Inductive sensors for measuring magnetic field of communication aerial double wire lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nichoga, V.; Dub, P.
Year: 1999
Calibration of high precision oscillators using the TV line frequency as a frequency standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pesic, M.T.; Arsic, M.Z.
Year: 1999
Design of selective linear phase filters using classical filter transfer functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milic, L.D.; Lutovac, M.D.
Year: 1999
EMQF filter design in MATLAB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lutovac, M.D.; Tosic, D.V.; Evans, B.L.
Year: 1999
Approximate linear phase Hilbert transformer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milic, L.D.; Lutovac, M.D.
Year: 1999
Design of IIR digital filters using allpass networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stancic, G.; Djuric, B.
Year: 1999
Texture analysis using 2D wavelet transform: theory and applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Popovic, M.
Year: 1999
Comparative study of scalar and multiwavelet filters in transform-based compression of IRLS images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milovanovic, D.; Marincic, A.; Petrovic, G.; Barbaric, Z.
Year: 1999
A method for providing digital image authenticity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rakocevic, I.; Reljin, B.; Reljin, I.
Year: 1999
Image synthesis acceleration using field programmable gate arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soldek, J.
Year: 1999
Objective and subjective estimation of image restoration quality in radiometry imaging systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prudyus, I.; Voloshynovskjy, S.; Osberger, W.; Holotyak, T.
Year: 1999
The ways of multispectral devices construction for thermal object visualization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hrytskiv, Z.D.; Kondratov, P.O.
Year: 1999
Active antenna integrated with up converter for 5 to 24 GHz band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nesic, A.; Radnovic, I.; Brankovic, V.; Nesic, D.
Year: 1999
Automatization of permittivity measuring using microwave cylindrical cavity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ivkovic, S.; Milovanovic, B.; Atanaskovic, A.; Tasic, V.
Year: 1999
Human exposure to electromagnetic fields from mobile phones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Szentpali, B.
Year: 1999
A method for coding of two-level facsimile pictures in systems based on digital modulation of signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bandjur, D.; Mirkovic, M.; Bandjur, M.; Andjelkovic, M.
Year: 1999
Robust sample-selective LP parameter estimation in USFS1016 coder based on quadratic classifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Markovic, M.Z.
Year: 1999
Penalty due to the residual laser radiation in ASK optical receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marincic, A.
Year: 1999
Analysis of the finite-impulse-response (FIR) filters implementation in the modeling of the single-mode optical fiber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cvetkovic, M.; Matavulj, P.; Marincic, A.; Radunovic, J.
Year: 1999
Advances in spectral methods for optoelectronic design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vukovic, A.; Greedy, S.; Sewell, P.; Benson, T.M.; Kendall, P.C.
Year: 1999
Coherent optical PSK systems with Costas loop in multichannel environment for nonlinear PLL model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Djordjevic, I.B.; Stefanovic, M.C.
Year: 1999
Coherent optical PSK systems with balanced PLL receivers for nonlinear PLL model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Djordjevic, I.B.; Stefanovic, M.C.; Djordjevic, G.T.
Year: 1999
Time-delays in microstructures and stability-problems in ultra-high speed amplifiers for optical WANs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nowack, G.
Year: 1999
Ultrafast all-optical switching using controlling solitons and nonlinear directional coupler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trivunac-Vukovic, N.; Vukovic, P.
Year: 1999
Reconfigurable elements for a video pipeline processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piacentino, M.R.; van der Wal, G.S.; Hansen, M.W.
Year: 1999
Debugging techniques for dynamically reconfigurable hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McKay, N.; Singh, S.
Year: 1999
Development system for FPGA-based digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sklyarov, V.; Fonseca, J.; Monteiro, R.; Oliveira, A.; Melo, A.; Lau, N.; Skliarova, I.; Neves, P.; Ferrari, A.
Year: 1999
Task-level partitioning and RTL design space exploration for multi-FPGA architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srinivasan, V.; Vemuri, R.
Year: 1999
SONIC-a plug-in architecture for video processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haynes, S.D.; Cheung, P.Y.K.; Luk, W.; Stone, J.
Year: 1999
A reconfigurable platform for academic purposes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Teuscher, C.; Haenni, J.-O.; Gomez, F.J.; Restrepo, H.F.; Sanchez, E.
Year: 1999
Accelerating an IR automatic target recognition application with FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jean, J.; Xiejun Liang; Drozd, B.; Tomko, K.
Year: 1999
An FPGA-based fan beam image reconstruction module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maltar, L.; Franca, F.M.G.; Alves, V.C.; Amorim, C.L.
Year: 1999
The 1999 outlook for GaAs IC markets and technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Bechtel
Year: 1999
Status and roadmap of GaAs technology in Georgia, former Soviet Union
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.P. Khuchua; A.B. Gerasimov; R.I. Chikovani; Z.D. Chakhnakia; L.V. Khvedelidze; R.G. Melkadze; A.P. Bibilashvili; T.D. Mkheidze; G.I. Goderdzishvili
Year: 1999
High-speed, low-power digital and analog circuits implemented in IBM SiGe BiCMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.E. Fritz; B.A. Randall; G.J. Fokken; W.L. Walters; M.J. Lorsung; A.D. Nielsen; J.F. Prairie; D.J. Post; D.R. Greenberg; B.K. Gilbert
Year: 1999
Wide-bandgap-semiconductor wide-bandwidth wide-temperature-range power amplifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C.M. Hwang
Year: 1999
An on-ledge Schottky potentiometer for the diagnosis of HBT emitter passivation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pingxi Ma; P. Zampardi; Liyang Zhang; M.F. Chang
Year: 1999
Inclusion of topside metal heat spreading in the determination of HBT temperatures by electrical and geometrical methods [GaAs devices]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Yeats
Year: 1999
Quantum well infrared photodetectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.S. Ahearn; M. Sundaram
Year: 1999
3.3 V MSM-TIA for Gigabit Ethernet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Jayakumar; M. Bustos; D. Cheskis; S. Pietrucha; M. Bonelli; S. Al-Kuran
Year: 1999
A 1.25 Gb/s GaAs OEIC for Gigabit Ethernet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung-Chiang Ku; Choa-Hui Lin; Ming-Hong Tsai; Jung-Te Ting; Rong-Heng Yuang
Year: 1999
High-gain transimpedance amplifier in InP-based HBT technology for the receiver in 40 Gb/s optical-fiber TDM links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.F. Jensen; B. Stanchina; M. Kardos; H. Thurner; H.-M. Rein
Year: 1999
A 180-GHz MMIC sub-harmonic mixer based on InGaAs/InAlAs/InP HEMT diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yon-Lin Kok; Huei Wang; R. Lai; M. Barsky; M. Sholley; B. Allen
Year: 1999
High efficiency monolithic InP HEMT V-band power amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M.J. Liu; O.S.A. Tang; W. Kong; K. Nichols; J. Heaton; P.C. Chao
Year: 1999
Suppression of electrochemical etching effects in GaAs PHEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Zhao; Y. Tkachenko; D. Bartle
Year: 1999
Bias point dependence of the hot electron degradation of AlGaAs/GaAs power HFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Menozzi; D. Dieci; M. Messori; G. Sozzi; C. Lanzieri; C. Canali
Year: 1999
Implementation of digital circuits in an InP scaled HBT technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.A. Randall; D.J. Schwab; W.L. Walters; A.D. Nielsen; E.L.H. Amundsen; M.M. Sokolich; Y.K. Brown; M.M. Lui; J.A. Henige; B.K. Gilbert
Year: 1999
High power and gain at 35 GHz utilizing an InAlGaAs-In/sub 0.32/Ga/sub 0.68/As metamorphic HEMT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.S. Whelan; W.E. Hoke; R.A. McTaggart; P.S. Lyman; P.F. Marsh; S.J. Lichwala; T.E. Kazior
Year: 1999
A miniaturized MMIC analog phase shifter using two quarter-wave-length transmission lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Hayashi; M. Muraguchi
Year: 1999
A 3.3 V, 21 Gb/s PRBS generator in AlGaAs/GaAs HBT technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.G. Chen; J.K. Notthoff
Year: 1999
A 10 Gb/s optical transmitter module with a built-in modulator driver IC and a receiver module with a built-in preamplifier IC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Yoshida; M. Ishizaka; I. Watanabe; M. Fujii; S. Wada; K. Numata; K. Fukuchi; K. Fukushima; J. Shimizu; M. Yamaguchi; T. Maeda
Year: 1999
Acoustic and optical methods for measuring electric charge distributions in dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takada, T.
Year: 1999
Polarization behaviour in polymers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Munaro, M.; Moreno, L.; Scarpa, P.C.N.; Das-Gupta, D.K.
Year: 1999
Space charge injection and extraction in high divergent fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dissado, L.A.; Paris, O.; Ditchi, T.; Alquie, C.; Lewiner, J.
Year: 1999
Effect of acetophenone on the space charge evolution in LDPE and LLDPE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kobayashi, K.; Ohara, T.; Ohki, Y.; Maeno, T.
Year: 1999
Investigation on charging and polarization effects at dielectric interfaces in laminated HVDC insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beyer, J.; Morshuis, P.H.F.; Smit, J.J.
Year: 1999
Space-charge and conduction-current measurements for the evaluation of aging of insulating materials for DC applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Montanari, G.C.; Fabiani, D.; Bencivenni, L.; Garros, B.; Audry, C.
Year: 1999
Mechanical and electrical response of charged polymers with cellular structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hillenbrand, J.; Sessler, G.M.
Year: 1999
Study of space charge dynamics directly on power cables using the thermal step method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agnel, S.; Notingher, P., Jr.; Toureille, A.; Castellon, J.; Malrieu, S.
Year: 1999
Third harmonic generation of soluble vanadyl-phthalocyanine doped in polymer film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakano, H.; Maeda, A.; Furuhashi, H.; Yoshikawa, T.; Uchida, Y.; Kojima, K.; Ohashi, A.; Ochiai, S.; Ieda, M.; Mizutani, T.
Year: 1999
The temperature dependence of space charge accumulation and DC current in XLPE power cable insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lim, F.N.; Fleming, R.J.
Year: 1999
Mechanism of charge decay in UV-irradiated SiO/sub 2/ electret films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amjadi, H.; Sessler, G.M.
Year: 1999
The influence of atmospheric pressure on the space charge of multilayered epoxy: a study using the thermal step method and the thermally stimulated discharge currents technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malrieu, S.; Castellon, J.
Year: 1999
Space charge distribution of polyimide films in high temperature region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muramoto, Y.; Nagao, M.; Mitsumoto, S.; Fukuma, M.; Kosaki, M.
Year: 1999
Measurements of conduction current and electric field distribution up to electrical breakdown in LDPE film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fukuma, M.; Nagao, M.; Kosaki, M.; Kohno, Y.
Year: 1999
Broad band dielectric spectroscopy as a diagnostic technique for water tree growth in cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Given, M.J.; Judd, M.; MacGregor, S.J.; Mackersie, J.; Fouracre, R.A.
Year: 1999
Increment of capacitive current and space charge formation of PP film near breakdown field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujii, M.; Tohyama, K.; Tokoro, T.; Kosaki, M.; Muramoto, Y.; Nagao, M.
Year: 1999
Shaping of filamentary streamers by the ambient field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fowler, H.A.; Devaney, J.E.; Hagedorn, J.G.
Year: 1999
Influence of probe geometry on the response of an electrostatic probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johansson, T.; Crichton, G.C.; McAllister, I.W.
Year: 1999
Potential distribution measurement of positive surface streamer by using Pockels device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumada, A.; Chiba, M.; Hidaka, K.
Year: 1999
Analysing the 2-D surface tracking patterns by using cellular neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ugur, M.; Ucan, O.N.; Kuntman, N.; Ozmen, N.; Merev, A.
Year: 1999
Portable ADSS surface contamination meter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edwards, K.S.; Pedrow, P.D.; Olsen, R.G.
Year: 1999
Determination of moisture content in impregnated paper using near infrared spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Neimanis, R.; Lennholm, H.; Eriksson, R.
Year: 1999
Precision of the inverse matrix technique for space charge measurement with the thermal step method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dakka, M.A.; Bamji, S.S.; Bulinski, A.T.
Year: 1999
Comparing linear regression and maximum likelihood methods to estimate Weibull distributions on limited data sets: systematic and random errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ross, R.
Year: 1999
A study of the method for evaluating dielectric materials using space charge measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takeda, T.; Hozumi, N.; Suzuki, H.; Okamoto, T.
Year: 1999
Finite element based Kerr electro-optic reconstructions of space charge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ustundag, A.; Zahn, M.
Year: 1999
On the measurement of the volume conductivity of insulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coelho, R.
Year: 1999
A new method for partial discharge measurement in oil-paper insulation system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao-Chun Chi; Ji Liu; Jia-Xiang Yang; Feng-Chun Wang
Year: 1999
Partial discharges in solid insulators-an experimental investigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karagiarmopoulos, C.G.; Agoris, D.P.; Psomopoulos, C.S.; Bourkas, P.D.
Year: 1999
Locating partial discharge in high voltage (HV) cable networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shim, I.; Soraghan, J.J.; Siew, W.H.; McPherson, F.; Sludden, K.; Gale, P.F.
Year: 1999
Development of partial discharge model, simulation and measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kolev, N.P.; Danikas, M.G.; Gadjeva, E.D.; Gourov, N.R.
Year: 1999
Influence of epoxy system formulation on partial discharge behavior of resin impregnated coils
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaindl, A.F.; Schoen, L.; Borsi, H.
Year: 1999
Theoretical and experimental derivation of partial discharge height distribution models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morshuis, P.H.F.; Cavallini, A.; Montanari, G.C.; Puletti, F.; Contin, A.
Year: 1999
Analysis of PD charge and energy distributions in thermosetting insulation of electrical machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Florkowska, B.; Zydron, P.
Year: 1999
Coupled measurements of partial discharges activity and space charge in a polyethylene model sample under 50 Hz AC field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malec, D.; Lebey, T.
Year: 1999
An experimental study to investigate the effects of partial discharges (PD), of electric field and of relative humidity during surface PD tests on thin polymer films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Centurioni, L.; Coletti, G.; Guastavino, F.
Year: 1999
Pulse-sequence-analysis-chances to characterize defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Patsch, R.; Berton, F.
Year: 1999
Observations of intrinsic and UV-light initiated partial discharges (PD) in thin polyethersulfone (PES) foils
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hodyr, K.; Banford, H.M.; Fouracre, R.A.
Year: 1999
Change in partial discharge properties of a void in LDPE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mizutani, T.; Kondo, T.; Nakao, K.
Year: 1999
Partial discharge pattern recognition of power transformer with neural network applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xianhe Jur; Changchang Wang; Weihong Jing; Cheng, T.C.; Lei Jiang; Deheng Zhur; Fuqi Li; Xuzhu Dong
Year: 1999
Optimization of EP/Al/sub 2/O/sub 3/-composites for SF/sub 6/ gas insulated power apparatus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seifert, J.M.; Di Lorenzo, M.; Herden, A.; Kamer, H.C.; Schifani, R.
Year: 1999
Dielectric response during curing of a resin-rich insulation system for rotating machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Helgeson, A.; Gafvert, U.
Year: 1999
Dielectric properties of carbon black-polyethylene composites below the percolation threshold
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakamura, S.; Tomimura, T.; Sawa, G.
Year: 1999
Study of pressure and temperature dependence of electrical properties in new intrinsic semiconducting polyacene quinone radical polymer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fan Yong; Zhang Weiguo; Lei Qingquan
Year: 1999
Polyurethane resins derived from castor oil for the fabrication of polymeric insulators.- II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Altafim, R.A.C.; Murakami, C.R.; Araujo, L.C.R.; Neto, S.C.; Chierice, G.O.
Year: 1999
Creation of the charged water aerosol cell with the limiting electric charge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Syssoev, V.S.; Vereshchagin, I.P.; Shcherbakov, Yu.V.
Year: 1999
Estimate of the electric stress in the liquid lying between particles of an electrorheological fluid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Atten, P.; Gonon, P.; Foulc, J.-N.; Boissy, C.
Year: 1999
Compressometer based method for measuring converse electrostriction in polymers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yimnirun, R.; Eury, S.; Sundar, V.; Moses, P.J.; Newnham, R.E.
Year: 1999
Comparison of silicone rubbers for high voltage insulation: Influence of vulcanization methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dowling, K.; Hillborg, H.
Year: 1999
3-D and 1-D dynamics of slender liquid jets: linear analysis with electric field and accuracy of 1-D models near the breakup
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garcia, F.J.; Castellanos, A.
Year: 1999
Estimation of carrier mobility using space charge measurement technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hozumi, N.; Muramoto, Y.; Nagao, M.
Year: 1999
Particle-initiated breakdown with spacer involvement in compressed gas and its mixtures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morcos, M.M.; Ward, S.A.; Anis, H.
Year: 1999
PD measurements in N/sub 2/-SF/sub 6/ gas mixtures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schoffner, G.; Boeck, W.; Messerer, F.; Michalik, L.
Year: 1999
Calculated particle trajectories in GIS of different designs and the verification by optical and acoustic measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Knapp, M.; Feser, K.; Rees, V.
Year: 1999
Ozone production using cylindrical reactors with and without solid dielectric layers in dry air
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Samaranayake, W.J.M.; Miyahara, T.; Namihira, T.; Katsuki, S.; Hackam, R.; Akiyama, H.
Year: 1999
The ferratron: a novel, repetitively rated, triggered spark gap switch with ultra low jitter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bowen, L.H.; Elizondo, J.M.; Farr, E.G.; Lehr, J.M.
Year: 1999
Simulation of predischarge processes in SF/sub 6//N/sub 2/ mixtures stressed by very fast transient voltages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pfeiffer, W.; Schoen, D.; Tong, L.Z.
Year: 1999
Insulation performance of 10% SF/sub 6//90% N/sub 2/ mixture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piemontesi, M.; Koenig, F.; Niemeyer, L.; Heitz, C.
Year: 1999
Sensitivity of a microwave differential technique for the measurement of contaminants in gases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rouleau, J.F.; Goyette, J.; Bose, T.K.; Frechette, M.F.
Year: 1999
Comparison of partial discharges in pure SF/sub 6/ and 5% SF/sub 6/-N/sub 2/ gas mixture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meijer, S.; Gulski, E.; Smit, J.J.; Girodet, A.
Year: 1999
Micro-discharge and surface flashover of insulators in vacuum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lijian Ding; Li, C.R.; Jingchun Wang; Cheng, Y.C.
Year: 1999
Influence of the humidity and the relative air density in impulse breakdown tracks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Calva, P.A.; Lopez-Tapia, P.; Almiral M, J.; Martinez B, J.A.
Year: 1999
Charge and correlated light emission of streamers in insulating oil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kist, K.; Badent, R.; Brand, M.; Schwab, A.J.
Year: 1999
Behavior of ester dielectric fluids near the pour point
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rapp, K.J.; Gauger, G.A.; Luksich, J.
Year: 1999
The effect of viscosity on the negative streamer inception in PFPE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katayama, Y.; Nakayashiki, T.; Yamashita, H.
Year: 1999
Two kinds of decay time constants for interfacial space charge in polyethylene-laminated dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, T.; Uchiumi, M.
Year: 1999
Study of the local discharge propagation velocity over two electrolytes water channels by measurement of current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boudjella, A.; Hadi, H.; Yumoto, M.; Sakai, T.; Hosokawa, T.
Year: 1999
The effect of dielectric cylinders (line guards) on the breakdown voltage of various air gaps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sebo, S.A.; Kahler, J.; Hutchins, S.; Meyers, C.; Oswiecinski, D.; Eusebio, A.; Que, W.
Year: 1999
Effects of charge accumulation in a dielectric covered electrode system in air
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blennow, H.J.M.; Sjoberg, M.L.-A.; Leijon, M.A.S.; Gubanski, S.M.
Year: 1999
Impact of the oil humidity on the AC and LI flashover strength of epoxy resin spacers in transformer oil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krins, M.; Borsi, H.; Gockenbach, E.
Year: 1999
Role of excited species in dielectric barrier discharge mechanisms observed in helium at atmospheric pressure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gouda, G.; Massines, F.
Year: 1999
Material differentiation by water treeing tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jow, J.
Year: 1999
Dynamism of interconnected channels in water treed polyethylene under a constant voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawai, J.; Ogishima, M.; Shinagawa, J.; Nakamura, S.; Sawa, G.
Year: 1999
Comparison between Lewis and Crine models for the electrical aging of dielectric polymers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crine, J.-P.
Year: 1999
Fluorescence lifetimes and ageing in irradiated low-density polyethylene
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Banford, H.M.; Wysocki, S.; Fouracre, R.A.
Year: 1999
Combined electroluminescence and charge profile measurements in polyethylene naphthalate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Auge, J.L.; Teyssedre, G.; Laurent, C.; Ditchi, T.; Hole, S.
Year: 1999
Epoxy castings with advanced surface properties-hydrophobicity and its recovery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaltenborn, U.; Hackam, R.
Year: 1999
Study of extruded power cable insulation anisotropy by means of electrical treeing growth tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guastavino, F.; Torello, E.; Lonzar, C.; Strignano, A.
Year: 1999
Thermal aging of oil-paper used in power transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao-Chun Chi; Zhe Yang; Feng-Chun Wang; Shouguo Sheng; Yu Chen; Jia-Xiang Yang
Year: 1999
On-line detection of overheating material in turbine generators using chemical analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sorita, T.; Minimi, S.; Fujimoto, T.; Takashima, M.; Nakamura, K.
Year: 1999
Effect of aging on the microstructure evolution, thermal and mechanical properties of mica/epoxy composite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hee Dong Kim; Young Ho Ju; Hong Woo Rhew
Year: 1999
Influence of harmonics in system voltage on metal oxide surge arrester diagnostics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhu, H.; Raghuveer, M.R.
Year: 1999
Investigation of the performance of new XLPE and EPR cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bialek, T.O.; Grzybowski, S.
Year: 1999
Investigation of DC threshold of polyethylenes as a tool for insulation characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Montanari, G.C.; Mazzanti, G.; Fabiani, D.; Albertini, M.; Perego, G.
Year: 1999
Detection of DC threshold of polyethylene materials through space-charge and electroluminescence measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Auge, J.L.; Laurent, C.; Montanari, G.C.; Fabiani, D.
Year: 1999
Recovery voltage measurements on XLPE cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morshuis, P.H.F.; Van Breen, H.J.; Smit, J.J.; Urbani, G.
Year: 1999
Conductivity and permittivity of water tree in polyethylene
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toyoda, T.; Mukai, S.; Ohki, Y.; Li, Y.; Maeno, T.
Year: 1999
Studies on the insulation life of adjustable speed drive (ASD)-fed motors under accelerated aging conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gao, G.G.; Steinhauser, M.; Kavanaugh, R.
Year: 1999
Electrical treeing in mechanically pre-stressed insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varlow, B.R.; Malkin, G.J.
Year: 1999
Nonlinear dielectric response of vented water treed XLPE insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hvidsten, S.
Year: 1999
Space charge distribution measurement in XLPE cable for detection of the water tree location
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, K.; Tanaka, Y.; Takada, T.; Ohki, Y.; Takeya, C.
Year: 1999
Space charge distribution measured with short period interval up to electrical breakdown in polyethylene
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitsumoto, S.; Tanaka, K.; Muramoto, Y.; Nagao, M.; Hozumi, N.; Fukuma, M.
Year: 1999
Electrical properties of low-density polyethylene prepared by different manufacturing process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishii, R.; Cho, D.-C.; Mori, T.; Mizutani, T.; Ishioka, M.
Year: 1999
An incremental 3-dimensional analysis of spark paths in air
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiu, D.H.; MacAlpine, J.M.K.; Li, Z.Y.
Year: 1999
Breakdown voltages of various air gaps in the presence of dielectric sheets (barriers)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sebo, S.A.; Kahler, J.; Hutchins, S.; Meyers, C.; Oswiecinski, D.; Eusebio, A.; Que, W.
Year: 1999
Surface flashover in liquid nitrogen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Butcher, M.; Neuber, A.; Krompholz, H.; Hatfield, L.L.
Year: 1999
Sea salts contamination pattern on high voltage insulators in Littoral region of Peninsular Malaysia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmad, A.S.; Ahmad, H.; Salam, A.
Year: 1999
Flashover phenomena of polluted insulators energized by AC voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Salam, A.; Ahmad, H.; Ahmad, A.S.; Tamsir, T.; Piah, M.A.M.; Buntat, Z.
Year: 1999
Diagnostics of EPDM polymer insulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krivda, A.; Cash, G.; Birtwhistle, D.; George, G.
Year: 1999
Evaluation of aged distribution terminations by characterization techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae Hong Han; Byung Sung Lee; Yong Heui Han
Year: 1999
Chemical analysis of the surface of silicone rubber using X-ray photoelectron spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishioka, H.; Arise, N.; Okraku-Yirenkyi, Y.; Otsubo, M.; Takenouchi, O.; Honda, C.
Year: 1999
Corona-discharge-induced hydrophobicity loss and recovery of silicones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, J.; Chaudhury, M.K.
Year: 1999
Study of the behavior of droplets on polymeric surfaces under the influence of an applied electrical field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keim, S.; Koenig, D.
Year: 1999
Flashover behavior of semiconducting glazed insulators under positive switching impulse stress at different climatic conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elsasser, O.; Feser, K.
Year: 1999
Criteria for the diagnostic of polluted ceramic insulators based on the leakage current monitoring technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramirez-Vazquez, I.; Fierro-Chavez, J.L.
Year: 1999
Partial discharge characteristics of wet and contaminated silicone rubber surface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mizuno, Y.; Shimada, M.; Nagata, M.; Naito, K.; Ishiwari, M.; Ito, S.; Koshino, Y.; Kondo, K.
Year: 1999
Laboratory study on hydrophobicity and pollution flashover properties of polymer insulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Shaowu; Liang Xidong; Huang Lengceng
Year: 1999
Accelerated corona discharge performance of polymer compounds used in high voltage outdoor insulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moreno, V.M.; Gorur, R.S.
Year: 1999
A study on the effect of environmental stresses on the hydrophobic characteristics and field performance of RTV silicone rubber coatings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hernandez, R.; Moreno, V.M.; Ponce, M.A.; Valle, E.; Jimenez, D.
Year: 1999
Identification of LMW fluid in HTV silicone rubber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hui Zhang; Hackam, R.; Lazarescu, V.
Year: 1999
Investigation the effect of environmental factors on the performance of polymeric outdoor insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ugur, M.; Kuntman, A.; Merev, A.
Year: 1999
Design of an anti-contamination insulator profile by using a computer program
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hernandez-Corona, R.; Fierro-Chavez, J.L.; Ponce-Velez, M.A.
Year: 1999
Hydrophobicity recovery of polydimethylsiloxane after repeated exposure to corona discharges. Influence of crosslink density
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hillborg, H.; Gedde, U.W.
Year: 1999
A digital image processing method for estimating the level of hydrophobicity of high voltage polymeric insulating materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berg, M.; Thottappillil, R.; Scuka, V.
Year: 1999
Image analysis of hydrophobicity of silicone rubber insulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tokoro, T.; Nagao, M.; Kosaki, M.
Year: 1999
Kinematics and dynamics of EHD-flows
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ostapenko, A.A.; Stishkov, Y.K.
Year: 1999
Image analysis of gas-phase corona discharge induced electrohydrodynamic liquid flow in stratified fluid observed by particle image velocimetry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohyama, R.; Jen-Shih Chang
Year: 1999
Measurement of steady electrohydrodynamic fluid motion induced under surface corona discharge by Schlieren photographs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Inoue, K.; Ohyama, R.
Year: 1999
Fundamental study of EHD pump with needle-cylinder electrodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Asano, K.; Yatsuzuka, K.
Year: 1999
Correlation between temperature gradient and space charge in an oil impregnated pressboard submitted to an electric field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mas, P.; Touchard, G.; Moreau, O.
Year: 1999
Oil electrification measured on a pressboard coming from a damaged power transformer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moreau, E.; Paillat, T.; Touchard, G.
Year: 1999
Measurements of electric current through a liquid-air interface in corona discharge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vega, F.; Perez, A.T.
Year: 1999
Velocity and power fields electrohydrodynamic flows
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stishkov, Y.K.; Ostapenko, A.A.; Pavleyno, M.A.
Year: 1999
Creating a precise panorama from fanned video sequence images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qin, X.; Nakamae, E.; Tadamura, K.
Year: 1999
Automatic camera placement for image-based modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fleishman, S.; Cohen-Or, D.; Lischinski, D.
Year: 1999
A speech driven talking head system based on a single face image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I-Chen Lin; Cheng-Sheng Hung; Tzong-Jer Yang; Ming Ouhyoung
Year: 1999
Motion generator approach to translating human motion from video to animation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noma, T.; Oishi, I.; Futsuhara, H.; Baba, H.; Ohashi, T.; Ejima, T.
Year: 1999
Boundary determination for trivariate solids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joy, K.I.; Duchaineau, M.A.
Year: 1999
A scan line algorithm for rendering curved tubular objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishita, T.; Johan, H.
Year: 1999
Wavelet based 3D compression with fast random access for very large volume data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rodler, F.F.
Year: 1999
Visualization of optical phenomena caused by multilayer films with complex refractive indices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hirayama, H.; Kaneda, K.; Yamashita, H.; Yamaji, Y.; Monden, Y.
Year: 1999
An efficient wavelet-based compression method for volume rendering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, T.; Shin, Y.
Year: 1999
Adaptive parameterization for reconstruction of 3D freeform objects from laser-scanned data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fischer, A.; Manor, A.; Barhak, Y.
Year: 1999
A multiscale deformable model for extracting complex surfaces from volume images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joo-Young Park; McInerney, T.; Terzopoulos, D.; Myoung-Hee Kim
Year: 1999
Modeling and rendering methods of clouds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishita, T.; Dobashi, Y.
Year: 1999
A distributed hybrid rendering algorithm for highly complex scenes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenting Zheng; Hujun Bao; Qunsheng Peng; Hanqiu Sun
Year: 1999
Volumetric modeling of colored pencil drawing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takgi, S.; Fujishiro, I.; Nakajima, M.
Year: 1999
Making 3D textures practical
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bajaj, C.; Insung Ihm; Sanghun Park
Year: 1999
Mesh approximation using a volume-based metric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alliez, P.; Laurent, N.; Sanson, H.; Schmitt, F.
Year: 1999
RF and microwave noise optimization of UHV/CVD SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guofu Niu; Ansley, W.E.; Shiming Zhang; Cressler, J.D.; Webster, C.S.; Groves, R.
Year: 1999
Impact-ionization induced instabilities in high-speed bipolar transistors and their influence on the maximum usable output voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rickelt, M.; Rein, H.-M.
Year: 1999
Impact ionization and neutral base recombination in SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peter, M.S.; Slotboom, J.W.; Terpstra, D.
Year: 1999
A 5.1-5.8 GHz low-power image-reject downconverter in SiGe technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Long, J.R.; Hadaway, R.A.; Harame, D.L.
Year: 1999
Improved extraction of base and emitter resistance from small signal high frequency admittance measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kloosterman, W.J.; Paasschens, J.C.J.; Klaassen, D.B.M.
Year: 1999
Modeling and parameter extraction of BJT substrate resistance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tzung-Yin Lee; Fox, R.M.; Green, K.; Vrotsos, T.
Year: 1999
Comprehensive hydrodynamic simulation of an industrial SiGe heterobipolar transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bartels, M.; Decker, S.; Neinhus, B.; Bach, K.H.; Schuppen, A.; Meinerzhagen, B.
Year: 1999
Carbon doped SiGe heterojunction bipolar transistors for high frequency applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osten, H.J.; Knoll, D.; Heinemann, B.; Rucker, H.; Tillack, B.
Year: 1999
A novel high-performance lateral BJT on SOI with metal-backed single-silicon external base for low-power/low-cost RF applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamada, T.; Nii, H.; Inoh, K.; Shino, T.; Kawanaka, S.; Minami, Y.; Fuse, T.; Yoshimi, Y.; Katsumata, Y.; Watanabe, S.; Matsunaga, J.; Ishiuchi, H.
Year: 1999
Ultra-low-temperature low-ohmic contacts for SOA applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nanver, L.K.; van Zeijl, H.W.; Schellevis, H.; Mallee, R.J.M.; Slabbekoorn, J.; Dekker, R.; Slotboom, J.W.
Year: 1999
High Q inductors in a SiGe BiMOS process utilizing a thick metal process add-on module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Groves, R.; Malinowski, J.; Volant, R.; Jadus, D.
Year: 1999
A current-folded up-conversion mixer and a VCO with center-tapped inductor in a SiGe-HBT technology for 5 GHz wireless LAN applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grau, G.; Langmann, U.; Winkler, W.; Knoll, D.; Osten, J.; Pressel, K.
Year: 1999
A fully-integrated 5-GHz frequency synthesizer in SiGe BiCMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ainspan, H.; Soyuer, M.
Year: 1999
Low-jitter, low-power 2.5-Gb/s one-chip optical receiver IC with 1:8 DEMUX
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kishine, K.; Ishii, K.; Hirose, M.; Ichino, H.
Year: 1999
Ad hoc wireless multicast with mobility prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung-Ju Lee; Su, W.; Gerla, M.
Year: 1999
A simple balanced fair blocking mechanism for discrete-time multiplexing of bursty traffic sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Conway, A.E.; Rosenberg, C.
Year: 1999
Real-time simulation with traffic monitoring tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saito, H.; Tsuchiya, T.; Marosi, G.; Horvath, G.; Tatai, P.; Asano, S.
Year: 1999
On fundamental issues in IP over WDM multicast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xijun Zhang; Wei, J.; Chunming Qiao
Year: 1999
A simple low-bandwidth broadcasting protocol for video-on-demand
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paris, J.-F.
Year: 1999
A robust and efficient mechanism for constructing multicast acknowledgement trees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rothermel, K.; Maihofer, C.
Year: 1999
A scalable priority queue manager architecture for output-buffered ATM switches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Do, V.L.; Yun, K.Y.
Year: 1999
An analysis of the performance of TCP over IEEE 1394 home networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiewon Lee; Jongwook Jang; Park, E.K.; Makki, S.
Year: 1999
Towards solving multicast key management problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fan Du; Ni, L.M.; Esfahanian, A.-H.
Year: 1999
Routing algorithms for all-optical networks with power considerations: the unicast case
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ali, M.; Ramamurthy, B.; Deogun, J.S.
Year: 1999
Fast and efficient flooding based QoS routing algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pung, H.K.; Song, J.; Jacob, L.
Year: 1999
Dynamic routing and assignment of wavelength algorithms in multi-fiber wavelength division multiplexing networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shizhong Xu; Lemin Li; Sheng Wang
Year: 1999
Fiber requirement in multifiber WDM networks with alternate-path routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ling Li; Somani, A.K.
Year: 1999
Dynamic scheduling scheme for handling traffic multiplicity in wavelength division multiplexed optical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Selvakennedy, S.; Ramani, A.K.; M-Saman, M.Y.; Prakash, V.
Year: 1999
Local restoration algorithm for link-state routing protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Narvaez, P.; Kai-Yeung Siu; Hong-Yi Tzeng
Year: 1999
Tree-based link-state routing in the presence of routing information corruption
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yih Huang; McKinley, P.K.
Year: 1999
A simple mechanism for improving the throughput of reliable multicast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sungwon Ha; Kang-Won Lee; Bharghavan, V.
Year: 1999
Optimal placement of wavelength converters in trees and trees of rings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng-Jun Wan; Liwu Liu; Frieder, O.
Year: 1999
Wavelength assignment to minimize requirement on tunable range of optical transceivers in WDM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng-Jun Wan; Liwu Liu; Frieder, O.
Year: 1999
Improving congestion control performance through loss differentiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tae-eun Kim; Songwu Lu; Bharghavan, V.
Year: 1999
A scalable modular architecture for SDH/SONET technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clauberg, R.; Herkersdorf, A.; Lemppenau, W.; Schindler, H.R.
Year: 1999
SLM, a framework for session layer mobility management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Landfeldt, B.; Larsson, T.; Ismailov, Y.; Seneviratne, A.
Year: 1999
Modeling and simulation study of the survivability performance of ATM-based restoration strategies for the next generation high-speed networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kant, L.; Deh-Phone Hsing; Tsong-Ho Wu
Year: 1999
An integrated scheme for establishing dependable real-time channels in multihop networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raghavan, S.; Manimaran, G.; Siva Ram Murthy, C.
Year: 1999
A fast and compact longest match prefix look-up method using pointer cache for very long network address
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uga, M.; Shiomoto, K.
Year: 1999
On multicasting with minimum end-to-end delay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young-Cheol Bang; Radhakrishnan, S.; Rao, N.S.V.; Batsell, S.G.
Year: 1999
Methodology for implementing scalable test configurations in ATM switches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Durresi, A.; Jain, R.; Babic, G.; Northcote, B.
Year: 1999
Analysis of a threshold dropping scheme for different service classes in the Internet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Casoni, M.
Year: 1999
Graphical user interface for teaching power system reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aboreshaid, S.; Basoudan, O.
Year: 1999
High voltage power fault-detection and analysis system: design and implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han, L.; Menzies, R.; Peters, J.F.; Crowe, L.
Year: 1999
Modelling extreme-weather-related transmission line outages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shen, B.; Koval, D.; Shen, S.
Year: 1999
Self adaptive impedance relays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McLaren, P.G.; Li, H.; Dirks, E.
Year: 1999
A phase selection algorithm for an adaptive impedance relay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, H.; McLaren, P.G.
Year: 1999
Estimation of the optimum rated wind velocity for wind turbine generators in the vicinity of Edmonton, Alberta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jatzeck, B.M.; Robinson, A.M.; Koval, D.O.
Year: 1999
Alternatives in simulating electrical machine dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Domnisoru, C.; Musavi, M.
Year: 1999
Omnibot mobile base for hazardous environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Houshangi, N.; Lippitt, T.
Year: 1999
An efficient neural network model for path planning of car-like robots in dynamic environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xianyi Yang; Meng, M.
Year: 1999
Ultrasonic distance measurement and data fusion to aid estimators with initialisation mechanisms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lucas de Couville, A.; Sicard, P.; Dube, Y.
Year: 1999
Influence of mode truncation and elongation deformation to a flexible manipulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan Liu; Meng, M.; Wang, D.
Year: 1999
Frequency analysis of a flexible robot manipulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, D.; Meng, M.
Year: 1999
Computed torque control of robots without joint velocity measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gourdeau, R.; Blouin, S.; Hurteau, R.
Year: 1999
Generating dextrous manipulation for multifingered robot hands by combining motion planning and teaching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pak Chiao Lam; Yun-Hui Liu; Dazhai Li; Leung, M.Y.Y.
Year: 1999
Internet-based tele-manipulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ho, T.T.; Hong Zhang
Year: 1999
3D calibration of bio-micromanipulator with local illumination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawaji, A.; Arai, F.; Fukuda, T.
Year: 1999
Surface evaluation of compact disks by electronic means
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pavuza, F.G.; Beszedics, G.; Pichler, H.
Year: 1999
Evaluating delivery point reliability performance for network configurations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fenlang Dong; Koval, D.O.
Year: 1999
Determination of interruptible load carrying capability using sequential Monte Carlo simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hua Chen; Billinton, R.
Year: 1999
A load compliance monitor system for the treatment of scoliosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lou, E.; Durdle, N.G.; Raso, V.J.; Hill, D.L.
Year: 1999
An instrumented rod rotator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lou, E.; Duke, K.K.; Hill, D.L.; Raso, V.J.; Dudle, N.G.; Moreau, M.J.; Mahood, J.K.; Budney, D.L.
Year: 1999
Continuous assessment of posture in adolescent idiopathic scoliosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lou, E.; Hill, D.L.; Raso, V.J.; Durdle, N.G.
Year: 1999
Surface modeling methods: correlation vs. unique feature extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cowley, T.G.; Hill, D.L.; Durdle, N.G.; Peterson, A.; Raso, V.J.
Year: 1999
Integrating VHDL into a first course in logic design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walsh, P.
Year: 1999
Ambiguity reduction using spatial variation for two dimensional navigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xing, S.Z.; Palmer, R.; Runtz, K.
Year: 1999
Geoacoustic parameter estimation using back wave propagation technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dizaji, R.M.; Chapman, N.R.; Kirlin, R.L.
Year: 1999
Process and control loop performance monitoring through detection of abrupt parameter changes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, B.
Year: 1999
Industrial implementation of a predictive IMC controller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tamayo, E.
Year: 1999
System identification issues in multirate systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dongguang Li; Shah, S.L.; Tongwen Chen
Year: 1999
Conditions for removing intersample ripples in multirate control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tangirala, A.K.; Shah, S.L.; Tongwen Chen
Year: 1999
Microstructure release and test techniques for high-temperature micro hotplate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grudin, O.; Marinescu, R.; Landsberger, L.; Cheeke, D.; Kahrizi, M.
Year: 1999
Mechanical properties of microspring thin films fabricated by glancing angle deposition (GLAD)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seto, M.W.; Robbie, K.; Brett, M.J.
Year: 1999
Mask-Under-Etch Experiments of Si{110} in TMAH
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pandy, A.; Landsberger, L.M.; Kahrizi, M.
Year: 1999
Measuring the deflection of a micromachined cantilever-in-cantilever device using a piezoresistive sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Ma; Robinson, A.M.; Lawson, R.P.W.; Bing Shen; Strembicke, D.; Allegretto, W.
Year: 1999
Dynamic response of a magnetically actuated micromachined cantilever with a Permalloy electroplated film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu, B.; Allegretto, W.; Robinson, A.M.
Year: 1999
CMOS cantilever microstructures as thin film deposition monitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spacek, M.; Brown, F.B.; Yuan Ma; Robinson, A.M.; Lawson, R.P.W.; Allegretto, W.
Year: 1999
Humidity measurement using resonating CMOS microcantilever structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strembicke, D.; Robinson, A.M.; Vermeulen, F.E.; Seto, M.; Brown, K.B.
Year: 1999
A silicon microfabricated aperture for counting cells using the aperture impedance technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roberts, K.; Parmeswaran, M.; Moore, M.; Muller, R.S.
Year: 1999
Elastic properties and vibration of micro-machined structures subject to residual stresses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wylde, J.; Hubbard, T.J.
Year: 1999
Measurement of MEMS displacements and frequencies using laser interferometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wylde, J.; Hubbard, T.J.
Year: 1999
Cantilever-in-cantilever micromachined pressure sensors fabricated in CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brown, K.B.; Allegretto, W.; Vermuelen, F.E.; Lawson, R.P.W.; Robinson, A.M.
Year: 1999
Measurement of MEMS Displacements and Frequencies Using Laser Interferometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wylde, J.; Hubbard, T.J.
Year: 1999
Adaptive tracking control for manipulators with only position feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung-Hua Yang
Year: 1999
Measurement of the wax appearance temperature in crude oil by laser scattering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McMullin, J.N.; Eastman, C.D.; Pulikkaseril, C.; Adler, D.
Year: 1999
Macroblock type selection for compressed domain down-sampling of MPEG video
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hashemi, M.R.; Winger, L.; Panchanathan, S.
Year: 1999
A robust high speed indoor wireless communications system using chirp spread spectrum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pinkney, J.Q.; Sesay, A.B.; Nichols, S.; Behin, R.
Year: 1999
Digital watermarking of images and video using direct sequence spread spectrum techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:George, M.; Chouinard, J.-V.; Georganas, N.
Year: 1999
Modeling a telecommunication platform for remote access to virtual laboratories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kassouf, M.; Pierre, S.; Levert, C.; Conan, J.
Year: 1999
Application of Hopfield neural network in routing for computer networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smeda, A.A.; El-Hawary, M.E.
Year: 1999
Dynamic managed objects for network management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cimpu, V.F.; Ionescu, D.; Cimpu, M.
Year: 1999
Multiple-access interference suppression in an optical DS-CDMA LAN using fractionally-spaced equalization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laflamme, J.-P.; Rusch, L.A.
Year: 1999
Current approaches in the design of ring-based optical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morley, G.D.; Grover, W.D.
Year: 1999
Description and validation of the Internet Stream Protocol (ST2+) using SDL/MSC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bui, T.H.; Elshabrawy, T.O.; Khendek, F.; Tahar, S.; Le-Ngoc, T.
Year: 1999
Simulating colliding particles in Java using Parsimony
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bishop, W.; Hembruch, M.; Trudeau, C.
Year: 1999
A secure card system with biometrics capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moon, Y.S.; Ho, H.C.; Ng, K.L.
Year: 1999
Validation of software effort models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johnson, L.F.; Smith, M.L.; Stevens, A.M.
Year: 1999
A formal model for the reuse of software specifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ehikioya, S.A.
Year: 1999
Formal test requirements for component interactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, W.; Dasiewicz, P.
Year: 1999
Segmentation of range images using successive differentiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khalifa, I.; Moussa, M.; Kamel, M.
Year: 1999
Rough software deployability control system: design and implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dueck, J.; Peters, J.F.
Year: 1999
On CAD databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mengchi Liu
Year: 1999
Issues on the design of a global university database system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yaoping Wang; Vu Pham; Karmouch, A.
Year: 1999
CORBA-based multimedia audio chat
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cimpu, V.F.; Ionescu, D.; Vieru, V.; Cimpu, M.
Year: 1999
A comparative analysis of high-speed digital test techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sachdev, M.; Shashaani, M.
Year: 1999
Towards memory centric computing: a flexible address mapping scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Lunteren, J.
Year: 1999
Semiconductor controlled rectifier (SCR) electrostatic discharge (ESD) protection devices in submicron CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, J.; Syrzycki, M.; Iniewski, K.
Year: 1999
Design and characterization of an embedded ASIC DRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birk, G.; Elliott, D.G.; Cockburn, B.E.
Year: 1999
Evaluating the output probability of Boolean functions without floating point operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yingtao Jiang; Yihui Tang; Yuke Wang; Savaria, Y.
Year: 1999
Dynamic combined pattern-parallel and fault-parallel fault simulation on computational RAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwong, A.L.-C.; Cockburn, B.F.; Elliott, D.G.
Year: 1999
GRASP: an effective constructive technique for VLSI circuit partitioning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Areibi, S.M.
Year: 1999
Design of a multi-purpose silicon integrated optical sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chunyan Wang; Ahmad, M.O.; Swamy, M.N.S.
Year: 1999
1.5 volts Iddq/Iddt current monitor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pecuh, I.; Margala, M.; Stopjakova, V.
Year: 1999
High-speed image composition with enhanced multiplier structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bo Liu; Margala, M.; Durdle, N.G.; Juskiw, S.
Year: 1999
A fast signature simulation technique for PPSFP simulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khadour, F.; Xiaoling Sun
Year: 1999
The applications of the new Chinese Remainder Theorems for three moduli sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Wang; Swamy, M.N.S.; Ahmad, M.O.; Yuke Wang
Year: 1999
Metal-semiconductor waveguides for application to optical-optical switching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Holzman, J.F.; Vermeulen, F.E.; Elezzabi, A.Y.
Year: 1999
Computer modelling of solid state laser systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buhr, M.; Fedosejevs, R.
Year: 1999
Photogrammetric calibration of a consumer grade flat-bed scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sampson, R.D.; Peterson, A.E.; Lozowski, E.P.
Year: 1999
Techniques to improve speed and efficiency of photodetectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:DeCorby, R.G.; Hnatiw, A.J.P.; McMullin, J.N.
Year: 1999
A multimode thermo-optic polymer switch for incorporation in a 4/spl times/4 hybrid integrated optoelectronic switch matrix
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hnatiw, A.J.P.; DeCorby, R.G.; McMullin, J.N.; Callender, C.; MacDonald, R.I.
Year: 1999
A supervised uncued classification approach for a class of multicomponent signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajan, S.; Doraiswami, R.; Stevenson, M.
Year: 1999
Optimal design of general multi-channel nonuniform transmultiplexers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, T.; Chen, T.
Year: 1999
Edge detection on color images using RGB vector angles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dony, R.D.; Wesolkowski, S.
Year: 1999
Improved image reconstruction by combining ARMA modeling with wavelet decomposition: preliminary results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nath, S.K.; Smith, M.R.
Year: 1999
On filtering short-duration sinusoids, periodic signals and damped sinusoids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Galigekere, R.R.; Venkatesh, Y.V.; Holdsworth, D.W.
Year: 1999
A standard-based system for robust video transmission over the Internet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cote, G.; Wenger, S.; Kossentini, F.
Year: 1999
Automatic detection of acoustic sub-word boundaries for single digit recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Artimy, M.M.; Robertson, W.; Phillips, W.J.
Year: 1999
A hybrid approach of wavelet packet and directional decomposition for image compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang, C.-N.; Wu, X.
Year: 1999
Ultrasonic aluminum weld testing method based on the wavelet transform and a neural classifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Legendre, S.; Massicotte, D.; Goyette, J.
Year: 1999
A new comprehensive database of handwritten Arabic words, numbers, and signatures used for OCR testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kharma, N.; Ahmed, M.; Ward, R.
Year: 1999
Renyi generalized entropy analysis of images from a progressive wavelet transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dansereau, R.; Kinsner, W.
Year: 1999
Real time 3D animation using progressive transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Greenberg, J.; Kinsner, W.
Year: 1999
Characterization and feature extraction of transient signals using multifractal measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun, L.; Kinsner, W.; Serinken, N.
Year: 1999
Texture analysis and segmentation of images using fractals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fazel-Rezai, R.; Kinsner, W.
Year: 1999
ECG signal compression and analysis in long-term monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, B.; Kinsner, W.
Year: 1999
Computational aspects of DNA multifractal analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rifaat, R.; Kinsner, W.
Year: 1999
Design of least asymmetric compactly supported orthogonal wavelets via optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao, Y.; Swamy, M.N.S.
Year: 1999
New architecture for multi-format video browsing and cut detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmed, M.; Karmouch, A.
Year: 1999
Adaptive IIR digital filtering using an analog neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwan, H.K.; Tao, L.
Year: 1999
2-D real Gabor transform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao, L.; Kwan, H.K.
Year: 1999
Error concealment methods, a comparative study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shirani, S.; Kossentini, F.; Ward, R.
Year: 1999
Feature analysis and classification of chromosome 16 homologs using fluorescence microscopy images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mousavi, P.; Ward, R.K.; Lansdorp, P.M.
Year: 1999
Method for partial reduction of the non-linearity and distortion in MR images caused by the presence of metal objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Domoustchiev, K.; Bott, K.; Smith, M.R.; Mintchev, M.P.
Year: 1999
Subspace-based line and curve extraction from noisy images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pango, P.A.; Champagne, B.
Year: 1999
Discontinuous control for harmonic drive system with the damping enhancement of acceleration feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han, J.D.; Qiu, Z.C.; Wang, Y.C.; Xu, W.L.
Year: 1999
Study of joint control system of main/flapped fin stabilizer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Shengzhong; Liu Sheng; Sun Jingchuan
Year: 1999
Robust delta-sigma modulators based on variable-structure control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akis Zourntos, T.
Year: 1999
Non-time based tracking controller for mobile robots
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jindong Tan; Ning Xi; Wei Kang
Year: 1999
Minimum variance feedforward control of a once-through steam generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gooden, K.; Morgan, P.; White, D.; Rink, R.
Year: 1999
Fault diagnosis of an industrial CGO coker model predictive control system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, B.; Zhao, X.; Tamayo, E.C.; Hanafi, A.
Year: 1999
Mobile agents for Web-based medical image retrieval
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, K.D.; Paranjape, R.B.
Year: 1999
Using statistics and neural networks in fault determination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schoorl, A.P.; Kourounakis, N.P.; Somers, C.D.A.; Dimopoulos, N.J.
Year: 1999
Robust speed estimation of an asynchronous machine aided by a dynamic neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghouili, J.; Cheriti, A.
Year: 1999
Fuzzy clocks as observers in communication networks with chaos: a fuzzy sets approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dansereau, R.; Kinsner, W.; Peters, J.F.
Year: 1999
An integrated expert system/operations research approach for natural gas pipeline operations optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiki Leo Sun; Uraikul, V.; Chan, C.W.; Tontiwachwuthikul, P.
Year: 1999
An independent maximum power extraction strategy for wind energy conversion systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, Q.; Chan, L.
Year: 1999
Rotating power cuts in Alberta-the past and the future
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rao, N.D.
Year: 1999
Transmission line model for large step size transient simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ibrahim, A.; Henschel, S.; Dommel, H.; Niimura, T.
Year: 1999
The effect of Au plating thickness of BGA substrates on ball shear strength under reliability tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hung, S.C.; Zheng, P.J.; Lee, S.C.; Lee, J.J.
Year: 1999
Shear testing and failure mode analysis for evaluation of BGA ball attachment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erich, R.; Coyle, R.J.; Wenger, G.M.; Primavera, A.
Year: 1999
The influence of nickel/gold surface finish on the assembly quality and long term reliability of thermally enhanced BGA packages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coyle, R.J.; Holliday, A.; Mescher, P.; Solan, P.P.; Gahr, S.A.; Cyker, H.A.; Dorey, K.; Ejim, T.I.
Year: 1999
Making the six sigma leap using SPC data [quality]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Horst, R.L.
Year: 1999
Adaptive fuzzy control of solder paste printing: the identification of deposit defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Howarth, M.; Lotfi, A.
Year: 1999
Thermosonic ball bonding: friction model based on integrated microsensor measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schwizer, J.; Mayer, M.; Bolliger, D.; Paul, O.; Baltes, H.
Year: 1999
Use of the area-of-spread method for monitoring the stability of reflow furnaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ekere, N.N.; Lawson, W.
Year: 1999
Fine pitch low-cost bumping for flip chip technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Szu-Wei Lu; Ruoh-Huey Uang; Kuo-Chuan Chen; Hsu-Tien Hu; Ling-Chen Kung; Hsin-Chien Huang
Year: 1999
Evaluation of eutectic solder bump interconnect technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beddingfield, C.; Qing Tan; Mistry, A.
Year: 1999
Eutectic bump evaluation with various passivation and polyimide structures [flip chip interconnects]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mistry, A.; Ananthanarayanan, K.; Mitchell, D.; Qing Tan; Beddingfield, C.; Mathew, V.; Sarihan, V.; Smith, J.
Year: 1999
Effect of CSP rework on surface intermetallic growth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Philpott, J.D.; Nguty, T.A.; Ekere, N.N.; Jones, G.D.
Year: 1999
Wafer to wafer direct bonding using surfaces activated by hydrogen plasma treatment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Choi, W.B.; Ju, C.M.; Ju, B.K.; Sung, M.Y.
Year: 1999
Compatibility of gas filters with HBr gas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amari, M.; Funahashi, I.; Ohyashiki, Y.; Takahara, K.
Year: 1999
Producing stress- and fault-free epitaxial silicon over buried antimony layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Turner, T.J.; Petersen, S.F.
Year: 1999
A model of the distribution of interconnectivity through multiple system levels and the impact of different design strategies and IP re-use on design effort
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palmer, P.J.; Williams, D.J.
Year: 1999
Closed loop feedback for continuous mode materials jetting [solder/adhesives]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lovelady, M.J.; Watts, J.D.
Year: 1999
Analysis of copper plating baths-new developments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Newton, B.; Kaiser, E.
Year: 1999
Flip-chip fine package and its assembly line development for GaAs MCM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kurata, H.; Ogata, T.; Mitsuka, K.; Matsushita, H.; Kimura, C.
Year: 1999
Thin mold array package warpage control study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, E.; Thompson, T.; Chen, S.
Year: 1999
Development of chip scale package for DRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cho, T.J.; Ahn, E.C.; Lyu, J.H.; Chung, M.G.; Oh, S.Y.
Year: 1999
Plastic strain in thermally cycled flip-chip PBGA solderballs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Drexler, E.S.
Year: 1999
Yield improvement at the contact process through run-to-run control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Khan; C. El Chemali; J. Moyne; J. Chapple-Sokol; R. Nadeau; P. Smith; J. Colt; T. Parikh
Year: 1999
Application of holography to evaluate the thermal deformation of printed circuit board connector due to thermal stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taniguchi, M.; Takagi, T.
Year: 1999
Plated copper on ceramic manufacturing technology advances into RF and CSP assembly systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balents, L.; Christopher, K.; Skoczylas, D.
Year: 1999
Correlating solder paste composition with stencil printing performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguty, T.A.; Ekere, N.N.; Adebayo, A.
Year: 1999
Bumping of silicon wafers by stencil printing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adriance, J.H.; Whitmore, M.A.; Schake, J.D.
Year: 1999
Reducing complexity of wafer flow to improve quality and throughput in a single-wafer cluster tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oh, H.L.
Year: 1999
Reliability of laser activated metal fuses in DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arndt, K.; Narayan, C.; Brintzinger, A.; Guthrie, W.; Lachtrupp, D.; Mauger, J.; Glimmer, D.; Lawn, S.; Dinkel, B.; Mitwalsky, A.
Year: 1999
Packaging of high resolution Si based spatial light modulators for display applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Narayan, C.; Horton, R.
Year: 1999
Integration of arrayed wavelength division multiplex components into an optical add drop module transmitter and receiver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lisicka, E.; Hua, H.; James, R.; Berolo, E.; Wang, W.-J.; He, J.J.; Lamontagne, B.; Erickson, L.; Delage, A.; Davies, M.; Koteles, E.S.
Year: 1999
High thermal performance silicon heat spreaders with microwhisker structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hammel, E.; Nagl, C.; Nicolics, J.; Hanreich, G.
Year: 1999
How to assemble large PBGAs on PCB reliably with large PQFPs directly on the opposite side?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lau, J.H.; Lee, R.; Chao, H.
Year: 1999
Failure analysis of solder bumped flip chip on low-cost substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lau, J.H.; Chang, C.; Lee, S.-W.R.
Year: 1999
Applications of multivariate statistics at Dofasco
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dudzic, M.; Vaculik, V.; Miletic, I.
Year: 1999
Using transient models of liquid pipelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Threlfall, R.W.
Year: 1999
An adaptive artificial neural network to model a Cu/Pb/Zn flotation circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Forouzi, S.; Meech, J.A.
Year: 1999
Advanced thickener control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schoenbrunn, F.; Toronto, T.
Year: 1999
Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lakin, D.R., II; Singh, A.D.
Year: 1999
Testing an MCM for high-energy physics experiments: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benso, A.; Chiusano, S.; Prinetto, P.; Giovannetti, S.; Mariani, R.; Motto, S.
Year: 1999
Transient current testing of 0.25 /spl mu/m CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kruseman, B.; Janssen, P.; Zieren, V.
Year: 1999
Statistical threshold formulation for dynamic I/sub dd/ test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiang, W.; Vinnakota, B.
Year: 1999
Defect detection using power supply transient signal analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Germida, A.; Zheng Yan; Plusquellic, J.F.; Muradali, F.
Year: 1999
Minimized power consumption for scan-based BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gerstendorfer, S.; Wunderlich, H.-J.
Year: 1999
Fault diagnosis in scan-based BIST using both time and space information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghosh-Dastidar, J.; Das, D.; Touba, N.A.
Year: 1999
Expediting ramp-to-volume production
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balachandran, H.; Parker, J.; Gammie, G.; Olson, J.; Force, C.; Butler, K.M.; Jandhyala, S.
Year: 1999
DFT advances in the Motorola's MPC7400, a PowerPC/sup TM/ G4 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pyron, C.; Alexander, M.; Golab, J.; Joos, G.; Long, B.; Molyneaux, R.; Raina, R.; Tendolkar, N.
Year: 1999
Towards reducing "functional only" fails for the UltraSPARC/sup TM/ microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kinra, A.
Year: 1999
Breaking the complexity spiral in board test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scheiber, S.F.
Year: 1999
The integration of boundary-scan test methods to a mixed-signal environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ley, A.W.
Year: 1999
Using LSSD to test modules at the board level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ziaja, T.A.
Year: 1999
Switch-level delay test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Natarajan, S.; Gupta, S.K.; Breuer, M.A.
Year: 1999
Delay testing considering power supply noise effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krstic, A.; Yi-Min Jiang; Kwang-Ting Cheng
Year: 1999
Test generation for crosstalk-induced delay in integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Yu Chen; Gupta, S.K.; Breuer, M.A.
Year: 1999
Accurate path delay fault coverage is feasible
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tragoudas, S.
Year: 1999
A new approach to RF impedance test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dino Ren Tao
Year: 1999
Subband filtering scheme for analog and mixed-signal circuit testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roh, J.; Abraham, J.A.
Year: 1999
Design of a test simulation environment for test program development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Riordan, J.J.O.
Year: 1999
Automatic timing margin failure location analysis by CycleStretch method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsumoto, M.; Ikeda, Y.
Year: 1999
Design for In-System Programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bonnett, D.A.
Year: 1999
Robust testability of primitive faults using test points
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tekumalla, R.C.; Menon, P.R.
Year: 1999
Delay testing of SOI circuits: Challenges with the history effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:MacDonald, E.; Touba, N.A.
Year: 1999
A DFT technique for high performance circuit testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shashaani, M.; Sachdev, M.
Year: 1999
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Singh, A.D.; Sogomonyan, E.S.; Gossel, M.; Seuring, M.
Year: 1999
Practical scan test generation and application for embedded FIFOs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rearick, J.
Year: 1999
Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakahara, S.; Higeta, K.; Kohno, M.; Kawamura, T.; Kakitani, K.
Year: 1999
Fault modeling of suspended thermal MEMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Charlot, B.; Mir, S.; Cota, E.F.; Lubaszewski, M.; Courtois, B.
Year: 1999
Particulate failures for surface-micromachined MEMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao Jiang; Blanton, R.D.S.
Year: 1999
IMEMS accelerometer testing-test laboratory development and usage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beegle, R.W.; Brocato, R.W.; Grant, R.W.
Year: 1999
Low overhead test point insertion for scan-based BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakao, M.; Kobayashi, S.; Hatayama, K.; Iijima, K.; Terada, S.
Year: 1999
Logic BIST for large industrial designs: real issues and case studies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hetherington, G.; Fryars, T.; Tamarapalli, N.; Kassab, M.; Hassan, A.; Rajski, J.
Year: 1999
Characterization and optimization of the production probing process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quach, M.; Samuelson, R.; Shaw, D.
Year: 1999
Probe contact resistance variations during elevated temperature wafer test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Broz, J.J.; Rincon, R.M.
Year: 1999
Checking sequence generation for asynchronous sequential elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goren, S.; Ferguson, F.J.
Year: 1999
Functional verification of intellectual properties (IP): a simulation-based solution for an application-specific instruction-set processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stadler, M.; Rower, T.; Kaeslin, H.; Felber, N.; Fichtner, W.; Thalmann, M.
Year: 1999
Critical path identification and delay tests of dynamic circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyung Tek Lee; Abrham, J.A.
Year: 1999
Static component interconnect test technology (SCITT) a new technology for assembly testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biewenga, A.; Hollmann, H.D.L.; Frans de Jong; Lousberg, M.
Year: 1999
Interconnect delay fault testing with IEEE 1149.1
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuejian Wu; Paul Soong
Year: 1999
Correlation of logical failures to a suspect process step
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balachandran, H.; Parker, J.; Shupp, D.; Butler, S.; Butler, K.M.; Force, C.; Smith, J.
Year: 1999
Defect-based delay testing of resistive vias-contacts a critical evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baker, K.; Gronthoud, G.; Lousberg, M.; Schanstra, I.; Hawkins, C.
Year: 1999
Optimal conditions for Boolean and current detection of floating gate faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renovell, M.; Ivanov, A.; Bertrand, Y.; Azais, F.; Rafiq, S.
Year: 1999
Embedded X86 testing methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Basto, L.; Khan, A.; Hodakievic, P.
Year: 1999
Towards a standardized procedure for automatic test equipment timing accuracy evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cai, Y.; Ortner, W.R.; Garrenton, C.T.
Year: 1999
An accurate simulation model of the ATE test environment for very high speed devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Warwick, T.P.; Cho, J.; Cai, Y.; Ortner, B.
Year: 1999
BIST for phase-locked loops in digital applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sunter, S.; Roy, A.
Year: 1999
Auto-calibrating analog timer for on-chip testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Provost, B.; Sanchez-Sinencio, E.
Year: 1999
Effective oscillation-based test for application to a DTMF filter bank
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huertas, G.; Vazquez, D.; Rueda, A.; Huertas, J.L.
Year: 1999
Static component interconnection test technology in practice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Jong, F.; Raaijmakers, R.
Year: 1999
Limited access testing of analog circuits: handling tolerances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahrikencheikh, C.; Spears, M.
Year: 1999
A comparison of bridging fault simulation methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ma, S.; Shaik, I.; Fetherston, R.S.
Year: 1999
Resistive bridge fault modeling, simulation and test generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sar-Dessai, V.R.; Walker, D.M.H.
Year: 1999
SymSim: symbolic fault simulation of data-flow data-path designs at the Register-Transfer level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yadavalli, S.; Reddy, S.M.
Year: 1999
Towards a standard for embedded core test: an example
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marinissen, E.J.; Zorian, Y.; Kapur, R.; Taylor, T.; Whetsel, L.
Year: 1999
Trends in SLI design and their effect on test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aitken, R.; Muradali, F.
Year: 1999
Test features of a core-based co-processor array for video applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Beers, J.; Van Herten, H.
Year: 1999
Is Analog Fault Simulation a Key to Product Quality? Practical Considerations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaminska, B.
Year: 1999
Analog Fault Simulation: Need it? No. It is already done
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Atwood, E.R.
Year: 1999
Analog Fault Simulation: Key to Product Quality, or a Foot in the Door
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Force, C.
Year: 1999
Self-checking scheme for very fast clocks' skew correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metra, C.; Giovanelli, F.; Soma, M.; Ricco, B.
Year: 1999
Finite state machine synthesis with concurrent error detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chaohuang Zeng; Saxena, N.; McCluskey, E.J.
Year: 1999
DFT, test lifecycles and the product lifecycle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robinson, G.D.
Year: 1999
An histogram based procedure for current testing of active defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thibeault, C.
Year: 1999
I/sub DDQ/ testing in deep submicron integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miller, A.C.
Year: 1999
Clustering based techniques for I/sub DDQ/ testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jandhyala, S.; Balachandran, H.; Jayasumana, A.P.
Year: 1999
Current ratios: a self-scaling technique for production I/sub DDQ/ testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maxwell, P.; O'Neill, P.; Aitken, R.; Dudley, R.; Jaarsma, N.; Quach, M.; Wiseman, D.
Year: 1999
Linearity testing issues of analog to digital converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuyel, T.
Year: 1999
Estimating the integral non-linearity of A/D-converters via the frequency domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Csizmadia, N.; Janssen, A.J.E.M.
Year: 1999
Testing high speed high accuracy analog to digital converters embedded in systems on a chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Max, S.
Year: 1999
Relating linearity test results to design flaws of pipelined analog to digital converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuyel, T.; Bilhan, H.
Year: 1999
A new method for jitter decomposition through its distribution tail fitting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, M.P.; Wilstrup, J.; Jessen, R.; Petrich, D.
Year: 1999
Test support processors for enhanced testability of high performance circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keezer, D.C.; Zhou, Q.
Year: 1999
Design-for-test methodology for Motorola PowerPC/sup TM/ microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abadir, M.; Raina, R.
Year: 1999
Testability of the Philips 80C51 micro-controller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Konijnenburg, M.H.; Van Der Linden, J.T.; Van De Goor, A.J.
Year: 1999
Tradeoff analysis for producing high quality tests for custom circuits in PowerPC/sup TM/ microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, L.-C.; Abadir, M.S.
Year: 1999
A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Butler, K.M.
Year: 1999
An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seshadri, S.; Hsiao, M.S.
Year: 1999
The test requirements model (TeRM) communicating test information throughout the product life cycle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shombert, L.A.; Davis, D.C.; Bukata, E.M.
Year: 1999
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huott, W.; McManus, M.; Knebel, D.; Steen, S.; Manzer, D.; Sanda, P.; Wilson, S.; Chan, Y.; Pelella, A.; Polonsky, S.
Year: 1999
A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, H.B.; Ha, D.S.
Year: 1999
The testability features of the 3rd generation ColdFire/sup (R)/ family of microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crouch, A.L.; Mateja, M.; McLaurin, T.L.; Potter, J.C.; Tran, D.
Year: 1999
On achieving complete coverage of delay faults in full scan circuits using locally available lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pomeranz, I.; Reddy, S.M.
Year: 1999
Practical optical waveform probing of flip-chip CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilsher, K.R.; Lo, W.K.
Year: 1999
Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kitagaki, T.
Year: 1999
A method to improve the performance of high-speed waveform digitizing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Asami, K.; Tajiri, S.
Year: 1999
On-line fault detection in DSP circuits using extrapolated checksums with minimal test points
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakrabarti, S.; Chatterjee, A.
Year: 1999
An efficient on-line-test and back-up scheme for embedded processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pflanz, M.; Pompsch, F.; Vierhaus, H.T.
Year: 1999
Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramovici, M.; Strond, C.; Hamilton, C.; Wijesuriya, S.; Verma, V.
Year: 1999
Industrial evaluation of stress combinations for march tests applied to SRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schanstra, I.; Van De Goor, A.J.
Year: 1999
An on-line BISTed SRAM IP core
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lobetti-Bodoni, M.; Pricco, A.; Benso, A.; Chiusano, S.; Prinetto, P.
Year: 1999
Port interference faults in two-port memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamdioui, S.; Van De Goor, A.J.
Year: 1999
Using Verilog simulation libraries for ATPG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wohl, P.; Waicukauski, J.
Year: 1999
STAR-ATPG: a high speed test pattern generator for large scan designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, K.-H.; Tompson, R.; Rajski, J.; Marek-Sadowska, M.
Year: 1999
Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dworak, J.; Grimaila, M.R.; Lee, S.; Wang, L.-C.; Mercer, M.R.
Year: 1999
Delay fault testing of IP-based designs via symbolic path modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, H.; Hayes, J.P.
Year: 1999
Eliminating the Ouija/sup (R)/ board: automatic thresholds and probabilistic I/sub DDQ/ diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lvao, D.B.; Larrabee, T.; Colburn, J.E.
Year: 1999
Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Song, P.; Motika, F.; Knebel, D.; Rizzolo, R.; Kusko, M.; Lee, J.; McManus, M.
Year: 1999
The effects of test compaction on fault diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shao, Y.; Guo, R.; Pomeranz, I.; Reddy, S.M.
Year: 1999
Is DFT right for you?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johnson, J.
Year: 1999
Design for test and time to market-friends or foes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Turino, J.
Year: 1999
Design for testability: it is time to deliver it for Time-to-Market
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dervisolu, B.
Year: 1999
High Time For High Level ATPG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iyer, M.A.
Year: 1999
High time for high level ATPG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu-Tung Cheng
Year: 1999
Changing our Path to High Level ATPG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davidson, S.
Year: 1999
High level ATPG is important and is on its way!
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kapur, R.
Year: 1999
High-level ATPG: a real topic or an academic amusement?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reorda, M.S.
Year: 1999
High-level ATPG for Early Power Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roethig, W.
Year: 1999
SIA Roadmaps: Sunset Boulevard for l/sub DDQ/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baker, K.
Year: 1999
Thin Gate Oxide Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roehr, J.L.
Year: 1999
Applying lessons learned from TDDB testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prendergast, J.
Year: 1999
Scan Insertion at the Behavioral Level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aktouf, C.
Year: 1999
Benchmarking DAT with the ITC'99 ATPG Benchmarks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Konijnenburg, M.; van der Linden, H.; Geuzebroek, J.
Year: 1999


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