Demonstrating a tunneling MR head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Song; J. Nowak; R. Larson; P. Kolbo; R. Chellew
Year: 2000
Spin valve device with sub-half micron core width fabricated by reactive etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Iijima; H. Kishi; A. Tanaka; C. Kamata; S. Eguchi
Year: 2000
Design and fabrication for sub half micron core width spin valve read head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Tanaka; H. Kishi; Y. Shimizu; R. Kondo; K. Nagasaka; M. Iijima; J. Ikeda; C. Kamata; S. Eguchi; M. Oshiki
Year: 2000
Enhancement of gmr properties of bottom type spin valve films with ultra-thin free layer covered with specular oxide capping layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Shimizu; S. Eguchi; A. Tanaka
Year: 2000
Enhanced gmr in PtMn based spin-valves with specular reflective thin oxide layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Sakakima; M. Satomi; Y. Sugita; Y. Kawawake; H. Adachi
Year: 2000
RuRhMn and PtMn specular spin valve with magnetic oxide layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Tsuchiya; M. Sano; S. Araki; H. Morita; M. Matsuzaki
Year: 2000
Comparison of friction measurement between load/unload ramp and suspension lift tabs using strain gauge and actuator current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Suk; D. Gillis
Year: 2000
The on drive electronic toroue meter: a self contained non-destructive & non-invasive method of monitoring head disk interface condition in hard disk drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Higgins
Year: 2000
Laser processing to adjust the suspension preload of magnetic recording head stack assemblies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.P. Singh; B.R. Brown; W. Kozlovsky
Year: 2000
High accuracy flying height measurements at the trailing edge of magnetic recording sliders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.A. Duran; Rui-Fang Shi; K.H. Womack
Year: 2000
Absolute calebration of scatir with comparison to measurements of fly height on the DFHT II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Walker; P.J. Sides
Year: 2000
Pole tip recession measurements with high accuracy and precision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V. Kulkami; S.K. Chilamakuri; B.K. Gupta; A.K. Menon
Year: 2000
A systematic study of head-disc dynamics wrfh laser pattern simulated disc microwaviness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Yao; D. Kuo; Jing Gui
Year: 2000
Magnetic switching and anisotropy in nanomagnets: the influence of size and shape
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Welland
Year: 2000
Multipole imaging of an elongated magnetic source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V. Kildishev; J.A. Nyenhuis
Year: 2000
Methods for predicting rotational iron losses fn three phase indumon motor stators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Stranges; R.D. Findlay
Year: 2000
Grain oriented silicon steel modeling: finite element implementation of the coenergy model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Buvat; F. Ossart
Year: 2000
Application of bi-directional thin-film micro wire array to RF integrated spiral inductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Yamaguchi; M. Baba; K.I. Arai; Y. Shimada; K. Ito
Year: 2000
Micro DC/DC converter that integrates planar inductor on power IC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Nakazawa; M. Edo; Y. Katayama; M. Gekinozu; S. Sugahara; Z. Hayashi; K. Kuroki; K. Matsuzaki
Year: 2000
Atomic migration and superexchange interaction in Cu/sub 0.9/Ni/sub 0.1/Fe/sub 2/O/sub 4/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sam Jin Kim; Seung Wha Lee; Chul Sung Kim
Year: 2000
The temperature dependence of power loss for MN-ZN ferrites at high frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.H. Han; B.M. Song
Year: 2000
Die mechanisms affecting the forming of super-large ferrite cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Matsuo; K. Ono; M. Kondoh; F. Nakao
Year: 2000
Non-uniform internal field in planar ferrite elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Pardavi-Horvath; Jijin Yan; J.R. Peverley
Year: 2000
A magnetostatic wave oscillator for data relay aatellite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Marcelli; E. Andreta; G. Bartolucci; M. Cicolani; A. Frattini
Year: 2000
Iron borate in a microwave resonator: magnetic pumping of quasiphonons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.V. Andrienko; V.L. Safonov
Year: 2000
Identification of parameters in multilaver media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Fry; O. Alejos; E. Cardelli
Year: 2000
Giant magneto-rapedance effect in multilayered FESiB/CU/FESiB films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinqiang Yu; Maolin Zhao; Bingchu Cai
Year: 2000
Seed layer effects on the magnetoresistive properties of NiFe films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Gong; D. Litvinov; T.J. Klemmer; D.N. Lambeth; J.K. Howard
Year: 2000
High sitional analysis of ultra-thin films in GMR sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rong-Tan Huang; Fu-Rong Chen; Ji-Jung Kai
Year: 2000
Modeling for the estimation of crystalline anisotropy field using asymmetric AMR curve in magnetic multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.S. Park; C.G. Kim; D.Y. Kim; C.M. Park
Year: 2000
Eva uation of a reverse-side defect on stainless steel plates by the residual magnetic field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Oka; M. Enokizono
Year: 2000
Pulsed magnetometer for low-temperature measurement on permanent magnet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Seiichi; K. Giyuu
Year: 2000
Measurement accuracy of a pulsed field magnetometer designed for rare earth based permanent magnets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min-Seok Song; Yoon-Bae Kim; Chang-Suk Kim; Taik-Kee Kim
Year: 2000
Measurement of extremeley low magnetic losses in ferromagnetic thin films at VHF-UHF frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yaping Zhou; A.P. Valanju; R.M. Walser
Year: 2000
Remote temperature sensing system using reverberated magnetic flux
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.H. Kim; K. Ishiyama; M. Inoue; K.I. Arai
Year: 2000
Motion capture system using magnetic marker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Yabukami; H. Kikuchi; M. Yamaguchi; K.I. Arai; K. Takahashi; A. Itagaki; N. Wako
Year: 2000
Investigate core loss of PM micro-motor made by MIM technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.C. Chau; C. Bi; X.P. Li
Year: 2000
Measurement of magnetostrictive tensor components using electronic speckle pattern interferometry (ESPI)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.L. Storch; A.D. Rollett; M.E. McHenry
Year: 2000
Benchtop magnetostriction measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.J. Garshelis; D.W. Cripe
Year: 2000
Electrostatic discharge testing of tunneling magnetoresistive (TMR) devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hillman; M. Sharma; S.X. Wang
Year: 2000
Evolution of barrier properties in magnetic tunnel junctions by annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Schmalhorst; A. Thomas; M. Justus; G. Reiss; H. Bruckl; M. Vieth; G. Gieres; J. Wecker
Year: 2000
Spin tunnelling junctions with Fe/sub 3/O/sub 4/ interface layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sharma; C. Fery; S.X. Wang; T.C. Anthony; J.H. Nickel
Year: 2000
Time domain analysis on magnetostatic waves by FDTD method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kodera; H. Shimasaki; M. Tsutsumi
Year: 2000
Development of spin-wave soliton-like trains parametric generation in YTTRIUM iron garnet films under parallel pumping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Benner; M.P. Kostylev; N.G. Kovshikov
Year: 2000
Self-generation of spin wave envelope black soliton trains in YYTRIUM iron garnet films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.A. Kalinikos; M.M. Scott; C.E. Patton
Year: 2000
Magnetostatic surface wave solitons induced by cross-phase modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Marcelli; S.A. Nikitov
Year: 2000
Turbo decoding for partial response channels using spinst and data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Souvignier; Z. Keirn
Year: 2000
Moving threshold detection for timing recovery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Younggyun Kim; Jaekyun Moon
Year: 2000
GMR and SDT sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Daughton
Year: 2000
The novel use of a memory layer in a giant magnetoresistive position sensor design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.T. Holliday; E.W. Hill
Year: 2000
Precision x-y robotic object handling a dual GMR bridge sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wanjun Ku; P.P. Freitas; P. Compadrinho; P. Alves; J. Barata
Year: 2000
A comparison of GMR multuayer and spin-valve sensors for vector field sensing.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.W. Hill
Year: 2000
Inverse giant magnetoresistance at room temperature in antiparallel biased spin-valves and application to bridge sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.E. Stanley; C.H. Marrows; B.J. Hickey
Year: 2000
Visualization of fatigue damage in magnetic materials using a high-resolution electromagnetic sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Chady; M. Enokizono; T. Todaka; Y. Tsuchida; R. Sikora
Year: 2000
Remotely interrogated temperature sensors based on magnetic materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Fletcher; N. Gershenfeld
Year: 2000
High density mo recording using solid immersion lens (SIL) with magnetic field modulation (MFM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sbiaa; E. Stavrou; A. Chekanov; M. Birukawa; Y. Itoh; T. Suzuki
Year: 2000
High-resolution readout from magneto-optical read only memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Birukawa; N. Miyatake; T. Suzuki
Year: 2000
Optimum design for a new 3D magneto-optical card information storage system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Huajun; Luo Yi; Wang Shifan
Year: 2000
Optical and magneto-optical properties of Co-Sm-O granular films for use in one-dmensional magnetophotonic crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yayoi; M. Osada; M. Inoue; T. Fujii; M. Abe; K.I. Arai
Year: 2000
Numerical analysis of faraday rotation and transmittance of one dimensional magnetrophotonic cyrstals with an active layer of a highly bi-substituted iron garnet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaehyuk Park; Jackyong Cho; M. Inoue
Year: 2000
Oxide glasses with ferrimagnetic nanoparticles for IR spectral region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Edelman; S. Stepanov; T. Zarubina; R. Ivantsov
Year: 2000
X-ray magnetic circular dichroism of Gd/Fe multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kato; Y. Fujiwara; K. Yano; S. Tsunashima; S. Iwata; M. Masuda
Year: 2000
Thermal stability evaluation of 0.03/spl mu/m MO domains in MAMMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Awano; S. Imai; M. Sekine; M. Tani; N. Ohta
Year: 2000
An edge finite element eddy current formulation using a reduced magnetic and a current vector potential
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Biro; K. Preis
Year: 2000
Influence of discretization model and evaluation method on torque prediction in switched reluctance motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Lin; Z.J. Liu; S.X. Chen; T.S. Low
Year: 2000
Effect of punching on electrical steels: experimental and numerical magneto-mechanical analyses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Ossart; E. Hug; O. Hubert; C. Buvat; R. Billardon
Year: 2000
Computation of the preisach distribution function based on a measured everett map
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. De Wulf; L. Dupre; L. Vandevelde; J. Melkebeek
Year: 2000
Giant magnetoresistive sensor in conductance control of switching regulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pelegri; D. Ramirez; E. Sanchis; A.E. Navarro; S. Casans
Year: 2000
A magnetic coupled simidle and high efricient battery management system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nishijima; H. Sakamoto; K. Harada
Year: 2000
HDD actuator resonance detection through acoustic signal analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weilu Wang; Guoxiao Guo; T.-C. Chong
Year: 2000
A new speed estmation scheme of the induction motor considering the flux saturation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung-Soo Choi; Young-Seok Kim
Year: 2000
An approach to a linear DC motor transfer and positioning system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kajioka; M. Watada; D. Ebihara
Year: 2000
Raman spectroscopy in oleoylsarcosine-coated magnetic fluids: A surface grafting investigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.C. Morais; S.W. da Silva; M.A.G. Soler; N. Buske
Year: 2000
Composition and heating efficiency of magnetic wood by induction heating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Oka; H. Fujita; K. Seki
Year: 2000
Overview of magnetic and magneto optical recording thermal instability of view
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Suzuki; R. Sbiaa; G. Lauhoff; M. Mochida
Year: 2000
20 nm domain expansion readout by magnetic amplifying MO system (MAMMOS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Awano; M. Sekine; M. Tani; N. Ohta; K. Mitani; N. Takagi; T. Noguchi; M. Kume
Year: 2000
Magnetic recording properties of magneto-optical media by merge type GMR head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Matsumoto; A. Chekanov; K. Ozaki; I. Tagawa; K. Shono
Year: 2000
A hybrid recording method using thermally assisted writing and flux sensitive detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.R. Cumpson; P. Hidding; R. Coehoorn
Year: 2000
Thin film characterization by acoustic emission monitoring of nanoindentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Daugela; J.T. Wyrobek
Year: 2000
Use of Ni/sub x/Si/sub y/ as an interlayer for wear and corrosion resistance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming M. Yang; D. Spaulding; J.L. Chao; M.A. Russak
Year: 2000
Effect of the additive X-IP on the tribological performance of PFPE lubricant at the head-disk interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.-Y. Chen; W. Fong; D.B. Bogy; T. Cheng; C.S. Bhatia
Year: 2000
Determination of the lubricant nligration rate from the hard disk surface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tai Cheng; B. Zhao; P. Lei; J. Chao
Year: 2000
Lube build-up and migration behavior on laser texture media after longterm parking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.D. Lin; J.S. Lin; W. Huang
Year: 2000
A valuation for clear stain and its behaver on helical scan tape system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Nagai; Y. Kamatani; M. Kondo; T. Ozue
Year: 2000
Successful suppression of magnetization precession after application of short field pulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bauer; R. Lopusnik; J. Fassbender; B. Hillebrands
Year: 2000
Selective writing of sub-/spl mu/m/sup 2/ domain in spin valve strip with current coincident schem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Matsuyama; N. Murashima; Y. Nozaki
Year: 2000
Temperature dependence of magnetic switching field distribution in magnetic tunnel junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.D. Schrag; S. Ingvarsson; Gang Xiao; R. Wanner; P. Trouilloud; Yu Lu; W.J. Gallagher; S.S.P. Parkin
Year: 2000
Switching properties of fast-pulse driven spin-valve devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kaka; S. Russek
Year: 2000
The magnettomecranical effect under torsional stress and the law of approach in a co ferrite composite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Chen; D.C. Jiles
Year: 2000
Biaxial stress effects on the magnetic properties of pure iron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pearson; P.T. Squire; M.G. Maylin; J.G. Gore
Year: 2000
Permeability measurement of ferrite under stress up to 6 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ledieu; A.L. Adenot; O. Acher
Year: 2000
The frequency and stress dependence of giant magneto-impedence in amorphous microwires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Mandal; S. Puerta; A. Hernando
Year: 2000
Anomalous thermally induced anisotropy in glass-covered amorphous microwires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.H.C.P. Sinnecker; M. Vazquez; L. Sampaio; M. Knobel
Year: 2000
On the use of the transverse biased initial susceptibility on the evaluation of the anisotropy constant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.R. Aranda; O.A. Chubykalo; J. Gonzalez; J.M. Gonzalez
Year: 2000
Giant field-induced reverseble linear strain in magnetic shape memory NiMnGa at room temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Heczko; A. Sozinov; K. Ullakko
Year: 2000
Pulsed field magnetic studies of MP dispersion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Blackwell; J. Hutchings; K. O'Grady
Year: 2000
An experimental investigation of the magnetization reversal in advanced metal particles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Bottoni; D. Candolfo; A. Cecchetti
Year: 2000
Comparison between deferent methods for evaluating the anisotropy field distribution in recording systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Bottoni; D. Candolfo; A. Cecchetti
Year: 2000
Switceng field versus pulse time: parameter study and experimental comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.L. Safonov
Year: 2000
Sidetrack erasure of stitched-pole magnetic recording heads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Guarisco; M. Li; H. Lin; C.H. Back; Y. Acremann
Year: 2000
Dependence of popcorn noise on write frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Zhang; R. Kemshetti; E. Salhi; D. Seagle; P. Rana
Year: 2000
High frequency recording head properties over 300 MHz for HDD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sugawara; S. Sasaki; S. Terada; A. Matsuzono; H. Ohmori; T. Sone; K. Fukumoto
Year: 2000
Residual stress optimization in FeAIN pole materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pei Zou; J.A. Bain
Year: 2000
Design of powder alignment system for anisotropic bonded NdFeB halbach cylinders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z.Q. Zhu; Z.P. Xia; K. Atallah; G.W. Jewell; D. Howe
Year: 2000
Design and analysis of a new permanent magnet brushless DC machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinyun Gan; K.T. Chau; J.Z. Jiang
Year: 2000
Hysteresis modelling of anisotropic barium-ferrite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Grossinger; H. Hauser; L. Stoleriu; P. Andrei
Year: 2000
Field rate measurement of time dependent magnetic phenomena
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong Sun; Wenjie Pang; R. Street
Year: 2000
Corrosion behaviours of sintered NdFeB permanent magnets produced from cast alloy ingot, atomized powder or strip cast alloy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X.C. Kou; R.K. Viswanadham
Year: 2000
Magnetic properties of NdFeB thin film obtained by diffusion annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mhan-joong Kim; Ying Li; Yoon-bae Kim; Kwon-sang Ryu; Chang-bin Song; Chong-oh Kim; Taik-kee Kim
Year: 2000
Magnetic properties and microstructure of NdFeB sintered magnets by the Ag powder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.B. Kim; W.Y. Jeung
Year: 2000
The effects of substituting iron for manganese in SmMn/sub 0/Ge/sub 6/: Magnetic and crystallographic properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Han; G.K. Marasinghe; W.J. James; W.B. Yelon; I. Dubenko; N. Ali
Year: 2000
Structural and magnetic properties of Sm/sub 2/Fe/sub 16/Mal/sub 2/ (M=Mn,Mo,Ni) and the effects of additional carbon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z.Y. Ren; D.H.L. Ng; S.-Y. Dai
Year: 2000
Cu addition in the YC/sub 05/ matrix: anisotropy field and ac-susceptibility between 4.2K and 900K
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sato Turtelli; E. Estevez-Rams
Year: 2000
Dipolar interactions in hard-soft nanocomposites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M. Gonzalez; V. Raposo; M.I. Montero; P. Crespo; p. Marin; A. Hernando
Year: 2000
Beyond 35 GBIT/IN/sup 2/: using a merged notched head on advanced thermally stable media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Madison; M. Pinarbasi; M. Parker; M. Doerner; X. Bian; C.K. Tang; S. Yuan; J. Li; L. Ingall; J. Raniseski; P. Fang; D. Margulies; K. Rubin; K. Takano; E. Fullerton; D. Weller; A. Moser; M.E. Best
Year: 2000
Experimental study of the off-track dependence of medium noise using mode projection method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhen Jin; Kezhao Zhang; G.H. Lin; H.N. Bertram
Year: 2000
Performance of turbo equalizer/turbo code detection for high density magnetic storage channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Lee; Jaejin Lee
Year: 2000
Partial response maximum likelihood detection for perpendicular recordfng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Oenning; Jaekyun Moon
Year: 2000
Essential physics of carrier transport in nanoscale MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lundstrom, M.; Zhibin Ren; Datta, S.
Year: 2000
First-principles-based predictive simulations of B diffusion and activation in ion implanted Si
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Theiss, S.K.; Caturla, M.-J.; Lenosky, T.J.; Sadigh, B.; Diaz de la Rubia, T.; Giles, M.D.; Foad, M.A.
Year: 2000
A fast three-dimensional MC simulator for tunneling diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wagner, M.; Mizuta, H.; Nakazato, K.
Year: 2000
Simulation of hot hole currents in ultra-thin silicon dioxides: the relationship between time to breakdown and hot hole currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ezaki, T.; Nakasato, H.; Yamamoto, T.; Hane, M.
Year: 2000
Coupled Monte Carlo simulation of Si and SiO/sub 2/ transport in MOS capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palestri, P.; Selmi, L.; Pavesi, M.; Widdershoven, F.; Sangiorgi, E.
Year: 2000
A Monte Carlo technique to investigate signal delays of advanced Si BJT's up to high currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palestri, P.; Selmi, L.; Hurkx, F.; Slotboom, J.
Year: 2000
Direct solution of the Boltzmann transport equation in nanoscale Si devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Banoo, K.; Lundstrom, M.; Smith, R.K.
Year: 2000
2-D quantum transport device modeling by self-consistent solution of the Wigner and Poisson equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiyi Han; Goldsman, N.; Chung-Kai Lin
Year: 2000
A multi-scale random-walk thermal-analysis methodology for complex IC-interconnect systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iverson, R.B.; Le Coz, Y.L.; Kleveland, B.; Wong, S.S.
Year: 2000
An extracting capacitance in a stacked DRAM cell by numerical method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sukin Yoon; Ohseb Kwon; Sangho Yoon; Taeyoung Won
Year: 2000
An exhaustive method for characterizing the interconnect capacitance considering the floating dummy-fills by employing an efficient field solving algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Kyu Park; Keun-Ho Lee; Joo-Hee Lee; Young-Kwan Park; Jeong-Taek Kong
Year: 2000
Di-interstitial diffusivity and migration path calculations based on tight-binding Hamiltonian molecular dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hane, M.; Ikezawa, T.; Gilmer, G.H.
Year: 2000
CHAMPS (chemical-mechanical planarization simulator)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoo-Hyon Kim; Kwang-Jae Yoo; Kyung-Hyun Kim; Bo-Yeon Yoon; Young-Kwan Park; Sang-Rok Ha; Jeong-Taek Kong
Year: 2000
Two-dimensional bandgap engineering in a novel Si-SiGe pMOSFET with enhanced device performance and scalability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ouyang, Q.; Chen, X.D.; Mudanai, S.; Kencke, D.L.; Wang, X.; Tasch, A.F.; Register, L.F.; Banerjee, S.K.
Year: 2000
Improved device technology evaluation and optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Connelly, D.; Foisy, M.
Year: 2000
Kinetics of boron activation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mokhberi, A.; Griffin, P.B.; Plummer, J.D.
Year: 2000
Nonlinear discretization scheme for the density-gradient equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ancona, M.G.; Biegel, B.A.
Year: 2000
Prediction of SiO/sub 2/ sputtering yield using molecular dynamics simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyusang Lee; Tai-Kyung Kim
Year: 2000
A physics-based empirical pseudopotential model for calculating band structures of simple and complex semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pennington, G.; Goldsman, N.; McGarrity, J.M.; Crowne, F.
Year: 2000
Monte Carlo simulation of current fluctuation at actual contact
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsuzawa, K.; Sano, N.; Natori, K.; Mukai, M.; Nakayama, N.
Year: 2000
Analysis of HBT behavior after strong electrothermal stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palankovski, V.; Selberherr, S.; Quay, R.; Schultheis, R.
Year: 2000
Optimizing free carrier absorption measurements for power devices by physically rigorous simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thalhammer, R.; Hille, F.; Wachutka, G.
Year: 2000
A new method to determine channel mobility model parameters in submicron MOSFET's using measured S-parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seonghearn Lee; Hyun Kyu Yu
Year: 2000
Extraction of the physical oxide thickness using the electrical characteristics of MOS capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eikyu, K.; Takashino, H.; Kidera, M.; Teramoto, A.; Umeda, H.; Ishikawa, K.; Kotani, N.; Inuishi, M.
Year: 2000
Simulation of multiple-bit soft errors induced by cosmic ray neutrons in DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tosaka, Y.; Satoh, S.
Year: 2000
Effective leadership of virtual project teams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thompsen, J.A.
Year: 2000
Improving SPC up to a one tolerance limit driven methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nenni, M.E.
Year: 2000
Benchmarking of technological innovation practices in Chinese enterprises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Jin; Xu Qingrui; Yong Hao; Qu Wenguang
Year: 2000
A model for management of technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Acosta, J.; Turrent, G.; Olin, M.; Gonzalez, R.
Year: 2000
Conducting successful new product field trials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Helm, J.W.; Holly, D.H.
Year: 2000
Strategies for adapting to technological change
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanderson, S.W.
Year: 2000
Fuzzy MCDM procedure for evaluating flexible manufacturing system alternatives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karsak, E.E.
Year: 2000
Organizing for innovation: focusing on the critical few R&D improvements that drive tangible results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mackey, W.
Year: 2000
Extending the balanced scorecard for technology strategy development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Durraui, T.S.; Forbes, S.M.; Carrie, A.S.
Year: 2000
Wavelet-based analysis of time series: an export from engineering to finance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Norsworthy, J.R.; Li, D.; Gorener, R.
Year: 2000
Innovation from a small company perspective-an empirical investigation of new product development strategies in SMEs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Filson, A.; Lewis, A.
Year: 2000
Value-based product development: refocusing lean
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Browning, T.R.
Year: 2000
Putting core competencies into market: core competence-based platform approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Qingrui; Wang Yi; Chen Jin; Shen Shouqin
Year: 2000
Managing technology in the top R&D spending companies worldwide-results of a global survey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reger, G.; Edler, J.; Meyer-Krahmer, F.
Year: 2000
A novel and ICT based information and workflow strategy for distributed and concurrent engineering processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pfeifer, T.; Reinecke, R.
Year: 2000
Assessment of technological capability on IT firms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Jin; Meng Fan; Xu Qingrui
Year: 2000
Implications of intelligent, integrated microsystems for product design and development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Myers, D.R.; McWhorter, P.J.; Converse, C.; Makal, L.
Year: 2000
Commercialization of distruptive technologies: the process of discontinuous innovations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hruby, J.; Kassicieh, S.K.; Walsh, S.T.
Year: 2000
A model for technology assessment and commercialization for innovative disruptive technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kassicieh, S.K.; Anderson, S.W.; Romig, A.; Cummings, J.; McWhorter, P.; Williams, D.
Year: 2000
Technological advance and productivity growth in the US Engineering and Scientific Instrument Industry: adjustment for unmeasured performance change in semiconductor inputs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fu, C.W.; Norsworthy, J.R.
Year: 2000
Accelerating technology transfer from federal laboratories to the private sector by increasing industrial R&D collaborations-a new business model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lombana, C.A.; Romig, A.D.; Linton, J.D.
Year: 2000
Biotechnology: industry of the 21st century. Implementing science and technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dorweiler, V.P.
Year: 2000
Fuzzy logic in management control: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nobre, F.S.M.; Nakasone, J.J.; Palhares, A.G.B.; Madrid, M.K.; Roy, R.
Year: 2000
Psychological concepts, public relations, and scientific responses to genetically modified organisms (GMOS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Supanutsetkul, N.; Caporael, L.
Year: 2000
Virtual reality? When visualization needs vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watts, T.P.; Swann, G.M.P.; Pearson, A.W.
Year: 2000
Roles and strategies of contract manufacturers in the telecommunications industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hadaya, P.; Lefebvre, E.; Leger, P.-M.
Year: 2000
A unified approach to technology management in new product development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thompson, J.S.
Year: 2000
Management for emergent properties in the research and development process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakahori, I.
Year: 2000
The relationship between R&D spending and shareholder returns in the computer industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mank, D.A.; Nystrom, H.E.
Year: 2000
The relationship of technology change management to risk management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mosier, S.P.; Guenterberg, S.A.; Raphael, R.R.
Year: 2000
Analysis of intangible factors in waste minimization projects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nystrom, H.; Kehr, W.
Year: 2000
Managing co-innovation: an effect way to reinforce competence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Qingrui; Wanyan Shaohua; Yang Huajun; Chen Jin
Year: 2000
Pre-emptive radical innovation: building inter-departmental common knowledge in a short product development cycle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hung-Bin Ding; Ravichandran, T.
Year: 2000
Rewards and retention of technical staff
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farris, G.F.
Year: 2000
The application of a systems engineering model to survey research methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wicker, D.B.
Year: 2000
Revolution of knowledge creating companies in Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamasaki, H.; Yamada, I.
Year: 2000
Two policies that will achieve engineering education reform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gover, J.; Huray, P.G.
Year: 2000
A national laboratory for reforming health care costs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gover, J.; Huray, P.G.
Year: 2000
The engineer's role in averting the pending health care cost crisis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gover, J.; Huray, P.G.
Year: 2000
Moore's law-is there more?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.H. Brown
Year: 2000
Highly accurate and precise measurement technique for effective exposure dose
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Izuha; T. Fujisawa; M. Asano; S. Inoue
Year: 2000
A novel procedure to evaluate design scalability based on device performance linked to photolithography data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karklin, L.; Balasinski, A.; Axelrad, V.
Year: 2000
High accurate optical proximity correction under the influences of lens aberration in 0.15 /spl mu/m logic process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Harazaki; Y. Hasegawa; Y. Shichijo; H. Tabuchi; K. Fujii
Year: 2000
Theoretical MEF calculation for periodic patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Terasawa; N. Hasegawa
Year: 2000
Sub-120 nm patterning in KrF lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seo-Min Kim; Sang-Jin Kim; Chang-Jin Bang; Young-Mog Ham; Bong-Ho Kim
Year: 2000
Microfabricated separator and manipulator of blood cells for health care devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ujiie; A. Yamazaki; M. Watanabe; T. Okuda; T. Ichiki; Y. Horiike
Year: 2000
Microtechnologies for nucleic acid analysis: from concept to commercialization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Northrup
Year: 2000
Microscopic demonstration of static- and dynamic-binding of Eco RI enzyme to extended DNA at a single-molecule level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kabata; W. Okada; M. Washizu
Year: 2000
Development of EUV reflectometer using a laser-plasma x-ray source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kondo; N. Kandaka; K. Sugisaki; T. Oshino; M. Shiraishi; W. Ishiyama; K. Murakami
Year: 2000
Simulation of multilayer defects in EUV masks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ito; T. Ogawa; K. Otaki; I. Nishiyama; S. Okazaki; T. Terasawa
Year: 2000
Hierarchical optical proximity correction on contact hole layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yamamoto; S. Kobayashi; T. Uno; T. Kotani; S. Tanaka; S. Inoue; S. Watanabe; H. Higurashi
Year: 2000
A new correction method for dry etch loading effect in photomask fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Won-Tai Ki; Seung-Hune Yang; Seong-Yong Moon; Seong-Woon Choi; Woo-Sung Han; Jung-Min Sohn
Year: 2000
A novel RET for random pattern formation utilizing attenuating non-phase-shift assist pattern
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Nakao; A. Tokui; K. Tsujita; I. Arimoto; W. Wakamiya
Year: 2000
Asymmetric properties of the aerial image in EUVL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Otaki; H. Oizumi; M. Ito; I. Nishiyama; S. Okazaki
Year: 2000
Sub-50-nm patterning in EUV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Oizumi; I. Nishiyama; H. Yamanashi; Ei Yano; S. Okazaki
Year: 2000
Deposition and characterization of Ta, TaN/sub x/, and Ta/sub 4/B films for NGL mask application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seung Yoon Lee; Chang Mo Park; Jinho Ahn
Year: 2000
A new cleaning technique for x-ray masks in alkaline solutions by control of surface potential
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tuda, M.; Kinugawa, M.; Ootera, H.; Marumoto, K.
Year: 2000
CD controllability of chemically amplified resists for x-ray membrane mask fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ezaki; Y. Kikuchi; S. Tsuboi; H. Watanabe; H. Aoyama; Y. Nakayama; S. Ohki; T. Morosawa; T. Matsuda
Year: 2000
Mask error factor in proximity X-ray lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujii, K.; Suzuki, K.; Matsui, Y.
Year: 2000
Capability of 70 nm pattern replication in x-ray lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kikuchi, Y.; Hasegawa, M.; Iwamoto, T.; Fujii, K.; Matsui, Y.
Year: 2000
Patterning yield of sub-100-nm holes limited by fluctuation of exposure and development reactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Deguchi; Y. Kawai; H. Kochiya; Y. Ushiyama; M. Oda
Year: 2000
Evaluation of the effective image blurring factors in the synchrotron proximity X-ray lithography simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongduck Seo; Ohyun Kim
Year: 2000
Dose uniformity of a compact beamline in routine operation with a storage ring "AURORA-2S"
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hirose; D. Amano; T. Miyatake; Xan Li; T. Hori
Year: 2000
Development of elemental technologies for fabricating the health care chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oki, A.; Adachi, S.; Takamura, Y.; Ishihara, K.; Ogawa, H.; Ichiki, T.; Horiike, Y.
Year: 2000
Analysis of heavy-metal-ions using mercury microelectrodes and a solid-state reference electrode fabricated on a Si wafer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwang-Seok Yun; Hong-Jeong Kim; Segyeong Joo; Juhyoun Kwak; Euisik Yoon
Year: 2000
Fabrication of a bump-type Si probe card
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-Seok Lee; Jeong-Yong Park; Dong-Kwon Kim; Jong-Hyun Lee
Year: 2000
Young's modulus evaluation of Si thin film fabricated by compatible process with Si MEMSs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Hirai; Y. Marushima; K. Nishikawa; Y. Tanaka
Year: 2000
Formation of micro eaves analyzed by energy balance model at threefold of Cu film/DFR/Ni plating solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, H.; Nakamura, T.; Kawakami, Y.; Kawai, A.
Year: 2000
Generation and relaxation of free volume during the post exposure bake
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stewart, M.D.; Burns, S.D.; Schmid, G.M.; Willson, C.G.
Year: 2000
Formation of sub-100 nm contact hole patterns using a novel resist material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang-Jun Choi; Yool Kang; Jeong-Hee Chung; Sang-Gyun Woo; Joo-Tae Moon
Year: 2000
Progress of top surface imaging process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Satou, I.; Watanabe, H.; Watanabe, M.; Itani, T.
Year: 2000
Approach of various polymers to 157 nm single-layer resists
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kishimura, S.; Sasago, M.; Shirai, M.; Tsunooka, M.
Year: 2000
Feasibility of new ARC using PECVD for both KrF and ArF lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongbeom Kim; Junghyeon Lee; Hanku Cho; Jootae Moon
Year: 2000
Sub-100 nm device fabrication using proximity X-ray lithography at five levels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Iba; T. Taguchi; F. Kumasaka; T. Iizuka; Y. Sanbonsugi; K. Deguchi; H. Aoyama; M. Fukuda; M. Oda; H. Morita; T. Matsuda; K. Horiuchi; Y. Matsui
Year: 2000
EB stepper. A high throughput E-beam projection lithography system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yamaguchi
Year: 2000
Electron scattering and related phenomena in SCALPEL/sup TM/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Mkrtchyan
Year: 2000
Critical dimension issues for 200 mm electron projection masks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.J. Resnick; K. Nordquist; W.J. Dauksher; E. Ainley; B. Lu; P. Mangat; E. Weisbrod; C. Martin; A. Wei; R. Englestad; E. Lovell; V. Ivin
Year: 2000
Contrast evaluation of SCALPEL GHOST method in 100 kV electron projection lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koba, F.; Yamashita, H.; Nomura, E.; Nakajima, K.; Nozue, H.
Year: 2000
Design and fabrication of magnetically driven micromirror with large angular deflection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang Hyeon Ji; Yong-Kweon Kim
Year: 2000
Simulation of electron and ion beam optics for high throughput lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X. Zhu; H. Liu; E. Munro; J. Rouse
Year: 2000
Simulation of Coulomb interactions in electron projection lithography using scattering contrast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yamashita; E. Munro; J. Rouse; H. Kobinata; K. Nakajima; H. Nozue
Year: 2000
Direct measurement of electron transmission properties of mask membranes for electron projection lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Nomura; H. Yamashita; Y. Ochiai; T. Baba
Year: 2000
Influence of electron density distribution at the electron source in a projection exposure system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kotera; M. Sakai; I. Shimizu; Y. Tomo; A. Yoshida; Y. Kojima; M. Yamabe
Year: 2000
Highly integrated cantilever with light emitting diode, channel waveguide, aperture, and photodiode for scanning near-field optical microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sasaki; K. Tanaka; K. Hane
Year: 2000
Solid polymer dye microlaser fabricated using Si mold having optically smooth surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sasaki; Y. Akatu; I. Li; K. Hane
Year: 2000
Micromachining of optical fiber using reactive ion etching and its application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kumazaki; Y. Yamada; T. Oshima; S. Inaba; K. Hane
Year: 2000
Automatic dose optimization system for resist cross-sectional profile in a electron beam lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Hirai; H. Kikuta; M. Okano; T. Yotsuya; K. Yamamoto
Year: 2000
Intralevel mix and match lithography for sub-100 nm CMOS devices using the JBX-9300FS point-electron-beam system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Narihiro; H. Wakabayashi; M. Ueki; K. Arai; T. Ogura; Y. Ochiai; T. Mogami
Year: 2000
An improved electron scattering simulation at the mask in a projection lithography system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Ishida; K. Naruse; M. Kotera; I. Shimizu; Y. Tomo; A. Yoshida; Y. Kojima; M. Yamabe
Year: 2000
A 100-kV, 100-A/cm/sup 2/ electron optical system for the EB-X3 X-ray mask writer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Saito; J. Kato; T. Matsuda; Y. Nakayama
Year: 2000
Proposal of atom lithography for silicon quantum dots
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Asakawa; H. Kumagai; M. Obara
Year: 2000
Lifetime and spin relaxation time measurements of micro-fabricated GaAs tips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Shinohara; K. Yamaguchi; H. Hirota; Y. Suzuki; T. Manago; H. Akinaga; T. Kuroda; F. Minami
Year: 2000
Dependence of buffer layer on the distribution of InAs quantum dots
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyo Jin Kim; Byung Don Min; Young Ju Park; Chan Kyung Hyon; Se Ki Park; Eun Kyu Kim; Tae Whan Kim
Year: 2000
A large-scaled 2D array of alkanethiol-encapsulated gold particles fabricated using Langmuir-Blodgett technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Huang; G. Tsutsui; H. Sakaue; S. Shingubara; T. Takahagi
Year: 2000
10 nm size fabrication of semiconductor substrates and metal thin lines by conventional photolithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hashioka; H. Matsumura
Year: 2000
Compact imprint system using driving power of stepping motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Igaku; S. Matsui; H. Ishigaki; H. Hiroshima; M. Komuro; S. Yamanaka; T. Nagamura
Year: 2000
AFM lithography combined with optical lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ishibashi; S. Heike; T. Hashizume
Year: 2000
Direct nanolithography of organic polysilane films using carbon nanotube tips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Okazaki; T. Kishida; S. Akita; H. Nishijima; Y. Nakayama
Year: 2000
Polarization dependence of photoinduced birefringence in chalcogenide thin film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun-Joo Jang; Cheol-Ho Yeo; Jeong-Il Park; Hyun-Young Lee; Hong-Bay Chung
Year: 2000
Typical electron beam doping (superdiffusion) of impurity atoms in damage-free regions of semiconductors by the kick-out mechanism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Wada; H. Fujimoto; S. Asada
Year: 2000
RF-plasma assisted fast atom beam etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ono, T.; Simizu, T.; Orimoto, N.; Lee, S.; Masayoshi, E.
Year: 2000
Relative domination between Cl/sup +/ and Cl2/sup +/ ions in time-modulated inductively coupled Cl2 plasma investigated with laser-induced fluorescence technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumagai, S.; Sasaki, M.; Koyanagi, M.; Hane, K.
Year: 2000
Remote-plasma-enhanced etching of silicon using trifluoro-acetyl-fluoride gas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Saito; H. Yamazaki; I. Mouri
Year: 2000
In situ monitoring of hydrogen etching of Si surfaces by infrared reflection absorption spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Noda; T. Urisu; Y. Kobayashi; T. Ogino
Year: 2000
Etching characteristics of fine Ta patterns with electron cyclotron resonance chlorine plasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang Hoon Kim; Sang-Gyun Woo; Jinho Ahn
Year: 2000
Collapse behavior of KrF resist line pattern analyzed with atomic force microscope tip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kawai
Year: 2000
Quantum dots in carbon nanotubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ishibashi; M. Suzuki; T. Ida; K. Tsukagoshi; Y. Aoyagi
Year: 2000
Nanoindentation of polycarbonate using carbon nanotube tip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akita, S.; Nishijima, H.; Kishida, T.; Nakayama, Y.
Year: 2000
Imprint lithography using triple-layer-resist and its application to MOSFET fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Nakamura; A. Baba; T. Asano
Year: 2000
Growth dynamics of single-wall carbon nanotubes synthesized by laser ablation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Kokai; M. Yudasaka; S. Iijima
Year: 2000
Si barrier metal grown by hybrid radical beam pulsed laser deposition of TiN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Obata, K.; Sugioka, K.; Toyoda, K.; Takai, H.; Midorikawa, K.
Year: 2000
Probing semiconductor nano-structures with synchrotron radiation and STM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Hamilton
Year: 2000
Fabrication and characterization of periodic nano-faceting structures on patterned vicinal [110] GaAs substrates by MOVPE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Harada; Y. Oda; J. Motohisa; T. Fukui
Year: 2000
Scanning Capacitance Microscopy for measuring device carrier profiles beyond the 100 nm generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Kopanski; J.F. Marchiando; B.G. Rennex
Year: 2000
Dynamic three-dimensional mask-wafer positioning with nanometer exposure overlay accuracy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.E. Moon; P.N. Everett; M.W. Meinhold; H.I. Smith
Year: 2000
Sub-10 nm linewidth and overlay performance achieved with a fine-tuned EBPG-5000 TFE electron beam lithography system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.E. Maile; W. Henschel; H. Kurz; B. Rienks; R. Polman; P. Kaars
Year: 2000
Inspection of critical dimension- and transmission uniformity of contact patterns by DUV imaging and regression algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yamashita; S. Yamaguchi
Year: 2000
Growth of new fluoride single crystals for optical applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fukuda; K. Shimamura; N. Sarukura
Year: 2000
Status of EUV lithography and plans in USA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Gwyn
Year: 2000
Recent activities in the development of EUV lithography at ASET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Okazaki
Year: 2000
Optics for EUV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Kurz; H.-J. Mann; M. Antoni; W. Singer; M. Muhlbeyer; F. Melzer; U. Dinger; M. Weiser; S. Stacklies; G. Seitz; F. Haidl; E. Sohmen; W. Kaiser
Year: 2000
An in-situ time-resolved infrared spectroscopic study of silicon dioxide (SiO/sub 2/) surface during selective etching over silicon in fluorocarbon plasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sekine
Year: 2000
Damage-free flattening technology of large diameter Si wafer employing numerically controlled local SF6/H2 downstream plasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanagisawa, M.; Ogawa, H.; Horiike, Y.
Year: 2000
Control of crystalline structure and ferroelectric properties of Pb(ZrxTi/sub 1-X/)O3 films by pulsed laser deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujita, H.; Goto, S.; Agata, S.; Sakashita, M.; Sakai, A.; Zaima, S.; Yasuda, Y.
Year: 2000
Current status of EUV optics and future advancements in optical components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Sweeney
Year: 2000
Experimental results obtained by EUV laboratory tool at NewSUBARU
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kinoshita; T. Watanabe
Year: 2000
Study of a cavity-confined plasma as a debris-less and high conversion efficiency source for EUV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomie, T.; Aota, T.; Kurashima, Y.; Kandaka, N.; Yashiro, H.; Nishigori, K.; Matsushima, I.; Komuro, M.
Year: 2000
Low-stress molybdenum/silicon multilayer coatings for extreme ultraviolet lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiraishi, M.; Ishiyama, W.; Oshino, T.; Murakami, K.
Year: 2000
Contrast measurement of reflection mask with Cr and Ta absorber for Extreme Ultraviolet Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niibe, M.; Watanabe, T.; Nii, H.; Tanaka, T.; Kinoshita, H.
Year: 2000
Chemically amplified electron beam positive resist with acetal protecting group-effect of the additives on resist properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saito, S.; Kihara, N.; Ushirogouchi, T.
Year: 2000
Application of organic silicon cluster to patter transfer process for deep UV lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Sato; E. Shiobara; J. Abe; Y. Onishi; Y. Nakano; S. Hayase
Year: 2000
Stabilization of motions of multi-pendulum systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miroshnik, I.; Bobtsov, A.
Year: 2000
A formal background for basic type autowaves formation by a cellular neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Selikhov, A.V.
Year: 2000
Small islands of stability in the chaotic sea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lazutkin, V.F.; Petrova, N.V.; Svanidze, N.V.
Year: 2000
On one property of duality in the algebra of first integrals for mechanical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Irtegov, V.D.
Year: 2000
Model of physical hysteresis and control of the image motion oscillations at a large space telescope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Somov, Y.I.
Year: 2000
Multispiral chaos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aziz-Alaoui, M.A.
Year: 2000
Images from chaos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subias Izquierdo, J.L.; Paricio Sanchez, J.M.
Year: 2000
A generalized self-consistent method for determining effective dynamic elastic and diffraction properties of composites with random structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pan'kov, A.A.
Year: 2000
Learning-oriented simulations and applications of self-organization principle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Lei; Ren Shouju; Wang Wei
Year: 2000
Control of 1-D and 2-D coupled map lattices through reinforcement learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gadaleta, S.; Dangelmayr, G.
Year: 2000
On reconstruction of disturbances in a system with hereditary
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blizorukova, M.S.
Year: 2000
Correlation analysis of the piecewise-linear system oscillation at the nonstationary narrow-band excitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bouraou, N.I.; Marchuk, P.I.
Year: 2000
Adaptive robust damping of divergent oscillations in updatable inertial systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chernodarov, A.V.
Year: 2000
Two-dimensional ergodic maps: new examples
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goloubentsev, A.F.; Anikin, V.M.; Noyanova, S.A.
Year: 2000
Stochastic approximation with exciting perturbation under dependent noises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Granichin, O.
Year: 2000
Study of homoclinic transversal intersections for the double mathematical pendulum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ivanov, A.V.
Year: 2000
Refined method of electric long lumped-parameters lines calculation on the basis of exact analytical solutions for mechanical elastic lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karavashkin, S.B.
Year: 2000
Controlling monostability in a bistable system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pisarchik, A.N.
Year: 2000
Design of digital controller with prescribed rejection of unknown harmonic disturbances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shatalov, B.V.; Yurkevich, V.D.
Year: 2000
Adaptive control on manifolds of nonlinear control plants with complex and oscillation dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Terekhov, V.A.; Tyukin, I.Y.
Year: 2000
On-off intermittency near the threshold of mode-locking in Nd:YAG laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Volodchenko, K.V.; Ivanov, V.N.; Dae-Sik Lee; Chil-Min Kim
Year: 2000
Maximum reaction spectra of oscillators and shock resistance of complex structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zaborova, N.V.
Year: 2000
Linear dynamically varying linear quadratic control of systems with complicated dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bohacek, S.; Jonckheere, E.
Year: 2000
A control problem for a particle of unknown mass subject to disturbance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ananievski, I.M.
Year: 2000
Robust stability and control of complex stochastic systems with jumps of state vector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pakshin, P.V.; Pakshina, N.A.
Year: 2000
Lyapunov-Bautin bifurcation and the hunting of a railway wheelset
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Inozemtsev, V.G.; Tibilov, T.A.
Year: 2000
Bifurcational phenomena in a nonideal system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belato, D.; Weber, H.I.; Balthazar, J.M.; Rosario, J.M.
Year: 2000
Hopf bifurcation in discrete-time systems via a frequency domain approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D'Amico, M.B.; Moiola, J.L.; Paolini, E.E.
Year: 2000
Limit behavior of attainable sets of a singular perturbed linear autonomous control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Figurina, T.Yu.; Ovseevich, A.I.
Year: 2000
Information viewpoint on chaotic synchronization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dmitriev, A.S.; Kassian, G.A.; Khilinsky, A.D.
Year: 2000
Coherent structures in dynamical systems described by hyperbolic equation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramian, A.K.; Vakulenko, S.A.
Year: 2000
Analysis of regularization of dynamics in a circular chain of bistable chaotic elements with variable number of couplings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuznetsov, A.S.; Shalfeev, V.D.
Year: 2000
Reconstruction of the right-hand side in equation describing size structured population models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rozenberg, V.L.
Year: 2000
A phase constraints tuning approach for complex object identification under uncertainty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pilishkin, V.N.; Tollet, I.
Year: 2000
Recovering parameters of chaotic piecewise linear dynamical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aziz-Alaoui, M.A.; Lozi, R.; Fedorenko, A.D.; Sharkovsky, A.N.
Year: 2000
A problem of on-line continuous-time estimation of parameters of polyharmonic function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bobtsov, A.A.; Lyamin, A.V.
Year: 2000
Frequency analysis of linear periodical systems. Theory and experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Volovodov, S.; Lampe, B.; Rozenvasser, Y.; Smolnikov, A.
Year: 2000
Controlling chaotic systems with disturbance using backstepping design and nonlinear damping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mascolo, S.; Grassi, G.
Year: 2000
Stabilization of quasiperiodic output in a Q-switched Nd:YAG laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chil-Min Kim; Dong-Uk Hwang; Young-Jai Park
Year: 2000
Discrete adaptive control of a chaotic system under disturbances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guzenko, P.Y.
Year: 2000
Interspike and interburst intervals: nonlinear dynamics approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pavlov, A.N.; Silantyeva, E.V.; Sof'yina, E.S.; Anishchenko, V.S.
Year: 2000
Neurodynamical route to chaos and normal speech vs. stuttering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Skljarov, O.P.
Year: 2000
Suppressing arrhythmias in cardiac models with overdrive pacing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osipov, G.V.; Stamp, A.T.; Collins, J.J.
Year: 2000
Synchronization of non-identical chaotic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarasola, C.; Torrealdea, F.J.; d'Anjou, A.; Grana, M.
Year: 2000
Phase synchronization in coupled Nd:YAG lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ivanov, V.N.; Volodchenko, K.V.; Sung-Huan Gong; Muhan Choi; Young-Jai Park; Chil-Min Kim
Year: 2000
Chaos synchronization destruction in symmetrically coupled chaotic oscillators with period-doubling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Astakhov, V.; Shabunin, A.; Anishchenko, V.
Year: 2000
New developments in the dynamics of constrained systems and applications to tracking control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Udwadia, F.E.
Year: 2000
Generator dynamics in a snapshot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pinceti, P.; Lagasio, M.
Year: 2000
Vortex structures in a thin oscillating liquid layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ezersky, A.B.; Kiyashko, S.V.; Nazarovsky, A.V.
Year: 2000
Oscillations and chaos in the model of the Pacific salmon's number dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frisman, E.Y.; Last, E.V.
Year: 2000
Oscillations and chaos in population dynamics caused by hunting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frisman, E.Y.; Sycheva, E.V.
Year: 2000
A RKHS approach to the optimal modeling, identification, and design of nonlinear adaptive systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2000
Stirrer efficiency in FOA reverberation chambers. Evaluation of correlation coefficients and chi-squared tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lunden, O.; Backstrom, M.
Year: 2000
Reverberation chamber verification procedures, or, how to check if your chamber ain't broke and suggestions on now to fix it if it is
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ladbury, J.M.; Goldsmith, K.
Year: 2000
Total-radiated-power-based OATS-equivalent emissions testing in reverberation chambers and GTEM cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harrington, T.E.
Year: 2000
Effect of antenna aperture, EUT and stirrer step size on measurements in mode-stirred reverberation chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnaut, L.R.; West, P.D.
Year: 2000
Improved triaxial set-ups for the measurement of complex transfer impedances and admittances of shielded multiconductor cables inside cable bundles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung, L.; Luiken ter Haseborg, J.
Year: 2000
An efficient digital controller for active shielding circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonini, G.; Cristina, S.
Year: 2000
EM analysis and numerical characterization of gaskets: applying a sub-domains decomposition technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ridel, M.; Gobin, V.; Issac, F.; Tabbara, W.
Year: 2000
Common mode impedance model of power electronic equipment to evaluate noise reduction effect of a line noise filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanda, M.; Oka, N.; Nitta, S.
Year: 2000
Evaluation of multiconductor transmission line interconnects with frequency dependent loss using reduced order modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, W.T.; Nguyen, T.V.
Year: 2000
Experimental characterization of switching noise and signal integrity in deep submicron integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Steinecke, T.
Year: 2000
Ground starvation effects on multi-layer PCBs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O'Sullivan, C.; Lee, N.
Year: 2000
Characterization of an EMC test-chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Wershoven, L.
Year: 2000
Constructing the Lagrangian of VLSI devices from near field measurements of the electric and magnetic fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Slattery, K.P.; Muccioli, J.P.; North, T.M.
Year: 2000
The correlation between common mode currents and radiated emissions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaires, R.G.
Year: 2000
A genetic algorithm based method for predicting far-field radiated emissions from near-field measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Regue, J.-R.; Ribo, M.; Garrell, J.-M.; Sorroche, S.; Ayuso, J.
Year: 2000
Assessment of H-field levels inside a DC railway substation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amendolara, A.; Laurenti, G.; Mariscotti, A.; Pozzobon, P.
Year: 2000
Combined effects of several, simultaneous, EMI couplings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mardiguian, M.
Year: 2000
Experimental verification for field to transmission line coupling using TEM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beom Jun Park; Jae Cheol Ju; Hyun Young Lee; Dong Chul Park
Year: 2000
Correcting OATS antenna factors for small fully anechoic chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hansen, D.; Ristau, D.; Lilienkamp, P.
Year: 2000
Fully compact anechoic chamber using the pyramidal ferrite absorber for immunity test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimada, K.; Hayashi, T.; Tokuda, M.
Year: 2000
Automatic field distribution measurement inside of enclosures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolfsperger, H.A.; Jordan, D.; Schwab, A.J.
Year: 2000
A new EMS facility for the test of large widespread systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilbert, J.; Schwarz, H.
Year: 2000
Investigation of sampling geometry for simultaneous emissions/immunity calibration of free space chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vitek, C.
Year: 2000
Detectors and procedures for the measurement of out-of-band emissions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stecher, M.; Wolf, J.
Year: 2000
Mutual recognition agreements-problems caused by inconsistencies in the accreditation requirements of EMC test laboratories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zombolas, C.
Year: 2000
The EMC management of the project compliance process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sims, T.P.
Year: 2000
Effective communication for EMC engineers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hailey, J.C.
Year: 2000
EMC market surveillance tests for UPS systems in Finland. Only one third was compliant!
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajamaki, J.
Year: 2000
EMC management: an integral part of a company's quality program
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sin, R.; Majewski, D.J.
Year: 2000
Time-domain macromodelling of realistic printed circuit board by FDTD and signal processing tools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Marrocco; P. Tognolatti
Year: 2000
Experimental evaluation of power bus decoupling on a 4-layer printed circuit board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Juan Chen; Minjia Xu; Hubing, T.H.; Drewniak, J.L.; Van Doren, T.P.; DuBroff, R.E.
Year: 2000
Prediction of RF interference effects in smart power integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fiori, F.
Year: 2000
Estimation of countermeasure effect by a bypass condenser at a source terminal of a CMOS IC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kazama, S.; Shinohara, S.; Sato, R.; Shimizu, M.
Year: 2000
Analysis of a test setup for the characterization of integrated circuits electromagnetic emissions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fiori, F.; Pignari, S.
Year: 2000
Prediction of electric far-field strength from printed circuit boards by measuring the common-mode current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sasabe, K.; Bullivant, A.; Yoshida, K.; Fujiwara, O.
Year: 2000
Novel EMC debugging methodologies for high-power converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chingchi Chen
Year: 2000
Analysis of RFI effects in voltage regulator ICs: measurement techniques, picking capability prediction and protection methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Florean, D.; Pinelli, M.; Tomasin, P.
Year: 2000
Current density in a rectangular rod
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bullard, B.W.; Norgard, J.D.
Year: 2000
A technique to reduce the apparent noise floor of emissions measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miller, P.
Year: 2000
Testing for FM-radio interference in motor vehicles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trost, T.F.; Ye Jin; Jongsin Yun; Qianlin Zhou
Year: 2000
Weak boundary treatment for high-order transient analysis of MTLs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grivet-Talocia, S.; Canavero, F.
Year: 2000
Transient suppression of switched power for critical resources aboard DDG 51 class naval ships
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:DiClementi, D.A.; Standeven, D.L.
Year: 2000
Measurement of conducted transients on automotive sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ivanov, V.; Plagens, M.
Year: 2000
Transient field simulation of electrostatic discharge (ESD) in the calibration setup (ace. IEC 61000-4-2)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leuchtmann, P.; Sroka, J.
Year: 2000
Calculation of the ESD-pulse parameters and associated uncertainty for ESD-gun calibration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Ketelaere, W.; Martens, L.; Braem, Y.; Vlietinck, Y.
Year: 2000
Electromagnetic compatibility in active telephone sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hernandez, F.; Gatti, E.; Garcia, L.
Year: 2000
Pseudo-noise generator with arbitrary APD, PDD and PSD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamane, K.; Shinozuka, T.; Ohnuma, K.
Year: 2000
EMI behavior of copper areas on outer layers of PCBs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bucker, M.
Year: 2000
Power conversion techniques for portable EMI sensitive applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perez, R.
Year: 2000
Imperfections in the theoretical NSA model can adversely or favorably affect a site validation measurement and a proposal for correction factors for broadband biconical antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Windler, M.J.; Zhong Chen
Year: 2000
Low uncertainty broadband EMC measurement using calculable precision biconical antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong Chen; Cook, A.
Year: 2000
An improved method for determining normalized site attenuation using log periodic dipole arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong Chen; Foegelle, M.
Year: 2000
Intentional emitters above 2400 MHz: how best to measure the transmitted signal level for FCC Part 15 compliance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bronaugh, E.L.
Year: 2000
Assessing the effects of an OATS shelter: is ANSI C63.7 enough?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johnk, R.T.; Novotny, D.R.; Weil, C.M.; Medley, H.W.
Year: 2000
Development of a precision biconical antenna for broadband metrology applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McLean, J.; Trucchi, U.; Sivaswamy, J.; Sutton, R.
Year: 2000
Directivity of the test device in EMC measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koepke, G.; Hill, D.; Ladbury, J.
Year: 2000
Common mode filter project by means of internal impedance measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Florean, D.; Spiazzi, G.
Year: 2000
Millimeter wave absorber using M-type hexagonal ferrite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iijima, Y.; Houjou, Y.; Sato, R.
Year: 2000
The attenuation characteristics of noise filter using motor-generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mutoh, A.; Nitta, S.; Konishi, K.
Year: 2000
EMC combined di/dt current probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van den Bossche, A.; Ghijselen, J.
Year: 2000
A study on the model of the slit on the ground plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mizuguchi, Y.; Yamamoto, Y.; Shinohara, S.; Sato, R.
Year: 2000
Can a slot act as a band pass aperture?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joffe, E.B.; Axelrod, A.
Year: 2000
Methods for speeding up radiated and conducted immunity tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pommerenke, D.
Year: 2000
Instantaneous frequency distribution (IFD) measuring equipment having a 500 MHz bandwidth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tagiri, O.; Shinozuka, T.; Sato, R.
Year: 2000
Measurements of transfer impedance with the line injection method on cables and connectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bluhm, M.; Peroglio, E.; Pierucci, G.; Squizzato, V.; Zich, R.E.
Year: 2000
Parameters and results of SE-measurements performed in mode-stirred chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kurner, W.; Schwab, A.
Year: 2000
Comparison of anechoic and reverberation chamber coupling data as a function of directivity pattern
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Freyer, G.J.; Backstrom, M.G.
Year: 2000
A calibration procedure for reverberation chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hatfield, M.O.
Year: 2000
Measuring the shielding effectiveness of coaxial cables using a reverberation chamber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Godfrey, E.A.; Kousky, J.T.
Year: 2000
An alternative way to stir the fields in a mode stirred chamber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perini, J.; Cohen, L.S.
Year: 2000
Experimental results obtained in the vibrating intrinsic reverberation chamber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leferink, F.; Boudenot, J.-C.; van Etten, W.
Year: 2000
Low frequency behavior of a reverberation chamber with monopole antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suriano, C.R.; Thiele, G.A.; Suriano, J.R.
Year: 2000
EMC in Taiwan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, G.; Han-Chang Hsieh
Year: 2000
Forthcoming changes to the European EMC Directive and the expected impact on industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jones, B.; Wood, I.
Year: 2000
Uncertainty rationale for compliance margin factors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heise, E.R.; Heise, R.E.W.
Year: 2000
Influence of soil and conductor of ground grid on safety of the grounding system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Li; Xiang Cui; Tiebing Lu; Haoliu Yin
Year: 2000
FDTD analysis on the current and electric field distribution in a PCB stripline structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yung-Kyu Kim
Year: 2000
Analytical and experimental study of the EM/biological tissues interaction at 1900 MHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Samiei, M.H.V.; Delisle, G.Y.
Year: 2000
Test signal reduction in radiated EMI measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schaefer, W.
Year: 2000
Estimation of radiated emission sources with arbitrary directional current components using CISPR measurement system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Ishida; K. Murakawa; K. Yamashita; M. Tokuda
Year: 2000
Experimental and numerical study of the radiation from microstrip bends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, H.; Ji, Y.; Hubing, T.H.; Drewniak, J.L.; van Doren, T.P.; DuBroff, R.E.
Year: 2000
Characterization of miniaturized E-field probes for SAR measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faraone, A.; McCoy, D.O.; Chou, C.M.; Balzano, Q.
Year: 2000
A new EMC antenna for the low-frequency SE measurement of small enclosures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Araneo, R.; Celozzi, S.
Year: 2000
Effects of termination networks on signal-induced EMI from the shields of Fibre Channel cables operating in the Gb/s regime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Knighten, J.L.; Smith, N.W.; DiBene, J.T., II; Hoeft, L.O.
Year: 2000
Advances of gyromagnetic electronics for EMC problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koledintseva, M.Y.; Mikhailovsky, L.K.; Kitaytsev, A.A.
Year: 2000
Experimental and FDTD study of the EMI performance of an open-pin-field connector for modules-on-backplanes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoning Ye; Nadolny, J.; Drewniak, J.L.; DuBroff, R.E.; VanDoren, T.P.; Hubing, T.H.
Year: 2000
FDTD modeling of the coaxial feed effect on the measurement of the ground bounce in the high speed digital PCB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jih-Jong Lin; Tzong-Lin Wu
Year: 2000
Geometrically extended UTD compared to the classical UTD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sturm, A.; Gonschorek, K.-H.; West, G.
Year: 2000
EMI resulting from signal via transitions through the DC power bus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Cui; Xiaoning Ye; Archambeault, B.; White, D.; Min Li; Drewniak, J.L.
Year: 2000
The EMI benefits of ground plane stitching in multi-layer power bus stacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoning Ye; Hockanson, D.M.; Min Li; Wei Cui; Radu, S.; Drewniak, J.L.; VanDoren, T.P.; Hubing, T.H.; DuBroff, R.E.
Year: 2000
Product safety and electromagnetic compatibility requirements of an a.c. filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Georgerian, R.; Duffy, R.
Year: 2000
A test programme for the shielding effectiveness evaluation of conductive plastic enclosures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ogunsola, A.
Year: 2000
Protection of cables by grounding structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Deursen, A.P.J.; van Helvoort, M.J.A.M.; van Horck, F.B.M.; van der Merwe, J.; van der Laan, P.C.T.
Year: 2000
Measured electromagnetic shielding characteristics of fabric made from metal clad aramid yarn and wire
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoeft, L.O.; Tokarsky, E.W.
Year: 2000
Measured surface transfer impedance of braided cable shields made from metal clad aramid yarn blended with metal wires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoeft, L.O.; Bergsrud, B.; Tokarsky, E.W.
Year: 2000
Absorber and resistor contribution in the GTEM-cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malaric, K.; Bartolic, J.; Modlic, B.
Year: 2000
On the complete theory of coaxial TEM cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Badic, M.; Marinescu, M.-J.
Year: 2000
Improvement of GTEM to OATS correlation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heidemann, M.; Garbe, H.
Year: 2000
A response of switching regulator to conductive noise on AC-mains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nitta, S.; Mutoh, A.; Sugiura, K.
Year: 2000
Theoretical normalized site attenuation calculations by spreadsheet analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barron, M.
Year: 2000
Theoretical procedure to convert anechoic radiated emission measurements to OATS equivalent results for arbitrary radiators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carpio, J.; Molina, J.C.; Guirado, R.
Year: 2000
Comparison of site-to-site measurement reproducibility using UK National Physical Laboratory and Austrian Research Center test sites as a reference
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hall, K.; Pommerenke, D.; Kolb, L.
Year: 2000
Correlation test among EMI measurement sites using a comb generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osabe, K.; Komatsuzaki, T.; Tamara, K.
Year: 2000
Influence of ground conductivity on the over voltages induced on overhead power distribution lines due to an indirect lightning stroke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kannu, P.D.; Thomas, J.
Year: 2000
The grounding requirement for ground facilities against lightning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chai, J.C.; Britting, A.O., Jr.
Year: 2000
Performing GR-1089-CORE lightning and power cross test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Press, J.; Lawrence, J.; Betts, M.; Ngo, J.
Year: 2000
National lightning location network-an alternative approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Serghei, F.; Sangkasaad, S.
Year: 2000
Grounding requirements to assure people and equipment safety against lightning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Portela, C.
Year: 2000
Parallel computing environments and methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fadlallah, G.; Lavoie, M.; Dessaint, L.-A.
Year: 2000
C++2MPI: a software tool for automatically generating MPI datatypes from C++ classes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hillson, R.; Iglewski, M.
Year: 2000
Towards more powerful and flexible synchronization primitives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Borkowski, J.
Year: 2000
Cellular automata approach to scheduling problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Swiecicka, A.; Seredynski, F.
Year: 2000
Introduction of the speaking rate in the model of speech recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yousfi, A.; Meziane, A.
Year: 2000
Fault tolerance for an embedded wormhole switched network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hotchkiss, R.; O'Neill, B.C.; Clark, S.
Year: 2000
Program graph scheduling in the look-ahead reconfigurable multiprocessor system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laskowski, E.
Year: 2000
Reduction of waiting time in retrieving images utilizing image directories with sketched image as key
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, K.; Nagao, M.; Ikeda, H.
Year: 2000
Numerical calculation of electromagnetic problems on an SCI based PC-cluster
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trinitis, C.; Eberl, M.; Karl, W.
Year: 2000
Implementation of a real-time distributed network simulator with PC-cluster
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marti, J.R.; Hollman, J.A.; Calvino-Fraga
Year: 2000
A parallel processing technique for electrical tree growth in solid insulating materials using cellular automata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piriyakumar, A.L.; Levi, P.; Jayaganthan, R.; Sarathi, R.
Year: 2000
IP/ATM solution for accelerating Internet services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:El Adnani, A.; Clausen, H.D.; Ouahman, A.A.
Year: 2000
Web-based endoscopy recommender system-ERS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krawczyk, H.; Knopa, R.; Kopczynska, K.; Lipczynski, M.
Year: 2000
A domain-decomposition/reciprocity technique for the analysis of arbitrarily-shaped dielectric-loaded microstrip antennas mounted on circularly-cylindrical platforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.J. Allard; D.H. Werner; J.S. Zmyslo
Year: 2000
Fast solution of EM scattering by large finite array of strips on a grounded dielectric slab
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.G. Rojas
Year: 2000
Combined MR-IMC approach to the simulation of printed antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Pirinoli; Z. Baharav; G. Vecchi
Year: 2000
The tether-free world and wireless technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.W. Mink
Year: 2000
High frequency Green's function for tapered planar arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Capolino; S. Maci; F. Mariottini; L.B. Felsen
Year: 2000
Beam synthesis in linearly polarized radial line slot array antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.W. Davis; M.E. Bialkowski
Year: 2000
76 GHz post-wall waveguide fed parallel plate slot arrays for car-radar applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hirokawa; M. Ando
Year: 2000
Field distribution in multi-mode rectangular waveguides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kai; J. Hirokawa; M. Ando
Year: 2000
Radiation pattern of magnetic line current placed near the edge of a semi-infinite dielectric structure with small vertical metallic wall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Volski; G. Vandenbosch
Year: 2000
Microstrip with truncated substrate by synthetic asymptotes. A novel analysis technique for formulas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.C. Tang; Y.L. Chow
Year: 2000
Efficient analysis of microstrip structures with multiple discontinuities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Radhakrishnan; W.C. Chew
Year: 2000
Concepts of the Square Kilometre Array; toward the new generation radio telescopes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Van Ardenne
Year: 2000
THousand Element Array (THEA)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.B. Smolders; G.W. Kant
Year: 2000
A wideband sparse fractal array antenna for low frequency radio astronomy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.B. Bregman; G.H. Tan; W. Cazemier; C. Craeye
Year: 2000
The Luneburg lens as a radio telescope element
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.J. Parfitt; J.S. Kot; G.L. James
Year: 2000
TSA element design for 500-1500 MHz array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.H. Schaubert; T.-H. Chio; H. Holter
Year: 2000
Arraying high gain antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.B. Dybdal; K.M. SooHoo
Year: 2000
A Rotman lens feed network for a hexagonal array of oversized radiating elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.K. Chan; S.K. Rao
Year: 2000
An analytical model of the effective parameters of regular arrays of dipoles: from quasi-statics to PBG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Tretyakov; A.J. Viitanen
Year: 2000
Improved and simpler FDTD formulation for axisymmetrical problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Celuch-Marcysiak; W.K. Gwarek
Year: 2000
Investigation of multithread FDTD schemes for faster analysis on multiprocessor PCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sypniewski; J. Rudnicki; M. Celuch-Marcysiak
Year: 2000
A novel variant of dual polarized CPW fed patch antenna for broadband wireless communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Hettak; G.Y. Delisle; M.G. Stubbs
Year: 2000
Microwave imaging of radially inhomogeneous cylindrical bodies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J. Akhtar; A.S. Omar
Year: 2000
Switched fragmented aperture antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Maloney; M.P. Kesler; L.M. Lust; L.N. Pringle; T.L. Fountain; P.H. Harms; G.S. Smith
Year: 2000
Reconfigurable aperture decade bandwidth array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Veihl; R.E. Hodges; D. McGrath; C. Monzon
Year: 2000
Photonic band-gap (PBG) versus effective refractive index: a case study of dielectric nanocavities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Mosallaei; Y. Rahmat-Samii
Year: 2000
Surface-wave guiding using periodic structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Byers; I. Rumsey; Z. Popovic; M. Piket-May
Year: 2000
Surface waves and leaky waves in integrated circuit structures with planar periodic dipole loading
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reonghee Kim; H.Y.D. Yang
Year: 2000
Novel 1-D photonic bandgap microstrip transmission line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quan Xue; Kam Man Shum; Chi Hou Chan
Year: 2000
Anomalous absorption in metallic optical photonic bandgaps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Blair
Year: 2000
On the relations of microscopic and averaged material parameters in composite media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.A. Belov; C.R. Simovski; M.S. Kondratjev
Year: 2000
Electromagnetic characterisation of building materials at 5.8 GHz using transmission and reflection measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Cuinas; M.G. Sanchez
Year: 2000
Computation of the effective propagation constants for a planar interface between two lossy uniaxial media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.E. Roy
Year: 2000
Mathematical investigation of modified edge representation [electromagnetic scattering]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Cui; M. Ando
Year: 2000
EM scattering from edges in anisotropic impedance surfaces with arbitrarily oriented anisotropy axes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Manara; P. Nepa; G. Pelosi; A. Vallecchi
Year: 2000
Application of the parabolic equation method to the scattering from a diaphanous wedge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.D. Graglia; G. Lisi; G. Pelosi; S. Selleri
Year: 2000
Scattering by narrow impedance cones: leading asymptotic terms for the diffraction coefficients
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M.L. Bernard; M.A. Lyalinov
Year: 2000
The magnetic physical optics scattered field in terms of a line integral
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Meincke; O. Breinbjerg; E. Jorgensen
Year: 2000
Scattering characteristics of dielectric periodic structures in the case of oblique incidence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Li; Xu Shanjia; Wu Xianliang
Year: 2000
Numerical diffraction coefficients of 2-D irregular wedge-a GMT/PO approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Zhong
Year: 2000
Analytical formulation for acousto-electromagnetic scattering behavior of a dielectric cylinder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.E. Lawrence; K. Sarabandi
Year: 2000
A comparison and verification of 2D and 3D ray tracing propagation. Models for land mobile satellite communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Dottling; A. Jahn; W. Wiesbeck
Year: 2000
Fields of an infinitesimal dipole radiating near an impedance half-space by application of exact image theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.D. Casciato; K. Sarabandi
Year: 2000
The DOA estimation by delay profile measurement using the sector antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Mori; H. Arai; Y. Ebine
Year: 2000
Mobile broadcast geostationary satellite system propagation measurements using GPS signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hatsuda; Y. Yamada; J. Osada; T. Kobayasi; T. Kato; Y. Aoki
Year: 2000
Point-based implementation of multilevel fast multipole algorithm for higher-order Galerkin's method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Donepudi; J.M. Song; J.M. Jin; G. Kang; W.C. Chew
Year: 2000
K-band planar antenna array fed through loop transitions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Zepeda; J. Navarro; Kai Chang
Year: 2000
Dual-polarized cross-mesh array antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kawano; H. Nakano
Year: 2000
Aperture size reduction using sub-beam design concepts for multiple spot beam satellites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.I. Zaghloul; O. Kilic; A.E. Williams
Year: 2000
Application of GTD/UTD method to the analysis of the SPORT antenna on board the ISS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Gutierrez; I. Gonzalez; M.F. Catedra
Year: 2000
In-orbit satellite antenna measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.D. Kelley; J.W. Opiekun; S.L. Teller
Year: 2000
An elliptical aperture dual shaped reflector antenna for SNG applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Skyttemyr
Year: 2000


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