E-commerce extended platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuilboer, J.-P.
Year: 2000
Building flexible mobile applications for next generation enterprises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karunanithi, K.; Haneef, K.; Cordioli, B.; Umar, A.; Jain, R.
Year: 2000
Key learnings from the electronic commerce journey at Kodak
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Foster, J.A.
Year: 2000
Telemedicine systems for collaborative diagnosis over the Internet: towards virtual "collaboratories"
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sacile, R.
Year: 2000
Subscriber based TDOA location techniques for the Motorola iDEN system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birchler, M.; Jasper, S.; Oros, N.; Jones, D.; Makhlouf, S.; Tziortzis, A.
Year: 2000
A local/global strategy based on signal strength for message routing in wireless mobile ad-hoc networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tien-Chung Tien; Upadhyaya, S.J.
Year: 2000
Mediating negotiations in a virtual enterprise via mobile agents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Szirbik, N.; Aerts, A.; Wortmann, H.; Hammer, D.; Goossenaerts, J.
Year: 2000
Mobile computing: wireless access to multimedia applications and its implications for a campus network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boggess, J.; Eckstrom, D.; Neri, F.
Year: 2000
Process-based service integration for zero latency supply chains in virtual enterprises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Georgakopoulos, D.; Cichocki, A.; Schluster, H.; Baker, D.
Year: 2000
An interpreter for adaptable supply chain planning algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Webster, S.
Year: 2000
Engineering resource management for the information grid and the emerging role of e-commerce
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwiat, K.A.
Year: 2000
Neural networks and customer grouping in e-commerce: a framework using fuzzy ART
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sungjune Park
Year: 2000
eFlow: a platform for developing and managing composite e-services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Casati, F.; Ilnicki, S.; Li-Jie Jin; Krishnamoorthy, V.; Ming-Chien Shan
Year: 2000
Exploiting the overlap of security and fault-tolerance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hardekopf, B.; Kwiat, K.
Year: 2000
Microwave noise of Si/Si/sub 0.6/Ge/sub 0.4/ heterojunction bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mohammadi; L.-H. Lu; Z. Ma; L.P.B. Katehi; P.K. Bhattacharya; G.E. Ponchak; E.T. Croke
Year: 2000
Microwave noise of Si/Si/sub 0.6/Ge/sub 0.4/ heterojunction bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mohammadi; L.H. Lu; Z. Ma; L.P.B. Katehi; P.K. Bhattacharya; G.E. Ponchak; E.T. Croke
Year: 2000
Self-steered silicon receiver array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.F. Fusco; Q. Chen; H.S. Gamble; B.M. Armstrong
Year: 2000
The effects of geometrical scaling on the RF performance of SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiming Zhang; Guofu Niu; A.J. Joseph; G. Freeman; D.L. Harame
Year: 2000
Silicon and soft-board millimetre wave antennas for broad-band mobile wireless
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Q. Chen; T. Brabetz
Year: 2000
High performance integrated spiral inductors based on a minimum AC difference voltage principle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Pierschel; G.G. Fischer; T. Grabolla; A. Wolff
Year: 2000
Si MMIC quadrature hybrid coupler for 1.35 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Abele; D. Behammer; U. Erben; M. Meilchen; P. Maier; K.-B. Schad; E. Sonmez; H. Schumacher
Year: 2000
Characterization of a bulk-micromachined post-process module: for silicon RF technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.T. Ng; N.P. Pham; L.P.M. Sarro; B. Rejaei; J.N. Burghartz
Year: 2000
Analysis of generic spiral-coil RF transformers on silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.T. Ng; T.R. de Kruijff; M. Soyuer; J.N. Burghartz
Year: 2000
High-Q X-band and K-band micromachined spiral inductors for use in Si-based integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liang-Hung Lu; G.E. Ponchak; P. Bhattacharya; L.P.B. Katehi
Year: 2000
K-band capacitive MEMS-switches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ulm; T. Walter; R. Mueller-Fiedler; K. Voigtlaender; E. Kasper
Year: 2000
Closed form inductance calculation for integrated spiral inductor compact modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Jenei; B. Nauwelaers; S. Decoutere; A. Naem
Year: 2000
Parameter extraction of SiGe HBTs for a scalable MEXTRAM model and performance verification by a SiGe HBT MMIC active receive mixer design for 11 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Sonmez; W. Durr; P. Abele; K.-B. Schad; H. Schumacher
Year: 2000
Non-linear noise mechanisms in SiGe BiCMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Regis; M. Borgarino; S. Kovacic; H. Lafontaine; O. Llopis; E. Tournier; L. Bary; R. Plana
Year: 2000
Materials optimization for high power silicon germanium heterostructure bipolar transistors at X-band frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.H. Mueller; E.T. Croke
Year: 2000
At-speed testing of delay faults for Motorola's MPC7400, a PowerPC/sup TM/ microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tendolkar, N.; Molyneaux, R.; Pyron, C.; Raina, R.
Year: 2000
On testing the path delay faults of a microprocessor using its instruction set
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Cheng Lai; Krstic, A.; Kwang-Ting Cheng
Year: 2000
Low power/energy BIST scheme for datapaths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gizopoulos, D.; Krantitis, N.; Paschalis, A.; Psarakis, M.; Zorian, Y.
Year: 2000
Low power BIST via non-linear hybrid cellular automata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corno, F.; Rebaudengo, M.; Reorda, M.S.; Squillero, G.; Violante, M.
Year: 2000
Static compaction techniques to control scan vector power dissipation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sankaralingam, R.; Oruganti, R.R.; Touba, N.A.
Year: 2000
Silicon-on-insulator technology impacts on SRAM testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adams, R.D.; Shephard, P., III
Year: 2000
Self-checking circuits versus realistic faults in very deep submicron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anghel, L.; Nicolaidis, M.; Alzaher-Noufal, I.
Year: 2000
BSM2: next generation boundary-scan master
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Higgins, F.P.; Srinivasan, R.
Year: 2000
Virtual scan chains: a means for reducing scan length in cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jas, A.; Pouya, B.; Touba, N.A.
Year: 2000
A rapid and scalable diagnosis scheme for BIST environments with a large number of scan chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghosh-Dastidar, J.; Touba, N.A.
Year: 2000
A framework to minimize test escape and yield loss during I/sub DDQ/ testing: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheung, H.; Gupta, S.K.
Year: 2000
Path selection for delay testing of deep sub-micron devices using statistical performance sensitivity analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing-Jia Liou; Kwang-Ting Cheng; Mukherjee, D.A.
Year: 2000
Test data compression for system-on-a-chip using Golomb codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chandra, A.; Chakrabarty, K.
Year: 2000
Design of system-on-a-chip test access architectures using integer linear programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakrabarty, K.
Year: 2000
Test generation for accurate prediction of analog specifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Voorakaranam, R.; Chatterjee, A.
Year: 2000
A comprehensive TDM comparator scheme for effective analysis of oscillation-based test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roh, J.; Abraham, J.A.
Year: 2000
Test selection based on high level fault simulation for mixed-signal systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ozev, S.; Orailoglu, A.
Year: 2000
Integrating logic BIST in VLSI designs with embedded memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chickermane, V.; Richter, S.; Barnhart, C.
Year: 2000
Synthesis for arithmetic built-in self-test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stroele, A.P.
Year: 2000
Cold delay defect screening
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chao-Wen Tseng; Mccluskey, E.J.; Xiaoping Shao; Wu, D.M.
Year: 2000
Thermal testing: fault location strategies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Altet, J.; Rubio, A.; Schaub, E.; Dialhaire, S.; Claeys, W.
Year: 2000
Detection of CMOS defects under variable processing conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Germida, A.; Plusquellic, J.
Year: 2000
SIFAR: static test compaction for synchronous sequential circuits based on single fault restoration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xijiang Lin; Wu-Tung Cheng; Pomeranz, I.; Reddy, S.M.
Year: 2000
Space compaction of test responses for IP cores using orthogonal transmission functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seuring, M.; Chakrabarty, K.
Year: 2000
ESIM: a multimodel design error and fault simulator for logic circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Al-Asaad, H.; Hayes, J.P.
Year: 2000
An effective defect-oriented BIST architecture for high-speed phase-locked loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, S.; Soma, M.; Risbud, D.
Year: 2000
Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tofte, J.A.; Chee-Kian Ong; Jiun-Lang Huang; Kwang-Ting Cheng
Year: 2000
Hardware resource minimization for histogram-based ADC BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renovell, M.; Azais, F.; Bernard, S.; Bertrand, Y.
Year: 2000
DEFUSE: a deterministic functional self-test methodology for processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, L.; Dey, S.
Year: 2000
Testing, verification, and diagnosis in the presence of unknowns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jain, A.; Boppana, V.; Mukherjee, R.; Jain, J.; Fujita, M.; Hsiao, M.
Year: 2000
Using arithmetic transform for verification of datapath circuits via error modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Radecka, K.; Zilic, Z.
Year: 2000
Functional memory faults: a formal notation and a taxonomy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van de Goor, Ad.J.; Al-Ars, Z.
Year: 2000
Simulation-based test algorithm generation for random access memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chi-Feng Wu; Chih-Tsun Huang; Kuo-Liang Cheng; Cheng-Wen Wu
Year: 2000
Detection of inter-port faults in multi-port static RAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao, J.; Irrinki, S.; Puri, M.; Lombardi, F.
Year: 2000
Detectability conditions for interconnection open defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Champac, V.H.; Zenteno, A.
Year: 2000
A technique for logic fault diagnosis of interconnect open defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Venkataraman, S.; Drummonds, S.B.
Year: 2000
Fault detection methodology and BIST method for 2nd order Butterworth, Chebyshev and Bessel filter approximations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Calvano, J.V.; Alves, V.C.; Lubaszewski, M.
Year: 2000
Bounding circuit delay by testing a very small subset of paths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharma, M.; Patel, J.H.
Year: 2000
On test set generation for efficient path delay fault diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tekumalla, R.C.
Year: 2000
A low-speed BIST framework for high-performance circuit testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Speek, H.; Kerkhoff, H.G.; Shashaani, M.; Sachdev, M.
Year: 2000
Hidden Markov and independence models with patterns for sequential BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brehelin, L.; Gascuel, O.; Caraux, G.; Girard, P.; Landrault, C.
Year: 2000
Reducing test application time for built-in-self-test test pattern generators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamzaoglu, I.; Patel, J.H.
Year: 2000
Linear independence as evaluation criterion for two-dimensional test pattern generators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mrugalski, G.; Tyszer, J.; Rajski, J.
Year: 2000
Extraction of peak-to-peak and RMS sinusoidal jitter using an analytic signal method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, T.J.; Soma, M.; Ishida, M.; Watanabe, T.; Ohmi, T.
Year: 2000
Crosstalk effect removal for analog measurement in analog test bus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chauchin Su; Yue-Tsang Chen
Year: 2000
High-level observability for effective high-level ATPG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corno, F.; Reorda, M.S.; Squillero, G.
Year: 2000
Testability alternatives exploration through functional testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferrandi, F.; Ferrara, G.; Fornara, G.; Fummi, F.; Sciuto, D.
Year: 2000
Efficient diagnosis of single/double bridging faults with Delta Iddq probabilistic signatures and Viterbi algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thibeault, C.
Year: 2000
Delta Iddq for testing reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Powell, T.J.; Pair, J.; St. John, M.; Counce, D.
Year: 2000
Clustering based evaluation of I/sub DDQ/ measurements: applications in testing and classification of ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jandhyala, S.; Balachandran, H.; Sengupta, M.; Jayasumana, A.P.
Year: 2000
Fault escapes in duplex systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitra, S.; Saxena, N.R.; McCluskey, E.J.
Year: 2000
Invariance-based on-line test for RTL controller-datapath circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makris, Y.; Bayraktaroglu, I.; Orailoglu, A.
Year: 2000
Master/slave computing on the Grid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shao, G.; Berman, F.; Wolski, R.
Year: 2000
Evaluation of PAMS' adaptive management services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, Y.; Hariri, S.; Djunaedi, M.
Year: 2000
Toward quality of security service in a resource management system benefit function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Irvine, C.E.; Levin, T.E.
Year: 2000
Optimising heterogeneous task migration in the Gardens virtual cluster computer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beitz, A.; Kent, S.; Roe, P.
Year: 2000
Linear algebra algorithms in a heterogeneous cluster of personal computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barbosa, J.; Tavares, J.; Padilha, A.J.
Year: 2000
Reliable cluster computing with a new checkpointing RAID-x architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hwang, K.; Hai Jin; Ho, R.; Ro, W.
Year: 2000
Task execution time modeling for heterogeneous computing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ali, S.; Siegel, H.J.; Maheswaran, M.; Hensgen, D.; Ali, S.
Year: 2000
Distributed quasi-Monte Carlo methods in a heterogeneous environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:deDoncker, E.; Zanny, R.; Ciobanu, M.; Guan, Y.
Year: 2000
Scheduling multi-component applications in heterogeneous wide-area networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weissman, J.B.
Year: 2000
Application-aware scheduling of a magnetohydrodynamics application in the Legion metasystem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dail, H.; Obertelli, G.; Berman, F.; Wolski, R.; Grimshaw, A.
Year: 2000
Combining workstations and supercomputers to support grid applications: the parallel tomography experience
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smallen, S.; Crine, W.; Frey, J.; Berman, F.; Wolski, R.; Mei-Hui Su; Kesselman, C.; Young, S.; Ellisman, M.
Year: 2000
Heterogeneous resource management for dynamic real-time systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eui-Nam Huh; Welch, L.R.; Shirazi, B.A.; Cavanaugh, C.D.
Year: 2000
Tunneling current characteristics and oxide breakdown in P+ poly gate PFET capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McKenna, J.M.; Wu, E.Y.; Shih-Hsien Lo
Year: 2000
Temperature dependence of soft breakdown and wear-out in sub-3 nm SiO/sub 2/ films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suehle, J.S.; Vogel, E.M.; Bin Wang; Bernstein, J.B.
Year: 2000
Investigation of ultra-thin gate oxide reliability behavior by separate characterization of soft breakdown and hard breakdown
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pompl, T.; Wurzer, H.; Kerber, M.; Eisele, I.
Year: 2000
Evidence for recombination at oxide defects and new SILC model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ielmini, D.; Spinellii, A.S.; Lacaita, A.L.; Ghidini, G.
Year: 2000
Experimental analysis of gate oxide degradation-existence of neutral trap precursor, single and multiple trap-assisted-tunneling for SILC mechanism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamada, R.; Yugami, J.; Ohkura, M.
Year: 2000
Temperature effect on the reliability of ZrO/sub 2/ gate dielectric deposited directly on silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Jie Qi; Nieh, R.; Onishi, R.; Byoung Hun Lee; Laegu Kang; Yongjoo Jeon; Gopalan, S.; Lee, J.C.
Year: 2000
Channel-width dependent hot-carrier degradation of thin-gate pMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, Y.-H.; Wu, K.; Linton, T.; Mielke, N.; Hu, S.; Wallace, B.
Year: 2000
The role of the spacer oxide in determining worst-case hot-carrier stress conditions for NMOS LDD devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:King, E.E.; Lacoe, R.C.; Wang-Ratkovic, J.
Year: 2000
Analysis of hot-carrier-induced degradation in MOSFETs by gate-to-drain and gate-to-substrate capacitance measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsu, C.T.; Lau, M.M.; Yeow, Y.T.; Yao, Z.Q.
Year: 2000
Hot carrier induced degradation in deep submicron MOSFETs at 100/spl deg/C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, E.; Rosenbaum, E.; Register, L.F.; Tao, J.; Fang, P.
Year: 2000
Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manhas, S.K.; de Souza, M.M.; Gates, A.S.; Chetlur, S.C.; Sankara Narayanan, E.M.
Year: 2000
Reliability characterization of thermal micro-structures implemented on 0.8 /spl mu/m CMOS chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng, L.Y.; de Tandt, C.; Ranson, W.; Vounckx, R.
Year: 2000
Reliability studies of bent-beam electro-thermal actuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Long Que; Jae-Sung Park; Mo-Huang Li; Gianchandani, Y.B.
Year: 2000
Nontactile reliability testing of a micro optical attenuator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rembe, C.; Aschemann, H.; aus der Wiesche, S.; Hofer, E.P.; Debeda, H.; Mohr, J.; Wallrabe, U.
Year: 2000
Hot carrier reliability of lateral DMOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O'Donovan, V.; Whiston, S.; Deignan, A.; Chleirigh, C.N.
Year: 2000
Role of hydrogen anneal in thin gate oxide for multi-metal-layer CMOS process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, Y.-H.; Nachman, R.; Seshan, K.; Kau, D.-C.; Mielke, N.
Year: 2000
Analysis of evolution to and beyond quasi-breakdown in ultra-thin oxide and oxynitride
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okandan, M.; Fonash, S.J.; Maiti, B.; Tseng, H.H.; Tobin, P.
Year: 2000
A new data retention mechanism after endurance stress on flash memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kameyama, H.; Okuyama, Y.; Kamohara, S.; Kubota, K.; Kume, H.; Okuyama, K.; Manabe, Y.; Nozoe, A.; Uchida, H.; Hidaka, M.; Ogura, K.
Year: 2000
Failure analysis and stress simulation in small multichip BGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moore, T.; Jarvis, J.
Year: 2000
Short and long-term stability problems of Hall plates in plastic packages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manic, D.; Petr, J.; Popovic, R.S.
Year: 2000
Pulsed measurements and circuit modeling of a new breakdown mechanism of MESFETs and HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zanoni, E.; Meneghesso, G.; Buttari, D.; Maretto, M.; Massari, G.
Year: 2000
Reliability of optical fiber Bragg grating sensors at elevated temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sennhauser, U.; Frank, A.; Mauron, P.; Nellen, P.M.
Year: 2000
ESD robustness of smart-power protection structures evaluated by means of HBM and TLP tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meneghesso, G.; Santirosi, S.; Novarini, E.; Contiero, C.; Zanoni, E.
Year: 2000
Analysis of oxide breakdown mechanism occurring during ESD pulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leroux, C.; Andreucci, P.; Reimbold, G.
Year: 2000
Microanalysis of VLSI interconnect failure modes under short-pulse stress conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Banerjee, K.; Dae-Yong Kim; Amerasekera, A.; Chenming He; Wong, S.S.; Goodson, K.E.
Year: 2000
Transmission line model testing of top-gate amorphous silicon thin film transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tosic, N.; Kuper, F.G.; Mouthaan, T.
Year: 2000
Simulation and experimental study of temperature distribution during ESD stress in smart-power technology ESD protection structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Esmark, K.; Furbock, C.; Gossner, H.; Groos, G.; Litzenberger, M.; Pogany, D.; Zelsacher, R.; Stecher, M.; Gornik, E.
Year: 2000
Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Voldman, S.; Juliano, P.; Johnson, R.; Schmidt, N.; Joseph, A.; Furkay, S.; Rosenbaum, E.; Dunn, J.; Harame, D.; Meyerson, B.
Year: 2000
The role of copper in electromigration: the effect of a Cu-vacancy binding energy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tammaro, M.
Year: 2000
Effect of Ti insertion between Cu and TiN layers on electromigration reliability in Cu/(Ti)/TiN/Ti layered damascene interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abe, K.; Tokitoh, S.; Shih-Chang Chen; Kanamori, J.; Onoda, H.
Year: 2000
Conduction processes in Cu/low-K interconnection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bersuker, G.; Blaschke, V.; Choi, S.; Wick, D.
Year: 2000
Experimental data and statistical models for bimodal EM failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fischer, A.H.; Abel, A.; Lepper, M.; Zitzelsberger, A.E.; von Glasow, A.
Year: 2000
A model for evaluating cumulative oxide damage from multiple plasma processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noguchi, K.; Matsumoto, A.; Oda, N.
Year: 2000
On-chip probes for silicon defectivity ranking and mapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zanchi, A.; Zappa, F.; Ghioni, M.; Morrison, A.P.
Year: 2000
Detection of thin oxide (3.5 nm) dielectric degradation due to charging damage by rapid-ramp breakdown
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hook, T.B.; Harmon, D.; Chuan Lin
Year: 2000
Charge pumping technique for the evaluation of plasma induced edge damage in shallow S/D extension thin gate oxide NMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung, S.S.; Chen, S.J.; Kao, H.L.; Luo, S.J.; Lin, H.C.
Year: 2000
Quantitative thermal probing of devices at sub-100 nm resolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Shi; Ohmyoung Kwon; Guanghua Wu; Majumdar, A.
Year: 2000
Electrical probing of deep sub-micron ICs using scanning probes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krieg, K.; Qi, R.; Thomson, D.; Bridges, G.
Year: 2000
Reliability assessment through defect based testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lisenker, B.; Mitnick, Y.
Year: 2000
Localizing power to ground shorts in a chips-first MCM by scanning SQUID microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vanderlinde, W.E.; Cheney, M.E.; McDaniel, E.B.; Skinner, K.L.; Knauss, L.A.; Frazier, B.M.; Christen, H.M.
Year: 2000
Single contact optical beam induced currents (SCOBIC)-a new failure analysis technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin, J.M.; Phang, J.C.H.; Chan, D.S.H.; Soh, C.E.; Gilfeather, G.
Year: 2000
Low-power task scheduling for multiple devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yung-Hsiang Lu; L. Benini; G. De Micheli
Year: 2000
Fast performance prediction for periodic task systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaobo Hu; Gang Quan
Year: 2000
Performance estimation of multiple-cache IP-based systems: case study of an interdependency problem and application of an extended shared memory model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sungjoo Yoo; Kyoungseok Rha; Youngchul Cho; Jinyong Jung; Kyoung Choi
Year: 2000
Automatic test bench generation for simulation-based validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lajolo, M.; Lavagno, L.; Rebaudengo, M.
Year: 2000
Parallel computation for chromosome reconstruction on a cluster of workstations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhandarkar, S.M.; Machaka, S.A.; Shete, S.S.; Arnold, J.
Year: 2000
Parallel maximum-likelihood inversion for estimating wavenumber-ordered spectra in emission spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:El-Sayed, H.; Salit, M.; Travis, J.; Devaney, J.; George, W.
Year: 2000
Parallel performance study of Monte Carlo photon transport code on shared-, distributed-, and distributed-shared-memory architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Majumdar, A.
Year: 2000
Scheduling with advanced reservations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, W.; Foster, I.; Taylor, V.
Year: 2000
Exploration of the spatial locality on emerging applications and the consequences for cache performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kampe, M.; Dahlgren, F.
Year: 2000
Register assignment for software pipelining with partitioned register banks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiser, J.; Carr, S.; Sweany, P.; Beaty, S.J.
Year: 2000
Applying interposition techniques for performance analysis of OPENMP parallel applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gonzalez, M.; Serra, A.; Martorell, X.; Oliver, J.; Ayguade, E.; Labarta, J.; Navarro, N.
Year: 2000
FIMD-MPI: a tool for injecting faults into MPI application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blough, D.M.; Peng Liu
Year: 2000
Skiplist-based concurrent priority queues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shavit, N.; Lotan, I.
Year: 2000
Efficient binary morphological algorithms on a massively parallel processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Svolos, A.I.; Konstantopoulos, C.G.; Kaklamanis, C.
Year: 2000
Speed vs. accuracy in simulation for I/O-intensive applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyeonsang Eom; Hollingsworth, J.K.
Year: 2000
Optimal on demand packet scheduling in single-hop multichannel communication systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bonuccelli, M.A.; Pelagatti, S.
Year: 2000
VisOK: a flexible visualization system for distributed Java object application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-Woo Lee; Ramakrishna, R.S.
Year: 2000
Bounded-response-time self-stabilizing OPS5 production systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng, A.M.K.; Fujii, S.
Year: 2000
Optimizing retrieval and processing of multi-dimensional scientific datasets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chialin Chang; Kurc, T.; Sussman, A.; Saltz, J.
Year: 2000
Buffered coscheduling: a new methodology for multitasking parallel jobs on distributed systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Petrini, F.; Wu-Chun Feng
Year: 2000
Job scheduling that minimizes network contention due to both communication and I/O
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mache, J.; Lo, V.; Garg, S.
Year: 2000
Template based structured collections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nolte, J.; Sato, M.; Ishikawa, Y.
Year: 2000
Bandwidth-efficient collective communication for clustered wide area systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kielmann, T.; Bal, H.E.; Gorlatch, S.
Year: 2000
Replicating the contents of a WWW multimedia repository to minimize download time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Loukopoulos, T.; Ahmad, I.
Year: 2000
Enhancing NWS for use in an SNMP managed internetwork
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Busby, R.E., Jr.; Neilsen, M.L.; Andresen, D.
Year: 2000
High performance parametric modeling with Nimrod/G: killer application for the global grid?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramson, D.; Giddy, J.; Kotler, L.
Year: 2000
Space and time efficient self-stabilizing and l-exclusion in tree networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hadid, R.
Year: 2000
Are global computing systems useful? Comparison of client-server global computing systems Ninf, NetSolve versus CORBA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzumura, T.; Nakagawa, T.; Matsuoka, S.; Nakada, H.; Sekiguchi, S.
Year: 2000
Thread migration and load balancing in non-dedicated environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thitikamol, K.; Keleher, P.
Year: 2000
Caching single-assignment structures to build a robust fine-grain multi-threading system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Yen Lin; Gaudiot, J.-L.; Amaral, J.N.; Gao, G.R.
Year: 2000
Fair and efficient packet scheduling in wormhole networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanhere, S.S.; Parekh, A.B.; Sethu, H.
Year: 2000
Fault-tolerant wormhole routing algorithms in meshes in the presence of concave faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Park, S.; Youn, J.-H.; Bose, B.
Year: 2000
ACDS: Adapting computational data streams for high performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Isert, C.; Schwan, K.
Year: 2000
A component framework for communication in distributed applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fischer, J.M.; Ercegovac, M.D.
Year: 2000
Performance of the IBM general parallel file system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jones, T.; Koniges, A.; Yates, R.K.
Year: 2000
Fast synchronization on scalable cache-coherent multiprocessors using hybrid primitives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nikolopoulos, D.S.; Papatheodorou, T.S.
Year: 2000
Predicting performance on SMPs. A case study: the SGI Power Challenge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amato, N.M.; Perdue, J.; Pietracaprina, A.; Pucci, G.; Mathis, M.
Year: 2000
An optimal parallel algorithm for computing moments on arrays with reconfigurable optical buses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Hsiung Wu; Shi-Jinn Horng; Horng-Ren Tsai; Jinn-Fu Lin; Tsrong-Lay Lin
Year: 2000
Relating two-dimensional reconfigurable meshes with optically pipelined buses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bourgeois, A.G.; Trahan, J.L.
Year: 2000
Optimal all-to-all personalized exchange in a class of optical multistage networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, Y.; Wang, J.
Year: 2000
Wavelengths requirement for permutation routing in all-optical multistage interconnection networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qian-Pin Gu; Peng, S.
Year: 2000
De Bruijn isomorphisms and free space optical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coudert, D.; Ferreira, A.; Perennes, S.
Year: 2000
On optimal fill-preserving orderings of sparse matrices for parallel Cholesky factorizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Yang Lin; Chuen-Liang Chen
Year: 2000
Study of a multilevel approach to partitioning for parallel logic simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subramanian, S.; Rao, D.M.; Wilsey, P.A.
Year: 2000
Optimal resource allocation for multi-service networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simon, R.; Jukic, B.; Woan Sun Chang
Year: 2000
Modeling and simulation of a fault tolerant ATM switching architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anan, M.; Guizani, M.
Year: 2000
Specifying truck movement in traffic models using cell-DEVS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davidson, A.; Wainer, G.
Year: 2000
Handling behavioral components in multi-level concurrent fault simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lentz, K.P.; Homer, J.B.
Year: 2000
Field, circuit, and visualization based simulation methodology for passive electronic components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beker, B.; Cokkinides, G.; Sechrest, M.
Year: 2000
Multiresolution behavioral modeling in a virtual environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koldas, G.; Isler, V.
Year: 2000
Approaches to cognitive system simulation: architectures and animations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reilly, K.D.; Bray, N.W.; Jackson, M.
Year: 2000
An analytic method for predicting simulation parallelism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong Wang; Yong Meng Teo; Seng Chuan Tay
Year: 2000
Mean estimation based on phi-mixing sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, E.J.; Kelton, W.D.
Year: 2000
Sequential dynamical systems and applications to simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barrett, C.I.; Bush, B.W.; Kopp, S.; Mortveit, H.S.; Reidys, C.M.
Year: 2000
First results on formal comparison of several stochastic optimization algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spall, J.C.; Hill, S.D.; Stark, D.R.
Year: 2000
Simulation-trace-based component performance prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, J.J.; Horgan, J.R.
Year: 2000
A neural network used for PD pattern recognition in large turbine generators with genetic algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guangning Wu
Year: 2000
Development of continuous partial discharge monitoring system for generator stator insulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Joo Kim; Don-Ha Hwang; Byoung-Chol Shin; Doh-Young Park; Jeong-Woo Kim
Year: 2000
A study about the influence of the rise-time of quasi-square voltages on the aging by partial discharges of a polymeric film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Centurioni, L.; Coletti, G.; Guastavino, F.
Year: 2000
Carrier jumping over a potential barrier at the interface of LDPE laminated dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, T.; Ito, T.; Tanaka, Y.; Takada, T.
Year: 2000
Electrical properties of PET films with semiconducting/interface layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Park, D.-H.; Kim, D.-S.
Year: 2000
Influence of processing parameters on electrical insulation properties for epoxy-resin materials-an investigation by experiment and finite element analysis simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaindl, A.; Schon, L.; Rockelein, R.; Borsi, H.
Year: 2000
New ferroelectric ceramics for the generation of high energy electric pulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong Ling Wang; Kwan Chi Kao
Year: 2000
Low-k dielectrics for ULSI multilevel interconnections: thickness-dependent electrical and dielectric properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, H.K.; Shi, F.G.; Zhao, B.; Brongo, M.
Year: 2000
Thermal and electrical characterization of poly(propylene terephthalate)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berti, C.; Bonora, V.; Lotti, N.; Montanari, G.C.; Motori, A.; Munari, A.; Saccani, A.; Sisti, L.
Year: 2000
Experimental investigation of surface charge distribution on insulator in vacuum under impulse voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lijian Ding; Li, C.R.; Jinchun Wang; Zezhong Wang; Xiaochun Chi; Jiaxiang Yang
Year: 2000
An investigation on the influencing factors on on-line insulation monitoring of HV apparatus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baozhuang Shi; Li Yang
Year: 2000
An on-line insulation monitoring system of HV apparatus using a micro-computer system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baozhuang Shi; Li Yang
Year: 2000
A new approach to study the electric strength of insulating materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajan, J.S.; Viswanatha, C.; Dwarakanath, K.
Year: 2000
Influence of high DC electrical fields on some aging properties of XLPE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crine, J.-P.
Year: 2000
Frequency domain response of medium voltage XLPE cable terminations and its influence on cable diagnostics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avellan, A.; Werelius, P.; Eriksson, R.
Year: 2000
The influence of mechanical stresses an the local dielectric strength of HV extruded cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amyot, N.; David, E.; Lee, S.Y.; Lee, I.H.
Year: 2000
Specific materials based on mica papers for fire resistant cable production
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuimov, I.E.; Papkov, A.V.
Year: 2000
Improvement of the return voltage method for water tree detection in XLPE cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Patsch, R.; Jung, J.
Year: 2000
Non-destructive diagnostic testing of service aged MV XLPE cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hvidsten, S.; Faremo, H.; Benjaminsen, J.T.; Ildstad, E.
Year: 2000
A survey of developments in insulation monitoring of power transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ward, B.H.; Lindgren, S.
Year: 2000
Changing insulation systems-benefits and problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clark, M.; Dymond, J.; Hayward, J.; Moore, B.; Snopek, D.; Stranges, N.; Younsi, K.
Year: 2000
A novel, compact instrument for the measurement and evaluation of relaxation currents conceived for on-site diagnosis of electric power apparatus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alff, J.-J.; Der Houhanessian, V.; Zaengl, W.S.; Kachler, A.J.
Year: 2000
Practical application of partial discharge measurements at epoxy impregnated coils for analyzing signal noise in the radio frequency range
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaindl, A.; Nowak, S.; Koschnitzki, T.; Borsi, H.
Year: 2000
The effect of low molecular weight fluid on aging performance of HTV silicone rubber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang, H.; Hackam, R.
Year: 2000
Aging of silicone rubber materials in marine environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gustavsson, T.G.; Gubanski, S.M.; Hillborg, H.; Gedde, U.W.
Year: 2000
An experimental approach to the estimation of the long term corona performance of non-ceramic insulator housings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moreno, V.M.; Goror, R.S.
Year: 2000
Long-term field experience with RTV coated porcelain insulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sorqvist, T.
Year: 2000
Added critical flashover voltage by fiberglass distribution line pole
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grzybowski, S.; Gao, G.; Feilat, E.A.; Mullinax, E.C.
Year: 2000
Critical conditions of AC arc propagation on ice surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farzaneh, M.; Zhang, J.; Chaarani, R.; Fikke, S.M.
Year: 2000
Study of visible discharge onset and development on ice surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farzaneh, M.; Brettschneider, S.; Srivastava, K.D.
Year: 2000
Preliminary results on the effect of an inverter environment on coated and uncoated MW35 twisted pair wires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarjeant, W.J.; Speer, D.R., Jr.; Kell, M.A.; Zimheld, J.L.
Year: 2000
An approach for measuring partial discharges in PWM inverter driven induction machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Busch, M.K.; Hilfert, S.
Year: 2000
Examples of stator winding partial discharge due to inverter drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Campbell, S.R.; Stone, G.C.
Year: 2000
Off line measurements of partial discharges in turn insulation of low voltage rotating machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Neacsu, C.; Bidan, P.; Lebey, T.
Year: 2000
Investigation of the relative impulse strength of magnet wires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilson, C.A.
Year: 2000
A new protection and monitoring system for dry type transformers based on innovative sensor technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Werle, P.; Wasserberg, V.; Borsi, H.; Gockenbach, E.
Year: 2000
On the use of acoustic signals for detection and location of partial discharges in power transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de A. Olivieri, M.M.; Mannheimer, W.A.; Ripper-Neto, A.P.
Year: 2000
Vibro-acoustic method of transformer clamping pressure monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berler, Z.; Golubev, A.; Rusov, V.; Tsvetkov, V.; Patterson, C.
Year: 2000
Development of knowledge rules for RVM for interpretation of the condition of transformer insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Bolhuis, J.P.; Gulski, E.; Smit, J.J.; Urbani, G.M.; Verhaart, H.F.A.
Year: 2000
Fault diagnosis of power transformer based on parsimonious covering set theory integrated with fuzzy logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, L.; Yang, M.Z.; Shang, Y.; Yan, Z.; Jin, X.H.; Wang, C.C.; Cheng, T.C.
Year: 2000
SF/sub 6/-N/sub 2/ gas mixtures-electrical insulation and discharge development under fast oscillating impulse conditions in a non-uniform gap
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schroder, G.
Year: 2000
Characteristics of VFTO generated in a GIS with SF/sub 6/-N/sub 2/ gas mixture as the insulating medium
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Singha, S.; Thomas M, J.; Naidu, M.S.
Year: 2000
Flashover behavior of conducting particle on the spacer surface in compressed N/sub 2/, 90%N/sub 2/+10%SF/sub 6/ and SF/sub 6/ under lightning impulse stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Imano, A.M.; Feser, K.
Year: 2000
Propagation characteristics of UHF electromagnetic waves induced by partial discharge in GIS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiansheng Wang; Yuchang Qiu; Xianghua Wut; Xiaobin Sun
Year: 2000
Comparison of PD phenomena in pure SF/sub 6/ and N/sub 2/-SF/sub 6/ mixtures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meijer, S.; Pharmatrisanti, A.; Gulski, E.; Smit, J.J.; Girodet, A.
Year: 2000
Failure of polyester spacer at low voltage equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moradian, A.R.; Mohseni, M.; Estifa, F.
Year: 2000
The study on partial discharge using light detection method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guangning Wu
Year: 2000
Development and evaluation of a new product line of silicone elastomers for high voltage applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goudie, J.L.; Collins, T.P.; Hoffman, L.W.
Year: 2000
Surface discharge along solid dielectrics in atmospheric air
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heitz, C.; Piemontesi, M.; Salge, G.
Year: 2000
On discharge phenomena in a covered electrode system in air
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sjoberg, M.L.-A.; Blennow, H.J.M.; Gubanski, S.M.; Leijon, M.A.S.
Year: 2000
On-site diagnosis of power and special transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kachler, A.J.
Year: 2000
Assessment of insulation condition of large power transformers by on-site electrical diagnostic methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Braunlich, R.; Hassig, M.; Fuhr, J.; Aschwanden, T.
Year: 2000
Power transformer monitoring using UHF sensors: installation and testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Judd, M.D.; Farish, O.; Pearson, J.S.; Breckenridge, T.; Pryor, B.M.
Year: 2000
The application of new diagnostic protocols for the condition-based assessment of high-voltage electrical equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haupert, T.; Hanson, D.; Savio, L.
Year: 2000
Practical experience in on-line partial discharge measurements of MV switchgear systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berler, Z.; Blokhintsev, I.; Golubev, A.; Paoletti, G.; Rashkes, V.; Romashkov, A.
Year: 2000
Effects of fault arcs on insulating walls in electrical switchgear
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Finke, S.; Koenig, D.; Kaltenborn, U.
Year: 2000
Analysis of the sensitivity of the UHF PD measuring technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meijer, S.; Bovis, A.; Gulski, E.; Smit, J.J.; Girodet, A.
Year: 2000
On-site investigations of gas insulated substations using ion mobility spectrometry for remote sensing of SF/sub 6/ decomposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pilzecker, P.; Baumbach, J.I.; Trindade, E.
Year: 2000
An update on silicone transformer fluid: specification, manufacturing, maintenance and end of life options
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chatterton, W.J.; Goudie, J.L.
Year: 2000
An accelerated aging technique to evaluate the long term performance of high temperature insulating fluids for mobile transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lemm, A.W.
Year: 2000
Parameters governing the AC and LI flashover strength of interfaces between epoxy resin tubes and transformer oil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krins, M.; Borsi, H.; Gockenbach, E.
Year: 2000
Analysis of partial discharge patterns from a rod to plane arrangement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, C.; Su, Q.
Year: 2000
PD detection in power cables using oscillating wave test system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gulski, E.; Wester, F.J.; Smit, J.J.; Seitz, P.N.; Turner, M.
Year: 2000
Digital HVDC partial discharge testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoogenraad, G.; Beyer, J.
Year: 2000
About the influence of the environmental conditions on the partial discharge extinction voltage at high frequency voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pfeiffer, W.; Paede, M.
Year: 2000
Advances in data mining for dissolved gas analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Esp, D.G.; McGrail, A.J.
Year: 2000
Effect of aging on the spectral response of transformer oil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palmer, J.A.; Xianghui Wang; Shoureshi, R.A.; Mander, A.; Torgerson, D.; Rich, C.
Year: 2000
Accelerated aging and diagnostic testing of 115 kV Type U bushings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Braun, J.M.; Densley, R.J.; Sedding, H.G.; Biksa, V.; Yung, C.; Bialek, T.; Nothelfer, A.; Sharp, R.
Year: 2000
Life estimation of DC insulation systems in the presence of voltage-polarity inversions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cavallini, A.; Fabiani, D.; Mazzanti, G.; Montanari, G.C.; Simoni, L.
Year: 2000
Effect of HVDC stress on breakdown strength and partial discharge activity of lapped thin film insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanden, B.; Haave, T.
Year: 2000
Space charge development and breakdown in cross-linked polyethylene under DC fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abou Dakka, M.; Bulinski, A.; Bamji, S.
Year: 2000
Space charge and field distributions in low-density polyethylene
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mizutani, T.; Semi, H.; Kaneko, K.; Mori, T.; Ishioka, M.
Year: 2000
Advancements in partial discharge analysis to diagnose stator winding problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Warren, V.; Stone, G.C.; Fenger, M.
Year: 2000
A novel technique for the identification of defects in stator bar insulation systems by partial discharge measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Contin, A.; Cavallini, A.; Montanari, G.C.; Puletli, F.
Year: 2000
How to identify stator insulation problems using on-line partial discharge analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhu, H.; Green, V.; Huynh, D.; Ravenscroft, L.
Year: 2000
Quality assurance of generator and motor insulation system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goffaux, R.; Comte, B.; Cottet, M.; Fruth, B.
Year: 2000
Dielectric absorption characteristics of generator stator insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McDermid, W.
Year: 2000
Evaluation of delaminated high-voltage rotating machine stator winding groundwall insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rux, L.; Grzybowski, S.
Year: 2000
A new diagnostic tool for determining and locating wet electrical insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krahn, J.R.
Year: 2000
Measurement and computation of powdered mixture permittivities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nelson, S.O.
Year: 2000
A measurement method of grounding impedance of a tree
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaura, I.; Yajima, M.; Tanaka, K.; Fukuma, H.
Year: 2000
Self-balancing DC bridge circuits using resistive mirror based voltage controlled resistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tadic, N.; Gobovic, D.
Year: 2000
The flat strap sandwich heater resistor for high frequency thermal transfer standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Castelli, F.
Year: 2000
Generalized low frequency stochastic true RMS instrument
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vujicic, V.
Year: 2000
Spatial DFT analysis from magnetic sensor circular array data for measuring a DC current flowing in a rectangular bus-bar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bazzocchi, R.; Manara, A.; Di Rienzo, L.
Year: 2000
Simultaneous measurement of the electrical and magnetic properties of a superconductive plate sample with a bifilar coil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamazaki, S.; Nakane, H.; Tanaka, A.
Year: 2000
System design for micropositioning and sensing of micro-electromechanical (MEM) actuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Madanagopal, K.V.; Tien, N.C.
Year: 2000
Improving the accuracy and operating range of quartz microbalance sensors by a purposely designed oscillator circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferrari, V.; Marioli, D.; Taroni, A.
Year: 2000
A hysteresis model for vanadium oxide thermal radiation sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Almeida, L.A.L.; Deep, G.S.; Lima, A.M.N.; Neff, H.; Freire, R.S.
Year: 2000
A linearisation method for commercial Hall-Effect current transducers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cristaldi, L.; Ferrero, A.; Lazzaroni, M.; Ottoboni, R.
Year: 2000
Study of micromanipulation using stereoscopic microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sano, T.; Yamamoto, H.
Year: 2000
A technique for image restoration based on recursive processing and error correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Russo, F.
Year: 2000
Object recognition using pseudo-random color encoded structured light
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Petriu, E.M.; Sakr, Z.; Spoelder, H.J.W.; Moica, A.
Year: 2000
Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vanhoenacker, K.; Dobrowiecki, T.; Schoukens, J.
Year: 2000
Modeling in the presence of switching uncertainties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Moer, W.; Rolain, Y.; Pintelon, R.
Year: 2000
Nonlinear gas turbine computer modelling using NARMAX structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiras, N.; Evans, C.; Rees, D.
Year: 2000
Continuous corrosion rate measurement by noise resistance calculation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lowe, A.M.; Eren, H.; Tan, Y.J.; Bailey, S.I.; Kinsella, B.J.
Year: 2000
Compensation of surface inclination for detecting in optical triangulation sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyung-Chan Kim; Se-Baek Oh; Jong-Ahn Kim; Soohyun Kim; Yoon Keun Kwak
Year: 2000
Flatness measurement system based on a non-linear optical triangulation technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garcia, D.F.; Garcia, M.; Obeso, F.
Year: 2000
Filtering of impulse noise from laser sensor signals in the process of non-contact thickness measurement in a stainless steel sheet production line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spinola, C.; Gago, A.; Bonelo, J.M.; Vizoso, J.
Year: 2000
Optical transmission system for acquisition and measurement of the signals from the high-speed rotating shaft
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jovanovic, L.D.
Year: 2000
Computer vision based inverted pendulum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenzel, L.; Vazquez, N.; Nair, D.; Jamal, R.
Year: 2000
A microprocessor based variable structure control system for synchronous high speed film cameras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xinqun Liu; Lichang Yao; Clegg, W.; Jenkins, D.
Year: 2000
The design of a fuzzy-based adaptive digital controller for a three-degrees-of-freedom in-parallel actuated manipulator [for flight simulator]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Hsien Kung; Devaney, M.J.; Chung-Ming Huang
Year: 2000
Transients in reconfigurable control loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simon, G.; Kovacshazy, T.; Peceli, G.
Year: 2000
Signal processing support for interpretation of circular dichroic data in the study of protein
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barwicz, A.; Ben Slima, M.; Barwicz, J.; Tancrede, P.
Year: 2000
Power requirements from instrumentation for ultrasound interstitial heating at variable heat sinks location
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jarosz, B.J.
Year: 2000
Reconstruction of temperature-change distribution in the cylindrical head model by means of electrical capacitance tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kimoto, A.; Nakatani, T.; Matsuoka, Y.; Shida, K.
Year: 2000
A novel automated measurement and control system based on VXIbus for I&D logic analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Hongxuan; Zhu Yisheng; Wang Wi
Year: 2000
Automated system for evaluation of climatic chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bojkovski, J.; Pusnik, I.; Drnovsek, J.; Hudoklin, D.
Year: 2000
An intelligent instrumentation system for testing fast-charging process in high-capacity batteries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Viera, J.C.; Gonzalez, M.; Carballo, C.; Blanco, C.
Year: 2000
Implementation and control of the magnetic linear actuation system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, C.E.; Lin, K.G.
Year: 2000
A hybrid instrument for a vibration test bed with built-in-test capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gao, R.X.; Sovenyi, S.
Year: 2000
Development of measuring apparatus for contact wire wear by sodium vapor lamps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kusumi, S.; Nagasawa, H.; Mochizuka, H.
Year: 2000
The new development of measuring EHL oil film thickness for thrust bearing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weimin Zheng; Zhaoli Zhang; Shenghe Sun
Year: 2000
Development of a hand-held Burr measurement system for statistical process control of the trimming process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benati, F.; Sacerdotti, F.; Haizhuang Kang; Gatti, S.
Year: 2000
The effect of offset voltage on the kick-out pulses used in the nose-to-nose sampler impulse response characterization method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Larson, D.R.; Paulter, N.G., Jr.
Year: 2000
Non-iterative waveform deconvolution using analytic reconstruction filters with time-domain weighting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roy, S.; Souders, M.
Year: 2000
Jitter measurements: from theory to practice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angrisani, L.; Baccigalupi, A.; Ferrigno, L.
Year: 2000
A DSP-based modified Costas receiver for LVDT position sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ford, R.M.; Weissbach, R.S.; Loker, D.R.
Year: 2000
Research on multi-parameter transducer and Integrated Measurement System (IMS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wendong Zhang; Haifeng Dong; Jijun Xiong; Shenshu Xiong
Year: 2000
Versatile headspace and electronics for measurements with gas sensor arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fort, A.; Gregorkiewitz, M.; Machetti, N.; Rocchi, S.; Ulivieri, N.; Vignoli, V.; Faglia, G.
Year: 2000
Sensor placement strategy for in-situ bearing defect detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Changting Wang; Gao, R.X.
Year: 2000
An approach to fault diagnosis for non-linear system based on fuzzy cluster analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yiping Liu; Yi Shen; Zhiyan Liu
Year: 2000
Electronic tongue and electronic nose data fusion in classification with neural networks and fuzzy logic based models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sundic, T.; Marco, S.; Samitier, J.; Wide, P.
Year: 2000
Neural and statistical classifiers. Can such approaches be complementary?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Barat; H. Loaiza; E. Colle; S. Lelandais
Year: 2000
Soft fault diagnosis in analogue circuits: a comparison of fuzzy approach with radial basis function networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Catelani, M.; Fort, A.; Bigi, M.; Singuaroli, R.
Year: 2000
A virtual instrumentation of electric drive systems for automation and testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eren, H.; Chun Che Fung
Year: 2000
Measurement uncertainty estimation of a virtual instrument
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caldara, S.; Nuccio, S.; Spataro, C.
Year: 2000
Signal recovery by using a QDW based approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ando, B.; Giuffrida, G.; Graziani, S.; Pitrone, N.
Year: 2000
Diagnosis of food safety based on pattern discrimination of attenuated total reflectance IR spectrum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishizawa, H.; Nishimatsu, T.; Toba, E.
Year: 2000
New measuring method of contact loss of pantograph in AC electric railroads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mochizuka, H.; Kusumi, S.; Mori, M.; Kobayashi, N.
Year: 2000
Identification of time-varying resistance during welding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garza, F.J.; Das, M.
Year: 2000
A real-time electro-optic handy probe using a CW laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shinagawa, M.; Nagatsuma, T.; Ohno, K.; Jin, Y.
Year: 2000
Magneto-optic Faraday effect current sensor based on thin cobalt films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robles, G.; Giannetti, R.
Year: 2000
Diode-pumped 2 /spl mu/m optical oscillator for high-resolution spectroscopy and frequency metrology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Svelto, C.; Galzerano, G.; Maffiolini, A.; Bava, E.
Year: 2000
Optical fibre interface for distributed measurement and control in metrology setups: application to current sensing with fA resolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Callegaro, L.; Capra, P.P.; Sosso, A.
Year: 2000
Distributed framework for instrumentation hardware/software codesign
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Groza, V.
Year: 2000
Automatic Measurement System for degradation analysis in thin-film AlCu metallizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Catelani, M.; Nicoletti, R.
Year: 2000
Testing and evaluating the quality-level of stratified multichip module instrumentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Park, N.; Lombardi, F.; Piuri, V.
Year: 2000
Design of a multi-parameter substance analyzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perez, M.A.; Campo, J.C.; Gonzalez, M.; Lopez, P.
Year: 2000
Development of a remotely accessible integrated circuit test facility based on telepresence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung, E.C.; Titus, A.H.
Year: 2000
NDI of delamination in IC packages using millimeter-wave
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Ju; Saka, M.; Abe, H.
Year: 2000
Metrological characterization of an eddy-current-based system for non-destructive testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bernieri, A.; Betta, G.
Year: 2000
Versatile multipurpose modular instrument for conductivity measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:DeFuria, J.; Probasco, B.; Mandayam, S.; Schmalzel, J.
Year: 2000
Optical method of sub-cooled water recognition in dew point hygrometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weremczuk, J.
Year: 2000
A new calibration technique for microwave moisture sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trabelsi, S.; Krazsewski, A.W.; Nelson, S.O.
Year: 2000
Relative humidity sensor based on side-polished fiber optic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corera, F.P.; Gaston, A.; Sevilla, J.
Year: 2000
Nonintrusive identification of electrical loads in a three-phase environment based on harmonic content
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cole, A.; Albicki, A.
Year: 2000
Fourier based three phase power metering system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, S.C.; Devaney, M.J.
Year: 2000
Physical interpretation and measurement of interharmonics in power supply
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kusmierek, Z.; Korczynski, M.J.
Year: 2000
Virtual power sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fock, B.
Year: 2000
Smart sensing of both the direction of acceleration and azimuth utilizing a slim permanent magnet floating in a spherical vessel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okada, T.; Sugito, S.; Karsten, B.; Dillmann, R.
Year: 2000
Odor-based incontinence sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huadong Wu; Siegel, M.
Year: 2000
Monolithic integrated magnetic sensor in a digital CMOS technology using a switched current interface system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rubio, C.; Bota, S.; Macias, J.G.; Samitier, J.
Year: 2000
Electro-optic sensor for measurement of DC fields in the presence of space charge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cecelja, F.; Bordovsky, M.; Balachandran, W.
Year: 2000
On the use of in-service, nonintrusive measurement devices in the performance analysis of telephone-type networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bertocco, M.; Paglierani, P.; Rizzi, E.
Year: 2000
A robust algorithm for measurement on MSK signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bucci, G.; Landi, C.
Year: 2000
Problems with jitter measurement in PDH/SDH-based digital telecommunication systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angrisani, L.; Baccigalupi, A.; d'Angiolo, G.
Year: 2000
The initial frequency uncertainty tolerated by the Levenberg-Marquardt method applied to dynamic testing of A/D converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haddadi, D.; Dallet, D.; Marchegay, P.
Year: 2000
ADC sinewave histogram testing with quasi-coherent sampling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carbone, P.; Chiorboli, G.
Year: 2000
Windows for ADC dynamic testing via frequency-domain analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bertocco, M.; Carbone, P.; Nunzi, E.; Petri, D.
Year: 2000
ADC testing based on IEEE 1057-94 standard-some critical notes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arpaia, P.; Cruz Serra, A.; Daponte, P.; Monteiro, C.L.
Year: 2000
Investigating the self-heating test for a temperature sensor using a ternary identification pattern
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jackowska-Strummillo, L.; McGlone, P.; Henderson, I.A.; McGhee, J.; Sankowski, D.
Year: 2000
Testing of heating in a black test corner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beges, G.; Pusnik, I.; Bojkovski, J.; Drnovsek, J.
Year: 2000
An in-situ real time impulse response auto-test of resistance temperature sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kulesza, W.; Bergander, T.; McGhee, J.; Hultgren, A.; Ingelbrant, P.; Lenells, M.; Wirandi, J.
Year: 2000
High sensitivity temperature sensor based on side-polished fiber optic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Senosiain, J.; Diaz, I.; Gaston, A.; Sevilla, J.
Year: 2000
An enhanced fiber optic temperature sensor system for power transformer monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Betta, G.; Pietrosanto, A.; Scaglione, A.
Year: 2000
The power-frequency converter, by the induction watthour meter, with application to bimodal tariff
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Castelli, F.
Year: 2000
A versatile multichannel direct-synthesized electrical stimulator for FES applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han-Chang Wu; Shuenn-Tsung Young; Te-Son Kuo
Year: 2000
Design of a low cost sensor system for the determination of the number of somatic cells in milk using bioluminescence analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferrero, F.J.; Campo, J.C.; Anton, J.C.
Year: 2000
Measurement system for swallowing based on impedance pharyngography and swallowing sound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakamura, T.; Yamamoto, Y.; Tsugawa, H.
Year: 2000
An automatic measurement system for the evaluation of carotid intima-media thickness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liguori, C.; Pietrosanto, A.
Year: 2000
RAM BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savir, J.
Year: 2000
An adaptive path selection method for delay testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jone, W.B.; Yeh, W.S.; Yeh, C.W.; Das, S.R.
Year: 2000
Data compression in space under generalized mergeability based on concepts of cover table and frequency ordering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Das, S.R.; Jiang Liang; Petriu, E.M.; Jone, W.B.; Chakrabarty, K.
Year: 2000
Controllable LFSR for BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kay, D.; Mourad, S.
Year: 2000
Nonrandom quantization errors in timebases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stenbakken, G.N.; Dong Liu; Starzyk, J.A.; Waltrip, B.C.
Year: 2000
Transients in reconfigurable signal processing channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kovacshazy, T.; Peceli, G.; Simon, G.
Year: 2000
Thick film flow sensor based on the thermal time-of-flight principle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crescini, D.; Marioli, D.; Taroni, A.
Year: 2000
Development of electromagnetic transducer for site flow azimuth and velocity measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tianshu Huang; Li Li; Qingzhen Ren; Deshi Li
Year: 2000
Optical means of determining the surface flow characteristics of open channel flows: a proposed design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Camur, H.; Balasubramanian, K.; Peremeci, O.
Year: 2000
A novel approach to eliminating short ending effects in the primary transducer of electromagnetic flow meter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michalski, A.; Starzynski, J.; Wincenciak, S.
Year: 2000
Measurement of air moisture by the phosphorescence lifetime of a sol-gel based sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Campo, J.C.; Perez, M.A.; Gonzalez, M.; Ferrero, F.J.
Year: 2000
Error analysis and reduction for a simple sensor-microcontroller interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Custodio, A.; Pallas-Areny, R.; Bragos, R.
Year: 2000
An accurate, low-cost resistive-sensor interface with a multiple-signal calibration technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiujun Li; Meijer, G.C.M.
Year: 2000
Automated calibration of temperature sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Orzylowski, M.; Hering, M.; Kaluzniacki, T.; Lobodzinski, W.; Ostrowski, P.; Wiechowski, J.
Year: 2000
A low-cost, compact indoor thermal environment monitor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Song Chen; Watanabe, K.; Nakayama, M.; Kanehori, M.; Okuyama, H.; Ito, Y.; Kushime, E.
Year: 2000
Method of temperature measurement on turning around an axis bodies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milici, L.D.; Milici, M.R.; Cretu, M.
Year: 2000
Automation of reading of liquid-in-glass thermometers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Batagelj, V.; Bojkovski, J.; Pusnik, I.; Drnovsek, J.
Year: 2000
Construction of blackbodies for calibration of noncontact thermometers in the range from -10/spl deg/C to 250/spl deg/C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pusnik, I.; Bojkovski, J.; Bergelj, F.; Drnovsek, J.
Year: 2000
Serial analysis with a Palm/sup TM/ organizer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniel, J.; Greenfeld, S.; Schmalzel, J.
Year: 2000
An artificial neural linearizer for capacitive humidity sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Chatterjee; S. Munshi; M. Dutta; A. Rakshit
Year: 2000
Applying a metric space to design a primary transducer or electromagnetic flow meter for open channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michalski, A.; Piotrowski, W.
Year: 2000
A software tool for designing intelligent sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benoit, E.; Tailland, J.; Foulloy, L.; Mauris, G.
Year: 2000
MEDICIS: a new tool for remote programmable FPGA circuit testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nouel, P.; Kadionik, P.; Gressier, P.; Dufrene, P.; Lemasson, S.
Year: 2000
Optimal sensor configuration for complex systems with application to signal detection in structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sadegh, P.; Spall, J.C.
Year: 2000
A new fiber-communication miniature sensor module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Shown Sheen; Sien Chi
Year: 2000
Motion estimation in image sequences for traffic applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Leeuwen, M.B.; Groen, F.C.A.
Year: 2000
Uncertainty in image based measurements: a step towards model characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Santo, M.; Liguori, C.; Pietrosanto, A.
Year: 2000
Inverse filtering of optical images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daboczi, T.; Bako, T.B.
Year: 2000
Ultrasonic seismic imaging of lava samples by viscoacoustic asymptotic waveform inversion: calibration and developments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saracco, G.; Ribodetti, A.; Turquety, S.; Conil, F.
Year: 2000
Genetic algorithm application for RASS-wind profiler data processing in remote sensing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D'Orazio, A.; Ekuakille, A.L.; Petruzzelli, V.
Year: 2000
A computerized system for testing batteries in full controlled environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carballo, C.; Gonzalez, M.; Alvarez, J.C.; Blanco, C.
Year: 2000
Measurements on radio extender system in cellular communication for railways tunnel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zanobini, A.; Doretti, F.
Year: 2000
A simple interface circuit to measure very small capacitance changes in capacitive sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Preethichandra, D.M.G.; Shida, K.
Year: 2000
A 50 A, 1-/spl mu/s-rise-time, programmable electronic load instrument for measurement of microprocessor power supply transient performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McNeill, J.A.; Lawler, M.; Levesque, G.; Ruiter, J.; Noon, J.
Year: 2000
Preliminary design of an electrodynamic balance for single particle analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bobcowski, C.; Costa, J.; Shaw, S.; Zucal, R.; Schmalzel, J.; Ordonez, R.; Chen, J.
Year: 2000
Steps involved in updating an older data acquisition and control system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baldassari-Mather, L.
Year: 2000
SPECTRA: An innovative network analyzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pasquale, R.V.; Bracht, R.R.
Year: 2000
A high gain, wide bandwidth isolated amplifier for using in fracture process transient analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perez, M.A.; Romero, V.; Anton, J.C.; Campo, J.C.
Year: 2000
Performance analysis of M/T-type digital tachometers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kavanagh, R.C.
Year: 2000
Conducted and radiated interference measurements in the line-pantograph system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tellini, B.; Macucci, M.; Giannetti, R.; Antonacci, G.A.
Year: 2000
A new method for conducted EMI measurements on three phase systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Bonitatibus, A.; De Capua, C.; Landi, C.
Year: 2000
2-dimensional audio phase measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniel, J.; Childs, J.; Shah, A.; Cheung, D.; Schmalzel, J.
Year: 2000
Macro-I: a gateway to instrumentation education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schmalzel, J.L.; Dyer, S.A.
Year: 2000
Phase measurement of distorted periodic signals based on nonsynchronous digital filtering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Djokic, B.; So, E.
Year: 2000
Improvement of the official examinations for the signal quality of the cable TV systems in Taiwan: the modification of the automatic measurement software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bing-Yuh Lu; Yigh-Pyng Lin; Hai-Han Lu; Hung-Wen Hung; Chin-Yuan Lin; Te-Son Kuo
Year: 2000
Material characterisation in situ using ultrasound measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gunarathne, G.P.P.; Christidis, K.
Year: 2000
Head-media interface instability under hostile operating conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tunstall, G.; Clegg, W.; Jenkins, D.; Chilumbu, C.
Year: 2000
Comparison of two different techniques for long term magnetic measurements in nuclear fusion research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fiorentin, P.; Pomaro, N.
Year: 2000
Characterization of a novel high-power fiber-pumped Er-Yb microlaser in single-frequency operation at 1.5 /spl mu/m
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Svelto, C.; Galzerano, G.; Ferrario, F.; Bava, E.
Year: 2000
The electrolytic capacitive displacement transducer for nano-technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Castelli, F.
Year: 2000
Measurement system gain and DC level shift programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Catunda, S.Y.C.; Naviner, J.-F.; Deep, G.S.; Freire, R.C.S.
Year: 2000
Fluid temperature compensation in a hot wire anemometer using a single sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferreira, R.P.C.; Freire, R.C.S.; Deep, G.S.; Rocha Neto, J.S.; Oliveira, A.
Year: 2000
A new Bragg reflection detection instrument for ultrasonic measurement based on optical feedback effects for laser diode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yarai, A.; Nakanishi, T.
Year: 2000
IEEE 1451: A standard in support of smart transducer networking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kang Lee
Year: 2000
The design of distributed measurement systems based on IEEE1451 standards and distributed time services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burch, J.; Eidson, J.; Hamilton, B.
Year: 2000
Complete IEEE-1451 node, STIM and NCAP, implemented for a CAN network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Camara, L.; Ruiz, O.; Samitier, J.
Year: 2000
Diagnosis of a continuous dynamic system from distributed measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manders, E.; Barford, L.A.
Year: 2000
AC magnetic flux density measurements with 200 pT resolution using magnetoresistive sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gard, M.F.
Year: 2000
A scanning laser microscope system to observe static and dynamic magnetic domain behaviour
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clegg, W.; Jenkins, D.; He, L.; Windmill, J.; Fry, N.
Year: 2000
A hybrid system for magnetic field measurement based on torque measuring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fiorentin, P.
Year: 2000
Characterization of giant magnetoresistance effect based sensors and its applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramirez, D.; Pelegri, J.; Navarro, A.E.; Casans, S.
Year: 2000
A study of fluid flow in a MEMS designed for the determination of fluid and flow characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Damean, N.; Regtien, P.P.L.
Year: 2000
Six-degree-of-freedom displacement sensing method using a diffraction grating as a cooperative target
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong Ahn Kim; Kyung-Chan Kim; Eui Won Bae; Soohyun Kirn; Yoon Keun Kwak
Year: 2000
Theoretical and experimental studies of a novel cone-jet sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tuqiang Xie; Qingping Yang; Jones, B.E.; Butler, C.
Year: 2000
Highly sensitive fiber-optic sensor for dynamic pressure measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bock, W.J.; Nawrocka, M.S.; Urbanczyk, W.; Rostkowski, J.
Year: 2000
High sensitivity inductive sensing system for position measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-June Choi; Chun-Taek Rim; Soohyun Kim; Yoon Keun Kwak
Year: 2000
Real-time 2 1/2 D head pose recovery for model-based video-coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cordea, M.D.; Petriu, E.M.; Georganas, N.D.; Petriu, D.C.; Whalen, T.E.
Year: 2000
Dual-energy measurements utilizing a novel multimedia detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giakos, G.C.; Chowdhury, S.; Shah, N.; Vedantham, S.; Passerini, A.G.; Suryanarayanan, S.; Mehya, K.; Sumrain, S.; Scheiber, C.
Year: 2000
Measurements of surface texture using ultrasound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gunarathne, G.P.P.; Christidis, K.
Year: 2000
Sampling criteria for the estimation of multisine signal parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carbone, P.; Nunzi, E.; Petri, D.
Year: 2000
Application of neural networks in the development of nonlinear error modeling and test point prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaolian Han; Stenbakken, G.N.; van Zuben, F.J.; Engler, H.
Year: 2000
Platform independent architecture for distributed measurement systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bertocco, M.; Parvis, M.
Year: 2000
Distributed virtual instrument for water quality monitoring across the Internet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toran, F.; Ramirez, D.; Casans, S.; Navarro, A.E.; Pelegri, J.
Year: 2000
The IP-meter, design concept and example implementation of an Internet enabled power line quality meter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Delsing, J.; Hyyppa, K.; Isaksson, T.
Year: 2000
A measurement on-demand service for access and delivery process acquisition data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fortino, G.; Nigro, L.
Year: 2000
Development and study of an automatic AC bridge for impedance measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dutta, M.; Rakshit, A.; Bhattacharyya, S.N.
Year: 2000
A novel technique to measure two independent components of impedance sensors with a simple relaxation oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nihtianov, S.N.; Shterev, G.P.; Iliev, B.; Meiljer, G.C.M.
Year: 2000
Automated system for inductance realization traceable to AC resistance with a three-voltmeter method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Callegaro, L.; D'Elia, V.
Year: 2000
A multiphase direct-digital-synthesis sinewave generator for high-accuracy impedance comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Callegaro, L.; Galzerano, G.; Svelto, C.
Year: 2000
Interface circuit for impedance measurement to test sterility of food products
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nihtianov, S.N.; Shterev, G.P.; Pefrov, N.; Meijer, G.C.M.
Year: 2000
On line detection of movement artifacts to improve ambulatory blood pressure monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Charbonnier, S.; Siche, J.P.; Vancura, R.
Year: 2000
Algorithms for estimation of concentrations in spectrophotometric analysis of multicomponent substances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niedzinski, C.; Miekina, A.; Morawski, R.Z.
Year: 2000
Algorithms for interpretation of spectrometric data-a comparative study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wisniewski, M.P.; Morawski, R.Z.; barwicz, A.
Year: 2000
Speckle velocimeter with a self-mixing laser diode: optimization of measurement system, reproducibility and accuracy of measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ozdemir, S.K.; Takamiya, S.; Shinohara, S.; Yoshida, H.; Sumi, M.
Year: 2000
Moving fringe detection for ultra precision position measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong Hoon Yi; Jong Ahn Kim; Soohyun Kim; Yoon Keun Kwak
Year: 2000
Polarization interferometer for measuring small displacement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xinqun Liu; Clegg, W.; Jenkins, D.; Bo Liu
Year: 2000
Fabry-Perot frequency discriminators: sensitivity, amplitude noise immunity and noise limits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bava, E.; Galzerano, G.; Svelto, C.
Year: 2000
A low-cost optical feedback interferometer for real-time velocity measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Plantier, G.; Servagent, N.; Sourice, A.; Bosch, T.
Year: 2000
Improving the noise performance of adaptive delta modem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balasubramanian, K.; Camur, H.; Uckan, G.
Year: 2000
Calibration algorithm for current-output R-2R ladders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vargha, B.; Zoltan, I.
Year: 2000
Explicit formula for channel mismatch effects in time-interleaved ADC systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kurosawa, N.; Maruyama, K.; Kobayashi, H.; Sugawara, H.; Kobayashi, K.
Year: 2000
Optimal frequency range for the measurement of A.C. conductivity in aqueous solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferrara, E.; Callegaro, L.; Durbiano, F.
Year: 2000
Design of meteorological and environmental monitor (MEM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hargrave, J.; Salvatore, S.; Abraham, W.; Head, L.; Schmalzel, J.
Year: 2000
Modeling study in remote sensing of air pollution measured data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andria, G.; D'Orazio, A.; Lay Ekuakille, A.; Notarnicola, M.
Year: 2000
A monostatic radio-acoustic sounding system used as an indoor remote temperature profiler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiss, M.; Knochel, R.
Year: 2000
Self-calibrating single sideband generators with high carrier- and unwanted sideband-rejection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hauschild, T.; Christange, H.A.
Year: 2000
Noise figure measurements on nonlinear devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Geens, A.; Rolain, Y.
Year: 2000
Wide bandwidth measurement of complex permittivity of liquids using coplanar lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raj, A.; Holmes, W.S.; Judah, S.R.
Year: 2000
A digital signal-processing approach for phase noise measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angrisani, L.; D'Apuzzo, M.
Year: 2000
A strain gage tactile sensor for finger-mounted applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:da Silva, J.G.; Carvalho, A.A.; Silva, D.D.
Year: 2000
Capacitive sensor for relative angle measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cermak, S.; Wandling, F.; Zdiarsky, W.; Fulmek, P.; Brasseur, G.
Year: 2000
Design and optimization of a low frequency electric field sensor using Pockels effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Passard, M.; Barthod, C.; Fortin, M.; Galez, C.; Bouillot, J.
Year: 2000
A measurement module for automated power supply test equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kennedy, G.; Burton, P.
Year: 2000
Measuring mixed signal substrate coupling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rolain, Y.; Van Moer, W.; Vandersteen, G.; van Heijningen, M.
Year: 2000
An automatic test equipment for the calibration of voltage transducers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muscas, C.; Peretto, L.; Sasdelli, R.; Briani, A.
Year: 2000
New measurement procedure for the static test of ADCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cruz Serra, A.
Year: 2000
Instrumentation applications of random-data representation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Petriu, E.M.; Zhao, L.; Das, S.R.; Cornell, A.
Year: 2000
Identification of linear systems in the presence of nonlinear distortions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pintelon, R.; Schoukens, J.
Year: 2000
The influence of noise in on-line frequency response estimation using a multifrequency ternary periodic signal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McGlone, P.; El-Fandi, M.; Henderson, I.A.; McGhee, J.
Year: 2000
Identification of transmission lines: a comparison between the Laplace domain and the Warburg domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Block, W.; Rolain, Y.
Year: 2000
Real-time power system linear model identification: instrumentation and algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Staroszczyk, Z.; Josko, A.
Year: 2000
Influence of top coated cloth for sitting comfort of car driver's seat
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishimatsu, T.; Hayakawa, H.; Shimizu, Y.; Toba, E.
Year: 2000
Universal serial bus enhances virtual instrument based distributed power monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung-Ping Young; Devaney, M.J.
Year: 2000
Real-time accurate power system frequency meter and its quality evaluation based on simulations and large area system observations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Winek, T.; Staroszczyk, Z.
Year: 2000
Fast and accurate measurement of power system frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abu-El-Haija, A.I.
Year: 2000
A VLSI system to speedup the measurement of the system frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alturaigi, M.A.
Year: 2000
The effect of the quality of spectrometric data on the result of their interpretation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wisneiwski, M.P.; Morawski, R.Z.; Barwicz, A.
Year: 2000
Simultaneous measurement of the botanical tissue impedance and the electrode impedance by the multi-electrode method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fukuma, H.; Tanaka, K.; Yamaura, I.
Year: 2000
Navel cord length: measurement theory and instrumentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caciotta, M.
Year: 2000
Cauchy-filter-based algorithms for reconstruction of absorption spectra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sprzeczak, P.; Morawski, R.Z.
Year: 2000
Supporting system for prevention of pressure sores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanimoto, Y.; Takechi, H.; Yamamoto, H.
Year: 2000
Design a C.I for sensitive tactile system for robotic hand with capacitance effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cordova Quiroz, F.F.
Year: 2000
Comparison of methods for uniform laser scanning of centrifuged blood tubes for data acquisition in a hematology analyzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marcus, M.
Year: 2000
Improved speed of convergence for Jansson's iterative deconvolution method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crilly, P.B.; da Silva, L.E.B.; Bernardi, A.
Year: 2000
Weighted multi-point interpolated DFTF to improve amplitude estimation of multi-frequency signal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrez, D.
Year: 2000
Approximation to Boolean functions by neural networks with applications to thinning algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiong Shenshu; Zhou Zhaoying; Zhong Limin; Zhang Wendong
Year: 2000
Adaptive filtering of color noise using the Kalman filter algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiong Shenshu; Zhou Zhaoying; Zhong Limin; Xu Changsheng; Zhang Wendong
Year: 2000
Edge detection and automatic threshold based on wavelet transform in the VPPAW keyhole image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhonghua Liu; Qilong Wang
Year: 2000
Engine dynamics identification in the case of non-uniformly sampled data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boubal, O.; Lahalle, E.; Nita, L.
Year: 2000
A statistical model to the expression of uncertainty and confidence in measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iuculano, G.; Pellegrini Gualtieri, G.; Zanobini, A.
Year: 2000
Signal spectrum analysis and period estimation by using delayed signal sampling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peretto, L.; Pasini, G.; Muscas, C.
Year: 2000
Some models and methods for fault diagnosis of analog piecewise linear circuits via verification technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robotycki, A.; Zielonko, R.
Year: 2000
Multi-resolution models for data processing: an experimental sensitivity analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferrari, S.; Borghese, N.A.; Piuri, V.
Year: 2000
Power source scheduling and adaptive load management via a genetic algorithm embedded neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Hsien Kung; Devaney, M.J.; Chung-Ming Huang; Chih-Ming Kung
Year: 2000
CNNS for noise generation in dithered transducers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ando, B.; Baglio, S.; Graziani, S.; Pitrone, N.
Year: 2000
Metrological characterization of the square waveform as calibration signal for data acquisition systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D'Antona, G.; Di Rienzo, L.; Ottoboni, R.
Year: 2000


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