A compact lateral-SOI BJT model for RF circuit simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fuse, T.; Kawanaka, S.; Inoh, K.; Shino, T.
Year: 1999
Impact-ionization in silicon at large operating temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Valdinoci, M.; Ventura, D.; Vecchi, M.C.; Rudan, M.; Baccarani, G.; Illien, F.; Stricker, A.; Zullino, L.
Year: 1999
Simple phase-space trajectory calculation for Monte Carlo device simulation including screened impurity scattering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bufler, F.M.; Yoder, P.D.; Fichtuer, W.
Year: 1999
Molecular dynamics calculation studies of interstitial-Si diffusion and arsenic ion implantation damage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hane, M.; Ikezawa, T.; Furukawa, A.
Year: 1999
Evaluation of excess interstitial silicon amount using delta-doped boron markers grown by UHV-CVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiroi, M.; Ikezawa, T.; Hane, M.; Furukawa, A.
Year: 1999
New developments and old problems in grid generation and adaptation for TCAD applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fichtner, W.; Krause, J.; Schmithusen, B.; Villablanca, L.
Year: 1999
Practical inverse modeling with SIESTA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strasser, R.; Plasun, R.; Selberherr, S.
Year: 1999
Optimization of temperature-time profiles in rapid thermal annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bork, I.; Molzer, W.; Nguyen, C.D.
Year: 1999
Accurate resist profile simulation for large area OPC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Inui, H.; Ohta, T.
Year: 1999
Modeling of direct tunneling gate current in ultra-thin gate oxide MOSFETs: a comparison between simulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cassan, E.; Galdin, S.; Dollfus, P.; Hesto, P.
Year: 1999
Transport-reaction model for interface state build-up at the Si-SiO/sub 2/ interface [in MOSFETs]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iizuka, T.; Yoshida, T.
Year: 1999
A 3-dimensional process-simulator based on an open architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wada, T.; Umimoto, H.; Fujinaga, M.; Kimura, M.; Uchida, T.; Suzuki, K.; Akiyama, Y.; Hane, M.; Takenaka, M.; Miura, N.; Kotani, N.
Year: 1999
Comparison of finite element and finite box discretization for three-dimensional diffusion modeling using AMIGOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haindl, B.; Kosik, R.; Fleischmann, P.; Selberherr, S.
Year: 1999
A FEM-MD combination method for silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Izumi, S.; Kawakami, T.; Sakai, S.
Year: 1999
Consistent comparison of drift-diffusion and hydro-dynamic device simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grasser, T.; Kosina, H.; Selberherr, S.
Year: 1999
Fast statistical-based interconnect modeling using automatic differentiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roh, L.; Bischof, C.; Chang, N.; Lee, K.; Kanevsky, V.; Nakagawa, O.S.; Soo Young Oh
Year: 1999
Advances in spherical harmonic device modeling: calibration and nanoscale electron dynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung-Kai Lin; Goldsman, N.; Mayergoyz, I.; Aronowitz, S.; Belova, N.
Year: 1999
Effect of the tunneling rates on the conductance characteristics of single-electron transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scholze, A.; Schenk, A.; Fichtner, W.
Year: 1999
Macromodel for micromechanical, multi-electrode structures in force feedback control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Handtmann, M.; Aigner, R.; Plotz, F.; Wachutka, G.
Year: 1999
Coupled hydrodynamic and electrodynamic modelling of an transformer coupled plasma (TCP) for semiconductor processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scheubert, P.; Awakowicz, P.; Schwefel, R.; Wachutka, G.
Year: 1999
A practical CMP profile model for LSI design application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohta, T.; Toda, T.; Ueno, H.
Year: 1999
Interconnect modeling for VLSIs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soo-Young Oh; Won-Young Jung; Jeong-Taek Kong; Keun-Ho Lee
Year: 1999
Precise physical modeling of the reverse-short-channel effect for circuit simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suetake, M.; Miura-Mattausch, M.; Mattausch, H.J.; Kumashiro, S.; Shigyo, N.; Odanaka, S.; Nakayama, N.
Year: 1999
Full-band Monte Carlo device simulation of a Si/SiGe-HBT with a realistic Ge profile
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keith, S.; Jungemann, C.; Decker, S.; Neinhus, B.; Bartels, M.; Meinerzhagen, B.
Year: 1999
Full-band quantum transport simulation based on tight-binding Green's function method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ogawa, M.; Sugano, T.; Tominaga, R.; Miyoshi, T.
Year: 1999
Simulation of heterojunction bipolar transistors on gallium-arsenide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palankovski, V.; Selberherr, S.; Schultheis, R.
Year: 1999
Density-gradient analysis of tunneling in MOS structures with ultra-thin oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ancona, M.G.; Yu, Z.; Dutton, R.W.; Vande Voorde, P.J.; Cao, M.; Vook, D.
Year: 1999
Simulation of direct tunneling through stacked gate dielectrics by a fully integrated 1D-Schrodinger-Poisson solver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wettstein, A.; Schenk, A.; Fichtner, W.
Year: 1999
Homogeneous transport in silicon dioxide using the spherical-harmonics expansion of the BTE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scozzoli, L.; Reggiani, S.; Rudan, M.
Year: 1999
Efficiency of electrostatic separation of minerals from coal as a function of size and charge distributions of coal particles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tennal, K.B.; Lindquist, D.; Mazumder, M.K.; Rajan, R.; Guo, W.
Year: 1999
Distribution of electric field strength around a large-scale charged particles cloud
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sugimoto, T.; Doi, S.; Takahashi, M.; Higashiyama, Y.
Year: 1999
Effect of mutual inductance on steady-state performance and position estimation of switched reluctance motor drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Panda, D.; Ramanarayanan, V.
Year: 1999
Two-dimensional finite element analysis of a high force density linear switched reluctance machine including three-dimensional effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deshpande, U.
Year: 1999
Two-dimensional finite element analysis of a high force density linear switched reluctance machine including three-dimensional effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deshpande, U.
Year: 1999
Sensorless vector controlled induction machine drives with fast stator voltage offset compensation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kubota, H.; Kataoka, Y.; Ohta, H.; Matsuse, K.
Year: 1999
Time coordination method for power system protection by evolutionary algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:So, C.W.; Li, K.K.
Year: 1999
A neural network based positional tracking controller for servo systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boyagoda, P.; Nakaoka, M.
Year: 1999
Using a Debye polarization cell to predict double-layer capacitor performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nelms, R.M.; Cahela, D.R.; Tatarchuk, B.J.
Year: 1999
Thermal modeling of aluminum electrolytic capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parler, S.G., Jr.
Year: 1999
Current sharing between diode clamps of polar capacitor bank
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Dijk, E.; Ferreira, J.A.; van Gelder, P.
Year: 1999
Capacitor measurements for power electronic applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strydom, J.T.; van Wyk, J.D.; Ferreira, J.A.
Year: 1999
The design of duty-cycle modulated three-phase boost rectifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simonetti, D.S.L.; Azevedo, M.C.; Vieira, J.L.F.; Rey, J.P.
Year: 1999
Axial flux interior PM synchronous motor: parameters identification and steady-state performance measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cavagnino, A.; Lazzari, M.; Profumo, F.; Tenconi, A.
Year: 1999
Optimal control of permanent-magnet AC machine drives with a novel multiple reference frame estimator/regulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chapman, P.L.; Sudhoff, S.D.
Year: 1999
Prediction of starting performance of PM motor by DC decay testing method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamamoto, S.; Ara, T.; Oda, S.; Matsuse, K.
Year: 1999
Comparison of motion control loops for industrial applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ellis, G.; Lorenz, R.D.
Year: 1999
Decoupled control of active and reactive power for a grid-connected doubly-fed wound rotor induction machine without position sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Datta, R.; Ranganathan, V.T.
Year: 1999
Web-based virtual engineering laboratory (VE-LAB) for a hybrid electric vehicle starter/alternator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sepe, R.B., Jr.; Chamberland, M.; Short, N.
Year: 1999
A battery management system for stand alone photovoltaic energy systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duryea, S.; Islam, S.; Lawrance, W.
Year: 1999
A medium-voltage drive utilizing series-cell multilevel topology for outstanding power quality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osman, R.H.
Year: 1999
OH radical generation in a discharge plasma observed by a LIF method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ono, R.; Oda, T.
Year: 1999
Removal of dilute benzene using zeolite-hybrid plasma reactor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ogata, A.; Ito, D.; Mizuno, K.; Kushiyama, S.; Yamamoto, T.
Year: 1999
OH radical generation by atmospheric pressure plasma and its quantitative analysis by monitoring CO oxidation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Su, Z.; Hyun-Ha Kim; Tsutsui, M.; Takashima, K.; Mizuno, A.
Year: 1999
Decomposition of trichloroethylene by non-thermal plasma with catalyst
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oda, T.; Takahashi, T.; Kohzuma, S.
Year: 1999
A new neutral point current control for a 3-level converter/inverter pair system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yo-Han Lee; Bum-Seok Suh; Chang-Ho Choi; Dong-Seok Hyun
Year: 1999
An airgap flux oriented vector controller for stable magnetic suspension during high torque acceleration in bearingless induction motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, T.; Chiba, A.; Azizur Rahman, M.; Fukao, T.
Year: 1999
Common mode voltage reduction method modifying the distribution of zero voltage vector in PWM converter/inverter system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyeoun-Dong Lee; Seung-Ki Sul
Year: 1999
An approach to achieve ride-through of an adjustable speed drive with flyback converter modules powered by super capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duran-Gomez, J.L.; Enjeti, P.N.; von Jouanne, A.
Year: 1999
On the reliability of DC-DC converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keskar, N.; Trivedi, M.; Shenai, K.
Year: 1999
Compensating power measurement phase delay error
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lester, J.N.; Alexandrovich, B.M.
Year: 1999
Optical wireless based on high brightness visible LEDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pang, G.; Kwan, T.; Liu, H.; Chi-Ho Chan
Year: 1999
An investigation to general characteristics of impulse magnetizer. I. Circuit, thermal and cost modeling of impulse magnetizer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pill-Soo Kim; Yong Kim; Byung-You Hong
Year: 1999
Notch filter tuning for resonant frequency reduction in dual inertia systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schmidt, P.; Rehm, T.
Year: 1999
Fabric defect detection by Fourier analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chi-Ho Chan; Pang, G.
Year: 1999
Sub-micron position sensor with a fiber-optic interferometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagaike, Y.; Lai, G.; Wu, Y.; Ikeda, H.
Year: 1999
Analysis and measurement of chip current imbalances caused by the structure of bus bars in an IGBT module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohi, T.; Horiguchi, T.; Okuda, T.; Kikunaga, T.; Matsumoto, H.
Year: 1999
Motion of a conductive particle in viscous fluid simulating liquefied plastic waste
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Choi, C.; Yatsuzuka, K.; Asano, K.
Year: 1999
Statistical energy analysis of acoustic noise and vibration for electric motors: transmission from air gap field to motor frame
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Delaere, K.; Iadevaia, M.; Heylen, W.; Sas, P.; Hameyer, K.; Beimans, R.
Year: 1999
Detection of A-C machine winding deterioration using electrically excited vibrations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trutt, F.C.; Sottlie, J.; Kohler, J.L.
Year: 1999
Stator fault diagnosis in induction motors using power decomposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arkan, M.; Unsworth, P.J.
Year: 1999
Closed loop control impact on the diagnosis of induction motors faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bellini, A.; Filippetti, F.; Franceschini, G.; Tassoni, C.
Year: 1999
Rotor cage fault diagnosis in three-phase induction motors by the total instantaneous power spectral analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cruz, S.M.A.; Cardoso, A.J.M.
Year: 1999
The flux switching motor, a DC motor without magnets or brushes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pollock, C.; Wallace, M.
Year: 1999
Co-axial current transformer for test and characterization of high power semiconductor devices under hard and soft-switching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lyra, R.O.C.; John, V.; Lipo, T.A.; Filho, B.J.C.
Year: 1999
An adaptive microcomputer based load shedding relay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang, Z.; Li, K.K.; Yin, X.G.; Zhang, Y.H.; Chen, D.S.
Year: 1999
Representing electrical behaviour of transformers by lumped element circuits: a global physical approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schellmanns, A.; Keradec, J.-P.; Schanen, J.-L.; Berrouche, K.
Year: 1999
Loss modeling for planar inductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Imre, T.G.; Cronje, W.A.; Van Wyk, J.D.; Ferreira, J.A.
Year: 1999
A method to charge and discharge high current energy storage coils
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Dijk, E.; Ferreira, J.A.; Van Gelder, P.
Year: 1999
HOKA: a new isolated current measuring principle and its features
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karrer, N.; Hofer-Noser, P.; Henrard, D.
Year: 1999
An accurate experimental apparatus for measuring losses in magnetic components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sridhar, S.; Wolf, R.M.; Odendaal, W.G.
Year: 1999
Mobility and drift velocity of charge carriers in gas mixtures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zucerovsky, Z.
Year: 1999
Electrostatic characterization of carpets and rugs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faesarella, A.S.; Altafim, R.A.C.; Canova, J.S.
Year: 1999
Analytical and numerical computation of airgap magnetic fields in brushless permanent-magnet motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rasmussen, K.F.; Davies, J.H.; Miller, T.J.E.; McGlip, M.I.; Olaru, M.
Year: 1999
A novel electric machine employing torque magnification and flux concentration effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dinyu Qin; Ronghai Qu; Lipo, T.A.
Year: 1999
Review of sensorless methods for brushless DC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johnson, J.P.; Ehsani, M.; Guzelgunler, Y.
Year: 1999
A sensorless direct torque control technique for permanent magnet synchronous motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minghua Fu; Longya Xu
Year: 1999
A sensorless induction motor drive for low speed applications using a novel stator resistance estimation method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guidi, G.; Umida, H.
Year: 1999
Condition monitoring and fault diagnosis of electrical machines-a review
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nandi, S.; Toliyat, H.A.
Year: 1999
Condition-based maintenance of electrical machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kohler, J.L.; Sottile, J.; Trutt, F.C.
Year: 1999
A novel parallel-resonant programmed start electronic ballast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hesterman, B.L.; Poehlman, T.M.
Year: 1999
Voice actuation with context learning for intelligent machine control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sepe, R.B., Jr.; Pace, J.F.
Year: 1999
A comparative evaluation of new silicon carbide diodes and state-of-the-art silicon diodes for power electronic applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elasser, A.; Kheraluwala, M.; Ghezzo, M.; Steigerwald, R.; Krishnamurthy, N.; Kretchmer, J.; Chow, T.P.
Year: 1999
Characterization and modeling of high voltage SiC PN diode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keskar, N.; Vijayalakshmi, R.; Trivedi, M.; Shenai, K.; Neudeck, P.
Year: 1999
1200 V, 50 A Trench Oxide PiN Schottky (TOPS) diode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, H.-R.; Winterhalter, C.; Gupta, R.; Humphrey, K.D.
Year: 1999
Characterizing medium-voltage high-power devices under conventional and soft-switching conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:von Bloh, J.; De Doncker, R.W.
Year: 1999
Pulsed corona modelling of a wire-cylinder ESP under dust loading condition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liang, X.; Jayaram, S.; Chang, J.S.; Berezein, A.
Year: 1999
Dynamic performance and control of a multilevel universal power conditioner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tolbert, L.M.; Peng, F.Z.; Habetler, T.G.
Year: 1999
Thermal effects of stray load losses in induction machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jimoh, A.A.
Year: 1999
Novel high speed induction motor for a commercial centrifugal compressor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soong, W.L.; Kliman, G.B.; Johnson, R.N.; White, R.; Miller, J.
Year: 1999
Nonlinear model and momentary performance capability of a cage rotor induction machine used as an automotive combined starter-alternator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McCleer, P.J.; Miller, J.M.; Gale, A.R.; Degner, M.W.; Leonardi, F.
Year: 1999
The rotor speed and position sensorless control of SRM using the binary observer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iee-Woo Yang; Young-Seok Kim; Yong-Geun Lee
Year: 1999
An improvement of HAGC response for CSC No.1 HSM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan-Liang Hsu; Chang-Pin Liang; Song-Jau Tsai
Year: 1999
Influence of frequency and current waveform on low pressure sodium lamp operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaiser, W.
Year: 1999
Experimental results for a pulsed vortex water wall high-pressure argon lamp
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kouroussis, D.; Bonert, R.; Dawson, F.P.
Year: 1999
Intelligent fusion control throughout varying thermal regions [arc welding]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hartman, D.A.; DeLapp, D.R.; Cook, G.E.; Barnett, R.J.
Year: 1999
A new induction motor drive with fuzzy logic CC-PWM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cecati, C.; Rotondale, N.
Year: 1999
IGBT model validation for soft-switching applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berning, D.W.; Hefner, A.R., Jr.
Year: 1999
Measurement of tribo and corona charging features of materials for assessment of risks from static electricity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chubb, J.
Year: 1999
Calibration of a calorimeter for measurements of electrostatic discharge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kucerovsky, Z.; Greason, W.D.; Flatley, M.Wm.
Year: 1999
Study of electrostatic properties of dielectric surfaces and powders using scanning probe microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Machowski, W.; Baird, P.; Balachandran, W.
Year: 1999
Optical decoupling in measurements of corona currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kucerovsky, Z.; Greason, W.D.; Doyle, T.E.
Year: 1999
A novel silent discharge type ozonizer using pulse density modulated high-frequency inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shengpei Wang; Konishi, Y.; Koudriavtsev, O.; Nakaoka, M.
Year: 1999
Voltage-phase shifting effect of three-phase harmonic canceling reactors and their applications to three-level diode rectifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oguchi, K.; Maeda, G.; Hoshi, N.; Kubota, T.
Year: 1999
Frequency domain analysis of three phase linear current regulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zmood, D.N.; Holmes, D.G.; Bode, G.
Year: 1999
A stand-still method for estimating the rotor resistance of induction motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Godbersen, J.
Year: 1999
On-line estimation of the stator parameters in an induction motor using only voltage and current measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zamora, J.L.; Garcia-Cerrada, A.
Year: 1999
Design and control of multi-span tension simulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seung-Ho Song; Seung-Ki Sul
Year: 1999
Partial discharge theory and technologies related to traditional testing methods of large rotating apparatus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paolitti, G.; Golubev, A.
Year: 1999
Zone branch reliability methodology for analyzing industrial power systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koval, D.O.
Year: 1999
Managing aviation safety through information technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Larsen, W.E.; Cooksy, K.D.; Zuk, J.
Year: 1999
Vector modeling and control of unbalanced electrical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jacobina, C.B.; Correa, M.B.R.; Oliveira, T.M.; Lima, A.M.N.; da Silva, E.R.C.
Year: 1999
Experimental verification of a hybrid fuzzy controller for a high performance brushless DC drive system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rubaai, A.; Ricketts, D.; Kankam, M.D.
Year: 1999
Unclamped inductive switching dynamics in lateral and vertical power DMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chinnaswamy, K.; Khandelwal, P.; Trivedi, M.; Shenai, K.
Year: 1999
Input and reverse transfer capacitance measurement of MOS-gated power transistors under high current flow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Deml
Year: 1999
Diesel engine exhaust cleanup with a pulsed streamer corona reactor equipped with reticulated vitreous carbon electrodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Locke, B.R.; Ichihashi, A.; Kim, H.H.; Mizuno, A.
Year: 1999
Micro-reactors based on water-in-oil emulsion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katsura, S.; Yamaguchi, A.; Harada, N.; Hirano, K.; Mizuno, A.
Year: 1999
Development of high collection efficiency ESP by barrier discharge system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawada, Y.; Kubo, T.; Ehara, Y.; Ito, T.; Zukeran, A.; Takahashi, T.; Kawakami, H.; Takamatsu, T.
Year: 1999
Removal of C/sub 2/F/sub 6/ from semiconductor process flue gases by ferro-electric packed-bed barrier discharge reactor-adsorbent hybrid systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Urashima, K.; Kostov, K.G.; Chang, J.S.; Okayasu, Y.; Iwaizumi, T.; Yoshimura, K.; Kato, T.
Year: 1999
Three-level inverter-fed synchronous motor drive system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amin, A.M.A.
Year: 1999
Low cost brushless generators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McGrow, L.; Pollock, C.
Year: 1999
Comparison of field-oriented control and direct torque control for induction motor drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoang Le-Huy
Year: 1999
Blast furnace burden detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gerber, H.; Chaubal, P.
Year: 1999
Radiation efficiency of Ar torch short plasma as function of length near 100 A
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iwao, T.; Hayashi, T.; Hirano, T.; Endo, M.; Inaba, T.
Year: 1999
Sensitivity analysis of an LQ optimal multivariable controller for a fine coal injection vessel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birk, W.; Medvedev, A.
Year: 1999
Detection of incipient clogging in pulverized coal injection lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johansson, A.; Medvedev, A.
Year: 1999
The effect of quantization and sampling time on transformers thermal performance and parameters calculation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tylavsky, D.J.; He, Q.; Si, J.; McCulla, G.A.; Hunt, J.R.
Year: 1999
Prediction of magnetic fields in multiconductor systems with significant harmonic currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carrescia, M.; Profumo, F.; Tartaglia, M.
Year: 1999
Parallel modeling of the IGBT electrothermal behavior
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benhissen, N.-E.; Skorek, A.; Lakhsasi, A.
Year: 1999
Thermal design and measurements of IGBT power modules: transient and steady state
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun He; Mehrotra, V.; Shaw, M.C.
Year: 1999
Localisation of electrical-insulation- and partial-discharge failures of IGBT modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitic, G.; Lefranc, G.
Year: 1999
Semiconductor and spending outlook: slow recovery underway and fundamental changes underfoot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fuhs, C.J.
Year: 1999
Yield methodology-three phases approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pouedras, T.; Mira Ben-Tzur
Year: 1999
A new systematic yield ramp methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nemoto, K.; Walanabe, K.; Ono, M.; Ikedaa, Y.; Saiki, K.
Year: 1999
All electronic defect inspection, management, and reporting system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:White, T.R.; Brenizer, J.; Dao, P.; Lin, J.; Sheth, V.; Miscione, M.; Anthony, B.; Kolar, D.; Apblett, C.; Bernstein, K.; Chase, A.; Union, L.
Year: 1999
Cycle time and bottleneck analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laure, W.
Year: 1999
Throughput monitoring to track and improve semiconductor lithography equipment performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Magoon, H.H.; Mitchell, P.H.
Year: 1999
Technological breakthrough in pad life improvement and its impact on CMP CoC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huey, S.; Mear, S.T.; Yuchun Wang; Jin, R.R.; Ceresi, J.; Freeman, P.; Johnson, D.; Vo, T.; Eppert, S.
Year: 1999
TAT- and cost-reduction strategies in LSI manufacturing test process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujioka, H.; Nakamae, K.; Chikamura, A.; Kitamura, M.
Year: 1999
An effective method to estimate defect limited yield impact on memory devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ott, R.; Ollendorf, H.; Lammering, H.; Hladschik, T.; Haensch, W.
Year: 1999
A mathematical model for defect impact based on in-line vs test data correlations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fernandez, A.; Lorenzo, A.; Cruceta, S.; Oter, D.; James, D.A.
Year: 1999
A methodology for determining capacity consumption due to the sampling of lots within the photolithography metrology sector in a multi-part number, multi-technology fabricator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Butler, K.L.; Woods, R.
Year: 1999
Techniques for analyzing cycle time variability in fab and probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sattler, L.; O'Connor, S.; Hallinan, M.; Finucane, T.
Year: 1999
Composition and thermal stability of chemically formed SiO/sub 2/ oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bernhardt, G.; Frankel, D.; Lad, R.J.; Nason, K.; Carbone, T.A.
Year: 1999
Critical dimension sample planning for sub-0.25 micron processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elliott, R.C.; Nurani, R.K.; Gudmundsson, D.; Preil, M.; Nasongkhla, R.; Shanthikumar, J.G.
Year: 1999
Ensemble average laser light scattering (EALLS)-an effective alternative to particle counting for monitoring turbidity in ultrapure water [for semiconductor rinsing]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Banerjee, A.; Lambertson, M.; Scarpine, D.
Year: 1999
In situ dielectric etch process technology for advanced leading edge production worthy etch applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian Ding; Arleo, P.; Hasselbach, J.
Year: 1999
Predicting failing bitmap signatures for memory arrays with critical area analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Segal, J.D.; Ho, T.; Hodgkins, B.; Misic, P.; Lin, J.; Yegnashankaran, M.
Year: 1999
Tool capacity improvement through specialization of operator activities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Foster, J.; Hennessy, J.
Year: 1999
Yield enhancement: reduction in defect density with improvement in the photolithography process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Livsey, S.C.; Grebs, T.; Hoffman, C.R.
Year: 1999
The effect of performance standards in a high volume wafer fab
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ingersoll, T.; Gentleman-Ingersoll, J.; Uszler, P.
Year: 1999
SEMATECH and equipment suppliers partner to reduce development costs at the 180 nm generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beach, J.V.; McDonald, C.J.
Year: 1999
The Virtual Fab the core of future technology development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Torres, K.; Smith, E.; McDonald, C.; Rinn Cleavelin, C.
Year: 1999
WSi/sub x//poly-Si gate stack etching for advanced dRAM applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leverd, F.; Loisil, L.; Lill, T.; Trevor, J.; Van Holt, P.; Van Autryve, L.; Varga, T.; Chinn, J.
Year: 1999
Contact and non contact post-CMP cleaning of thermal oxide silicon wafers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moumen, N.; Guarrera, M.; Piboontum, C.; Busnaina, A.A.
Year: 1999
Cost effective reticle quality management strategies in wafer fabs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomlinson, W.; Samek, V.; Shiffler, B.; Gudmundsson, D.; Merritt, J.; Nurani, R.K.; Shanthikumar, J.G.
Year: 1999
Advanced interconnect process development utilizing wafer inspection with "on-the-fly" automatic defect classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Skumanich, A.; Boyle, J.; Brown, D.
Year: 1999
Use of multiple lithography monitors in a defect control strategy for high volume manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bond, L.; Sutton, D.; Turnquest, K.
Year: 1999
Applications of automatic defect classification in photolithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stinson, G.; Magluyan, B.
Year: 1999
Advanced process development and control based on a fully automated SEM with ADC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ben-Porath, A.; Hayes, T.; Skumanich, A.
Year: 1999
Evaluation of a fast defect detection tool to disposition product wafers with large defects in printed photoresist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grindle, S.; Bilodeau, M.; Otis, M.; Barnum, J.; Tamayo, N.; Bhattacharyya, K.
Year: 1999
Development of copper etch technology for advanced copper interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koch, P.; Yan Ye; Ma, D.; Zhao, A.; Hsieh, P.; Chun Mu; Jenn Chow; Sherman, S.
Year: 1999
An effective end point detector on oxide CMP by motor current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bih-Tiao Lin; Lee, S.-N.
Year: 1999
Yield focused defect reduction methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Retersdorf, M.
Year: 1999
Application of a new laser scanning pattern wafer inspection tool to leading edge memory and logic applications at Infineon Technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reuter, T.; Bohmler, U.; Steck, S.; McLaren, M.; Siqun Xiao; Howland Pinto, R.
Year: 1999
Minimizing in-line calculated yield errors by optimizing and maintaining ADC classifier performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blais, J.; Pilon, T.; Robitaille, C.; Bartholomew, K.; Fischer, V.
Year: 1999
Application of ADC techniques to characterize yield-limiting defects identified with the overlay of E-test/inspection data on short loop process testers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henry, T.; Patterson, O.; Brown, G.
Year: 1999
Two methods for improved accuracy calibration and control of ion implanter incidence angle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elzer, R.D.; Oakey, P.; Chen, J.; Sing, D.
Year: 1999
Correlation of ellipsometric volume fraction to polysilicon grain size from transmission electron microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carbone, T.A.; Plourde, P.; Karagiannis, E.
Year: 1999
Partial coherence optimization for printing chain contacts using an attenuated phase-shifting mask
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toth, T.; Viens, P.; Coker, E.; Winslow, A.; Colelli, J.
Year: 1999
Comparison of mask writing tools and mask simulations for 0.16 /spl mu/m devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balasinski, A.; Coburn, D.
Year: 1999
Photolithography yield enhancement due to reduced consumption of the usable depth of focus resulting from advanced wafer back surface clean processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lysaght, P.S.; Ybarra, I.; Doros, T.; Beach, J.; Mello, J.; Gupta, G.; West, M.; DeBear, D.
Year: 1999
Dual frequency silicon nitride film of low thermal budget for pre-metal dielectric applications in sub-0.25 /spl mu/m devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuxiang Wang; Lee, J.H.; Thakur, B.; Huang, J.
Year: 1999
Thickness and composition measurement for thin film with combined X-ray technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Terada, S.; Murakami, H.; Nishihagi, K.; Noshiro, H.; Horii, Y.
Year: 1999
Challenging the paradigm of monitor reduction to achieve lower product costs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Williams, R.; Gudmundsson, D.; Nurani, R.; Stoller, M.; Chatterjee, A.; Seshadri, S.; Shanthikumar, J.G.
Year: 1999
Integrated statistical process control as a productivity improvement tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bowen, C.L.
Year: 1999
Characterization of copper CVD process by a process monitor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, K.C.; Marcadal, C.; Ganguli, S.; Bo Zheng; Schmitt, J.; Ling Chen
Year: 1999
CMOS technology: Present and future
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Davari
Year: 1999
A 1 V, 10.4 mW low power DSP core for mobile wireless use
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Shiota; I. Fukushi; R. Ohe; W. Shibamoto; M. Hamaminato; R. Sasagawa; A. Tsuchiya; T. Ishihara; S. Kawashima
Year: 1999
A 250 MHz CMOS floating-point divider with operand pre-scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Inui; T. Uesugi; H. Saito; Y. Hagihara; A. Yoshikawa; M. Nishida; M. Yamashina
Year: 1999
A 50 Gb/s 32/spl times/32 CMOS crossbar chip using asymmetric serial links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kun-Yung Ken Chang; Shang-Tse Chuang; N. McKeown; M. Horowitz
Year: 1999
A low-power multi-gigabit CMOS/SIMOX LSI design using two power supply voltages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Ohtomo; H. Sawada; T. Ohno; Y. Sakakibara; Y. Sato; T. Ishihara; S. Matsuoka; M. Shimaya
Year: 1999
A sampling weak-program method to tighten Vth-distribution of 0.5 V for low-voltage flash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Shiga; T. Tanzawa; A. Umezawa; T. Taura; T. Miyaba; M. Saito; S. Kitamura; S. Mori; S. Atsumi
Year: 1999
A source-line programming scheme for low voltage operation NAND flash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Takeuchi; S. Satoh; K. Imamiya; Y. Sugiura; H. Nakamura; T. Himeno; T. Ikehashi; K. Kanda; K. Hosono; K. Sakui
Year: 1999
An integratable 1-2.5 Gbps low jitter CMOS transceiver with built in self test capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ah-Lyan Yee; R. Gu; Heng-Chih-Lin; A. Tsong; R. Prentice; J. Tran; R. Venett; S. Spencer; V. Pathak; E. Suder; M. Izzard
Year: 1999
1.5 V 10-12.5 GHz integrated CMOS oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ting-Ping Liu
Year: 1999
An 8 b 500 MS/s full Nyquist cascade A/D converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Irie; N. Kusayanagi; T. Kawachi; T. Nishibu; Y. Matsumori
Year: 1999
A delta-sigma true RMS-to-DC converter using an indirect-charge-transfer filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Shinn Wey; Yu-Chung Huang
Year: 1999
High-speed cascode sensing scheme for 1.0 V contact-programming mask ROM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sasagawa; I. Fukushi; M. Hamaminato; S. Kawashima
Year: 1999
A robust 8F/sup 2/ ferroelectric RAM cell with depletion device (DeFeRAM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Braun; H. Hoenigschmid; T. Schlager; W. Weber
Year: 1999
A pseudo multi-bank DRAM with categorized access sequence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Shiratake; K. Tsuchida; H. Toda; H. Kuyama; M. Wada; F. Kouno; T. Inaba; H. Akita; K. Isobe
Year: 1999
A DRAM system for consistently reducing CPU wait cycles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Kanno; H. Mizuno; T. Watanabe
Year: 1999
100.000 pixel 120 dB imager in TFA-technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Lule; H. Keller; M. Wagner; M. Bohm
Year: 1999
A high speed, 500 frames/s, 1024/spl times/1024 CMOS active pixel sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Krymski; D. Van Blerkom; N. Bock; B. Mansoorian; E.R. Fossum
Year: 1999
A CMOS imager with new focal-plane motion detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Okamoto; Y. Fujimoto; T. Nagata; M. Furumiya; K. Hatano; Y. Nakashiba; M. Yotsuyanagi
Year: 1999
A smart CMOS imager with pixel level PWM signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nagata; M. Homma; N. Takeda; T. Morie; A. Iwata
Year: 1999
Embedded DRAM for a reconfigurable array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Perissakis; Y. Joo; J. Ahn; A. Dellon; J. Wawraynek
Year: 1999
Dynamically shift-switched dataline redundancy suitable for DRAM macro with wide data bus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Namekawa; S. Miyano; R. Fukuda; R. Haga; O. Wada; H. Banba; S. Takeda; K. Suda; K. Mimoto; S. Yamaguchi; T. Ohkubo; H. Takato; K. Numata
Year: 1999
A high-resolution capacitive fingerprint sensing scheme with charge-transfer technique and automatic contrast emphasis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Morimura; S. Shigematsu; K. Machida
Year: 1999
CMOS fingerprint sensor with automatic local contrast adjustment and pixel-parallel encoding logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Jung; R. Thewes; T. Scheiter; K. Goser; W. Weber
Year: 1999
Future perspective and scaling down roadmap for RF CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Morifuji; H.S. Momose; T. Ohguro; T. Yoshitomi; H. Kimijima; F. Matsuoka; M. Kinugawa; Y. Katsumata; H. Iwai
Year: 1999
Micro IDDQ test using Lorentz force MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nose; T. Sakurai
Year: 1999
Adaptive processing of data structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ah Chung Tsoi; Hagenbuchner, M.
Year: 1999
ANN parallelization on a token-based simulated parallel system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cristea, A.I.; Okamoto, T.
Year: 1999
Credit assessment using constructive neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Costa de Sousa, H.; de Carvalho, A.
Year: 1999
RBF neural network for thrust and torque predictions in drilling operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karri, V.
Year: 1999
Formulation of an encryption algorithm on the basis of molecular genetics and image patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prashant, M.; Siddharth, R.; Kumar, R.
Year: 1999
Genetic algorithms in optical thin film optimisation design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, D.G.; Watson, A.C.
Year: 1999
A genetic approach to qualitative temporal reasoning with constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fin, A.
Year: 1999
Object oriented toolkit for multiobjective genetic optimisation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, R.; Kumar, N.V.; Nagrath, I.J.
Year: 1999
Evolutionary training of a neurofuzzy network for detection of P wave of the ECG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pilla, V., Jr.; Lopes, H.S.
Year: 1999
On generalisation of machine learning with neural-evolutionary computations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, R.
Year: 1999
Application of genetic and fuzzy modelling in time series analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, K.; Wu, B.
Year: 1999
Combining CBR and GA for designing FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Job, D.; Shankararaman, V.; Miller, J.
Year: 1999
Credit analysis using radial basis function networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Lacerda, E.; de Carvalho, A.
Year: 1999
Modelling an interactive ITS using a MAS approach: from design to pedagogical evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giraffa, L.M.M.; Mora, M.daC.; Viccari, R.M.
Year: 1999
An automated method for inspection of IC bonds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, H.K.; Yoo, S.I.
Year: 1999
A content-based video query agent using feature-based image search engine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fushikida, K.; Hiwatari, Y.; Waki, H.
Year: 1999
A two-stage approach to 3D scene structural analysis from a single two-dimensional image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, Y.; Rodrigues, M.A.
Year: 1999
Vision system with depth obtaining capabilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heras, M.L.; Amat, J.
Year: 1999
Horizontal cooperation under uncertainties in distributed expert systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chengqi Zhang; Yuefeng Li
Year: 1999
Content based image retrieval using mobile agents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arora, C.; Nirankari, P.; Ghosh, H.; Chaudhury, S.
Year: 1999
An index structure for content-based retrieval from a video database
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiwatari, Y.; Fushikida, K.; Waki, H.
Year: 1999
An intelligent on-line system for content based image retrieval
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Verma, B.; Sharma, P.; Kulkarni, S.; Selvaraj, H.
Year: 1999
Use of transforms for indexing in audio databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subramanya, S.R.; Youssef, A.; Narahari, B.; Simha, R.
Year: 1999
Visual image retrieval on compressed domain with Q-distance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu, H.H.
Year: 1999
Human shape recognition from snakes using neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tabb, K.; George, S.; Adams, R.; Davey, N.
Year: 1999
Regular feature extraction for recognition of Braille
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ng, C.M.; Ng, V.; Lau, Y.
Year: 1999
End-to-end simulation of VBR traffic over ATM networks using CIPP network traffic model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manivasakan, R.; Desai, U.B.; Karandikar, A.
Year: 1999
QoS tradeoffs using an application-oriented transport protocol (AOTP) for multimedia applications over IP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei, S.; Tsaoussidis, V.; Venkatakrishnan, V.N.
Year: 1999
A guidance metric for developing hypermedia educational designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ng, V.; Chan, S.; Lee, J.
Year: 1999
HTML and multimedia Web GIS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soomro, T.R.; Zheng, K.; Pan, Y.
Year: 1999
A pruning based fast rate control algorithm for MPEG coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Venkatesh, T.G.; Srinivasan, S.
Year: 1999
A simulated annealing approach for the capacitated minimum spanning tree problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Torres-Jimenez, J.; Pinto-Elias, R.; Garcia-Romero, A.
Year: 1999
Supporting cooperative work with Viceroy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xuanming Dong; Subramanian, K.R.
Year: 1999
Enhancing the beauty of fractals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar Bisoi, A.; Mishra, J.
Year: 1999
A new supervised training algorithm for generalised learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhaumik, A.; Banerjee, S.; Sil, J.
Year: 1999
On the filtering of imperfect multimedia information by means of representation-based queries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bosc, P.; Duval, L.; Pivert, O.
Year: 1999
Problems of physiognomic identification with video cameras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palafox, J.L.
Year: 1999
Design and implementation of a nonthreatening barrier for deployment in special usage holding areas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buckley, N.
Year: 1999
Automatic CCTV surveillance-towards the VIRTUAL GUARD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thiel, G.
Year: 1999
Multisensorial modular system of monitoring and tracking with information fusion techniques and neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Jesus, J.D.; Fuente, A.I.; Calvo, J.J.V.
Year: 1999
Automatic car plate detection and recognition through intelligent vision engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Salgado, L.; Menendez, J.M.; Rendon, E.; Garcia, N.
Year: 1999
The Vocal Passport, a technique to outline profiles of criminals from their voice recordings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Romero, C.D.
Year: 1999
Moderate computational load watermarking system for digital images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martinez, J.M.; Mora, M.L.
Year: 1999
Non destructive testing of fence mounted PIDS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wassell, I.J.
Year: 1999
Solid state simulation of movements for the test of volumetric intrusion detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Williams, I.; Berentsen, M.; Rexfort, C.
Year: 1999
Analyses of performance of volumetric intrusion detection technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lester, A.J.; Smith, C.L.
Year: 1999
User performance testing of the Perimitrax buried cable sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maki, M.; Hill, C.; Malone, C.R.
Year: 1999
Airport vulnerability assessment-a methodology evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lazarick, R.
Year: 1999
Face identification by means of a neural net classifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Espinosa-Duro, V.; Faundez-Zanuy, M.
Year: 1999
Fully integrated digital imaging in an access control and security system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oram, C.; Collins, F.; Body, N.
Year: 1999
Motorway surveillance through stereo computer vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manendez, J.M.; Salgado, L.; Rendon, E.; Garcia, N.
Year: 1999
Identification of individuals using fingerprints by linguistic descriptions fuzzy comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martinez, A.L.P.
Year: 1999
Evaluation of JTC method robustness in security applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Klima, M.
Year: 1999
Biometrics verification in a real environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruiz-Mezcua, B.; Garcia-Plaza, D.; Fernandez, C.; Domingo-Garcia, P.; Fernandez, F.
Year: 1999
A dual speech/speaker recognition using GMM in speaker identification and a HMM in keyword speech recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruiz, B.; Domingo, P.; Hernandez, L.
Year: 1999
Digital image recording for court-related purposes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rieger, B.; Rode, H.
Year: 1999
Security interface between Metrica and Magerit: development of secure information systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sierra, J.M.; Ribagorda, A.; Munoz, A.
Year: 1999
Non-noticeable information embedding in color images: marking and detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vidal, J.; Sayrol, E.; Cabanillas, S.; Santamaria, S.
Year: 1999
Speech variability in automatic speaker recognition systems for forensic purposes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ortega-Garcia, J.; Cruz-Llanas, S.; Gonzalez-Rodriguez, J.
Year: 1999
A novel algorithm for number factorization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alvarez-Cubero, J.A.; Zufiria, P.J.
Year: 1999
High discrimination of nuisance alarms in a low cost movement videosensing system for remote surveillance of unattended sites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Munoz-Grandes, A.; Ciria, R.; Godoy, J.L.; Rodrigo, J.; Cifuentes, P.
Year: 1999
Main security system of the first highway tunnel on Slovakia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Volner, R.; Ticha, D.
Year: 1999
On the development of a digital video motion detection test set SAND99-0410C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pritchard, D.A.; Vigil, J.T.
Year: 1999
Security communication in headrace tunnel using beam transmission of laser lights
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiba, J.; Sato, T.; Sasaki, N.; Matsuda, K.
Year: 1999
Gryffin TALOS taut wire perimeter detection system real world experiences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hellard, G.
Year: 1999
Advanced method for improvement of obscure video image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamada, Y.
Year: 1999
Detecting security vulnerabilities in remote TCP/IP networks: an approach using security scanners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lerida, J.L.; Grackzy, S.M.; Vina, A.; Andujar, J.M.
Year: 1999
On the use of outer ear images for personal identification in security applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moreno, B.; Sanchez, A.; Velez, J.F.
Year: 1999
An on-line signature verification system using multi-template matching approaches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Chuan Han; Pao-Chung Chang; Chao-Chih Hsu; Bor-Shenn Jeng
Year: 1999
Signature classification by hidden Markov model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Camino, J.L.; Travieso, C.M.; Morales, C.R.; Ferrer, M.A.
Year: 1999
Access control system with hand geometry verification and smart cards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanchez-Reillo, R.; Gonzalez-Marcos, A.
Year: 1999
Advanced compact model for the charges and capacitances of short-channel MOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:da Costa Gouveia-Filho, O.; Schneider, M.C.; Galup-Montoro, C.
Year: 1999
Interface design and refinement using state-based techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Klapuri, H.; Takala, J.; Saarinen, J.
Year: 1999
MCA: a single chip one-port scalable ATM layer controller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Lima, J.A.G.; Melchier, E.U.K.; Cavalcanti, A.C.
Year: 1999
Fault detection in systems with 2nd order dynamics using transient analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Calvano, J.V.; Alves, V.C.; Lubaszewski, M.
Year: 1999
A low sensitivity switched-capacitor filter design with testability features
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Canive, J.M.; Gomes, J.G.R.C.; Petraglia, A.
Year: 1999
Reusing hardware components with single-state processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Melo, A.C.V.
Year: 1999
Test escapes: analysis of short defect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renovell, M.; Azdis, F.; Bertrand, Y.
Year: 1999
Effects of radiation on digital architectures: one year results from a satellite experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Velazco; P. Cheynet; R. Ecoffet
Year: 1999
On-line test of a switching circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bastos, J.A.; Kussler, J.A.; Cassol, L.J.; Lubaszewski, M.S.
Year: 1999
A tool for analysis of universal logic gates functionality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Lima, F.G.; Johann, M.de.O.; Guntzel, J.L.; Carro, L.; Reis, R.
Year: 1999
Solving satisfiability in combinational circuits with backtrack search and recursive learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marques-Silva, J.P.; Guerra e Silva, L.
Year: 1999
Comparison between quasi-uniform linear cellular automata and linear feedback shift registers as test pattern generators for built-in self-test applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cardoso, P.S.; Strum, M.; Amazonas, J.R.de.A.; Wang Jiang Chau
Year: 1999
Implementing a self-testing 8051 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cota, E.F.; Krug, M.R.; Lubaszewski, M.; Carro, L.; Susin, A.A.
Year: 1999
Design for testability reuse in synthesis for testability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bukovjan, P.; Marzouki, M.; Maroufi, W.
Year: 1999
Real-time, 3D estimation of human body postures from trinocular images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iwasawa, S.; Ohya, J.; Takahashi, K.; Sakaguchi, T.; Kawato, S.; Ebihara, K.; Morishima, S.
Year: 1999
Tracking hybrid 2D-3D human models from multiple views
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eng-Jon Ong; Shaogang Gong
Year: 1999
An improved algorithm for reconstruction of the surface of the human body from 3D scanner data using local B-spline patches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Douros, I.; Dekker, L.; Buxton, B.F.
Year: 1999
Towards model-based capture of a persons shape, appearance and motion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hilton, A.
Year: 1999
Automated body modeling from video sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Plankers, R.; Fua, P.; D'Apuzzo, N.
Year: 1999
Real time tracking and modeling of faces: an EKF-based analysis by synthesis approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strom, J.; Jebara, T.; Basu, S.; Pentland, A.
Year: 1999
Modeling people's focus of attention
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stiefelhagen, R.; Jie Yang; Waibel, A.
Year: 1999
Stochastic temporal models of human activities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walter, M.; Shaogang Gong; Psarrou, A.
Year: 1999
Shift of paradigms in microelectronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wieder, A.W.
Year: 1999
Antenna ratio definition for VLSI circuits [plasma etch damage]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simon, P.; Luchies, J.-M.; Maly, W.
Year: 1999
Effect of plasma density and uniformity, electron temperature, process gas, and chamber on electron shading damage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siu, S.; Patrick, R.; Vahedi, V.; Alba, S.; Valentini, G.; Colombo, P.
Year: 1999
Evaluation and reduction of electron shading damage in high temperature etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nojiri, K.; Kato, K.; Kawakami, H.
Year: 1999
The sensitivity of electron shading damage to electron temperature, electron density and the plasma-to-wafer electron energy threshold
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamartino, J.M.; Loewenhardt, P.K.; Kenlin Huang; Hui Chen; Paterson, A.M.; Yan Ye; Helmsen, J.J.
Year: 1999
Compounding effects of UV exposure, ion bombardment, electron shading and plasma charging in a high density plasma poly etcher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shyue-Shyh Lin; Bing-Yue Tsui; Chia-Shone Tsai; Hsia, C.C.
Year: 1999
Plasma induced damage from HDP process on the ultra-thin gate oxide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shoumian Chen; Sudijono, J.; Perera, C.; Yin Jin; Susilo, F.; Xu Zeng; Kumar, A.V.; Jianqing Wen
Year: 1999
A study of effects of plasma-induced charging damage on hot-carrier lifetime using pre-stressed data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhuva, B.; Mongkolkachit, P.; Bui, N.; Kerns, S.
Year: 1999
Plasma damage evaluation using matched transistors and determination of damage prevention options
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ellis, J.; Comeau, A.R.; Porter, R.; Bossingham, J.; Alestig, G.
Year: 1999
Plasma damage during dielectric etch in high density plasma etcher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bing-Yue Tsui; Shyue-Shyh Lin; Chia-Shone Tsai; Hsia, C.C.
Year: 1999
The prevention of charge damage on thin gate oxide from high density plasma deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shih, H.H.; Tsai, C.Y.; Yang, G.S.; Chen, K.C.; Yew, T.R.; Lur, W.; Liou, F.T.
Year: 1999
Comparison of CHARM-2 and surface potential measurement to monitor plasma induced gate oxide damage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming-Yi Lee; Hu, J.; Catabay, W.; Schoenborn, P.; Burkus, A.
Year: 1999
A method for reducing notching and electron shading damage in a continuous wave ECR metal etcher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tabara, S.
Year: 1999
Evaluation of charging damage in a plasma doping system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goeckner, M.J.; Felch, S.B.; Fang, Z.; Weeman, J.
Year: 1999
Process-induced damage by a low energy neutral beam source [etching/cleaning]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xianmin Tang; Qi Wang; Manos, D.M.
Year: 1999
Plasma damage characterization of the Lam TCP/sup TM/ 9600PTX high-density, inductively coupled metal etcher and microwave asher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Patrick, R.; Siu, S.; Baldwin, S.; Werking, J.
Year: 1999
Characterization of ion implanter electron flood guns using charge pumping and threshold voltage measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sawyer, W.D.; Mason, P.W.; Santiesteban, R.S.; Persson, E.J.
Year: 1999
Detection of magnetically induced plasma charging from passivation level processing using corona-oxide-semiconductor techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lobbins, J.M.; Nelson, L.M.
Year: 1999
Ultra-thin oxynitride gate dielectrics for 0.18 /spl mu/m CMOS and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takayanagi, M.; Toyoshima, Y.
Year: 1999
Relationship between plasma damage, SILC and gate-oxide reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheung, K.P.; Lu, Q.; Ciampa, N.A.; Liu, C.T.; Chang, C.-P.; Colonell, J.I.; Lai, W.-Y.-C.; Liu, R.; Miner, J.F.; Vaidya, H.; Pai, C.-S.; Clemens, J.T.
Year: 1999
Plasma-induced charging damage in ultrathin (3 nm) nitrided oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, C.-C.; Lin, H.-C.; Chang, C.-Y.; Liang, M.-S.; Chien, C.-H.; Hsien, S.-K.; Huang, T.-Y.
Year: 1999
Plasma diagnosis and charging damage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malyshev, M.V.; Donnelly, V.M.; Colonell, J.I.; Samukawa, S.
Year: 1999
Suppression of topography dependent charging using a phase-controlled pulsed inductively coupled plasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyoung-Sub Shin; Wan-Jae Park; Ji-Soo Kim; Chang-Jin Kang; Tae-Hyuk Ahn; Joo-Tae Moon; Moon-Yong Lee
Year: 1999
Reduction of charging damage of gate oxide by time modulation bias method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ono, T.; Oomoto, Y.; Mizutani, T.; Yoshioka, K.; Ogawa, Y.; Kofuji, N.; Izawa, M.; Goto, Y.; Kure, T.
Year: 1999
Charging protection and degradation by antenna environment on NMOS and PMOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carrere, J.-P.; Heslinga, D.R.
Year: 1999
Effect of low temperature deuterium annealing on plasma process induced damage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, S.H.; Kim, Y.K.; Lee, Y.H.; Kang, H.S.; Ahn, C.G.; Kang, B.K.; Jinju Lee; Kangguo Cheng; Zhi Chen; Hess, K.; Lyding, J.W.
Year: 1999
Plasma vacuum ultraviolet emission in a high density etcher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cismaru, C.; Shohet, J.L.; McVittie, J.P.
Year: 1999
Device effects and charging damage: correlations between SPIDER-MEM and CHARM/sup R/-2
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lukaszek, W.; Rendon, M.J.; Dyer, D.E.
Year: 1999
Dependence of plasma damage on density and T/sub e/ in a decoupled plasma source metal etcher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Downey, S.W.; Malyshev, M.V.; Donnelly, V.M.; Colonell, J.I.; Layadi, N.; Yamartino, J.; Paterson, A.; Chen, H.; Loewenhardt, P.; Bohman, D.; Singh, N.
Year: 1999
Fast hot-carrier aging method of charging damage measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheung, K.P.; Lloyd, E.J.
Year: 1999
Elephant: the file system that never forgets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Santry, D.J.; Feeley, M.J.; Hutchinson, N.C.; Veitch, A.C.
Year: 1999
Caching documents with active properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Lara, E.; Petersen, K.; Terry, D.B.; LaMarca, A.; Thornton, J.; Salisbury, M.; Dourish, P.; Edwards, K.; Lamping, J.
Year: 1999
An end-system architecture for unified congestion management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rahul, H.S.; Balakrishnan, H.; Seshan, S.
Year: 1999
Brittle metrics in operating systems research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mogul, J.C.
Year: 1999
The problems you're having may not be the problems you think you're having: results from a latency study of Windows NT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jones, M.B.; Regehr, J.
Year: 1999
The case for application-specific benchmarking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seltzer, M.; Krinsky, D.; Smith, K.; Xiaolan Zhang
Year: 1999
Soft real time scheduling for general purpose client-server systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ingram, D.
Year: 1999
Xenoservers: accountable execution of untrusted programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reed, D.; Pratt, I.; Menage, P.; Early, S.; Stratford, N.
Year: 1999
An economic approach to adaptive resource management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stratford, N.; Mortier, R.
Year: 1999
The case for higher-level power management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ellis, C.S.
Year: 1999
Command management system for next-generation user input
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, M.; Reiher, P.; Popek, G.J.
Year: 1999
The Systems Engineering Process Activities (SEPA) - supporting early requirements analysis and integration prior to implementation design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barber, K.S.; Graser, T.J.; Jernigan, S.R.; Silva, J.
Year: 1999
On the effectiveness of the optimally refined proportional sampling testing strategy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chan, F.T.; Mak, I.K.; Chen, T.Y.; Shen, S.M.
Year: 1999
The Web generation of software inspection: a process with virtual meetings and on-line recording
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tervonen, I.; Harjumaa, L.; Iisakka, J.
Year: 1999
Software quality and CASE tools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Low, G.; Leenanuraksa, V.
Year: 1999
An experience: a small software company attempting to improve its process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Otoya, S.; Cerpa, N.
Year: 1999
Specification of service level agreements, clarifying concepts on the basis of practical research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bouman, J.; Trienekens, J.; van der Zwan, M.
Year: 1999
Using qualitative research techniques to learn the cultural language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carliner, S.
Year: 1999
Lights, sirens, and computers: how pen-based computing is changing the way emergency care is conducted and communicated
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Munger, R.
Year: 1999
Gender and software: rhetoric and the computer culture exemplified by "Barbie Fashion Designer"
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamilton, M.; Hokanson, B.
Year: 1999
Using the Internet for audience and customer research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watt, J.H.; Lynch, M.
Year: 1999
Producing multilingual online documentation using contract developers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clark, E.
Year: 1999
Ancient voices and cyberspace: exploring the past to reshape the future
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Search, P.
Year: 1999
Digital image resolution: what it means and how it can work for you
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lemieux, A.; Knoll, E.
Year: 1999
The impact of Web-based training systems for distance education: a corporate perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lau, T.T.
Year: 1999
"Real world" assignments in the professional writing classroom: forging an alliance with public schools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitchell, K.L.
Year: 1999
Designing Web sites for the intranet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rubens, B.
Year: 1999
Introduction to Usitbility Testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bystrom, K.
Year: 1999
Considering accessibility for visually impaired users [Web site design]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moehling, J.L.; Smith, R.L.; Stewart, M.D.; Swenson, J.A.
Year: 1999
Designing Web-based access for multiple and international audiences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rubens, P.; Southard, S.G.
Year: 1999
Making a successful transition to the online classroom: a faculty perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gibson, J.W.; Blackwell, C.W.
Year: 1999
Developing single source documentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kostur, P.
Year: 1999
Algorithm and architecture of a 1 V low power hearing instrument DSP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moller, F.; Bisgaard, N.; Melanson, J.
Year: 1999
Variable supply-voltage scheme with 95%-efficiency DC-DC converter for MPEG-4 codec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Ichiba; K. Suzuki; S. Mita; T. Kuroda; T. Furuyama
Year: 1999
Power macro-models for DSP blocks with application to high-level synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Gupta; F.N. Najm
Year: 1999
Energy-per-cycle estimation at RTL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Gupta; F.N. Najm
Year: 1999
VIP-an input pattern generator for identifying critical voltage drop for deep sub-micron designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yin-Min Jiang; T.K. Young; Kwang-Ting Cheng
Year: 1999
A physical alpha-power law MOSFET model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bowman, K.A.; Austin, B.L.; Eble, J.C.; Tang, X.; Meindl, J.D.
Year: 1999
Impact of using adaptive body bias to compensate die-to-die Vt variation on within-die Vt variation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Narendra, S.; Antoniadis, D.; De, V.
Year: 1999
Differential PLL for wireless applications using differential CMOS LC-VCO and differential charge pump
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. ElSayed; A. Ali; M.I. Elmasry
Year: 1999
An architectural solution for the inductive noise problem due to clock-gating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.D. Pant; P. Pant; D.S. Wills; V. Tiwari
Year: 1999
A methodology for power efficient partitioning of data-dominated algorithm specifications within performance constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Masselos; K. Danckaert; F. Catthoor; C.E. Goutis; H. DeMan
Year: 1999
System-level power optimization: techniques and tools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benini, L.; de Micheli, G.
Year: 1999
Analysis of radiation noise caused by power distribution on multilayer printed circuit board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hara, T.; Kasai, M.; Yokota, H.; Nakamura, A.
Year: 1999
Reduction of electromagnetic radiation from power and ground layers using capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iguchi, D.; Arakaki, H.; Ueno, O.
Year: 1999
A study evaluation method for line noise filters using common mode output impedance of electrical equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanda, M.; Oka, N.
Year: 1999
Effect of noise suppression by surge protective devices for impulsive noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanbayashi, T.; Tsuda, F.; Shinohara, S.; Sato, R.
Year: 1999
Calculation of surge attenuation in filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Worshevsky
Year: 1999
Two dimensional electromagnetic noise imaging system using planar shielded-loop coil array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, M.; Yabukami, S.; Yurugi, H.; Nakada, K.; Arai, K.I.; Itagaki, A.; Itagaki, K.; Saito, N.; Fuda, K.; Watanabe, M.; Takahashi, H.; Tamogami, T.; Sakurada, Y.
Year: 1999
Electromagnetic field characteristics of injection probes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Onomae, H.; Ito, H.; Ishida, T.; Eguchi, T.; Nagasawa, Y.
Year: 1999
Measurements of potential distributions near flat boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Murota, N.
Year: 1999
Measurement and calculation in the near field of dipole antenna using optical electric-field sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kimura, E.; Kukita, S.; Tokuda, M.
Year: 1999
Three directional Helmholtz coils for a low frequency-magnetic-field immunity test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Murano, K.; Shiokawa, A.; Kami, Y.
Year: 1999
Immunity testing of computerized equipment to fast electrical transients using adaptive test methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wendsche, S.; Vick, R.; Habiger, E.
Year: 1999
Raising accuracy in finding method of radiated emission sources utilizing CISPR emission measurement system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Ishida; K. Murakawa; K. Yamashita; M. Tokuda
Year: 1999
A study on mechanism of radiated emissions from fiber optic module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aizawa, T.; Yamamoto, H.; Shinohara, S.; Sato, R.
Year: 1999
A method for finding the direction of arrival of a single short pulse by the waveform reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishii, M.; Iwasaki, T.; Amano, T.
Year: 1999
The research of a new type aperture-coupled microstrip antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Shiming; Liu Ruixiang; Xue Zhenghui
Year: 1999
Very fast time domain measurement of voltage rising part due to micro gap discharge in air
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawamata, K.; Minegishi, S.; Haga, A.; Sato, R.
Year: 1999
Measurement and analysis of aircraft ESD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Honda, M.
Year: 1999
Two-source model of transient electromagnetic fields generated by electrostatic discharge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishigami, S.; Iwasaki, T.
Year: 1999
Dependence of current and induced voltage due to spark discharge on gap length
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomita, H.
Year: 1999
Propagation characteristics of ESD-induced electromagnetic pulses measured using optical E-field sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tajima, K.; Masugi, M.; Kuwabara, N.
Year: 1999
On the estimation of ESD current waveshapes by radiated electromagnetic fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ki-Chai Kim; Kwang-Sik Lee; Dong-In Lee
Year: 1999
Analysis of induced current density in spherical conductive model exposed simultaneously to extremely low frequency electric and magnetic fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsumoto, T.; Hayashi, N.; Isaka, K.
Year: 1999
A method to evaluate electric fields induction of overhead lines and substation's equipment in humans
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ala, G.; Buccheri, P.; Inzerillo, M.
Year: 1999
Effect of membrane on current distribution in biological sphere tissue with a membrane placed in uniform and eddy current fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tarao, H.; Hayashi, N.; Isaka, K.
Year: 1999
Experimental analysis of the human perception threshold of an ELF electric field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimizu, H.O.; Shimizu, K.
Year: 1999
Simultaneous measurements of disturbance APD, CRD and PDD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uchino, M.; Shinozuka, T.
Year: 1999
A method to obtain crossing rate distribution from equispace-sampled signal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohnuma, K.; Tomitsuka, S.; Uchino, M.; Shinozuka, T.
Year: 1999
1/f phase and correlation noises in transmission media and a frequency noise reduction method in an oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takagi, K.; Yamoto, T.
Year: 1999
Statistical analysis of radio frequency noise spectrum in Korea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joong Geun Rhee
Year: 1999
Radiated emission from a power plane of a multilayer printed circuit board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uchida, T.; Miyazaki, C.; Oka, N.
Year: 1999
Common mode current prediction from normal mode voltage of printed circuit board with limited width ground pattern
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, T.; Wada, O.; Koga, R.
Year: 1999
A FDTD method for fast simulation of decoupling capacitors on multilayer multichip modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huber, A.; Wendel, J.; Reiss, K.
Year: 1999
Experience of measuring normalized site attenuation at CMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Tron Shay; Ray-Rong Lao
Year: 1999
Site attenuation characteristics of anechoic chamber using foamed ferrite as new absorbing material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tokuda, M.; Simada, K.; Ishii, H.
Year: 1999
Evaluation of anechoic chamber characteristics using an optically driven imitated equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawashima, T.; Aquino, J.C.; Tokuda, M.
Year: 1999
Evaluation of 10 m semi-anechoic chamber characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osabe, K.; Komatsuzaki, T.
Year: 1999
On the unwanted effects on the radiated emissions and susceptibility measurements due to the introduction of a wooden table
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beggio, A.; Borio, G.; Zich, R.E.
Year: 1999
Anechoic chamber using foamed ferrite for immunity tests in the frequency range over 1 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayashi, T.; Inoue, S.; Shimada, K.; Tokuda, M.
Year: 1999
FDTD analysis on the effect of stirrers in a reverberation chamber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harima, K.; Yamanaka, Y.
Year: 1999
EMC chambers for radiated EMC testing up to 18 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trautnitz, F.W.; Pues, H.F.
Year: 1999
Calculation of service area for mobile communication system using optical rays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Itoh, Y.; Tajima, K.; Kuwabara, N.
Year: 1999
Analysis of electromagnetic wave scattering from building walls with periodic and random surface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoon, K.-Y.; Tateiba, M.; Uchida, K.
Year: 1999
Beam diffraction by rectangular cylinders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheung, H.D.; Jull, E.V.
Year: 1999
Analysis of plane wave scattering by a conducting elliptic cylinder near a ground plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masuda, T.; Miyazaki, Y.
Year: 1999
The ULF electromagnetic radiation excited by special typical minor clumped earthquakes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:ZhaoTong Wan; YuFang He; XunJie Zhang
Year: 1999
Open-circuit voltages due to lightning-generated time-dependent and elliptically polarized E-fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chai, J.C.; Britting, A.O., Jr.
Year: 1999
Improved frequency characteristics of large Rogowski coil using lightning surges observation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Kato; Tominaga, T.; Kuwabara, N.
Year: 1999
Interference on wide-band digital communication by disturbance in 2 GHz band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kowada, T.; Hayashi, Y.; Yamane, K.; Shinozuka, T.
Year: 1999
Frequency dependence of energy deposition in the multilayered spherical model of a human head near a half wavelength dipole
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kamimura, Y.; Murata, E.; Yamada, Y.
Year: 1999
A study on solid phantoms for estimation of interaction between human body and electromagnetic waves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ito, K.; Okano, Y.; Hase, A.; Asahina, T.; Yoshimura, H.
Year: 1999
An experimental study on the dependence of local SARs on a human ear during exposure to MW from a cellular telephone
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, S.; Wakayanagi, H.; Hamada, T.; Taki, M.; Yamanaka, Y.; Shirai, H.
Year: 1999
Dosimetric analysis of a small animal locally exposed to near fields by electrically short antennas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianqing Wang; Fujiwara, O.
Year: 1999
Calculation of the field distribution around the body exposed to the emissions from cellular phones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yinghong Wen; Chen Liu; Linchang Zhang
Year: 1999
Experiment and estimation by FDTD-method on the close field noise from a printed line model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kasuga, T.; Tanaka, M.; Inoue, H.
Year: 1999
Measurement of complex permittivity and permeability at millimeter wavelength using a free space method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iijima, Y.; Tanaka, T.; Kimura, M.; Sato, R.
Year: 1999
Microwave absorption properties of M-type hexagonal ferrite composite sheet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ota, H.; Kimura, M.; Sato, R.; Okayama, K.; Kondo, S.; Homma, M.
Year: 1999
Indoor propagation experiments in shielding TV studio at 2 GHz and analysis by geometrical optics method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Numata, S.; Sato, H.; Yamane, T.; Chiba, H.
Year: 1999
Analysis of voltage dips propagation in MV distribution networks by using ATP-EMTP code
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ala, G.; Barone Barone, A.; Cataliotti, V.; Inzerillo, M.
Year: 1999
Study on electromagnetic field in the end region of large generator by FEM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Shufang; Yao Ruoping; Gao Yougang
Year: 1999
Influence of the high voltage overhead cable on the bearing station with short wave and its testing of the shield distance and calculation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Ming-Sheng
Year: 1999
Electromagnetic interferences of electric medical equipment from hand-held radiocommunication equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Furahata, H.
Year: 1999
Radiation performance and evaluation of human exposure from mobile handsets using near-field measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuster, N.
Year: 1999
Radio wave absorptive building materials for depressing multipath indoors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oda, M.
Year: 1999
Development of wide band ferrite fin electromagnetic wave absorber for glass curtain wall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mizumoto, T.; Naito, Y.; Yamane, T.; Miyashita, M.
Year: 1999
A proposal of multi-functioned EM-wave absorbers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kotsuka, Y.; Komazawa, Y.
Year: 1999
Absorbing materials and damping of screened rooms for EMC testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Christopoulos, C.; Paul, J.; Thomas, D.W.P.
Year: 1999
Compensating method of CRT display jitter caused by an external magnetic field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miyajima, K.; Tomita, S.
Year: 1999
Electromagnetic characterization of protective clothing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pocai, M.R.; Bottari, E.
Year: 1999
Deterioration in shield characteristics by signal lines and power lines passing through shield material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miyazaki, C.; Oka, N.; Uchida, T.; Fukasawa, T.; Nitta, S.
Year: 1999
A new dual-coaxial-TEM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolfsperger, H.A.; Strehlow, H.; Schwab, A.J.
Year: 1999
Measurement and simulation of magnetic shielding with ferromagnetic material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lederer, B.; Kost, A.
Year: 1999
Improved sensitivity in grounding search system using TV signal for phase reference
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tominaga, T.; Kuramoto, S.; Kuwabara, N.
Year: 1999
Computation of shielding effectiveness of concentric spherical shields with plane wave illumination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishikata, A.; Yamane, T.; Shimizu, Y.
Year: 1999
Study of radiated emissions from PCB with narrow ground plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ooi, T.H.; Tan, S.Y.; Li, H.
Year: 1999
Experimental investigation of noise immunity diagnosis for printed circuit boards by bulk current injection test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sasabe, K.; Yoshida, K.; Bullivant, A.; Fujiwara, O.
Year: 1999
Electromagnetic radiation properties of a printed circuit board with a slot in the ground plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ko, Y.; Ito, K.; Kudo, J.; Sudo, T.
Year: 1999
S-parameter between two dipole antenna elements on a finite ground plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujii, K.; Iwasaki, T.
Year: 1999
Calibration of biconical antennas using the standard antenna method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, N.; Sugiura, A.; Yamanaka, Y.; Iwasaki, T.
Year: 1999
Improving calibration of broadband antenna factors in a GTEM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong, T.; Chien-Lung Chou; Kuo, A.
Year: 1999
Characteristic impedance variation of the TEM cell caused by the introduction of the equipment under test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lu Xinhua
Year: 1999
Influence of calibration and measurement techniques on the inhomogeneity of electromagnetic fields for immunity tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glimm, J.; Munter, K.; Spitzer, M.; Dotzer, Th.; Schrader, Th.
Year: 1999
Novel decoupling circuit comprising magnetic materials and built-in choking coils
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, S.; Tohya, H.
Year: 1999
Application of ferrite chip EMI suppressors to EMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, Y.; Bandoh, A.
Year: 1999
Transient-field characterization of reverse recovery behavior of diode with interconnection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Dongyan; Zhang Linchang; Zhou Kesheng
Year: 1999
An EMI test methodology for network devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, Y.C.; Chen, F.; Liau, P.Y.
Year: 1999
Determination of a relevant criterion to characterize differential conducted perturbations generated by low frequency converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guitton, F.; Magnon, D.
Year: 1999
Automated shielding effectiveness test system for shielded enclosures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ooi Tian Hock; Foo Chew Houw, B.
Year: 1999
Recent topics in activities of IEC and JIS in relation with EMC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masada, E.
Year: 1999
Recent movement in VCCI [Voluntary Laboratory Accreditation Center]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagasawa, H.; Sakurai, A.; Usuda, S.; Kojima, T.
Year: 1999
Technical analysis of ISO/DIS 17025-general requirements for the competence of testing and calibration laboratories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoolihan, D.D.
Year: 1999
Reconsideration of CISPR24 immunity test condition and performance criteria of TTE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katsuyama, Y.; Amemiya, F.; Yamaji, M.
Year: 1999
RF measurement method over 1 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohishi, R.
Year: 1999
Characteristics of noise on printed circuit board traces induced by noise transmitted on external cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saito, S.; Nitta, S.
Year: 1999
A transfer impedance measurement bench for high immunity [cables]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raimbourg, J.; Charmet, P.
Year: 1999
A study on suppression of induced voltage on printed wire by external electromagnetic field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamamoto, H.; Shinohara, S.; Sato, R.
Year: 1999
EMI problems for frequency hopping communication sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deb, G.K.
Year: 1999
Power line transients on a bus due to the operation of the electrical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joffe, E.B.
Year: 1999
An evaluation of bit errors due to the random fluctuation of atmosphere and ionosphere in satellite communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamada, K.; Fujisaki, K.; Tatejba, M.
Year: 1999
EMI noise analysis of plasma display panels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiraki, Y.; Tanabe, S.; Nagai, T.; Suzuki, Y.
Year: 1999
Logic and evaluation of assuring functional safety from electromagnetic noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sakai, M.; Shirai, T.; Futsuhara, K.
Year: 1999
Radio noise measurement near the vehicle traffics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hachiya, T.; Suzuki, T.; Echigo, H.; Sato, R.
Year: 1999
Undergraduate EMC education at Xidian University
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lu Hongmin; Zhu Manzuo
Year: 1999
Millimeter wave absorber using epoxy-modified urethane rubber mixed with carbon particles at 60 GHz frequency band
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soh, T.; Yoshioka, N.; Hashimoto, O.
Year: 1999
New ISNs for emission and immunity testing on unshielded telecommunication ports
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stecher, M.
Year: 1999
EMI suppression effects of a magnetic composite sheet with an internal conductive layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Awakura, Y.; Ono, H.; Yoshida, S.
Year: 1999
The use of scanning receivers in EMI compliance measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maroney, J.
Year: 1999
Development of statistical parameter measuring equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shinozuka, T.
Year: 1999
Micro and millimeter wave absorber using M-type hexagonal ferrite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ota, H.; Kimura, M.
Year: 1999
Development of common mode filter with a multilayer structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaizaki, Y.; Tsuda, F.; Shinohara, S.
Year: 1999
EMC solution supporting EMC test and consultant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagae, K.; Terai, K.
Year: 1999
New approach for EMC design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kato, K.
Year: 1999
Method of measuring conducted disturbance using both capacitive voltage probe and current probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiroshima, Y.; Miyashita, S.; Kuwabara, N.
Year: 1999
Demonstration of radio noise measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hachiya, T.; Echigo, H.; Sato, R.
Year: 1999
An exposure setup for biological studies on the effects of localized MW exposure by a cellular telephone
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, S.; Yamanaka, Y.; Taki, M.
Year: 1999
A multilayer board-type magnetic field probe with high spatial resolution and RF current estimation method for ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masuda, N.; Tamaki, N.; Wabuka, H.; Watanabe, T.; Ishizaka, K.
Year: 1999
Automatic immunity tester relating to RF-conducted disturbance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takagi, K.; Miyake, M.; Okayasu, R.
Year: 1999
Evaluation of impedance-matching and coupling by using radiowave holograph method. I
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kitayoshi, H.; Nagashima, M.; Nishitani, S.; Maeda, A.; Katoh, K.
Year: 1999
Evaluation of impedance-matching and coupling by using radiowave holography method. II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kitayoshi, H.; Nagashima, M.; Nishitani, S.; Maeda, A.; Katoh, K.
Year: 1999
Detection of buried human body by electromagnetic wave reflection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hatakeyama, K.; Sakata, Y.; Hashimoto, T.; Yamauchi, K.
Year: 1999
An example of modern radio disturbance measuring apparatus and systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kobayashi, T.
Year: 1999
EMI ambient cancellation and source localization technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marino, M.; Watkins, S.D.
Year: 1999


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