Spin diffusion in doped semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Flatte; J.M. Byers; W.H. Lau
Year: 2000
Toward experimental verification of vector Preisach hysteresis model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Friedman; Yikun Huang; J. Kouvel
Year: 2000
Scalinc and data collapse in magnetic viscosity of superconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Adly; M. Huang; C. Krafft
Year: 2000
Application of Preisach analysis to detection of fatigue damage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.Y. Melikhov; C.C.H. Lo; D.C. Jiles; I. Tomas; J. Kadlecova; O.V. Perevertov
Year: 2000
Head positioning servo and data channel for HDDs with multiple spindle speeds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yada; H. Ishioka; Y. Onuki; Y. Shimano; M. Uchida; H. Kanno; N. Hayashi
Year: 2000
Servo bandwidth and positioning accuracy design for high track density disk drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yamaguchi; K. Akagi; K. Yasuna; K. Usui; Y. Matsuda; S. Nakagawa; K. Shishida
Year: 2000
A design method of a mulilhate servo controller using H-infinity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Semba
Year: 2000
Reducing disk flutter by improving aerodynamic design of base castings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baekho Heo; I.Y. Shen
Year: 2000
Possibilities of 40 Gb/in/sup 2/ perpendicular recording
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Takano; Y. Nishida; M. Futamoto; H. Aoi; Y. Nakamura
Year: 2000
Optimization of the number of turns in the write head from a channel front-end perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Jury; P.K. George; J.H. Judy
Year: 2000
Performance of a signal-dependent autoregressive channel model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Stander; A. Patapoutian
Year: 2000
Analysis of dropout peakshift in magnetic tape recording
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Sarigoz; Gang Li; J. Bain; Jian-Gang Zhu
Year: 2000
Novel developments in the field of biomagnetic measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Trahms
Year: 2000
Apparatus for magnetic measurements under biaxial stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pearson; P.T. Squire; M.G. Maylin; J.G. Gore
Year: 2000
Magnetic measurement of material loss in case hardened steel using a new Barkhausen effect system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Zhu; M.J. Johnson; D.C. Jiles
Year: 2000
Method for detection of broken bars in induction motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.N. Dobrodeyev; S.A. Volokhov; A.V. Kildishev; J.A. Nyenhuis
Year: 2000
Properties of lithographically formed cobalt and cobalt alloy single crystal patterned media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Ganesan; K. Hattori; R.L. White; H. Koo
Year: 2000
Ferromagnetic resonance spectroscopy wrfh a micromechanical calorimeter sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Moreland; P. Kabos; R.D. McMichael; C.G. Lee
Year: 2000
Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coeffient in magnetic thin film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siang Huei Leong; Jian Ping Wang; Teck Seng Low
Year: 2000
Magnetic head field over the air bearing surface as visualised by the projection of patterned electron beam
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Suzuki; K. Itoh; K. Nakamura
Year: 2000
Noise measurements on NiFe/Ag multilayered structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Lhermet; R. Cuchet; L. Vieux-Rochaz; M.H. Vaudaine
Year: 2000
Junction edge instability in simple spin valve recording heads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erli Chen; D. Saunders
Year: 2000
Chracterization of magnetic stability in spin valve test devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.T. Hardner
Year: 2000
1/f noise in saturated GMR heads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min Xiao; K.B. Klaassen; J.C.L. van Peppen
Year: 2000
Analysis of quasi static GMR transfer curves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Hannon
Year: 2000
Optimum sensor design of vertical type GMR head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kano; T. Mizuguchi; M. Hashimoto; K. Kitamura; T. Katakura; T. Miyauchi
Year: 2000
The effect of a PT underlayer on the growth texture of strontium ferrite thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zailong Zhuang; Bo Bian; R.M. White; D.E. Laughlin
Year: 2000
Barium ferrite films prepared by pulsed laser deposition with a varying substrate temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.D. Song; Y.F. Lu; W.J. Wang; J.P. Wang; T.C. Chong
Year: 2000
Growth and magnetic properties of nanostructured Ni/sub 50/Co/sub 50/ films by non-aqueous electroless deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Zhang; G.M. Chow
Year: 2000
Correlations among sputter pressure, thickness, and coercivity in co/cu magnetic thin films sputfer-deposited on si[001]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Kelly; J.F. MacKay; E. Mateeva; W.L. O'Brien; M.G. Lagally
Year: 2000
Patterning ferromagnetism in NiFe films via 30 KEV GA ion irradiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.M. Kaminsky; G.A.C. Jones; S.M. Gardiner; Y.B. Xu; J.A.C. Bland; M.G. Blamire
Year: 2000
Thickness dependence of induced magnetic anistropy in very thin permalloy films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Katada; T. Shimatsu; I. Watanabe; H. Muraoka; Y. Sugita; Y. Nakamura
Year: 2000
The stress induced anisotropy in amorphous magnetic thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Mandal; M. Tena; D. Garcia; A. Hernando
Year: 2000
Visualization of mixed frequency magnetic flux using 3/2n terminal type A.C. magnetic flux CT probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Inatomi; S. Yamada
Year: 2000
Magnetoresisuve and magnetic properties of RF-magnetron sputter deposited La-Ca,Sr-Mn-O films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seung-lel Park; Ji-Hee Son; Young Suk Cho; Chul Sung Kim
Year: 2000
Time-frequency analysis of the evoked meg based on a 3-D magnetic field measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Kobayashi; S. Takeuchi; Y. Uchikawa; M. Saito
Year: 2000
Measurement and analysis of environmental magnetic field for biomagneuc nifasuirements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Kobayashi; Y. Uchikawa; K. Yamazaki; K. Kato; K. Kawamata; A. Haga
Year: 2000
Environmental low frequency magnetic noise for biomagnetic measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yamazaki; K. Kamata; Y. Uchikawa; K. Kobayashi; K. Fujiwara
Year: 2000
Aggregation of blood platelets in static magnetic fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Takeuchi; S. Ueno
Year: 2000
Measurement ofauditoryevoked magnetic fields ofrats using A 12 channel high resolution dc-squid magnetometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Uchida; K. Iramina; K. Goto; S. Ueno
Year: 2000
Source localization of visually evoked magnetic fields to stimuli in apparent motion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Tsuda; S. Ueno
Year: 2000
Fabrication of spiral-type magnetic micro-machine running in a gel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sendoh; M. Inoue; K.I. Arai
Year: 2000
A new class of Sm/sub 2/Tm/sub 17/ magnets with operating temperatures up to 550/spl deg/C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.S. Walmer
Year: 2000
High temperature soft magnetic materials: feco alloys and composites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.H. Yu; S. Basu; L. Ren; J.Q. Xiao
Year: 2000
Noise characterization by voronoi cell modeling for perpendicular double layer media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Miura; H. Muraoka; Y. Sugita; Y. Nakamura
Year: 2000
Effect of seedlayer and junction geometry on permanent magnets stabilisation of magnetoresistive heads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Rea; W. O'Kane
Year: 2000
Effect of head slider DLC overcoats produced by various deposition techniques on the interface failure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zheming Zhao; B. Bhushan
Year: 2000
Track profile of MR head and its performance in a helical scan tape system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Fukuda; T. Ikegami; T. Shirai; T. Ozue; S. Kumagai
Year: 2000
Specularity in GMR spin valves and real-time electrical and magnetotransport measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.X. Wang; K. Yamada; W.E. Bailey
Year: 2000
Time dependence studies on giant magnetoresistive Co/Cu multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.T. Holliday; E.W. Hill
Year: 2000
Effects of pumping time and oxidation of multilayers on the GMR ratio of RF sputtered metallic MRAM dual spin valves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seongtae Bae; N. Matsushita; S. Zum; E.J. Torok; L. Sheppard; J.H. Judy
Year: 2000
MR characteristics of synthetic ferrimagnet based spin-valves with different pinning laver thickness ratios
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ki-Seok Moon; Y.K. Kim
Year: 2000
Characterization of magnetic and thermal stability of PTMN spin valves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong Gao; Sining Mao
Year: 2000
Effect of magnetostatic coupling between the free and reference layers on the thermal stability of spin valves with synthetic antiferromagnetic layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hae Seok Cho; M. Tang; Qing He; Song S. Xue
Year: 2000
Magnetoelastic properties of Al-substituted finemet alloys
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Atalay; P.T. Squire; I. Todd; H.A. Davies; M.R.J. Gibbs
Year: 2000
AE effect in amorphous glass-covered wires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.T. Squirel; S. Atalaya; H. Chiriac
Year: 2000
Stress dependence of sound velocity in Fe-based amorphous wires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Chiriac; E. Hristoforou; M. Neagu; I. Darie; C. Hison
Year: 2000
Magnetoimpedance analysed by decomposed components of permeability in annealed amorphous Fe/sub 83/Zr/sub 7/B/sub 8/Cu/sub 2/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Byon; Gil-Ho Ryu; Seong-Cho Yu; Cheol Gi Kim
Year: 2000
Correlation between the magneto-impedence and ferromagnetic resonance responses of nanocrystallike microwires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.-A. Ovari; H. Chiriaco; M. Vazquez; A. Hernando
Year: 2000
Coupling effects in coptcrb thin film media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.R. Jones; K. O'Grady; X. Biano; M. Mirzamaanio; M.F. Doeme
Year: 2000
Contact-dependent relfability of spin valve heads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.-F. Tsu; A. Morrone
Year: 2000
Spin-valve thermal stability - interdiffusion versus exchange biasing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Pakala; Yiming Huai
Year: 2000
Reliability characteristics of IrMn dual sinthetic spin valves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caleb Chang; V.V. Doan; C.F. Lam; J. Thompson
Year: 2000
Current density limitations of spin-valves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Gafron; S.L. Burkett; S.E. Russek
Year: 2000
A study of the ESD sensitivity of bottom synthetic spin-valve recording head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.F. Lam; I. Barlow; Caleb Chang
Year: 2000
General accuracy of the FEM solutions on ampere's law for a highly saturated magnetic device wrm a large air-gap
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sharifi; J.D. Lavers
Year: 2000
Control of inter-layer coupling field in spin valves by thin oxide layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jongill Hong; K. Aoshima; J. Kane; K. Noma; H. Kanai
Year: 2000
Pulsed-current-induced domain wall propagation in permalloy patterns observed using magnetic force microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Gan; K.H. Aschenbach; R.D. Gomez
Year: 2000
Metastable states in large angle magnetic rotations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Kabos; S. Kaka; S. Russek; T. Silva
Year: 2000
Experimental study of local magnetization reversal in exchange-biased spin-valve sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Boeve; J. De Boeck; G. Borghs
Year: 2000
Strain-magnetization properties and domain structure change of silicon steel sheets due to plastic s
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Notoji; M. Hayakawa; A. Saito
Year: 2000
Magnetization properties and domain structures of grain oriented silicon steel sheets due to bending stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Iwasaki; A. Saito
Year: 2000
The magnetic and magnetoelastic properties of ce substrfuted melt-spun tb/sub 3/Dy/sub 7/(Ce/sub z/Fe/sub 1-z/)/sub 1.95/ alloys
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.M. Mahon; A.G. Jenner; H. Ahlers
Year: 2000
Processing of terfenol-d alloy based magnetostrictive composites by dynamic compaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Guruswamy; M.R. Loveless; N. Srisukhumbowomchai; J.P. Teeter
Year: 2000
Magnetic and magnetostrictwe properties of amorphous tbfeb and crystalline terfenol-d composues under dynamic excitanon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Pasquale; C. Sasso; S.H. Lim
Year: 2000
Dependence of magnetoelastic anisotropy energy on Ni sublayer thickness in Ni/Pd nanomultilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong-Ryul Jeong; Sung-Chul Shin
Year: 2000
Measurement of anisotropy field by second harmonics in 3 % silicon steel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.S. Ryu; J.S. Park; C.G. Kim; D. Son
Year: 2000
Magnetic anisotropy of Nd/sub 2/CuO/sub 4/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.N. Bazhan; S.N. Barilo
Year: 2000
Magnetoelastic coupling constant of amorphous ferromagnetic alloys. a critical study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Garcia-Arribas; P.T. Squire; D. Atkinson
Year: 2000
Crystallographic and magnetic properties of Co-Cr-Ta/Cr produced by pulsed laser deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Shima; C.A. Ross
Year: 2000
Novel quantitative MFM technique to study orientation ratio in longitudinal recording media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.T. Yen; T. Thomson; J. Chen; H.J. Richter; R. Ranjan; G.C. Rauch
Year: 2000
Magnetic recording at data rate beyond 700 Mbits/s
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Chen; S. Shi; F. Liu; R. Barr; Hua-Ching Tong; S. Dey
Year: 2000
Perpendicular systems above 100 Gbit/In/sup 2/ density
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.M. Chomko; Y. Liu; K. Mountfield; M.H. Kryder; D. Litvinov
Year: 2000
Measuring the field from the hard bias in spin valves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ningjia Zhu; Xiao Yan; D. Rao; Jing Zhang; M. Lederman; Yiming Huai; A. Rana
Year: 2000
3-D FEM micromagnetic modeling of spin-valve sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuankai Zheng; Yihong Wu; Towchong Chong
Year: 2000
Major hysteresis loop modeling of two-dmensional arrays of single domain particles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hwang; M. Farhoud; Y. Hao; M. Walsh; T.A. Savas; H.I. Smith; C.A. Ross
Year: 2000
Measurement of rotational iron losses in electrical sheet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Stranges; R.D. Findlay
Year: 2000
Prediction of iron losses in ferromagnetic sheets: dynamic and magnetomechanical behaviors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Darces; F. Alves; J. Moulin; A. Benchabi; M. Lecrivain
Year: 2000
Measurements of localised flux density and power loss under PWM excitation in a typical stator core
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Tutkun; A.J. Moses
Year: 2000
A direct identification method of the hysteresis model for the design of SMC transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Cros; I. Haouara; P. Viarouge; F. Piriou
Year: 2000
Laminated FeRhN films for high speed writer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.J. Chen; S. Hossain; L. Miloslavsky; C. Chien; Z.P. Shi; M.S. Miller; H.C. Tong
Year: 2000
Spin-transfer and other current-driven excitations in CPP Cu/Co multilayer devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Katine; F.J. Albert; E.B. Myers; D.C. Ralph; R.A. Buhrman
Year: 2000
A round with nanomagnetism in ballistic nanocontacts: magnetoresistance and current injection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Garcia; M. Munoz; I.G. Saveliev; Y.-W. Zhao
Year: 2000
A force identification method for slider/disk contact force measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qing-hua Zeng; M. Chapin; D.B. Bogy
Year: 2000
Calibration methods for contact force measurements at the head disk interface using acoustic emission analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Knigge; F.E. Talke
Year: 2000
In-situ laser texture chracterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qingfang Leng; Bo Liu; Wei Zhang; A.S. Mydeen; Shengbin Hu
Year: 2000
Dual beam normal incidence polarization interferometry flying height testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Clegg; Xinqun Liu; Bo Liu
Year: 2000
Improved intensrfy interferometry method for measuring head-disk spacing down to contact
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Clegg; Xinqun Liu; Bo Liu
Year: 2000
Flying height measurement considering the effects of the slider-disk interaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yao-Long Zhu; Bo Liu
Year: 2000
Component level corrosion resistance measurements on thin film media and its correlation to drive level tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.L. Jiaa
Year: 2000
High impact resistance plastic hard disk produced using pbii
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Tonosaki; H. Okita; H. Ohuchi; M. Kobayashi; Y. Takei; A. Chayahara; Y. Horino; N. Tsubouchi
Year: 2000
A novel shape effect on magnetisation reversal in mesoscovic Ni/sub 80/Fe/sub 20/ wires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.Y. Lee; A. Hirohata; H.T. Leung; Y.B. Xu; S.M. Gardiner; C.C. Yao; J.A.C. Bland
Year: 2000
Microstructural and magnetic observations of compacted FECOV nanoparticles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Turgut; R.T. Fingers; H.R. Piehler; M.E. McHenry
Year: 2000
Dependence of thermal relaxation and hysteresis on microstructure in nanocrystalline soft magnetic materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Basso; C. Beatrice; P. Tiberto
Year: 2000
Development of granular structure on melt-spun Cu/sub 90/Co/sub 10/ ribbons through furnace and current annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Denardin; M.N. Baibich
Year: 2000
Magnetic measurements on a single co cluster
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Jamet; V. Dupuis; J. Tuaillon; A. Perez; W. Wemsdorfer; D. Mailly
Year: 2000
Single phase induction motor with permanent magnet excitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Ackermann
Year: 2000
Performance improvement of spindle motor for DVD drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuo-Chi Chiu; Tai-Fa Ying; Der-Ray Huang
Year: 2000
Fabrication and development of a novel flux-concentration type linear induction motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Roy; S. Yamada; M. Iwahara
Year: 2000
PZT crack detection of suspension based dual stage actuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ping Yeh; C.-P.R. Ku
Year: 2000
New design of a HDD spindle motor using damping material to reduce NRRO
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.H. Jang; S.J. Hong; J.H. Han; D.K. Kim
Year: 2000
Out of plane magnetoresistance in spin valves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z.Q. Lu; J. Li; W.Y. Lai; Y.K. Zheng
Year: 2000
Magnetic and GMR properties of magnetic granular films prepared by low-energy cluster deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Hamakake; M. Wakairo; K. Ishii
Year: 2000
Effect of in-plane anisotropy on magnetoresistance and magnetization characteristics of the Fe/Co/Cu/Co pseudo-spin valve
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Malkinski; J.-Q. Wang; J.M. Maclaren; W.L. Zhou; Y.W. Hao
Year: 2000
Physical behavior of magnetic ribbons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Puca; N.S. Ahmeida
Year: 2000
Recent developments in magnetic tunnel junction MRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tehrani; B. Engel; E. Chen; M. DeHerrera; M. Durlam; J.M. Slaughter
Year: 2000
Ballistic electron magnetic microscop
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.A. Buhrman; W.H. Rippard
Year: 2000
Single crystal tunnel junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Heinrich; W. Wulfhekel; T. Monchesky; R. Urban; J. Kirschner
Year: 2000
Structure and mumetic properties of (100) NiFe/NiMn/Co
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Huang Lai; Y.H. Wang; W.C. Lien; C.K. Lo
Year: 2000
Annealing effect on exchange bias in NeFe/CrMn bilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haiwen Xi; Bo Bian; Zailong Zhuang; D.E. Laughlin; R.M. White
Year: 2000
Influence of ion irradiation on the exchange bias effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Mewes; R. Lopusnik; M. Jung; D. Engel; A. Ehresmann; H. Schmoranzer; B. Hillebrands
Year: 2000
Microscopic imaging of Fe magnetic domains exchange-coupled with those in a NiO
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Matsuyama; C. Haginoya; K. Koike
Year: 2000
Antiferromagnetic instabilities in exchange bias bilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.D. McMichael; M.D. Stiles; C.G. Lee; P.J. Chen; W.F. Egelhoff
Year: 2000
Exchange anisotropy in mbe grown MnPt/NiFe bilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Shimoyama; Y. Ozaki; T. Kato; S. Iwata; S. Tsunashima
Year: 2000
Antiferromaenetic Cr-Ga layers with a high neel temperature for sipin-valve
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chan-Gyu Lee; Kuk-Tae Youn; K. Fukamichi
Year: 2000
Dependence of the coercivity H/sub c/J of high energy product Nd-Fe-B magnets on the alignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Rodewald; M. Katter; B. Wall; R. Blank; G.W. Reppel; H.D. Zjlg
Year: 2000
A high performance and more economical magnet with an operating temperature of 5000c
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Tang; Y. Zhang; G.C. Hadjipanayis
Year: 2000
Effect of Z value on high temperature performance of Sm(Co,Fe,Cu,Zr) with Z= 6.5- 7.3
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Liu; G. Potts; G. Doyle; Jie Yang; G.E. Kuhl
Year: 2000
Effect of small Zr additions on the microstructure of Sm/sub 2/Fe/sub 17/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kubis; D.N. Brown; O. Gutfleisch; B. Gebel; L. Schultz; I.R. Harris
Year: 2000
Scannng magnetoresistance microscope with a magnetoresistive sensor cantilever
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nakamura; N. Kimura; K. Mukasa
Year: 2000
Magnetic field imaging with a scanning ferromagnetic resonance probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lohndorf; P. Kabos; J. Moreland
Year: 2000
Resolution enhancement by applying MFM under UHV condtions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Dreyer; I.D. Mayergoyz; R.D. Gomez
Year: 2000
Evolution of magnetization reversal on patterned magnetic elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Wu; H.W. Huang; Te-ho Wu
Year: 2000
Noise characteristics of double-layered perpendicular media using novel soft magnetic underlayer materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kikukawa; Y. Honda; M. Futamoto
Year: 2000
High density recording on ultra-thin Fe-Pt films of perpendicular composite media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Suzuki; T. Kiya; N. Honda; K. Ouchi
Year: 2000
Estimation of effective length of superconducting generator's stator coil using 3D FEM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong-Hyuk Lee; Pan-Seok Shin
Year: 2000
3D analysis and development of a novel planar actuator with neodymium-iron-boron permanent magnets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Susin; M.A. da Silveira
Year: 2000
Analysis of orthogonal-core type liner variable inductor and application to var compensator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nakamura; O. Ichinokura
Year: 2000
The influnece of magnetisation pattern on the performance of a cylindrical, moving magnet ltnear actuator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.E. Clark; D. Howe; G.W. Jewell
Year: 2000
Evaluation of alternating flux leakage testing using 3-d non-linear eddy current analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Gotoh; A. Radin; N. Takahashi
Year: 2000
Power loss in soff magnetic materials under sinusoidal rotating magnetic field conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Aouli; A. Mouillet; Y. Azzouz; G. Gueugneau
Year: 2000
Conductive and ferromagnetic shielding of power-frequency magnetic fields from busbars in secondary substations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Salinas; A. Bondeson
Year: 2000
Visualiztion of mixed frequency magnetic flux using 3/2n terminal type A.C. magnetic flux CT probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tashiro; Y. Inatomi; M. Iwahara; S. Yamada
Year: 2000
Car traffic monitoring system using MI sensor built-in disk set on the road
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Uchiyama; K. Mohri; K. Nakashima; Y. Sudo
Year: 2000
Characterization of magnetic enzyme sensor utilizing pyro magnetic film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Yachi; H. Osada; S. Chiba; H. Oka; O. Michikami; N. Tayama; K. Seki
Year: 2000
Spin filtering with perovskite and spinel oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Gajek; U. Luders; A. Barthelemy; M. Bibes; J. Fontcuberta; J.-F. Bobo; K. Bouzehouane; E. Jacquet; J.P. Contour; A. Fert
Year: 2000
Spin dependent tunneling junctions with ion beam omdized tunneling barrier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyusik Sin; C. Chien; Shin Funada; M. Miller; Hua-Ching Tong; Jinsong Wang; G. Landry; J.Q. Xiao
Year: 2000
Evaluation of the in-situ UV oxidation technioue for tunnel-junction preparation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Girgis; H. Boeve; J. De Boeck; J. Schelten; G. Borghs
Year: 2000
ESD sensitivity and thermal stability of spin-valve read with pinned synthetic ferrimahonet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Inage; M. Sano; S. Araki; M. Sakai
Year: 2000
Magnetization vector directions in a steel cube'
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weihua Mao; D.L. Atherton
Year: 2000
Observation of barkrausen noise in a 20X20 /spl mu/m permalloy thin film square
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Callegaro; E. Puppin; S. Ricci
Year: 2000
Statistical fluctuations during magnetization reversal in thin Fe/MgO films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Puppin
Year: 2000
Experimental testing of vector preisach models for superconducting hysteresis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.D. Mayergoyz; A.A. Adly; M. Huang; C. Krafft
Year: 2000
Magnetostatic control of superconductivity in a thin film st by a ferromagnetic overlayer structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Callegaro; A. Polcari; S. Ricci; P. Vavassori
Year: 2000
Modulation of Josephson current of NB junctions by two-dimensional scan of external magnetic field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Nakayama; S. Abe; T. Morita; M. Iwata; Y. Yamamoto
Year: 2000
Magnetic microstructure of oxygen deficient peroskites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sh.Sh. Bashkirov; L.D. Zaripova; N.V. Boltakova
Year: 2000
Demonstrating a tunneling MR head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Song; J. Nowak; R. Larson; P. Kolbo; R. Chellew
Year: 2000
Spin valve device with sub-half micron core width fabricated by reactive etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Iijima; H. Kishi; A. Tanaka; C. Kamata; S. Eguchi
Year: 2000
Design and fabrication for sub half micron core width spin valve read head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Tanaka; H. Kishi; Y. Shimizu; R. Kondo; K. Nagasaka; M. Iijima; J. Ikeda; C. Kamata; S. Eguchi; M. Oshiki
Year: 2000
Enhancement of gmr properties of bottom type spin valve films with ultra-thin free layer covered with specular oxide capping layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Shimizu; S. Eguchi; A. Tanaka
Year: 2000
Enhanced gmr in PtMn based spin-valves with specular reflective thin oxide layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Sakakima; M. Satomi; Y. Sugita; Y. Kawawake; H. Adachi
Year: 2000
RuRhMn and PtMn specular spin valve with magnetic oxide layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Tsuchiya; M. Sano; S. Araki; H. Morita; M. Matsuzaki
Year: 2000
Comparison of friction measurement between load/unload ramp and suspension lift tabs using strain gauge and actuator current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Suk; D. Gillis
Year: 2000
The on drive electronic toroue meter: a self contained non-destructive & non-invasive method of monitoring head disk interface condition in hard disk drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Higgins
Year: 2000
Laser processing to adjust the suspension preload of magnetic recording head stack assemblies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.P. Singh; B.R. Brown; W. Kozlovsky
Year: 2000
High accuracy flying height measurements at the trailing edge of magnetic recording sliders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.A. Duran; Rui-Fang Shi; K.H. Womack
Year: 2000
Absolute calebration of scatir with comparison to measurements of fly height on the DFHT II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Walker; P.J. Sides
Year: 2000
Pole tip recession measurements with high accuracy and precision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V. Kulkami; S.K. Chilamakuri; B.K. Gupta; A.K. Menon
Year: 2000
A systematic study of head-disc dynamics wrfh laser pattern simulated disc microwaviness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Yao; D. Kuo; Jing Gui
Year: 2000
Magnetic switching and anisotropy in nanomagnets: the influence of size and shape
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Welland
Year: 2000
Multipole imaging of an elongated magnetic source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V. Kildishev; J.A. Nyenhuis
Year: 2000
Methods for predicting rotational iron losses fn three phase indumon motor stators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Stranges; R.D. Findlay
Year: 2000
Grain oriented silicon steel modeling: finite element implementation of the coenergy model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Buvat; F. Ossart
Year: 2000
Application of bi-directional thin-film micro wire array to RF integrated spiral inductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Yamaguchi; M. Baba; K.I. Arai; Y. Shimada; K. Ito
Year: 2000
Micro DC/DC converter that integrates planar inductor on power IC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Nakazawa; M. Edo; Y. Katayama; M. Gekinozu; S. Sugahara; Z. Hayashi; K. Kuroki; K. Matsuzaki
Year: 2000
Atomic migration and superexchange interaction in Cu/sub 0.9/Ni/sub 0.1/Fe/sub 2/O/sub 4/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sam Jin Kim; Seung Wha Lee; Chul Sung Kim
Year: 2000
The temperature dependence of power loss for MN-ZN ferrites at high frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.H. Han; B.M. Song
Year: 2000
Die mechanisms affecting the forming of super-large ferrite cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Matsuo; K. Ono; M. Kondoh; F. Nakao
Year: 2000
Non-uniform internal field in planar ferrite elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Pardavi-Horvath; Jijin Yan; J.R. Peverley
Year: 2000
A magnetostatic wave oscillator for data relay aatellite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Marcelli; E. Andreta; G. Bartolucci; M. Cicolani; A. Frattini
Year: 2000
Iron borate in a microwave resonator: magnetic pumping of quasiphonons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V. Andrienko; V.L. Safonov
Year: 2000
Identification of parameters in multilaver media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Fry; O. Alejos; E. Cardelli
Year: 2000
Giant magneto-rapedance effect in multilayered FESiB/CU/FESiB films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinqiang Yu; Maolin Zhao; Bingchu Cai
Year: 2000
Seed layer effects on the magnetoresistive properties of NiFe films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Gong; D. Litvinov; T.J. Klemmer; D.N. Lambeth; J.K. Howard
Year: 2000
High sitional analysis of ultra-thin films in GMR sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rong-Tan Huang; Fu-Rong Chen; Ji-Jung Kai
Year: 2000
Modeling for the estimation of crystalline anisotropy field using asymmetric AMR curve in magnetic multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.S. Park; C.G. Kim; D.Y. Kim; C.M. Park
Year: 2000
Eva uation of a reverse-side defect on stainless steel plates by the residual magnetic field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Oka; M. Enokizono
Year: 2000
Pulsed magnetometer for low-temperature measurement on permanent magnet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Seiichi; K. Giyuu
Year: 2000
Measurement accuracy of a pulsed field magnetometer designed for rare earth based permanent magnets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min-Seok Song; Yoon-Bae Kim; Chang-Suk Kim; Taik-Kee Kim
Year: 2000
Measurement of extremeley low magnetic losses in ferromagnetic thin films at VHF-UHF frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yaping Zhou; A.P. Valanju; R.M. Walser
Year: 2000
Remote temperature sensing system using reverberated magnetic flux
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.H. Kim; K. Ishiyama; M. Inoue; K.I. Arai
Year: 2000
Motion capture system using magnetic marker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Yabukami; H. Kikuchi; M. Yamaguchi; K.I. Arai; K. Takahashi; A. Itagaki; N. Wako
Year: 2000
Investigate core loss of PM micro-motor made by MIM technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.C. Chau; C. Bi; X.P. Li
Year: 2000
Measurement of magnetostrictive tensor components using electronic speckle pattern interferometry (ESPI)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.L. Storch; A.D. Rollett; M.E. McHenry
Year: 2000
Benchtop magnetostriction measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.J. Garshelis; D.W. Cripe
Year: 2000
Electrostatic discharge testing of tunneling magnetoresistive (TMR) devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hillman; M. Sharma; S.X. Wang
Year: 2000
Evolution of barrier properties in magnetic tunnel junctions by annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Schmalhorst; A. Thomas; M. Justus; G. Reiss; H. Bruckl; M. Vieth; G. Gieres; J. Wecker
Year: 2000
Spin tunnelling junctions with Fe/sub 3/O/sub 4/ interface layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sharma; C. Fery; S.X. Wang; T.C. Anthony; J.H. Nickel
Year: 2000
Time domain analysis on magnetostatic waves by FDTD method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kodera; H. Shimasaki; M. Tsutsumi
Year: 2000
Development of spin-wave soliton-like trains parametric generation in YTTRIUM iron garnet films under parallel pumping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Benner; M.P. Kostylev; N.G. Kovshikov
Year: 2000
Self-generation of spin wave envelope black soliton trains in YYTRIUM iron garnet films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.A. Kalinikos; M.M. Scott; C.E. Patton
Year: 2000
Magnetostatic surface wave solitons induced by cross-phase modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Marcelli; S.A. Nikitov
Year: 2000
Turbo decoding for partial response channels using spinst and data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Souvignier; Z. Keirn
Year: 2000
Moving threshold detection for timing recovery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Younggyun Kim; Jaekyun Moon
Year: 2000
GMR and SDT sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Daughton
Year: 2000
The novel use of a memory layer in a giant magnetoresistive position sensor design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.T. Holliday; E.W. Hill
Year: 2000
Precision x-y robotic object handling a dual GMR bridge sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wanjun Ku; P.P. Freitas; P. Compadrinho; P. Alves; J. Barata
Year: 2000
A comparison of GMR multuayer and spin-valve sensors for vector field sensing.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.W. Hill
Year: 2000
Inverse giant magnetoresistance at room temperature in antiparallel biased spin-valves and application to bridge sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.E. Stanley; C.H. Marrows; B.J. Hickey
Year: 2000
Visualization of fatigue damage in magnetic materials using a high-resolution electromagnetic sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Chady; M. Enokizono; T. Todaka; Y. Tsuchida; R. Sikora
Year: 2000
Remotely interrogated temperature sensors based on magnetic materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Fletcher; N. Gershenfeld
Year: 2000
High density mo recording using solid immersion lens (SIL) with magnetic field modulation (MFM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sbiaa; E. Stavrou; A. Chekanov; M. Birukawa; Y. Itoh; T. Suzuki
Year: 2000
High-resolution readout from magneto-optical read only memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Birukawa; N. Miyatake; T. Suzuki
Year: 2000
Optimum design for a new 3D magneto-optical card information storage system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Huajun; Luo Yi; Wang Shifan
Year: 2000
Optical and magneto-optical properties of Co-Sm-O granular films for use in one-dmensional magnetophotonic crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yayoi; M. Osada; M. Inoue; T. Fujii; M. Abe; K.I. Arai
Year: 2000
Numerical analysis of faraday rotation and transmittance of one dimensional magnetrophotonic cyrstals with an active layer of a highly bi-substituted iron garnet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaehyuk Park; Jackyong Cho; M. Inoue
Year: 2000
Oxide glasses with ferrimagnetic nanoparticles for IR spectral region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Edelman; S. Stepanov; T. Zarubina; R. Ivantsov
Year: 2000
X-ray magnetic circular dichroism of Gd/Fe multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kato; Y. Fujiwara; K. Yano; S. Tsunashima; S. Iwata; M. Masuda
Year: 2000
Thermal stability evaluation of 0.03/spl mu/m MO domains in MAMMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Awano; S. Imai; M. Sekine; M. Tani; N. Ohta
Year: 2000
An edge finite element eddy current formulation using a reduced magnetic and a current vector potential
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Biro; K. Preis
Year: 2000
Influence of discretization model and evaluation method on torque prediction in switched reluctance motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Lin; Z.J. Liu; S.X. Chen; T.S. Low
Year: 2000
Effect of punching on electrical steels: experimental and numerical magneto-mechanical analyses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Ossart; E. Hug; O. Hubert; C. Buvat; R. Billardon
Year: 2000
Computation of the preisach distribution function based on a measured everett map
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. De Wulf; L. Dupre; L. Vandevelde; J. Melkebeek
Year: 2000
Giant magnetoresistive sensor in conductance control of switching regulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pelegri; D. Ramirez; E. Sanchis; A.E. Navarro; S. Casans
Year: 2000
A magnetic coupled simidle and high efricient battery management system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nishijima; H. Sakamoto; K. Harada
Year: 2000
HDD actuator resonance detection through acoustic signal analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weilu Wang; Guoxiao Guo; T.-C. Chong
Year: 2000
A new speed estmation scheme of the induction motor considering the flux saturation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung-Soo Choi; Young-Seok Kim
Year: 2000
An approach to a linear DC motor transfer and positioning system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kajioka; M. Watada; D. Ebihara
Year: 2000
Raman spectroscopy in oleoylsarcosine-coated magnetic fluids: A surface grafting investigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.C. Morais; S.W. da Silva; M.A.G. Soler; N. Buske
Year: 2000
Composition and heating efficiency of magnetic wood by induction heating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Oka; H. Fujita; K. Seki
Year: 2000
Overview of magnetic and magneto optical recording thermal instability of view
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Suzuki; R. Sbiaa; G. Lauhoff; M. Mochida
Year: 2000
20 nm domain expansion readout by magnetic amplifying MO system (MAMMOS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Awano; M. Sekine; M. Tani; N. Ohta; K. Mitani; N. Takagi; T. Noguchi; M. Kume
Year: 2000
Magnetic recording properties of magneto-optical media by merge type GMR head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Matsumoto; A. Chekanov; K. Ozaki; I. Tagawa; K. Shono
Year: 2000
A hybrid recording method using thermally assisted writing and flux sensitive detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.R. Cumpson; P. Hidding; R. Coehoorn
Year: 2000
Thin film characterization by acoustic emission monitoring of nanoindentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Daugela; J.T. Wyrobek
Year: 2000
Use of Ni/sub x/Si/sub y/ as an interlayer for wear and corrosion resistance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming M. Yang; D. Spaulding; J.L. Chao; M.A. Russak
Year: 2000
Effect of the additive X-IP on the tribological performance of PFPE lubricant at the head-disk interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.-Y. Chen; W. Fong; D.B. Bogy; T. Cheng; C.S. Bhatia
Year: 2000
Determination of the lubricant nligration rate from the hard disk surface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tai Cheng; B. Zhao; P. Lei; J. Chao
Year: 2000
Lube build-up and migration behavior on laser texture media after longterm parking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.D. Lin; J.S. Lin; W. Huang
Year: 2000
A valuation for clear stain and its behaver on helical scan tape system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Nagai; Y. Kamatani; M. Kondo; T. Ozue
Year: 2000
Successful suppression of magnetization precession after application of short field pulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bauer; R. Lopusnik; J. Fassbender; B. Hillebrands
Year: 2000
Selective writing of sub-/spl mu/m/sup 2/ domain in spin valve strip with current coincident schem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Matsuyama; N. Murashima; Y. Nozaki
Year: 2000
Temperature dependence of magnetic switching field distribution in magnetic tunnel junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.D. Schrag; S. Ingvarsson; Gang Xiao; R. Wanner; P. Trouilloud; Yu Lu; W.J. Gallagher; S.S.P. Parkin
Year: 2000
Switching properties of fast-pulse driven spin-valve devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kaka; S. Russek
Year: 2000
The magnettomecranical effect under torsional stress and the law of approach in a co ferrite composite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Chen; D.C. Jiles
Year: 2000
Biaxial stress effects on the magnetic properties of pure iron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pearson; P.T. Squire; M.G. Maylin; J.G. Gore
Year: 2000
Permeability measurement of ferrite under stress up to 6 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ledieu; A.L. Adenot; O. Acher
Year: 2000
The frequency and stress dependence of giant magneto-impedence in amorphous microwires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Mandal; S. Puerta; A. Hernando
Year: 2000
Anomalous thermally induced anisotropy in glass-covered amorphous microwires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.H.C.P. Sinnecker; M. Vazquez; L. Sampaio; M. Knobel
Year: 2000
On the use of the transverse biased initial susceptibility on the evaluation of the anisotropy constant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.R. Aranda; O.A. Chubykalo; J. Gonzalez; J.M. Gonzalez
Year: 2000
Giant field-induced reverseble linear strain in magnetic shape memory NiMnGa at room temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Heczko; A. Sozinov; K. Ullakko
Year: 2000
Pulsed field magnetic studies of MP dispersion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Blackwell; J. Hutchings; K. O'Grady
Year: 2000
An experimental investigation of the magnetization reversal in advanced metal particles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Bottoni; D. Candolfo; A. Cecchetti
Year: 2000
Comparison between deferent methods for evaluating the anisotropy field distribution in recording systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Bottoni; D. Candolfo; A. Cecchetti
Year: 2000
Switceng field versus pulse time: parameter study and experimental comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.L. Safonov
Year: 2000
Sidetrack erasure of stitched-pole magnetic recording heads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Guarisco; M. Li; H. Lin; C.H. Back; Y. Acremann
Year: 2000
Dependence of popcorn noise on write frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Zhang; R. Kemshetti; E. Salhi; D. Seagle; P. Rana
Year: 2000
High frequency recording head properties over 300 MHz for HDD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sugawara; S. Sasaki; S. Terada; A. Matsuzono; H. Ohmori; T. Sone; K. Fukumoto
Year: 2000
Residual stress optimization in FeAIN pole materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pei Zou; J.A. Bain
Year: 2000
Design of powder alignment system for anisotropic bonded NdFeB halbach cylinders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z.Q. Zhu; Z.P. Xia; K. Atallah; G.W. Jewell; D. Howe
Year: 2000
Design and analysis of a new permanent magnet brushless DC machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinyun Gan; K.T. Chau; J.Z. Jiang
Year: 2000
Hysteresis modelling of anisotropic barium-ferrite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Grossinger; H. Hauser; L. Stoleriu; P. Andrei
Year: 2000
Field rate measurement of time dependent magnetic phenomena
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong Sun; Wenjie Pang; R. Street
Year: 2000
Corrosion behaviours of sintered NdFeB permanent magnets produced from cast alloy ingot, atomized powder or strip cast alloy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X.C. Kou; R.K. Viswanadham
Year: 2000
Magnetic properties of NdFeB thin film obtained by diffusion annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mhan-joong Kim; Ying Li; Yoon-bae Kim; Kwon-sang Ryu; Chang-bin Song; Chong-oh Kim; Taik-kee Kim
Year: 2000
Magnetic properties and microstructure of NdFeB sintered magnets by the Ag powder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.B. Kim; W.Y. Jeung
Year: 2000
The effects of substituting iron for manganese in SmMn/sub 0/Ge/sub 6/: Magnetic and crystallographic properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Han; G.K. Marasinghe; W.J. James; W.B. Yelon; I. Dubenko; N. Ali
Year: 2000
Structural and magnetic properties of Sm/sub 2/Fe/sub 16/Mal/sub 2/ (M=Mn,Mo,Ni) and the effects of additional carbon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z.Y. Ren; D.H.L. Ng; S.-Y. Dai
Year: 2000
Cu addition in the YC/sub 05/ matrix: anisotropy field and ac-susceptibility between 4.2K and 900K
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sato Turtelli; E. Estevez-Rams
Year: 2000
Dipolar interactions in hard-soft nanocomposites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M. Gonzalez; V. Raposo; M.I. Montero; P. Crespo; p. Marin; A. Hernando
Year: 2000
Beyond 35 GBIT/IN/sup 2/: using a merged notched head on advanced thermally stable media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Madison; M. Pinarbasi; M. Parker; M. Doerner; X. Bian; C.K. Tang; S. Yuan; J. Li; L. Ingall; J. Raniseski; P. Fang; D. Margulies; K. Rubin; K. Takano; E. Fullerton; D. Weller; A. Moser; M.E. Best
Year: 2000
Experimental study of the off-track dependence of medium noise using mode projection method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhen Jin; Kezhao Zhang; G.H. Lin; H.N. Bertram
Year: 2000
Performance of turbo equalizer/turbo code detection for high density magnetic storage channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Lee; Jaejin Lee
Year: 2000
Partial response maximum likelihood detection for perpendicular recordfng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Oenning; Jaekyun Moon
Year: 2000
Essential physics of carrier transport in nanoscale MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lundstrom, M.; Zhibin Ren; Datta, S.
Year: 2000
First-principles-based predictive simulations of B diffusion and activation in ion implanted Si
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Theiss, S.K.; Caturla, M.-J.; Lenosky, T.J.; Sadigh, B.; Diaz de la Rubia, T.; Giles, M.D.; Foad, M.A.
Year: 2000
A fast three-dimensional MC simulator for tunneling diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wagner, M.; Mizuta, H.; Nakazato, K.
Year: 2000
Simulation of hot hole currents in ultra-thin silicon dioxides: the relationship between time to breakdown and hot hole currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ezaki, T.; Nakasato, H.; Yamamoto, T.; Hane, M.
Year: 2000
Coupled Monte Carlo simulation of Si and SiO/sub 2/ transport in MOS capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palestri, P.; Selmi, L.; Pavesi, M.; Widdershoven, F.; Sangiorgi, E.
Year: 2000
A Monte Carlo technique to investigate signal delays of advanced Si BJT's up to high currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palestri, P.; Selmi, L.; Hurkx, F.; Slotboom, J.
Year: 2000
Direct solution of the Boltzmann transport equation in nanoscale Si devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Banoo, K.; Lundstrom, M.; Smith, R.K.
Year: 2000
2-D quantum transport device modeling by self-consistent solution of the Wigner and Poisson equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiyi Han; Goldsman, N.; Chung-Kai Lin
Year: 2000
A multi-scale random-walk thermal-analysis methodology for complex IC-interconnect systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iverson, R.B.; Le Coz, Y.L.; Kleveland, B.; Wong, S.S.
Year: 2000
An extracting capacitance in a stacked DRAM cell by numerical method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sukin Yoon; Ohseb Kwon; Sangho Yoon; Taeyoung Won
Year: 2000
An exhaustive method for characterizing the interconnect capacitance considering the floating dummy-fills by employing an efficient field solving algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Kyu Park; Keun-Ho Lee; Joo-Hee Lee; Young-Kwan Park; Jeong-Taek Kong
Year: 2000
Di-interstitial diffusivity and migration path calculations based on tight-binding Hamiltonian molecular dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hane, M.; Ikezawa, T.; Gilmer, G.H.
Year: 2000
CHAMPS (chemical-mechanical planarization simulator)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoo-Hyon Kim; Kwang-Jae Yoo; Kyung-Hyun Kim; Bo-Yeon Yoon; Young-Kwan Park; Sang-Rok Ha; Jeong-Taek Kong
Year: 2000
Two-dimensional bandgap engineering in a novel Si-SiGe pMOSFET with enhanced device performance and scalability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ouyang, Q.; Chen, X.D.; Mudanai, S.; Kencke, D.L.; Wang, X.; Tasch, A.F.; Register, L.F.; Banerjee, S.K.
Year: 2000
Improved device technology evaluation and optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Connelly, D.; Foisy, M.
Year: 2000
Kinetics of boron activation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mokhberi, A.; Griffin, P.B.; Plummer, J.D.
Year: 2000
Nonlinear discretization scheme for the density-gradient equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ancona, M.G.; Biegel, B.A.
Year: 2000
Prediction of SiO/sub 2/ sputtering yield using molecular dynamics simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyusang Lee; Tai-Kyung Kim
Year: 2000
A physics-based empirical pseudopotential model for calculating band structures of simple and complex semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pennington, G.; Goldsman, N.; McGarrity, J.M.; Crowne, F.
Year: 2000
Monte Carlo simulation of current fluctuation at actual contact
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsuzawa, K.; Sano, N.; Natori, K.; Mukai, M.; Nakayama, N.
Year: 2000
Analysis of HBT behavior after strong electrothermal stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palankovski, V.; Selberherr, S.; Quay, R.; Schultheis, R.
Year: 2000
Optimizing free carrier absorption measurements for power devices by physically rigorous simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thalhammer, R.; Hille, F.; Wachutka, G.
Year: 2000
A new method to determine channel mobility model parameters in submicron MOSFET's using measured S-parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seonghearn Lee; Hyun Kyu Yu
Year: 2000
Extraction of the physical oxide thickness using the electrical characteristics of MOS capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eikyu, K.; Takashino, H.; Kidera, M.; Teramoto, A.; Umeda, H.; Ishikawa, K.; Kotani, N.; Inuishi, M.
Year: 2000
Simulation of multiple-bit soft errors induced by cosmic ray neutrons in DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tosaka, Y.; Satoh, S.
Year: 2000
Effective leadership of virtual project teams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thompsen, J.A.
Year: 2000
Improving SPC up to a one tolerance limit driven methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nenni, M.E.
Year: 2000
Benchmarking of technological innovation practices in Chinese enterprises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Jin; Xu Qingrui; Yong Hao; Qu Wenguang
Year: 2000
A model for management of technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Acosta, J.; Turrent, G.; Olin, M.; Gonzalez, R.
Year: 2000
Conducting successful new product field trials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Helm, J.W.; Holly, D.H.
Year: 2000
Strategies for adapting to technological change
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanderson, S.W.
Year: 2000
Fuzzy MCDM procedure for evaluating flexible manufacturing system alternatives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karsak, E.E.
Year: 2000
Organizing for innovation: focusing on the critical few R&D improvements that drive tangible results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mackey, W.
Year: 2000
Extending the balanced scorecard for technology strategy development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Durraui, T.S.; Forbes, S.M.; Carrie, A.S.
Year: 2000
Wavelet-based analysis of time series: an export from engineering to finance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Norsworthy, J.R.; Li, D.; Gorener, R.
Year: 2000
Innovation from a small company perspective-an empirical investigation of new product development strategies in SMEs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Filson, A.; Lewis, A.
Year: 2000
Value-based product development: refocusing lean
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Browning, T.R.
Year: 2000
Putting core competencies into market: core competence-based platform approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Qingrui; Wang Yi; Chen Jin; Shen Shouqin
Year: 2000
Managing technology in the top R&D spending companies worldwide-results of a global survey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reger, G.; Edler, J.; Meyer-Krahmer, F.
Year: 2000
A novel and ICT based information and workflow strategy for distributed and concurrent engineering processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pfeifer, T.; Reinecke, R.
Year: 2000
Assessment of technological capability on IT firms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Jin; Meng Fan; Xu Qingrui
Year: 2000
Implications of intelligent, integrated microsystems for product design and development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Myers, D.R.; McWhorter, P.J.; Converse, C.; Makal, L.
Year: 2000
Commercialization of distruptive technologies: the process of discontinuous innovations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hruby, J.; Kassicieh, S.K.; Walsh, S.T.
Year: 2000
A model for technology assessment and commercialization for innovative disruptive technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kassicieh, S.K.; Anderson, S.W.; Romig, A.; Cummings, J.; McWhorter, P.; Williams, D.
Year: 2000
Technological advance and productivity growth in the US Engineering and Scientific Instrument Industry: adjustment for unmeasured performance change in semiconductor inputs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fu, C.W.; Norsworthy, J.R.
Year: 2000
Accelerating technology transfer from federal laboratories to the private sector by increasing industrial R&D collaborations-a new business model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lombana, C.A.; Romig, A.D.; Linton, J.D.
Year: 2000
Biotechnology: industry of the 21st century. Implementing science and technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dorweiler, V.P.
Year: 2000
Fuzzy logic in management control: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nobre, F.S.M.; Nakasone, J.J.; Palhares, A.G.B.; Madrid, M.K.; Roy, R.
Year: 2000
Psychological concepts, public relations, and scientific responses to genetically modified organisms (GMOS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Supanutsetkul, N.; Caporael, L.
Year: 2000
Virtual reality? When visualization needs vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watts, T.P.; Swann, G.M.P.; Pearson, A.W.
Year: 2000
Roles and strategies of contract manufacturers in the telecommunications industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hadaya, P.; Lefebvre, E.; Leger, P.-M.
Year: 2000
A unified approach to technology management in new product development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thompson, J.S.
Year: 2000
Management for emergent properties in the research and development process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakahori, I.
Year: 2000
The relationship between R&D spending and shareholder returns in the computer industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mank, D.A.; Nystrom, H.E.
Year: 2000
The relationship of technology change management to risk management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mosier, S.P.; Guenterberg, S.A.; Raphael, R.R.
Year: 2000
Analysis of intangible factors in waste minimization projects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nystrom, H.; Kehr, W.
Year: 2000
Managing co-innovation: an effect way to reinforce competence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Qingrui; Wanyan Shaohua; Yang Huajun; Chen Jin
Year: 2000
Pre-emptive radical innovation: building inter-departmental common knowledge in a short product development cycle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hung-Bin Ding; Ravichandran, T.
Year: 2000
Rewards and retention of technical staff
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farris, G.F.
Year: 2000
The application of a systems engineering model to survey research methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wicker, D.B.
Year: 2000
Revolution of knowledge creating companies in Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamasaki, H.; Yamada, I.
Year: 2000
Two policies that will achieve engineering education reform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gover, J.; Huray, P.G.
Year: 2000
A national laboratory for reforming health care costs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gover, J.; Huray, P.G.
Year: 2000
The engineer's role in averting the pending health care cost crisis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gover, J.; Huray, P.G.
Year: 2000
Moore's law-is there more?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.H. Brown
Year: 2000
Highly accurate and precise measurement technique for effective exposure dose
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Izuha; T. Fujisawa; M. Asano; S. Inoue
Year: 2000
A novel procedure to evaluate design scalability based on device performance linked to photolithography data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karklin, L.; Balasinski, A.; Axelrad, V.
Year: 2000
High accurate optical proximity correction under the influences of lens aberration in 0.15 /spl mu/m logic process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Harazaki; Y. Hasegawa; Y. Shichijo; H. Tabuchi; K. Fujii
Year: 2000
Theoretical MEF calculation for periodic patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Terasawa; N. Hasegawa
Year: 2000
Sub-120 nm patterning in KrF lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seo-Min Kim; Sang-Jin Kim; Chang-Jin Bang; Young-Mog Ham; Bong-Ho Kim
Year: 2000
Microfabricated separator and manipulator of blood cells for health care devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ujiie; A. Yamazaki; M. Watanabe; T. Okuda; T. Ichiki; Y. Horiike
Year: 2000
Microtechnologies for nucleic acid analysis: from concept to commercialization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Northrup
Year: 2000
Microscopic demonstration of static- and dynamic-binding of Eco RI enzyme to extended DNA at a single-molecule level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kabata; W. Okada; M. Washizu
Year: 2000
Development of EUV reflectometer using a laser-plasma x-ray source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kondo; N. Kandaka; K. Sugisaki; T. Oshino; M. Shiraishi; W. Ishiyama; K. Murakami
Year: 2000
Simulation of multilayer defects in EUV masks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ito; T. Ogawa; K. Otaki; I. Nishiyama; S. Okazaki; T. Terasawa
Year: 2000
Hierarchical optical proximity correction on contact hole layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yamamoto; S. Kobayashi; T. Uno; T. Kotani; S. Tanaka; S. Inoue; S. Watanabe; H. Higurashi
Year: 2000
A new correction method for dry etch loading effect in photomask fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Won-Tai Ki; Seung-Hune Yang; Seong-Yong Moon; Seong-Woon Choi; Woo-Sung Han; Jung-Min Sohn
Year: 2000
A novel RET for random pattern formation utilizing attenuating non-phase-shift assist pattern
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Nakao; A. Tokui; K. Tsujita; I. Arimoto; W. Wakamiya
Year: 2000
Asymmetric properties of the aerial image in EUVL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Otaki; H. Oizumi; M. Ito; I. Nishiyama; S. Okazaki
Year: 2000
Sub-50-nm patterning in EUV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Oizumi; I. Nishiyama; H. Yamanashi; Ei Yano; S. Okazaki
Year: 2000
Deposition and characterization of Ta, TaN/sub x/, and Ta/sub 4/B films for NGL mask application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seung Yoon Lee; Chang Mo Park; Jinho Ahn
Year: 2000
A new cleaning technique for x-ray masks in alkaline solutions by control of surface potential
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tuda, M.; Kinugawa, M.; Ootera, H.; Marumoto, K.
Year: 2000
CD controllability of chemically amplified resists for x-ray membrane mask fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ezaki; Y. Kikuchi; S. Tsuboi; H. Watanabe; H. Aoyama; Y. Nakayama; S. Ohki; T. Morosawa; T. Matsuda
Year: 2000
Mask error factor in proximity X-ray lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujii, K.; Suzuki, K.; Matsui, Y.
Year: 2000
Capability of 70 nm pattern replication in x-ray lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kikuchi, Y.; Hasegawa, M.; Iwamoto, T.; Fujii, K.; Matsui, Y.
Year: 2000
Patterning yield of sub-100-nm holes limited by fluctuation of exposure and development reactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Deguchi; Y. Kawai; H. Kochiya; Y. Ushiyama; M. Oda
Year: 2000
Evaluation of the effective image blurring factors in the synchrotron proximity X-ray lithography simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongduck Seo; Ohyun Kim
Year: 2000
Dose uniformity of a compact beamline in routine operation with a storage ring "AURORA-2S"
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hirose; D. Amano; T. Miyatake; Xan Li; T. Hori
Year: 2000
Development of elemental technologies for fabricating the health care chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oki, A.; Adachi, S.; Takamura, Y.; Ishihara, K.; Ogawa, H.; Ichiki, T.; Horiike, Y.
Year: 2000
Analysis of heavy-metal-ions using mercury microelectrodes and a solid-state reference electrode fabricated on a Si wafer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwang-Seok Yun; Hong-Jeong Kim; Segyeong Joo; Juhyoun Kwak; Euisik Yoon
Year: 2000
Fabrication of a bump-type Si probe card
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-Seok Lee; Jeong-Yong Park; Dong-Kwon Kim; Jong-Hyun Lee
Year: 2000
Young's modulus evaluation of Si thin film fabricated by compatible process with Si MEMSs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Hirai; Y. Marushima; K. Nishikawa; Y. Tanaka
Year: 2000
Formation of micro eaves analyzed by energy balance model at threefold of Cu film/DFR/Ni plating solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, H.; Nakamura, T.; Kawakami, Y.; Kawai, A.
Year: 2000
Generation and relaxation of free volume during the post exposure bake
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stewart, M.D.; Burns, S.D.; Schmid, G.M.; Willson, C.G.
Year: 2000
Formation of sub-100 nm contact hole patterns using a novel resist material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang-Jun Choi; Yool Kang; Jeong-Hee Chung; Sang-Gyun Woo; Joo-Tae Moon
Year: 2000
Progress of top surface imaging process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Satou, I.; Watanabe, H.; Watanabe, M.; Itani, T.
Year: 2000
Approach of various polymers to 157 nm single-layer resists
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kishimura, S.; Sasago, M.; Shirai, M.; Tsunooka, M.
Year: 2000
Feasibility of new ARC using PECVD for both KrF and ArF lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongbeom Kim; Junghyeon Lee; Hanku Cho; Jootae Moon
Year: 2000
Sub-100 nm device fabrication using proximity X-ray lithography at five levels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Iba; T. Taguchi; F. Kumasaka; T. Iizuka; Y. Sanbonsugi; K. Deguchi; H. Aoyama; M. Fukuda; M. Oda; H. Morita; T. Matsuda; K. Horiuchi; Y. Matsui
Year: 2000
EB stepper. A high throughput E-beam projection lithography system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yamaguchi
Year: 2000
Electron scattering and related phenomena in SCALPEL/sup TM/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Mkrtchyan
Year: 2000
Critical dimension issues for 200 mm electron projection masks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.J. Resnick; K. Nordquist; W.J. Dauksher; E. Ainley; B. Lu; P. Mangat; E. Weisbrod; C. Martin; A. Wei; R. Englestad; E. Lovell; V. Ivin
Year: 2000
Contrast evaluation of SCALPEL GHOST method in 100 kV electron projection lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koba, F.; Yamashita, H.; Nomura, E.; Nakajima, K.; Nozue, H.
Year: 2000
Design and fabrication of magnetically driven micromirror with large angular deflection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang Hyeon Ji; Yong-Kweon Kim
Year: 2000
Simulation of electron and ion beam optics for high throughput lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X. Zhu; H. Liu; E. Munro; J. Rouse
Year: 2000
Simulation of Coulomb interactions in electron projection lithography using scattering contrast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yamashita; E. Munro; J. Rouse; H. Kobinata; K. Nakajima; H. Nozue
Year: 2000
Direct measurement of electron transmission properties of mask membranes for electron projection lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Nomura; H. Yamashita; Y. Ochiai; T. Baba
Year: 2000
Influence of electron density distribution at the electron source in a projection exposure system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kotera; M. Sakai; I. Shimizu; Y. Tomo; A. Yoshida; Y. Kojima; M. Yamabe
Year: 2000
Highly integrated cantilever with light emitting diode, channel waveguide, aperture, and photodiode for scanning near-field optical microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sasaki; K. Tanaka; K. Hane
Year: 2000
Solid polymer dye microlaser fabricated using Si mold having optically smooth surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sasaki; Y. Akatu; I. Li; K. Hane
Year: 2000
Micromachining of optical fiber using reactive ion etching and its application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kumazaki; Y. Yamada; T. Oshima; S. Inaba; K. Hane
Year: 2000
Automatic dose optimization system for resist cross-sectional profile in a electron beam lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Hirai; H. Kikuta; M. Okano; T. Yotsuya; K. Yamamoto
Year: 2000
Intralevel mix and match lithography for sub-100 nm CMOS devices using the JBX-9300FS point-electron-beam system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Narihiro; H. Wakabayashi; M. Ueki; K. Arai; T. Ogura; Y. Ochiai; T. Mogami
Year: 2000
An improved electron scattering simulation at the mask in a projection lithography system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Ishida; K. Naruse; M. Kotera; I. Shimizu; Y. Tomo; A. Yoshida; Y. Kojima; M. Yamabe
Year: 2000
A 100-kV, 100-A/cm/sup 2/ electron optical system for the EB-X3 X-ray mask writer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Saito; J. Kato; T. Matsuda; Y. Nakayama
Year: 2000
Proposal of atom lithography for silicon quantum dots
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Asakawa; H. Kumagai; M. Obara
Year: 2000
Lifetime and spin relaxation time measurements of micro-fabricated GaAs tips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Shinohara; K. Yamaguchi; H. Hirota; Y. Suzuki; T. Manago; H. Akinaga; T. Kuroda; F. Minami
Year: 2000
Dependence of buffer layer on the distribution of InAs quantum dots
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyo Jin Kim; Byung Don Min; Young Ju Park; Chan Kyung Hyon; Se Ki Park; Eun Kyu Kim; Tae Whan Kim
Year: 2000
A large-scaled 2D array of alkanethiol-encapsulated gold particles fabricated using Langmuir-Blodgett technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Huang; G. Tsutsui; H. Sakaue; S. Shingubara; T. Takahagi
Year: 2000
10 nm size fabrication of semiconductor substrates and metal thin lines by conventional photolithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hashioka; H. Matsumura
Year: 2000
Compact imprint system using driving power of stepping motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Igaku; S. Matsui; H. Ishigaki; H. Hiroshima; M. Komuro; S. Yamanaka; T. Nagamura
Year: 2000
AFM lithography combined with optical lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ishibashi; S. Heike; T. Hashizume
Year: 2000
Direct nanolithography of organic polysilane films using carbon nanotube tips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Okazaki; T. Kishida; S. Akita; H. Nishijima; Y. Nakayama
Year: 2000
Polarization dependence of photoinduced birefringence in chalcogenide thin film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun-Joo Jang; Cheol-Ho Yeo; Jeong-Il Park; Hyun-Young Lee; Hong-Bay Chung
Year: 2000
Typical electron beam doping (superdiffusion) of impurity atoms in damage-free regions of semiconductors by the kick-out mechanism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Wada; H. Fujimoto; S. Asada
Year: 2000
RF-plasma assisted fast atom beam etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ono, T.; Simizu, T.; Orimoto, N.; Lee, S.; Masayoshi, E.
Year: 2000
Relative domination between Cl/sup +/ and Cl2/sup +/ ions in time-modulated inductively coupled Cl2 plasma investigated with laser-induced fluorescence technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumagai, S.; Sasaki, M.; Koyanagi, M.; Hane, K.
Year: 2000
Remote-plasma-enhanced etching of silicon using trifluoro-acetyl-fluoride gas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Saito; H. Yamazaki; I. Mouri
Year: 2000
In situ monitoring of hydrogen etching of Si surfaces by infrared reflection absorption spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Noda; T. Urisu; Y. Kobayashi; T. Ogino
Year: 2000
Etching characteristics of fine Ta patterns with electron cyclotron resonance chlorine plasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang Hoon Kim; Sang-Gyun Woo; Jinho Ahn
Year: 2000
Collapse behavior of KrF resist line pattern analyzed with atomic force microscope tip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kawai
Year: 2000
Quantum dots in carbon nanotubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ishibashi; M. Suzuki; T. Ida; K. Tsukagoshi; Y. Aoyagi
Year: 2000
Nanoindentation of polycarbonate using carbon nanotube tip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akita, S.; Nishijima, H.; Kishida, T.; Nakayama, Y.
Year: 2000
Imprint lithography using triple-layer-resist and its application to MOSFET fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Nakamura; A. Baba; T. Asano
Year: 2000
Growth dynamics of single-wall carbon nanotubes synthesized by laser ablation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Kokai; M. Yudasaka; S. Iijima
Year: 2000
Si barrier metal grown by hybrid radical beam pulsed laser deposition of TiN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Obata, K.; Sugioka, K.; Toyoda, K.; Takai, H.; Midorikawa, K.
Year: 2000
Probing semiconductor nano-structures with synchrotron radiation and STM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Hamilton
Year: 2000
Fabrication and characterization of periodic nano-faceting structures on patterned vicinal [110] GaAs substrates by MOVPE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Harada; Y. Oda; J. Motohisa; T. Fukui
Year: 2000
Scanning Capacitance Microscopy for measuring device carrier profiles beyond the 100 nm generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Kopanski; J.F. Marchiando; B.G. Rennex
Year: 2000
Dynamic three-dimensional mask-wafer positioning with nanometer exposure overlay accuracy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.E. Moon; P.N. Everett; M.W. Meinhold; H.I. Smith
Year: 2000
Sub-10 nm linewidth and overlay performance achieved with a fine-tuned EBPG-5000 TFE electron beam lithography system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.E. Maile; W. Henschel; H. Kurz; B. Rienks; R. Polman; P. Kaars
Year: 2000
Inspection of critical dimension- and transmission uniformity of contact patterns by DUV imaging and regression algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yamashita; S. Yamaguchi
Year: 2000
Growth of new fluoride single crystals for optical applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fukuda; K. Shimamura; N. Sarukura
Year: 2000
Status of EUV lithography and plans in USA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Gwyn
Year: 2000
Recent activities in the development of EUV lithography at ASET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Okazaki
Year: 2000
Optics for EUV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Kurz; H.-J. Mann; M. Antoni; W. Singer; M. Muhlbeyer; F. Melzer; U. Dinger; M. Weiser; S. Stacklies; G. Seitz; F. Haidl; E. Sohmen; W. Kaiser
Year: 2000
An in-situ time-resolved infrared spectroscopic study of silicon dioxide (SiO/sub 2/) surface during selective etching over silicon in fluorocarbon plasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sekine
Year: 2000
Damage-free flattening technology of large diameter Si wafer employing numerically controlled local SF6/H2 downstream plasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanagisawa, M.; Ogawa, H.; Horiike, Y.
Year: 2000
Control of crystalline structure and ferroelectric properties of Pb(ZrxTi/sub 1-X/)O3 films by pulsed laser deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujita, H.; Goto, S.; Agata, S.; Sakashita, M.; Sakai, A.; Zaima, S.; Yasuda, Y.
Year: 2000
Current status of EUV optics and future advancements in optical components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Sweeney
Year: 2000
Experimental results obtained by EUV laboratory tool at NewSUBARU
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kinoshita; T. Watanabe
Year: 2000
Study of a cavity-confined plasma as a debris-less and high conversion efficiency source for EUV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomie, T.; Aota, T.; Kurashima, Y.; Kandaka, N.; Yashiro, H.; Nishigori, K.; Matsushima, I.; Komuro, M.
Year: 2000
Low-stress molybdenum/silicon multilayer coatings for extreme ultraviolet lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiraishi, M.; Ishiyama, W.; Oshino, T.; Murakami, K.
Year: 2000
Contrast measurement of reflection mask with Cr and Ta absorber for Extreme Ultraviolet Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niibe, M.; Watanabe, T.; Nii, H.; Tanaka, T.; Kinoshita, H.
Year: 2000
Chemically amplified electron beam positive resist with acetal protecting group-effect of the additives on resist properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saito, S.; Kihara, N.; Ushirogouchi, T.
Year: 2000
Application of organic silicon cluster to patter transfer process for deep UV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Sato; E. Shiobara; J. Abe; Y. Onishi; Y. Nakano; S. Hayase
Year: 2000
Stabilization of motions of multi-pendulum systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miroshnik, I.; Bobtsov, A.
Year: 2000
A formal background for basic type autowaves formation by a cellular neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Selikhov, A.V.
Year: 2000
Small islands of stability in the chaotic sea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lazutkin, V.F.; Petrova, N.V.; Svanidze, N.V.
Year: 2000
On one property of duality in the algebra of first integrals for mechanical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Irtegov, V.D.
Year: 2000
Model of physical hysteresis and control of the image motion oscillations at a large space telescope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Somov, Y.I.
Year: 2000
Multispiral chaos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aziz-Alaoui, M.A.
Year: 2000
Images from chaos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subias Izquierdo, J.L.; Paricio Sanchez, J.M.
Year: 2000
A generalized self-consistent method for determining effective dynamic elastic and diffraction properties of composites with random structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pan'kov, A.A.
Year: 2000
Learning-oriented simulations and applications of self-organization principle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Lei; Ren Shouju; Wang Wei
Year: 2000
Control of 1-D and 2-D coupled map lattices through reinforcement learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gadaleta, S.; Dangelmayr, G.
Year: 2000
On reconstruction of disturbances in a system with hereditary
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blizorukova, M.S.
Year: 2000
Correlation analysis of the piecewise-linear system oscillation at the nonstationary narrow-band excitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bouraou, N.I.; Marchuk, P.I.
Year: 2000
Adaptive robust damping of divergent oscillations in updatable inertial systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chernodarov, A.V.
Year: 2000
Two-dimensional ergodic maps: new examples
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goloubentsev, A.F.; Anikin, V.M.; Noyanova, S.A.
Year: 2000
Stochastic approximation with exciting perturbation under dependent noises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Granichin, O.
Year: 2000
Study of homoclinic transversal intersections for the double mathematical pendulum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ivanov, A.V.
Year: 2000
Refined method of electric long lumped-parameters lines calculation on the basis of exact analytical solutions for mechanical elastic lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karavashkin, S.B.
Year: 2000
Controlling monostability in a bistable system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pisarchik, A.N.
Year: 2000
Design of digital controller with prescribed rejection of unknown harmonic disturbances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shatalov, B.V.; Yurkevich, V.D.
Year: 2000
Adaptive control on manifolds of nonlinear control plants with complex and oscillation dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Terekhov, V.A.; Tyukin, I.Y.
Year: 2000
On-off intermittency near the threshold of mode-locking in Nd:YAG laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Volodchenko, K.V.; Ivanov, V.N.; Dae-Sik Lee; Chil-Min Kim
Year: 2000
Maximum reaction spectra of oscillators and shock resistance of complex structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zaborova, N.V.
Year: 2000
Linear dynamically varying linear quadratic control of systems with complicated dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bohacek, S.; Jonckheere, E.
Year: 2000
A control problem for a particle of unknown mass subject to disturbance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ananievski, I.M.
Year: 2000
Robust stability and control of complex stochastic systems with jumps of state vector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pakshin, P.V.; Pakshina, N.A.
Year: 2000
Lyapunov-Bautin bifurcation and the hunting of a railway wheelset
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Inozemtsev, V.G.; Tibilov, T.A.
Year: 2000
Bifurcational phenomena in a nonideal system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belato, D.; Weber, H.I.; Balthazar, J.M.; Rosario, J.M.
Year: 2000
Hopf bifurcation in discrete-time systems via a frequency domain approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D'Amico, M.B.; Moiola, J.L.; Paolini, E.E.
Year: 2000
Limit behavior of attainable sets of a singular perturbed linear autonomous control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Figurina, T.Yu.; Ovseevich, A.I.
Year: 2000
Information viewpoint on chaotic synchronization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dmitriev, A.S.; Kassian, G.A.; Khilinsky, A.D.
Year: 2000
Coherent structures in dynamical systems described by hyperbolic equation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramian, A.K.; Vakulenko, S.A.
Year: 2000
Analysis of regularization of dynamics in a circular chain of bistable chaotic elements with variable number of couplings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuznetsov, A.S.; Shalfeev, V.D.
Year: 2000
Reconstruction of the right-hand side in equation describing size structured population models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rozenberg, V.L.
Year: 2000
A phase constraints tuning approach for complex object identification under uncertainty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pilishkin, V.N.; Tollet, I.
Year: 2000
Recovering parameters of chaotic piecewise linear dynamical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aziz-Alaoui, M.A.; Lozi, R.; Fedorenko, A.D.; Sharkovsky, A.N.
Year: 2000
A problem of on-line continuous-time estimation of parameters of polyharmonic function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bobtsov, A.A.; Lyamin, A.V.
Year: 2000
Frequency analysis of linear periodical systems. Theory and experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Volovodov, S.; Lampe, B.; Rozenvasser, Y.; Smolnikov, A.
Year: 2000
Controlling chaotic systems with disturbance using backstepping design and nonlinear damping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mascolo, S.; Grassi, G.
Year: 2000
Stabilization of quasiperiodic output in a Q-switched Nd:YAG laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chil-Min Kim; Dong-Uk Hwang; Young-Jai Park
Year: 2000
Discrete adaptive control of a chaotic system under disturbances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guzenko, P.Y.
Year: 2000
Interspike and interburst intervals: nonlinear dynamics approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pavlov, A.N.; Silantyeva, E.V.; Sof'yina, E.S.; Anishchenko, V.S.
Year: 2000
Neurodynamical route to chaos and normal speech vs. stuttering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Skljarov, O.P.
Year: 2000
Suppressing arrhythmias in cardiac models with overdrive pacing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osipov, G.V.; Stamp, A.T.; Collins, J.J.
Year: 2000
Synchronization of non-identical chaotic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarasola, C.; Torrealdea, F.J.; d'Anjou, A.; Grana, M.
Year: 2000
Phase synchronization in coupled Nd:YAG lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ivanov, V.N.; Volodchenko, K.V.; Sung-Huan Gong; Muhan Choi; Young-Jai Park; Chil-Min Kim
Year: 2000
Chaos synchronization destruction in symmetrically coupled chaotic oscillators with period-doubling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Astakhov, V.; Shabunin, A.; Anishchenko, V.
Year: 2000
New developments in the dynamics of constrained systems and applications to tracking control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Udwadia, F.E.
Year: 2000
Generator dynamics in a snapshot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pinceti, P.; Lagasio, M.
Year: 2000
Vortex structures in a thin oscillating liquid layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ezersky, A.B.; Kiyashko, S.V.; Nazarovsky, A.V.
Year: 2000
Oscillations and chaos in the model of the Pacific salmon's number dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frisman, E.Y.; Last, E.V.
Year: 2000
Oscillations and chaos in population dynamics caused by hunting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frisman, E.Y.; Sycheva, E.V.
Year: 2000
A RKHS approach to the optimal modeling, identification, and design of nonlinear adaptive systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2000
Stirrer efficiency in FOA reverberation chambers. Evaluation of correlation coefficients and chi-squared tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lunden, O.; Backstrom, M.
Year: 2000
Reverberation chamber verification procedures, or, how to check if your chamber ain't broke and suggestions on now to fix it if it is
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ladbury, J.M.; Goldsmith, K.
Year: 2000
Total-radiated-power-based OATS-equivalent emissions testing in reverberation chambers and GTEM cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harrington, T.E.
Year: 2000
Effect of antenna aperture, EUT and stirrer step size on measurements in mode-stirred reverberation chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnaut, L.R.; West, P.D.
Year: 2000
Improved triaxial set-ups for the measurement of complex transfer impedances and admittances of shielded multiconductor cables inside cable bundles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung, L.; Luiken ter Haseborg, J.
Year: 2000
An efficient digital controller for active shielding circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonini, G.; Cristina, S.
Year: 2000
EM analysis and numerical characterization of gaskets: applying a sub-domains decomposition technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ridel, M.; Gobin, V.; Issac, F.; Tabbara, W.
Year: 2000
Common mode impedance model of power electronic equipment to evaluate noise reduction effect of a line noise filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanda, M.; Oka, N.; Nitta, S.
Year: 2000
Evaluation of multiconductor transmission line interconnects with frequency dependent loss using reduced order modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, W.T.; Nguyen, T.V.
Year: 2000
Experimental characterization of switching noise and signal integrity in deep submicron integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Steinecke, T.
Year: 2000
Ground starvation effects on multi-layer PCBs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O'Sullivan, C.; Lee, N.
Year: 2000
Characterization of an EMC test-chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Wershoven, L.
Year: 2000
Constructing the Lagrangian of VLSI devices from near field measurements of the electric and magnetic fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Slattery, K.P.; Muccioli, J.P.; North, T.M.
Year: 2000
The correlation between common mode currents and radiated emissions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaires, R.G.
Year: 2000
A genetic algorithm based method for predicting far-field radiated emissions from near-field measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Regue, J.-R.; Ribo, M.; Garrell, J.-M.; Sorroche, S.; Ayuso, J.
Year: 2000
Assessment of H-field levels inside a DC railway substation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amendolara, A.; Laurenti, G.; Mariscotti, A.; Pozzobon, P.
Year: 2000
Combined effects of several, simultaneous, EMI couplings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mardiguian, M.
Year: 2000


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