On a Robust Bounded Control Design of the Combined Wheel Slip for an Autonomous 4WS4WD Ground Vehicle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shou-Tao Peng; Che-Chia Hsu; Chau-Chin Chang
Year: 2005
Pole Placement of Time-Varying State Space Representations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kai Zenger; R. Ylinen
Year: 2005
New Hamiltonian Eigensolvers with Applications in Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Benner; D. Kressner
Year: 2005
Model reduction via projection of generalized state space systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Vandendorpe; P. Van Dooren
Year: 2005
Average and Worst-Case Techniques in Convex Optimization with Stochastic Uncertainty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Calafiore; F. Dabbene
Year: 2005
A Method for Stopping Nonconvergent Stochastic Approximation Processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.W. Hutchison; J.C. Spall
Year: 2005
Relative Frequencies of Non-homogeneous Markov Chains in Simulated Annealing and Related Algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hannig; E.K.P. Chong; S.R. Kulkarni
Year: 2005
Stability of Stochastic Approximation under Verifiable Conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Andrieu; E. Moulines; P. Priouret
Year: 2005
A Simple Condition for the Convexity of Optimal Control over Networks with Delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Rotkowitz; R. Cogill; S. Lall
Year: 2005
Joint Strategy Fictitious Play with Inertia for Potential Games
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.R. Marden; G. Arslan; J.S. Shamma
Year: 2005
The Design of an Integrated Control System in Heavy Vehicles Based on an LPV Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Gaspar; Z. Szabo; J. Bokor
Year: 2005
Vehicle Velocity Estimation using Modular Nonlinear Observers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Imsland; T.A. Johansen; T.I. Fossen; J.C. Kalkkuhl; A. Suissa
Year: 2005
Observability matrix and parameter identification: application to vehicle tire cornering stiffness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Stephant; A. Charara
Year: 2005
Improved Numerical Integration Method for Power/Power Electronic Systems Based on Three-Point Collocation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.P. Meliopoulos; G.J. Cokkinides; G.K. Stefopoulos
Year: 2005
Self Calibrating Procedure for a 3D Force Observer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.G. Garcia; A. Robertsson; J.G. Ortega; R. Johansson
Year: 2005
Active control of a tensegrity plane grid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Averseng; J.-F. Dube; B. Crosnier; R. Motro
Year: 2005
PID Controller Design for a Flexible-Link Manipulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming-Tzu Ho; Yi-Wei Tu
Year: 2005
A Nonsmooth Optimization Approach to H∞ Synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Mammadov; R. Orsi
Year: 2005
Hybrid Static Output Feedback Stabilization of Two-Dimensional LTI Systems: A Geometric Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guisheng Zhai; H. Kondo; J. Imae; T. Kobayashi
Year: 2005
Computation of Observability Regions for Piecewise Affine Systems: A Projection-Based Algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Gati; G. Ferrari-Trecate
Year: 2005
Approximate Trajectories and Sampling Methods For Impulsive Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.R. Wolenski; S. Zabic
Year: 2005
Towards Satisfying an Application Level Quality Measure via a Neural Network TCP-like Protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.N. Houmkozlis; G.A. Rovithakis
Year: 2005
A Nested Noncooperative OSNR Game in Optical Links with Dynamic Gain Filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Pavel
Year: 2005
Nonstationary consistency of covariance based subspace methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Benveniste; L. Mevel
Year: 2005
Subspace intersection identification of Hammerstein-Wiener systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Goethals; K. Pelckmans; L. Hoegaerts; J. Suykens; B. De Moor
Year: 2005
Identification of Bilinear Systems Using an Iterative Deterministic-Stochastic Subspace Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Lopes dos Santos; J.A. Ramos; J.L. Martins de Carvalho
Year: 2005
Model-based PID tuning for high-order processes: when to approximate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Visioli
Year: 2005
Tuning of a PID controller Using a Multi-objective Optimization Technique Applied to A Neutralization Plant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Popov; A. Farag; H. Werner
Year: 2005
Correlation-Based Tuning of Linear Multivariable Decoupling Controllers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Miskovic; A. Karimi; D. Bonvin; M. Gevers
Year: 2005
Beyond the Existence of Diagonal Controllers: from the Relative Gain Array to the Multivariable Structure Function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Liceaga-Castro; J. Liceaga-Castro; C.E. Ugalde-Loo
Year: 2005
On the Design of Robust H∞Filter-Based Tracking Controller for a Class of Linear Time Delay Systems with Parametric Uncertainties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Alif; M. Darouach; M. Boutayeb
Year: 2005
Robust sensor location optimization in distributed parameter systems using functional observers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Demetriou
Year: 2005
Observability recovering by additional sensor implementation in linear structured systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Commault; J.-M. Dion; Do Hieu Trinh
Year: 2005
A Finite Time Functional Observer For Linear Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Raff; P. Menold; C. Ebenbauer; F. Allgower
Year: 2005
Preferential Estimation for Uncertain Linear Systems at Steady State: Application to Filamentous Fungal Fermentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Bodizs; D. Bonvin; B. Srinivasan
Year: 2005
Structural Identification: The Computation of the Generic McMillan Degree
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Karcanias; E. Sagianos; E. Milonidis
Year: 2005
A State Bounding Observer for Uncertain Non-linear Continuous-time Systems based on Zonotopes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Combastel
Year: 2005
Design of Set-Invariant Estimators for Linear Discrete-Time Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E.T. Dorea; A.C.C. Pimenta
Year: 2005
Leader/Follower synchronization of satellite attitude without angular velocity measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.K. Bondhus; K.Y. Pettersen; J.T. Gravdahl
Year: 2005
Global Practical Output Regulation of a Class of Nonlinear Systems by Output Feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qi Gong; Chunjiang Qian
Year: 2005
Path-following Approach to Control Effort Reduction of Tracking Feedback Laws
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.B. Dacic; M.V. Subbotin; P.V. Kokotovic
Year: 2005
Vertically transverse functions as an extension of the transverse function control approach for second-order systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.A. Lizarraga; J.M. Sosa
Year: 2005
Direction change detection from noisy data and application to mud logging data processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qinghua Zhang; N. Frechin; N. Gueze
Year: 2005
Asymptotically Optimal Sequential Change-Point Detection under Composite Hypotheses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Brodsky; B. Darkhovsky
Year: 2005
Active Control of Flow Over a Backward-Facing Step
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Emami-Naeini; S.A. McCabe; D. de Roover; J.L. Ebert; R.L. Kosut
Year: 2005
Modelling and Simulation of Central Receiver Solar Thermal Power Plants
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.J. Yebra; M. Berenguel; S. Dormido; M. Romero
Year: 2005
Distributed Averaging on Asynchronous Communication Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Mehyar; D. Spanos; J. Pongsajapan; S.H. Low; R.M. Murray
Year: 2005
Error Detection within a Specific Time Horizon and Application to Air Traffic Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.D. Di Benedetto; S. Di Gennaro; A. D'Innocenzo
Year: 2005
Joint Integrated PDA Avoiding Track Coalescence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.A.P. Blom; D. Musicki; E.A. Bloem
Year: 2005
Robust Output Command Tracking for Linear Systems with Nonlinear Uncertain Structure with Application to Flight Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.G. Skarpetis; F.N. Koumboulis; N.S. Roussos
Year: 2005
Energy-based nonlinear control of hydraulically actuated mechanical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Grabmair; K. Schlacher
Year: 2005
Disturbance Attenuation for Linear Systems Subject to Actuator Saturation using Output Feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fen Wu; Qian Zheng; Zongli Lin
Year: 2005
Constructive design of output feedback weakened anti-windup compensators for linear systems with additive/multiplicative perturbations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Galeani; S. Paoletti
Year: 2005
Solving polynomial static output feedback problems with PENBMI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Henrion; J. Lofberg; M. Kocvara; M. Stingl
Year: 2005
2x2 Individual Channel Design MATLAB®Toolbox
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E. Ugalde-Loo; E. Liceaga-Castro; J. Liceaga-Castro
Year: 2005
MAXIS-G: a software package for computing polyhedral invariant sets for constrained LPV systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Miani; C. Savorgnan
Year: 2005
Extremal trajectories in P-time Event Graphs: application to control synthesis with specifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Declerck; M. Khalid; D. Alaoui
Year: 2005
On Controllability of Timed Continuous Petri Net Systems: the Join Free Case
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Jimenez; J. Julvez; L. Recalde; M. Silva
Year: 2005
Identification of residual generators for fault detection of linear dynamic models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Simani; R. Diversi; U. Soverini
Year: 2005
Diagnosis and on-line parametric estimation of simulated moving bed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Youssef; M. Alamir; F. Ibrahim
Year: 2005
Sensor fusion by using a sliding observer for an underwater breathing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Carotenuto; L. Iannelli; S. Manfredi; S. Santini
Year: 2005
Robust Fault Diagnosis for a Satellite System Using a Neural Sliding Mode Observer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qing Wu; M. Saif
Year: 2005
Simulation of Monitoring and Diagnosis of Flotation Columns Operation Using Projection Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.G. Bergh; A. Leon R.
Year: 2005
On Infimum Quantization Density for Multiple-input Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Haimovich; M.M. Seron
Year: 2005
Analysis of Logic Controllers by Transformation of SFC into Timed Automata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Stursberg; S. Lohmann
Year: 2005
Flow-Invariant Sets with Respect to the Markings of Timed Continuous Petri Nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.-H. Matcovschi; O. Pastravanu
Year: 2005
Control of Linear Min-plus Systems under Temporal Constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Amari; I. Demongodin; J.J. Loiseau
Year: 2005
Robust Adaptive Observer Design for Uncertain Systems with Bounded Disturbances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Stepanyan; N. Hovakimyan
Year: 2005
Robust Rotor Flux and Speed Control of Induction Motors Using On-Line Time-Varying Rotor Resistance Adaptation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Kenne; T. Ahmed-Ali; H. Nkwawo; F. Lamnabhi-Lagarrigue
Year: 2005
Adaptive Output-Feedback Stabilization and Disturbance Attenuation for Feedforward Systems with ISS Appended Dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Krishnamurthy; F. Khorrami
Year: 2005
Solutions of max-plus linear equations and large deviations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Akian; S. Gaubert; V. Kolokoltsov
Year: 2005
Series Expansions of Generalized Matrix Products
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Leahu; B. Heidergott
Year: 2005
On the Model Reference Control for Max-Plus Linear Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.A. Maia; L. Hardouin; R. Santos-Mendes; B. Cottenceau
Year: 2005
On a proof of the general version of the spectral theorem in max-plus algebra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. van der Woude; G.J. Olsder
Year: 2005
On MPC for max-plus-linear systems: Analytic solution and stability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J.J. van den Boom; B. De Schutter; I. Necoara
Year: 2005
Sensor Validation And Outlier Detection Using Fuzzy Limits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Nasi; A. Sorsa; K. Leiviska
Year: 2005
GPS Navigation Using Fuzzy Neural Network Aided Adaptive Extended Kalman Filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dah-Jing Jwo; Hung-Chih Huang
Year: 2005
Robust Adaptive Fuzzy Output Control for Nonlinear Uncertain Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mingjun Zhang; Huaguang Zhang; Derong Liu
Year: 2005
Robust exact pole placement via an LMI-based algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Rami; S.E. Faiz; A. Benzaouia
Year: 2005
Loop Shaping Robust Control for Scaled Teleoperation System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Boukhnifer; A. Ferreira; J.G. Fontaine
Year: 2005
State-space μ-analysis for an experimental drive-by-wire vehicle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Halton; M.J. Hayes; P. Iordanov
Year: 2005
The Covariance Extension Equation Revisited
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.I. Byrnes; G. Fanizza; A. Lindquist
Year: 2005
Comparison of Systems using Diffusion Maps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Vaidya; G. Hagen; A. Banaszuk; S. Lafon; I. Mezic; R.R. Coifman
Year: 2005
Sampled-data observer design: A dynamical approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Pertew; H.J. Marquez; Q. Zhao
Year: 2005
Robust Kalman Filtering with Application to Tracking of Partials in Music Signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Satar-Boroujeni; B. Shafai
Year: 2005
Improving the Efficiency of Rapidly-exploring Random Trees Using a Potential Function Planner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Garcia; J.P. How
Year: 2005
An LFT approach to robust gain scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-F. Magni
Year: 2005
Counterclockwise Dynamics of a Rate-Independent Semilinear Duhem Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.K. Padthe; JinHyoung Oh; D.S. Bernstein
Year: 2005
Reachable Set of Bilinear Control Systems With Time Varying Drift
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haidong Yuan; N. Khaneja
Year: 2005
Adaptive Optimization of Markov Reward Processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Campos-Nanez; S.D. Patek
Year: 2005
Linear Independency of Interval Vectors and Its Applications to Robust Controllability Tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyo-Sung Ahn; K.L. Moore; YangQuan Chen
Year: 2005
On Stochastic Analysis Approaches for Comparing Complex Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.G. Mehta; U. Vaidya
Year: 2005
Duhem Models for Hysteresis in Sliding and Presliding Friction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:JinHyoung Oh; A.K. Padthe; D.S. Bernstein; D.D. Rizos; S.D. Fassois
Year: 2005
Combined A Priori Knowledge And Structural Model Closed-Loop Identification Of High Temperature Industrial Furnaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Vinsonneau; D.P. Goodall; K.J. Burnham; D. Brie
Year: 2005
Linear modeling error and steady-state behaviour of nonlinear dynamical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Schweickhardt; F. Allgower
Year: 2005
Estimating derivatives and integrals with Kriging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Vazquez; E. Walter
Year: 2005
Semi-blind receiver for the fiber-wireless uplink channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.Y. Kibangou; G. Favier; M.M. Hassani
Year: 2005
Distributed Kalman Filter with Embedded Consensus Filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Olfati-Saber
Year: 2005
Limited-Delay Coding of Individual Sequences with Piecewise Different Behavior
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gyorgy; T. Linder; G. Lugosi
Year: 2005
Input-to-state stabilization of linear systems with quantized feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Liberzon; D. Nesic
Year: 2005
Equivalence between local tracking procedures and monotonic algorithms in quantum control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Turinici
Year: 2005
Local reachability of stochastic quantum dynamics with application to feedback control of single-spin systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Yamamoto; H. Machida; K. Tsumura; S. Hara
Year: 2005
Harmonic Bounds in Atomic Force Microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Materassi; M. Salapaka; M. Basso
Year: 2005
Extremum seeking applied to the plasma control system of the Frascati Tokamak Upgrade
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Centioli; F. Iannone; G. Mazza; M. Panella; S. Podda; A. Tuccillo; V. Vitale; L. Pangione; L. Zaccarian
Year: 2005
On-Line Calculation of Feedforward Trajectories for Tokamak Plasma Shape Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.L. Walker; R.D. Johnson; J.A. Leuer; B.G. Penaflor
Year: 2005
Disturbance Tolerance and Rejection of Linear Systems with Imprecise Knowledge of Actuator Input Output Characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haijun Fang; Zongli Lin; Y. Shamash
Year: 2005
Combining a Novel Computer Vision Sensor with a Cleaning Robot to Achieve Autonomous Pig House Cleaning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.A. Andersen; I.D. Braithwaite; M. Blanke; T. Sorensen
Year: 2005
Sonar and Video Data Fusion for Robot Localization and Environment Feature Estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Bonci; G. Ippoliti; A. La Manna; S. Longhi; L. Sartini
Year: 2005
A transparent solution for providing remote wired or wireless communication to board and system level boundary-scan architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Collins; I. Reis; M. Simonen; M. van Houcke
Year: 2005
Definitions of jitter measurement terms and relationships
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Zamek; S. Zamek
Year: 2005
Jitter transformations in measurement instruments and discrepancies between measurement results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Zamek; S. Zamek
Year: 2005
Third-Order Phase Lock Loop Measurement and Characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Ma; M. Li; M. Marlett
Year: 2005
A 16-bit resistor string DAC with full-calibration at final test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Parthasarathy; T. Kuyel; Zhongjun Yu; Degang Chen; R. Geiger
Year: 2005
Power-scan chain: design for analog testability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Zjajo; H.J. Bergveld; R. Schuttert; J.P. de Gyvez
Year: 2005
A self-timed structural test methodology for timing anomalies due to defects and process variations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.D. Singh
Year: 2005
Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Lee; Hui Li; L.-C. Wang; M.S. Abadir
Year: 2005
Testing and debugging delay faults in dynamic circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Datta; S. Nassif; R. Montoye; J.A. Abraham
Year: 2005
Test methodology for Freescale's high performance e600 core based on PowerPC/spl reg/ instruction set architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Tendolkar; D. Belete; A. Razdan; H. Reyes; B. Schwarz; M. Sullivan
Year: 2005
Drive only at speed functional testing; one of the techniques Intel is using to control test costs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Tripp; S. Picano; B. Schnarch
Year: 2005
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Schuermyer; K. Cota; R. Madge; B. Benware
Year: 2005
Burn-in reduction using principal component analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Nahar; R. Daasch; S. Subramaniam
Year: 2005
Compression mode diagnosis enables high volume monitoring diagnosis flow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Leininger; P. Muhmenthaler; Wu-Tung Cheng; N. Tamarapalli; Wu Yang; Hans Tsai
Year: 2005
Safely backdriving low voltage devices at in-circuit test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Jacobsen; T. Saye; T. Trader
Year: 2005
Optimized reasoning-based diagnosis for non-random, board-level, production defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. O'Farrill; M. Moakil-Chbany; B. Eklow
Year: 2005
The effects of defects on high-speed boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Parker
Year: 2005
Structural tests for jitter tolerance in SerDes receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sunter; A. Roy
Year: 2005
A DDJ calibration methodology for high-speed test and measurement equipments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Farahmand; S. Tabatabaei; F. Ben-Zeev; A. IvanoV
Year: 2005
Test time reduction of successive approximation register A/D converter by selective code measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Goyal; A. Chatterjee; M. Atia; H. Iglehart; Chung Yu Chen; B. Shenouda; N. Khouzam; H. Haggag
Year: 2005
A wideband low-noise ATE-based method for measuring jitter in GHz signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Yamaguchi; M. Ishida; M. Soma
Year: 2005
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bhattacharya; R. Senguttuvan; A. Chatterjee
Year: 2005
Enhanced launch-off-capture transition fault testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Ahmed; M. Tehranipoor; C.P. Ravikumar
Year: 2005
Methods for improving transition delay fault coverage using broadside tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Devtaprasanna; A. Gunda; P. Krishnamurthy; S.M. Reddy; I. Pomeranz
Year: 2005
Calibrating clock stretch during AC scan testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rearick; R. Rodgers
Year: 2005
Test and debug features of the RTO7 chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. van Kaam; B. Vermeulen; H.J. Bergveld
Year: 2005
Automated mapping of pre-computed module-level test sequences to processor instructions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Guramurthy; S. Vasudevan; J.A. Abraham
Year: 2005
Variance reduction and outliers: statistical analysis of semiconductor test data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.R. Daasch; R. Madge
Year: 2005
Data-driven models for statistical testing: measurements, estimates and residuals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.R. Daasch; R. Madge
Year: 2005
The value of statistical testing for quality, yield and test cost improvement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Madge; B. Benware; M. Ward; R. Daasch
Year: 2005
Progressive random access scan: a simultaneous solution to test power, test data volume and test time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Hyun Baik; K.K. Saluja
Year: 2005
A low power and low cost scan test architecture for multi-clock domain SoCs using virtual divide and conquer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.T. Arasu; C.P. Ravikumar; S.K. Nandy
Year: 2005
A novel stuck-at based method for transistor stuck-open fault diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xinyue Fan; W. Moore; C. Hora; G. Gronthoud
Year: 2005
Diagnosis framework for locating failed segments of path delay faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying-Yen Chen; Min-Pin Kuo; Jing-Jia Liou
Year: 2005
Diagnosis with convolutional compactors in presence of unknown states
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Mrugalski; A. Pogiel; J. Rajski; J. Tyszer
Year: 2005
Low cost multisite testing of quadruple band GSM transceivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Zhang; D. Heaton; H. Largey
Year: 2005
Functional vs. multi-VDD testing of RF circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Silva; J. Pineda de Gyvez; G. Gronthoud
Year: 2005
Defect-based RF testing using a new catastrophic fault model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Acar; S. Ozev
Year: 2005
A novel process and hardware architecture to reduce burn-in cost
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Schroeder; Jin Pan; T. Albertson
Year: 2005
Reducing test cost through the use of digital testers for analog tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Sweeney; A. Tsefrekas
Year: 2005
Noncontact wafer probe using wireless probe cards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.V. Sellathamby; M.M. Reja; Lin Fu; B. Bai; E. Reid; S.H. Slupsky; I.M. Filanovsky; K. Iniewski
Year: 2005
Cost-effective designs of field service for electronic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Ting Lin; D. Williams; T. Ambler
Year: 2005
Analyzing second-order effects between optimizations for system-level test-based model generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Margaria; H. Raffelt; B. Steffen
Year: 2005
Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhanglei Wang; K. Chakrabarty
Year: 2005
Defect-oriented testing and diagnosis of digital microfluidics-based biochips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fei Su; W. Hwang; A. Mukherjee; K. Chakrabarty
Year: 2005
A new approach for massive parallel scan design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woo Cheol Chung; D.S. Ha
Year: 2005
Power-supply noise in SoCs: ATPG, estimation and control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nourani; A. Radhakrishnan
Year: 2005
A vector-based approach for power supply noise analysis in test compaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Wang; Ziding Yue; Xiang Lu; Wangqi Qiu; Weiping Shi; D.M.H. Walker
Year: 2005
Forming N-detection test sets from one-detection test sets without test generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Pomeranz; S.M. Reddy
Year: 2005
An update on IEEE 1149.6 - successes and issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Eklow
Year: 2005
IEEE 1500 utilization in SOC design and test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Zorian; A. Yessayan
Year: 2005
Layering of the STIL extensions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Maston; T. Taylor
Year: 2005
Analysis of error-masking and X-masking probabilities for convolutional compactors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Arai; S. Fukumoto; K. Iwasaki
Year: 2005
XWRC: externally-loaded weighted random pattern testing for input test data compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seongmoon Wang; K.J. Balakrishnan; S.T. Chakradhar
Year: 2005
Test data compression for IP embedded cores using selective encoding of scan slices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhanglei Wang; K. Chakrabarty
Year: 2005
On concurrent test of wrapped cores and unwrapped logic blocks in SOCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiang Xu; N. Nicolici
Year: 2005
Definition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Waayers; R. Morren; R. Grandi
Year: 2005
Test implications of lead-free implementation in a high-volume manufacturing environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shu Peng; Sam Wong
Year: 2005
Bead probes in practice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Parker
Year: 2005
Effect of lead free solders on in-circuit test process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.D. Reinosa
Year: 2005
A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Cai; A. Bhattacharyya; J. Martone; A. Verma; W. Burchanowski
Year: 2005
A test case for 3Gbps serial attached SCSI (SAS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Cai; L. Fang; R. Ratemo; J. Liu; K. Gross; M. Kozma
Year: 2005
Production-oriented interface testing for PCI-Express by enhanced loop-back technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lin; Kwang-Ting Cheng; J. Hsu; M.C. Sun; J. Chen; S. Lu
Year: 2005
Logic soft errors: a major barrier to robust platform design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mitra; Ming Zhang; T.M. Mak; N. Seifert; V. Zia; Kee Sup Kim
Year: 2005
Built-in constraint resolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Giles; J. Irby; D. Toneva; Kun-Han Tsai
Year: 2005
A methodology for testing one-hot transmission gate multiplexers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.L. McLaurin; F. Frederick; R. Slobodnik
Year: 2005
Enabling yield analysis with X-compact
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Stanojevic; Ruifeng Guo; S. Mitra; S. Venkataraman
Year: 2005
Use of MISRs for compression and diagnostics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Keller; T. Bartenstein
Year: 2005
Compressed pattern diagnosis for scan chain failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Huang; Wu-Tung Cheng; J. Rajski
Year: 2005
Logic proximity bridges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.N. Tran; V. Krishna; S. Zachariah; S. Chakravarty
Year: 2005
An optimal test pattern selection method to improve the defect coverage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuxin Tian; M.R. Grimaila; Weiping Shi; M.R. Mercer
Year: 2005
Gate exhaustive testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyoung Youn Cho; S. Mitra; E.J. McCluskey
Year: 2005
JTAG-based vector and chain management for system test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.G. Van Treuren; B.E. Peterson; J.M. Miranda
Year: 2005
A strategy for board level in-system programmable built-in assisted test and built-in self test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Ferry; J. Scesnak; S. Shaikh
Year: 2005
IJTAG (internal JTAG): a step toward a DFT standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rearick; B. Eklow; K. Posse; A. Crouch; B. Bennetts
Year: 2005
Word line pulsing technique for stability fault detection in SRAM cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pavlov; M. Azimane; J.P. de Gyvez; M. Sachdev
Year: 2005
Testing priority address encoder faults of content addressable memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Fu Li
Year: 2005
March AB, March AB1: new March tests for unlinked dynamic memory faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Benso; A. Bosio; S. Di Carlo; G. Di Natale; P. Prinetto
Year: 2005
Chasing subtle embedded RAM defects for nanometer technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Powell; A. Kumar; J. Rayhawk; N. Mukherjee
Year: 2005
Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Arkin
Year: 2005
Parallel, multi-DUT testing in an open architecture test system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Adachi; A. Pramanick; M. Elston
Year: 2005
The PXI carrier: a novel approach to ATE instrument development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.B. Kushnick
Year: 2005
Computational intelligence based testing for semiconductor measurement systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Liau; D. Schmitt-Landsiedel
Year: 2005
Efficient compression of deterministic patterns into multiple PRPG seeds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Wohl; J.A. Waicukauski; S. Patel; F. DaSilva; T.W. Williams; R. Kapur
Year: 2005
Comparative study of CA with phase shifters and GLFSRs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Chidambaram; D. Kagaris; D.K. Pradhan
Year: 2005
Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.H.-P. Wen; L.-C. Wang; Kwang-Ting Cheng; Wei-Ting Liu; Ji-Jan Chen
Year: 2005
UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laung-Terng Wang; K.S. Abdel-Hafez; Xiaoqing Wen; B. Sheu; Shianling Wu; Shyh-Horng Lin; Ming-Tung Chang
Year: 2005
I/sub DDQ/ test using built-in current sensing of supply line voltage drop
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Xue; D.M.H. Walker
Year: 2005
A leakage control system for thermal stability during burn-in test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Meterelliyoz; H. Mahmoodi; K. Roy
Year: 2005
Test generation for ultra-high-speed asynchronous pipelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feng Shi; Yiorgos Makris; S.M. Nowick; M. Singh
Year: 2005
Low-capture-power test generation for scan-based at-speed testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoqing Wen; Y. Yamashita; S. Morishima; S. Kajihara; Laung-Terng Wang; K.K. Saluja; K. Kinoshita
Year: 2005
Efficient SAT-based combinational ATPG using multi-level don't-cares
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.S. Saluja; S.P. Khatri
Year: 2005
Transient fault characterization in dynamic noisy environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Polian; J.P. Hayes; S. Kundu; B. Becker
Year: 2005
Synthesis of nonintrusive concurrent error detection using an even error detecting function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Dutta; N.A. Touba
Year: 2005
Evaluating ATE-equipment for volume diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Arnold; A. Leininger
Year: 2005
STIL persistence [data reduction]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Maston; J. Villar
Year: 2005
"Driver on a floppy" delivery of ATE instrumentation software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Proskauer
Year: 2005
X-filter: filtering unknowns from compacted test responses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manish Sharma; Wu-Tung Cheng
Year: 2005
Design and analysis of multiple weight linear compactors of responses containing unknown values
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Clouqueur; Kamran Zarrineh; K.K. Saluja; H. Fujiwara
Year: 2005
Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hung-Mao Lin; J.C.-M. Li
Year: 2005
A concurrent BIST scheme for on-line/off-line testing based on a pre-computed test set
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Voyiatzis; D. Gizopoulos; A. Paschalis; C. Halatsis
Year: 2005
Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saibal Mukhopadhyay; Kunhyuk Kang; Hamid Mahmoodi; Kaushik Roy
Year: 2005
A novel test methodology based on error-rate to support error-tolerance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuen-Jong Lee; Tong-Yu Hsieh; M.A. Breuer
Year: 2005
Programmable memory BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Boutobza; M. Nicolaidis; K.M. Lamara; A. Costa
Year: 2005
Full-speed field-programmable memory BIST architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaogang Du; N. Mukherjee; Wu-Tung Cheng; S.M. Reddy
Year: 2005
Analysis of pseudo-interleaving AWG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Okawara
Year: 2005
High-performance ADC linearity test using low-precision signals in non-stationary environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Le Jin; K. Parthasarathy; T. Kuyel; R. Geiger; Degang Chen
Year: 2005
A test point selection method for data converters using Rademacher functions and wavelet transforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Carter; S. Ang
Year: 2005
Invisible delay quality - SDQM model lights up what could not be seen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Sato; S. Hamada; T. Maeda; A. Takatori; Y. Nozuyama; S. Kajihara
Year: 2005
Multiple tests for each gate delay fault: higher coverage and lower test application cost
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Irajpour; S.K. Gupta; M.A. Breuer
Year: 2005
Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Lurkins; D. Hill; B. Benware
Year: 2005
An advanced optical diagnostic technique of IBM z990 eServer microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Song; F. Stellari; B. Huott; O. Wagner; U. Srinivasan; Yuen Chan; R. Rizzolo; H.J. Nam; J. Eckhardt; T. McNamara; Ching-Lung Tong; A. Weger; M. McManus
Year: 2005
Impact of back side circuit edit on active device performance in bulk silicon ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Kerst; R. Schlangen; A. Kabakow; E. Le Roy; T.R. Lundquist; S. Pauthner
Year: 2005
Diagnosis and analysis of an analog circuit failure using time resolved emission microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Syed; R. Herlein; B. Cain; F. Sauk
Year: 2005
A new probing technique for high-speed/high-density printed circuit boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Parker
Year: 2005
How are we going to test SoCs on a board?: the users viewpoint
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Carisson
Year: 2005
How are we going to test socs on a board? the users viewpoint
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Carlsson
Year: 2005
How are we going to test SoC's on a PCB?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peter Collins
Year: 2005
How are we going to test SOC's on a board?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J. Smith
Year: 2005
Soft errors: is the concern for soft-errors overblown?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Vijaykrishnan
Year: 2005
Is the concern for soft-error overblown?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajesh Raina
Year: 2005
Business constraints drive test decisions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Muradali
Year: 2005
Business constraints drive test decisions planning, partnerships and success
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Campbell
Year: 2005
Business constraints drive test decisions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Domino
Year: 2005
Panel: business constraints drive test decisions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Schneider
Year: 2005
Business constraints drive test decisions - not vice versa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanjiv Taneja
Year: 2005
The ITC test compression shootout
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Davidson
Year: 2005
Test compression and logic BIST at your fingertips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shianling Wu; Laung-Terng Wang; Jin Woo Cho; Zhigang Jiang; Boryau Sheu
Year: 2005
Encounter test OPMISR/sup +/ on-chip compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Keller
Year: 2005
XMAX: a practical and efficient compression architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kee Sup Kim
Year: 2005
Test compression - real issues and matching solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rajski
Year: 2005
Methods for improving test compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.A. Touba
Year: 2005
Have we overcome the challenges associated with SoC and multi-core testing?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sankaran Menon
Year: 2005
Position statement: "have we overcome the challenges associated with SoC and multi-core testing?"
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Wood
Year: 2005
Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Haggag; A. Chatterjee
Year: 2005
Darwin, thy name is system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Force
Year: 2005
Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Slamani
Year: 2005
Guaranteed by design or guaranteed to fail or guaranteed by test? or ... neither?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Soma
Year: 2005
Correct by construction is guaranteed to fail
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sunter
Year: 2005
Achieving higher yield through diagnosis-the ASIC perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Schuermyer
Year: 2005
Achieving higher yield through diagnosis?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Venkataraman
Year: 2005
Partnering with customer to achieve high yield
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Wang
Year: 2005
Outsourcing DFT: the right mix
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Holzwarth
Year: 2005
The case for outsourcing DFT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Roehr
Year: 2005
Outsourcing DFT: it can be done but it isn't easy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Winemberg
Year: 2005
Test the test experts: do we know what we are doing?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kapur
Year: 2005
Cyberworld modeling - integrating cyberworlds, the real world and conceptual worlds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.L. Kunii
Year: 2005
Influence of resolution degradation on distance estimation in virtual space displaying static and dynamic image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Ryu; N. Hashimoto; M. Sato
Year: 2005
Web-based configure-to-order platform for collaborative development of customized products
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianxin; M. Helander; Lianfeng Zhang
Year: 2005
A novel watermarking framework for joint-creatorship protection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Quan Zhang; S. Emmanuel
Year: 2005
Supporting presentation techniques based on virtual humans in educational virtual worlds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Chittaro; L. Ieronutti; S. Rigutti
Year: 2005
AReViRoad : a traffic road simulator to learn how to behave
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Herviou; E. Maisel
Year: 2005
A grid-based mobile agent collaborative virtual environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoon Kang Neo; QingPing Lin; Kim Meow Liew
Year: 2005
Design of a virtual shopping mall: some observations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Han Bei Bei; N.S. Chaudhari; J.C. Patra
Year: 2005
Fast algorithm for mining item profit in retails based on microeconomic view
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Xiujuan; Jia Lifeng; Wang Zhe; Zhang Hongyan; Liang Shuang; Zhou Chunguang
Year: 2005
A proposal of COMPASS (community portrait authentication system)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yokota; T. Yonekura
Year: 2005
Massively multiplayer online game (MMOG) - a proposed approach for military application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Tay
Year: 2005
A statistical classification approach to question answering using Web data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Whittaker; S. Furui; D. Klakow
Year: 2005
Improved concept-to-speech generation in a dialogue system on road guidance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Yagi; K. Hirose; S. Takada; N. Minematsu
Year: 2005
Smile and laughter recognition using speech processing and face recognition from conversation video
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ito; Xinyue Wang; M. Suzuki; S. Makino
Year: 2005
Reactive virtual human system with haptic sensation and adaptive function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seungzoo Jeong; Woong Choi; N. Hashimoto; M. Sato
Year: 2005
Strategy for displaying the recognition result in interactive vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Makihara; J. Miura; Y. Shirai; N. Shimada
Year: 2005
Personalized cyber face: a novel facial modeling approach using multi-level radial basis function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Chen; E.C. Prakash
Year: 2005
Range of motion estimation from Mocap data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yasuda; S. Saito; M. Nakajima
Year: 2005
A WBEM based disk array management provider
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-an Tan; Guo-min Lin; Hong Deng; Xue-lan Zhang
Year: 2005
Approximate information retrieval for heterogeneity ontologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dazhou Kang; Baowen Xu; Jianjiang Lu; Keyue Li; W.C. Chu; Hanwu Chen
Year: 2005
Fuzzy co-clustering of Web documents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.-C. Tjhi; Lihui Chen
Year: 2005
Research on the analysis and measurement for testing results of Web applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lei Xu; Baowen Xu; Yanxiang He; Hanwu Chen; Qiaoming Zhu
Year: 2005
A Task Decomposition Algorithm Using Radial Basis Functions for Classification Problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Ishihara; H. Igarashi
Year: 2005
Viewing Low Contrast, High Dynamic Range Images with MUSCLE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Whatmough
Year: 2005
Gabor Filter Bank Representation for 3D Face Recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Cook; V. Chandran; S. Sridharan; C. Fookes
Year: 2005
Object Recognition Using Stereo Vision and Higher Order Spectra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.M. Cool; V. Chandran; A. Nguyen; S. Sridharan
Year: 2005
Pedestrian Tracking Based on Colour and Spatial Information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.H. Seitner; B.C. Lovell
Year: 2005
Adaptive Optical Flow for Person Tracking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Denman; V. Chandran; S. Sridharan
Year: 2005
Simultaneous Estimation of Camera Response Function, Target Reflectance and Irradiance Values
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.G.C. Hamey
Year: 2005
Hand Gesture Extraction by Active Shape Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nianjun Liu; B.C. Lovell
Year: 2005
A Thermodynamics Approach to Graph Similarity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Robles-Kelly
Year: 2005
3-D/4-D Registration of Artificial Knee Implants with Predicting Dynamic Knee Kinematics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Tomosada; S. Kobashi; N. Shibanuma; K. Kondo; M. Yamaguchi; H. Muratsu; Y. Hata; S. Yoshiya; M. Kurosaka
Year: 2005
Trajectory Based Video Sequence Synchronization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Wedge; P. Kovesi; Du Huynh
Year: 2005
Automatic Number Plate Recognition for Australian Conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.G.C. Hamey; C. Priest
Year: 2005
Robust Autofocusing for Automated Microscopy Imaging of Fluorescently Labelled Bacteria
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Hilsenstein
Year: 2005
Geometric Shape Effects in Redundant Keys used to Encrypt Data Transformed by Finite Discrete Radon Projections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kingston; I. Svalbe
Year: 2005
Improved Direct Volume Visualization of the Coronary Arteries Using Fused Segmented Regions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Mueller; A. Maeder; P. O'Shea
Year: 2005
Restoration of Images with Atmospheric Perturbation Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lemaitre; F. Meriaudeau; O. Laligant; J. Blanc-Talon
Year: 2005
Multi-Image 2D-PAGE Feature Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Seow; A. Sowmya; Changming Sun
Year: 2005
Translation Estimation from Omnidirectional Images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae-Hak Kim; R. Hartley
Year: 2005
3D Strain Detection of a Support Implant for an Artificial Hip Joint Using Finite Element Method and Genetic Algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Maeda; S. Kobashi; N. Shibanuma; K. Kondo; Y. Hata
Year: 2005
Tracking Camouflaged Objects with Weighted Region Consolidation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhuan Qing Huang; Zhuhan Jiang
Year: 2005
Pixel Behaviour Metrics for Dynamic Background Modelling with the Projected Difference Pattern Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Pakulski; K. Sammut; Fangpo He; M. Naylor
Year: 2005
Auto-Calibration of a Compound-Type Omnidirectional Camera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hongdong Li; R. Hartley; Lei Wang
Year: 2005
Handwritten Document Offline Text Line Segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Weliwitage; A.L. Harvey; A.B. Jennings
Year: 2005
Face Recognition from Video by Matching Image Sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tat-Jun Chin; U. James; K. Schindler; D. Suter
Year: 2005
A Gradient Based Weighted Averaging Method for Estimation of Fingerprint Orientation Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Wang; Jiankun Hu; H. Schroder
Year: 2005
A Novel Approach to Skew Detection and Character Segmentation for Handwritten Bangla Words
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Roy; T.K. Bhowmik; S.K. Parui; U. Roy
Year: 2005
Representation of Cyclic Colour Spaces within Quantum Space
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nolle; B. Omer
Year: 2005
Virtual Microscopy with Extended Depth of Field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.P. Bradley; M. Wildermoth; P. Mills
Year: 2005
Federated Exploitation of All-Source Imagery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.M. Booth; N.J. Redding; R. Jones; M. Smith; I.J. Lucas; K.L. Jones
Year: 2005
Image Completion from Low-Level Learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Zhu; H.D. Li
Year: 2005
Large-Object Range Data Acquisition, Fusion and Segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Hesami; A. Bab-Hadiashar; N. Gheissari
Year: 2005
Matching Commercial Clips from TV Streams Using a Unique, Robust and Compact Signature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yijun Li; J.S. Jin; Xiaofang Zhou
Year: 2005
Correcting Flicker in Color Motion Pictures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.K. Wong; A. Das; M.N. Chong
Year: 2005
Spatial Error Concealment Using Directional Extrapolation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan Zhao; Hexin Chen; Xuefen Chi; J.S. Jin
Year: 2005
Medical Image Analysis for Image Guided Therapy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.K. Warfield
Year: 2005
Computer Aided Analysis of Dental Radiographic Images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A.A. Youssif; M.U. Chowdhury; S. Ray
Year: 2005
Towards Optimal Image Stitching for Virtual Microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Appleton; A.P. Bradley; M. Wildermoth
Year: 2005
Development of Semi-Automatic Segmentation Methods for Measuring Tibial Cartilage Volume
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Cheong; D. Suter; F. Cicuttini
Year: 2005
Application of data mining techniques as a complement to natural inflow uni-variable stochastic forecasting - a case study : the Iguacu River Basin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Cataldi; Cd.C.L. Achao; L.G.F. Guilhon
Year: 2005
Evolving analytic hierarchy processes for artificial life-based games
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Halavati; J. Habibi; S.B. Shouraki
Year: 2005
Hybridizing particle filters and population-based metaheuristics for dynamic optimization problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Pantrigo; A. Sanchez
Year: 2005
An efficient adaptive focused crawler based on ontology learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang Su; Yang Gao; Jianmei Yang; Bin Luo
Year: 2005
Fuzzy expert system for solving lost circulation problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Sheremetov; I. Batyrshin; J. Martinez; H. Rodriguez; D. Filatov
Year: 2005
A constructive neural network for detecting left ventricular hypertrophy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.V. Filho; Hd.C. Chaves, Jr.; M.J.S. Valenca; F.M.C. de Souza
Year: 2005
Data mining experiments on hop processing data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.W. Grzymala-Busse; Z.S. Hippe; T. Mroczek; E. Roj; B. Skowronski
Year: 2005
A boosting approach to remove class label noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Karmaker; S. Kwek
Year: 2005
Feature selection with decision tree criterion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Grabczewski; N. Jankowski
Year: 2005
GRASP with path-relinking for the SONET ring assignment problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ld.O. Bastos; L.S. Ochi; E.M. Macambira
Year: 2005
Particle Swarn Optimization with Fast Local Search for the Blind Traveling Salesman Problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.S. Lope; L.S. Coelho
Year: 2005
Investigation of particle swarm optimization for dynamic reconfiguration of field-programmable analog circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Tawdross; A. Konig
Year: 2005
Spatial implementation of evolutionary multiobjective algorithms with partial Lamarckian repair for multiobjective knapsack problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ishibuchi; K. Narukawa
Year: 2005
Ensemble of genetic programming models for designing reactive power controllers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Grosan; A. Abraham
Year: 2005
Texture classification using local and global histogram equalization and the Lempel-Ziv-Welch algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.V. Batista; M.M. Meira; N.L. Cavalcanti, Jr.
Year: 2005
An unsupervised learning approach to resolving the data imbalanced issue in supervised learning problems in functional genomics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kihoon Yoon; Stephen Kwek
Year: 2005
Constructing ensembles of symbolic classifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.C. Bernardini; M.C. Monard; R.C. Prati
Year: 2005
A hybrid approach for sparse least squares support vector machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Carvalho BPR; W.S. Lacerda; A.P. Braga
Year: 2005
An evolutionary approach to transduction in support vector machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Silva; T.T. Maia; A.P. Braga
Year: 2005
Extracting trees from trained SVM models using a TREPAN based approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.E.D. Torres; C.M.S. Rocco
Year: 2005
Improvement of a face detection system by evolutionary multi-objective optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Verschae; J.R. del Solar; M. Koppen; R.V. Garcia
Year: 2005
Support vector machines applied to white blood cell recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.M. Ushizima; A.C. Lorena; A.C.P.L.F. de Carvalho
Year: 2005
A neural network fingerprint segmentation method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.C. Pais Barreto Marques; A.C. Gay Thome
Year: 2005
Grouping of soccer game records by multiscale comparison technique and rough clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hirano; S. Tsumoto
Year: 2005
Hybrid metabolic flux analysis/artificial neural network modeling of bioprocesses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Teixeira; C. Alves; P.M. Alves; M.J.T. Carrondo; R. Oliveira
Year: 2005
Methods of computational intelligence to give qualitative and quantitative statements of gas concentrations at a high temperature sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Bauersfeld; K.-D. Kramer; S. Patzwahl
Year: 2005
A comparative analysis of negotiation methods for a multi-neural agent system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.C.C. Abreu; A.M.P. Canuto; L.E.A.S. Santana
Year: 2005
The SOPHY framework: simulation, observation and planning in hybrid systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.K. Laursen; M.F. Pedersen; J.D. Bendtsen; L. Alminde
Year: 2005
Recognizing behaviors patterns in a micro robot soccer game
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Barrios-Aranibar; P.J. Alsina
Year: 2005
SWARMs of self-organizing polymorphic agents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Messie; J.C. Oh
Year: 2005
Ontology support for communicating agents in negotiation processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.C. Bravo; J. Perez; V.J. Sosa; A. Montes; G. Reyes
Year: 2005
Determination of real options value by Monte Carlo simulation and fuzzy numbers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.G. Lazo Lazo; M.M.B.R. Vellasco; M.A.C. Pacheco
Year: 2005
Observability in hybrid multi agent recurrent nets for natural language processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Al-Dabass; D. Evans; M. Ren
Year: 2005
A study on the influence of parameter 6 on performance of RBF neural networks trained with the dynamic decay adjustment algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L.I. Oliveira; E.A. Medeiros; T.A.B.V. Rocha; M.E.R. Bezerra; R.C. Veras
Year: 2005
New enhanced methods for radial basis function neural networks in function approximation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Fatemi; M. Roopaei; F. Shabaninia
Year: 2005
Modeling of the rainfall-runoff relationship with artificial neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Valenpa; T. Ludermir; A. Valenpa
Year: 2005
Steering and forwarding techniques for reducing memory communication on a clustered microarchitecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Irie; N. Hattori; M. Takada; N. Hatta; T. Toyoshima; S. Sakai
Year: 2005
A colored Petri net based strategy for multi-agent scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quan Bai; Minjie Zhang; Haijun Zhang
Year: 2005
An approach to avoiding shill bids based on combinatorial auction in volume discount
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Matsuo; T. Ito; T. Shintani
Year: 2005
Balancing conflict and cost in the selection of negotiation opponents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Munroe; M. Luck
Year: 2005
Coalition deal negotiation for services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiangbo Dang; M.N. Huhns
Year: 2005
Performing more than AC for hard distributed constraint satisfaction problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.B. Hassine; Tu Bao Ho
Year: 2005
A stochastic non-deterministic temporal concurrent constraint calculus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Olarte; C. Rueda
Year: 2005
Parallel evolution strategy for protein threading
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Islam; A. Ngom
Year: 2005
Obtaining possible execution histories on multiple memory consistency models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.C.M.A. Melo; N.S.B. Silva; H.C. Mendes; D.F. Aranha
Year: 2005
Using active messages to explore high performance in clusters of computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.S. Peranconi; H.G.G. Cavalheiro
Year: 2005
Balancing active objects on a peer to peer infrastructure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Bustos-Jimenez; D. Caromel; A. di Costanzo; M. Leyton; J.M. Piquer
Year: 2005
Parallel strategies for a multi-criteria GRASP algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.S. Vianna; J.E.C. Arroyo; P.S. Vieira; T.R. de Azeredo
Year: 2005
Adaptive attenuation correction in contrast echo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Zwirn; R. Beeri; D. Gilon; S. Akselrod
Year: 2005
Nearly automated left ventricular long axis tracking on real time three-dimensional echocardiographic data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Veronesi; C. Corsi; E.G. Caiani; C. Lamberti
Year: 2005
Visualisation of cardiac wall motion using MR images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.L. Poh; R.I. Kitney; R.B.K. Shrestha
Year: 2005
Contour detection of short axis slice MR images for contraction irregularity assessment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Muller; A. Neitmann; N. Merkle; J. Wohrle; V. Hombach; H.A. Kestler
Year: 2005
Quantitative assessment of the infarct transmurality using delayed contrast enhanced magnetic resonance images: description and validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Kachenoura; A. Redheuil; R. El-Berbari; C.R. Dominguez; A. Herment; E. Mousseaux; F. Frouin
Year: 2005
An intuitive validation technique to comapre local versus global tagged MRI analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.G. Barnes; J. Barajas; F. Carreras; S. Pujadas; P. Radeva
Year: 2005
Regularization of phase contrast magnetic resonance images using optical flow and smoothness constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Bergvall; K. Markenroth; E. Hedstom; H. Arheden; G. Sparr
Year: 2005
Improved quantification of right ventricular volumes from cardiac magnetic resonance data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Corsi; E.G. Caiani; O. Catalano; S. Antonaci; F. Veronesi; A. Sarti; C. Lamberti
Year: 2005
Telemetric ECG evaluation using einthoven-leads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Bousseljot; D. Kreiseler
Year: 2005
Competitive interactions between ectopic foci and reentry in virtual human atrium
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Zhang; J.-H. Liu; C.J. Garratt; A.V. Holden
Year: 2005
Prediction of maintenance of sinus rhythm using heart rate variability characteristics after conversion in patients with atrial fibrillation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Varoneckas; A. Martinkenas; R. Paskeviciute; A. Podlipskyte; D. Zemaityte
Year: 2005
Discrimination between atrial flutter and atrial fibrillation by computing a flutter index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Fischer; G. Klein; B. Widiger; L. Hoy; C. Zywietz
Year: 2005
Increased dispersion of ventricular repolarization during recovery from exercise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.H.M. Draisma; B.H. van Huysduynen; C.A. Swenne; A.C. Maan; E.E. van der Wall; M.J. Schalij
Year: 2005
Study of spectral components of ventricular repolarization variability by multiple correspondence analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Wong; A. Hernandez; F. Carre; G. Carrault
Year: 2005
Effect of channel exclusion for the automatic measurement of QT dispersion in multichannel magnetocardiograms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.E. Smith; P. Langley; P. van Leeuwen; B. Hailer; L. Trahms; U. Steinhoff; J. Bourke; A. Murray
Year: 2005
Prediction of coronary artery disease progression in human from numerically determined endothelial shear stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.L. Feldman; A.U. Coskun; P.H. Stone
Year: 2005
Are the sites of endocardial origin of the left ventricular papillary muscles primary determinants of the morphology of the normal QRS complex?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M.C. Robinson; C.W. Olson; G. Wagner; R.H. Selvester; J. Foster; T. Steedman
Year: 2005
Discrimination of herg carrier from non-carrier adult patients with borderline prolonged QTc interval
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Couderc; W. Zareba; A.J. Moss
Year: 2005
Real-time three-dimensional echocardiographic evaluation of global and regional left ventricular function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Corsi; R.M. Lang; F. Veronesi; L. Weinert; E.G. Caiani; P. MacEneaney; C. Lamberti; V. Mor-Avi
Year: 2005
Quantification of parametric images to assess segmental wall motion of the left ventricle in echocardiography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Frouin; C. Ruiz-Dominguez; T. Kalikian; N. Kachenoura; A. Delouche; A. Herment; O. Nardi; B. Diebold
Year: 2005
A primary exploration of three-dimensional echocardiographic intra-cardiac virtual reality visualization of atrial septal defect: in vitro validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Sun; H.H. Xue; J.G. Yu; J. Wang; G.Z. Chen; W.J. Hong; W.Q. Wang
Year: 2005
Adaptive searching mechanisms for a cardiology information retrieval system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Chessa; E. de la Vega; C. Vera; M.T. Arredondo; M. Garcia; A. Blanco; R. de las Heras
Year: 2005
Cross-departmental access to relevant clinical information for early rehabilitation using a web-based medical multimedia document server
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Eichelberg; K. Kronberg; D. Heidkamp; M. Grundler; O. Nee; H. Spekker
Year: 2005
A web-based tool for visualization and collaborative annotation of physiological databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Oefinger; R.G. Mark
Year: 2005
Predicting hyperkalemia by the use of a 12-lead temporal-spatial electrocardiograph: clinical evaluations and model simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.C. Tzeng; Y.Z. Chan; J.C. Hsieh
Year: 2005
Cardiac motion estimation in multislice computed tomography imaging using a 4D multiscale surface-volume matching process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Simon; M. Garreau; D. Boulmier; C. Toumoulin; C.H. Le Breton
Year: 2005
Towards automatic full heart segmentation in computed-tomography images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Ecabert; J. Peters; C. Lorenz; J. von Berg; M. Vembar; K. Subramanyan; G. Lavi; J. Weese
Year: 2005
Quantitative fluoroscopic dose saving in cardiovascular imaging with a novel motion discriminating temporal filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.M. Manjeshwar; P.J. Dhawale
Year: 2005
Heartscope: a software tool addressing autonomic nervous system regulat
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Badilini; M. Pagani; A. Porta
Year: 2005
Regional myocardial work: a new method to assess local myocardial function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Mekkaoui; F. Thuny; Y. Seree; A. Riberi; T.G. Mesana
Year: 2005
Incorporating blood pressure load into an elastomechanical ventricular mod
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Mohr; R.R. Schnell; G. Seemann; F.B. Sachse; O. Dossel
Year: 2005
Automating the determination of wave speed using the PU-loop method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J.P. Swalen; A.W. Khir
Year: 2005
Implementation of the cards data standards in five dutch university medical centres
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. van der Putten; E.T. van der Velde; W.A. Dijk; T. Maikoe; R. Hoekema
Year: 2005
Determination of atrial fibrillation frequency using QRST-cancellation with QRS-scaling in standard electrocardiogram leads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Beckers; W. Anne; B. Verheyden; C. van der Dussen de Kestergat; E. Van Herk; L. Janssens; R. Willems; H. Heidbuchel; A.E. Aubert
Year: 2005
Templates implementation for structured DICOM diagnosis reporting in echocardiography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Homorodean; D. Olinic; S. Nedevschi; N. Olinic
Year: 2005
New standards for cardiology report and data communication: an experience with HL7 CDA release 2 and EbXML
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Marcheschi; A. Mazzarisi; S. Dalmiani; A. Benassi
Year: 2005
Towards an electronic patient record for cardiology: the issue of integrity of patient data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Hoekema; G. Weijers; N.G. Janssen; J.P. Busman; W.A. Dijk; E.T. van der Velde
Year: 2005
Improved frequency-domain analysis of ventricular late potentials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.C. Lin
Year: 2005
Detect short run of TWA event with time-domain algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Hostetler; J. Xue; B. Young; W. Kaiser; M. Findeis; D. Gutterman
Year: 2005
Measurement of QT interval and duration of the QRS complex at different ECG sampling rates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Risk; J.S. Bruno; M.L. Soria; P.D. Arini; R.A.M. Taborda
Year: 2005
Comparison of the tissue response during the loading with voltage-sensitive dye in two animal models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Novakova; M. Blaha; J. Bardonova; I. Provaznik
Year: 2005
A simple effective filtering method for removing CPR caused artefacts from surface ECG signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Aramendi; J. Ruiz; S.R. de Gauna; U. Irusta; A. Lazkano; J. Gutierrez
Year: 2005
Nonlinear analysis of cardiac optical mapping data reveals ordered period in defibrillation failure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.D. Simonotto; M.D. Furman; W.L. Ditto; M.L. Spano; G. Liu; K.M. Kavanagh
Year: 2005
A new ventricular fibrillation detection algorithm for automated external defibrillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Amann; R. Tratnig; K. Unterkofler
Year: 2005
Vulnerability in a one-dimensional transmural model of human ventricular tissue in heart failure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kharche; A.V. Holden; H. Zhang
Year: 2005
QRS width and QT time alteration due to geometry change in modelled human cardiac magnetograms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bauer; R.W. dos Santos; T.R. Schmal; E. Nagel; M. Baer; H. Koch
Year: 2005
Characterization of fetal heart rate using approximate entropy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P.M. de Sa
Year: 2005
Robust and efficient location of T-wave ends in electrocardiogram
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Q. Zhang; A.I. Manriquez; C. Medigue; Y. Papelier; M. Sorine
Year: 2005
Savitzky-Golay least-squares polynomial filters in ECG signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hargittai
Year: 2005
Wavelet-basedwiener filter for electrocardiogram signal denoising
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Chmelka; J. Kozumplik
Year: 2005
Evaluation of the quality of ultrasound image compression for a robotic tele-echographic system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Delgorge; C. Rosenberger; G. Poisson; P. Vieyres
Year: 2005
Online measurement of the vasodilation of peripheral arteries on ultrasound images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Bianchini; R. Andrei; F. Faita; V. Gemignani; Y. Plantinga; M. Demi
Year: 2005
Three-dimensional motion analysis of mitral valve leaflet in children with congenital heart disease and its clinical significance: a pilot study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Sun; X. Yan; L.P. Yao; Q. Guo; L.P. Wu; Y.F. Shang
Year: 2005
Constraint 3D elastic model for the segmentation in cardiac MRI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pousin; Y. Rouchdy; M. Picq; J. Schaerer; P. Clarysse
Year: 2005
Hardware accelerated watershed based echocardiographic image segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Drop; Z. Latala; J. Kasperek; R. Patury; P.J. Rajda; J. Sadowski; L. Szydlowski; L. Wojnar
Year: 2005
A realistic anthropomorphic dynamic heart phantom
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Haddad; P. Clarysse; M. Orkisz; P. Croisille; D. Revel; I.E. Magnin
Year: 2005
Characterization of aortic input impedence in the supplemental domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E. Martinez-Cruz; J.L. Rojo-Alvarez; F.J. Vallejo-Ramos; R. Yotti; J.C. Antoranz; M.A. Garcia-Fernandez; J. Bermejo
Year: 2005
Examining the potential of using thorax impedance measured by automated external defibrillators for quantification of circulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Risdal; H. Losert; J. Nysaether; T. Eftestol; F. Sterz; S.O. Aase
Year: 2005
An original method to quantify mitochondria movement in cultured cardiomyocytes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Pelloux; C. Ojeda; Y. Tourneur
Year: 2005
A robust method for auto-synchronized MRI in the mouse at 7 T
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Hiba; N. Richard; M. Janier; P. Croisille
Year: 2005
Medical image enhancement by using cellular neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gacsadi; C. Grava; A. Grava
Year: 2005
Continuous cardiac output monitoring in humans by non-invasive arterial blood pressure waveform analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Lu; R. Mukkamala
Year: 2005
What is the optimum window width when calculating the interaction between rr intervals and systolic pressure levels?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.J. Bowers; A. Murray
Year: 2005
Sequence analysis of pulse transit time and systolic blood pressure during dynamic exercise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Porta; C. Gasperi; G. Nollo; D. Lucini; R. Antolini; M. Pagani
Year: 2005
Diurnal changes of heart rate and sympatho-vagal activity for temporal patterns of transient ischemia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Smrdel; F. Jager
Year: 2005
An on-line ischemia monitoring algorithm for mobile devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Dranca; A. Goni; J. Rodriguez; A. Burgos; A. Illarramendi
Year: 2005
A sensitivity study of the safety factor for conduction in the myocardium
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Romero; B. Trenor; J.M. Ferrero; J. Saiz
Year: 2005
Simulated blocking potassium channels medication on variant mutant SCN5A sodium channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Hsieh; S.K. Lin; W.C. Tzeng; S.M. Shieh
Year: 2005
Pacing lead/myocardium interface: modelling and characterization of the impedance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gressard; C. Besnard; D. Dubet; P. Lantelme; H. Milon
Year: 2005
Laboratory data integration into medical record
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Taddei; P. Pisani; A. Vellani; S. Dalmiani; G. Piccini; T. Carducci; G. Kraft; E. Rocca; S. Storti; A. Andrenelli; M.S. Parri; M. Cardillo; P. Lauciello; S. Gwynne; A. Macerata
Year: 2005
The Groningen ambulance study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Svilaas; W.A. Dijk; J.P. Busman; W.R.M. Dassen; R. de Vos; F. Zijlstra
Year: 2005
Atrial activity enhancement by blind sparse sequential separation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Sanchez; J.J. Rieta; C. Vaya; D. Moratal; R. Cervigon; J.M. Blas; J. Millet
Year: 2005
Systematic evaluation of time-frequency parameters from surface electrocardiograms for monitoring amiodarone effects in atrial fibrillation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Mora; D. Husser; O. Husser; F. Castells; J. Millet; A. Bollmann
Year: 2005
Automatic segmentation of heart sound signals using hidden markov models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.D. Ricke; R.J. Povinelli; M.T. Johnson
Year: 2005
Detection and identification of heart sounds using homomorphic envelogram and self-organizing probabilistic model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Gill; N. Gavrieli; N. Intrator
Year: 2005
A web service for conformance testing of ECG records to the SPC-ECG standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E. Chronaki; F. Chiarugi; S. Sfakianakis; C. Zywietz
Year: 2005
Estimation of the myocardial activation sequence based on b-mode ultrasound cine-images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Adam; D. Rappaport; A. Landesberg; E. Konyukhov; N. Smirin; P. Lysyansky; Z. Friedman
Year: 2005
Stability of genetically engineered cardiac pacemaker - role of intracellular CA/sup 2+/ handling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Zhang; W.-C. Tong; C.J. Garratt; A.V. Holden
Year: 2005
From 2D to 4D in quantitative left ventricle wall motion analysis of biplanar X-ray angiograms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Swoboda; M. Carpella; C. Steinwender; C. Gabriel; F. Leisch; W. Backfrieder
Year: 2005
Linear and non-linear indices of heart rate variability in chronic heart failure: mutual interrelationships and prognostic value
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Maestri; G.D. Pinna; P. Allegrini; R. Balocchi; A. Casaleggio; G. D'Addio; M. Ferrario; D. Menicucci; A. Porta; R. Sassi; M.G. Signorini; M.T. La Rovere; S. Cerutti
Year: 2005
Physiological role of transverse-axial tubular system in cardiac ventricular myocytes: a simulation study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Pasek; J. Simurda; C.H. Orchard; G. Christe
Year: 2005
Cellular modeling and simulation of brugada syndrome
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Xia; Y. Zhang; X.H. Lu
Year: 2005
Wave nature of fractal lacunarity: a higher resolution scale to capture subtle changes in ECG signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.N. Esgiar; P.K. Chakravorty
Year: 2005
Modeling the network forensics behaviors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Ren; Hai Jin
Year: 2005
Cyberprofiling: offender profiling and geographic profiling of crime on the Internet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.C. Tompsett; A.M. Marshall; N.C. Semmens
Year: 2005
Investigating real-time system forensics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Sremack
Year: 2005
Trusted Internet forensics: design of a network forensics appliance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Bruschi; M. Monga; E. Rosti
Year: 2005
Establishing agreements in dynamic virtual organizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ryutov; C. Neuman; Li Zhou; N. Foukia
Year: 2005
A security framework with trust management for sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiying Yao; Daeyoung Kim; Insun Lee; Kiyoung Kim; Jongsoo Jang
Year: 2005
Trust, the "wisdom of crowds", and societal norms: the creation, maintenance, and reasoning about trust in peer networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.C. Colon Osorio; J. Whitney
Year: 2005
Vulnerabilities in SOHO VoIP gateways
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Thermos; G. Hadsall
Year: 2005
New approach for selfish nodes detection in mobile ad hoc networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Djenouri; N. Badache
Year: 2005
State of the art on vision-based structured light systems for 3D measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ribo; M. Brandner
Year: 2005
A practical spherical mirror omnidirectional camera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ohte; O. Tsuzuki; K. Mori
Year: 2005
Optical flow techniques in biomimetic UAV vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.F. Khalil; P. Payeur
Year: 2005
Active environment perception: a novel theoretical modelling based on synchronization of interactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Gianfelici
Year: 2005
Intelligent vision-sensor for robot-sensing applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Hrach; M. Brandner
Year: 2005
Dual feed-back and feed-forward synchronized cross-coupled motion control for two-wheel mobile robot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Al-Ayasrah; T. Alukaidey; R. Salman; G. Pissanidis
Year: 2005
Process-algebra based regulation of sensor controlled operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Gianfelici
Year: 2005
De-noising mechanical signals by hybrid thresholding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoonbin Hong; Ming Liang
Year: 2005
Analysis of wavelength-routed WDM networks under heterogeneous environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han-You Jeong; Seung-Woo Seo
Year: 2005
Routing and wavelength assignment with power aware multicasting in WDM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Hamad; A.E. Kamal
Year: 2005
Network design for IP-centric light-trail networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Balasubramanian; A.E. Kamal; A.K. Somani
Year: 2005
Performance comparison of agile optical network architectures with static vs. dynamic regenerator assignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Sriram; D. Griffith; O. Borchert; G. DiLorenzo; R. Su; N. Golmie
Year: 2005
Analytical calculation of blocking probabilities in WDM rings with wavelength conversion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Waldman; D.R. Campelo
Year: 2005
A photonic container switched transport network to support long-haul traffic at the core
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Ghosh; K. Basu; S.K. Das
Year: 2005
On computing disjoint paths with dependent cost structure in optical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Todimala; Byrav Ramamurthy; N.V. Vinodchandran
Year: 2005
Adaptive QoS routing in dynamic wavelength-routed optical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Deng; S. Subramaniam
Year: 2005
Architectures for WDM Benes interconnection network with simultaneous space-wavelength switching capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.S. Hamza; J.S. Deogun
Year: 2005
Sharing tunable wavelength converters in AWG-based IP optical switching nodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pattavina; M. Rebughini; A. Sipone
Year: 2005
The output-controlled round robin scheduling in differentiated services edge switches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ghaffar; P. Rahbar; O. Yang
Year: 2005
Multiple-quality of protection classes including dual-failure survivable services in p-cycle networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kodian; W.D. Grover
Year: 2005
Coordinated survivability in IP-over-optical networks with IP-layer dual-homing and optical-layer protection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.M. Vokkarane; J. Wang; J.P. Jue
Year: 2005
A GMPLS based control plane testbed for end-to-end services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Li; J. Yates; D. Wang; P. Sebos; J. Gottlieb; A. Greenberg; C. Kalmanek; R. Doverspike
Year: 2005
Dual-link failure resiliency through backup link mutual exclusion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Chandak; S. Ramasubramanian
Year: 2005
On providing elastic QoS in optical burst switched networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Praveen; J. Praveen; C. Siva Ram Murthy
Year: 2005
Evaluation of burst retransmission in optical burst-switched networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Q. Zhang; V.M. Vokkarane; Y. Wang; J.P. Jue
Year: 2005
The streamline effect in OBS networks and its application in load balancing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.H. Phung; K.C. Chua; G. Mohan; M. Motani; T.C. Wong
Year: 2005
Data burst grooming in optical burst-switched networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Farahmand; Q. Zhang; J.P. Jue
Year: 2005
Dynamic converter-aware wavelength assignment in WDM networks with sparse conversion capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quang-Dzung Ho; Man-Seop Lee
Year: 2005
A multi-threshold wavelength allocation scheme for fairness management in WDM ring networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Mosharaf; J. Talim; I. Lambadaris; A. Shokrani
Year: 2005
A feedback-based contention resolution mechanism for slotted optical burst switching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Abe; H. Pan; H. Tanida; Y.-B. Choi; H. Okada
Year: 2005
Design of tunnel-based protection schemes in multigranularity optical cross-connect networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tse Yu Lo; Chien Chen; Ying Yu Chen
Year: 2005
Opportunistic power allocation for fading channels with non-cooperative users and random access
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Sun; E. Modiano
Year: 2005
Wireless enhancements for storage area networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Griffith; K. Sriram; J. Gao; N. Golmie
Year: 2005
Design and evaluation of multichannel multirate wireless networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niranjan; Sugam Pandey; Aura Ganz
Year: 2005
Measuring performance impact of security protocols in wireless local area networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.K. Agarwal; W. Wang
Year: 2005
Geographic routing in the presence of location errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kwon; N.B. Shroff
Year: 2005
A lightweight framework for source-to-sink data transfer in wireless sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Jobin; Z. Ye; H. Rawat; S. Krishnamurthy; S.K. Tripathi
Year: 2005
Approximation algorithms for two optimal location problems in sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Efrat; S. Har-Peled; J.S.B. Mitchell
Year: 2005
Energy saving mechanisms in sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Wang; Y. Xiao
Year: 2005
SS-trees: a cross-layer organizational approach for mesh-based wide-area wireless sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.W. Ha; Pin-Han Ho; X.S. Shen
Year: 2005
Tunneling techniques for end-to-end VPNs: generic deployment in an optical testbed environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Saad; B. Alawieh; S. Guider; H.T. Mouftah
Year: 2005
CompuP2P: a light-weight architecture for Internet computing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sekhri; R. Gupta; A.K. Somani
Year: 2005
Network selection using fuzzy logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kher; A.K. Somani; R. Gupta
Year: 2005
Heuristic solution of MMKP in different distributed admission control and QoS adaptation architectures for video on demand service
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Alam; M. Hasan; M. Hossain; A.S.M. Sohail
Year: 2005
Lifetime maximization using observation time scheduling in multi-hop sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao Qun; M. Gurusamy
Year: 2005


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