Mancini; S. Setia; S. Jajodia
Year: 2005
A Privacy Preserving Reputation System for Mobile Information Dissemination Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Voss; A. Heinemann; M. Muhlhauser
Year: 2005
Short Paper: A Signal Fingerprinting Paradigm for General Physical Layer and Sensor Network Security and Assurance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Daniels; M. Mina; S.F. Russell
Year: 2005
Short Paper: Dynamic Risk Mitigation for 'Self-defending' Network Security
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Bambos
Year: 2005
A comparative study of small antenna efficiency measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A.H. Azremi; H.G. Shiraz; P.S. Hall
Year: 2005
CT-shaped microstrip antenna for dual-operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.K.H. Ismail; M. Esa; N.A. Murad; S. Subahir; R. Othman
Year: 2005
Analysis of rain cell size distribution from meteorological radar data for rain attenuation studies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.H.H. Khamis; J. Din; T.A. Rahman
Year: 2005
Equatorial F3-layer observations during the winter of 2004
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.F.M. Zain; M.K. Jaafar
Year: 2005
First ionospheric experimental campaign and observations at Fraser's Hill, Malaysia: results of vertical sounding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.F.M. Zain; M. Abdullah; Ho Yih Hwa; Z.A. Rhazali; S. Abdullah; K.H. Gaik
Year: 2005
First ionospheric experimental campaign and observation at Fraser's Hill, Malaysia: total electron content (TEC) and scintillation measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.F.M. Zain; Ho Yih Hwa; M. Abdullah; Z.A. Rhazali; S. Abdullah; M.F. Marsimin
Year: 2005
Magnetic fields from a scaled down model transmission line - simulation and comparison to measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.A. Rahman; H. Hussain; I. Said; T.S. Jalal; A.S. Farag
Year: 2005
Impulse impedance tests on laboratory model earth electrode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.A. Idris; H. Ahmad; M.N. Isa
Year: 2005
Microwave detection of rubber filler using rectangular dielectric waveguide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ismail; D.K. Ghodgaonkar; Z. Awang; A. Samsuri; C.M.S. Said; M. Esa
Year: 2005
Shielding effectiveness of rectangular metallic enclosures with apertures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.A. Po'ad; M.Z.M. Jenu; C. Christopoulos; D.W.P. Thomas; W.R. Abdullah; K. Yusoff; B.M. Shariff
Year: 2005
Experimental study of the electromagnetic coupling to an enclosure via a wire penetration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yusoff; M.Z.M. Jenu; W.R.W. Abdullah; B.M. Shariff
Year: 2005
Teaching of electromagnetics theory at Kolej Universiti Teknikal Kebangsaan Malaysia (KUTKM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.K. Gan; M.G. Mariam
Year: 2005
Preliminary study analysis on magnetic field exposure assessment in Selangor public schools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hashim; A.S. Farag; H. Hussain; I. Said; N. Rahman
Year: 2005
ADS simulation of 2 to 5 GHz IFM correlator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.J.N.B. Mazim; M.F. Ain; S.I.S. Hassan
Year: 2005
Application of microwave technology for home industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.H.H. Khamis; S. Ramli; T.C. Ean; W.Z.A.W. Bakar
Year: 2005
Parameter based investigation: the design of node-B high power PA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.F. Wan Nasra; I. Mahamod; A. Azzemi; A. Fadzil
Year: 2005
High-speed domino logic design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.K. Sahari; C.P. Tiong; N. Rajaee; R. Sapawi
Year: 2005
Nonlinear analysis for performance characterization of a photoparametric amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M. Idrus; R.J. Greenland; S.M. Supa'at
Year: 2005
Analytical study of the characteristic dispersion equations in elliptical step-index fiber with helical winding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Mishra; D. Kumar
Year: 2005
An optical transceiver design for analog transmission using direct intensity modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Awiaran; R.W. Yousif; M.K. Abdullah
Year: 2005
Low power consumption thermooptic switch using polymers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.S.M. Supa'at; A.B. Mohammad; N.M. Kassim; S.M. Idrus
Year: 2005
Secure speech communication over public switched telephone network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.M. Anas; Z. Rahman; A. Shafii; M.N.A. Rahman; Z.A.M. Amin
Year: 2005
Analysis and receiving of downlink GSM signal using spectrum analyzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Hamzah; S.A. Ibrahim; M.S. Zainal; M. Ismail
Year: 2005
Iterative data detection and pilot symbol assisted-channel estimation for single-parity check-product coded multiple antennas system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.N. Fisal; S.K. Yusof
Year: 2005
Development of software planning tools for an intelligent traffic light wireless communication link using 5.8 GHz WLAN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.H. Ibrahim; M. Ismail; T.S. Kiong; Z.B.K. Mastan
Year: 2005
The GPATE system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A.R. Molpeceres
Year: 2005
ECSAMS - bridging the gap from EC flightline test to backshop and laboratory support
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Williams
Year: 2005
Introduction to the next generation automatic test system (NGATS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Burden; P.A. Curry; D. Roby; F. Love
Year: 2005
A better way to handle instrument error checking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Anderson
Year: 2005
Next generation multitier.net enabled test systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. D'Anna
Year: 2005
XVIML: an extensible virtual instrument markup language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:He Lingsong; Zhang Dengpa
Year: 2005
LAN-based measurement triggering using LXI instrumentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Pleasant
Year: 2005
The LXI IVI programming model for synchronization and triggering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Wheelwright
Year: 2005
Enhancing today's test system functionality through emerging technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Semancik
Year: 2005
Exploring LXI's advanced capabilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Franklin; A. Creque; R. Reddy
Year: 2005
Expanding LXI class C implementations into low cost applications beyond the "standard" test instrumentation functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Judd
Year: 2005
Plenary diagnostics: benefits and challenges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.K. Scully
Year: 2005
Improving heat transfer in a VXI chassis using black body radiation techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Estrada
Year: 2005
ATE noise reduction techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.L. Marion
Year: 2005
Automated calibration and diagnostics for synthetic instruments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.J. Martinek; M.P. Molloy; S.D. Pepin
Year: 2005
ATML: what "it" is, what "it" is not, and an example of how "it" can be applied
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Seavey; T. Einspanjer
Year: 2005
Implementing IEEE 1641 - a demonstration of portability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Cornish; M. Brown
Year: 2005
New data exchange standard for ATE and test information sharing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Harrison; A. Jain
Year: 2005
Can you make one size fit all? [synthetic instrument]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Stratton
Year: 2005
Tradeoffs in synthetic instrument design and application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Fleagle
Year: 2005
Key characteristics of synthetic instrumentation to facilitate TPS transportability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Orlet
Year: 2005
Automated test equipment synthetic instrumentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.H. Dare
Year: 2005
Conditioned based maintenance (CBM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Holguin
Year: 2005
A systems approach to diagnostic ambiguity reduction in naval avionic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Shannon; J. Quiter; A. D'Annunzio; R. Meseroll; R. Lebron; V. Sieracki
Year: 2005
Challenges of developing electro-optical testing in a portable configuration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.L. Raney; P. Bryant; J. James; S. McHugh; J. McKechnie
Year: 2005
Tactical laser system testing: evolution and challenges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Bates; F. Kearns
Year: 2005
RAD9000: a high-performance spectral radiometer for EO calibration applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bryant; G. Matis; J. James; S. McHugh
Year: 2005
EO3: tester for emerging electro-optical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Highland; D. Albrighta; D. Pudlo; T. Robinson; J. Hobbs
Year: 2005
PXI Express: extending backplanes to 6 Gbyte/s while maintaining backwards compatibility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Caesar; M. Wetzel
Year: 2005
Design considerations for a distributed test system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faya Peng
Year: 2005
Implementing a protocol abstraction layer architecture for interfacing heterogeneous software and hardware systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Petersen; R. Harrison
Year: 2005
Supporting hardware independence in the next generation of automatic test equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.A. Neag
Year: 2005
Re-using legacy Atlas TPS's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Grard
Year: 2005
A new TPS design structure for DOD ATS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Hernandez
Year: 2005
Hardware issues migrating legacy TPS to a new tester
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Wehrman
Year: 2005
An alternative TPS rehost approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Krayewsky; S. O'Donnell
Year: 2005
Frequency extension techniques for RF/microwave signal generation and measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Nicklin
Year: 2005
The up converter - a critical synthetic instrument technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Pragastis; M.N. Granieri
Year: 2005
Solving test challenges using modular microwave synthetic test systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Humphrey; T. Schmitthenner
Year: 2005
Design for diagnosis using a diagnostic evaluation measure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Assaf; J.B. Dugan
Year: 2005
Training solution for automated test equipment marine corps electronic testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Roybal
Year: 2005
Self-evolution in knowledge bases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Barlas; A. Ginart; J.L. Dorrity
Year: 2005
Modernizing a DoD ATS family
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.A. Ross
Year: 2005
Independent integrator consolidates test resources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.M. Neal
Year: 2005
Advanced virtual instrument test system (AVITS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. McHugh; S. Cluer; J. Deffler
Year: 2005
Utilization of the WISE and COBRA 1000/11 technologies for TPS transportability and reusable software without software changes or source code availability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Shany; G. Schwartzberg
Year: 2005
The role of extensibility in software standards for automatic test systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.P. Lopes; I.A. Neag; J.E. Ralph
Year: 2005
A software technique for optimizing measurement time and repeatability on instrument control buses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.B. McCarthy
Year: 2005
Embedded control/signal processing tools providing improved automated inspection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Black; R. Goodman; J. Badman
Year: 2005
Minimal footprint ATE system with expandable resource and capabilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Cortez
Year: 2005
Verifying electronic combat system operation using free space radiated combat scenario simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Hartman
Year: 2005
The need for embedded intelligence in ATE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.D. Ziomek; D.J. Jenkins
Year: 2005
Using the FFT as an arbitrary function generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.W. Lowdermilk; F. Harris
Year: 2005
Virtual instrument for synchro-to-digital conversion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Fiengo; G. Caesar
Year: 2005
Bayesian diagnosis and prognosis using instrument uncertainty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.W. Sheppard; M.A. Kaufman
Year: 2005
Bayesian modeling: an amendment to the AI-ESTATE standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Kaufman; J.W. Sheppard
Year: 2005
Signal processing and feature extraction toolbox for prognosis/diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shubha Kadambe
Year: 2005
Advanced microelectronics test facility at New Mexico Tech
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M. Bracht; S.W. Teare; J.L. Meason; L.O. Quarrie
Year: 2005
Knowledge base to manage the grading and selection of testability guidelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.Y. Ungar; Rajini Parameswaran
Year: 2005
Polar anchoring energy effect and measurement of vertically-aligned liquid crystal cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiangyi Nie; T.X. Wu; Shin-Tson Wu
Year: 2005
Improving test time on a COTS based system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.R. Barker, Jr.; S.J. O'Donnell
Year: 2005
An approach to applying commercial ATS to DOD applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Maciejewski
Year: 2005
Ruggedized COTS field testers are an attractive and economic alternative
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.M. Neal
Year: 2005
Pros and cons of using COTS products
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.R. Blanchette
Year: 2005
ATE applied into fault modeling and fault diagnosis of AC servo motor PWM driver system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Baoan; Fan Ju; P. Liu Chou Kee
Year: 2005
Graphical models for diagnosis knowledge representation and inference
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianhui Luo; Haiying Tu; K. Pattipati; Liu Qiao; Shunsuke Chigusa
Year: 2005
Self-evolving, advanced test stand reasoning for closed loop diagnostics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.W. Kalgren; C.S. Byington
Year: 2005
Stable, repeatable, and adaptable digital testing in a varying interconnect environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Gohel
Year: 2005
Resource switching the cornerstone for a modular scalable test set solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Wehrman; J. Lum
Year: 2005
ARGCS power solution covers ATE requirements with COTS appeal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Kuzara; N. Precourt
Year: 2005
Deploying support forward-bringing deep test capability to forward areas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. MacLennan
Year: 2005
Catching up with the real world: requirements for next-generation test instruments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Truebenbach
Year: 2005
Sustainment of automatic test systems - what 30 years of system integration has taught us
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Cupo; K. Woods
Year: 2005
Anatomy of the next generation of ATE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.B. Droste; B. Allman
Year: 2005
Performance analysis of a high-end CPU under a heavy computational load and varying RAM amount using thermal imaging techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Naghedolfeizi; S. Arora; S. Garcia
Year: 2005
Integration of software technologies into a test system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Yazma
Year: 2005
A low cost method for environmental testing at cryogenic temperatures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Braley; T. Windley; H. Hess
Year: 2005
IEEE P1505 receiver fixture interface (RFI) standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J. Stora
Year: 2005
Development and application of common test interface - supporting OSD and the DOD ATS executive directorate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Guzak
Year: 2005
A model-based approach to sequential fault diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pietersma; A.J.C. van Gemund; A. Bos
Year: 2005
A UUT-centric test specification simplifies digital functional test development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.A. Eracar; T. Lopes
Year: 2005
A review of signal based measurement for both traditional and synthetic instrumentation utilising IEEE 1641 definitions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Gorringe
Year: 2005
Graphical system design AUTOTESTCON 2005
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Gretlein
Year: 2005
User-centric digital test architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Jones; M. McGoldrick
Year: 2005
Novel, lower cost, noise measurement method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.B. Mitsdarffer; D. Thelen
Year: 2005
Using new instrument interface standards to increase automatic test system performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sethunadh
Year: 2005
Use of ontologies for decision support generation and analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bodkin; M. Harris; A. Helton
Year: 2005
Systematic data preparation in an automated test diagnostic environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.L. Woodward
Year: 2005
Using XML transactions to perform closed-loop diagnostics in network centric support environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Alwardt
Year: 2005
Boundary-scan improves test effectiveness of military/aerospace electronics throughout the product life cycle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Dellecker
Year: 2005
Advancing ATE systems with PXI based power-off diagnostic instrument technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Howard; E. Haltiner
Year: 2005
Finding a lasting interface for your ATE system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Swanstrom
Year: 2005
Can LXI replace GPIB?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Ryland
Year: 2005
Using IVI in .NETand the upcoming IVI .NET standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.E. Mueller
Year: 2005
Circuit board testing through multispectral signal analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.G. Wright; L.V. Kirkland
Year: 2005
HTPG: hybrid test pattern generation for reducing test storage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.K. Kalyanam; N.A. Touba
Year: 2005
Multiresolution nanoscale sensor-based circuit board testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.G. Wright; M. Zgol; D. Adebimpe; E. Keenan; R. Mulligan; L.V. Kirkland
Year: 2005
Audio single and dual tone measurements with a 12 bit converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Wehrman
Year: 2005
Navigating the landscape of IVI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Fertitta
Year: 2005
Development of a new interchangeable virtual instrument class specification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Kennedy
Year: 2005
Attacking "bad actor" and "no fault found" electronic boxes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Steadman; S. Sievert; B. Sorensen; F. Berghout
Year: 2005
Generic test station utilizing database and COTS technologies with an integrated logistic approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. du T Paul; G.R. Zeiler
Year: 2005
Electronic prognostics - a case study using Global Positioning System (GPS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.W. Brown; P.W. Kalgren; C.S. Byington; R.F. Orsagh
Year: 2005
Looking past BIT - incipient fault detection and prognostics for avionics system power supplies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Orsagh; D. Brown; P. Kaigren
Year: 2005
Integrating PXI with VXI, GPIB, USB, and LXI instrumentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Caesar
Year: 2005
Implementing advanced timing and synchronization architectures in PXI systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Stock
Year: 2005
Microstructure modified HfO/sub 2/ using Zr addition with Ta/sub x/ C/sub y/ gate for improved device performance and reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.I. Hegde; D.H. Triyoso; P.J. Tobin; S. Kalpat; M.E. Ramon; H.-H. Tseng; J.K. Schaeffer; E. Luckowski; W.J. Taylor; C.C. Capasso; D.C. Gilmer; M. Moosa; A. Haggag; M. Raymond; D. Roan; J. Nguyen; L.B. La; E. Hebert; R. Cotton; X.-D. Wang; S. Zollner; R. Gregory; D. Werho; R.S. Rai; L. Fonseca; M. Stoker; C. Tracy; B.W. Chan; Y.H. Chiu; B.E. White
Year: 2005
Lithography for manufacturing of sub-65nm nodes and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.J. Lin
Year: 2005
A robust 45 nm-node, dual damascene interconnects with high quality cu/barrier interface by a novel oxygen absorption process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Abe; K. Motoyama; Y. Kasama; K. Arita; F. Ito; H. Yamamoto; M. Tagami; T. Tonegawa; Y. Tsuchiya; K. Fujii; N. Oda; M. Tada; M. Sekine; Y. Hayashi; H. Ohtake; N. Furutake; M. Narihiro; K. Arai; T. Takeuchi; S. Saito; T. Taiji
Year: 2005
Low-voltage inkjetted organic transistors for printed RFID and display applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.E. Molesa; A. de la Fuente Vornbrock; P.C. Chang; V. Subramanian
Year: 2005
CMOS devices mobility enhancement and low resistance source/drain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Boeuf; Huiling Shang
Year: 2005
Mechanism of moisture uptake induced via failure and its impact on 45nm node interconnect design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fujimaki; K. Higashi; N. Nakamura; N. Matsunaga; K. Yoshida; N. Miyawaki; M. Hatano; M. Hasunuma; J. Wada; T. Nishioka; K. Akiyama; H. Kawashima; Y. Enomoto; T. Hasegawa; K. Honda; M. Iwai; S. Yamada; F. Matsuoka
Year: 2005
Electro-thermal transport in metallic single-wall carbon nanotubes for interconnect applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Pop; D. Mann; J. Reifenberg; K. Goodson; Hongjie Dai
Year: 2005
Wrap-gated inas nanowire field-effect transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.E. Wernersson; T. Bryllert; E. Lind; L. Samuelson
Year: 2005
Low phase noise array-composite micromechanical wine-glass disk oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Wei Lin; Sheng-Shian Li; Zeying Ren; C.T.C. Nguyen
Year: 2005
Frequency tolerance of RF micromechanical disk resonators in polysilicon and nanocrystalline diamond structural materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Wang; Yuan Xie; C.T.-C. Nguyen
Year: 2005
Non-linearity cancellation in MEMS resonators for improved power-handling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Agarwal; K. Park; R. Candler; M. Hopcroft; C. Jha; R. Melamud; B. Kim; B. Murmann; T.W. Kenny
Year: 2005
PECVD-oxynitride gas chromatographic columns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Agah; K.D. Wise
Year: 2005
A novel p-channel NAND-type flash memory with 2-bit/cell operation and high programming throughput (> 20 MB/sec)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hang-Ting Lue; Szu-Yu Wang; Erh-Kun Lai; Min-Ta Wu; Ling-Wu Yang; Kuang-Chao Chen; J. Ku; Kuang-Yeu Hsieh; R. Liu; Chih-Yuan Lu
Year: 2005
Fabrication of 3D trench PZT capacitors for 256Mbit FRAM device application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:June-Mo Koo; Ji-Eun Lim; Dong-Chul Yoo; Soon-Oh Park; Hee-Suk Kim; Hee Han; Sunggi Baik; Jae-Young Choi; Yong Jun Park; Youngsoo Park; Bum-Seok Seo; Sukpil Kim; Sangmin Shin; Jung-Hyun Lee; Hionsuck Baik; Jang-Ho Lee; Jun Ho Lee; Byoung-Jae Bae
Year: 2005
High performance RF power LDMOSFETs for cellular handsets formed in thick-strained-Si/relaxed-SiGe structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kondo; N. Sugii; Y. Hoshino; W. Hirasawa; Y. Kimura; M. Miyamoto; T. Fujioka; S. Kamohara; Y. Kondo; S. Kimura; I. Yoshida
Year: 2005
CMOS and interconnect reliability gate dielectric breakdown - modeling and mechanism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Nicollian; K. Eriguchi
Year: 2005
A comprehensive investigation of gate oxide breakdown of P+Poly/PFETs under inversion mode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Wu; J. Sune; W. Lai; A. Vayshenker; D. Harmon
Year: 2005
Degradation and breakdown of 0.9 nm EOT SiO/sub 2/ ALD HfO/sub 2/metal gate stacks under positive constant voltage stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Degraeve; T. Kauerauf; M. Cho; M. Zahid; L.A. Ragnarsson; D.P. Brunco; B. Kaczer; Ph. Roussel; S. De Gendt; G. Groeseneken
Year: 2005
Fluorine incorporation into HfSiON dielectric for V/sub th/ control and its impact on reliability for poly-Si gate pFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Inoue; S. Tsujikawa; M. Mizutani; K. Nomura; T. Hayashi; K. Shiga; J. Yugami; J. Tsuchimoto; Y. Ohno; M. Yoneda
Year: 2005
High performance gate first HfSiON dielectric satisfying 45nm node requirements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Quevedo-Lopez; B.E. Gnade; M.J. Kim; R.M. Wallace; D. Guo; H. Bu; T.P. Ma; S.A. Krishnan; D. Kirsch; C.H.J. Li; J.H. Sim; C. Huffman; J.J. Peterson; B.H. Lee; G. Pant
Year: 2005
Dramatic improvement of Ge p-MOSFET characteristics realized by amorphous zr-silicate/ge gate stack with excellent structural stability through process temperatures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Kamata; Y. Kamimuta; T. Ino; R. Iijima; M. Koyama; A. Nishiyama
Year: 2005
Ultra-thin (EOT=3/spl Aring/) and low leakage dielectrics of La-alminate directly on si substrate fabricated by high temperature deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Suzuki; M. Tomita; T. Yamaguchi; N. Fukushima
Year: 2005
Organic and hybrid organic/inorganic transistors for chemical and bio sensing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sharma; L. Wang; C. Burham; D. Fine; A. Dodabalapur
Year: 2005
CMOS devices strained-silicon technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yee-Chia Yeo; H.C.-H. Wang
Year: 2005
Design of high performance PFETs with strained si channel and laser anneal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Luo; Y.F. Chong; J. Kim; N. Rovedo; B. Greene; S. Panda; T. Sato; J. Holt; D. Chidambarrao; J. Li; R. Davis; A. Madan; A. Turansky; O. Gluschenkov; R. Lindsay; A. Ajmera; J. Lee; S. Mishra; R. Amos; D. Schepis; H. Ng; K. Rim
Year: 2005
Thin body silicon-on-insulator N-MOSFET with silicon-carbon source/drain regions for performance enhancement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kah-Wee Ang; King-Jien Chui; V. Bliznetsov; Yihua Wang; Lai Yin Wong; Chih-Hang Tung; N. Balasubramanian; Ming-Fu Li; Ganesh Samudra; Yee-Chia Yeo
Year: 2005
New stress inducing technique of epitaxial si on recessed S/D fabricated in substrate strained-si of [100]channel on rotated wafers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sanuki; H. Tanaka; K. Oota; O. Fujii; R. Yamaguchi; K. Nakayama; Y. Morimasa; Y. Takasu; J. Idebuchi; N. Nishiyama; H. Fukui; H. Yoshimura; K. Matsuo; I. Mizushima; H. Ito; Y. Takegawa; M. Saito; M. Iwai; N. Nagashima; F. Matsuoka
Year: 2005
Stress memorization in high-performance FDSOI devices with ultra-thin silicon channels and 25nm gate lengths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.V. Singh; J.W. Sleight; J.M. Hergenrother; Z. Ren; K.A. Jenkins; O. Dokumaci; L. Black; J.B. Chang; H. Nakayama; D. Chidambarrao; R. Venigalla; J. Pan; W. Natzle; B.L. Tessier; A. Nomura; J.A. Ott; M. Ieong; W. Haensch
Year: 2005
Uniaxial-biaxial stress hybridization for super-critical strained-si directly on insulator (SC-SSOI) PMOS with different channel orientations.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V.-Y. Thean; J. Cheek; S. Venkatesan; J. Mogab; C.H. Chang; Y.H. Chiu; H.C. Tuan; Y.C. See; M.S. Liang; Y.C. Sun; L. Prabhu; V. Vartanian; M. Ramon; B.-Y. Nguyen; T. White; H. Collard; Q.-H. Xie; S. Murphy
Year: 2005
Computational study of carbon nanotube p-i-n tunnel FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.O. Koswatta; D.E. Nikonov; M.S. Lundstrom
Year: 2005
CMOS and interconnect reliability process and electrical degradation in flash memories and performance boosted CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Visconti; W. Tonti
Year: 2005
BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hang-Ting Lue; Szu-Yu Wang; Erh-Kun Lai; Yen-Hao Shih; Sheng-Chih Lai; Ling-Wu Yang; Kuang-Chao Chen; J. Ku; Kuang-Yeu Hsieh; Rich Liu; Chih-Yuan Lu
Year: 2005
Highly reliable 2-bit/cell nitride trapping flash memory using a novel array-nitride-sealing (ANS) ONO process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen-Hao Shih; S.C. Lee; H.T. Lue; M.D. Wu; T.H. Hsu; E.K. Lai; J.Y. Hsieh; C.W. Wu; L.W. Yang; Kuang Yeu Hsieh; K.C. Chen; R. Liu; Chih-Yuan Lu
Year: 2005
A new insight into the degradation mechanisms of various mobility-enhanced CMOS devices with different substrate engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Chung; Y.R. Liu; S.J. Wu; C.S. Lai; Y.C. Liu; D.F. Chen; H.S. Lin; W.T. Shiau; C.T. Tsai; S.C. Chien; S.W. Sun
Year: 2005
Positive bias and temperature stress induced two-stage drain current degradation in HfSiON nMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.T. Chan; C.J. Tang; Tahui Wang; H.C.-H. Wang; D.D. Tang
Year: 2005
Evidence of traps creation in GaN/AlGaN/GaN HEMTs after a 3000 hour on-state and off-state hot-electron stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sozza; C. Dua; E. Morvan; M.A. diForte-Poisson; S. Delage; F. Rampazzo; A. Tazzoli; F. Danesin; G. Meneghesso; E. Zanoni; A. Curutchet; N. Malbert; N. Labat; B. Grimbert; J.-C. De Jaeger
Year: 2005
Modeling and simulation transport in advanced planar cmos devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Sangiorgi; M. Staedele
Year: 2005
Investigation of the performance limits of III-V double-gate n-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abhijit Pethe; Tejas Krishnamohan; Donghyun Kim; Saeroonter Oh; H.-S.P. Wong; Yoshio Nishi; K.C. Saraswat
Year: 2005
A study of the effect of the interface roughness on a DG-MOSFET using a full 2D NEGF technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Martinez; A. Svizhenko; M.P. Anantram; J.R. Barker; A.R. Brown; A. Asenov
Year: 2005
Multi-subband monte carlo modeling of nano-mosfets with strong vertical quantization and electron gas degeneration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Lucci; P. Palestri; D. Esseni; L. Selmi
Year: 2005
Physical mechanism of work function modulation due to impurity pileup at Ni-FUSI/SiO(N) interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Tsuchiya; M. Yoshiki; M. Koyama; A. Kinoshita; J. Koga
Year: 2005
Modulation of the Ni FUSI workfunction by Yb doping: from midgap to n-type band-edge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.Y. Yu; J.D. Chen; M.F. Li; S.J. Lee; D.L. Kwong; M. van Dal; J.A. Kittl; A. Lauwers; E. Augendre; S. Kubicek; C. Zhao; H. Bender; B. Brijs; L. Geenen; A. Benedetti; P. Absil; M. Jurczak; S. Biesemans
Year: 2005
Demonstration of Ni fully germanosilicide as a pFET gate electrode candidate on HfSiON
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.Y. Yu; R. Singanamalla; K. Opsomer; E. Augendre; E. Simoen; J.A. Kittl; S. Kubicek; S. Severi; X.P. Shi; S. Brus; C. Zhao; J.F. de Marneffe; S. Locorotondo; D. Shamiryan; M. Van Dal; A. Veloso; A. Lauwers; M. Niwa; K. Maex; K.D. Meyer; P. Absil; M. Jurczak; S. Biesemans
Year: 2005
CMOS integration of dual work function phase controlled Ni FUSI with simultaneous silicidation of NMOS (NiSi) and PMOS (Ni-rich silicide) gates on HfSiON
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Lauwers; A. Veloso; T. Hoffmann; M.J.H. van Dal; C. Vrancken; S. Brus; S. Locorotondo; J.-F. de Marneffe; B. Sijmus; S. Kubicek; T. Chiarella; M.A. Pawlak; K. Opsomer; M. Niwa; R. Mitsuhashi; K.G. Anil; H.Y. Yu; C. Demeurisse; R. Verbeeck; M. de Potter; P. Absil; K. Maex; M. Jurczak; S. Biesemans; J.A. Kittl
Year: 2005
Integrated circuits and manufacturing advanced sram and novel integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ghani; T. Houston
Year: 2005
Fluctuation limits & scaling opportunities for CMOS SRAM cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Bhavnagarwala; S. Kosonocky; C. Radens; K. Stawiasz; R. Mann; Qiuyi Ye; Ken Chin
Year: 2005
High density and high speed SRAM bit-cells and ring oscillators due to laser annealing for 45nm bulk CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pouydebasque; B. Dumont; S. Denorme; F. Wacquant; M. Bidaud; C. Laviron; A. Halimaoui; C. Chaton; J.D. Chapon; P. Gouraud; F. Leverd; H. Bernard; S. Warrick; D. Delille; K. Romanjek; R. Gwoziecki; N. Planes; S. Vadot; I. Pouilloux; F. Arnaud; F. Boeuf; T. Skotnicki
Year: 2005
Ultra-fast programming of silicided polysilicon fuses based on new insights in the programming physics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.S. Doorn; M. Altheimer
Year: 2005
On the dispersive versus arrhenius temperature activation of nbti time evolution in plasma nitrided gate oxides: measurements, theory, and implications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Varghese; D. Saha; S. Mahapatra; K. Ahmed; F. Nouri; M. Alam
Year: 2005
Material dependence of hydrogen diffusion: implications for NBTI degradation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.T. Krishnan; C. Chancellor; S. Chakravarthi; P.E. Nicollian; V. Reddy; A. Varghese; R.B. Khamankar; S. Krishnan
Year: 2005
On-chip charge pumping method for characterization of interface states of ultra thin gate oxide in nano CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hee-Hwan Ji; Yong-Goo Kim; In-Shik Han; Kyung-Min Kim; Jin-Suk Wang; Hi-Deok Lee; Won-Joon Ho; Sung-Hyung Park; Heui-Seung Lee; Young-Seok Kang; Dae-Byung Kim; Chang-Young Lee; Ihl-Hyun Cho; Sang-Young Kim; Sung-Bo Hwang; Jeong-Gun Lee; Jin-Won Park
Year: 2005
GIDL (gate-induced drain leakage) and parasitic schottky barrier leakage elimination in aggressively scaled HfO/sub 2/TiN FinFET devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hoffmann; A. Dixit; K. De Meyer; M. Jurczak; S. Biesemans; G. Doornbos; I. Ferain; N. Collaert; P. Zimmerman; M. Goodwin; R. Rooyackers; A. Kottantharayil; Y. Yim
Year: 2005
Mobility enhancement due to volume inversion in [110]-oriented ultra-thin body double-gate nMOSFETs with body thickness less than 5 nm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Tsutsui; M. Saitoh; T. Saraya; T. Nagumo; T. Hiramoto
Year: 2005
Solid-state and nanoelectronic devices resistive switching memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-L. Autran; F. Widdershoven
Year: 2005
Oxygen-doped gesbte phase-change memory cells featuring 1.5 V/100-/spl mu/A standard 0.13/spl mu/m CMOS operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Matsuzaki; K. Kurotsuchi; Y. Matsui; O. Tonomura; N. Yamamoto; Y. Fujisaki; N. Kitai; R. Takemura; K. Osada; S. Hanzawa; H. Moriya; T. Iwasaki; T. Kawahara; N. Takaura; M. Terao; M. Matsuoka; M. Moniwa
Year: 2005
Impact of crystallization statistics on data retention for phase change memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Redaelli; D. Ielmini; A.L. Lacaita; F. Pellizzer; A. Pirovano; R. Bez
Year: 2005
Multi-layer cross-point binary oxide resistive memory (OxRRAM) for post-NAND storage application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.G. Baek; D.C. Kim; M.J. Lee; H.-J. Kim; E.K. Yim; M.S. Lee; J.E. Lee; S.E. Ahn; S. Seo; J.H. Lee; J.C. Park; Y.K. Cha; S.O. Park; H.S. Kim; I.K. Yoo; U-In Chung; J.T. Moon; B.I. Ryu
Year: 2005
Conductive bridging RAM (CBRAM): an emerging non-volatile memory technology scalable to sub 20nm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kund; G. Beitel; C.-U. Pinnow; T. Rohr; J. Schumann; R. Symanczyk; K.-D. Ufert; G. Muller
Year: 2005
85nm gate length enhancement and depletion mode InSb quantum well transistors for ultra high speed and very low power digital logic applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Datta; T. Ashley; J. Brask; L. Buckle; M. Doczy; M. Emeny; D. Hayes; K. Hilton; R. Jefferies; T. Martin; T.J. Phillips; D. Wallis; P. Wilding; R. Chau
Year: 2005
The InP/GaAsSb type-H heterostructure system and its application to high-speed DHBTs and photodetectors: physics, surprises, and opportunities (INVITED)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.R. Bolognesi; H.G. Liu; N.G. Tao; L. Zheng; X. Zhang; S.P. Watkins
Year: 2005
Non-uniform degradation behavior across device width in RF power GaAs PHEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Villanueva; J.A. del Alamo; T. Hisaka; K. Hayashi; M. Somerville
Year: 2005
Detectors, sensors, and MEMS image sensors and photon detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Mabuchi; H. Haddad
Year: 2005
A high-performance and low-noise CMOS image sensor with an expanding photodiode under the isolation oxide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Itonaga; H. Abe; I. Yoshihara; T. Hirayama
Year: 2005
The features and characteristics of 5M CMOS image sensor with 1.9/spl times/1.9/spl mu/m/sup 2/ pixels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang-Rok Moon; Jongwan Jung; Doowon Kwon; Seok-Ha Lee; Jae-seob Roh; Kee-Hyun Paik; Doo-Cheol Park; HongKi Kim; Heegeun Jeongc; Jae-Hwang Sim; Hyunpil Noh; Kangbok Lee; Duckhyung Lee; Kinam Kim
Year: 2005
The hole role
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.J.P. Theuwissen; J.T. Bosiers; E. Roks
Year: 2005
High-speed blue-, red-, and infrared-sensitive photodiode integrated in a 0.35 /spl mu/m SiGe:C-BiCMOS process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Meinhardt; J. Kraft; B. Loffler; H. Enichlmair; G. Rohrer; E. Wachmann; M. Schrems; R. Swoboda; C. Seidl; H. Zimmermann
Year: 2005
A 28 mega pixel large area full frame CCD with 2/spl times/2 on-chip RGB charge-binning for professional digital still imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Draijer; F. Polderdijk; A. van der Heide; B. Dillen; W. Klaassens; J. Bosiers
Year: 2005
Influence of terrestrial cosmic rays on the reliability of CCD image sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.J.P. Theuwissen
Year: 2005
On-chip detection and counting of single-photons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tisa; F. Zappa; I. Labanca
Year: 2005
An intra-chip electro-optical channel based on CMOS single photon detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sergio; E. Charbon
Year: 2005
A 65nm NOR flash technology with 0.042/spl mu/m/sup 2/ cell size for high performance multilevel application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Servalli; D. Brazzelli; E. Camerlenghi; G. Capetti; S. Costantini; C. Cupeta; D. DeSimone; A. Ghetti; T. Ghilardi; P. Gulli; M. Mariani; A. Pavan; R. Somaschini
Year: 2005
Robust multi-bit programmable flash memory using a resonant tunnel barrier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shieun Kim; Seung Jae Baik; Zongliang Huo; Young-Jin Noh; Chulsung Kim; Jeong Hee Han; In-Seok Yeo; U-In Chung; Joo Tae Moon; Byung-Il Ryu
Year: 2005
Direct measurement of carrier profiles in operating sub-30-nm N-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Fukutome; Y. Momiyama; E. Yoshida; M. Okuno; T. Itakura; T. Aoyama
Year: 2005
Detectors, sensors, and mems thin film transistors for displays and system on panel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyuha Chung; A. Akinwande
Year: 2005
High performance single grain si tfts inside a location-controlled grain by /spl mu/-czochralski process with capping layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Vikas; R. Ishihara; Y. Hiroshima; D. Abe; S. Inoue; T. Shimoda; J.W. Metselaar; C.I.M. Beenakker
Year: 2005
Low temperature single grain thin film transistor (LTSG-TFT) with SOI performance using cmp-flattened /spl mu/-czochralski process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Shimada; Y. Hiroshima; T. Shimoda
Year: 2005
2-bit poly-Si-TFT nonvolatile memory using hafnium oxide, hafnium silicate and zirconium silicate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Hsien Lin; Chao-Hsin Chien; Tung-Hung Chou; Tien-Sheng Chao; Chun-Yen Chang; Tan-Fu Lei
Year: 2005
Highly efficient current scaling AMOLED panel employing a new current mirror pixel circuit fabricated by excimer laser annealed poly-Si TFTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae-Hoon Lee; Woo-Jin Nam; Hee-Sun Shin; Min-Koo Han; Yong-Min Ha; Chang-Hwan Lee; Hong-Seok Choi; Soon-Kwang Hong
Year: 2005
Novel solid-state spatial light modulator on integrated circuits for high-speed application with electro-optic thin film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Fujimori; T. Fujii; T. Suzuki; H. Kimura; T. Fuchikami; T. Nakamura; H. Takasu
Year: 2005
A novel CMOS compatible L-shaped impact-ionization MOS (LI-MOS) transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eng-Huat Toh; Grace Huiqi Wang; Guo-Qiang Lo; N. Balasubramanian; Chih-Hang Tung; F. Benistant; L. Chan; G. Samudra; Yee-Chia Yeo
Year: 2005
Modeling and simulation simulation of doping and stress effects in advanced CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Rafferty; J. Lorenz
Year: 2005
Ultra-thin-body fully depleted SOI metal source/drain n-MOSFETs and ITRS low-standby-power targets through 2018
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Connelly; P. Clifton; C. Faulkner; D.E. Grupp
Year: 2005
Moderately doped channel multiple-finFET for logic applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Shiho; D. Burnett; M. Orlowski; J. Mogab
Year: 2005
Practical finFET design considering GIDL for LSTP (low standby power) devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tanaka; K. Takeuchi; M. Hane
Year: 2005
Thermal phenomena in deeply scaled MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rowlette; E. Pop; S. Sinha; M. Panzer; K. Goodson
Year: 2005
Dual stress capping layer enhancement study for hybrid orientation finFET CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyoungsub Shin; Chi On Chui; Tsu-Jae King
Year: 2005
A full self-consistent methodology for strain-induced effects characterization in silicon devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Fantini; A. Ghetti; G.P. Carnevale; E. Bonera; D. Rideau
Year: 2005
Quantum, power, and compound semiconductor devices silicon challenges conventional iii-v light emitters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Harris; A. Khan
Year: 2005
2 /spl mu/m emission from Si/Ge heterojunction LED and up to 1.55 /spl mu/m detection by GOI detectors with strain-enhanced features
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.H. Liao; C.Y. Yu; C.F. Huang; C.H. Lin; C.J. Lee; M.H. Yu; S.T. Chang; C.Y. Liang; C.Y. Lee; T.H. Guo; C.C. Chang; C.W. Liu
Year: 2005
Dislocation engineering for a silicon-based light emitter at 1.5 /spl mu/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kittler; M. Reiche; T. Arguirov; W. Seifert; X. Yu
Year: 2005
Failure mechanisms of gallium nitride LEDs related with passivation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Meneghini; L.R. Trevisanello; S. Levada; G. Meneghesso; G. Tamiazzo; E. Zanoni; T. Zahner; U. Zehnder; V. Harle; U. Straus
Year: 2005
A novel silicon-nitride based light-emitting transistor (SiNLET): optical/electrical properties of a SONOS-type three-terminal electroluminescence device for optical communication in ULSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.C. Yeh; W.J. Tsai; T.C. Lu; Y.R. Chen; K.M. Pan; S.H. Gu; Y.Y. Liao; H.L. Kao; T.F. Ou; N.K. Zous; WenChi Ting; Tahui Wang; J. Ku; Chih-Yuan Lu
Year: 2005
The origin of variable retention time in DRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Mori; K. Ohyu; K. Okonogi; R. Yamada
Year: 2005
Program and SILC constraints on NC memories scaling: a monte carlo approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Gusmeroli; A.S. Spinelli; C. Monzio Compagnoni; D. Ielmini; F. Morelli; A.L. Lacaita
Year: 2005
Observations of NBTI-induced atomic scale defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Campbell; P.M. Lenahan; A.T. Krishnan; S. Krishnan
Year: 2005
NBTI in SOI p-channel MOS field effect transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.T. Liu; D.E. Ioannou; D.P. Ioannou; M. Flanery; H.L. Hughes
Year: 2005
Blech effect in dual damascene copper-low k interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Ney; X. Federspiel; V. Girault; O. Thomas; P. Gergaud
Year: 2005
An integrated solution with a novel bi-layer etch stop to eliminate 90 nm Cu/low k package fail
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Sun; E. Bei; Y.W. Chen; T. Hu; F. Ji; C.C. Liao; V. Ruan; A. Tsai; D.L. Wang; S. Wu; G. Zhang; A. Fan; I.C. Chen
Year: 2005
Impact of moisture on porous low-k reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Michelon; R.J.O.M. Hoofman
Year: 2005
Effect of moisture on the time dependent dielectric breakdown (TDDB) behavior in an ultra-low-k (ULK) dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.R. Lloyd; T.M. Shaw; E.G. Liniger
Year: 2005
Voltage acceleration of oxide breakdown in the sub-10 nm Fowler-Nordheim and direct tunneling regime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Duschl; R.-P. Vollertsen
Year: 2005
Lifetime prediction of ultra-thin gate oxide PMOSFETs submitted to hot hole injections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Di Gilio; A. Bravaix
Year: 2005
On intrinsic failure rate of products with error correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guoqiao Tao; J. Bisschop; S. Nath
Year: 2005
Detection of trap generation in high-k gate stacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.D. Young; D. Heh; S. Nadkarni; R. Choi; J.J. Peterson; H.R. Harris; J.H. Sim; S.A. Krishnan; J. Barnett; E. Vogel; B.H. Lee; P. Zeitzoff; G.A. Brown; G. Bersuker
Year: 2005
Charge instability in high-k gate stacks with metal and polysilicon electrodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Neugroschel; G. Bersuker
Year: 2005
Matching variation after HCI stress in advanced CMOS technology for analog applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Lin; S.Y. Chen; H.W. Chen; H.C. Lin; Z.W. Jhou; S. Chou; J. Ko; T.F. Lei; H.S. Haung
Year: 2005
IREM usage in the detection of highly resistive failures on 65nm products
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ifar Wan; D. Bockelman; Yun Xuan; S. Chen
Year: 2005
Characterization of EOS induced defects on submicron devices using 2D spectral imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. Bailon; P.F. Salinas; J.S. Arboleda; J.C. Miranda
Year: 2005
Some applications of V/sub BD/ and Q/sub BD/ tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.T.C. Chen; T. Dimitrova; D. Dimitrov; K. Park; D. Schroder
Year: 2005
Resistance instability in Cu-damascene structures during the isothermal electromigration test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Impronta; S. Farris; A. Ficola; A. Scorzoni
Year: 2005
From micro breakdown to hard breakdown - from artifact to destructive failure?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Degraeve
Year: 2005
Characterization and modeling NBTI for design-in reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.R. Parthasarathy; M. Denais; V. Huard; G. Ribes; E. Vincent; A. Bravaix
Year: 2005
Product reliability in 90nm CMOS and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Turner
Year: 2005
Discussion Groups (DG) and Special Interest Group (SIG) Summary Reports
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Nelson
Year: 2005
IIRW 2005 Discussion Group Summary: NBTI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Campbell; C. Parthasarathy
Year: 2005
IIRW 2005 discussion group summary: product reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2005
Multi-Agent Design for Catchment Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Dunstan; X. Qiang; O. Cacho; R. Hean
Year: 2005
Genetic Algorithms for Predicting the Egyptian Stock Market
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.A. Badawy; H.Y. Abdelazim; M.G. Darwish
Year: 2005
On-line assertion-based verification with proven correct monitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Borrione; Miao Liu; K. Morin-Allory; P. Ostier; L. Fesquet
Year: 2005
From Sequential Extended Regular Expressions to Determinstic Finite Automata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Gascard
Year: 2005
Generating unit test sequences for aspect-oriented programs: towards a formal approach using UML state diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Badri; L. Badri; M. Bourque-Fortin
Year: 2005
A robust steganography technique using discrete cosine transform insertion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.I. Hashad; A.S. Madani; A.E.M.A. Wahdan
Year: 2005
Content-aware adaptive video streaming system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Talaat; M.A. Koutb; H.M. Kelash; R.H. Aboelez
Year: 2005
IMM/spl I.bar/Analyser: a tool for retrieving data from multimedia documents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bari; B. Benzater
Year: 2005
A Semantics-Based Consultations Workbench
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Vassilakis; D. Gouscos; P. Georgiadis
Year: 2005
Client-End Cryptographic Extensions Threat Analysis & Implementation of DNS Routing Attacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Anand; M. Kumar; R. Rishi
Year: 2005
A design flow for an H.264 embedded video encoder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Amer; W. Badawy; G. Jullien
Year: 2005
Effects of real environment simulations on mobile ad hoc networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Hassan; M.I. Youssef; M.M. Zahra
Year: 2005
Multi-agent framework for power systems simulation and monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Prymek; A. Horak
Year: 2005
Optimal transform domain watermark embedding via genetic algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.E. Areef; H.S. Heniedy; O.M. Ouda Mansour
Year: 2005
Agent-based micro-tools development for a co-operative design platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.-J. Fougeres
Year: 2005
Evaluating Web applications testability by combining metrics and analogies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Marchetto; A. Trentini
Year: 2005
Roadmap in Development of Quality Model for Thai Software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.-O. Makdee; P. Praneetpolgrang
Year: 2005
A design for an FPGA-based implementation of Rijndael cipher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Abdelhalim; H.K. Aslan; H. Farouk
Year: 2005
Are we ready to be unleashed? A comparative analysis between agile software development and war fighting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Adolph
Year: 2005
An environment for collaborative iteration planning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Liu; H. Erdogmus; F. Maurer
Year: 2005
Promiscuous pairing and beginner's mind: embrace inexperience [agile programming]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Belshee
Year: 2005
Estimating in actual time [extreme programming]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Hohman
Year: 2005
Selling agile: target-cost contracts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Eckfeldt; R. Madden; J. Horowitz
Year: 2005
Using open spaces to resolve cross team issue [software development]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.M. Tartaglia; P. Ramnath
Year: 2005
A false measure of success "I'd rather have an ounce of cure over this 200 pounds of prevention" [Web development]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.K. Cheng
Year: 2005
Costs of compliance: agile in an inelastic organization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Cunningham
Year: 2005
Agile phase I - the pragmatic case study of Schneider National
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Mc Cormick
Year: 2005
Follow the sun: distributed extreme programming development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Yap
Year: 2005
Improving communication between customers and developers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Takats; N. Brewer
Year: 2005
Creating a living specification using FIT documents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prashant Gandhi; N.C. Haugen; M. Hill; R. Watt
Year: 2005
Test-driven porting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Bohnet; G. Meszaros
Year: 2005
Ongoing quality improvement, or: how we all learned to trust XP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Striebeck
Year: 2005
Balancing hands-on and research activities: a graduate level agile software development course
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Chao
Year: 2005
Student experiences with executable acceptance testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Read; G. Melnik; F. Maurer
Year: 2005
Design of data-path for a VLIW media coprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing He; Yi-he Sun
Year: 2005
A unified architecture for crypto-processing in embedded systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Wang; J. Leiwo; T. Srikanthan
Year: 2005
Supports for components loading and binding at boot-time for component-based embedded operating systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Xu; Oiming Teng; Xiangqun Chen
Year: 2005
Lightweight real-time embedded systems for scalable ubiquitous networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwang-il Hwang; Jin-woo Kim; Jeongsik In; Doo-seop Eom
Year: 2005
Analysis on energy cost for wireless sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yufu Jia; Tianlin Dong; Jian Shi
Year: 2005
Implementation of a semi-formal verification for embedded systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhu Yun; Li Xi; Zhao Siyang; Gong Yuchang
Year: 2005
Test case generation based on time constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Cavalli; E.R. Vieira
Year: 2005
Investigation of transient effects on FPGA-based embedded systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Bakhoda; S.G. Miremadi; H.R. Zarandi
Year: 2005
Anti-detection: how does a target traverse a sensing field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenzhe Zhang; Minglu Li
Year: 2005
Node-disjoint parallel multi-path routing in wireless sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shanping Li; Zhendong Wu
Year: 2005
An approach to reliable scripts dissemination in wireless sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dongmei Zhang; Huadong Ma; Liang Liu; Dan Tao
Year: 2005
Software-based EDF message scheduling on CAN networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Fuster; F. Rodriguez; A. Bonastre
Year: 2005
Enhancing Internet robustness against malicious flows using active queue management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Zheng; Mingzeng Hu; Liyuan Zhao
Year: 2005
The implement of status-checking on the platform of IXP1200 [implement read as implementation]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bo Ning; Yichao Li; Naiqi Liu
Year: 2005
An approach of AIS LAN based on Intel IXP2800
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guo Jiandong; Qin Zhiguang; Zuo Lin
Year: 2005
A proxy cache scheme of network storage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yihui Luo; Changsheng Xie; Xinwei Zheng; Chengfeng Zhang; Zhen Zhao
Year: 2005
Network storage system applied in the military field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lianxing Jia; Chenhui Li; Biaoyuan Li; Honghai Wang; Dan Feng
Year: 2005
A New Era in Computing: Moving Services onto Grid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Foster
Year: 2005
Performance Effective Task Scheduling Algorithm for Heterogeneous Computing System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Ilavarasan; P. Thambidurai; R. Mahilmannan
Year: 2005
Cellular Nonlinear Network Grids - a new Grid Computing Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kunz
Year: 2005
Load Balancing Algorithm in Cluster-based RNA secondary structure Prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guangming Tan; Shengzhong Feng; Ninghui Sun
Year: 2005
Ghost Process: a Sound Basis to Implement Process Duplication, Migration and Checkpoint/Restart in Linux Clusters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Vallee; R. Lottiaux; D. Margery; C. Morin; J.-Y. Berthou
Year: 2005
Load Balancing with Migration Based on Synchronizers in PS-GRADE Graphical Tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Tudruj; J. Borkowski; D. Koponski
Year: 2005
Measuring and improving quality of parallel application monitoring based on global states
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Borkowski
Year: 2005
Parallel Jess
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Petcu
Year: 2005
An Artificial Immune System for Efficient Comparison-Based Diagnosis of Multiprocessor Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Elhadef
Year: 2005


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