The Use Of The Finite-Difference Method For The Analysis Of The Coupling Between Anisotropic Dielectric Waveguides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:da Silva Souza Sobrinho, C.L.; Giarola, A.J.
Year: 1993
Guided Waves In Dielectric Waveguides With Slanted Gratings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rokushima, K.; Matsumoto, K.
Year: 1993
Properties Of Composite Chiral - Ferrite Media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krowne, C.M.
Year: 1993
Reflection Properties Of Isotropic-Pseudochiral Interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toscano, A.; Vaccari, M.; Vegni, L.
Year: 1993
Non Linear Modelling Techniques Of High Frequency MESFET Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garcia, J.L.; Tazon, A.; Mediavilla, A.
Year: 1993
Cad-Oriented Models Of Packaged Low-Noise HEMTs From Measured Noise And Scattering Parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caddemi, A.; Gambino, G.; Sannino, M.
Year: 1993
The Optimization Synthesis Of Matching Network And Idler Circuit For Varactor Frequency Multipliers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiadong Huang; Zhan Ding
Year: 1993
Recent Achievements In Microwave Optoelectronic Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berceli, T.
Year: 1993
High Speed Optoelectronic Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagarajan, R.; Bowers, J.
Year: 1993
Low Chirp 10 Gb/s Standard Fibre Transmission By Injection-Locking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burkhard, H.; Mohrdiek, S.; Walter, H.
Year: 1993
A Triple Deck Ceramic Sringle Chip Package For High Frequency Communication Integrated Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bedouani, M.
Year: 1993
Fiber Brillouin Laser With Two Cascaded Fiber Of Different Brillouin Frequency Shifts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Oliveira, C.A.S.; Jen, C.K.
Year: 1993
Development Of Industrial Microwave Sensors In Finland
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nyfore, E.; Vainikainen, P.; Raisanen, A.
Year: 1993
The Six-Port Technique: A Brief Review
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belfort de Oliveira, A.J.; Neto, S.P.X.
Year: 1993
MMIC Bandwidth-Gain Control Optical Preamplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giannini, F.; Paoloni, C.; Orengo, G.
Year: 1993
1-1 8GHz Monolithic Distributed Amplifier With Lumped And Distributed Elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Torres, J.P.; Parra, T.; Freire, J.C.
Year: 1993
MMIC Based InP/InGaAsP Intensity Optical Modulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Silva, M.T.C.; Herczfeld, P.R.
Year: 1993
Light-Controlled MMW Beam Scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Webb, G.W.; Pinck, L.H.
Year: 1993
Broadband Spread Spectrum Multiple Access For Personal And Cellular Communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schilling, D.L.
Year: 1993
A 174.08 MHz SAW Filter For Clock Recovery Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Magri Cabreira, C.; Finardi, C.A.; Marini de Almeida, A.
Year: 1993
Biomedical Applications Of Optics. New Computer Aided Sensor Concepts For Nonimvasive Measurements Of Human Hemodynamics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blazek, V.
Year: 1993
Low Birefringence Single Mode Optical Fiber: Polarimetric Properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vieira, A.J.C.; Camargo Silva, M.T.
Year: 1993
Fiber Simulator For Hybrid Lightwave-microwave Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mullen, L.; Herczfeld, P.R.; Contarino, V.M.; Allocca, D.; Squicciarini, M.F.; Billmers, R.
Year: 1993
New Formulations And Notations To Teach Vector Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tai, C.T.
Year: 1993
On The Amplitude Center Of Three Dimensional Sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Panicali, A.R.
Year: 1993
An Experience Of Teaching Microwaves & Antennas In Novosibirsk Telecommunication Institute
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kapilevich, B.Yu.
Year: 1993
Hermetically Packaged Semiconductor Optical Amplifier For Application In Singlemode Fiber Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barbosa, F.R.; Coral, C.; Caumo, J.R.; Flacker, A.
Year: 1993
Dynamic Response Of External Cavity Semiconductor Laser - A Multigigabit Per Second Transmission Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Barros, L.E.M.; Moschin, E.; Souza, R.F.
Year: 1993
Radar-ECM Simulation System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oliveira, C.L.C.; Grivet, M.A.; Pantoja, F.R.
Year: 1993
Real-time Sar Processing At DLR
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moreira, A.
Year: 1993
Frequency Multipliers For Submillimeter Wavelengths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raisanen, A.
Year: 1993
Millimetre And Submillimetre Wave Heterodyne Receivers For Atmospheric Sounding And Radioastronomy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beaudin, G.; Deschamps, A.; Encrenaz, P.; Feautrier, P.; Febvre, P.; Gheudin, M.; Perrin, O.; Pernot, J.C.; Prigent, C.; Robert, C.; Ruffle, G.
Year: 1993
Wide Band, Wide Temperature Operating Range Acousto-optical Spectrometer (A.O.S) For The Balloon Borne Pronaos Submillimetre Heterodyne Experiment.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosolen, C.; Michet, D.; Gac, C.; Lecacheux, A.
Year: 1993
Ferrite Rotary-field Phase Shifters: A Survey Of Current Technology And Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boyd, C.R.
Year: 1993
Optimized test cost using fault probabilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spiegel, G.
Year: 1993
Trade-offs in scan path and BIST implementations for RAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolaidis, M.; Castro Alves, V.; Kebichi, O.
Year: 1993
Is there any future for deterministic self-test of embedded RAMs?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krasniewski, A.; Gaj, K.
Year: 1993
Random test length for bounded faults in RAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David, R.; Brzozowski, J.A.; Jurgensen, H.
Year: 1993
Functional memory array testing using associative search algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elm, C.; Tavangarian, D.
Year: 1993
On the application of fault detection observers to analog circuit testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vermeiren, W.; Straube, B.; Hohn, C.
Year: 1993
A fault signature approach to analog devices testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corsi, F.; Chiarantoni, M.; Lorusso, R.; Marzocca, C.
Year: 1993
Analog fault diagnosis: a fault clustering approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Somayajula, S.S.; Sanchez-Sinencio, E.; Pineda de Gyvez, J.
Year: 1993
Fast test pattern generation for all path delay faults considering various test classes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fuchs, K.; Wittmann, H.C.; Antreich, K.J.
Year: 1993
A reconvergent fanout analysis for the CPT algorithm used in delay-fault diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Girard, P.; Landrault, C.; Pravossoudovitch, S.
Year: 1993
Concurrent error detection of CMOS digital and analog faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeong-Ruey Shieh; Cheng-Wen Wu
Year: 1993
Implementation of the transient response measurement of mixed-signal circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shepherd, P.R.; Bertin, A.; Al-Qutayri, M.A.
Year: 1993
Towards a mixed-signal testability bus standard P1149.4
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilkins, B.R.; Oresjo, S.; Suparjo, B.S.
Year: 1993
System-level fault modeling and test pattern generation with process algebras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Camurati, P.; Corno, F.; Prinetto, P.
Year: 1993
A fuzzy decision-making approach for test space exploration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fares, M.; Kaminska, B.
Year: 1993
Testability and test protocol expansion in hierarchical macro testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marinissen, E.J.; Kuiper, K.; Wouters, C.
Year: 1993
Reliability aspects of defect analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruls, E.M.J.G.
Year: 1993
A framework for test quality assessment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tromp, G.-J.; van der Goor, A.J.
Year: 1993
The effect of guardbands on errors in production testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Williams, R.H.; Hawkins, C.F.
Year: 1993
Redundant states in test control block design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thijssen, L.; Bouwman, F.; Vink, H.
Year: 1993
On the testability of FFT arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lombardi, F.
Year: 1993
Test pattern generation for multiple stuck-at faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karkouri, Y.; Aboulhamid, E.M.; Cerny, E.
Year: 1993
Algebraic ATPG of combinational circuits using binary decision diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srinivasan, S.; Swaminathan, G.; Aylor, J.H.; Mercer, M.R.
Year: 1993
Combinational ATPG theorems for identifying untestable faults in sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrawal, V.D.; Chakradhar, S.T.
Year: 1993
I-path analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blatny, J.; Kotasek, Z.; Hlavicka, J.
Year: 1993
Emitter coupled logic testability analysis and comparison with CMOS & BiCMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Al-Khalili, D.; Esonu, M.O.; Rozon, C.
Year: 1993
Essential testability guidelines for current technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Phillips, J.C.
Year: 1993
A deductive method for simulating transistor stuck-open faults in CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanbing Xu; Abd-El-Barr, M.; McCrosky, C.
Year: 1993
Fault simulation for synchronous sequential circuits under the multiple observation time testing approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pomeranz, I.; Reddy, S.M.
Year: 1993
Phase coherent, event synchronized test system architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dinteman, B.J.
Year: 1993
Modules for gigahertz digital testing of ECL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keezer, D.C.
Year: 1993
Analog test signal generation on a digital tester
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zwemstra, T.; Seuren, G.P.H.
Year: 1993
Basic boundary-scan for in-circuit test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Albee, A.J.; Ellis, M.; Robinson, G.D.
Year: 1993
Integration of IEEE 1149.1 with mixed ECL, TTL and differential logic signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrews, J.
Year: 1993
Implementing BIST and boundary-scan in a digital signal processor ASIC for radiocommunication applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pichon, F.
Year: 1993
Absolute dynamic measurements of temperature changes in electronic components from a thermoreflectance optical test probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Claeys, W.; Dilhaire, S.; Quintard, V.; Dom, J.P.
Year: 1993
Current vs. logic testability of bridges in scan chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rodriguez-Montanes, R.; Figueras, J.; Rubio, A.
Year: 1993
Influence of IC synthesis on the random pattern testability of parametric bridging faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dalpasso, M.; Favalli, M.; Olivo, P.; Ricco, B.
Year: 1993
Experience with biased random pattern generation to meet the demand for a high quality BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gruetzner, M.; Starke, C.W.
Year: 1993
Fast and high quality in-circuit test development through expert debug
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Loopik, A.; Crook, D.; Browen, R.; Allport, D.
Year: 1993
Using EDIF in IC testing: experience from the Everest project
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baker, K.; Morren, R.; Wahl, M.; Verhelst, B.
Year: 1993
Aliasing minimization in signature analysis testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olivo, P.; Damiani, M.; Ricco, B.
Year: 1993
Modular-addition signature analysis for built-in self-test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng-Wen Wu; Hun-Song Chen
Year: 1993
Experimental results on aliasing errors in circular BIST design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kothari, R.D.; Dong Sam Ha
Year: 1993
Interconnect testing for bus-structured systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dickinson, P.J.; Wilkins, B.R.
Year: 1993
A new DFT technique to reduce test duration for sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bertrand, Y.; Bancel, F.; Renovell, M.
Year: 1993
A new and secure selftest scheme for block cipher implementations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bonnenberg, H.; Curiger, A.; Zimmermann, R.; Felber, N.; Kaeslin, H.; Fichtner, W.
Year: 1993
An approach to mixed circuits testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bracho, S.; Martinez, M.; Arguelles, J.
Year: 1993
Testing of analogue to digital converter macros in ASICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cobley, R.A.
Year: 1993
Defect level as a function of fault coverage and yield
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corsi, F.; Martino, S.; Williams, T.W.
Year: 1993
Functional validation methods for VLSI-based systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Jonghe, M.; Mehtani, R.; Morren, R.
Year: 1993
Resynthesis for testability of redundant combinational circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Evans, A.H.; Macii, E.
Year: 1993
The structure of complete test sets for programmable logic arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goldberg, E.I.; Novikov, Y.A.
Year: 1993
Automated comparison of measured versus expected signals in mixed signal device testing and its effect on fault localization strategies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Helmreich, K.; Chowanetz, M.; Wolz, W.; Scharf, R.; Muller-Glaser, K.D.
Year: 1993
Design for testability techniques applicable to analog circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huertas, J.L.; Rueda, A.; Vazquez, D.
Year: 1993
Testing analog circuits by using a sigma-delta modulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huertas, J.L.; Rueda, A.; Vazquez, D.
Year: 1993
FNSIM: a functional fault simulator for efficient testability analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ienne, P.
Year: 1993
Mixed-signal automatic test program generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keady, A.; Lyden, C.; Ryan, J.; Claffey, S.; Murphy, N.; Long, B.
Year: 1993
Testing of resistive bridging faults in CMOS flip-flop
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metra, C.; Favalli, M.; Olivo, P.; Ricco, B.
Year: 1993
On automatic fault isolation using DFT methodology for active analog filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Novak, F.; Biasizzo, A.; Santo-Zarnik, M.; Mozetic, I.
Year: 1993
Analysis of voltage forcing consequences during in-circuit testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sartori, M.; Chiado Piat, A.; Gallesio, A.; Truzzi, C.; Bonaria, L.
Year: 1993
Logic circuit extraction for bridging fault equivalence identification in CMOS ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simoes, M.C.; Teixeira, I.M.; Teixeira, J.P.
Year: 1993
Modelling delay in symbolic test for data paths with partial scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Steensma, J.; Catthoor, F.; De Man, H.
Year: 1993
Functional level testability analysis for digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ubar, R.; Kuchcinski, K.
Year: 1993
A MPEG encoder implementation on the Princeton Engine video supercomputer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taylor, H.H.; Chin, D.; Jessup, A.W.
Year: 1993
Real-time focal-plane image compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tawel, R.
Year: 1993
Multispectral image compression algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Markas, T.; Reif, J.
Year: 1993
Algorithms for fast vector quantization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arya, S.; Mount, D.M.
Year: 1993
Fast and efficient lossless image compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Howard, P.G.; Vitter, J.S.
Year: 1993
Compression of DNA sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grumbach, S.; Tahi, F.
Year: 1993
Application of AVL trees to adaptive compression of numerical data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yokoo, H.
Year: 1993
A mean-removed variation of weighted universal vector quantization for image coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrews, B.D.; Effros, M.; Chou, P.A.; Gray, R.M.
Year: 1993
Design and performance of tree-structured vector quantizers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, J.; Storer, J.A.
Year: 1993
Segmentation-based progressive image coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu, X.; Fang, Y.
Year: 1993
Efficient compression of wavelet coefficients for smooth and fractal-like data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Culik, K., II; Dube, S.; Rajcani, P.
Year: 1993
An embedded hierarchical image coder using zerotrees of wavelet coefficients
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shapiro, J.M.
Year: 1993
A high performance adaptive image compression system using a generative neural network: DynAmic Neural Network II (DANN II)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rios, A.; Kabuka, M.R.
Year: 1993
Full-frame compression of tomographic images using the discrete Fourier transform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Villasenor, J.D.
Year: 1993
Optimum DCT quantization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Monro, D.M.; Sherlock, B.G.
Year: 1993
Visually optimal DCT quantization matrices for individual images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watson, A.B.
Year: 1993
Coding theory and regularization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Connor, J.T.; Atlas, L.E.
Year: 1993
Multialphabet arithmetic coding at 16 MBytes/sec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Printz, H.; Stubley, P.
Year: 1993
An empirical evaluation of coding methods for multi-symbol alphabets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moffat, A.; Sharman, N.; Witten, I.H.; Bell, T.C.
Year: 1993
Filtering random noise via data compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Natarajan, B.K.
Year: 1993
Codes with monotonic codeword lengths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abrahams, J.
Year: 1993
On-line adaptive vector quantization with variable size codebook entries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Constantinescu, C.; Storer, J.A.
Year: 1993
Experiments with client/server multimedia on token ring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amer, K.; Christensen, K.; Toher, T.
Year: 1993
"And CNM for all.": Customer network management services for broadband data services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brown, T.A.; Kostick, D.C.
Year: 1993
A technical trial of the SMDS customer network management (CNM) by 3M and US West
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amley, C.; Bumblis, J.R.; Gale, L.
Year: 1993
Experience with the VuNet: A network architecture for a distributed multimedia system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adam, J.F.; Houh, H.H.; Tennenhouse, D.L.
Year: 1993
Distance learning and ATM: A trial at the University of Minnesota
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Foldvik, R.G.; Walling, W.
Year: 1993
Dynamic congestion control schemes in high-speed multimedia networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chatterjee, S.; Bassiouni, M.A.
Year: 1993
Reactive DQDB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O'Shea, S.; Finucane, J.
Year: 1993
Experimentation on the concentrator tree with loopback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiles, W.S.; Marlow, T.T.
Year: 1993
Using camp-on to improve the performance of a Fibre Channel switch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varma, A.; Murthy, S.; Bryant, R.
Year: 1993
Optical link bandwidth optimization of the Fiber Channel Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, E.S.
Year: 1993
Slotted Aloha protocols for high-speed optical fiber local area networks using WDM passive star topology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cho, W.; Lee, S.-B.
Year: 1993
Configuration and performance issues in the MetaNet design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yener, B.; Ofek, Y.; Yung, M.
Year: 1993
Performance evaluation of an off-host communications architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michel, J.R.; Waterman, A.S.; Weaver, A.C.
Year: 1993
Error control in the Xpress transfer protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Atwood, J.W.; Chung, G.C.K.
Year: 1993
Analysis of a link layer protocol for high speed data bus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harju, J.; Raatikainen, P.; Reinikka, T.; Zidbeck, J.
Year: 1993
Bandwidth balancing of the register insertion bus (RIB) fiber optic local area network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ott, J.M.; Jayasumana, A.P.
Year: 1993
Performance evaluation of wireless LANs in the indoor environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bronson, G.; Pahlavan, K.; Rotithor, H.
Year: 1993
Token-cycle time characteristics of FDDI networks with multiple classes of traffic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Werahera, P.; Jayasumana, A.P.; Boes, D.C.
Year: 1993
Adaptive bounded time windows in an optimistically synchronized simulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palaniswamy, A.C.; Wilsey, P.A.
Year: 1993
Minmax-cut graph partitioning problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tragoudas, S.
Year: 1993
Efficient minimization algorithms for fixed polarity AND/XOR canonical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, C.-C.; Marek-Sadowska, M.
Year: 1993
A simple method for noise tolerance characterization of digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simovich, S.; Franzon, P.; Steer, M.
Year: 1993
Clock partitioning for testability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Einspahr, K.L.; Seth, S.C.; Agrawal, V.D.
Year: 1993
C-testable systolic arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faroughi, N.
Year: 1993
Delay fault testability evaluation through timing simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bose, S.; Agrawal, P.; Agrawal, V.D.
Year: 1993
Modeling stuck-open faults in CMOS iterative circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Macii, E.; Xu, Q.
Year: 1993
Automatic parallelization of LINPACK routines on distributed memory parallel processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Neeracher, M.; Ruhl, R.
Year: 1993
Parallel A* algorithms and their performance on hypercube multiprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dutt, S.; Mahapatra, N.R.
Year: 1993
Towards understanding block partitioning for sparse Cholesky factorization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Venugopal, S.; Naik, V.K.
Year: 1993
VMPP: a virtual machine for parallel processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Loyot, E.C., Jr.; Grimshaw, A.S.
Year: 1993
Speedup, communication complexity and blocking-a La Recherche du Temps Perdu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marinescu, D.C.; Rice, J.R.
Year: 1993
Global semigroup operations in faulty SIMD hypercubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raghavendra, C.S.; Sridhar, M.A.
Year: 1993
VLSI architectures for depth estimation using intensity gradient analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sastry, R.; Ranganathan, N.; Jain, R.C.
Year: 1993
Parallel computation of solvent accessible surface area of protein molecules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suh, E.; Lee, B.K.; Martino, R.; Narahari, B.; Choudhary, A.
Year: 1993
Parallel memory-based parsing on SNAP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung, M.; Moldovan, D.
Year: 1993
Strategies for mapping Lee's maze routing algorithm onto parallel architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen, I.-L.; Dubash, R.M.; Bastani, F.B.
Year: 1993
Optimal broadcasting in binary de Bruijn networks and hyper-deBruijn networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ganesan, E.; Pradhan, D.K.
Year: 1993
Writing correct parallel programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chandy, K.M.
Year: 1993
Process Groups: a mechanism for the coordination of and communication among processes in the Venus collective communication library
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bala, V.; Kipnis, S.
Year: 1993
Advanced methods of performance data processing and analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rover, D.T.; Waheed, A.; Doetsch, M.
Year: 1993
Data-parallel functional programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:VanderWiel, S.; Davis, J.A.
Year: 1993
A tensor product formulation of Strassen's matrix multiplication algorithm with memory reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, B.; Huang, C.-H.; Johnson, R.W.; Sadayappan, P.
Year: 1993
Parallel analog algorithms for processing polygonal images on a systolic screen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guha, S.
Year: 1993
Hypersphere Mapper: a nonlinear programming approach to the hypercube embedding problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonio, J.K.; Metzger, R.C.
Year: 1993
Mapping interconnection networks into VEDIC networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chaudhary, V.; Sabata, B.; Aggarwal, J.K.
Year: 1993
Dynamic embeddings of trees and quasi-grids into hyper-de Bruijn networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohring, S.; Das, S.K.
Year: 1993
The clustered-star graph: a new topology for large interconnection networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Latifi, S.
Year: 1993
Image processing with the MGAP: a cost effective solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bajwa, R.S.; Owens, R.M.; Irwin, M.J.
Year: 1993
A parallel Prolog execution model: theoretical approach and experimental results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bodeveix, J.P.; Bizouarn, E.
Year: 1993
Linked list cache coherence for scalable shared memory multiprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thapar, M.; Delagi, B.; Flynn, M.J.
Year: 1993
A separation between reconfigurable mesh models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:MacKenzie, P.D.
Year: 1993
Parallel algorithms for hypercube allocation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, Y.; Bhuyan, L.N.
Year: 1993
Load balancing of DOALL loops in the Perfect Club
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elsesser, G.; Ngo, V.; Bhattacharya, S.; Tsai, W.T.
Year: 1993
Global combine on mesh architectures with wormhole routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barnett, M.; Littlefield, R.; Payne, D.G.; van de Geijn, R.
Year: 1993
New degree four networks: properties and performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gessesse, G.A.; Chalasani, S.
Year: 1993
Sorting n numbers on n*n reconfigurable meshes with buses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nigam, M.; Sahni, S.
Year: 1993
Towards optimal parallel radix sorting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vaidyanathan, R.; Hartmann, C.R.P.; Varshney, P.K.
Year: 1993
A parallel MSF algorithm for planar graphs on a mesh and applications to image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nassimi, D.
Year: 1993
Simulating interconnection networks in RAW
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ligon, W.B., III; Ramachandran, U.
Year: 1993
A cluster-M based mapping methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eshaghian, M.M.; Shaaban, M.E.
Year: 1993
A load balancing strategy for prioritized execution of tasks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sinha, A.B.; Kale, L.V.
Year: 1993
Mapping onto three classes of parallel machines: a case study using the cyclic reduction algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saghi, G.; Siegel, H.J.; Gray, J.L.
Year: 1993
Testing a simple polygon for monotonicity optimally in parallel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, D.Z.; Guha, S.
Year: 1993
2D and 3D optimal parallel image warping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wittenbrink, C.M.; Somani, A.K.
Year: 1993
Designing efficient parallel algorithms: models and paradigms with applications to image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:JaJa, J.
Year: 1993
Complexity of intensive communications on balanced generalized hypercubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonio, J.K.; Lin, L.; Metzger, R.C.
Year: 1993
Analytical models of bandwidth allocation in pipelined k-ary n-cubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaughan, P.T.; Yalamanchili, S.
Year: 1993
Reconfiguration of binary trees in faulty hypercubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, P.-J.; Raghavendra, C.S.
Year: 1993
A portable parallel algorithm for VLSI circuit extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramkumar, B.; Banerjee, P.
Year: 1993
A design algorithm for reconfigurable ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, M.-J.; Yee, J.R.
Year: 1993
A unified approach to protocol test sequence generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chanson, S.T.; Zhu, J.
Year: 1993
How bad is naive multicast routing?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doar, M.; Leslie, I.
Year: 1993
A packet-switched WDM passive optical star based metropolitan area network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ganz, A.; Li, B.
Year: 1993
A multi-Gbit/s optical LAN utilizing a passive WDM star: towards an experimental prototype
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kazovsky, L.G.; Barry, C.F.; Hickey, M.J.; Noronha, C.A.; Poggiolini, P.T.
Year: 1993
Self-stabilizing ARQ on channels with bounded memory or bounded delay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spinelli, J.M.
Year: 1993
Wavelength-based cell switching in ATM multihop optical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elby, S.D.; Acampora, A.S.
Year: 1993
Path allocation in a three-stage broadband switch with intermediate channel grouping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Collier, M.; Curran, T.
Year: 1993
Statistical multiplexing of VBR MPEG compressed video on ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reininger, D.; Raychaudhuri, D.; Melamed, B.; Sengupta, B.; Hill, J.
Year: 1993
Traffic characteristics of the T1 NSFNET backbone
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Claffy, K.C.; Polyzos, G.C.; Braun, H.-W.
Year: 1993
Implementation of the ANSI T1M1.5 GNM-T1.214 within an ODBMS framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Torrente, S.; Morgera, S.D.; Lester, K.W.
Year: 1993
Analysis of the link error monitoring algorithms in the Signaling System Number 7 protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramaswami, V.; Wang, J.L.
Year: 1993
Real-time high percentile tracking of quasi-exponential delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sohraby, K.; Eckberg, A.E.
Year: 1993
A real-time distributed routing and admission control algorithm for ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, F.Y.S.; Yee, J.R.
Year: 1993
Multiple fault diagnosis for finite state machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghedamsi, A.; Bochmann, G.V.; Dssouli, R.
Year: 1993
Generating test cases for EFSM with given fault models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, C.-J.; Liu, M.T.
Year: 1993
On the queueing behavior of multiplexed leaky bucket regulated sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hluchyj, M.G.; Yin, N.
Year: 1993
Fundamental limits of input rate control in high speed network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, S.-Q.; Chong, S.
Year: 1993
A simple flow control mechanism in ATM network with end to end transport
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwon, H.-I.; Tubtiang, A.; Pujolle, G.
Year: 1993
In-call renegotiation of traffic parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crosby, S.
Year: 1993
Routing and switching in a wavelength convertible optical network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, K.-C.; Li, V.O.K.
Year: 1993
A new performance measure for statistical multiplexing: perspective of the individual source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meempat, G.; Ramamurthy, G.; Sengupta, B.
Year: 1993
Network access fairness control for concurrent traffic in gigabit LANs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yih, J.-S.; Li, C.-S.; Kandlur, D.D.; Yang, M.S.
Year: 1993
Fast connection establishment in large-scale networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doeringer, W.A.; Dykeman, H.D.; Engbersen, A.; Guerin, R.; Herkersdorf, A.; Heusler, L.
Year: 1993
Logical clustering for the optimization and analysis of a rearrangeable distributed ATM switch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Labourdette, J.-F.P.; Acampora, A.S.
Year: 1993
Extensions to the 'staggering switch' architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haas, Z.
Year: 1993
Dispersity routing on ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maxemchuk, N.F.
Year: 1993
Irregular torus networks: deadlock avoidance and throughput analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, Y.-M.; Sasaki, G.H.
Year: 1993
Analysis of one-buffer deflection routing in ultra-fast optical mesh networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bononi, A.; Forghieri, F.; Prucnal, P.R.
Year: 1993
An all-optical multifiber tree network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bannister, J.; Gerla, M.; Kovacevic, M.
Year: 1993
Memory- and channel-sharing techniques for congestion control in ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eng, K.Y.; Karol, M.J.; Gitlin, R.D.
Year: 1993
Analysis and implementation of a priority knockout switch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Evans, J.B.; Duron, E.; Wang, Y.
Year: 1993
The performance analysis of a random packet selection policy for multicast switching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ali, M.M.
Year: 1993
Reverse channel augmented multihop lightwave networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pavan, A.; Bhattacharya, S.; Du, D.H.C.
Year: 1993
Reducing the complexities of TCP for a high speed networking environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen, M.-H.; Schwartz, M.
Year: 1993
A fundamental property for traffic management in ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liew, S.C.; Lee, T.T.
Year: 1993
A general relationship between buffer occupancy and delay in discrete-time multiserver queueing models, applicable in ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Steyaert, B.; Bruneel, H.; Xiong, Y.
Year: 1993
An integrated dynamic resource allocation scheme for ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bolla, R.; Danovaro, F.; Davoli, F.; Marchese, M.
Year: 1993
Load balancing of complex stochastic tasks using stochastic majorization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicol, D.; Simha, R.; Towsley, D.
Year: 1993
Multicasting in a linear lightwave network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bala, K.; Petropoulos, K.; Stern, T.E.
Year: 1993
Improved queueing analysis of shared buffer switching networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bianchi, G.; Turner, J.S.
Year: 1993
Parallel searching techniques for routing table lookup
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Knox, D.; Panchanathan, S.
Year: 1993
A case-based reasoning approach to the management of faults in communication networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lewis, L.
Year: 1993
Opportunities, limitations, and tradeoffs in process programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sutton, S.M., Jr.
Year: 1993
A role-based empirical process modeling environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cain, B.G.; Coplien, J.O.
Year: 1993
Concurrent engineering and the software process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frailey, D.J.
Year: 1993
Hakoniwa: Monitor and navigation system for cooperative development based on activity sequence model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iida, H.; Mimura, K.-i.; Inoue, K.; Torii, K.
Year: 1993
Software process themes and issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dowson, M.
Year: 1993
On the equivalence of persistent term rewriting systems and recursive program schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khasidashvili, Z.
Year: 1993
Divergence models for atomized statements and parallel choice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kok, J.N.; Knijnenburg, P.
Year: 1993
Algorithmic research problems in molecular bioinformatics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lengauer, T.
Year: 1993
On fixed-parameter tractability and approximability of NP-hard optimization problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cai, L.; Chen, J.
Year: 1993
Subpixel image registration using circular fiducials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Efrat, A.; Gotsman, C.
Year: 1993
A lower bound for linear approximate compaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chaudhuri, S.
Year: 1993
Finite resolution aspect graphs of polyhedral objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimshoni, I.; Ponce, J.
Year: 1993
Motion constraint patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fermuller, C.
Year: 1993
A geometric invariant for visual recognition and 3D reconstruction from two perspective/orthographic views
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shashua, A.
Year: 1993
A hierarchy of invariant representations of 3D shape
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weinshall, D.
Year: 1993
On the use of size functions for shape analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Verri, A.; Uras, C.; Frosini, P.; Ferri, M.
Year: 1993
Verifying the 'consistency' of shading patterns and 3-D structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sinha, P.; Adelson, E.
Year: 1993
Studying control of selective perception using T-world and TEA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rimey, R.D.
Year: 1993
Learning and recognition of 3D objects from appearance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Murase, H.; Nayar, S.K.
Year: 1993
Using causal scene analysis to direct focus of attention
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birnbaum, L.; Brand, M.; Cooper, P.
Year: 1993
Function-based recognition from incomplete knowledge of shape
Publisher: IEEE Computer Society
Authors:L. Stark; A. Hoover; D. Goldgof; K. Bowyer
Year: 1993
Object recognition using steerable filters at multiple scales
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ballard, D.H.; Wixson, L.E.
Year: 1993
ERDA: a user-centered, intelligent tutorial system for educational research in data abstractions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bartholomew, K.W.; Christensen, L.C.; Hays, B.
Year: 1993
Managing intelligent systems with a deductive database: a first step towards federated knowledge based-systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hanachi, C.; Charrel, P.-J.
Year: 1993
From databases to rule bases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oxman, S.W.
Year: 1993
Effect of genetic sectoring on vehicle routing problems with time windows
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thangiah, S.R.; Gubbi, A.V.
Year: 1993
Applying constraint propagation technology to an expert system planning Hubble Space Telescope observations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gerb, A.; Henry, R.; Johnston, M.
Year: 1993
ProloGA: a Prolog implementation of a genetic algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Medsker, C.; Song, I.Y.
Year: 1993
Design of a modular chip for a reconfigurable artificial neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Plaskonos, P.; Pakzad, S.; Jin, B.; Hurson, A.R.
Year: 1993
A biological-based neural network model of leech reflexive behaviors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coulston, C.; Pakzad, S.
Year: 1993
Eliciting potential expert systems projects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Archer, C.O.; Wolman, K.H.; Kramer, B.R.
Year: 1993
Identifying and measuring quality in a software requirements specification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davis, A.; Overmyer, S.; Jordan, K.; Caruso, J.; Dandashi, F.; Dinh, A.; Kincaid, G.; Ledeboer, G.; Reynolds, P.; Sitaram, P.; Ta, A.; Theofanos, M.
Year: 1993
A new framework of measuring software development processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsumoto, K.; Kusumoto, S.; Kikuno, T.; Torii, K.
Year: 1993
Can we measure software testing effectiveness?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weyuker, E.J.
Year: 1993
An empirical investigation of software fault distribution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moller, K.-H.; Paulish, D.J.
Year: 1993
Slice based metrics for estimating cohesion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ott, L.M.; Thuss, J.J.
Year: 1993
Constructing and testing software maintainability assessment models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhuo, F.; Lowther, B.; Oman, P.; Hagemeister, J.
Year: 1993
A framework for evaluation and prediction of metrics program success
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jeffery, R.; Berry, M.
Year: 1993
Inter-item correlations among function points
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kitchenham, B.; Kansala, K.
Year: 1993
Software process maturity: measuring its impact on productivity and quality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rubin, H.A.
Year: 1993
How audience analysis keeps engineers customer-focused
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barchilon, M.G.
Year: 1993
Structure and form: Strengthening selling documents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramos, O., Jr.
Year: 1993
What do users really want from computer documentation?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitchell, G.E.
Year: 1993
Using International English to prepare technical text for translation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buican, I.; Hriscu, V.; Amador, M.
Year: 1993
Technical support: A valuable voice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hart, S.
Year: 1993
Computer-aided teaching of thermoelectrical power plant operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rodriguez, G.; Villavicencio, S.
Year: 1993
Hypertext technology in information design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mings, S.; Geisler, C.; Rogers, E.
Year: 1993
The nontechnical audience: A vanished species?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Longo, J.A.
Year: 1993
Understanding statistics as a tool for interpreting research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grove, L.K.
Year: 1993
Technical Policy Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malcolm, A.
Year: 1993
The wizard of cause
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walling, K.A.; Strange, C.L.
Year: 1993
User interface design for a CD-ROM product
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lau, T.
Year: 1993
Access methods for online information: A cost/benefit approach to users' choices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carey, T.; Nonnecke, B.; Lungu, D.; Mitterer, J.
Year: 1993
Answers to questions about questions-and-answers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bethke, F.J.; Hunter, C.M.
Year: 1993
The neglect of writing in technical writing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bush, D.
Year: 1993
Retraining industrial employees for a career in programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cohen, A.J.
Year: 1993
Getting the most out of your professional communications: A total quality approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khera, D.
Year: 1993
The communicator's role in project teams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hilliard, D.K.
Year: 1993
Information Mapping on the Macintosh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brosius, J.Y.
Year: 1993
Balancing visual and verbal modes of presenting information: Diagnostic tools for making effective choices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krull, R.; Bayer, N.; Keyes, E.
Year: 1993
Skimmers - How to reach our new audience
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaufman, K.A.; Tebelak, R.M.
Year: 1993
Risk analysis communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brosius, M.T.
Year: 1993
Curriculum for technical communication in the computer industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edmunds, J.; Garb, R.
Year: 1993
Solutions for training the professional when money is tight
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feinberg, S.
Year: 1993
Effective training techniques: Oral versus written
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Douglas, R.; MacNealy, M.S.
Year: 1993
Quality metrics for ISO 9000 documents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiss, E.H.
Year: 1993
The cooperative development of Linux
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wiegand, J.
Year: 1993
Electronic bulletin boards alleviate time zones, increasing efficiency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Campagna, J.M.
Year: 1993
University minority engineering programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dakich, M.
Year: 1993
Video teleconferencing and the integration of effective communications systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fini, R.J.
Year: 1993
A comparison among different front-end input versions of a medical record system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuo-Lane Chen; Evens, M.; Trace, D.; Naeymi-Rad, F.
Year: 1993
Development of an effective user interface for a computerized laboratory alerting system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tate, K.E.; Gardner, R.M.
Year: 1993
Computer/user interface design specification for medical devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eisenberg, P.
Year: 1993
An intelligent hypermedia system for generating progress notes and physician reminders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ma, H.-N.N.; Chang, P.-L.; Chen, S.; Evens, M.; Singh, S.; Yaturu, S.; Trace, D.; Naeymi-Rad, F.
Year: 1993
A new method for estimating dimensions and 3-D reconstruction of coronary arterial trees from biplane angiograms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kayikcioglu, T.; Mitra, S.
Year: 1993
Image analysis and 3-D visualization of intracerebral brain hemorrhage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dhawan, A.P.; Loncaric, S.; Hitt, K.; Broderick, J.; Brott, T.
Year: 1993
Computerized cardiopulmonary perfusion-a six year overview
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tisdell, M.I.; Jerabek, C.F.
Year: 1993
Rapid validation of a medical expert system using precedence logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sorace, J.M.; Moore, G.W.
Year: 1993
A hyperdocument architecture for cardiac catheterisation documents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ip, H.H.S.; Law, K.C.K.; Chan, S.L.; Chau, W.Y.; Wong, C.P.
Year: 1993
A computer imaging system for noninvasively determining blood pool volume in the chick embryo heart
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:James, T.L.; Magee, M.; Bruyere, H.J.
Year: 1993
Comparison of results from two methods of measurement of stride characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peterson, M.G.E.; Murray-Weir, M.P.T.; Root, L.
Year: 1993
Rapid acquisition and tracking of evoked potentials by two dimensional spectral filtering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paige, A.L.B.; Ozdamar, O.; Delgado, R.
Year: 1993
Traditional software development's effects on safety
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gowen, L.D.; Yap, M.Y.
Year: 1993
DANIEL: a dynamic acquisition & numerical information environment & language and RIVKA: robust intelligent vector crunching application (virtual instrument)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spitzer, A.R.; Bearden, M.F.
Year: 1993
Convolution reverse-projection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peddanarappagari, K.V.; Fager, R.S.
Year: 1993
Registration of retinal images using adaptive adjacency graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jasiobedzki, P.
Year: 1993
A new multiresolution predictive scheme for lossless compression of medical images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Das, M.K.; Li, C.C.; Burgett, S.R.
Year: 1993
Planning successful products (on purpose)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eureka, W.
Year: 1993
Medical CANDAs as a regulatory tool for clinical data review
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsiras, P.V.; Berger, E.T.
Year: 1993
Software quality in medical devices-a top-down approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leggingwell, D.A.; Norman, B.
Year: 1993
Total quality management for software development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Redig, G.; Swanson, M.
Year: 1993
The MEDAS local area network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chao, S.-C.; Juang, M.; Evens, M.; Carmony, L.; Zelanski, R.; Roberts, R.; McDermott, M.
Year: 1993
Integration of intermittent clinical data with continuous data from bedside monitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fackler, J.C.; Kohane, I.S.
Year: 1993
A secure communications and status reporting protocol for implanted devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Snyder, A.J.; Nazarian, R.A.; Weiss, W.J.
Year: 1993
Electronics development for the Utah electrohydraulic total artificial heart
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bearnson, G.B.; Krivoy, S.R.; Jarmin, R.D.; Fratto, J.R.; Khanwilkar, P.; Crump, K.R.; Smith, K.D.
Year: 1993
Developing an advanced 'tool' for the clinician; using industrial design and interface design together to bring technology into the hand of the user
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belden, T.; Sembrowich, W.L.; Deetz, D.W.; Solomon, F.A.
Year: 1993
In-vivo ultrasound liver differentiation using artificial neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zatari, D.; Botros, N.
Year: 1993
Extraction of diagnostic rules using neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sethi, I.K.; Yoo, J.H.; Brickman, C.M.
Year: 1993
Automatic examination for vestibulo-ocular reflex function test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tainsong Chen; Tzu-Tung Tsai; Ming-Chi Shieh
Year: 1993
Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taenzler, F.; Novak, T.; Kubalek, E.
Year: 1993
On CMOS bridge fault modeling and test pattern evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:chennian Di; Jess, J.A.G.
Year: 1993
Classification of bridging faults in CMOS circuits: experimental results and implications for test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Midkiff, S.F.; Bollinger, S.W.
Year: 1993
Computer-aided failure analysis of VLSI circuits using I/sub DDQ/ testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Naik, S.; Maly, W.
Year: 1993
The effect of defect clustering on test transparency and defect levels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Singh, A.D.; Krishna, C.M.
Year: 1993
Carafe: an inductive fault analysis tool for CMOS VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jee, A.; Ferguson, F.J.
Year: 1993
Explorations of sequential ATPG using Boolean satisfiability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Konuk, H.; Larrabee, T.
Year: 1993
CCSTG: an efficient test pattern generator for sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, K.; Saluja, K.K.
Year: 1993
Parallelization methods for circuit partitioning based parallel automatic test pattern generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Klenke, R.H.; Williams, R.D.; Aylor, J.H.
Year: 1993
Finitely self-checking circuits and their application on current sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolaidis, M.
Year: 1993
On the check base selection problem for fast adders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sparmann, U.
Year: 1993
Error detection, fault location and reconfiguration for 2D mesh processing element arrays for digital signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guoning Liao
Year: 1993
Input and output encoding techniques for on-line error detection in combinational logic circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Busaba, F.Y.; Lala, P.K.
Year: 1993
Quiescent current estimation based on quality requirements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vargas, F.L.; Nicolaidis, M.; Hamdi, B.
Year: 1993
Simulation and generation of I/sub DDQ/ tests for bridging faults in combinational circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakravarty, S.; Thadikaran, P.J.
Year: 1993
Minimal hardware multiple signature analysis for BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuejian Wu; Ivanov, A.
Year: 1993
A new built-in self-test method based on prestored testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edirisooriya, G.; Edirisooriya, S.; Robinson, J.P.
Year: 1993
A distributed BIST control scheme for complex VLSI devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zorian, Y.
Year: 1993
Automatic synthesis of DUT board circuits for testing of mixed signal ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kao, W.H.; Xia, J.Q.
Year: 1993
Hard faults diagnosis in analog circuits using sensitivity analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunsheng Lu; Dandapani, R.
Year: 1993
Improvement of analog circuit fault detectability using fault detection observers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vermeiren, W.; Straube, B.; Elst, G.
Year: 1993
LFSROM an algorithm for automatic design synthesis of hardware test pattern generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dufaza, C.; Chevalier, C.; Lew Yan Voon, L.F.C.
Year: 1993
LFSR based deterministic hardware for at-speed BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vasudevan, B.; Ross, D.E.; Gala, M.; Watson, K.L.
Year: 1993
Signal probability calculations using partial functional manipulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kodavarti, R.; Ross, D.E.
Year: 1993
Worst-case analysis for pseudorandom testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marculescu, R.
Year: 1993
Degrading fault model for WSI interconnection lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abujbara, H.Y.; Al-Arian, S.A.
Year: 1993
Testability of one dimensional ILAs under multiple faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gala, M.M.R.; Watson, K.L.; Ross, D.E.
Year: 1993
Concurrent error correction in iterative circuits by recomputing with partitioning and voting
Publisher: IEEE Computer Society
Authors:H. Al-Asaad; E. Czeck
Year: 1993
ECC design of a custom DRAM storage unit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peter, J.-L.
Year: 1993
Design SRAMs for burn-in
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reohr, W.; Yuen Chan; Plass, D.; Pelella, A.; Wu, P.
Year: 1993
Defect-tolerant cache memory design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lamet, D.; Frenzel, J.F.
Year: 1993
Revisiting shift register realization for ease of test generation and testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toida, S.
Year: 1993
On the design for testability of sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun, X.; Lombardi, F.
Year: 1993
Testability analysis based on structural and behavioral information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, J.; Patel, J.H.
Year: 1993
Testability preserving Boolean transforms for logic synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kundu, S.; Pramanick, A.K.
Year: 1993
Generation of testable designs from behavioral descriptions using high level synthesis tools
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varma, K.K.; Vishakantaiah, P.; Abraham, J.A.
Year: 1993
Incremental test pattern generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang-Hoon Song; Kinney, L.L.
Year: 1993
Combinational circuit ATPG using binary decision diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srinivasan, S.; Swaminathan, G.; Aylor, J.H.; Mercer, M.R.
Year: 1993
Aliasing-free error detection (ALFRED)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakrabarty, K.; Hayes, J.P.
Year: 1993
Time and space correlated errors in signature analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edirisooriya, G.; Edirisooriya, S.; Robinson, J.P.
Year: 1993
Aliasing computation using fault simulation with fault dropping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pomeranz, I.; Reddy, S.M.
Year: 1993
On the maximum value of aliasing probabilities for single input signature registers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shou-ping Feng; Fujiwara, T.; Kasami, T.; Iwasaki, K.
Year: 1993
Physical design for testability for bridges in CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferguson, F.J.
Year: 1993
Testable design for BiCMOS stuck-open fault detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Menon, S.M.; Jayasumana, A.P.; Malaiya, Y.K.
Year: 1993
On diagnosis of faults in a scan-chain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kundu, S.
Year: 1993
Impact of high level functional constraints on testability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, J.; Chickermane, V.; Patel, J.H.
Year: 1993
Partial scan testing with single clock control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrawal, V.D.; Charkraborty, T.J.
Year: 1993
Estimation of reject ratio in testing of combinatorial circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaitonde, D.D.; Khare, J.; Walker, D.M.H.; Maly, W.
Year: 1993
Evaluation of test generation algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yinghua Min; Zhongcheng Li
Year: 1993
Simulation of non-classical faults on the gate level-fault modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alt, J.; Mahlstedt, U.
Year: 1993
System level policies for fault tolerance issues in the FERMI project
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dell'Acqua, A.; Hansen, M.; Ikinen, S.; Lofstedt, B.; Vanuxem, J.P.; Svensson, C.; Yuan, J.; Hentzell, H.; Del Buono, L.; David, J.; Genat, J.F.; Lebbolo, H.; LeDortz, O.; Nayman, P.; Savoy-Navarro, A.; Zitoun, R.; Alippi, C.; Breveglieri, L.; Dadda, L.; Piuri, V.; Salice, F.; Sami, M.; Stefanelli, R.; Cattaneo, P.; Fumagalli, G.; Goggi, G.; Brigati, S.; Gatti, U.; Maloberti, F.; Torelli, G.; Carlson, P.; Kerek, A.; Appelquist, G.; Berglund, S.; Bohm, C.; Engstrom, M.; Yamdagni, N.; Sundblad, R.; Hoglund, I.; Persson, S.T.
Year: 1993
Analysis and comparison of fault tolerant FSM architecture based on SEC codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rochet, R.; Leveugle, R.; Saucier, G.
Year: 1993
Block implementation of fault-tolerant LMS adaptive FIR filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, L.; Redinbo, G.R.
Year: 1993
Fault-tolerant sorting using VLSI processor arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Youn, H.Y.; Lee, K.O.
Year: 1993
A high speed Reed-Solomon encoder-decoder for fault tolerant solid state disks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cardarilli, G.; Di Zenzo, M.; Pistilli, P.; Salsano, A.
Year: 1993
High level synthesis techniques for efficient built-in-self-repair
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guerra, L.M.; Potkonjak, M.M.; Rabaey, J.M.
Year: 1993
Detection of defective media in disks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kari, H.H.; Saikkonen, H.; Lombardi, F.
Year: 1993
A two-phase reconfiguration strategy for extracting linear arrays out of two-dimensional architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Al-Asaad, H.; Manolakos, E.S.
Year: 1993
On the configuration of degradable VLSI/WSI arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Low, C.P.; Leong, H.W.
Year: 1993
Functional testing and reconfiguration of MIMD machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aktouf, C.; Robach, C.; Mazare, G.; Johansson, J.
Year: 1993
On the reconfigurable operation of arrays with defects for image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Salinas, J.; Lombardi, F.
Year: 1993
Front-end electronics in the radiation environment of LHC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kerek, A.
Year: 1993
Analysis of the floating gate defect in CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Champac, V.H.; Rubio, A.; Figueras, J.
Year: 1993
Experiments on bridging fault analysis and layout-level DFT for CMOS designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Casimiro, A.; Simoes, M.; Santos, M.; Teixeira, I.; Teixeira, J.P.
Year: 1993
A logistic regression yield model for SRAM bit fail patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Collica, R.S.
Year: 1993
Yield model for ASIC and processor chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stapper, C.H.; Patrick, J.A.; Rosner, R.J.
Year: 1993
Some results on yield and local design rule relaxation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crepeau, J.; Thibeault, C.; Savaria, Y.
Year: 1993
Use of a segmentation technique to analyze the variability of the yield of a mature CMOS SRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duvivier, F.; Rivier, M.; Burtschy, B.; Charlot, J.J.
Year: 1993
Fault detection in sequential circuits through functional testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buonanno, G.; Fummi, F.; Sciuto, D.
Year: 1993
Layout level design for testability strategy applied to a CMOS cell library
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blom, F.; Oliver, J.; Rullan, M.; Ferrer, C.
Year: 1993
Current testing viability in dynamic CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renovell, M.; Figueras, J.
Year: 1993
Probabilistic identification of critical components for circuit delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wessels, D.; Muzio, J.C.
Year: 1993
Reduction of fault detection costs through testable design of sequential architectures with signal feedbacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bombana, M.; Buonanno, G.; Cavalloro, P.; Ferrandi, F.; Sciuto, D.; Zaza, G.
Year: 1993
Design of self-parity combinational circuits for self-testing and on-line detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sogomonjan, E.S.; Goessel, M.
Year: 1993
Design and implementation of a merged on-line and off-line self-testable architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun, X.; Serra, M.
Year: 1993
A probabilistic measurement for totally self-checking circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lo, J.-C.; Fujiwara, E.
Year: 1993
Design rules for CMOS self checking circuits with parametric faults in the functional block
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metra, C.; Favalli, M.; Olivo, P.; Ricco, B.
Year: 1993
A highly testable 1-out-of-3 CMOS checker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metra, C.; Favalli, M.; Olivo, P.; Ricco, B.
Year: 1993
VLSI concurrent error correcting adders and multipliers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsu, Y.-M.; Swartzlander, E.E., Jr.
Year: 1993
Functional testing of linear circuits using transient response analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taylor, D.; Evans, P.S.A.; Marland, D.
Year: 1993
Neural networks for multiple fault diagnosis in analog circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fanni, A.; Giua, A.; Sandoli, E.
Year: 1993
Realistic fault analysis of CMOS analog building blocks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolau, P.; Barbosa, J.; Saraiva, M.; Santos, M.B.; Teixeira, I.M.; Teixeira, J.P.
Year: 1993
Catastrophic defects oriented testability analysis of a class AB amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sachdev, M.
Year: 1993
Device mismatch limitations on performance of a Hamming distance classifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, N.; Pouliquen, P.O.; Andreou, A.G.
Year: 1993
Analytical performance evaluation of data replication based shared memory model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srbljic, S.; Budin, L.
Year: 1993
Performance analysis of distributed file systems with non-volatile caches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biswas, P.; Ramakrishnan, K.K.; Towsley, D.; Krishna, C.M.
Year: 1993
Distributed computing systems and checkpointing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, K.; Franklin, M.
Year: 1993
A low-latency programming interface and a prototype switch for scalable high-performance distributed computing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, T.; Feeney, J.; Fox, G.; Frieder, G.; Ranka, S.; Wilhelm, B.; Yu, F.
Year: 1993
Performance evaluation of a high-speed switching system based on the fibre channel standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varma, A.; Sahai, V.; Bryant, R.
Year: 1993
An ATM WAN/LAN gateway architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minden, G.J.; Evans, J.B.; Petr, D.W.; Frost, V.S.
Year: 1993
A fully distributed parallel ray tracing scheme on the Delta Touchstone machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, T.Y.; Raghavendra, C.S.; Nicholas, J.B.
Year: 1993
Test pattern generation for sequential circuits on a network of workstations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrawal, P.; Agrawal, V.D.; Villoldo, J.
Year: 1993
Toward a high performance distributed memory climate model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wehner, M.F.; Ambrosiano, J.J.; Brown, J.C.; Dannevik, W.P.; Eltgroth, P.G.; Mirin, A.A.; Farrara, J.D.; Ma, C.C.; Mechoso, C.R.; Spahr, J.A.
Year: 1993
DSMA: a fair capacity-1 protocol for gigabit ring networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dobosiewicz, W.; Gburzynski, P.
Year: 1993
p4-Linda: a portable implementation of Linda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Butler, R.M.; Leveton, A.L.; Lusk, E.L.
Year: 1993
A parallel object-oriented framework for stencil algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karpovich, J.F.; Judd, M.; Strayer, W.T.; Grimshaw, A.S.
Year: 1993
Programming a distributed system using shared objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanenbaum, A.S.; Bal, H.E.; Kaashoek, M.F.
Year: 1993
Variations on the themes of message freshness and replay-or the difficulty in devising formal methods to analyze cryptographic protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gong, L.
Year: 1993
Information flow control in a parallel language framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Banatre, J.-P.; Bryce, C.
Year: 1993
Modeling restrictive processes that involve blocking requests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosenthal, D.
Year: 1993
Towards normalized iconic indexing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Petraglia, G.; Sebillo, M.; Tucci, M.; Tortora, G.
Year: 1993
Three-dimensional graphical programming in CAEL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Reeth, F.; Flerackers, E.
Year: 1993
An iconic query system with intensional feedback capabilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Massari, A.; Pavani, S.; Chang, S.K.
Year: 1993
An empirical study of visual labs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Williams, M.G.; Ledder, W.A.; Buehler, J.N.; Canning, J.T.
Year: 1993
The results of geographical information system queries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mainguenaud, M.
Year: 1993
A visual programming for telecommunication services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takami, K.; Ohta, T.; Terashima, N.
Year: 1993
Relational grammars for interactive design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weitzman, L.; Wittenburg, K.
Year: 1993
Graphical annotation as a visual language for specifying generalization relations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lieberman, H.
Year: 1993
A Turbo environment for producing algorithm animations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glassman, S.C.
Year: 1993
Sequence retrieval by contents through spatio temporal indexing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bimbo, A.D.; Vicario, E.; Zingoni, D.
Year: 1993
Iconic object definition system for object-oriented databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshitaka, A.; Ueda, K.; Hirakawa, M.; Ichikawa, T.
Year: 1993
Media Streams: an iconic visual language for video annotation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davis, M.
Year: 1993
A visual logic programming language based on sets and partitioning constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spratt, L.; Ambler, A.
Year: 1993
A visual approach for developing, understanding and analyzing parallel programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wirtz, G.
Year: 1993
Deriving the meaning of iconic sentences for augmentative communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, S.K.; Orefice, S.; Polese, G.; Baker, B.R.
Year: 1993
A comparison study of the pen and the mouse in editing graphic diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Apte, A.; Kimura, T.D.
Year: 1993
Structured analysis, structured design, visual programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Opdahl, A.I.
Year: 1993
Is it easier to write matrix manipulation programs visually or textually? An empirical study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pandey, R.K.; Burnett, M.M.
Year: 1993
Deriving path expressions recursively
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bertolino, A.; Marre, M.
Year: 1993
The role of testing and dynamic analysis in program comprehension supports
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benedusi, P.; Benvenuto, V.; Tomacelli, L.
Year: 1993
A process algebra based program and system representation for reverse engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Merlo, E.; DeMori, R.; Kontogiannis, K.
Year: 1993
Understanding the process of software maintenance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bennett, K.H.
Year: 1993
Concurrent engineering information systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilson, F.A.; Wilson, J.N.
Year: 1993
Translative interface for data sharing in integrating: a paradigm for distributed data systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maloney, T.F.
Year: 1993
Infrastructure support for multimedia communications: a survey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiang Lin; Srinivas, K.
Year: 1993
Tools for inventing organizations: toward a handbook of organizational processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malone, T.W.; Crowston, K.; Jintae Lee; Pentland, B.
Year: 1993
An open systems profile for concurrent engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaska, M.T.
Year: 1993
ARTEMIS: a research testbed for collaborative health care informatics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reddy, R.; Jagannathan, V.; Srinivas, K.; Karinthi, R.; Reddy, S.M.; Gollapudy, C.; Friedman, S.
Year: 1993
Building public concurrent engineering frameworks on a national information infrastructure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sng, D.C.H.; Yap, M.K.S.
Year: 1993
The design of real-time applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hinchey, M.G.
Year: 1993
Putting OO to work: results from applying the object-oriented paradigm during the development of real-time applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pereira, C.E.
Year: 1993
A real-time image filtration system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laplante, P.A.; Zalewski, D.
Year: 1993
Real-time environment modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burmeister, C.
Year: 1993
Temporal properties of the timed d-graphs of distributed processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cantone, G.
Year: 1993
Real-time considerations in submarine target motion analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bussiere, G.; Oblinger, J.; Wolfe, V.F.
Year: 1993
Resource scheduling for adaptive systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferguson, E.E.
Year: 1993
Research issues for executing real-time C3 applications on parallel processing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metzger, R.C.; Antonio, J.K.
Year: 1993
Hard real-time scheduling for large scale process control applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Waknis, P.; Sztipanovits, J.
Year: 1993
Bounds of start and completion times of application tasks on the RTEM system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng, D.-T.
Year: 1993
Applying formal methods to an embedded real-time avionics system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clements, P.C.; Heitmeyer, C.L.; Labaw, B.G.; Mok, A.K.
Year: 1993
Implications of fault management and replica determinism on the real-time execution scheme of VOTRICS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Appel, B.; Kantz, H.; Koza, C.
Year: 1993
The design of a real-time system for simulators and trainers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Furht, B.
Year: 1993
Real-time computer systems: current and future trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Furht, B.
Year: 1993
A current testing for CMOS static RAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yokoyama, H.; Tamamoto, H.; Narita, Y.
Year: 1993
Automatic verification of march tests (SRAMs)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van de Goor, A.J.; Smit, B.
Year: 1993
Dynamic reconfiguration schemes for mega bit BiCMOS SRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rayapati, V.N.; Kaminska, B.
Year: 1993
Radiation and life test procedures for military and aerospace memory components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chrusciel, R.W.
Year: 1993
Total dose radiation hardening and testing issues of CMOS static memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hensley, R.; Srivastava, A.
Year: 1993
Are NV-memories non-volatile?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ratchev, D.
Year: 1993
Effective tests for memories based on faults models for low PPM defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lam, D.; Khim, S.Y.
Year: 1993
An inexpensive method of detecting localised parametric defects in static RAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savaria, Y.; Thibeault, C.
Year: 1993
Key attributes of an SRAM testing strategy required for effective process monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khare, J.; Griep, S.; Oberle, H.-D.; Maly, W.; Schmitt-Landsiedel, D.; Kollmer, U.; Walker, D.M.H.
Year: 1993
Modeling of intra-cell defects in CMOS SRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Al-Assadi, W.K.; Malaiya, Y.K.; Jayasumana, A.P.
Year: 1993
A new class of fault models and test algorithms for dual-port dynamic RAM testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Castro Alves, V.; Kebichi, O.; Ferreira, A.
Year: 1993
An optimal march test for locating faults in DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Shen; Cockburn, B.F.
Year: 1993
Fault location algorithms for repairable embedded RAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Treuer, R.; Agarwal, V.K.
Year: 1993
Algorithms to test PSF and coupling faults in random access memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajsuman, R.
Year: 1993
Functional testing of RAMs by random testing simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ashtijou, M.; Fusheng Chen
Year: 1993
Associative search based test algorithms for test acceleration in FAST-RAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elm, C.; Tavangarian, D.
Year: 1993
Modeling of faulty behavior of ECL storage elements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Menon, S.M.; Malaiya, Y.K.; Jayasumana, A.P.
Year: 1993
On-line and off-line testable design of random access memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subramanian, S.; Lala, P.K.
Year: 1993
Exact aliasing computation and/or aliasing free design for RAM BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yarmolik, V.N.; Nicolaidis, M.
Year: 1993
A high-speed boundary search Shmoo plot for ULSI memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamada, M.; Kumanoya, M.; Ishii, M.; Kawagoe, T.; Niiro, M.
Year: 1993
Safety assessment test for automated ground transportation systems' software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rizzo, R.; Speciale, M.
Year: 1993
AUSTERE: a system for AUtomated STandard softwarE REview
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fabrizi, S.; Procopio, R.; Russo, D.
Year: 1993
Bridging the gap between CASE and CAST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Graham, J.A.; Higgott, J.B.; Hynes, A.J.
Year: 1993
Automated tool support for ANSI/IEEE STD: 829-1983 software test documentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sneed, H.M.
Year: 1993
A practitioner's guide to evaluation of software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boegh, J.; Hausen, H.-L.; Welzel, D.
Year: 1993
Status of repository standards for software engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morron, M.W.
Year: 1993


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